MC33CD1030AE - FREESCALE - Datasheet.Directory

* This document contains certain information on a new product.

Specifications and information herein are subject to change without notice.

Document Number: CD1030

Rev. 4.0, 3/2017

NXP Semiconductors

Data sheet: Advance Information

33 channel multiple switch detection

interface with programmable wetting

current

The CD1030 is designed to detect the closing and opening of up to 33 switch

contacts. The switch status, either open or closed, is transferred to the

microprocessor unit (MCU) through a serial peripheral interface (SPI). This

SMARTMOS device also features a 35-to-1 analog multiplexer for reading the

input channels as analog inputs. The analog selected input signal is buffered

and provided on the AMUX output pin for the MCU to read.

Independent programmable wetting currents are available as needed for the

application. A battery and temperature monitor are included in the IC and

available via the AMUX pin.

The CD1030 device has two modes of operation, Normal and Low-power mode

(LPM). Normal mode allows programming of the device and supplies switch

contacts with pull-up or pull-down current as it monitors the change of state on

the switches. The LPM provides low quiescent current, which makes the

CD1030 ideal for automotive and industrial products requiring low sleep-state

currents.

Features

• Fully functional operation 4.5 V ≤ VBATP ≤ 36 V

• Full parametric operation 6.0 V ≤ VBATP ≤ 28 V

• Operating switch input voltage range from -1.0 V to 36 V

• 12 programmable inputs (switches to battery or ground)

• 21 switch-to-ground inputs

• Selectable wetting current (2.0, 6.0, 8.0, 10, 12, 14, 16, or 20 mA)

• Interfaces directly to an MCU using 3.3 V / 5.0 V SPI protocol

• Selectable wake-up on change of state

• Typical standby current IBATP = 50 μA and IDDQ = 10 μA

• Active interrupt (INT_B) on switch state change

• Integrated battery and temperature sensing

Figure 1. CD1030 simplified application diagram

MULTIPLE SWITCH DETECTION INTERFACE

CD1030

Applications

• Automotive

• Heating ventilation and air conditioning (HVAC)

• Lighting

• Central gateway / in-vehicle networking

• Gasoline engine management

• Industrial

• Programmable logic control (PLC)

• Process control, temperature control

• Input-output control (I/O Control)

• Single board computer

• Ethernet switch

AE SUFFIX (PB-FREE)

98ASA00173D

48-PIN LQFP-EP

SP0

SG1

SG20

SG0

SP11

SP1

Battery

VBATP

VDDQ

MISO

MOSI

SCLK

AMUX

GND

WAKE_B

Battery

Power

Supply

Power

Supply

VDDQ

MCU

MISO

MOSI

SCLK

AN0

INT_B

CS_B CSB

INTB

SG1

CD1030

Analog Integrated Circuit Device Data

NXP Semiconductors 2

CD1030

Table of Contents

1 Orderable parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

2 Internal block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

3 Pin connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

3.1 Pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

3.2 Pin definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

4 General product characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

4.1 Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

4.2 Thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

4.3 Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

4.4 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

5 General description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

5.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

5.2 Functional block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

6 General IC functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

6.1 Battery voltage ranges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

6.2 Power sequencing conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

6.3 Low-power mode operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

7 Functional block description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

7.1 State machine . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

7.2 Input functional block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

7.3 Oscillator and timer control functional block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

7.4 Temperature monitor and control functional block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

7.5 WAKE_B control functional block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

7.6 INT_B functional block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

7.7 AMUX functional block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

7.8 Serial peripheral interface (SPI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

7.9 SPI control register definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

8 Typical applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

8.1 Application diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

8.2 Bill of materials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

8.3 Abnormal operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

9 Packaging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

9.1 Package mechanical dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62

10 Reference section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

11 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66

Analog Integrated Circuit Device Data

3NXP Semiconductors

CD1030

1 Orderable parts

This section describes the part numbers available to be purchased along with their differences.

Table 1. Orderable part variations

Part number Temperature (TA)Package Notes

MC33CD1030AE -40 °C to 125 °C LQFP 48 pins (1)

Notes

1. To order parts in tape and reel, add the R2 suffix to the part number.

Analog Integrated Circuit Device Data

NXP Semiconductors 4

CD1030

2 Internal block diagram

Figure 2. CD1030 internal block diagram

Wetting (2.0 mA to 20 mA)

Sustain (2.0 mA)

Low Power Mode (1.0 mA)

VBATP

To SPI

SG0

VBATP

4.0 V

reference

To SPI

SP0-7

Internal 2.5 V

VBATP

VDDQ

Inputs

SG0

SG2

SG1

SG20

SP11

SP0

SP1

AMUX

VBATP

VDDQ

GND

SCLK

MOSI

MISO

CS_B

WAKE_B

INT_B

Oscillator

and

Clock control

VBATP, VDDQ

Internal 2.5 V/5.0 V

Power On Reset

Bandgap reference

Sleep Power

Temperature

Monitor and

Control

SPI Interface and

Control

Internal 2.5 V

VDDQ

Mux control

Interrupt

control

VDDQ

125 kΩ

WAKE_B control

VDDQ

125 kΩ

Internal 2.5 V

VBATP

Internal 2.5 V

4.0 V

reference

VBATP

To SPI

SGx

4.0 V

reference

VBATP

To SPI

SG5

4.0 V

reference

SG5

1/6 Ratio

VDDQ

125 kΩ

Wetting (2.0 mA to 20 mA)

Sustain (2.0 mA)

Low Power Mode (1.0 mA)

Wetting (2.0 mA to 20 mA)

Sustain (2.0 mA)

Low Power Mode (1.0 mA)

Wetting (2.0 mA to 20 mA)

Sustain (2.0 mA)

Low Power Mode (1.0 mA)

Wetting (2.0 mA to 20 mA)

Sustain (2.0 mA)

Low Power Mode (2.0 mA)

Analog Integrated Circuit Device Data

5NXP Semiconductors

CD1030

3 Pin connections

3.1 Pinout

Figure 3. CD1030 LQFP-48 package pinout

3.2 Pin definitions

Table 2. CD1030 pin definitions

Pin number Pin name Function Formal name Definition

1 - 3

SP2 - SP4

SP0

SP1

Input Programmable

Switches 0 – 4 Switch to programmable input pins (SB or SG)

4 - 15 SG0 - SG11 Input Switch-to-Ground

Inputs 0 – 11 Switch-to-ground input pins

18 NC1 -Not Connect Not connect

19 GND1 Ground Ground Ground for logic, analog

20 WAKE_B Input/Output Wake-up Open drain wake-up output. Designed to control a power supply enable pin.

Input used to allow a wake-up from an external event.

21 NC2 -Not Connect Not connect

22 - 30 SG12 - SG20 Input Switch-to-Ground

Inputs 12– 20 Switch-to-ground input pins

31 - 37 SP5 - SP11 Input Programmable

Switches 5 – 11 Switch to programmable input pins (SB or SG)

38 INT_B Input/Output Interrupt

Open-drain output to MCU. Used to indicate an input switch change of state.

Used as an input to allow wake-up from LPM via an external INT_B falling

event.

Transparent Top View

SP2

SP3

SP4

SG0

SG1

SG2

SG3

SG4

SG5

SG6

SG7

SG8

SG14

SG13

SG12

NC2

WAKE_B

GND1

NC1

VBATP2

VBATP1

SG11

SG10

SG9

SP10

SP9

SP8

SP7

SP6

SP5

SG20

SG19

SG18

SG17

SG16

SG15

SP1

SP0

CS_B

SCLK

MOSI

GND3

GND2

MISO

VDDQ

AMUX

INT_B

SP11

Analog Integrated Circuit Device Data

NXP Semiconductors 6

CD1030

39 AMUX Output Analog Multiplex Output Analog multiplex output.

40 VDDQ Input Voltage Drain Supply 3.3 V/ 5.0 V supply. Sets SPI communication level for the MISO driver and I/O

level buffer

41 MISO Output/SPI SPI Slave Out Provides digital data from the CD1030 to the MCU

44 MOSI Input/SPI SPI Slave In SPI control data input pin from the MCU

45 SCLK Input/SPI Serial Clock SPI control clock input pin

46 CS_B Input/SPI Chip Select SPI control chip select input pin

VBATP1

VBATP2 Power Battery Input Battery supply input pin. Pin requires external reverse battery protection

GND2

GND3 Ground Ground Ground for logic, analog

EP EP Ground Exposed Pad It is recommended to terminated the exposed pad to GND and system ground.

Table 2. CD1030 pin definitions

Pin number Pin name Function Formal name Definition

Analog Integrated Circuit Device Data

7NXP Semiconductors

CD1030

4 General product characteristics

4.1 Maximum ratings

Table 3. Maximum ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage

to the device.

Symbol Description (Rating) Min. Max. Unit Notes

Electrical Ratings

VBATP Battery Voltage -0.3 40 V

VDDQ Supply Voltage -0.3 7.0 V

CS_B, MOSI,

MISO, SCLK SPI Inputs/Outputs -0.3 7.0 V

SGx, SPx Switch Input Range -14(2) 38 V

AMUX AMUX -0.3 7.0 V

INT_B INT_B -0.3 7.0 V

WAKE_B WAKE_B -0.3 40 V

VESD1-2

VESD1-3

VESD2-1

VESD2-2

ESD Voltage

• Human Body Model (HBM) (VBATP versus GND)

• Human Body Model (HBM) (All other pins)

• Charge Device Model (CDM) (Corners pins)

• Charge Device Model (CDM) (All other pins)

±4000

±2000

±750

±500

V(3)

VESD5-3

VESD5-4

VESD6-1

VESD6-2

Contact Discharge

• VBATP

• WAKE_B (series resistor 10 kΩ)

• SGx and SPx pins with 100 nF capacitor (100 Ω series R) based on

external protection performance

• SGx and SPx pins with 47 nF capacitor (50 Ω series R)

±8000

±8000(5)

V(4),(6)

Notes

2. Minimum value of -18 V is guaranteed by design for switch input voltage range (SGx, SPx).

3. ESD testing is performed in accordance AEC Q100, with the Human Body Model (HBM) (CZAP = 100 pF, RZAP = 1500 Ω), the Machine Model (MM)

(CZAP = 200 pF, RZAP = 0 Ω), and the Charge Device Model (CDM).

4. CZAP = 330 pF, RZAP = 2.0 kΩ (Powered and unpowered) / CZAP = 150 pF, RZAP = 330 Ω (Unpowered)

5. CZAP = 150 pF, RZAP = 330 Ω (Unpowered)

6. See Table 4 for minimum external component requirements at system level.

Table 4. External component requirements

VBATP Pin

CBULK = 100 μF minimum aluminum electrolytic

CBYPASS = 100 nf ±37% minimum ceramic

Reverse blocking diode [0.6 V < VFWD < 1.0 V)

VDDQ Pin CBULK 10 μF Typical aluminum electrolytic (If required by the application)

CBYPASS 100 nF minimum ceramic

SGx/SPx Pins 47 nf < CESD < 100 nF typ ±37%

50 Ω < RESD < 100 Ω typical

Switch Load 5.0 Ω < RSW < 100 Ω Lumped element, includes wire harness

100 kΩ < RSW isolation < ∞

AMUX Output External capacitor at AMUX Output

CAMUX = 1.0 nF

Analog Integrated Circuit Device Data

NXP Semiconductors 8

CD1030

4.2 Thermal characteristics

Table 5. Thermal ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage

to the device.

Symbol Description (Rating) Min. Max. Unit Notes

Thermal Ratings

Operating Temperature

• Ambient

• Junction

-40

125

150

°C

TSTG Storage Temperature -65 150 °C

TPPRT Peak Package Reflow Temperature During Reflow – – °C

Thermal Resistance

RΘJA

Junction-to-Ambient, Natural Convection, Single-layer Board

• 48 LQFP 75.4 °C/W (7),(8)

RΘJB Junction-to-Board 13.8 °C/W (9)

RΘJC

Junction-to-Case (Bottom)

• 48 LQFP 1.5 °C/W (10)

ΨJT

Junction-to-Package (Top), Natural convection

• 48 LQFP 4.7 °C/W (11)

Package Dissipation Ratings

TSD

Thermal Shutdown

• 48 LQFP 155 185 °C

TSDH

Thermal Shutdown Hysteresis

• 48 LQFP 3.0 15 °C

Moisture Sensitivity Level

Moisture Moisture Sensitivity Level per AEC-Q-100 Level 3

Notes

7. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient

temperature, air flow, power dissipation of other components on the board, and board thermal resistance.

8. Per JEDEC JESD51-2 with natural convection for horizontally oriented board. Board meets JESD51-9 specification for 1s or 2s2p board,

respectively.

9. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the

board near the package.

10. Thermal resistance between the die and the solder pad on the bottom of the package based on simulation without any interface resistance.

11. Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2.

When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.

Analog Integrated Circuit Device Data

9NXP Semiconductors

CD1030

4.3 Operating conditions

This section describes the operating conditions of the device. Conditions apply to all the following data, unless otherwise noted.

Table 6. Operating conditions

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage

to the device.

Symbol Ratings Min. Max. Unit Notes

VBATP Battery Voltage 4.5 36 V

VDDQ Supply Voltage 3.0 5.25 V

CS_B, MOSI,

MISO, SCLK SPI Inputs / Outputs 3.0 5.25 V

SGx, SPx Switch Input Range -1.0 36 V

AMUX, INT_B AMUX, INT_B 0.0 5.25 V

WAKE_B WAKE_B 0.0 36 V

Analog Integrated Circuit Device Data

NXP Semiconductors 10

CD1030

4.4 Electrical characteristics

4.4.1 Static electrical characteristics

Table 7. Static electrical characteristics

TA = - 40 °C to +125 °C, VDDQ = 3.1 V to 5.25 V, VBATP = 6.0 V to 28.0 V, unless otherwise noted.

Symbol Characteristic Min. Typ. Max. Units Notes

Power Input

VBATP(POR)

VBATP Supply Voltage POR

• VBATP Supply Power on Reset voltage 2.7 3.3 3.8 V

VBATPUV VBATP Undervoltage Rising Threshold — 4.3 4.5 V

VBATPUVHYS VBATP Undervoltage Hysteresis 250 — 500 mV

VBATPOV VBATP Overvoltage Rising Threshold 32 — 37 V

VBATPOVHYS VBATP Overvoltage Hysteresis 1.5 — 3.0 V

IBAT(on)

VBATP Supply Current

• All switches open, Normal mode, Tri-state disabled all channels —1216mA

IBATP,IQ,LPM,P

IBATP,IQ,LPM,F

VBATP Low-power Mode Supply Current (polling disabled)

• Parametric VBATP, 6.0 V < VBATP < 28 V

• Functional Low VBATP, 4.5 V < VBATP < 6.0 V

—

μA(14)

IPOLLING,IQ

VBATP Polling Quiescent Current (no load)

• Polling rate = 3.0 ms

• Wake-up enable all channels

• All switches open

——20μA(12),(13)

IVDDQ,NORMAL

Normal Mode (IVDDQ)

•SCLK, MOSI, WAKE_B = 0 V, CS_B, INT_B = VDDQ, no SPI

communication, AMUX selected no input

— — 500 μA

IVDDQ,LPM

Logic Low-power Mode Supply Current

• SCLK, MOSI = 0 V, CS_B, INT_B, WAKE_B = VDDQ, no SPI

communication

——10μA

VDDQUV VDDQ Undervoltage Falling Threshold 2.2 — 2.8 V

VDDQUVHYS VDDQ Undervoltage Hysteresis 150 — 350 mV

VGNDOFFSET

Ground Offset

• Ground offset of Global pins to IC ground -1.0 — 1.0 V

Switch Detection Interface (SG and SP)

VICTHR Switch Detection Threshold 3.7 4.0 4.3 V (20)

VICTHRLV

Switch Detection Threshold Low Battery

• VBATP 4.5 V to 6.0 V

0.55 *

VBATP

—4.3 V

VICTHRLPM Switch Detection Threshold Low-power Mode (SG only) 100 — 300 mV (21)

VICTHRH Switch Detection Threshold Hysteresis (4.0 V threshold) 80 — 300 mV

VICTH2P5

Input Threshold 2.5 V,

• Used for Comp Only 2.0 2.5 3.0 V

Analog Integrated Circuit Device Data

11 NXP Semiconductors

CD1030

Switch to ground Input (SG pins)

ILEAKSG_GND

Leakage to GND

• Inputs tri-stated, voltage at SGx = 36 V; VBATP = 0 V ——2.0μA

ILEAKSG_BAT

Leakage to Battery

• Inputs tri-stated, voltage at SGx = GND ——2.0μA

ISUSSG

SG Sustain Current

• VBATP 6.0 V to 28 V 1.6 2.0 2.4 mA

ISUSSGLV

SG Sustain Current LV(15)

• VBATP 4.5 V to 6.0 V 1.0 — 2.4 mA

IWETSG

Wetting Current Level

• Mode 0 = 2.0 mA

• Mode 1 = 6.0 mA

• Mode 2 = 8.0 mA

• Mode 3 = 10 mA

• Mode 4 = 12 mA

• Mode 5 = 14 mA

• Mode 6 = 16 mA

• Mode 7 = 20 mA

—

2.0

6.0

8.0

—mA

IWETSGTOL

SG Wetting Current Tolerance

• Mode 0

• Mode 1 to 7

-20

-10

—

IWETSGLV

SG Wetting Current Tolerance LV (VBATP 4.5 V to 6.0 V)(15)

• Mode 0 = 2.0 mA

• Mode 1 = 6.0 mA

• Mode 2 = 8.0 mA

• Mode 3 = 10 mA

• Mode 4 = 12 mA

• Mode 5 = 14 mA

• Mode 6 = 16 mA

• Mode 7 = 20 mA

1.0

2.0

—

2.4

6.6

8.8

11.0

13.2

15.4

17.6

22.0

IMATCH(SUS) Sustain Current Matching Between SG Channels — — 10 % (16), (17)

IMATCH(WET) Wetting Current Matching Between SG Channels — — 6.0 % (18), (19)

IACTIVEPOLLSG

Low-power Mode Polling Current SG

• VBATP 4.5 V to 28 V 0.7 1.0 1.44 mA

Programmable Input (SP pins)

ILEAKSP_GND

Leakage to GND

• Inputs tri-stated, voltage at SPx = 36 V; VBATP = 0 V ——2.0μA

ILEAKSP_BAT

Leakage to Battery

• Inputs tri-stated, voltage at SPx = GND ——2.0μA

ISUSSP

SP Sustain current (VBATP 6.0 V to 28 V)

• SP programmed as SG

• SP programmed as SB

1.6

1.75

2.0

2.2

2.4

2.85

ISUSSPLV

SP Sustain current - LV (VBATP 4.5 V to 6.0 V)

• SP programmed as SG 1.0 — 2.4 mA (15)

IWET0SP

Wetting Current Level Mode 0

• SP programmed as SG

• SP programmed as SB

—

2.0

2.2

—

Table 7. Static electrical characteristics (continued)

TA = - 40 °C to +125 °C, VDDQ = 3.1 V to 5.25 V, VBATP = 6.0 V to 28.0 V, unless otherwise noted.

Symbol Characteristic Min. Typ. Max. Units Notes

Analog Integrated Circuit Device Data

NXP Semiconductors 12

CD1030

Programmable Input (SP pins) (Continued)

IWETSP

Wetting Current Level (SG & SB)

• Mode 1 = 6.0 mA

• Mode 2 = 8.0 mA

• Mode 3 = 10 mA

• Mode 4 = 12 mA

• Mode 5 = 14 mA

• Mode 6 = 16 mA

• Mode 7 = 20 mA

—

6.0

8.0

—mA

IWETSPTOL

Wetting Current Tolerance

• SG/SB Mode 0

• SG Mode 1 to 7

• SB Mode 1 to 7

-20

-10

-20

—

IWETSPLV

Wetting Current Tolerance - LV (VBATP 4.5 V to 6.0 V)

(SG configuration)

• Mode 0 = 2.0 mA

• Mode 1 = 6.0 mA

• Mode 2 = 8.0 mA

• Mode 3 = 10 mA

• Mode 4 = 12 mA

• Mode 5 = 14 mA

• Mode 6 = 16 mA

• Mode 7 = 20 mA

Wetting Current Tolerance - LV (VBATP 4.5 V to 6.0 V)

(SB configuration)

• Mode 0 to 7 = 20 mA

1.0

2.0

-20

—

2.4

6.6

8.8

11.0

13.2

15.4

17.6

22.0

(15)

IMATCHSUSSP Sustain Current Matching Between SP Channels — — 10 % (16), (17)

IMATCHWETSP Wetting Current Matching Between SP Channels — — 6.0 % (18), (19)

IACTIVEPOLLSP

Low-power Mode Polling Current

• SP programmed as SG

• SP Programmed as SB

0.7

1.75

1.0

2.2

1.44

2.85

Digital Interface

IHZ Tri-state Leakage Current (MISO)

• VDDQ = 0.0 to VDDQ

-2.0 — 2.0 μA

VINLOGIC

Input Logic Voltage Thresholds

• SI, SCLK, CS_B, INT_B

VDDQ *

0.25 —V

DDQ * 0.7 V

VINLOGICHYS

Input Logic Hysteresis

• SI, SCLK, CS_B, INT_B 300 — — mV

VINLOGICWAKE Input Logic Voltage Threshold WAKE_B 0.8 1.25 1.7 V

VINWAKE_BHYS Input Logic Voltage Hysteresis WAKE_B 200 — 800 mV

ISCLK, IMOSI

SCLK / MOSI Input Current

• SCLK / MOSI = 0 V -3.0 — 3.0 µA

ISCLK, IMOSI

SCLK / MOSI Pull-down Current

• SCLK / MOSI = VDDQ 30 — 100 µA

ICS_BH

CS_B Input Current

• CS_B = VDDQ

-10 — 10 µA

RCS_BL

CS_B Pull-up Resistor to VDDQ

• CS_B = 0.0 V 40 125 270 kΩ

Table 7. Static electrical characteristics (continued)

TA = - 40 °C to +125 °C, VDDQ = 3.1 V to 5.25 V, VBATP = 6.0 V to 28.0 V, unless otherwise noted.

Symbol Characteristic Min. Typ. Max. Units Notes

Analog Integrated Circuit Device Data

13 NXP Semiconductors

CD1030

Digital Interface (Continued)

VOHMISO

MISO High-side Output Voltage

•I

OHMISO = -1.0 mA VDDQ – 0.8 — VDDQ V

VOLMISO

MISO Low-side Output Voltage

•I

OLMISO = 1.0 mA ——0.4V

CIN Input Capacitance on SCLK, MOSI, Tri-state MISO (GBD) — — 20 pF

Analog MUX Output

VOFFSET Input Offset Voltage When Selected as Analog -15 — 15 mV

VOLAMUX

Analog Operational Amplifier Low Output Voltage

• Sink 1.0 mA ——50mV

VOHAMUX

Analog Operational Amplifier High Output Voltage

• Source 1.0 mA VDDQ – 0.1 — — V

AMUX Selectable Outputs

Temp-Coeff Chip Temperature Sensor Coefficient — 8.0 — mV/°C

VBATSNSACC

Battery Sense (SG5 config) Accuracy

• Battery voltage (SG5 input) divided by 6

• Accuracy over full temperature range

-5.0 — 5.0 %

VBATSNSDIV

Divider By 6 coefficient accuracy

• Offset over operating voltage range (VBATP = 6.0 V to 28 V) -3.0 — 3.0 % (22)

INT_B

VOLINT

INT_B Output Low Voltage

•I

OUT = 1.0 mA —0.20.5 V

VOHINT

INT_B Output High Voltage

• INT_B = Open-circuit VDDQ – 0.5 — VDDQ V

RPU Pull-up Resistor to VDDQ 40 125 270 kΩ

ILEAKINT_B

Leakage Current INT_B

• INT_B pulled up to VDDQ ——1.0µA

Temperature Limit

tFLAG

Temperature Warning

• First flag to trip 105 120 135 °C

tLIM Temperature Monitor 155 — 185 °C (23)

tLIM(HYS) Temperature Monitor Hysteresis 5.0 — 15 °C (23)

WAKE_B

RWAKE_B(RPU) WAKE_B Internal pull-up Resistor to VDDQ 40 125 270 kΩ

VWAKE_B(VOH)

WAKE_B Voltage High

• WAKE_B = Open-circuit VDDQ -1.0 — VDDQ V

VWAKE_B(VOL)

WAKE_B Voltage Low

• WAKE_B = 1.0 mA (RPU to VBATP = 16 V) ——0.4V

Table 7. Static electrical characteristics (continued)

TA = - 40 °C to +125 °C, VDDQ = 3.1 V to 5.25 V, VBATP = 6.0 V to 28.0 V, unless otherwise noted.

Symbol Characteristic Min. Typ. Max. Units Notes

Analog Integrated Circuit Device Data

NXP Semiconductors 14

CD1030

IWAKE_BLEAK

WAKE_B Leakage

• WAKE_B pulled up to VBATP = 16 V through 10 kΩ— — 1.0 μA

Notes

12. Guaranteed by design

13. Polling quiescent current refers to the additional current in low-power mode due to the polling mechanism without any loading. IPOLLING,IQ depends

directly on the Polling rate and it increases as the polling pulse is more frequent. Worst case scenario is polling rate = 3.0 ms, with all channels set

to wake-up enable.

14. Total maximum quiescent current with polling enabled in LPM is given by IBATP,LPM,IQ + IPOLLING,IQ

15. During low voltage range operation SG wetting current may be limited when there is not enough headroom between VBATP and SG pin voltage.

16. (ISUS(MAX)– ISUS(MIN)) X 100/ISUS(MIN)

17. Sustain current source (SGs only)

18. (IWET(MAX) – IWET(MIN)) X 100/IWET(MIN)

19. Wetting current source (SGs only)

20. The input comparator threshold decreases when VBATP ≤ 6.0 V.

21. SP (as SB) only use the 4.0 V VICTHR for LPM wake-up detection.

22. Calibration of divider ratio can be done at VBAT = 12 V, 25 °C to achieve a higher accuracy. See Figure 4 for AMUX offset linearity waveform through

the operating voltage range.

23. Guaranteed by characterization in the development phase, parameter not tested.

Table 7. Static electrical characteristics (continued)

TA = - 40 °C to +125 °C, VDDQ = 3.1 V to 5.25 V, VBATP = 6.0 V to 28.0 V, unless otherwise noted.

Symbol Characteristic Min. Typ. Max. Units Notes

Analog Integrated Circuit Device Data

15 NXP Semiconductors

CD1030

4.4.2 Dynamic electrical characteristics

Table 8. Dynamic electrical characteristics

TA = -40 °C to +125 °C. VDDQ = 3.1 V to 5.25 V, VBATP = 4.5 V to 28 V, unless otherwise specified. SPI timing is performed with a 100 pF

load on MISO, unless otherwise noted.

Symbol Parameter Min. Typ. Max. Units Notes

General

tACTIVE

POR to Active time

• Undervoltage to Normal mode 250 340 450 μs

Oscillator

OSCTOLNOR Oscillator Tolerance Normal Mode at 4.0 MHz -15 — 15 %

OSCTOLLPM Oscillator Tolerance at 192 kHz in Low-power Mode -15 — 15 %

Switch Input

tPULSE(ON)

Pulse Wetting Current Timer

• Normal mode 17 20 23 ms

tINT-DLY

Interrupt Delay Time

• Normal mode — — 18.5 μs

tPOLLING_TIMER

Polling Timer Accuracy

• Low-power mode — — 15 %

tINT-TIMER

Interrupt Timer Accuracy

• Low-power mode — — 15 %

tACTIVEPOLLSG Tactivepoll Timer SG 49.5 58 66.5 μs

tACTIVEPOLLSB

Tactivepoll Timer SB

• SBPOLLTIME=0

• SBPOLLTIME=1

1.0

49.5

1.2

1.4

66.5

μs

tGLITCHTIMER

Input Glitch Filter Timer

• Normal mode 5.0 — 18 μs

tDEBOUNCE

LPM Debounce Additional Time

• Low-power mode 1.0 1.2 1.4 ms

AMUX Output

AMUXVALID

AMUX Access Time (Selected Output to Selected Output)

• CMUX = 1.0 nF, Rising edge of CS_B to selected —(25) — μs

AMUXVALIDTS

AMUX Access Time (Tristate to ON)

• CMUX = 1.0 nF, Rising edge of CS_B to selected ——20μs

Interrupt

INTPULSE Interrupt Pulse Duration

• Interrupt occurs or INT_B request 90 100 110 μs

SPI Interface

fOP Transfer Frequency — — 8.0 MHz

tSCK

SCLK Period

•Figure 7 - 1 160 — — ns

tLEAD

Enable Lead Time

•Figure 7 - 2 140 — — ns

tLAG

Enable Lag Time

•Figure 7 - 3 50 — — ns

tSCKHS

SCLK High Time

•Figure 7 - 4 56 — — ns

Analog Integrated Circuit Device Data

NXP Semiconductors 16

CD1030

Figure 4. Divide by 6 coefficient accuracy

SPI Interface (Continued)

tSCKLS

SCLK Low Time

•Figure 7 - 5 56 — — ns

tSUS

MOSI Input Setup Time

•Figure 7 - 6 16 — — ns

tHS

MOSI Input Hold Time

•Figure 7 - 7 20 — — ns

MISO Access Time

•Figure 7 - 8 — — 116 ns

tDIS

MISO Disable Time (24)

•Figure 7 - 9 — — 100 ns

tVS

MISO Output Valid Time

•Figure 7 - 10 — — 116 ns

tHO

MISO Output Hold Time (No cap on MISO)

•Figure 7 - 11 20 — — ns

tRO

Rise Time

•Figure 7 - 12 — — 30 ns (24)

tFO

Fall Time

•Figure 7 - 13 — — 30 ns (24)

tCSN

CS_B Negated Time

•Figure 7 - 14 500 — — ns

Notes

24. Guaranteed by characterization.

25. AMUX settling time to be within the 10 mV offset specification. AMUXVALID is dependent of the voltage step applied on the input SGx/SPx pin or the

difference between the first and second channel selected as the multiplexed analog output. See Figure 9 for a typical AMUX access time versus

voltage step waveform.

Table 8. Dynamic electrical characteristics (continued)

TA = -40 °C to +125 °C. VDDQ = 3.1 V to 5.25 V, VBATP = 4.5 V to 28 V, unless otherwise specified. SPI timing is performed with a 100 pF

load on MISO, unless otherwise noted.

Symbol Parameter Min. Typ. Max. Units Notes

5.96

5.97

5.98

5.99

6.01

6.02

6.03

6.04

678910111213141516171819202122232425262728

VBATP (Volts)

25°C

Divider factor

Analog Integrated Circuit Device Data

17 NXP Semiconductors

CD1030

Figure 5. Glitch filter and interrupt delay timers

Figure 6. Interrupt pulse timer

Figure 7. SPI timing diagram

LPM CLK

SG_Pin

Input Glitch

filter timer

INT_B

500 ns

tglitchTIMER

tINT- DLY

LPM CLK

SG_Pin

INT_B tINT- DLY INTPULSE

SCLK

MSB IN

CARE

LSB IN

DON'T

MISO

MOSI

MSB OUT DATA LSB OUT

810

DATA

12 13

CS_B

Analog Integrated Circuit Device Data

NXP Semiconductors 18

CD1030

Figure 8. MISO loading for disable time measurement

Figure 9. AMUX access time waveform

1.0 kΩ

VDDQ

MISO

1.0 kΩ

+5.0 V

1.0 V

4.0 V

0 V

MISO

CS_B

100

150

200

250

0 500 1000 1500 2000 2500 3000 3500 4000 4500 5000

Step Size (mV)

AMUX Access Time

Settling time (us)

Analog Integrated Circuit Device Data

19 NXP Semiconductors

CD1030

5 General description

The CD1030 is designed to detect the closing and opening of up to 33 switch contacts. The switch status, either open or closed, is

transferred to the microprocessor unit (MCU) through a serial peripheral interface (SPI). Individually selectable input currents are available

in Normal and Low-power (LPM) modes, as needed for the application.

It also features a 35-to-1 analog multiplexer for reading inputs as analog. The analog input signal is buffered and provided on the AMUX

output pin for the MCU to read. A battery and temperature monitor are included in the IC and available via the AMUX pin.

The CD1030 device has two modes of operation, Normal and Low-power mode (LPM). Normal mode allows programming of the device

and supplies switch contacts with pull-up or pull-down current as it monitors the change of state of switches. The LPM provides low

quiescent current, which makes the CD1030 ideal for automotive and industrial products requiring low sleep-state currents.

5.1 Features

• Fully functional operation from 4.5 V to 36 V

• Full parametric operation from 6.0 V to 28 V

• Low-power mode current IBATP = 50 μA and IDDQ = 10 μA

• 33 switch detection channels

• 21 switch-to-Ground (SG) inputs with configurable pull-up current sources

• 12 programmable switch (SP) inputs

• Switch-to-Ground (SG) or Switch-to-Battery (SB)

• Operating switch input voltage range from -1.0 V to 36 V

• Selectable wetting current (2.0, 6.0, 8.0, 10, 12, 14, 16, or 20 mA)

• Programmable wetting operation (Pulse or continuous)

• Selectable wake-up on change of state

• 35 to 1 Analog Multiplexer

• Buffered AMUX output from SG/SP channels

• Integrated divider by six on SG5 for battery voltage sensing

• Integrated die temperature sensing through AMUX output

• Optional two or three pin hardwire AMUX selection

• Active interrupt (INT_B) on switch's change of state

• Direct MCU Interface through 3.3 V / 5.0 V SPI protocol

Analog Integrated Circuit Device Data

NXP Semiconductors 20

CD1030

5.2 Functional block diagram

Figure 10. Functional block diagram

Logic and Control

SG0 – SG20 SP0 – SP11

Bias & References

WAKE_B I/O INT_B I/O

CD1030 Functional Internal Block Diagram

SPI Serial Communication & Registers

Switch Status Detection

Fault Detection and Protection

4.0 V SW Detection Reference.

OV Detection

Overtemperature

Protection

1.25 V internal Bandgap

VBATP UV Detect

Input Power

VBATP

Battery Supply

VDDQ

Logic Supply

192 kHz

LPM Oscillator

4.0 MHz

Oscillator

SPI Error Detect

HASH Error Detect

Switch to Ground (SG)

Only

Switch to Ground (SG)

Switch to Battery (SB)

Selectable Wetting Current Level

35 to 1 SPI AMUX select

Analog Multiplexer (AMUX)

Battery Voltage Sensing (divided by 6 )

Die Temperature Sensing

Modes of Operation

Normal Mode Low Power Mode

Pulse/Continuous Wetting Current

12 x Programmable Switch

21 x Switch to Ground

Programmable Polling/

Interrupt Time

SPI Communication/

Switch Status Read

Hardwire selectable

SPx/SGx Inputs to AMUX

Analog Integrated Circuit Device Data

21 NXP Semiconductors

CD1030

6 General IC functional description

The CD1030 device interacts with many connections outside the module and near the end user. The IC detects changes in switch state

and reports the information to the MCU via the SPI protocol. The input pins generally connected to switches located outside the module

and in proximity to battery in car harnesses. Consequently, the IC must have some external protection including an ESD capacitor and

series resistors, to ensure the energy from the various pulses are limited at the IC.

The IC requires a blocking diode be used on the VBATP pin to protect from a reverse battery condition. The inputs are capable of surviving

reverse battery without a blocking diode and also contain an internal blocking diode from the input to the power supply (VBATP). This

ensures there is no back feeding of voltage/current into the IC, when the voltage on the input is higher than the VBATP pin.

6.1 Battery voltage ranges

The CD1030 device operates from 4.5 V ≤ VBATP ≤ 36 V and is capable of withstanding up to 40 V. The IC operates functionally from

4.5 V < VBATP < 6.0 V, but with degraded parametrics values. Voltages in excess of 40 V must be clamped externally to protect the IC

from destruction. The VBATP pin must be isolated from the main battery node by a diode.

6.1.1 Load dump (overvoltage)

During load dump the CD1030 operates properly up to the VBATP overvoltage. Voltages greater than load dump (~32 V) causes the

current sources to be limited to ~2.0 mA, but the register values are maintained. Upon leaving this overvoltage condition, the original setup

is returned and normal operation begins again.

6.1.2 Jump start (double battery)

During a jump start (double battery) condition, the device must functions normally and meets all the specified parametric values. No

internal faults are set and no abnormal operation noted as a result of operating in this range.

6.1.3 Normal battery range

The normal voltage range is fully functional with all parametrics in the given specification.

6.1.4 Low voltage range (degraded parametrics)

In the VBATP range between 4.5 V to 6.0 V the CD1030 functions normally, but has some degraded parametric values. The SPI functions

normally with no false reporting. The degraded parameters are noted in Ta ble 7 and Tab le 8. During this condition, the input comparator

threshold is reduced from 4.0 V and remain ratiometrically adjusted, according to the battery level.

6.1.5 Undervoltage lockout

During undervoltage lockout, the MISO output is tri-stated to avoid any data from being transmitted from the CD1030. Any CS_B pulses

are ignored in this voltage range. If the battery enters this range at any point (even during a SPI word), the CD1030 ignores the word and

enters lockout mode. A SPI bit register is available to notify the MCU the CD1030 has seen an undervoltage lockout condition, once the

battery is high enough to leave this range. During this mode, the input comparator and current sources are turned off.

6.1.6 Power On Reset (POR) activated

The Power on Reset is activated when the VBATP is within the 2.7 V to 3.8 V range. The CD1030 is initialized in undervoltage lockout

after the POR is de-asserted. A SPI bit in the device configuration register is used to note a POR occurrence, all SPI registers are reset

to the default values, and SPI operation is disabled.

6.1.7 No operation

The device does not function and no switch detection is possible.

Analog Integrated Circuit Device Data

NXP Semiconductors 22

CD1030

Figure 11. Battery voltage range

6.2 Power sequencing conditions

The chip uses two supplies as inputs into the device for various usage. These pins are VBATP and VDDQ. The VBATP pin is the power

supply for the chip where the internal supplies are generated and power supply for the SG circuits. The VDDQ pin is used for the I/O buffer

supply to talk to the MCU or other logic level devices, as well as AMUX. The INT_B pin is held low upon POR until the IC is ready to

operate and communicate. Power can be applied in various ways to the CD1030 and the following conditions are possible.

6.2.1 VBATP before VDDQ

The normal condition for operation is the application of VBATP and then VDDQ.The chip operates logically in the default state, but without

the ability to drive logic pins. When the VDDQ supply is available, the chip is able to communicate correctly. The IC maintains its logical

state (register settings) with functional behavior consistent with the logical state. No SPI communications can occur.

6.2.2 VDDQ before VBATP

In some cases, the VDDQ supply may be available before the VBATP supply is ready. There is no back feeding current into the VDDQ pin

which could potentially turn on the device into an unknown state, in this scenario. VDDQ is isolated from VBATP circuits and the device

is off until VBATP is applied. When VBATP is available the device powers up the internal rails and logic within tACTIVE time. Communication

is undefined until the tACTIVE time and becomes available after this time frame.

6.2.3 VBATP okay, VDDQ lost

After power up, it is possible the VDDQ may turn off or be lost. In this case, the chip remains in the current state, but is not able to

communicate. After the VDDQ pin is available again, the chip is ready to communicate.

6.2.4 VDDQ okay, VBATP lost

After power up, the VBATP supply could be lost. The operation is consistent when VDDQ is available before VBATP.

Functional

Normal Mode

Full Parametrics

Overvoltage

No Operation

41 V

37 V

29 V

7.0 V

0 V

5.5 V

Degraded Parametrics

Battery Voltage

(System Level)

Overvoltage

Load Dump

Normal

Battery

Low Battery

Reset

40 V

36 V

28 V

6.0 V

0 V

4.5 V

VBATP

(IC Level)

Undervoltage lockout

5.3 V 4.3 V

POR 2.7 V3.7 V

Analog Integrated Circuit Device Data

23 NXP Semiconductors

CD1030

Figure 12. VDDQ power up first

Figure 13. VBATP power up first

VBATP

VDDQ

POR

SPI Capability

VBATP

VDDQ

POR

SPI Capability

Analog Integrated Circuit Device Data

NXP Semiconductors 24

CD1030

Figure 14. Battery crank profile

6.3 Low-power mode operation

Low-power mode (LPM) is used to reduce system quiescent currents. LPM can be entered only by sending the Enter Low-power mode

command. All register settings programmed in Normal mode are maintained while in LPM.

The CD1030 exits LPM and enters Normal mode when any of the following events occur:

• Input switch change of state (when enabled)

• Interrupt timer expire

• Falling edge of WAKE_B (as set by the device configuration register)

• Falling edge of INT_B (with VDDQ = 5.0 V)

• Falling edge of CS_B (with VDDQ = 5.0 V)

• Power-ON Reset (POR)

The VDDQ supply may be removed from the device during LPM, however removing VDDQ from the device disables a wake-up from falling

edge of INT_B and CS_B. The IC checks the status of VDDQ after a falling edge of WAKE_B (as selected in the device configuration

register), INT_B and CS_B. If VDDQ is low, the IC returns to LPM and does not report a Wake event. If VDDQ is high, the IC wakes up and

reports the Wake event. In cases where CS_B is used to wake the device, the first MISO data message is not valid.

The LPM command contains settings for two programmable registers: the interrupt timer and the polling timer, as shown in Table 30. The

interrupt timer is used as a periodic wake-up timer. When the timer expires, an interrupt is generated and the device enters Normal mode.

The polling timer is used periodically to poll the inputs during Low-power mode to check for change of states. The tACTIVEPOLL time is the

length of time the part is active during the polling timer to check for change of state. The polling pulse is set at 1.0 mA for SG channels

and 2.0 mA for SB channels. If a switch closure is detected during the low-power mode, the CD1030 detects the change of state and starts

providing the sustain current (2.0 mA) for about 416 μs until the device returns to the Normal mode (WAKE_B pulled low). Once in Normal

mode, the input channel keeps supplying the sustain current (2.0 mA) for 270 μs more and then forces the corresponding wetting current.

This mechanism protects against excessive inrush current, when the input capacitors discharge during the long polling cycles, and need

to be recharged all at once upon waking up from the LPM.

The Low-power mode voltage threshold allows the user to determine the noise immunity versus lower current levels that polling allows.

Figure 16 shows the polling operation.

When polling and Interrupt timer coincide, the Interrupt timer wakes the device and the polling does not occur. When an input is determined

to meet the Open condition (when entering LPM), yet while Open (on polling event), the chip does not continue the polling event for this

input(s) to lower current in the chip.

Battery VBATP

5 15 - 40 5 - 100

12 V

6.0 V

4.5 V

Time in milliseconds

11 V

5.0 V

3.5 V

= 50 500 – 20,000

Analog Integrated Circuit Device Data

25 NXP Semiconductors

CD1030

Figure 15. Low-power mode polling check

Figure 16. Low-power mode typical timing

Latch voltage

Compare voltage to initial

(Delta > 0.25 V or > 4.0 V)

LPM Voltage threshold

(~0.25 V)

Polling timer

(64 ms def)

Voltage on SG pin

End Polling (current off if

no change detected)

58 µs

CS_B

Polling Time

Polling startup

TACTIVE time

Mode

Normal

LPM

Normal

Go To LPM

64 ms (config)

78 Ζs

58 Ζs

20 Ζs

Current source

1.0 mA

Switch Status

Comp EN

Wake Up Timer

1.0 mA

2.0 mA

Wetting

Current

416 Ζs

Early

check

Delta V

check

270 Ζs

IC Current

~330 ΖA

~20 ΖA

Normal Mode

Current

Early Open/Open check ends

polling pulse early

(based on 4.0 V threshold)

Analog Integrated Circuit Device Data

NXP Semiconductors 26

CD1030

Figure 17. Low-power mode to Normal mode operation

VBATP

VDDQ

WAKE_B

INT_B

CS_B

SGn

Power – up

Normal Mode

Tri-state

Command

Sleep

Command Sleep Mode Normal

Mode

Sleep

Command Sleep Mode Normal

Mode

Sleep

Command

Wake up from Interrupt

Timer expire

Wake up from

Closed Switch

Analog Integrated Circuit Device Data

27 NXP Semiconductors

CD1030

7 Functional block description

7.1 State machine

Figure 18. CD1030 state diagram

After power up, the IC enters into the device state machine, as illustrated in Figure 18. The voltage on VBATP begins to power the internal

oscillators and regulator supplies. The POR is based on the internal 2.5 V digital core rail. When the internal logic regulator reaches

approximately 1.8 V (typically 3.3 V on the VBATP node), the IC enters into the UV range. Below the POR threshold, the IC is in RESET

mode where no activity occurs.

7.1.1 UV: undervoltage lockout

After the POR circuit has reset the logic, the IC is in undervoltage. In this state, the IC remembers all register conditions, but is in a lockout

mode, where no SPI communication is allowed. AMUX is inactive and the current sources are off. The user does not receive a valid

response from the MISO, as it is disabled in this state. The chip oscillators (4.0 MHz for most normal mode activities, 192 kHz for LPM,

and limited normal mode functions) are turned on in the UV state. The chip moves to the Read fuses state when the VBATP voltage rises

above the UV threshold (~4.3 V rising). The internal fuses read in approximately 50 μs and the chip enters the Normal mode.

OV / OT

IWET-> ISUS

Wake

Event

Normal Mode

Low-power

Mode

Polling

RESET

Run

VBATP > OV

or OT

VBAT too low:

POR

VBATP applied

Detect change in switch

status (opn/close)

SPI CMD

Polling time expires

Polling timer initiates

VBATP <

IC OFF

VBAT applied >

por

Wait 50 μs

Read fuses

VBATP > UV

threshold

Not VBATP > OV

or OT

SPI RESET

command

Analog Integrated Circuit Device Data

NXP Semiconductors 28

CD1030

7.1.2 Normal mode

In Normal mode, the chip operates as selected in the available registers. Any command may be loaded in Normal mode, although not all

(Low-power mode) registers are used in the Normal mode. All the LPM registers must be programmed in Normal mode, as the SPI is not

active in LPM. The Normal mode of the chip is used to operate AMUX, communicate via the SPI, Interrupt the IC, wetting and sustain

currents, as well as the thresholds available to use. The WAKE_B pin is asserted (low) in Normal mode and can be used to enable a power

supply (ENABLE_B). Various fault detections are available in this mode including overvoltage, overtemperature, thermal warning, SPI

errors, and Hash faults.

7.1.3 Low-power mode

When the user needs to lower the IC current consumption, a Low-power mode is used. The only method to enter LPM is through a SPI

word. After the chip is in Low-power mode, the majority of circuitry is turned off including most power rails, the 4.0 MHz oscillator, and all

the fault detection circuits. This mode is the lowest current consumption mode on the chip. If a fault occurs while the chip is in this mode,

the chip does not see or register the fault (does not report via the SPI when awakened). Some items may wake the IC in this mode,

including the interrupt timer, falling edge of INT_B, CS_B, or WAKE_B (configurable), or a comparator only mode switch detection.

7.1.4 Polling mode

The CD1030 uses a polling mode, which periodically (selectable in LPM config register) interrogates the input pins to determine in what

state the pins are, and decide if there was a change of state from when the chip was in Normal mode. There are various configurations

for this mode, allowing the user greater flexibility in operation. This mode uses the current sources to pull-up (SG) or down (SB) to

determine if a switch is open or closed. More information is available on section 6.3, Low-power mode operation, page 24.

In the case of a low VBATP, the polling pauses and waits until the VBATP rises out of UV or a POR occurs. The pause of the polling ensures

all of the internal rails, currents, and thresholds are up at the required levels to accurately detect open or closed switches. The chip does

not wake-up in this condition and simply waits for the VBATP voltage to rise or cause a POR.

After the polling ends, the chip either returns to the Low-power mode, or enters Normal mode when a wake event was detected. Other

events may wake the chip as well, such as the falling edge of CS_B, INT_B, or WAKE_B (configurable). A comparator only mode switch

detection is always on in LPM or Polling mode, so a change of state for those inputs would effectively wake the IC in Polling mode as well.

If the wake-up enable bits are disabled on all channels (SG and SP), the device does not wake-up with a change of state on any of the

input pins. In this case, the device disables the polling timer to allow the lowest current consumption during Low-power mode.

7.2 Input functional block

The SGx pins are switch-to-ground inputs only (pull-up current sources). The SPx pins are configurable as either switch to ground or

switch to battery (pull-up current source or pull-down current sink). The input is compared with a 4.0 V (input comparator threshold)

reference. Voltages greater than the input comparator threshold value are considered open for SG pins and closed for SB configuration.

Voltages less than the input comparator threshold value are considered closed for SG pins and open for the SB configurations.

Programming features are defined in section 7.9, SPI control register definition, page 35 of this datasheet. The input comparator has

hysteresis with the thresholds based on the closing of the switch (falling on SG, rising on SB). The user must take care to keep power

conditions within acceptable limits (package is capable of 2.0 W). Using many of the inputs with continuous wetting current levels causes

overheating of the IC and may cause an overtemperature (OT) event to occur.

Analog Integrated Circuit Device Data

29 NXP Semiconductors

CD1030

Figure 19. SG block diagram

Figure 20. SP block diagram

6 - 20

2.0

Pre-reg = ~8.0 V

4.0 V ref comparator

250 mV Delta V

2.5 V Comparator only

To SPI

1.0 mA

(LPM)

VBATP

To AMUX

6 - 20

2.0

Pre-reg

4.0 V ref comparator

To SPI

1.0mA

(LPM)

VBATP

6 - 20

2.0

1.0mA

(LPM)

Analog Integrated Circuit Device Data

NXP Semiconductors 30

CD1030

7.3 Oscillator and timer control functional block

Two oscillators are generated in this block. A 4.0 MHz clock is used in Normal mode only, as well as a Low-power mode 192 kHz clock,

which is on all the time. All timers are generated from these oscillators. The oscillator accuracy is 15% for both, the 4.0 MHz clock and the

192 kHz clock. No calibration is needed and the accuracy is overvoltage and temperature. The timers in Low-power mode are generated

from a base timer such that all timers coincide with other times. When polling and Interrupt timer coincide, the Interrupt timer wakes the

device and the polling does not occur.

7.4 Temperature monitor and control functional block

The device has multiple thermal limit (tLIM) cells to detect thermal excursions in excess of 155 °C. The tLIM cells from various locations on

the IC are logically ORed together and communicated to the MCU as one tLIM fault. When the tLIM value is detected, the wetting current

is lowered to 2.0 mA until the temperature has decreased beyond the tLIM(HYS) value (the sustain current remains on or as selected). A

hysteresis value of 15 °C exists to keep the device from cycling. A thermal flag also exists to alert the system to increasing temperature.

The thermal flag is set at a typical value of 120 °C.

7.5 WAKE_B control functional block

The WAKE_B functions as an input (wake-up) or an output (open drain) pin. In Normal mode, the WAKE_B pin is low. In Low-power mode,

the WAKE_B pin is pulled high. The WAKE_B pin has an internal pull-up to the VDDQ supply, with an internal series diode to allow an

external pull-up to VBATP, if the specific application requires it.

As an input, with VDDQ present, when the device is in Low-power mode and WAKE_B is pulled high (internally or externally), a falling edge

of the WAKE_B pin brings the CD1030 into Normal mode. In Low-power mode, if VDDQ goes low, the WAKE_B VDDQ check bit in the

Device configuration register can be used to ignore or allow a wake-up event upon a falling edge of the WAKE_B pin. Setting the WAKE_B

VDDQ check bit to 0, ignores the falling edge of WAKE_B when VDDQ is low. Setting the WAKE_B VDDQ check to 1, allows the WAKE_B

falling edge to wake-up the device and go into Normal mode regardless of the status of VDDQ. This allows the user to pull the WAKE_B

pin up to VBATP so it can be used in a setup in which VDDQ is supposed to shut down during Low-power mode.

As an output, WAKE_B pin can drive either an MCU input or the EnableB of a regulator (possibly for VDDQ). WAKE_B is driven LOW

during Normal mode regardless of the state of VDDQ. When the CD1030 is in LPM, the WAKE_B pin is released and is expected to be

pulled up internally to VDDQ or externally to VBATP. When a valid wake-up event is detected, the CD1030 should wake-up from LPM and

the WAKE_B should be driven LOW (regardless of the state of VDDQ).

7.6 INT_B functional block

INT_B is an input/output pin in the CD1030 device to indicate an interrupt event has occurred, as well as receiving interrupts from other

devices when the INT_B pins are wired ORed.The INT_B pin is an open-drain output with an internal pull-up to VDDQ. In Normal mode, a

switch state change triggers the INT_B pin (when enabled). The INT_B pin and INT_B bit in the SPI register are latched on the falling

edge of CS_B, which permits the MCU to determine the origin of the interrupt. When two CD1030 devices are used, only the device

initiating the interrupt has the INT_B bit set. The INT_B pin and INTflg bit are cleared 1.0 μs after the falling edge of CS B. The INT_B pin

does not clear with the rising edge of CS_B if a switch contact change has occurred while CS_B was Low.

In a multiple CD1030 device system with WAKE_B high and VDDQ in Low-power mode, the falling edge of INT_B places all CD1030s in

Normal mode.The INT_B has the option of a pulsed output (pulsed low for INTPULSE duration) or a latched low output.The default case is

the latched low operation; the INT_B operation is selectable via the SPI. An INT_B request by the MCU can be done by a SPI word and

results in an INTPULSE of 100 μs duration on the INT_B pin.

The chip causes an INT_B assertion for the following cases:

1. A change of state is detected

2. Interrupt timer expires

3. Any wake-up event

4. Any faults detected

5. After a POR, the INT_B pin is asserted during startup until the chip is ready to communicate

Analog Integrated Circuit Device Data

31 NXP Semiconductors

CD1030

7.7 AMUX functional block

The analog voltage on switch inputs may be read by the MCU using the analog command (Table 47). Internal to the IC is a 35-to-1 analog

multiplexer. The voltage present on the selected input pin is buffered and made available on the AMUX output pin. The output pin is

clamped to a maximum of VDDQ regardless of the higher voltages present on the input pin. After an input has been selected as the analog,

the corresponding bit in the next MISO data stream is logic [0]. When selecting a channel to be read as analog input, the user can enable

the current source to provide a current flow through the specific channel. Current level can be set to the programmed wetting current for

the selected channel or set to high-impedance, as defined in Table 46.

When selecting an input to be sent to the AMUX output, this input is not polled or wake-up from Low-power mode. The user should set

AMUX to “No input selected” or “Temp diode” before entering Low-power mode.The AMUX pin is not active during Low-power mode. The

SG5 pin can also be used as a VBATP sense pin. An internal resistor divider of 1/6 is provided for conditioning the VBATP higher voltage

to a level within the 0 V to VDDQ range.

Along with the default SPI input selection method, the AMUX has two hardwire operation such that the user can select an specific input

channel by physically driving the SG1, SG2, or SG3 pin (HW 3-bit), or by driving the SG1 and SG2 pins (HW 2-bit), as shown in Table 10

and Table 11. When using the AMUX hardwired options, the SG1, SG2, and SG3 inputs use a 2.5 V input voltage threshold to read a

logic 0 or logic 1. Table 9 shows the AMUX selection methods configurable by the Aconfig0 and Aconfig1 bits in the Device configuration

Since the device is required to meet the ±1.0 V offset with ground, it is imperative the user bring the sensor ground back to the CD1030

when using AMUX for accurate measurements, to ensure any ground difference does not impact the device operation.

Table 9. AMUX selection method

Aconfig1 Aconfig0 AMUX selection method

0 0 SPI (def)

0 1 SPI

1 0 HW 2-bit

1 1 HW 3-bit

Table 10. AMUX hardware 3-bit

Pins [SG3, SG2, SG1] Output of AMUX

000 SG0

001 SG5

010 SG6

011 SG7

100 SG8

101 SG9

110 Temperature Diode

111 Battery Sense

Table 11. AMUX hardware 2-bit

Pins [SG2, SG1] Output of AMUX

00 SG0

01 SG5

10 SG6

11 SG7

Analog Integrated Circuit Device Data

NXP Semiconductors 32

CD1030

7.8 Serial peripheral interface (SPI)

The CD1030 contains a serial peripheral interface consisting of Serial Clock (SCLK), Serial Data Out (MISO), Serial Data In (MOSI), and

Chip Select Bar (CS_B).The SPI interface is used to provide configuration, control, and status functions. The user may read the registers

contents as well as read some status bits of the IC. The CD1030 is configured as a SPI slave.

All SPI transmissions to the CD1030 must be done in exact increments of 32 bits (modulo 0 is ignored as well). The CD1030 contains a

data valid method via SCLK input to keep non-modulo 32-bit transmissions from being written into the IC. The SPI module also provides

a daisy chain capability to accommodate MOSI to MISO wrap around (see Figure 24). The SPI registers have a hashing technique to

ensure the registers are consistent with the programmed values. If the hashed value does not match the register status, a SPI bit is set,

as well as an interrupt to alert the MCU to this issue.

7.8.1 Chip select low (CS_B)

The CS_B input selects this device for serial transfers. On the falling edge of CS_B, the MISO pin is released from tri-state mode, and all

status information are latched in the SPI shift register. While CS_B is asserted, register data is shifted in the MOSI pin and shifted out the

MISO pin on each subsequent SCLK. On the rising edge of CS_B, the MISO pin is tri-stated and the fault register reloaded (latched) with

the current filtered status data. To allow sufficient time to reload the fault registers, the CS_B pin must remain low for a minimum of tCSN

prior to going high again.

The CS_B input contains a pull-up current source to VDDQ to command the de-asserted state should an open-circuit condition occur.

This pin has threshold compatible voltages allowing proper operation with microprocessors using a 3.3 V to 5.0 V supply.

7.8.2 Serial clock (SCLK)

The SCLK input is the clock signal input for synchronization of serial data transfer. This pin has a threshold compatible voltage allowing

proper operation with microprocessors using a 3.3 V to 5.0 V supply.

When CS_B is asserted, both the Master Microprocessor and the CD1030 latch input data on the rising edge of SCLK. The SPI master

typically shifts data out on the falling edge of SCLK. The CD1030 shifts data out on the falling edge of SCLK as well, to allow more time

to drive the MISO pin to the proper level.

This input is used as the input for the modulo 32-bit counter validation. Any SPI transmissions which are NOT exact multiples of 32 bits

(clock edges) are treated as illegal transmissions. The entire frame is aborted and no information is changed in the configuration or control

registers.

7.8.3 Serial data output (MISO)

The MISO output pin is in a tri-state condition when CS_B is negated. When CS_B is asserted, MISO is driven to the state of the MSB of

the internal register and starts shifting out the requested data from the MSB to the LSB. This pin supplies a “rail to rail” output, depending

on the voltage at the VDDQ pin.

7.8.4 Serial data input (MOSI)

The MOSI input takes data from the master microprocessor while CS_B is asserted. The MSB is the first bit of each word received on

MOSI and the LSB is the last bit of each word received on MOSI. This pin has threshold level compatible input voltages allowing proper

operation with microprocessors using a 3.3 V to 5.0 V (VDDQ) supply.

Analog Integrated Circuit Device Data

33 NXP Semiconductors

CD1030

Figure 21. First SPI operation (After POR)

Figure 22. SPI write operation

Figure 23. SPI read operation

MOSI/

SCLK

MISO

Control word Configure words

124252627

2930 2

30122

Fault

Status

INTflg

SG/SP input status

21 23

20 ...

CS_B

Switch Status Register

MOSI/

SCLK

MISO

Control word Configure word

124252627

2930 2

30122

Previous command data

21 23

20 ...

Previous Address

CS_B

MISO

124252627

2930 2

30122

Configure Word

21 23

20 ...

Control Word

MOSI/

SCLK

Next Control word Next Configure words

CS_B

MOSI/

SCLK

MISO

Control word (READ) DON’T CARE

124252627

2930 2

30122

Previous command data

21 23

20 ...

Previous Address

CS_B

MISO

124252627

2930 2

30122

21 23

20 ...

Control Word (READ)

MOSI/

SCLK

Next Control word Next Configure words

CS_B

Analog Integrated Circuit Device Data

NXP Semiconductors 34

CD1030

Figure 24. Daisy Chain SPI operation

- 3rd IC

MISO - 1st IC

MOSI - 2nd IC

- 3rd IC

MCU MOSI

- 2st IC

- 3rd IC

MOSI - 1st IC

MCU MISO

- 2nd IC - 1st IC

MOSI - 3rd IC - 2nd IC - 1st ICDon't Care

Don't Care

1st IC

SCLK

2nd IC

SCLK

3rd IC

SCLK

MISO

MISI

MCU

CS_B CS_B

CS_B

MISO

MOSI

MISO

MISO MISO MISO

MOSI MOSI

Analog Integrated Circuit Device Data

35 NXP Semiconductors

CD1030

7.9 SPI control register definition

A 32-bit SPI allows the system microprocessor to configure the CD1030 for each input as well as read out the status of each input. The

SPI also allows the Fault Status and INTflg bits to be read via the SPI. The SPI MOSI bit definitions are given in Table 12:

Table 12. MOSI input register bit definition

0 SPI check 0 0 0 00000

02/03 Device configuration register 0 0 0 00010/1

04/05 Tri-state SP register 0 0 0 00100/1

06/07 Tri-state SG register 0 0 0 00110/1

08/09 Wetting current level SP register 0 0 0 0 01000/1

0A/0B Wetting current level SG register 0 0 0 0 01010/1

0C/0D Wetting current level SG register 1 0 0 0 01100/1

0E/0F Wetting current level SG register 2 0 0 0 01110/1

10/11 Wetting current level SP register 1 0 0 0 10000/1

16/17 Continuous wetting current SP register 0 0 0 10110/1

18/19 Continuous wetting current SG register 0 0 0 11000/1

1A/1B Interrupt enable SP register 0 0 0 11010/1

1C/1D Interrupt enable SG register 0 0 0 11100/1

1E/1F Low-power mode configuration 0 0 0 11110/1

20/21 Wake-up enable register SP 0 0 1 00000/1

22/23 Wake-up enable register SG 0 0 1 00010/1

24/25 Comparator only SP 0 0 1 00100/1

26/27 Comparator only SG 0 0 1 00110/1

28/29 LPM voltage threshold SP configuration 0 0 1 01000/1

2A/2B LPM voltage threshold SG configuration 0 0 1 01010/1

2C/2D Polling current SP configuration 0 0 1 01100/1

2E/2F Polling current SG configuration 0 0 1 01110/1

30/31 Slow polling SP 0 0 1 10000/1

32/33 Slow polling SG 0 0 1 10010/1

34/35 Wake-up debounce SP 0 0 1 10100/1

36/37 Wake-up debounce SG 0 0 1 10110/1

39 Enter Low-power mode 0 0 1 11001

3A/3B AMUX control register 0 0 1 11010/1

3C Read switch status registers SP 0 0 1 11100

3E Read switch status registers SG 0 0 1 11110

42 Fault status register 0 1 0 00010

47 Interrupt request 0 1 0 00111

49 Reset register 0 1 0 01001

Analog Integrated Circuit Device Data

NXP Semiconductors 36

CD1030

The 32-bit SPI word consists of a command word (8-bit) and three configure words (24-bit). The 8 MSB bits are the command bits that

select what type of configuration is to occur. The remaining 24-bits are used to select the inputs to be configured.

• Bit 31 - 24 = Command word: Use to select what configuration is to occur (example: setting wake-up enable command)

• Bit 23 - 0 = SGn input select word: Use these bits in conjunction with the command word to determine which input is setup.

Configuration registers may be read or written to. To read the contents of a configuration register, send the register address + ‘0’ on the

LSB of the command word; the contents of the corresponding register is shifted out of the MISO buffer in the next SPI cycle. When a Read

command is sent, the answer (in the next SPI transaction) includes the Register address in the upper byte (see Figure 23).

Read example:

• Send 0x0C00_0000 Receive: 8000_0000 (for example after a POR)

• Send 0x0000_0000 Receive: 0C00_0000 (address + register data)

The first response from the device after a POR event is a Read Status register (0x3Exxxxxx where x is the status of the inputs). This is

the same for exiting the Low-power mode (see Figure 21).

To write into a configuration register, send the register Address + ‘1’ on the LSB of the command word and the configuration data on the

next 24 bits. The new value of the register is shifted out of the MISO buffer in the next SPI cycle, along with the register address and the

corresponding read or write bit.

The fault/status diagnostic capability consists of two Switch Status registers and one Fault status register (shown in Table 13).

In the Read Status Register SP, Bits 0 – 11 shows the status of each one of the SP inputs, where logic [1] is a closed switch and logic [0]

is an open switch. In addition to input status information, Fault conditions and interrupts are reported through bits FAULT STATUS [23]

and INTflg [22].

In the Read Status Register SG, Bits 0 - 20 show the status of each one of the SG input, where logic [1] is a closed switch and logic [0]

is an open switch. In addition to input status information, fault conditions and interrupts are reported through bits FAULT STATUS [23]

and INTflg [22].

The Fault Status Register latches the respective bit high when a specific fault event occurs. All possible fault events are described in

Table 50. When a Fault Status command is sent, a SPI read cycle is initiated by a CS_B falling edge, followed by 32 SCLK cycles to shift

the fault status register out the MISO pin. The INTflg bit is cleared 1.0 ms after the falling edge of CSB.

On most registers where the first two significant bits are available, bit 23 is an OR of all the fault status register bits and bit 22 is latched

high following any interrupt event. Registers which have all bits dedicated for other purposes, such as the Wetting Current Level or the

SPI check registers, do not have these interrupt or fault status bits.

When a register with a int flag (bit-22) set high is read, the INTflg bit is globally cleared. For the case of bit-23 high, it is cleared after the

Fault Status Register is read, and the respective fault flag is cleared.

The Fault status bit sets any time a fault occurs. A read of the fault status register must be done to clear the Fault status bit. The fault bit

immediately sets again if the fault condition is still present. The INTflg bit sets any time an interrupt event occurs (change of state on switch,

or any fault status bit gets set). Any SPI command that returns INTflg bit clears this flag, even if the event is still occurring, for example,

an overtemp causes an interrupt. The interrupt can be cleared but the chip does not interrupt again based on the overtemp until the

Overtemp flag has been cleared. A thermal fault latches as soon as it occurs.

Table 13. Switch status and Fault registers

Commands [31-25]

Address

R23 22 21 20 19 18 17 16 15 14 13 12 11 10 9876543210

Read Switch Status SP 0011110 0

FAULT

STATUS

INTflg

SP11

SP10

SP9

SP8

SP7

SP6

SP5

SP4

SP3

SP2

SP1

SP0

Read Switch Status SG 0011111 0

FAULT

STATUS

INTflg

SG20

SG19

SG18

SG17

SG16

SG15

SG14

SG13

SG12

SG11

SG10

SG9

SG8

SG7

SG6

SG5

SG4

SG3

SG2

SG1

SG0

Fault Status 0100001 0

INTflg

SPI Error

hash fault

TempFlag

INT_B wake

WAKE_B

SpiWake

POR

Analog Integrated Circuit Device Data

37 NXP Semiconductors

CD1030

Table 14 provides a general overview of the functional SPI commands and configuration bits.

Table 14. Functional SPI register

Commands [31-25]

Address

R/W 23(26) 22(26) 21 20 19 18 17 16 15 14 13 12 11 10 9876543210

SPI check 0000000 0XXXXXXXXXXXXXXXXXXXXXXXX

Device Configuration 0000001 0/1 X X X X X X

SBPOLL TIME

VBATP OV Disable

WAKE_B Pull up

IntB_Out

aconfig1

aconfig0

SP11

SP10

SP9

SP8

SP7

SP6

SP5

SP4

SP3

SP2

SP1

SP0

Tri-state Enable SP 0000010 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

Tri-state Enable SG 0000011 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

Wetting Current Level SP 0 0000100 0/1 SP7[2-0] SP6[2-0] SP5[2-0] SP4[2-0] SP3[2-0] SP2[2-0] SP1[2-0] SP0[2-0]

Wetting Current Level SG 0 0000101 0/1 SG7[2-0] SG6[2-0] SG5[2-0] SG4[2-0] SG3[2-0] SG2[2-0] SG1[2-0] SG0[2-0]

Wetting Current Level SG 1 0000110 0/1 SG15[2-0] SG14[2-0] SG13[2-0] SG12[2-0] SG11[2-0] SG10[2-0] SG9[2-0] SG8[2-0]

Wetting Current Level SG 2 0000111 0/1 XXXXXXXXX SG20[2-0] SG19[2-0] SG18[2-0] SG17[2-0] SG16[2-0]

Wetting Current Level SP 1 0001000 0/1 XXXXXXXXXXXX SP11[2-0 SP10[2-0] SP9[2-0] SP8[2-0]

Cont Wetting Current

Enable SP 0001011 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

Cont Wetting Current

Enable SG 0001100 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

Interrupt Enable SP 0001101 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

Interrupt Enable SG 0001110 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

Low-power Mode

configuration 0001111 0/1 XXXXXXXXXXXXXXXXint3 int2 int2 int0 poll3 poll2 poll1 poll0

Wake-up Enable SP 0010000 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

Wake-up Enable SG 0010001 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

LPM Comparator Only SP 0010010 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

LPM Comparator Only SG 0010011 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

LPM Voltage Threshold SP 0010100 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

LPM Voltage Threshold SG 0010101 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

LPM Polling current config

SP 0010110 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

LPM Polling current config

SG 0010111 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

LPM Slow Polling SP 0011000 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

LPM Slow Polling SG 0011001 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

Wake-up Debounce SP 0011010 0/1 XXXXXXXXXXXXSP11 SP10 SP9 SP8 SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

Wake-up Debounce SG 0011011 0/1 X X X SG20 SG19 SG18 SG17 SG16 SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8 SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

Enter Low-power Mode 0011100 1XXXXXXXXXXXXXXXXXXXXXXXX

AMUX Channel Select SPI 0011101 0/1 XXXXXXXXXXXXXXXXXasett asel5 asel4 asel3 asel2 asel1 asel0

Read Switch Status SP 0011110 0XXXXXXXXXXXXXXXXXXXXXXXX

Read Switch Status SG 0011111 0XXXXXXXXXXXXXXXXXXXXXXXX

Fault Status 0100001 0XXXXXXXXXXXXXXXXXXXXXXXX

Interrupt Pulse Request 0100011 1XXXXXXXXXXXXXXXXXXXXXXXX

Reset 0100100 1XXXXXXXXXXXXXXXXXXXXXXXX

26. Bits 23 and 22 are used for FAULT STATUS and INTflg global diagnostic flags (Read only) respectively. INTflg is cleared out upon reading of any

register with this flag available. The FAULT STATUS flag is cleared upon reading the fault status register and no fault event present anymore.

Analog Integrated Circuit Device Data

NXP Semiconductors 38

CD1030

7.9.1 SPI check

The MCU may check the communication with the IC by using the SPI Check register. The MCU sends the command and the response

during the next SPI transaction is 0x123456. The SPI Check command does not return Fault Status or INTflg bit, therefore this bit is not

cleared upon a SPI check command.

7.9.2 Device configuration register

The device has various configuration settings that are global in nature. The configuration settings are as follows:

• When the SP channels are programmed to detect a Switch to Battery (SB), the SBPOLLTIME bit can be used to program the length of

the polling pulse during the Low-power mode operation. A logic [0] sets the active polling timer to 1.2 ms and a logic [1] sets the active

polling timer to 58 us.

• When the CD1030 is in the overvoltage region, a Logic [0] on the VBATP OV bit, limits the wetting current on all input channels to

2.0 mA, and the CD1030 is not able to enter into the Low-power mode. A Logic [1] allows the device to operate normally even on the

overvoltage region. The OV flag sets when the device enters in the OV region, regardless the value of the VBATP OV bit.

• WAKE_B can be used to enable an external power supply regulator to supply the VDDQ voltage rail. When the WAKE_B VDDQ check

bit is a Logic [0], the WAKE_B pin is expected to be pulled-up internally or externally to VDDQ, and VDDQ is expected to go low, and so

the CD1030 does not wake-up on the falling edge of WAKE_B. A Logic [1], assumes the user uses an external pull-up to VBATP or

VDDQ (when VDDQ is not expected to be off) and the IC wakes up on a falling edge of WAKE_B.

• INT_B out is used to select how the INT_B pin operates when an interrupt occurs. The IC is able to pulse low [1] or latch low [0].

• A config[1-0] is used to determine the method of selecting the AMUX output, either a SPI command or using a hardwired setup with

SG[3-1].

• SP0-7 inputs may be programmable for switch-to-battery or switch-to-ground. To set a SPx input for switch-to-battery, a logic [1] for

the appropriate bit must be set. To set a SPx input for switch-to-ground, a logic [0] for the appropriate bit must be set. The MCU may

change or update the programmable switch register via software at any time in Normal mode. Regardless of the setting, when the SPx

input switch is closed, a logic [1] is placed in the serial output response register. If an SP is changed from SB or SG, the chip generates

an interrupt, since the SPI registers for the switch status change due to the change of polarity of SB / SG.

Table 15. SPI check command

[31-25] 24 bits [23 - 16]

0000_000 0 0000_0000

bits [15 - 8]

0000_0000

bits [7 - 0]

0000_0000

MISO Return Word 0x00123456

Analog Integrated Circuit Device Data

39 NXP Semiconductors

CD1030

Table 16. Device configuration register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0000_001 0/1 FAULT

STATUS INTflg Unused SBPOLL

TIME

VBATP OV

disable

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

WAKE_B

VDDQ Check INT_B out Aconfig1 Aconfig0 SP11 SP10 SP9 SP8

10001111

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

11111111

MISO Return Word bit 23 bit 22 bits [21 - 0]

0000_001[R/W] FAULT

STATUS INTflg Register Data

Table 17. Device configuration bits definition

Bit Functions Default value Description

23 FAULT

STATUS X

The FAULT STATUS flag is a read only bit. It is set when a fault occurs and it is cleared upon reading the fault

status register with no fault event is present anymore. It is a global variable and clearing the flag once clears

it for all registers.

22 INTflg X

The INTflg is a read only bit. It is set when an interrupt event occurs and it is cleared upon a read/write

transaction of a register containing the INTflg. It is a global variable and clearing the flag once clears it for all

registers.

21-18 Unused 0 Unused

17 SBPOLLTIME 0

Select the polling time for SP channels configured as SB.

• A logic [0] set the active polling timer to 1.0 ms,

• A logic [1] sets the active polling timer to 55 μs.

16 VBATP OV

Disable 0

VBATP Overvoltage protection

• 0 - Enabled

• 1 - Disable

15 WAKE_B

VDDQ Check 1

Enable/Disable WAKE_B to wake-up the device on falling edge when VDDQ is not present.

• 0 - WAKE_B is pulled up to VDDQ (internally and/or externally). WAKE_B is ignored while in LPM if VDDQ

is low.

• 1 - WAKE_B is externally pulled up to VBATP or VDDQ and wakes upon a falling edge of the WAKE_B pin

regardless of the VDDQ status.(VDDQ is not expected to go low)

14 Int_B_Out 0

Interrupt pin behavior

• 0 - INT pin stays low when interrupt occurs

• 1 - INT pin pulse low and return high

13-12 Aconfig(1-0) 00

Configure the AMUX output control method

• 00 - SPI (default)

• 01 - SPI

• 10 - HW 2-bit

• 11 - HW 3-bit

Refer to section 7.7, AMUX functional block, page 31 for details on 2 and 3-bit hardwire configuration.

11-0 SP11 - SP0 111_1111_1111

Configure the SP pin as Switch to Battery (SB) or Switch to ground (SG)

• 0 - Switch to Ground

• 1 - Switch to Battery

Analog Integrated Circuit Device Data

NXP Semiconductors 40

CD1030

7.9.3 Tri-state SP register

The tri-state command is used to set the input nodes as high-impedance (Table 18). By setting the tri-state register bit to logic [1], the

input is high-impedance regardless of the wetting current setting. The configurable comparator (4.0 V default) on each input remains

active. The MCU may change or update the tri-state register via software at any time in Normal mode. The tri-state register defaults to 1

(inputs are tri-stated). Any input in tri-state mode is still polled in LPM but the current source is not active during this time. The

determination of change of state occurs at the end of the tACTIVEPOLL and the wake-up decision is made.

7.9.4 Tri-state SG register

The tri-state command is used to set the input nodes as high-impedance (Table 19). By setting the tri-state register bit to logic [1], the

input is high-impedance regardless of the wetting command setting. The configurable comparator (4.0 V default) on each input remains

active. The MCU may change or update the tri-state register via software at any time in Normal mode. The tri-state register defaults to 1

(inputs are tri-stated). Any input in tri-state is still polled in LPM but the current source is not active during this time. The determination of

change of state occurs at the end of the tACTIVEPOLL and the wake-up decision is made.

Table 18. Tri-state SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0000_010 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX00 000 0

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00001111

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

11111111

MISO Return Word bit 23 bit 22 bits [21 - 0]

0000_010[R/W] FAULT

STATUS INTflg Register Data

Table 19. Tri-state SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0000_011 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX011111

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

11111111

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

11111111

MISO Return Word bit 23 bit 22 bits [21 - 0]

0000_011[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

41 NXP Semiconductors

CD1030

7.9.5 Wetting current level SP register 0

Three bits are used to control the configurable wetting currents for each individual input pin with the values set in the Table 20. The default

configuration is 16 mA for all channels. The MCU may change or update the wetting current register via software at any time in Normal

mode.

See Table 25 for the selectable wetting current level values for both SPx and SGx pins.

7.9.6 Wetting current level SP register 1

Three bits are used to control the configurable wetting currents for each individual input pin with the values set in the Table 21. The default

configuration is 16 mA for all channels. The MCU may change or update the wetting current register via software at any time in Normal

mode.

See Table 25 for the selectable wetting current level values for both SPx and SGx pins.

Table 20. Wetting current level SP register 0

[31-25] [24] bit [23 - 21] bit [20 - 18] bit [17 - 16]

0000_100 0/1 SP7 [2-0] SP6[2-0] SP5[2-1]

Default on POR

110 110 11

bit [15] bit [14 - 12] bit [11 - 9] bit [8]

SP5[0] SP4 [2-0] SP3[2-0] SP2[2]

0 110 110 1

bit [7 - 6] bit [5 - 3] bit [2 - 0]

SP2[1-0] SP1[2-0] SP0[2-0]

10 110 110

MISO Return Word bits [23 - 0]

0000_100[R/W] Register Data

Table 21. Wetting current level SP register 1

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0001_000 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit [11 - 9] bit [8]

Unused SP11[2-0] SP10[2]

0000 110 1

bit [7 - 6] bit [5 - 3] bit [2 - 0]

SP10[1-0] SP9[2-0] SP8[2-0]

10 110 110

MISO Return Word bit 23 bit 22 bits [21 - 0]

0001_000[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

NXP Semiconductors 42

CD1030

7.9.7 Wetting current level SG register 0

Three bits are used to control the configurable wetting currents for each individual input pin with the values set in the Table 22. The default

configuration is 16 mA for all channels. The MCU may change or update the wetting current register via software at any time in Normal

mode.

See Table 25 for the selectable wetting current level values for both SPx and SGx pins.

7.9.8 Wetting current level SG register 1

Three bits are used to control the configurable wetting currents for each individual input pin with the values set in the Table 23. The default

configuration is 16 mA for all channels. The MCU may change or update the wetting current register via software at any time in Normal

mode.

See Table 25 for the selectable wetting current level values for both SPx and SGx pins.

Table 22. Wetting current level SG register 0

[31-25] [24] bit [23 - 21] bit [20 - 18] bit [17 - 16]

0000_101 0/1 SG7 [2-0] SG6[2-0] SG5[2-1]

Default on POR

110 110 11

bit [15] bit [14 - 12] bit [11 - 9] bit [8]

SG5[0] SG4 [2-0] SG3[2-0] SG2[2]

0 110 110 1

bit [7 - 6] bit [5 - 3] bit [2 - 0]

SG2[1-0] SG1[2-0] SG0[2-0]

10 110 110

MISO Return Word bits [23 - 0]

0000_101[R/W] Register Data

Table 23. Wetting current level SG register 1

[31-25] [24] bit [23 - 21] bit [20 - 18] bit [17 - 16]

0000_110 0/1 SG15[2-0] SG14[2-0] SG13[2-1]

Default on POR

110 110 11

bit [15] bit [14 - 12] bit [11 - 9] bit [8]

SG13[0] SG12 [2-0] SG11[2-0] SG10[2]

0 110 110 1

bit [7 - 6] bit [5 - 3] bit [2 - 0]

SG10[1-0] SG9[2-0] SG8[2-0]

10 110 110

MISO Return Word bits [23 - 0]

0000_110[R/W] Register Data

Analog Integrated Circuit Device Data

43 NXP Semiconductors

CD1030

7.9.9 Wetting current level SG register 2

Three bits are used to control the configurable wetting currents for each individual input pin with the values set in the Table 24. The default

configuration is 16 mA for all channels. The MCU may change or update the wetting current register via software at any time in Normal

mode.

See Table 25 for the selectable wetting current level values for both SPx and SGx pins.

7.9.10 Continuous wetting current SP register

Each switch input has a designated 20 ms timer. The timer starts when the specific switch input crosses the comparator threshold. When

the 20 ms timer expires, the contact current is reduced from the configured wetting current (16 mA) to the sustain current. The wetting

current is defined to be an elevated level reducing to the lower sustain current level after the timer has expired. With multiple wetting

current timers disabled, power dissipation for the IC must be considered (see Figure 25).

The MCU may change or update the continuous wetting current register via software at any time in Normal mode. This allows the MCU

to control the amount of time wetting current is applied to the switch contact. Programming the continuous wetting current bit to logic [0]

operates normally with a higher wetting current followed by sustain current after 20 ms (pulsed Wetting current operation). Programming

to logic [1] enables the continuous wetting current (Table 26) and result in a full time wetting current level. The continuous wetting current

Table 24. Wetting current level SG register 2

[31-25] [24] bit 23 bit 23 bit 23 bit 23 bit 23 bit 23 bit 23 bit 23

0000_111 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit [14 - 12] bit [11 - 9] bit 8

Unused SG20 [2-0] SG19[2-0] SG18[2]

0 110 110 1

bit [7 - 6] bit [5 - 3] bit [2 - 0]

SG18[1-0] SG17[2-0] SG16[2-0]

10 110 110

MISO Return Word bits [23 - 0]

0000_111[R/W] Register Data

Table 25. SPx/SGx selectable wetting current levels

SPx/SGx[2-0]

Wetting current level

bit 2 bit 1 bit 0

0002.0 mA

0016.0 mA

0108.0 mA

0 1 1 10 mA

1 0 0 12 mA

1 0 1 14 mA

1 1 0 16 mA

1 1 1 20 mA

Analog Integrated Circuit Device Data

NXP Semiconductors 44

CD1030

7.9.11 Continuous wetting current SG register

Each switch input has a designated 20 ms timer. The timer starts when the specific switch input crosses the comparator threshold. When

the 20 ms timer expires, the contact current is reduced from the configured wetting current (16 mA) to 2.0 mA. The wetting current is

defined to be at an elevated level that reduces to the lower sustain current level after the timer has expired. With multiple wetting current

timers disabled, power dissipation for the IC must be considered.

The MCU may change or update the continuous wetting current register via software at any time in Normal mode. This allows the MCU

to control the amount of time wetting current is applied to the switch contact. Programming the continuous wetting current bit to logic [0]

operates normally with a higher wetting current followed by sustain current after 20 ms (Pulse wetting current operation). Programming to

logic [1] enables the continuous wetting current (Table 27) and results in a full time wetting current level. The continuous wetting current

Table 26. Continuous wetting current SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0001_011 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX00 000 0

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0001_011[R/W] FAULT

STATUS INTflg Register Data

Table 27. Continuous wetting current SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0001_100 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7SG6SG5SG4SG3SG2SG1SG0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0001_100[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

45 NXP Semiconductors

CD1030

Figure 25. Pulsed/continuous wetting current configuration

Switch to Ground

open

Switch to Ground

Closed

IWET

ISUS=~2.0 mA

0 ma

20 ms

IWET

0 ma

Continuous wetting

current enabled

Continuous wetting

current disabled

Analog Integrated Circuit Device Data

NXP Semiconductors 46

CD1030

7.9.12 Interrupt enable SP register

The interrupt register defines the inputs allowed to interrupt the CD1030 Normal mode. Programming the interrupt bit to logic [0] disables

the specific input from generating an interrupt. Programming the interrupt bit to logic [1] enables the specific input to generate an interrupt

with switch change of state. The MCU may change or update the interrupt register via software at any time in Normal mode. The Interrupt

7.9.13 Interrupt enable SG register

The interrupt register defines the inputs allowed to interrupt the CD1030 Normal mode. Programming the interrupt bit to logic [0] disables

the specific input from generating an interrupt. Programming the interrupt bit to logic [1] enables the specific input to generate an interrupt

with switch change of state. The MCU may change or update the interrupt register via software at any time in Normal mode. The Interrupt

Table 28. Interrupt enable SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0001_101 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX00 000 0

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00001111

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

11111111

MISO Return Word bit 23 bit 22 bits [21 - 0]

0001_101[R/W] FAULT

STATUS INTflg Register Data

Table 29. Interrupt enable SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0001_110 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX011111

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

11111111

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

11111111

MISO Return Word bit 23 bit 22 bits [21 - 0]

0001_110[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

47 NXP Semiconductors

CD1030

7.9.14 Low-power mode configuration

The device has various configuration settings for the Low-power mode operation. The configuration settings are as follows:

• int[3-0] is used to set the interrupt timer value. With the interrupt timer set, the IC wakes up after the selected timer expires and issues

an interrupt. This register can be selected to be OFF such that the IC does not wake-up from an interrupt timer.

• poll[3-0] is used to set the normal polling rate for the IC. The polling rate is the time between polling events. The current sources

become active at this time for a time of tACTIVEPOLLSG or tACTIVEPOLLSB for SG or SB channels respectively.

Table 30. Low-power mode configuration register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0001_111 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

int3 int2 int1 int0 poll3 poll2 poll1 poll0

00001111

MISO Return Word bit 23 bit 22 bits [21 - 0]

0001_111[R/W] FAULT

STATUS INTflg Register Data

Table 31. Low-power mode configuration bits definition

Bit Functions Default value Description

23 FAULT STATUS X It is set when a fault occurs and it is cleared upon reading the fault status register with a fault event

no longer present. It is a global variable and clearing the flag once clears it for all registers.

22 INTflg X It is set when an interrupt event occurs and it is cleared upon a read/write transaction of a register

containing the INTflg. It is a global variable and clearing the flag once clears it for all registers.

21 - 8 Unused 0 Unused

7 - 4 int[3-0] 0000

Set the Interrupt timer value

• 0000 - OFF

• 0001 - 6.0 ms

• 0010 - 12 ms

• 0011 - 24 ms

• 0100 - 48 ms

• 0101 - 96 ms

• 0110 - 192 ms

• 0111 - 394 ms

• 1000 - 4.0 ms

• 1001 - 8.0 ms

• 1010 - 16 ms

• 1011 - 32 ms

• 1100 - 64 ms

• 1101 - 128 ms

• 1110 - 256 ms

• 1111 - 512 ms

3 - 0 poll[3-0] 1111

Set the polling rate for switch detection

• 0000 - 3.0 ms

• 0001 - 6.0 ms

• 0010 - 12 ms

• 0011 - 24 ms

• 0100 - 48 ms

• 0101 - 68 ms

• 0110 - 76 ms

• 0111 - 128 ms

• 1000 - 32 ms

• 1001 - 36 ms

• 1010 - 40 ms

• 1011 - 44 ms

• 1100 - 52 ms

• 1101 - 56 ms

• 1110 - 60 ms

• 1111 - 64 ms (default)

Analog Integrated Circuit Device Data

NXP Semiconductors 48

CD1030

7.9.15 Wake-up enable register SP

The wake-up register defines the inputs allowed to wake the CD1030 from Low-power mode. Programming the wake-up bit to logic [0]

disables the specific input from waking the IC (Table 32). Programming the wake-up bit to logic [1] enables the specific input to wake-up

with switch change of state. The MCU may change or update the wake-up register via software at any time in Normal mode. The Wake-up

register defaults to 1 (wake-up enabled). If all channels (SG and SB) have the Wake-up bit disabled, the device disables the polling timer

to reduce the current consumption during Low-power mode.

7.9.16 Wake-up enable register SG

The wake-up register defines the inputs allowed to wake the CD1030 from Low-power mode. Programming the wake-up bit to logic [0]

disables the specific input from waking the IC (Table 33). Programming the wake-up bit to logic [1] enables the specific input to wake-up

with any switch change of state. The MCU may change or update the wake-up register via software at any time in Normal mode. The

Wake-up register defaults to 1 (wake-up enabled). If all channels (SG and SB) have the Wake-up bit disabled, the device disables the

polling timer to reduce the current consumption during Low-power mode.

Table 32. Wake-up enable SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0010_000 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00001111

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

11111111

MISO Return Word bit 23 bit 22 bits [21 - 0]

0010_000[R/W] FAULT

STATUS INTflg Register Data

Table 33. Wake-up enable SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0010_001 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX011111

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

11111111

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

11111111

MISO Return Word bit 23 bit 22 bits [21 - 0]

0010_001[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

49 NXP Semiconductors

CD1030

7.9.17 Comparator only SP

The comparator only register allows the input comparators to be active during LPM with no polling current. In this case, the inputs can

receive a digital signal on the order of the LPM clock cycle and wake-up on a change of state. This register is intended to be used for

signals that are driven by an external chip and drive to 5.0 V.

7.9.18 Comparator only SG

The comparator only register allows the input comparators to be active during LPM with no polling current. In this case, the inputs can

receive a digital signal on the order of the LPM clock cycle and wake-up on a change of state. This register is intended to be used for

signals driven by an external chip and drive to 5.0 V.

Table 34. Comparator only SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0010_010 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0010_010[R/W] FAULT

STATUS INTflg Register Data

Table 35. Comparator only SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0010_011 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7SG6SG5SG4SG3SG2SG1SG0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0010_011[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

NXP Semiconductors 50

CD1030

7.9.19 LPM voltage threshold SP configuration

The CD1030 is able to use different voltage thresholds to wake-up from LPM. When configured as SG, a Logic [0] means the input uses

the LPM delta voltage threshold to determine the state of the switch. A Logic [1] means the input uses the Normal threshold (VICTHR) to

determine the state of the switch. When configured as an SB, it only uses the 4.0 V threshold regardless the status of the LPM voltage

threshold bit. The user must ensure the correct current level is set to allow the crossing of the normal mode threshold (typ. 4.0 V).

7.9.20 LPM voltage threshold SG configuration

The CD1030 is able to use different voltage thresholds to wake-up from LPM. A Logic 0 means the input uses the LPM delta voltage

threshold to determine the state of the switch. A Logic [1] means the input uses the Normal threshold (VICTHR) to determine the state of

the switch. The user must ensure the correct current level is set to allow crossing of the normal mode threshold (typ. 4.0 V).

Table 36. LPM voltage threshold configuration SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0010_100 0/1 FAULT

STATUS INTflg Unused

Default on POR

00000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0010_100[R/W] FAULT

STATUS INTflg Register Data

Table 37. LPM voltage threshold configuration SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0010_101 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0010_101[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

51 NXP Semiconductors

CD1030

7.9.21 Polling current SP configuration

The normal polling current for LPM is 2.0 mA for SB channels and 1.0 mA for SG channels, A logic [0] selects the normal polling current

for each individual channel. By writing a Logic [1], the user may choose to select the IWET current value as defined in the wetting current

level registers. This results in higher LPM currents, but may be used in cases when a higher polling current is needed.

7.9.22 Polling current SG configuration

A logic [0] selects the normal polling current for LPM =1.0 mA. By writing a logic [1], the user can select the IWET current value as defined

in the wetting current registers for LPM. This results in higher LPM currents, but may be used in cases when a higher polling current is

needed.

Table 38. Polling current configuration SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0010_110 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0010_110[R/W] FAULT

STATUS INTflg Register Data

Table 39. Polling current configuration SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0010_111 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0010_111[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

NXP Semiconductors 52

CD1030

7.9.23 Slow polling SP

The normal polling rate is defined in the Low-power mode configuration register. If the user is able to poll at a slower rate (4x), the LPM

current level decreases significantly. Setting the bit to [0] results in the input polling at the normal rate as selected. Setting the bit to [1]

results in the input being polled at a slower frequency at 4x the normal rate.

7.9.24 Slow polling SG

The normal polling rate is defined in the Low-power mode configuration register. If the user is able to poll at a slower rate (4x), the LPM

current level decreases significantly. Setting the bit to [0] results in the input polling at the normal rate as selected. Setting the bit to [1]

results in the input being polled at a slower frequency at 4x the normal rate.

Table 40. Slow polling SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0011_000 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0011_000[R/W] FAULT

STATUS INTflg Register Data

Table 41. Slow polling SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0011_001 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0011_001[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

53 NXP Semiconductors

CD1030

7.9.25 Wake-up debounce SP

The IC is able to extend the time the active polling takes place to ensure a true change of state has occurred in LPM, and reduce the

chance noise has impacted the measurement. If this bit is [0], the IC uses a voltage difference technique to determine if a switch has

changed state. If this bit is set [1], the IC debounces the measurement by continuing to source the LPM polling current for an additional

1.2 ms and take the measurement based on the final voltage level. This helps to ensure the switch is detected correctly in noisy systems.

7.9.26 Wake-up debounce SG

The IC is able to extend the time the active polling takes place to ensure a true change of state has occurred in LPM, and reduce the

chance noise has impacted the measurement. If this bit is [0], the IC uses a voltage difference technique to determine if a switch has

changed state. If this bit is set [1], the IC debounces the measurement by continuing to source the LPM polling current for an additional

1.2 ms, and take the measurement based on the final voltage level. This helps to ensure the switch is detected correctly in noisy systems.

Table 42. Wake-up debounce SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0011_010 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0011_010[R/W] FAULT

STATUS INTflg Register Data

Table 43. Wake-up debounce SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0011_011 0/1 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0011_011[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

NXP Semiconductors 54

CD1030

7.9.27 Enter Low-power mode

Low-power mode (LPM) is used to reduce system quiescent currents. Low-power mode may be entered only by sending the Low-power

command. When returning to Normal mode, all register settings are maintained.

The Enter Low-power mode register is write only and has the effect of going to LPM and beginning operation as selected (polling, interrupt

timer). When returning from Low-power mode, the CD1030 returns the Read switch status SG register on the first valid SPI transaction.

The user should ensure the Read switch status SP register command is sent in the first SPI transaction after POR, to get the remaining

SP switch status information in the second SPI transaction.

7.9.28 AMUX control register

The analog voltage on switch inputs may be read by the MCU using the analog command (Table 45). Internal to the CD1030 is a 35-to-1

analog multiplexer. The voltage present on the selected input pin is buffered and made available on the AMUX output pin. The AMUX

output pin is clamped to a maximum of VDDQ volts regardless of the higher voltages present on the input pin. After an input has been

selected as the analog, the corresponding bit in the next MISO data stream is logic [0].

Setting the current to wetting current (configurable) may be useful for reading sensor inputs. Analog currents set by the analog command

are pull-up currents for all inputs. The MCU may change or update the analog select register via software at any time in Normal mode.

The analog select defaults to no input.

Table 44. Enter Low-power mode command

[31-25] [24] bits [23 - 16]

0011_100 1 0000_0000

bits [15 - 8]

0000_0000

bits [7 - 0]

0000_0000

MISO Return Word -

Table 45. AMUX control register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0011_101 0/1 FAULT

STATUS INTflg Unused

Default on POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused

00000000

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

Unused asett0 asel[5-0]

00000000

MISO Return Word bit 23 bit 22 bits [21 - 0]

0011_101[R/W] FAULT

STATUS INTflg Register Data

Analog Integrated Circuit Device Data

55 NXP Semiconductors

CD1030

Table 46. AMUX current select

asett[0] Zsource

0 hi Z (default)

WET

Table 47. AMUX channel select

asel 5 asel 4 asel3 asel 2 asel 1 asel 0 Analog channel select

000000 No Input Selected

000001 SG0

000010 SG1

000011 SG2

000100 SG3

000101 SG4

000110 SG5

000111 SG6

001000 SG7

001001 SG8

001010 SG9

001011 SG10

001100 SG11

001101 SG12

001110 SG13

001111 SG14

010000 SG15

010001 SG16

010010 SG17

010011 SG18

010100 SG19

010101 SG20

010110 SP0

010111 SP1

011000 SP2

011001 SP3

011010 SP4

011011 SP5

011100 SP6

011101 SP7

011110 SP8

011111 SP9

100000 SP10

100001 SP11

Analog Integrated Circuit Device Data

NXP Semiconductors 56

CD1030

7.9.29 Read switch status registers

The CD1030 uses two status registers to provide the status of all 33 input channels. The Read switch status SP register is used to

determine the state of each one of the SP inputs and is read only. All of the SP inputs are returned after the next command is sent. A

Logic [1] means the switch is closed while a Logic [0] is an open switch.

The Read switch status SG register is used to determine the state of each one of the SG inputs and is read only. All of the SG inputs are

returned after the next command is sent. A Logic [1] means the switch is closed while a Logic [0] is an open switch.

Both status registers include two more bits, the Fault Status bit and INTflg bit. The Fault Status bit is a combination of various Fault Status

bits in the Fault status register. If any of these bits are set, the Fault Status bit is set. The INTflg bit is set when an interrupt occurs on this

device. After POR both the Fault Status bit and the INTflg bit are set high to indicate an interrupt due to a POR occurred.The CD1030

returns the Read switch status SG register on the first valid SPI transaction and the INTflg bit is cleared, the Fault Status bit remains high

until the Fault status register is read and thus the POR fault bit and all other fault flags are cleared. User must ensure the Read switch

status SP register command is sent in the first SPI transaction after POR in order to get the remaining SP switch status information in the

second SPI transaction.

100010 Temp Diode

100011Battery Sense

Table 48. Read switch status SP register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0011_110 0 FAULT

STATUS INTflg Unused

Default After POR

XX000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SP11 SP10 SP9 SP8

0 0 0 0XXXX

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0

XXXXXXXX

MISO Return Word bit 23 bit 22 bits [21-12] bits [11-0]

0011_1100 FAULT

STATUS INTflg Unused SP11- SP0 Switch Status

Table 47. AMUX channel select (continued)

asel 5 asel 4 asel3 asel 2 asel 1 asel 0 Analog channel select

Analog Integrated Circuit Device Data

57 NXP Semiconductors

CD1030

7.9.30 Fault status register

To read the fault status bits the user should first sent a message to the IC with the fault status register address followed by any given

second command. The MISO response from the second command contains the fault flag information.

Table 49. Read switch status SG register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0011_111 0 FAULT

STATUS INTflg Unused SG20 SG19 SG18 SG17 SG16

Default After POR

11 0XXXXX

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

SG15 SG14 SG13 SG12 SG11 SG10 SG9 SG8

XXXXXXXX

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

SG7 SG6 SG5 SG4 SG3 SG2 SG1 SG0

XXXXXXXX

MISO Return Word bit 23 bit 22 bit [21] bits [20-0]

0011_1110 FAULT

STATUS INTflg Unused SG20 - SG0 Switch Status

Table 50. Fault status register

[31-25] [24] bit 23 bit 22 bit 21 bit 20 bit 19 bit 18 bit 17 bit 16

0100_001 0 Unused INTflg Unused

Default After POR

0X000000

bit 15 bit 14 bit 13 bit 12 bit 11 bit 10 bit 9 bit 8

Unused SPI error Hash Fault Unused

00000XX0

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

UV OV TempFlag OT INT_B Wake WAKE_B

Wake SPI Wake POR

XXXXXXXX

MISO Return Word bit 23 bit 22 bits [21-0]

0100_0010 FAULT

STATUS INTflg FAULT/FLAG BITS

Analog Integrated Circuit Device Data

NXP Semiconductors 58

CD1030

Table 51. MISO response for fault status command

Bit Functions Default value Description

23 Unused 0 Unused

22 INTflg X

Reports an Interrupt has occurred, user should read the status register to determine cause.

• Set: Various (SGx change of state, SPx change of state, Extended status bits).

• Reset: Clear of fault or read of Status register

21-11 Unused 0 Unused

10 SPI error X

Any SPI error generates a bit (Wrong address, incorrect modulo).

• Set: SPI message error.

• Reset: Read fault status register and no SPI errors.

9 Hash Fault X

SPI register and hash mismatch.

• Set: Mismatch between SPI registers and hash.

• Reset: No mismatch and SPI flag read.

8 Unused 0 Unused

7UV X

Reports a low VBATP voltage was in undervoltage range

• Set: Voltage drops below UV level.

• Reset: VBATP rises above UV level and flag read (SPI)

6OV X

Report the voltage on VBATP was higher than the OV threshold

• Set: Voltage at VBATP rises above overvoltage threshold.

• Reset: Overvoltage condition is over and flag read (SPI)

5 Temp Flag X

Temperature warning to note elevated IC temperature

• Set: tLIM warning threshold is passed.

• Reset: Temperature drops below thermal warning threshold + hysteresis and flag read (SPI)

4OT X

TLIM event occurred on the IC

• Set: TLIM warning threshold is passed.

• Reset: Temperature drops below thermal warning threshold + hysteresis and flag read (SPI)

3 INT_B Wake X

Part awakens via an external INT_B falling edge

• Set: INT_B Wakes the part from LPM (external falling edge)

• Reset: flag read (SPI).

2 WAKE_B Wake X

Part awakens via an external WAKE_B falling edge

• Set: External WAKE_B falling edge seen

• Reset: flag read (SPI).

1 SPI Wake X

Part awaken via a SPI message

• Set: SPI message wakes the IC from LPM

• Reset: flag read (SPI).

0POR X

Reports a POR event occurred.

• Set: Voltage at VBATP pin dropped below VBATP(POR) voltage

• Reset: flag read (SPI)

Analog Integrated Circuit Device Data

59 NXP Semiconductors

CD1030

7.9.31 Interrupt request

The MCU may request an Interrupt pulse duration of 100 μs by sending the Interrupt request command. After an Interrupt request

command, the CD1030 returns the Interrupt request command word, as well as the Fault status and INTflg bits set, if a fault/interrupt event

occurred. Sending an interrupt request command does not set the INTflg bit itself.

7.9.32 Reset register

Writing to this register causes all of the SPI registers to reset. The CD1030 behaves in the same way as if a POR has occurred. Both the

Fault Status bit and the INTflg bit are set high to indicate an interrupt due to a POR occurred.The CD1030 returns the Read switch status

SG register on the first valid SPI transaction and the INTflg bit is cleared, the Fault Status bit remains high until the Fault status register

is read and thus the POR fault bit and all other fault flags are cleared. User must ensure the Read switch status SP register command is

sent in the first SPI transaction after POR, to get the remaining SP switch status information in the second SPI transaction.

Table 52. Interrupt request command

[31-25] [24] bits [23 - 16]

0100_011 1 0000_0000

bits [15 - 8]

0000_0000

bits [7 - 0]

0000_0000

MISO Return Word bit 23 bit 22 bits [21-0]

0100_0111 FAULT

STATUS INTflg 0x000000

Table 53. Reset command

[31-25] [24] bits [23 - 16]

0100_100 1 0000_0000

bits [15 - 8]

0000_0000

bits [7 - 0]

0000_0000

MISO Return Word bit 23 bit 2 bit 21 bits [20-0]

0011_1110 FAULT

STATUS INTflg Unused SG20 - SG0 Switch Status

Analog Integrated Circuit Device Data

NXP Semiconductors 60

CD1030

8 Typical applications

8.1 Application diagram

Figure 26. Typical application diagram

8.2 Bill of materials

Table 54. Bill of materials

Item Quantity Reference Value Description

135

C1, C2, C3, C4, C5, C6, C7, C8, C9, C10, C11, C12,

C13, C14, C15, C16, C17, C18, C19, C20, C21, C24,

C26, C27, C28, C29, C30, C31, C32, C33, C34, C35,

C36, C37, C38

0.1 μF CAP CER 0.1 μF 100 V X7R 10% 0603

2 1 C22 100 μF CAP ALEL 100 μF 50 V 20% -- SMD

3 2 C23, C25 1.0 nF CAP CER 1000 PF 100 V 10% X7R 0603

4 1 D1 ES3AB-13-F DIODE RECT 3.0 A 50 V AEC-Q101 SMB

533

R1, R2, R3, R4, R5, R6, R7, R8, R9, R10, R11, R12,

R13, R14, R15, R16, R17, R18, R19, R20, R21, R24,

R25, R26, R27, R28, R29, R30, R31, R32, R33, R34,

R35

100 RES MF 100 Ω 1/10 W 1% 0805

6 1 R22 1.0 k RES MF 1.0 kΩ 1/10 W 5% 0805

7 2 R36, R23 10 k RES MF 10 kΩ 1/10 W 5% 0805

8 1 U1 CD1030 IC MULTIPLE DETECTION SWITCH INTERFACE

LQFP48

to MCU

ADC

TO MCU

VABTP

SG0

SG1

SG2

SG3

SG4

SG5

SG6

SG7

SG8

SG9

SG10

SG11

SG12

SG13

SP7

SP6

SP5

SP4

SP3

SP2

SP1

SP0

WAKE_B

MOSI

MISO

SCLK

CS_B

INT_B

SG14

SG15

SG16

SG17

SG18

SG19

SG20

SP11

SP10

SP9

SP8

BATTERY VDDQ

VBATP

AMUX

C9 0.1uF

C33 0.1uF

R6 100

R12 100 R25 100

C23

1nf

R8 100

R3 100

C34 0.1uF

R14 100

R13 100

R35 100

R34 100

R10 100

R26 100

R33 100

C35 0.1uF

C13 0.1uF

R2 100

C15 0.1uF

R32 100

R27 100

C2 0.1uF

CD1030

SCLK 45

CS 46

SG0

SG1

SG2

SG3

SG4

SG5

SG6

SG7

SG8

SG9

SG10

SG11

SG12

SG13

MOSI 44

SP0 47

SP1 48

SP2 1

SP3 2

WAKE 20

SP4 3

SP5 31

SP6 32

SP7 33

INT 38

AMUX

MISO 41

VBATP2 17

VDDQ 40

GND3

EP_GND

SP8 34

SP9 35

SP10 36

SP11 37

SG14

SG15

SG16

SG17

SG18

SG19

SG20

GND2

NC1 18

NC2 21

GND1

VBATP1 16

C28 0.1uF

R21 100

R7 100

C16 0.1uF

C36 0.1uF

C8 0.1uF

C27 0.1uF

R20 100

C3 0.1uF

C17 0.1uF

C12 0.1uF

R28 100

C37 0.1uF

R36

10K

C29 0.1uF

R19 100

C6 0.1uF

C18 0.1uF

C22

100uF

R29 100

C25

1nF

C30 0.1uF

R18 100

R1 100

C19 0.1uF

C5 0.1uF

R22

C20 0.1uF

C7 0.1uF

C38 0.1uF

R11 100

R23

10K

R17 100

C11 0.1uF

C14 0.1uF

C21 0.1uF

R30 100

C24

0.1uF

R16 100

R15 100

ES3AB-13-F

A C

R4 100

R31 100

C10 0.1uF

C32 0.1uF

R9 100

R5 100

R24 100

C4 0.1uF

C1 0.1uF

C31 0.1uF

C26

0.1uF

CD1030

Analog Integrated Circuit Device Data

61 NXP Semiconductors

CD1030

8.3 Abnormal operation

The CD1030 could be subject to various conditions considered abnormal as defined within this section.

8.3.1 Reverse battery

This device with applicable external components is not damaged by exposure to reverse battery conditions of -14 V. This test is performed

for a period of one minute at 25 °C. In addition, this negative voltage condition does not force any of the logic level I/O pins to a negative

voltage less than -0.6 V at 10 mA or to a positive voltage greater the 5.0 V. This ensures protection of the digital device interfacing with

this device.

8.3.2 Ground offset

The applicable driver outputs and/or current sense inputs are capable of operation with a ground offset of ±1.0 V. The device is not

damaged by exposure to this condition and maintains specified functionality.

8.3.3 Shorts to ground

All I/Os of the device that are available at the module connector are protected against shorts to ground with maximum ground offset

considered (-1.0 V referenced to device ground or other application specific value). The device is not damaged by this condition.

8.3.4 Shorts to battery

All I/Os of the device available at the module connector are protected against a short to battery (voltage value is application dependent,

although there may be cases where short to jump start or load dump voltage values are required). The device is not damaged by this

condition.

8.3.5 Unpowered shorts to battery

All I/Os of the device available at the module connector are protected against unpowered (battery to the module is open) shorts to battery

per application specifics. The device is not damaged by this condition, and does not enable any outputs nor backfeed onto the power rails

(VBATP, VDDQ) or the digital I/O pins.

8.3.6 Loss of module ground

The definition of a loss of ground condition at the device level is all pins of the IC detects very low-impedance to battery. The nomenclature

is suited to a test environment. In the application, a loss of ground condition results in all I/O pins floating to battery voltage, while all

externally referenced I/O pins are at worst case pulled to ground. All applicable driver outputs and current sense inputs are protected

against excessive leakage current due to loads referenced to an external ground (high-side drivers).

8.3.7 Loss of module battery

The loss of battery condition at the parts level is the power input pins of the IC see infinite impedance to the battery supply voltage

(depending upon the application), but there is some undefined impedance looking from these pins to ground. All applicable driver outputs

and current sense inputs are protected against excessive leakage current due to loads referenced to an external battery connection

(low-side drivers).

Analog Integrated Circuit Device Data

NXP Semiconductors 62

CD1030

9 Packaging

9.1 Package mechanical dimensions

Package dimensions are provided in package drawings. To find the most current package outline drawing, go to www.nxp.com and

perform a keyword search for the drawing’s document number.

Table 55. Packaging information

Package Suffix Package outline drawing number

48-Pin LQFP-EP AE 98ASA00173D

NXP SEMICONDUCTORS N.V.

Analog Integrated Circuit Device Data

63 NXP Semiconductors

CD1030

NXP SEMICONDUCTORS N.V.

Analog Integrated Circuit Device Data

NXP Semiconductors 64

CD1030

NXP SEMICONDUCTORS N.V.

Analog Integrated Circuit Device Data

65 NXP Semiconductors

CD1030

10 Reference section

Table 56. CD1030 reference documents

Reference Description

CDF-AEC-Q100 Stress Test Qualification For Automotive Grade Integrated Circuits

Q-1000 Qualification Specification for Integrated Circuits

SQ-1001 Specification Conformance

Analog Integrated Circuit Device Data

NXP Semiconductors 66

CD1030

11 Revision history

REVISION DATE DESCRIPTION OF CHANGES

1.0 1/2015 • Initial Release

2.0 7/2015

• Deleted statement: Short to ground is detectable by internal diagnostics

• Deleted statement: Short to battery is detectable by internal diagnostics

• Changed test conditions on IPOLLING,IQ to make sure the worst case is being considered (3.0 ms)

• Added Note 13 and Note 14 to clarify LPM current specification

• VDDQ bulk capacitor marked a 10 μF typical value if required by the application

• Updated IBATP(ON) to Typ = 12 mA, Max = 16 mA

• Clarified WAKE_B operation

• Updated VBATP HBM specification to 4.0 KV

3.0 1/2016

• Relaxed AMUX offset specification to ±15 mV

• Updated Figure 16 to clarify LPM operation

• Clarified 20% tolerance for SB wetting current in LV condition

• Corrected MISO operation description, the CD1030 also shift data out on the Falling edge of SCLK

• Deleted PC34CD1030AE from the Orderable Part Variations table

4.0 3/2017 • Corrected typo in Figure 2

• Added Note 2 to switch input voltage range in Table 3

Information in this document is provided solely to enable system and software implementers to use NXP products.

There are no expressed or implied copyright licenses granted hereunder to design or fabricate any integrated circuits

based on the information in this document. NXP reserves the right to make changes without further notice to

anyproducts herein.

NXP makes no warranty, representation, or guarantee regarding the suitability of its products for any particular

purpose, nor does NXP assume any liability arising out of the application or use of any product or circuit, and

specifically disclaims any and all liability, including without limitation, consequential or incidental damages. "Typical"

parameters that may be provided in NXP data sheets and/or specifications can and do vary in different applications,

and actual performance may vary over time. All operating parameters, including "typicals," must be validated for each

customer application by the customer's technical experts. NXP does not convey any license under its patent rights nor

the rights of others. NXP sells products pursuant to standard terms and conditions of sale, which can be found at the

following address:

http://www.nxp.com/terms-of-use.html.

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Document Number: CD1030

Rev. 4.0

3/2017