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OPAx192 36-V, Precision, Rail-to-Rail Input/Output, Low Offset Voltage,
Low Input Bias Current Op Amp with e-trim™
1 Features 3 Description
The OPAx192 family (OPA192, OPA2192, and
1 Low Offset Voltage: ±5 µV OPA4192) is a new generation of 36-V, e-trim
Low Offset Voltage Drift: ±0.2 µV/°C operational amplifiers.
Low Noise: 5.5 nV/Hz at 1 kHz These devices offer outstanding dc precision and ac
High Common-Mode Rejection: 140 dB performance, including rail-to-rail input/output, low
Low Bias Current: ±5 pA offset (±5 µV, typ), low offset drift (±0.2 µV/°C, typ),
and 10-MHz bandwidth.
Rail-to-Rail Input and Output
Wide Bandwidth: 10 MHz GBW Unique features such as differential input-voltage
range to the supply rail, high output current (±65 mA),
High Slew Rate: 20 V/µs high capacitive load drive of up to 1 nF, and high
Low Quiescent Current: 1 mA per Amplifier slew rate (20 V/µs) make the OPA192 a robust, high-
Wide Supply: ±2.25 V to ±18 V, 4.5 V to 36 V performance operational amplifier for high-voltage
industrial applications.
EMI/RFI Filtered Inputs
Differential Input Voltage Range to Supply Rail The OPA192 family of op amps is available in
standard packages and is specified from –40°C to
High Capacitive Load Drive Capability: 1 nF +125°C.
Industry Standard Packages:
Single in SOIC-8, SOT-23-5, and VSSOP-8 Device Information(1)
Dual in SOIC-8 and VSSOP-8 PART NUMBER PACKAGE BODY SIZE (NOM)
Quad in SOIC-14 and TSSOP-14 SOIC (8) 4.90 mm × 3.90 mm
OPA192 SOT-23 (5) 2.90 mm × 1.60 mm
2 Applications VSSOP (8) 3.00 mm × 3.00 mm
SOIC (8) 4.90 mm × 3.90 mm
Multiplexed Data-Acquisition Systems OPA2192 VSSOP (8) 3.00 mm × 3.00 mm
Test and Measurement Equipment SOIC (14) 8.65 mm x 3.90 mm
High-Resolution ADC Driver Amplifiers OPA4192 TSSOP (14) 5.00 mm x 4.40 mm
SAR ADC Reference Buffers (1) For all available packages, see the package option addendum
Programmable Logic Controllers at the end of the data sheet.
High-Side and Low-Side Current Sensing
High Precision Comparator
OPA192 in a High-Voltage, Multiplexed, Data-Acquisition System
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
OPA192
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,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
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Table of Contents
8.1 Overview................................................................. 23
1 Features.................................................................. 18.2 Functional Block Diagram....................................... 23
2 Applications ........................................................... 18.3 Feature Description................................................. 24
3 Description............................................................. 18.4 Device Functional Modes........................................ 30
4 Revision History..................................................... 29 Application and Implementation ........................ 31
5 Pin Configuration and Functions......................... 49.1 Application Information............................................ 31
6 Specifications......................................................... 69.2 Typical Applications ................................................ 31
6.1 Absolute Maximum Ratings ..................................... 610 Power-Supply Recommendations..................... 35
6.2 ESD Ratings.............................................................. 611 Layout................................................................... 35
6.3 Recommended Operating Conditions....................... 611.1 Layout Guidelines ................................................. 35
6.4 Thermal Information: OPA192 .................................. 711.2 Layout Example .................................................... 36
6.5 Thermal Information: OPA2192 ................................ 712 Device and Documentation Support................. 37
6.6 Thermal Information: OPA4192 ................................ 712.1 Device Support...................................................... 37
6.7 Electrical Characteristics: VS= ±4 V to ±18 V (VS=
+8 V to +36 V)............................................................ 812.2 Documentation Support ........................................ 37
6.8 Electrical Characteristics: VS= ±2.25 V to ±4 V (VS=12.3 Related Links ........................................................ 37
+4.5 V to +8 V)......................................................... 10 12.4 Community Resources.......................................... 37
6.9 Typical Characteristics............................................ 12 12.5 Trademarks........................................................... 38
6.10 Typical Characteristics.......................................... 13 12.6 Electrostatic Discharge Caution............................ 38
7 Parameter Measurement Information ................ 21 12.7 Glossary................................................................ 38
7.1 Input Offset Voltage Drift......................................... 21 13 Mechanical, Packaging, and Orderable
8 Detailed Description............................................ 23 Information........................................................... 38
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision D (September 2015) to Revision E Page
Changed PW package from product preview to production data........................................................................................... 1
Added PW package to test condition for input offset voltage drift.......................................................................................... 8
Added PW package to test condition for input offset voltage drift........................................................................................ 10
Added PW package condition to Figure 8 ........................................................................................................................... 13
Added PW package condition to Figure 10 ......................................................................................................................... 13
Added PW package condition to Figure 52 ......................................................................................................................... 22
Changed Figure 70 to fix typos ............................................................................................................................................ 36
Changes from Revision C (March 2015) to Revision D Page
Changed device status to Production Data; OPA4192 released to Production .................................................................... 1
Deleted footnote 2 from Device Information table ................................................................................................................. 1
Deleted footnote 2 from Pin Configuration and Functions section......................................................................................... 4
Changed ESD Ratings table: added correct OPA4192 CDM specifications ......................................................................... 6
Added Frequency Response, Crosstalk parameter to Electrical Characteristics: VS= ±4 V to ±18 V table ......................... 9
Added Frequency Response, Crosstalk parameter to Electrical Characteristics: VS= ±2.25 V to ±4 V table .................... 11
Changed Typical Characteristics to current standards (split curves and table of graphs into separate sections to be
SDS compliant) .................................................................................................................................................................... 12
Added Crosstalk vs Frequency row to Table 1 ................................................................................................................... 12
Added Figure 48 .................................................................................................................................................................. 20
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Changes from Revision B (March 2014) to Revision C Page
Added CDM row for OPA2192, OPA4192 in ESD Ratings table........................................................................................... 6
Changed input offset voltage values for VCM (V+) 1.5 V test condition............................................................................ 8
Changed Input offset voltage parameter typical specs for VCM = (V+) 1.5 V test conditions ............................................. 8
Changed test conditions for dVOS/dT parameter.................................................................................................................... 8
Changed input offset voltage max values and test conditions for VCM = (V+) 3 V test condition...................................... 10
Changed input offset voltage values and test conditions for VCM = (V+) 1.5 V test condition .......................................... 10
Changed Input offset voltage parameter typical specs for VCM = (V+) 1.5 V test conditions............................................ 10
Changed test conditions for dVOS/dT parameter ................................................................................................................. 10
Added text to last bullet of Layout Guidelines section.......................................................................................................... 35
Changes from Revision A (January 2014) to Revision B Page
Added ESD Ratings and Recommended Operating Conditions tables, and Parameter Measurement Information,
Application and Implementation,Power-Supply Recommendations, and Device and Documentation Support
sections, and moved existing sections................................................................................................................................... 1
Changed all OPA192 and OPA2192 packages to production data........................................................................................ 1
Changed package names to latest standard; changed all MSOP to VSSOP, SO to SOIC, and SOT23 to SOT ................. 1
Deleted DCK package pin configuration................................................................................................................................. 4
Added thermal information for OPA192 DBV and DGK packages......................................................................................... 7
Added OPA2192 and OPA4192 Thermal Information tables ................................................................................................ 7
Added rows with additional test conditions to input offset voltage parameter........................................................................ 8
Changed Input offset voltage drift parameter ........................................................................................................................ 8
Changed CMRR test conditions ............................................................................................................................................ 8
Added rows with additional test conditions to input offset voltage parameter...................................................................... 10
Changed Input offset voltage drift parameter....................................................................................................................... 10
Changed PSSR parameter .................................................................................................................................................. 10
Changed CMRR test conditions .......................................................................................................................................... 10
Added Output section........................................................................................................................................................... 11
Added typical characteristic curves to Table 1 .................................................................................................................... 12
Added TA= 25°C to Typical Characteristics condition line .................................................................................................. 12
Added nine new histogram plots from Figure 2 to Figure 10............................................................................................... 13
Changed Figure 11 to show more units ............................................................................................................................... 13
Changed Figure 19 .............................................................................................................................................................. 15
Added text to Application Information section...................................................................................................................... 31
Changed text in Layout Guidelines section.......................................................................................................................... 35
Changes from Original (December 2013) to Revision A Page
Changed first paragraph of 16-Bit Precision Multiplexed Data-Acquisition System section ................................................ 31
Changed Figure 66 and title................................................................................................................................................. 31
Changed TIDU181 reference design title............................................................................................................................. 32
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1
2
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14
13
12
11
OUTD
-IND
+IND
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-INA
+INA
V+
5
6
7
10
9
8
+INC
-INC
OUTC
+INB
-INB
OUTB
1
2
3
4
8
7
6
5
NC(1)
V+
OUT
NC(1)
NC(1)
-IN
+IN
V-
1
2
3
4
8
7
6
5
V+
OUTB
-INB
+INB
OUTA
-INA
+INA
V-
1
2
3
5
4
V+
-IN
OUT
V-
+IN
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5 Pin Configuration and Functions
DBV Package: OPA192 D and DGK Packages: OPA2192
5-Pin SOT 8-Pin SOIC and VSSOP
Top View Top View
D and DGK Packages: OPA192
8-Pin SOIC and VSSOP
Top View D and PW Packages: OPA4192
14-Pin SOIC and TSSOP
Top View
(1) NC = No internal connection.
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Pin Functions: OPA192
PIN
OPA192 I/O DESCRIPTION
NAME D (SOIC), DBV (SOT)
DGK (VSSOP)
+IN 3 3 I Noninverting input
–IN 2 4 I Inverting input
NC 1, 5, 8 No internal connection (can be left floating)
OUT 6 1 O Output
V+ 7 5 Positive (highest) power supply
V– 4 2 Negative (lowest) power supply
Pin Functions: OPA2192 and OPA4192
PIN
OPA2192 OPA4192 I/O DESCRIPTION
NAME D (SOIC), D (SOIC),
DGK (VSSOP) PW (TSSOP)
+IN A 3 3 I Noninverting input, channel A
+IN B 5 5 I Noninverting input, channel B
+IN C 10 I Noninverting input, channel C
+IN D 12 I Noninverting input, channel D
–IN A 2 2 I Inverting input, channel A
–IN B 6 6 I Inverting input, channel B
–IN C 9 I Inverting input,,channel C
–IN D 13 I Inverting input, channel D
OUT A 1 1 O Output, channel A
OUT B 7 7 O Output, channel B
OUT C 8 O Output, channel C
OUT D 14 O Output, channel D
V+ 8 4 Positive (highest) power supply
V– 4 11 Negative (lowest) power supply
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6 Specifications
6.1 Absolute Maximum Ratings(1)
over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT
±20
Supply voltage, VS= (V+) (V–) V
(40, single supply)
Common-mode (V–) 0.5 (V+) + 0.5
Voltage V
Signal input pins Differential (V+) (V–) + 0.2
Current ±10 mA
Output short circuit(2) Continuous
Operating range –55 150
Temperature Junction 150 °C
Storage, Tstg –65 150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Short-circuit to ground, one amplifier per package.
6.2 ESD Ratings VALUE UNIT
V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±4000 V
OPA192
V(ESD) Electrostatic discharge Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±1000 V
OPA2192
V(ESD) Electrostatic discharge Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±750 V
OPA4192
V(ESD) Electrostatic discharge Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±500 V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT
Supply voltage, VS= (V+) (V–) 4.5 (±2.25) 36 (±18) V
Specified temperature –40 +125 °C
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6.4 Thermal Information: OPA192 OPA192
THERMAL METRIC(1) D (SOIC) DBV (SOT) DGK (VSSOP) UNIT
8 PINS 5 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance 115.8 158.8 180.4 °C/W
RθJC(top) Junction-to-case(top) thermal resistance 60.1 60.7 67.9 °C/W
RθJB Junction-to-board thermal resistance 56.4 44.8 102.1 °C/W
ψJT Junction-to-top characterization parameter 12.8 1.6 10.4 °C/W
ψJB Junction-to-board characterization parameter 55.9 4.2 100.3 °C/W
RθJC(bot) Junction-to-case(bottom) thermal resistance N/A N/A N/A °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.5 Thermal Information: OPA2192 OPA2192
THERMAL METRIC(1) D (SOIC) DGK (VSSOP) UNIT
8 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance 107.9 158 °C/W
RθJC(top) Junction-to-case(top) thermal resistance 53.9 48.6 °C/W
RθJB Junction-to-board thermal resistance 48.9 78.7 °C/W
ψJT Junction-to-top characterization parameter 6.6 3.9 °C/W
ψJB Junction-to-board characterization parameter 48.3 77.3 °C/W
RθJC(bot) Junction-to-case(bottom) thermal resistance N/A N/A °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.6 Thermal Information: OPA4192 OPA4192
THERMAL METRIC(1) D (SOIC) PW (TSSOP) UNIT
14 PINS 14 PINS
RθJA Junction-to-ambient thermal resistance 86.4 92.6 °C/W
RθJC(top) Junction-to-case(top) thermal resistance 46.3 27.5 °C/W
RθJB Junction-to-board thermal resistance 41.0 33.6 °C/W
ψJT Junction-to-top characterization parameter 11.3 1.9 °C/W
ψJB Junction-to-board characterization parameter 40.7 33.1 °C/W
RθJC(bot) Junction-to-case(bottom) thermal resistance N/A N/A °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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6.7 Electrical Characteristics: VS= ±4 V to ±18 V (VS= +8 V to +36 V)
At TA= +25°C, VCM = VOUT = VS/ 2, and RLOAD = 10 kΩconnected to VS/ 2, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
OFFSET VOLTAGE
±5 ±25
TA= 0°C to 85°C ±8 ±50
TA= –40°C to +125°C ±10 ±75
VOS Input offset voltage µV
±10 ±40
VCM = (V+) 1.5 V TA= 0°C to 85°C ±25 ±150
TA= –40°C to +125°C ±50 ±250
TA= 0°C to 85°C ±0.1 ±0.5
D packages only TA= –40°C to +125°C ±0.15 ±0.8
dVOS/dT Input offset voltage drift µV/°C
TA= 0°C to 85°C ±0.1 ±0.8
DBV, DGK, and PW packages only TA= –40°C to +125°C ±0.2 ±1.0
Power-supply rejection
PSRR TA= –40°C to +125°C ±0.3 ±1.0 µV/V
ratio
INPUT BIAS CURRENT
±5 ±20 pA
IBInput bias current TA= –40°C to +125°C ±5 nA
±2 ±20 pA
IOS Input offset current TA= –40°C to +125°C ±2 nA
NOISE
(V–) 0.1 V < VCM < (V+) 3 V f = 0.1 Hz to 10 Hz 1.30
EnInput voltage noise µVPP
(V+) 1.5 V < VCM < (V+) + 0.1 V f = 0.1 Hz to 10 Hz 4
f = 100 Hz 10.5
(V–) 0.1 V < VCM < (V+) 3 V f = 1 kHz 5.5
Input voltage noise
ennV/Hz
density f = 100 Hz 32
(V+) 1.5 V < VCM < (V+) + 0.1 V f = 1 kHz 12.5
NOISE (continued)
Input current noise
inf = 1 kHz 1.5 fA/Hz
density
INPUT VOLTAGE
Common-mode voltage
VCM (V–) 0.1 (V+) + 0.1 V
range
120 140
(V–) 0.1 V < VCM < (V+) 3 V TA= –40°C to +125°C 114 126 dB
Common-mode
CMRR 100 120
rejection ratio (V+) 1.5 V < VCM < (V+) TA= –40°C to +125°C 86 100
(V+) 3 V < VCM < (V+) 1.5 V See Typical Characteristics
INPUT IMPEDANCE
ZID Differential 100 || 1.6 MΩ|| pF
1013Ω||
ZIC Common-mode 1 || 6.4 pF
OPEN-LOOP GAIN
120 134
(V–) + 0.6 V < VO< (V+) 0.6 V,
RLOAD = 2 kΩTA= –40°C to +125°C 114 126
AOL Open-loop voltage gain dB
126 140
(V–) + 0.3 V < VO< (V+) 0.3 V,
RLOAD = 10 kΩTA= –40°C to +125°C 120 134
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Electrical Characteristics: VS= ±4 V to ±18 V (VS= +8 V to +36 V) (continued)
At TA= +25°C, VCM = VOUT = VS/ 2, and RLOAD = 10 kΩconnected to VS/ 2, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
FREQUENCY RESPONSE
GBW Unity gain bandwidth 10 MHz
SR Slew rate G = 1, 10-V step 20 V/µs
VS= ±18 V, G = 1, 10-V step 1.4
To 0.01% VS= ±18 V, G = 1, 5-V step 0.9
tsSettling time µs
VS= ±18 V, G = 1, 10-V step 2.1
To 0.001% VS= ±18 V, G = 1, 5-V step 1.8
tOR Overload recovery time VIN × G = VS200 ns
Total harmonic
THD+N G = 1, f = 1 kHz, VO= 3.5 VRMS 0.00008%
distortion + noise
OPA2192 and OPA4192, at dc 150
Crosstalk dB
OPA2192 and OPA4192, f = 100 kHz 130
OUTPUT
No load 5 15
Positive rail RLOAD = 10 kΩ95 110
RLOAD = 2 kΩ430 500
Voltage output swing
VOmV
from rail No load 5 15
Negative rail RLOAD = 10 kΩ95 110
RLOAD = 2 kΩ430 500
ISC Short-circuit current ±65 mA
CLOAD Capacitive load drive See Typical Characteristics
Open-loop output
ZOf = 1 MHz, IO= 0 A, see Figure 31 375 Ω
impedance
POWER SUPPLY
IO= 0 A 1 1.2
Quiescent current per
IQmA
amplifier TA= –40°C to +125°C, IO= 0 A 1.5
TEMPERATURE
Thermal protection(1) 140 °C
(1) For a detailed description of thermal protection, see the Thermal Protection section.
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6.8 Electrical Characteristics: VS= ±2.25 V to ±4 V (VS= +4.5 V to +8 V)
At TA= +25°C, VCM = VOUT = VS/ 2, and RLOAD = 10 kΩconnected to VS/ 2, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
OFFSET VOLTAGE
±5 ±25
VCM = (V+) 3 V TA= 0°C to 85°C ±8 ±50 µV
TA= –40°C to +125°C ±10 ±75
VOS Input offset voltage (V+) 3.5 V < VCM < (V+) 1.5 V See Common-Mode Voltage Range section
±10 ±40
VCM = (V+) 1.5 V TA= 0°C to 85°C ±25 ±150 µV
TA= –40°C to +125°C ±50 ±250
TA= 0°C to 85°C ±0.1 ±0.5
VCM = (V+) 3 V,
D packages only TA= –40°C to +125°C ±0.15 ±0.8
dVOS/dT Input offset voltage drift TA= 0°C to 85°C ±0.1 ±0.8 µV/°C
VCM = (V+) 3 V,
DBV, DGK, and PW packages only TA= –40°C to +125°C ±0.2 ±1.1
VCM = (V+) 1.5 V, TA= –40°C to +125°C ±0.5 ±3
Power-supply rejection
PSRR TA= –40°C to +125°C, VCM = VS/ 2 0.75 V ±1 µV/V
ratio
INPUT BIAS CURRENT
±5 ±20 pA
IBInput bias current TA= –40°C to +125°C ±5 nA
±2 ±20 pA
IOS Input offset current TA= –40°C to +125°C ±2 nA
NOISE
(V–) 0.1 V < VCM < (V+) 3 V, f = 0.1 Hz to 10 Hz 1.30
EnInput voltage noise µVPP
(V+) 1.5 V < VCM < (V+) + 0.1 V, f = 0.1 Hz to 10 Hz 4
f = 100 Hz 10.5
(V–) 0.1 V < VCM < (V+) 3 V f = 1 kHz 5.5
enInput voltage noise density nV/Hz
f = 100 Hz 32
(V+) 1.5 V < VCM < (V+) + 0.1 V f = 1 kHz 12.5
inInput current noise density f = 1 kHz 1.5 fA/Hz
INPUT VOLTAGE
Common-mode voltage
VCM (V–) 0.1 (V+) + 0.1 V
range
94 110
(V–) 0.1 V < VCM < (V+) 3 V TA= –40°C to +125°C 90 104 dB
Common-mode rejection
CMRR 100 120
ratio (V+) 1.5 V < VCM < (V+) TA= –40°C to +125°C 84 100
(V+) 3 V < VCM < (V+) 1.5 V See Typical Characteristics
INPUT IMPEDANCE
ZID Differential 100 || 1.6 MΩ|| pF
1013Ω||
ZIC Common-mode 1 || 6.4 pF
OPEN-LOOP GAIN
110 120
(V–) + 0.6 V < VO< (V+) 0.6 V,
RLOAD = 2 kΩTA= –40°C to +125°C 100 114
AOL Open-loop voltage gain dB
110 126
(V–) + 0.3 V < VO< (V+) 0.3 V,
RLOAD = 10 kΩTA= –40°C to +125°C 110 120
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Electrical Characteristics: VS= ±2.25 V to ±4 V (VS= +4.5 V to +8 V) (continued)
At TA= +25°C, VCM = VOUT = VS/ 2, and RLOAD = 10 kΩconnected to VS/ 2, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
FREQUENCY RESPONSE
GBW Unity gain bandwidth 10 MHz
SR Slew rate G = 1, 10-V step 20 V/µs
tsSettling time To 0.01% VS= ±3 V, G = 1, 5-V step 1 µs
tOR Overload recovery time VIN× G = VS200 ns
OPA2192 and OPA4192, at dc 150
Crosstalk dB
OPA2192 and OPA4192, f = 100 kHz 130
OUTPUT
No load 5 15
Positive rail RLOAD = 10 kΩ95 110
RLOAD = 2 kΩ430 500
Voltage output swing from
VOmV
rail No load 5 15
Negative rail RLOAD = 10 kΩ95 110
RLOAD = 2 kΩ430 500
ISC Short-circuit current ±65 mA
CLOAD Capacitive load drive See Typical Characteristics
Open-loop output
ZOf = 1 MHz, IO= 0 A, see Figure 31 375 Ω
impedance
POWER SUPPLY
1 1.2
Quiescent current per
IQIO= 0 A mA
amplifier TA= –40°C to +125°C 1.5
TEMPERATURE
Thermal protection(1) 140 °C
(1) For a detailed description of thermal protection, see the Thermal Protection section.
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OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
6.9 Typical Characteristics Table 1. Table of Graphs
DESCRIPTION FIGURE
Offset Voltage Production Distribution Figure 1 to Figure 6
Offset Voltage Drift Distribution Figure 7 to Figure 10
Offset Voltage vs Temperature Figure 11
Offset Voltage vs Common-Mode Voltage Figure 12 to Figure 14
Offset Voltage vs Power Supply Figure 15
Open-Loop Gain and Phase vs Frequency Figure 16
Closed-Loop Gain and Phase vs Frequency Figure 17
Input Bias Current vs Common-Mode Voltage Figure 18
Input Bias Current vs Temperature Figure 19
Output Voltage Swing vs Output Current (maximum supply) Figure 20
CMRR and PSRR vs Frequency Figure 21
CMRR vs Temperature Figure 22
PSRR vs Temperature Figure 23
0.1-Hz to 10-Hz Noise Figure 24
Input Voltage Noise Spectral Density vs Frequency Figure 25
THD+N Ratio vs Frequency Figure 26
THD+N vs Output Amplitude Figure 27
Quiescent Current vs Supply Voltage Figure 28
Quiescent Current vs Temperature Figure 29
Open Loop Gain vs Temperature Figure 30
Open Loop Output Impedance vs Frequency Figure 31
Small Signal Overshoot vs Capacitive Load (100-mV Output Step) Figure 32,Figure 33
No Phase Reversal Figure 34
Positive Overload Recovery Figure 35
Negative Overload Recovery Figure 36
Small-Signal Step Response (100 mV) Figure 37,Figure 38
Large-Signal Step Response Figure 39
Settling Time Figure 40 to Figure 43
Short-Circuit Current vs Temperature Figure 44
Maximum Output Voltage vs Frequency Figure 45
Propagation Delay Rising Edge Figure 46
Propagation Delay Falling Edge Figure 47
Crosstalk vs Frequency Figure 48
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-75
-50
-25
0
25
50
75
Amplifiers (%)
Offset Voltage (µV)
C013
Distribution Taken From 190 Amplifiers
TA = -25ƒC
-75
-50
-25
0
25
50
75
Amplifiers (%)
Offset Voltage (µV)
C013
Distribution Taken From 190 Amplifiers
TA = -40ƒC
-50
-45
-40
-35
-30
-25
-20
-15
-10
-5
0
5
10
15
20
25
30
35
40
45
50
Amplifiers (%)
Offset Voltage (µV)
C013
Distribution Taken From 190 Amplifiers
TA = 85ƒC
-50
-45
-40
-35
-30
-25
-20
-15
-10
-5
0
5
10
15
20
25
30
35
40
45
50
Amplifiers (%)
Offset Voltage (µV)
C013
Distribution Taken From 190 Amplifiers
TA = 0ƒC
-10
-9
-8
-7
-6
-5
-4
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
10
Percentage of Amplifiers (%)
Offset Voltage (V)
C032
Distribution Taken From 4715 Amplifiers
-75
-50
-25
0
25
50
75
Amplifiers (%)
Offset Voltage (µV)
C013
Distribution Taken From 190 Amplifiers
TA = 125 ƒC
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
6.10 Typical Characteristics
At TA= 25°C, VS= ±18 V, VCM = VS/ 2, RLOAD = 10 kΩconnected to VS/ 2, and CL= 100 pF, unless otherwise noted.
Figure 1. Offset Voltage Production Distribution at 25°C Figure 2. Offset Voltage Production Distribution at 125°C
Figure 3. Offset Voltage Production Distribution at 85°C Figure 4. Offset Voltage Production Distribution at 0°C
Figure 5. Offset Voltage Production Distribution at –25°C Figure 6. Offset Voltage Production Distribution at 40°C
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VOS (V)
VCM (V)
C001
5 Typical Units Shown
VCM = -18.1 V
±100
±75
±50
±25
0
25
50
75
100
±75 ±50 ±25 0 25 50 75 100 125 150
VOS (V)
Temperature (ƒC)
C001
190 Typical Units Shown
-0.5
-0.4
-0.3
-0.2
-0.1
0
0.1
0.2
0.3
0.4
0.5
Amplifiers (%)
Offset Voltage Drift (µV/ƒC)
C013
Distribution Taken From 120 Amplifiers
SOIC, TA = 0ƒC to 85ƒC
-0.8
-0.7
-0.6
-0.5
-0.4
-0.3
-0.2
-0.1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
Amplifiers (%)
Offset Voltage Drift (µV/ƒC)
C013
Distribution Taken From 75 Amplifiers
SOT and VSSOP, TA = 0ƒC to 85ƒC
-0.8
-0.7
-0.6
-0.5
-0.4
-0.3
-0.2
-0.1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
Amplifiers (%)
Offset Voltage Drift (µV/ƒC)
C013
Distribution Taken From 120 Amplifiers
SOIC, TA = -40ƒC to +125ƒC
-1.1
-0.9
-0.7
-0.5
-0.3
-0.1
0.1
0.3
0.5
0.7
0.9
1.1
Amplifiers (%)
Offset Voltage Drift (µV/ƒC)
C013
Distribution Taken From 75 Amplifiers
SOT and VSSOP, TA = -40ƒC to +125ƒC
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
Typical Characteristics (continued)
At TA= 25°C, VS= ±18 V, VCM = VS/ 2, RLOAD = 10 kΩconnected to VS/ 2, and CL= 100 pF, unless otherwise noted.
OPA192ID and OPA2192ID OPA192IDBV, OPA192IDGK, OPA2192IDGK, and OPA4192IPW
Figure 7. Offset Voltage Drift Distribution Figure 8. Offset Voltage Drift Distribution
from –40°C to +125°C from –40°C to +125°C
OPA192ID and OPA2192ID OPA192IDBV, OPA192IDGK, OPA2192IDGK, and OPA4192IPW
Figure 9. Offset Voltage Drift Distribution Figure 10. Offset Voltage Drift Distribution
from 0°C to 85°C from 0°C to 85°C
Figure 11. Offset Voltage vs Temperature Figure 12. Offset Voltage vs Common-Mode Voltage
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±20.0
0.0
20.0
40.0
60.0
1000 10k 100k 1M 10M
Gain (dB)
Frequency (Hz)
G = -100
G = +1
G = -1
G = -10
C003
±20
±15
±10
±5
0
5
10
15
20
±18.0 ±9.0 0.0 9.0 18.0
Input Bias Current (pA)
VCM (V)
C001
IB+
IB-
0
45
90
135
180
±20.0
0.0
20.0
40.0
60.0
80.0
100.0
120.0
140.0
1 10 100 1k 10k 100k 1M 10M 100M
Phase (ƒ)
Gain (dB)
Frequency (Hz)
C004
Phase
Open-loop Gain
CLOAD = 15 pF
±50
±40
±30
±20
±10
0
10
20
30
40
50
0.0 2.0 4.0 6.0 8.0 10.0 12.0 14.0 16.0 18.0 20.0
VOS (V)
VSUPPLY (V)
C001
10 Typical Units Shown
VS = ±2.25 V to 18 V
±200
±150
±100
±50
0
50
100
150
200
±2.5 ±2.0 ±1.5 ±1.0 ±0.5 0.0 0.5 1.0 1.5 2.0 2.5
VOS (V)
VCM (V)
C001
5 Typical Units Shown
VS = ±2.25 V
VCM = +2.35 V
VCM = -2.35 V
P-Channel
Transition
N-Channel
±100
±75
±50
±25
0
25
50
75
100
12.5 13.5 14.5 15.5 16.5 17.5 18.5
VOS (V)
VCM (V)
C001
5 Typical Units Shown
VCM = +18.1 V
N-Channel
P-Channel
Transition
VCM = -18.1 V
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
Typical Characteristics (continued)
At TA= 25°C, VS= ±18 V, VCM = VS/ 2, RLOAD = 10 kΩconnected to VS/ 2, and CL= 100 pF, unless otherwise noted.
Figure 13. Offset Voltage vs Common-Mode Voltage Figure 14. Offset Voltage vs Common-Mode Voltage
Figure 15. Offset Voltage vs Power Supply Figure 16. Open-Loop Gain and Phase vs Frequency
Figure 17. Closed-Loop Gain and Phase vs Frequency Figure 18. Input Bias Current vs Common-Mode Voltage
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-1
-0.8
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
1
±75 ±50 ±25 0 25 50 75 100 125 150
Power-Supply Rejection Ratio (µV/V)
Temperature (ƒC)
C001
400 nV/div
Time (1 s/div)
C001
Peak-to-Peak Noise = VRMS × 6.6 = 1.30 Vpp
0.0
20.0
40.0
60.0
80.0
100.0
120.0
140.0
160.0
1 10 100 1k 10k 100k 1M
Common-Mode Rejection Ratio (dB),
Power-Supply Rejection Ratio (dB)
Frequency (Hz)
+PSRR
CMRR
-PSRR
C012
±10
±8
±6
±4
±2
0
2
4
6
8
10
±75 ±50 ±25 0 25 50 75 100 125 150
Common-Mode Rejection Ratio (µV/V)
Temperature (ƒC)
C001
VS = ±18 V, VCM = 0 V
VS = ±2.25 V, VCM = V+ - 3 V
Vout (V)
Iout (mA)
C001
-40°C
+125°C
±1000
0
1000
2000
3000
4000
5000
6000
±75 ±50 ±25 0 25 50 75 100 125 150 175
Input Bias Current (pA)
Temperature (ƒC)
C001
IB+
IB -
Ios
Ios
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
Typical Characteristics (continued)
At TA= 25°C, VS= ±18 V, VCM = VS/ 2, RLOAD = 10 kΩconnected to VS/ 2, and CL= 100 pF, unless otherwise noted.
Figure 19. Input Bias Current vs Temperature Figure 20. Output Voltage Swing vs Output Current
(Maximum Supply)
Figure 21. CMRR and PSRR vs Frequency Figure 22. CMRR vs Temperature
Figure 23. PSRR vs Temperature Figure 24. 0.1-Hz to 10-Hz Noise
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IQ (mA)
Temperature (ƒC)
C001
Vs = ±18 V
Vs = ±2.25 V
±3.0
±2.0
±1.0
0.0
1.0
2.0
3.0
±75 ±50 ±25 0 25 50 75 100 125 150
AOL (µV/V)
Temperature (ƒC)
C001
Vs = 4.5 V
Vs = 36 V
RL = 10 kŸ
IQ (mA)
Supply Voltage (V)
C001
-140
-120
-100
-80
-60
0.00001
0.0001
0.001
0.01
0.1
0.01 0.1 1 10
Total Harmonic Distortion + Noise (dB)
Total Harmonic Distortion + Noise (%)
Output Amplitude (VRMS)
G = +1 V/V, RL = 10 k
G = +1 V/V, RL = 2 k
G = -1 V/V, RL = 10 k
G = -1 V/V, RL = 2 k
C008
f = 1 kHz
BW = 80 kHz
1
10
100
1000
0.1 1 10 100 1k 10k 100k
Voltage Noise Density (nV/rtHz)
Frequency (Hz)
C002
V
CM
= V+ - 100 mV
N-Channel Input
V
CM
= 0 V
P-Channel Input
-140
-120
-100
-80
-60
0.00001
0.0001
0.001
0.01
0.1
10 100 1k 10k
Total Harmonic Distortion + Noise (dB)
Total Harmonic Distortion + Noise (%)
Frequency (Hz)
G = +1 V/V, RL = 10 k
G = +1 V/V, RL = 2 k
G = -1 V/V, RL = 10 k
G = -1 V/V, RL = 2 k
C007
VOUT = 3.5 VRMS
BW = 80 kHz
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
Typical Characteristics (continued)
At TA= 25°C, VS= ±18 V, VCM = VS/ 2, RLOAD = 10 kΩconnected to VS/ 2, and CL= 100 pF, unless otherwise noted.
Figure 26. THD+N Ratio vs Frequency
Figure 25. Input Voltage Noise Spectral Density
vs Frequency
Figure 27. THD+N vs Output Amplitude Figure 28. Quiescent Current vs Supply Voltage
Figure 30. Open-Loop Gain vs Temperature
Figure 29. Quiescent Current vs Temperature
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5 V/div
Time (200 ns/div)
C009
VOUT
VIN
±
+
RF= 10 kORI= 1 kO
VOUT
VIN
+ 18 V
±18 V
OPA192
+
±
G = -10
RI NŸ RF NŸ
5 V/div
Time (200 ns/div)
C010
VOUT
VIN
±
+
RF= 10 kORI= 1 kO
VOUT
VIN
+ 18 V
±18 V
OPA192
+
±
G = -10
RI NŸ RF NŸ
0
5
10
15
20
25
30
35
40
45
50
10p 100p 1n
Overshoot (%)
Capacitive Load (F)
0
25
50
C013
RISO = 0
RISO = 25
RISO = 50
CL
RL
±
+
VIN
+ 18 V
±18 V
OPA192
+
±
RISO
G = +1
5 V/div
Time (200 s/div)
C011
VIN
VOUT
37 VPP
Sine Wave
(±18.5V)
±
+VOUT
+ 18 V
±18 V
OPA192
+
±
10
100
1k
10k
0 1 10 100 1k 10k 100k 1M 10M
Output Impedance ()
Frequency (Hz)
C016
0
5
10
15
20
25
30
35
40
45
50
10p 100p 1n
Overshoot (%)
Capacitive Load (F)
0
25
50
±
+
RI= 1 kO
VIN
+ 18 V
±18 V
CL
OPA192
+
±
RF= 1 kO
RISO
G = -1
C013
RISO = 0
RISO = 25
RISO = 50
RI NŸ RF NŸ
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
Typical Characteristics (continued)
At TA= 25°C, VS= ±18 V, VCM = VS/ 2, RLOAD = 10 kΩconnected to VS/ 2, and CL= 100 pF, unless otherwise noted.
Figure 31. Open-Loop Output Impedance vs Frequency Figure 32. Small-Signal Overshoot vs Capacitive Load
(100-mV Output Step)
Figure 33. Small-Signal Overshoot vs Capacitive Load Figure 34. No Phase Reversal
(100-mV Output Step)
Figure 35. Positive Overload Recovery Figure 36. Negative Overload Recovery
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Output Delta from Final Value (mV)
Time (s)
C034
0.01% Settling = ±500 V
G = +1
Output Delta from Final Value (mV)
Time (s)
C034
0.01% Settling = ±1 mV
G = +1
2 V/div
Time (300 ns/div)
C005
R
L
= 1 kŸ
CL = 10 pF
±
+
RI= 1 kO
VIN
+ 18 V
±18 V
CL
OPA192
+
±
RF= 1 kO G = -1
RI NŸ RF NŸ
Output Delta from Final Value (mV)
Time (s)
C034
0.01% Settling = ±1 mV
G = +1
Step Applied at t = 0
20 mV/div
Time (100 ns/div)
C015
CL
RL
±
+
VIN
+ 18 V
±18 V
OPA192
+
±
G = +1
CL = 10 pF
20 mV/div
Time (120 ns/div)
C006
±
+
RI= 1 kO
VIN
+ 18 V
±18 V
CL
OPA192
+
±
RF= 1 kO G = -1
RI NŸ RF NŸ
R
L
= 1 kŸ
CL = 10 pF
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
Typical Characteristics (continued)
At TA= 25°C, VS= ±18 V, VCM = VS/ 2, RLOAD = 10 kΩconnected to VS/ 2, and CL= 100 pF, unless otherwise noted.
Figure 38. Small-Signal Step Response (100 mV)
Figure 37. Small-Signal Step Response (100 mV)
Figure 40. Settling Time (10-V Positive Step)
Figure 39. Large-Signal Step Response
Figure 41. Settling Time (5-V Positive Step) Figure 42. Settling Time (10-V Negative Step)
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Frequency (Hz)
Crosstalk (db)
-180
-160
-140
-120
-100
-80
1k 10k 100k 1M
Output Voltage (1 V/div)
Time (200 ns/div)
C026
VOUT Voltage
Overdrive = 100 mV
tpLH = 1.1 s
0
5
10
15
20
25
30
10k 100k 1M 10M
Output Voltage (VPP)
Frequency (Hz)
C033
VS = ±2.25 V
VS = ±5 V
VS = ±15 V
Maximum output voltage without
slew-rate induced distortion.
Output Voltage (5 V/div)
Time (200 ns/div)
C025
VOUT Voltage
Overdrive = 100 mV
tpLH = 0.97 s
Output Delta from Final Value (mV)
Time (s)
C034
0.01% Settling = ±500 V
G = +1
0
20
40
60
80
±75 ±50 ±25 0 25 50 75 100 125 150
ISC (mA)
Temperature (ƒC)
C001
ISC, Source
ISC, Sink
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
Typical Characteristics (continued)
At TA= 25°C, VS= ±18 V, VCM = VS/ 2, RLOAD = 10 kΩconnected to VS/ 2, and CL= 100 pF, unless otherwise noted.
Figure 43. Settling Time (5-V Negative Step) Figure 44. Short-Circuit Current vs Temperature
Figure 45. Maximum Output Voltage vs Frequency Figure 46. Propagation Delay Rising Edge
Figure 47. Propagation Delay Falling Edge Figure 48. Crosstalk vs Frequency
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Temperature (qC)
Offset Voltage (PV)
Offset Voltage vs Temperature
-50 -25 0 25 50 75 100 125 150
-100
-75
-50
-25
0
25
50
75
100
Temperature
Input Offset Voltage
VOS Before e-trim
VOS After e-trim
Linear component of drift
Linear component of drift
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
7 Parameter Measurement Information
7.1 Input Offset Voltage Drift
The OPAx192 family of operational amplifiers is manufactured using TI’s e-trim technology. Each amplifier input
offset voltage and input offset voltage drift is trimmed in production, thereby minimizing errors associated with
input offset voltage and input offset voltage drift. The e-trim technology is a TI proprietary method of trimming
internal device parameters during either wafer probing or final testing. When trimming input offset voltage drift the
systematic or linear drift error on each device is trimmed to zero. This results in the remaining errors associated
with input offset drift are minimal and are the result from only nonlinear error sources. Figure 49 illustrates this
concept.
Figure 49. Input Offset Before and After Drift Trim
A common method of specifying input offset voltage drift is the box method. The box method estimates a
maximum input offset drift by bounding the offset voltage versus temperature curve with a box and using the
corners of this bounding box to determine the drift. The slope of the line connecting the diagonal corners of the
box corresponds to the input offset voltage drift. Figure 50 shows the box method concept. The box method
works particularly well when the input offset drift is dominated by the linear component of drift, but because the
OPA192 family uses TI’s e-trim technology to remove the linear component input offset voltage drift, the box
method is not a particularly useful method of accurately performing an error analysis. Figure 50 shows 30 typical
units of the OPAx192 with the box method superimposed for illustrative purposes. The boundaries of the box are
determined by the specified temperature range along the x-axis and the maximum specified input offset voltage
across that same temperature range along the y-axis. Using the box method predicts an input offset voltage drift
of 0.9 µV/°C. As shown in Figure 50, the slopes of the actual input offset voltage versus temperature are much
less than that predicted by the box method. The box method predicts a pessimistic value for the maximum input
offset voltage drift and is not recommended when performing an error analysis.
Figure 50. The Box Method
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±75
±50
±25
0
25
50
75
±75 ±50 ±25 0 25 50 75 100 125 150
VOS (V)
Temperature (ƒC)
C001
6 Typical Units Shown
3 1
-3 1
-1
-0.8
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
1
±75 ±50 ±25 0 25 50 75 100 125 150
Input Offset Voltage Drift (V/ƒC)
Temperature (ƒC)
C001
+3 1
-3 1
- 1
+ 1
SOIC
-1.1
-0.9
-0.7
-0.5
-0.3
-0.1
0.1
0.3
0.5
0.7
0.9
1.1
±75 ±50 ±25 0 25 50 75 100 125 150
Input Offset Voltage Drift (V/ƒC)
Temperature (ƒC)
C001
+3 1
-3 1
- 1
+ 1
SOT and VSSOP
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
Input Offset Voltage Drift (continued)
Instead of the box method, a convenient way to illustrate input offset drift is to compute the slopes of the input
offset voltage versus temperature curve. This is the same as computing the input offset drift at each point along
the input offset voltage versus temperature curve. The results for the OPAx192 family are shown in Figure 51
and Figure 52.
Figure 51. Input Offset Voltage Drift vs Temperature Figure 52. Input Offset Voltage Drift vs Temperature
(OPA192ID and OPA2192ID) (OPA192IDBV, OPA192IDGK, OPA2192IDGK, and
OPA4192IPW)
As shown in Figure 51, the input offset drift is typically less than ±0.3 µV/°C over the range from –40°C to
+125°C. When performing an error analysis over the full specified temperature range, use the typical and
maximum values for input offset voltage drift as described in the Electrical Characteristics tables. If a reduced
temperature range is applicable, use the information shown in Figure 51 or Figure 52 when performing an error
analysis. To determine the change in input offset voltage, use Equation 1:
ΔVOS =ΔT × dVOS/dT
where
ΔVOS = Change in input offset voltage
ΔT = Change in temperature
dVOS/dT = Input offset voltage drift (1)
For example, determine the amount of OPA192ID input offset voltage change over the temperature range of
25°C to 75°C for 1 σ(68%) of the units. As shown in Figure 51, the input offset drift is typically 0.15 µV/°C. This
input offset drift results in a typical input offset voltage change of (75°C 25°C) × 0.15 µV/°C = 7.5 µV .
For 3 σ(99.7%) of the units, Figure 51 shows a typical input offset drift of 0.4 µV/°C. This input offset drift results
in a typical input offset voltage change of (75°C 25°C) × 0.4 µV/°C = 20 µV.
Figure 53 shows six typical units.
Figure 53. Input Offset Voltage Drift vs Temperature for Six Typical Units
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Product Folder Links: OPA192 OPA2192 OPA4192
t
36-V
Differential
Front End Slew
Boost
High
Capacitive Load
Compensation
e-trim
Package Level Trim
IN+
IN
VOUT
OPAx192
NCH Input
Stage
PCH Input
Stage
Output
Stage
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
8 Detailed Description
8.1 Overview
The OPAx192 family of operational amplifiers use e-trim, a method of package-level trim for offset and offset
temperature drift implemented during the final steps of manufacturing after the plastic molding process. This
method minimizes the influence of inherent input transistor mismatch, as well as errors induced during package
molding. The trim communication occurs on the output pin of the standard pinout, and after the trim points are
set, further communication to the trim structure is permanently disabled. The Functional Block Diagram section
shows the simplified diagram of the OPA192 with e-trim.
Unlike previous e-trim op amps, the OPAx192 uses a patented two-temperature trim architecture to achieve a
very low offset voltage of 25 µV (max) and low voltage offset drift of 0.5 µV/°C (max) over the full specified
temperature range. This level of precision performance at wide supply voltages makes these amplifiers useful for
high-impedance industrial sensors, filters, and high-voltage data acquisition.
8.2 Functional Block Diagram
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Product Folder Links: OPA192 OPA2192 OPA4192
±100
±80
±60
±40
±20
0
20
40
60
80
100
0 5 10 15 20 25 30 35 40 45 50 55 60
Output Delta From Final Value (mV)
Time (s)
C040
Standard Input Diode Structure
Extends Settling Time
OPA192 Input Structure
Offers Fast Settling
0.1% Settling = ±10 mV
Input Low Pass Filter
Ron_mux
CS
CS
CD
Sn
Sn+1
D
Simplified Mux Model
RFILT
RFILT
CFILT
CFILT
Vn = +10 V
Vn+1 = ±10 V
+10 V
±10 V
Buffer Amplifier
1
2
Idiode_transient
+10 V ~±9.3 V
1
Vin+
Vin±
~0.7 V Vout
2
±10 V
Ron_mux
OPA192
36 V ~0.7 V
VOUT
V+
VConventional Input Protection
Limits Differential Input Range
OPA192 Provides Full 36-V
Differential Input Range
VIN+
VIN
VOUT
V+
V
VIN+
VIN
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
8.3 Feature Description
8.3.1 Input Protection Circuitry
The OPAx192 uses a unique input architecture to eliminate the need for input protection diodes but still provides
robust input protection under transient conditions. Conventional input diode protection schemes shown in
Figure 54 can be activated by fast transient step responses and can introduce signal distortion and settling time
delays because of alternate current paths, as shown in Figure 55. For low-gain circuits, these fast-ramping input
signals forward-bias back-to-back diodes, causing an increase in input current, and resulting in extended settling
time, as shown in Figure 56.
Figure 54. OPA192 Input Protection Does Not Limit Differential Input Capability
Figure 55. Back-to-Back Diodes Create Settling Issues
Figure 56. OPA192 Protection Circuit Maintains Fast-Settling Transient Response
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Product Folder Links: OPA192 OPA2192 OPA4192
0.0
20.0
40.0
60.0
80.0
100.0
120.0
140.0
160.0
10M 100M 1G 10G
EMIRR IN+ (dB)
Frequency (Hz)
C017
PRF = -10 dBm
VSUPPLY = ±18 V
VCM = 0 V
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
Feature Description (continued)
The OPAx192 family of operational amplifiers provides a true high-impedance differential input capability for high-
voltage applications. This patented input protection architecture does not introduce additional signal distortion or
delayed settling time, making the device an optimal op amp for multichannel, high-switched, input applications.
The OPA192 can tolerate a maximum differential swing (voltage between inverting and noninverting pins of the
op amp) of up to 36 V, making the device suitable for use as a comparator or in applications with fast-ramping
input signals such as multiplexed data-acquisition systems; see Figure 66.
8.3.2 EMI Rejection
The OPAx192 uses integrated electromagnetic interference (EMI) filtering to reduce the effects of EMI from
sources such as wireless communications and densely-populated boards with a mix of analog signal chain and
digital components. EMI immunity can be improved with circuit design techniques; the OPAx192 benefits from
these design improvements. Texas Instruments has developed the ability to accurately measure and quantify the
immunity of an operational amplifier over a broad frequency spectrum extending from 10 MHz to 6 GHz.
Figure 57 shows the results of this testing on the OPA192. Table 2 shows the EMIRR IN+ values for the OPA192
at particular frequencies commonly encountered in real-world applications. Applications listed in Table 2 may be
centered on or operated near the particular frequency shown. Detailed information can also be found in the
application report EMI Rejection Ratio of Operational Amplifiers,SBOA128, available for download from
www.ti.com.
Figure 57. EMIRR Testing
Table 2. OPA192 EMIRR IN+ For Frequencies of Interest
FREQUENCY APPLICATION OR ALLOCATION EMIRR IN+
Mobile radio, mobile satellite, space operation, weather, radar, ultra-high frequency (UHF)
400 MHz 44.1 dB
applications
Global system for mobile communications (GSM) applications, radio communication, navigation,
900 MHz 52.8 dB
GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF applications
1.8 GHz GSM applications, mobile personal communications, broadband, satellite, L-band (1 GHz to 2 GHz) 61.0 dB
802.11b, 802.11g, 802.11n, Bluetooth®, mobile personal communications, industrial, scientific and
2.4 GHz 69.5 dB
medical (ISM) radio band, amateur radio and satellite, S-band (2 GHz to 4 GHz)
3.6 GHz Radiolocation, aero communication and navigation, satellite, mobile, S-band 88.7 dB
802.11a, 802.11n, aero communication and navigation, mobile communication, space and satellite
5.0 GHz 105.5 dB
operation, C-band (4 GHz to 8 GHz)
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VOUT
140ºC
3 V
0 V
Temperature
Normal
Operation
Output
High-Z
150°C
+30 V
RL
100 Ÿ
VIN
3 V
+
3 V
±
IOUT = 30 mA
OPA192
TA = 65°C
PD = 0.81W
JA = 116°C/W
TJ = 116°C/W × 0.81W + 65°C
TJ = 159°C (expected)
+
±
5 V/div
Time (200 s/div)
C011
VIN
VOUT
37 VPP
Sine Wave
(±18.5V)
±
+VOUT
+ 18 V
±18 V
OPA192
+
±
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
8.3.3 Phase Reversal Protection
The OPAx192 family has internal phase-reversal protection. Many op amps exhibit a phase reversal when the
input is driven beyond its linear common-mode range. This condition is most often encountered in noninverting
circuits when the input is driven beyond the specified common-mode voltage range, causing the output to
reverse into the opposite rail. The OPAx192 is a rail-to-rail input op amp; therefore, the common-mode range can
extend up to the rails. Input signals beyond the rails do not cause phase reversal; instead, the output limits into
the appropriate rail. This performance is shown in Figure 58.
Figure 58. No Phase Reversal
8.3.4 Thermal Protection
The internal power dissipation of any amplifier causes its internal (junction) temperature to rise. This
phenomenon is called self heating. The absolute maximum junction temperature of the OPAx192 is 150°C.
Exceeding this temperature causes damage to the device. The OPAx192 has a thermal protection feature that
prevents damage from self heating. The protection works by monitoring the temperature of the device and
turning off the op amp output drive for temperatures above 140°C. Figure 59 shows an application example for
the OPA192 that has significant self heating (159°C) because of its power dissipation (0.81 W). Thermal
calculations indicate that for an ambient temperature of 65°C the device junction temperature must reach 187°C.
The actual device, however, turns off the output drive to maintain a safe junction temperature. Figure 59 shows
how the circuit behaves during thermal protection. During normal operation, the device acts as a buffer so the
output is 3 V. When self heating causes the device junction temperature to increase above 140°C, the thermal
protection forces the output to a high-impedance state and the output is pulled to ground through resistor RL.
Figure 59. Thermal Protection
8.3.5 Capacitive Load and Stability
The OPAx192 features a patented output stage capable of driving large capacitive loads, and in a unity-gain
configuration, directly drives up to 1 nF of pure capacitive load. Increasing the gain enhances the ability of the
amplifier to drive greater capacitive loads; see Figure 60 and Figure 61. The particular op amp circuit
configuration, layout, gain, and output loading are some of the factors to consider when establishing whether an
amplifier will be stable in operation.
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Product Folder Links: OPA192 OPA2192 OPA4192
+
Cload
+
±
Vin
Vout
+Vs
Riso
-Vs
0
5
10
15
20
25
30
35
40
45
50
10p 100p 1n
Overshoot (%)
Capacitive Load (F)
0
25
50
±
+
RI= 1 kO
VIN
+ 18 V
±18 V
CL
OPA192
+
±
RF= 1 kO
RISO
G = -1
C013
RISO = 0
RISO = 25
RISO = 50
RI NŸ RF NŸ
0
5
10
15
20
25
30
35
40
45
50
10p 100p 1n
Overshoot (%)
Capacitive Load (F)
0
25
50
C013
RISO = 0
RISO = 25
RISO = 50
CL
RL
±
+
VIN
+ 18 V
±18 V
OPA192
+
±
RISO
G = +1
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
Figure 60. Small-Signal Overshoot vs Capacitive Load Figure 61. Small-Signal Overshoot vs Capacitive Load
(100-mV Output Step) (100-mV Output Step)
For additional drive capability in unity-gain configurations, improve capacitive load drive by inserting a small
(10 Ωto 20 Ω) resistor, RISO, in series with the output, as shown in Figure 62. This resistor significantly reduces
ringing and maintains dc performance for purely capacitive loads. However, if a resistive load is in parallel with
the capacitive load, then a voltage divider is created, thus introducing a gain error at the output and slightly
reducing the output swing. The error introduced is proportional to the ratio RISO / RL, and is generally negligible at
low output levels. A high capacitive load drive makes the OPA192 well suited for applications such as reference
buffers, MOSFET gate drives, and cable-shield drives. The circuit shown in Figure 62 uses an isolation resistor,
RISO, to stabilize the output of an op amp. RISO modifies the open-loop gain of the system for increased phase
margin, and results using the OPA192 are summarized in Table 3. For additional information on techniques to
optimize and design using this circuit, TI Precision Design TIDU032 details complete design goals, simulation,
and test results.
Figure 62. Extending Capacitive Load Drive with the OPA192
Table 3. OPA192 Capacitive Load Drive Solution Using Isolation Resistor Comparison of Calculated and
Measured Results
PARAMETER VALUE
Capacitive Load 100 pF 1000 pF 0.01 µF 0.1 µF 1 µF
Phase Margin 45° 60° 45° 60° 45° 60° 45° 60° 45° 60°
RISO (Ω)47.0 360.0 24.0 100.0 20.0 51.0 6.2 15.8 2.0 4.7
Measured 23.2 8.6 10.4 22.5 9.0 22.1 8.7 23.1 8.6 21.0 8.6
Overshoot (%)
Calculated PM 45.1° 58.1° 45.8° 59.7° 46.1° 60.1° 45.2° 60.2° 47.2° 60.2°
For step-by-step design procedure, circuit schematics, bill of materials, printed circuit board (PCB) files,
simulation results, and test results, refer to TI Precision Design TIDU032, Capacitive Load Drive Solution using
an Isolation Resistor .
Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 27
Product Folder Links: OPA192 OPA2192 OPA4192
±15.0 ±14.0 «11.0 12.0 13.0 14.0 15.0
Common-Mode Voltage (V)
Input Offset Voltage (V)
200
100
0
±100
±200
±300
Input Offset Voltage vs Vcm
without e-Trim Input
Transition
Region
P-Channel
Region N-Channel
Region
±15.0 ±14.0 «11.0 12.0 13.0 14.0 15.0
Common-Mode Voltage (V)
Input Offset Voltage (V)
200
100
0
±100
±200
±300
Transition
Region
P-Channel
Region N-Channel
Region
OPA192 e-Trim
Input Offset Voltage vs Vcm
NCH3
PCH2
PCH1
IS1
NCH4
-Vsupply
+Vsupply
VIN+
VIN-
FUSE BANK
VOS TRIM VOS DRIFT TRIM
e-TrimTM
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
8.3.6 Common-Mode Voltage Range
The OPAx192 is a 36-V, true rail-to-rail input operational amplifier with an input common-mode range that
extends 100 mV beyond either supply rail. This wide range is achieved with paralleled complementary N-channel
and P-channel differential input pairs, as shown in Figure 63. The N-channel pair is active for input voltages
close to the positive rail, typically (V+) 3 V to 100 mV above the positive supply. The P-channel pair is active
for inputs from 100 mV below the negative supply to approximately (V+) 1.5 V. There is a small transition
region, typically (V+) –3 V to (V+) 1.5 V in which both input pairs are on. This transition region can vary
modestly with process variation, and within this region PSRR, CMRR, offset voltage, offset drift, noise and THD
performance may be degraded compared to operation outside this region.
Figure 63. Rail-to-Rail Input Stage
To achieve the best performance for two-stage rail-to-rail input amplifiers, avoid the transition region when
possible. The OPAx192 uses a precision trim for both the N-channel and P-channel regions. This technique
enables significantly lower levels of offset than previous-generation devices, causing variance in the transition
region of the input stages to appear exaggerated relative to offset over the full common-mode range, as shown in
Figure 64.
Figure 64. Common-Mode Transition vs Standard Rail-to-Rail Amplifiers
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Product Folder Links: OPA192 OPA2192 OPA4192
Power-Supply
ESD Cell
100 Ÿ
100 Ÿ
VSS
VDD
IN±
IN+
+
±
+
±
+
±
R1
RS
RF
TVS
TVS
RL
VIN
+VS
±VS
OPA192
ID
+
±
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
8.3.7 Electrical Overstress
Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress
(EOS). These questions tend to focus on the device inputs, but may involve the supply voltage pins or even the
output pin. Each of these different pin functions have electrical stress limits determined by the voltage breakdown
characteristics of the particular semiconductor fabrication process and specific circuits connected to the pin.
Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them from
accidental ESD events both before and during product assembly.
Having a good understanding of this basic ESD circuitry and its relevance to an electrical overstress event is
helpful. Figure 65 shows an illustration of the ESD circuits contained in the OPAx192 (indicated by the dashed
line area). The ESD protection circuitry involves several current-steering diodes connected from the input and
output pins and routed back to the internal power-supply lines, where the diodes meet at an absorption device or
the power-supply ESD cell, internal to the operational amplifier. This protection circuitry is intended to remain
inactive during normal circuit operation.
Figure 65. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application
Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 29
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OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
An ESD event is very short in duration and very high voltage (for example, 1 kV, 100 ns), whereas an EOS event
is long duration and lower voltage (for example, 50 V, 100 ms). The ESD diodes are designed for out-of-circuit
ESD protection (that is, during assembly, test, and storage of the device before being soldered to the PCB).
During an ESD event, the ESD signal is passed through the ESD steering diodes to an absorption circuit (labeled
ESD power-supply circuit). The ESD absorption circuit clamps the supplies to a safe level.
Although this behavior is necessary for out-of-circuit protection, excessive current and damage is caused if
activated in-circuit. A transient voltage suppressors (TVS) can be used to prevent against damage caused by
turning on the ESD absorption circuit during an in-circuit ESD event. Using the appropriate current limiting
resistors and TVS diodes allows for the use of device ESD diodes to protect against EOS events.
8.3.8 Overload Recovery
Overload recovery is defined as the time required for the op amp output to recover from a saturated state to a
linear state. The output devices of the op amp enter a saturation region when the output voltage exceeds the
rated operating voltage, either due to the high input voltage or the high gain. After the device enters the
saturation region, the charge carriers in the output devices require time to return back to the linear state. After
the charge carriers return back to the linear state, the device begins to slew at the specified slew rate. Thus, the
propagation delay in case of an overload condition is the sum of the overload recovery time and the slew time.
The overload recovery time for the OPAx192 is approximately 200 ns.
8.4 Device Functional Modes
The OPAx192 has a single functional mode and is operational when the power-supply voltage is greater than
4.5 V (±2.25 V). The maximum power supply voltage for the OPAx192 is 36 V (±18 V).
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Product Folder Links: OPA192 OPA2192 OPA4192
SAR
ADC
REFP
VINP
VINM
1
4:2
Mux
+
+
+Antialiasing
Filter
Gain
Network
Gain
Network
Gain
Network
High-Voltage Level Translation
VCM
High-Voltage Multiplexed Input
Reference Driver
2 4
Voltage
Reference RC Filter Buffer RC Filter
16 Bits
400 kSPS
Delay
Digital Counter For Multiplexer
CONV
5
3
Very Low Output Impedance
Input-Filter Bandwidth High-Impedance Inputs
No Differential Input Clamps
Fast Settling-Time Requirements
Attenuate High-Voltage Input Signal
Fast-Settling Time Requirements
Stability of the Input Driver
Attenuate ADC Kickback Noise
VREF Output: Value and Accuracy
Low Temp and Long-Term Drift
Fast logic transition
±20-V,
10-kHz
Sine Wave
±20-V,
10-kHz
Sine Wave
+
+
+
+
Shmidtt
Trigger
Counter
REF3240 Voltage
Divider OPA350
VCM Generation Circuit
n
n
CH0+
CH0-
CH3+
CH3-
OPA192
OPA192
OPA192
OPA192
OPA140
OPA192
OPA192 Gain
Network
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The OPAx192 family offers outstanding dc precision and ac performance. These devices operate up to 36-V
supply rails and offer true rail-to-rail input/output, ultralow offset voltage and offset voltage drift, as well as
10-MHz bandwidth and high capacitive load drive. These features make the OPAx192 a robust, high-
performance operational amplifier for high-voltage industrial applications.
9.2 Typical Applications
9.2.1 16-Bit Precision Multiplexed Data-Acquisition System
Figure 66 shows a 16-bit, differential, 4-channel, multiplexed data-acquisition system. This example is typical in
industrial applications that require low distortion and a high-voltage differential input. The circuit uses the
ADS8864, a 16-bit, 400-kSPS successive-approximation-resistor (SAR) analog-to-digital converter (ADC), along
with a precision, high-voltage, signal-conditioning front end, and a 4-channel differential multiplexer (mux). This
TI Precision Design details the process for optimizing the precision, high-voltage, front-end drive circuit using the
OPA192 and OPA140 to achieve excellent dynamic performance and linearity with the ADS8864.
Figure 66. OPA192 in 16-Bit, 400-kSPS, 4-Channel, Multiplexed Data Acquisition System for High-Voltage
Inputs with Lowest Distortion
9.2.1.1 Design Requirements
The primary objective is to design a ±20 V, differential 4-channel multiplexed data acquisition system with lowest
distortion using the 16-bit ADS8864 at a throughput of 400 kSPS for a 10 kHz full-scale pure sine-wave input.
The design requirements for this block design are:
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Integral Nonlinearity Error (LSB)
2.0
1.5
1.0
0.5
0
–0.5
–1.0
–1.5
–2.0
ADC Differential Input (V)
–20 –15 –10 –5 0 5 10 15 20
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
Typical Applications (continued)
System Supply Voltage: ±15 V
ADC Supply Voltage: 3.3 V
ADC Sampling Rate: 400 kSPS
ADC Reference Voltage (REFP): 4.096 V
System Input Signal: A high-voltage differential input signal with a peak amplitude of 10 V and frequency
(fIN) of 10 kHz are applied to each differential input of the mux.
9.2.1.2 Detailed Design Procedure
The purpose of this precision design is to design an optimal high voltage multiplexed data acquisition system for
highest system linearity and fast settling. The overall system block diagram is illustrated in Figure 66. The circuit
is a multichannel data acquisition signal chain consisting of an input low-pass filter, multiplexer (mux), mux output
buffer, attenuating SAR ADC driver, digital counter for mux and the reference driver. The architecture allows fast
sampling of multiple channels using a single ADC, providing a low-cost solution. The two primary design
considerations to maximize the performance of a precision multiplexed data acquisition system are the mux input
analog front-end and the high-voltage level translation SAR ADC driver design. However, carefully design each
analog circuit block based on the ADC performance specifications in order to achieve the fastest settling at 16-bit
resolution and lowest distortion system. The diagram includes the most important specifications for each
individual analog block.
This design systematically approaches each analog circuit block to achieve a 16-bit settling for a full-scale input
stage voltage and linearity for a 10-kHz sinusoidal input signal at each input channel. The first step in the design
is to understand the requirement for extremely low impedance input-filter design for the mux. This understanding
helps in the decision of an appropriate input filter and selection of a mux to meet the system settling
requirements. The next important step is the design of the attenuating analog front-end (AFE) used to level
translate the high-voltage input signal to a low-voltage ADC input when maintaining amplifier stability. The next
step is to design a digital interface to switch the mux input channels with minimum delay. The final design
challenge is to design a high-precision, reference-driver circuit that provides the required REFP reference voltage
with low offset, drift, and noise contributions.
9.2.1.3 Application Curve
Figure 67. ADC 16-Bit Linearity Error for the Multiplexed Data Acquisition Block
For step-by-step design procedure, circuit schematics, bill of materials, PCB files, simulation results, and test
results, refer to TI Precision Design TIDU181, 16-bit, 400-kSPS, 4-Channel, Multiplexed Data Acquisition
System for High Voltage Inputs with Lowest Distortion.
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Product Folder Links: OPA192 OPA2192 OPA4192
VCC
VEE
R2
1.6 MŸ
VOUT
V+
+
VIN
RL
10 kŸ
R1
1.69 kŸ
C1
470 nF
Op Amp Gain Stage Slew Rate Limiter
OPA192
VCC
VEE
V+
OPA192
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
9.2.2 Slew Rate Limit for Input Protection
In control systems for valves or motors, abrupt changes in voltages or currents can cause mechanical damages.
By controlling the slew rate of the command voltages into the drive circuits, the load voltages ramps up and down
at a safe rate. For symmetrical slew-rate applications (positive slew rate equals negative slew rate), one
additional op amp provides slew-rate control for a given analog gain stage. The unique input protection and high
output current and slew rate of the OPAx192 make the device an optimal amplifier to achieve slew rate control
for both dual- and single-supply systems.Figure 68 shows the OPA192 in a slew-rate limit design.
Figure 68. Slew Rate Limiter Uses One Op Amp
For step-by-step design procedure, circuit schematics, bill of materials, PCB files, simulation results, and test
results, refer to TI Precision Design TIDU026, Slew Rate Limiter Uses One Op Amp.
Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 33
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RF
1 kŸ
CL
10 µF
RISO
37.4 Ÿ
VREF
2.5 V
RFx
10 kŸ CF
39 nF
V+
OPA192 VOUT
VCC
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
9.2.3 Precision Reference Buffer
The OPAx192 features high output current drive capability and low input offset voltage, making the device an
excellent reference buffer to provide an accurate buffered output with ample drive current for transients. For the
10-µF ceramic capacitor shown in Figure 69, RISO, a 37.4-Ωisolation resistor, provides separation of two
feedback paths for optimal stability. Feedback path number one is through RFand is directly at the output, VOUT.
Feedback path number two is through RFx and CFand is connected at the output of the op amp. The optimized
stability components shown for the 10-µF load give a closed-loop signal bandwidth at VOUT of 4 kHz and still
provides a loop gain phase margin of 89°. Any other load capacitances require recalculation of the stability
components: RF, RFx , CF, and RISO.
Figure 69. Precision Reference Buffer
34 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated
Product Folder Links: OPA192 OPA2192 OPA4192
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
10 Power-Supply Recommendations
The OPAx192 is specified for operation from 4.5 V to 36 V (±2.25 V to ±18 V); many specifications apply from
–40°C to +125°C. Parameters that can exhibit significant variance with regard to operating voltage or
temperature are presented in the Typical Characteristics.
CAUTION
Supply voltages larger than 40 V can permanently damage the device; see the
Absolute Maximum Ratings.
Place 0.1-μF bypass capacitors close to the power-supply pins to reduce errors coupling in from noisy or high-
impedance power supplies. For more detailed information on bypass capacitor placement, refer to the Layout
section.
11 Layout
11.1 Layout Guidelines
For best operational performance of the device, use good PCB layout practices, including:
Noise can propagate into analog circuitry through the power pins of the circuit as a whole and op amp
itself. Bypass capacitors are used to reduce the coupled noise by providing low-impedance power
sources local to the analog circuitry.
Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as
close to the device as possible. A single bypass capacitor from V+ to ground is applicable for single-
supply applications.
Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective
methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground
planes. A ground plane helps distribute heat and reduces EMI noise pickup. Make sure to physically
separate digital and analog grounds paying attention to the flow of the ground current. For more detailed
information refer to Circuit Board Layout Techniques,SLOA089.
In order to reduce parasitic coupling, run the input traces as far away from the supply or output traces as
possible. If these traces cannot be kept separate, crossing the sensitive trace perpendicular is much
better as opposed to in parallel with the noisy trace.
Place the external components as close to the device as possible. As illustrated in Figure 70, keeping RF
and RG close to the inverting input minimizes parasitic capacitance.
Keep the length of input traces as short as possible. Always remember that the input traces are the most
sensitive part of the circuit.
Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly
reduce leakage currents from nearby traces that are at different potentials.
Cleaning the PCB following board assembly is recommended for best performance.
Any precision integrated circuit may experience performance shifts due to moisture ingress into the
plastic package. Following any aqueous PCB cleaning process, baking the PCB assembly is
recommended to remove moisture introduced into the device packaging during the cleaning process. A
low temperature, post cleaning bake at 85°C for 30 minutes is sufficient for most circumstances.
Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 35
Product Folder Links: OPA192 OPA2192 OPA4192
N/C
±IN
+IN
V±
V+
OUTPUT
N/C
N/C
VS+
GND
VS±
GND Ground (GND) plane on another layer
VOUT
VIN
GND
Run the input traces
as far away from
the supply lines
as possible
Use low-ESR, ceramic
bypass capacitor
RF
RG
Place components
close to device and to
each other to reduce
parasitic errors
+
VIN VOUT
RG
RF
(Schematic Representation)
Use low-ESR,
ceramic bypass
capacitor
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
11.2 Layout Example
Figure 70. Operational Amplifier Board Layout for Noninverting Configuration
36 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated
Product Folder Links: OPA192 OPA2192 OPA4192
OPA192
,
OPA2192
,
OPA4192
www.ti.com
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
12 Device and Documentation Support
12.1 Device Support
12.1.1 Development Support
12.1.1.1 TINA-TI™ (Free Software Download)
TINA™ is a simple, powerful, and easy-to-use circuit simulation program based on a SPICE engine. TINA-TI is a
free, fully-functional version of the TINA software, preloaded with a library of macro models in addition to a range
of both passive and active models. TINA-TI provides all the conventional dc, transient, and frequency domain
analysis of SPICE, as well as additional design capabilities.
Available as a free download from the Analog eLab Design Center, TINA-TI offers extensive post-processing
capability that allows users to format results in a variety of ways. Virtual instruments offer the ability to select
input waveforms and probe circuit nodes, voltages, and waveforms, creating a dynamic quick-start tool.
NOTE
These files require that either the TINA software (from DesignSoft™) or TINA-TI software
be installed. Download the free TINA-TI software from the TINA-TI folder.
12.1.1.2 TI Precision Designs
The OPA192 is featured in several TI Precision Designs, available online at
http://www.ti.com/ww/en/analog/precision-designs/. TI Precision Designs are analog solutions created by TI’s
precision analog applications experts and offer the theory of operation, component selection, simulation,
complete PCB schematic and layout, bill of materials, and measured performance of many useful circuits.
12.2 Documentation Support
12.2.1 Related Documentation
Circuit Board Layout Techniques,SLOA089.
Op Amps for Everyone,SLOD006.
12.3 Related Links
Table 4 lists quick access links. Categories include technical documents, support and community resources,
tools and software, and quick access to sample or buy.
Table 4. Related Links
TECHNICAL TOOLS & SUPPORT &
PARTS PRODUCT FOLDER SAMPLE & BUY DOCUMENTS SOFTWARE COMMUNITY
OPA192 Click here Click here Click here Click here Click here
OPA2192 Click here Click here Click here Click here Click here
OPA4192 Click here Click here Click here Click here Click here
12.4 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 37
Product Folder Links: OPA192 OPA2192 OPA4192
OPA192
,
OPA2192
,
OPA4192
SBOS620E DECEMBER 2013REVISED NOVEMBER 2015
www.ti.com
12.5 Trademarks
e-trim, E2E are trademarks of Texas Instruments.
TINA-TI is a trademark of Texas Instruments, Inc and DesignSoft, Inc.
Bluetooth is a registered trademark of Bluetooth SIG, Inc.
TINA, DesignSoft are trademarks of DesignSoft, Inc.
All other trademarks are the property of their respective owners.
12.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.7 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical packaging and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
38 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated
Product Folder Links: OPA192 OPA2192 OPA4192
PACKAGE OPTION ADDENDUM
www.ti.com 3-Dec-2015
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
OPA192ID ACTIVE SOIC D 8 75 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OPA192
OPA192IDBVR ACTIVE SOT-23 DBV 5 3000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OUYS
OPA192IDBVT ACTIVE SOT-23 DBV 5 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OUYS
OPA192IDGKR ACTIVE VSSOP DGK 8 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OUXS
OPA192IDGKT ACTIVE VSSOP DGK 8 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OUXS
OPA192IDR ACTIVE SOIC D 8 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OPA192
OPA2192ID ACTIVE SOIC D 8 75 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 2192
OPA2192IDGKR ACTIVE VSSOP DGK 8 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OVLM
OPA2192IDGKT ACTIVE VSSOP DGK 8 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OVLM
OPA2192IDR ACTIVE SOIC D 8 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 2192
OPA4192ID ACTIVE SOIC D 14 50 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR -40 to 125 OPA4192
OPA4192IDR ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR -40 to 125 OPA4192
OPA4192IPW ACTIVE TSSOP PW 14 90 Green (RoHS
& no Sb/Br) CU SN Level-3-260C-168 HR -40 to 125 OPA4192
OPA4192IPWR ACTIVE TSSOP PW 14 2000 Green (RoHS
& no Sb/Br) CU SN Level-3-260C-168 HR -40 to 125 OPA4192
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
PACKAGE OPTION ADDENDUM
www.ti.com 3-Dec-2015
Addendum-Page 2
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
OPA192IDBVR SOT-23 DBV 5 3000 180.0 8.4 3.23 3.17 1.37 4.0 8.0 Q3
OPA192IDBVT SOT-23 DBV 5 250 180.0 8.4 3.23 3.17 1.37 4.0 8.0 Q3
OPA192IDGKR VSSOP DGK 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
OPA192IDGKT VSSOP DGK 8 250 177.8 12.4 5.3 3.4 1.4 8.0 12.0 Q1
OPA192IDR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1
OPA2192IDGKR VSSOP DGK 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
OPA2192IDGKT VSSOP DGK 8 250 177.8 12.4 5.3 3.4 1.4 8.0 12.0 Q1
OPA2192IDR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1
OPA4192IDR SOIC D 14 2500 330.0 16.4 6.5 9.0 2.1 8.0 16.0 Q1
OPA4192IPWR TSSOP PW 14 2000 330.0 12.4 6.9 5.6 1.6 8.0 12.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 3-Aug-2017
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
OPA192IDBVR SOT-23 DBV 5 3000 223.0 270.0 35.0
OPA192IDBVT SOT-23 DBV 5 250 223.0 270.0 35.0
OPA192IDGKR VSSOP DGK 8 2500 358.0 335.0 35.0
OPA192IDGKT VSSOP DGK 8 250 223.0 270.0 35.0
OPA192IDR SOIC D 8 2500 367.0 367.0 35.0
OPA2192IDGKR VSSOP DGK 8 2500 346.0 346.0 29.0
OPA2192IDGKT VSSOP DGK 8 250 223.0 270.0 35.0
OPA2192IDR SOIC D 8 2500 367.0 367.0 35.0
OPA4192IDR SOIC D 14 2500 367.0 367.0 38.0
OPA4192IPWR TSSOP PW 14 2000 367.0 367.0 35.0
PACKAGE MATERIALS INFORMATION
www.ti.com 3-Aug-2017
Pack Materials-Page 2
www.ti.com
PACKAGE OUTLINE
C
TYP
0.22
0.08
0.25
3.0
2.6
2X 0.95
1.9
1.45 MAX
TYP
0.15
0.00
5X 0.5
0.3
TYP
0.6
0.3
TYP
8
0
1.9
A
3.05
2.75
B
1.75
1.45
(1.1)
SOT-23 - 1.45 mm max heightDBV0005A
SMALL OUTLINE TRANSISTOR
4214839/C 04/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Refernce JEDEC MO-178.
0.2 C A B
1
34
5
2
INDEX AREA
PIN 1
GAGE PLANE
SEATING PLANE
0.1 C
SCALE 4.000
www.ti.com
EXAMPLE BOARD LAYOUT
0.07 MAX
ARROUND 0.07 MIN
ARROUND
5X (1.1)
5X (0.6)
(2.6)
(1.9)
2X (0.95)
(R0.05) TYP
4214839/C 04/2017
SOT-23 - 1.45 mm max heightDBV0005A
SMALL OUTLINE TRANSISTOR
NOTES: (continued)
4. Publication IPC-7351 may have alternate designs.
5. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
SYMM
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:15X
PKG
1
34
5
2
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
EXPOSED METAL
METAL
SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK DETAILS
EXPOSED METAL
www.ti.com
EXAMPLE STENCIL DESIGN
(2.6)
(1.9)
2X(0.95)
5X (1.1)
5X (0.6)
(R0.05) TYP
SOT-23 - 1.45 mm max heightDBV0005A
SMALL OUTLINE TRANSISTOR
4214839/C 04/2017
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
7. Board assembly site may have different recommendations for stencil design.
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE:15X
SYMM
PKG
1
34
5
2
www.ti.com
PACKAGE OUTLINE
C
TYP
0.22
0.08
0.25
3.0
2.6
2X 0.95
1.9
1.45 MAX
TYP
0.15
0.00
5X 0.5
0.3
TYP
0.6
0.3
TYP
8
0
1.9
A
3.05
2.75
B
1.75
1.45
(1.1)
SOT-23 - 1.45 mm max heightDBV0005A
SMALL OUTLINE TRANSISTOR
4214839/C 04/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Refernce JEDEC MO-178.
0.2 C A B
1
34
5
2
INDEX AREA
PIN 1
GAGE PLANE
SEATING PLANE
0.1 C
SCALE 4.000
www.ti.com
EXAMPLE BOARD LAYOUT
0.07 MAX
ARROUND 0.07 MIN
ARROUND
5X (1.1)
5X (0.6)
(2.6)
(1.9)
2X (0.95)
(R0.05) TYP
4214839/C 04/2017
SOT-23 - 1.45 mm max heightDBV0005A
SMALL OUTLINE TRANSISTOR
NOTES: (continued)
4. Publication IPC-7351 may have alternate designs.
5. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
SYMM
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:15X
PKG
1
34
5
2
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
EXPOSED METAL
METAL
SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK DETAILS
EXPOSED METAL
www.ti.com
EXAMPLE STENCIL DESIGN
(2.6)
(1.9)
2X(0.95)
5X (1.1)
5X (0.6)
(R0.05) TYP
SOT-23 - 1.45 mm max heightDBV0005A
SMALL OUTLINE TRANSISTOR
4214839/C 04/2017
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
7. Board assembly site may have different recommendations for stencil design.
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE:15X
SYMM
PKG
1
34
5
2
IMPORTANT NOTICE
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Copyright © 2018, Texas Instruments Incorporated
Mouser Electronics
Authorized Distributor
Click to View Pricing, Inventory, Delivery & Lifecycle Information:
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OPA2192IDR OPA2192ID OPA2192IDGKT OPA2192IDGKR