10-Bit,
A/D Converter
AD571
ASD0012806 Rev. F
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibilit y is assumed by Analog Devices for its use,
nor for any infringements of patents or other rights of third parties that may
result from its use. Specifications subj ect to chang e without notice. No license
is granted by implication or otherwise under any patent or patent rights of
Analog Devices. Trademarks and registered trademarks are the property of
their respective companies.
One Technology Wa y, P.O. Box 9106, Norw ood, MA 02062-9106,
U.S.A.
Tel: 781.329.4700 www.analog.com
Fax: 781.326.8703 © 2009 Analog Devices, Inc. All rights reserved.
1.0 SCOPE
This specification documents the detailed requirements for Analog Devices space qualified die including
die qualification as described for Class K in MIL-PRF-38534, Appendix C, Table C-II except as
modified herein.
The manufacturing flow described in the STANDARD DIE PRODUCTS PROGRAM brochure at
http://www.analog.com/marketSolutions/militaryAerospace/pdf/Die_Broc.pdf is to be considered a part
of this specification.
This data sheet specifically details the space grade version of this product. A more detailed operational
description and a complete data sheet for commercial product grades can be found at
www.analog.com/AD571
2.0 Part Number. The complete part number(s) of this specification follow:
Part Number Description
AD571-000C 10-Bit, A/D Converter
3.0 Die Information
3.1 Die Dimensions
3.2 Die Picture
1. Bit 9
2. Bit 8
3. Bit 7
4. Bit 6
5. Bit 5
6. Bit 4
7. Bit 3
8. Bit 2
9. Bit 1 (MSB)
10. VCC _____
11. BLK & CONV
12. VEE
13. ANALOG IN
14. ANALOG COM
15. BIPOLAR OFF
16. DIGITAL COM
17. DATA READY
18. BIT 10 (LSB)
Die Size Die Thickness
mil Bond Pad
Metalization
126 mil x 158 mil 19 mil ± 2 mil Al/Cu
AD571
ASD0012806 Rev. F | Page 2 of 6
3.3 Absolute Maximum Ratings 1/
Negative Supply Voltage (VEE) to Digital Common....................-16.5V dc
Positive Supply Voltage (VCC) to Digital Common......................+7V dc
Analog Input Voltage to Analog Common...................................±15V dc
Digital Input Voltage to Digital Common.....................................0V dc to VCC
Digital Output Voltage to Digital Common..................................0V dc to VCC
Analog Return to Digital Common...............................................±1V dc
Storage Temperature Range..........................................................-65°C to +150°C
Junction Temperature (TJ).............................................................+175°C
Ambient Operating Temperature Range.......................................-55°C to +125°C
Absolute Maximum Ratings Notes:
1/
Stresses above the absolute maximum rating may cause permanent damage to the device.
Extended operation at the maximum levels may degrade performance and affect
reliability.
4.0 Die Qualification
In accordance with class-K version of MIL-PRF-38534, Appendix C, Table C-II, except as
modified herein.
(a) Qual Sample Size and Qual Acceptance Criteria – 25/2
(b) Qual Sample Package – DIP
(c) Pre-screen electrical test over temperature performed post-assembly prior to die qualification.
Table I - Dice Electrical Characteristics
Parameter Symbol
Conditions
1/ Limit
Min Limit
Max Units
Relative Accuracy RA Unipolar and Bipolar major
transitions ±3 codes ±0.195 % FS
Digital Input High Voltage VIH BLK and CONV 2 V
Digital Input Low Voltage VIL BLK and CONV 0.8 V
Digital Input High Current IIH BLK and CONV , VIH = 5V ±100 µA
Digital Input Low Current IIL BLK and CONV , VIL = 0V ±100 µA
Digital Output Low Voltage VOL DATA READY,
Bit 1 - 10, IOL = +3.2mA 0.4 V
Digital Output High Voltage VOH Bit 1 - 10, IOH = -0.5mA 2.4 V
Unipolar
±40
Full Scale Error 2/ A
E Bipolar
±20 mV
Offset Error VOS First transition
±0.4 % FS
Bipolar Zero Error BPZE Low side MSB,
Transition Bipolar ±0.4 % FS
AD571
ASD0012806 Rev. F | Page 3 of 6
Table I - Dice Electrical Characteristics (Continued)
Parameter Symbol Conditions
1/
Limit
Min
Limit
Max Units
Three-S tate Leakage Current IOLT VOH = 5V, VOL = 0V,
Bit 1 - 10 ±40 µA
ICC BLK and CONV 10
Power Supply Current IEE -15
mA
Diff erential Nonlinearity 3/ DNL All codes test Unipolar and
Bipolar 10 Bits
-16.0V ≤ VEE ≤ -13.5V
VCC = +5V
Power Supply Rejection PSRR +4.5V ≤ VCC ≤ +5.5V
VEE = -15V
±78.1 mV
Table I Notes:
1/ VCC = +5V, VEE = -15V, VIH = +2.0V, VIL = +0.8V, analog input through 15Ωto pin 13,
Unipolar configuration. Also, in the Unipolar configuration pin 15 (Bipolar Offset Control) is
grounded. TA = 25°C, unless otherwise specified.
2/ Full Scale Error guaranteed trimmable with 50Ωpotentiometer.
3/ Minimum resolution for which no missing codes are guaranteed.
AD571
ASD0012806 Rev. F | Page 4 of 6
Table II Notes:
1/ VCC = +5V, VEE = -15V, VIH = +2.0V, VIL = +0.8V, analog input through 15Ωto pin 13, Unipolar
configuration. Also, in the Unipolar configuration pin 15 (Bipolar Offset Control) is grounded.
2/ Full Scale Error guaranteed trimmable with 50Ωpotentiometer.
3/ Minimum resolution for which no missing codes are guaranteed.
Table II - Electrical Characteristics for Qual Samples
Parameter Symbol
Conditions
1/ Sub-
groups Limit
Min Limit
Max Units
Relative Accuracy RA Unipolar and Bipolar
major transitions ±3 codes 1, 2, 3 ±0.195 % of FS
Digital Input High Voltage VIH BLK and CONV 1, 2, 3 2 V
Digital Input Low Voltage VIL BLK and CONV 1, 2, 3 0.8 V
Digital Input High Current IIH BLK and CONV ,
VIH = 5V 1, 2, 3 ±100 µA
Digital Input Low Current IIL BLK and CONV ,
VIL = 0V 1, 2, 3 ±100 µA
Digital Output Low Voltage VOL DATA READY,
Bit 1 - 10, IOL = +3.2mA 1, 2, 3 0.4 V
Digital Output High Voltage VOH Bit 1 - 10,
IOH = -0.5mA 1, 2, 3 2.4 V
Unipolar
±40
Full Scale Error 2/ A
E Bipolar 1 ±20 mV
Full Scale Temperature Drift TCAE 2, 3
±0.488 % FS
Offset Error VOS First transition 1
±0.4 % FS
Offset Temperature Drift TCVOS 2, 3
±0.195 % FS
Bipolar Zero Error BPZE Low side MSB,
Transition Bipolar 1
±0.4 % FS
Bipolar Zero Temperature TCBPZE Bipolar 2, 3
±0.195 % FS
Three-State Leakage Current IOLT VOH = 5V, VOL = 0V,
Bit 1 - 10 1, 2, 3 ±40 µA
ICC BLK and CONV 1 10
Power Supply Current IEE 1 -15
mA
Differential Nonlinearity 3/ DNL All codes test
Unipolar and Bipolar 1 10 Bits
-16.0V ≤ VEE ≤ -13.5V
VCC = +5V
Power Supply Rejection PSRR +4.5V ≤ VCC ≤ +5.5V
VEE = -15V
1, 2, 3 ±78.1 mV
Input Resistance RIN 4 3 7
kΩ
Conversion Time TC 9 15 40
µs
AD571
ASD0012806 Rev. F | Page 5 of 6
5.0 Life Test/Burn-In Information
5.1 HTRB is not applicable for this drawing.
5.2 Burn-in is per MIL-STD-883 Method 1015 test condition B or C.
5.3 Steady state life test is per MIL-STD-883 Method 1005.
Table III - Life Test Endpoint and Delta Parameter
(Product is tested in accordance with Table II with the following exceptions)
Post Burn In Limit Post Life Test Limit
Parameter Symbol
Sub-
groups Min Max Min Max
Life
Test
Delta Units
Power Supply Current ICC 1 10 ±1 mA
Digital Output Low Voltage VOL 1, 2, 3 0.4 0.4 ±0.1 V
Digital Output High Voltage VOH 1, 2, 3 2.4 2.4 ±0.24 V
Offset Error VOS 1 ±0.6 ±0.8 % FS
Bipolar Zero Error BPZE 1 ±0.6 ±0.8 % FS
Unipolar Full Scale Error AE UNI 1 ±40 ±80 mV
Bipolar Full Scale Error AE BIP 1 ±20 ±60 mV
AD571
ASD0012806 Rev. F | Page 6 of 6
Rev Description of Change Date
A Initiate Feb. 28, 2002
B Table III. Change post burn in limits of both Offset Error and Bipolar Zero Error
from ±0.2%FS to ±0.6%FS. Update web address. Sep. 30, 2004
C Update 1.0 Scope description. 31 July 2007
D Update header/footer and add to 1.0 Scope description Feb. 13, 2008
E Add junction temperature....+175°C to section 3.3-Absolute Maximum Ratings April 3, 2008
F Updated Section 4.0c note to indicate pre-screen temp testing being performed 6-JUN-2009
© 2009 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective
companies.
Printed in the U.S.A. 06/09
