2N2222ACSM-RH HIGH SPEED, MEDIUM POWER NPN SWITCHING TRANSISTOR RADIATION TESTED FOR HIGH RELIABILITY APPLICATIONS MECHANICAL DATA Dimensions in mm (inches) FEATURES * SILICON PLANAR EPITAXIAL NPN TRANSISTOR 0.31 rad. (0.012) 3 2 1 1.91 0.10 (0.075 0.004) 3.05 0.13 (0.12 0.005) * HERMETIC CERAMIC SURFACE MOUNT PACKAGE (SOT23 COMPATIBLE) 0.76 0.15 (0.03 0.006) 2.54 0.13 (0.10 0.005) 0.51 0.10 (0.02 0.004) 0.31 rad. (0.012) A = 1.02 0.10 (0.04 0.004) * HIGH SPEED SATURATED SWITCHING A 1.40 (0.055) max. LCC1 PACKAGE (DSCC TYPE UB) PAD 1 - Base * ESA, SCC-B, JAN LEVEL SCREENING OPTIONS Underside View PAD 2 - Emitter PAD 3 - Collector APPLICATIONS: Hermetically sealed surface mount version of the popular 2N2222A for high reliability / space applications requiring small size and low weight devices. ABSOLUTE MAXIMUM RATINGS (Tcase = 25C unless otherwise stated) VCBO VCEO VEBO IC PD RJA Tstg,Tj Collector - Base Voltage Collector - Emitter Voltage (IB = 0) Emitter - Base Voltage (IB = 0) Collector Current Total Device Dissipation Derate above 50C Thermal Resistance Junction to Ambient Storage Temperature,Operating Temp Range 75V 40V 6V 600mA 350mW 2.0mW / C 350C/W -55 to 200C Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 5551 Issue 1 2N2222ACSM-RH PRE-IRRADIATION ELECTRICAL CHARACTERISTICS (Tcase = 25C unless otherwise stated) Parameter Test Conditions Min. Typ. Max. Unit VCEO(sus)* Collector - Emitter Sustaining Voltage IC = 10mA 40 V V(BR)CBO* Collector - Base Breakdown Voltage IC = 10A 75 V V(BR)EBO* Emitter - Base Breakdown Voltage IE = 10A IC = 0 6 V ICEX* Collector Cut-off Current (IC = 0) IB = 0 VCE = 60V 10 nA ICBO* Collector - Base Cut-off Current IE = 0 VCB = 60V 10 nA 10 A IEBO* Emitter Cut-off Current (IC = 0) IC = 0 VEB = 3V (off) 10 nA IBL* Base Current VCE = 60V VEB = 3V (off) 20 nA VCE(sat)* Collector - Emitter Saturation Voltage IC = 150mA IB = 15mA 0.3 IC = 500mA IB = 50mA 1 VBE(sat)* Base - Emitter Saturation Voltage IC = 150mA IB = 15mA IC = 500mA IC = 50mA IC = 0.1mA VCE = 10V 35 IC = 1mA VCE = 10V 50 IC = 10mA VCE = 10V 75 TA = -55C IC = 10mA VCE = 10V 35 IC = 150mA VCE = 10V 100 IC = 150mA VCE = 1V 50 IC = 500mA VCE = 10V 40 hFE* TC = 125C DC Current Gain 0.6 1.2 2 V V -- 300 * Pulse test tp = 300s , 2% DYNAMIC CHARACTERISTICS (Tcase = 25C unless otherwise stated) Parameter Test Conditions Min. Typ. Max. Unit fT Transition Frequency IC = 20mA VCE = 20V f = 100MHz 300 MHz Cob Output Capacitance VCB = 10V IE = 0 f = 1.0MHz 8 Cib Input Capacitance VBE = 0.5V IC = 0 f = 1.0MHz 30 hfe Small Signal Current Gain IC = 1mA VCE = 10V f = 1kHz 50 300 IC = 10mA VCE = 10V f = 1kHz 75 375 pF -- SWITCHING CHARACTERISTICS (RESISTIVE LOAD) (Tcase = 25C unless otherwise stated) Parameter Test Conditions Min. Typ. Max. Unit td Delay Time VCC = 30V VBE = 0.5V (off) 10 ns tr Rise Time IC1 = 150mA IB1 = 15mA 25 ns ts Storage Time VCC = 30V IC = 150mA 225 ns tf Fall Time 60 ns IB1 = IB2 = 15mA fT is defined as the frequency at which hFE extrapolates to unity. Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 5551 Issue 1 2N2222ACSM-RH RADIATION TEST DATA Total dose or TID is a long term degradation of electronics due to the culmative energy depoisted in a material. Typical effects in 2N2222A bipolar transistors when exposed to ionising radiation include variations in device parameters such as leakage current, gain or in some cases functional and parametric failures. Significant sources of TID exposure in the space enviroment include trapped electrons, trapped photons and solar protons. TOTAL DOSE RADIATION TESTING Sample devices from Semelab wafer stocks were assembled in standard LCC1 ceramic surface mount packages. Testing was to an accumulated dose of approximately 120Krad(Si)and a dose rate of 360 rad(Si)/hour. The tests were performed at a qualified test house using a Cobalt 60 calibrated source. DEVICE DETAILS Part Number 2N2222ACSM Production Lot: AA0212C Semelab Wafer Lot: TG5 EXPERIMENTAL CONDITIONS IRRADIATION STEPS DOSE RATE Krads/hr ANNEALING STEPS TEMPERATURE HRS C 0 Krad 25 32 Krad 0.36 25 59 Krad 0.36 25 119 Krad 0.36 0 25 24 25 Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 5551 Issue 1 2N2222ACSM-RH BIAS CONDITIONS TEST CONDITIONS(Tcase = 25C unless otherwise stated) Parameter Test Conditions Min. Typ. Max. Unit hFE1 DC Current Gain VCE = 10V IC = 100A 35 hFE2 DC Current Gain VCE = 10V IC = 10mA 75 hFE3 DC Current Gain VCE = 10V IC = 150mA 100 VCE(sat) Collector - Emitter Saturation Voltage IC = 150mA IB = 15mA 0.3 V ICBO Collector - Base Cut-off Current VCB = 50V IE = 0 10 nA -- 300 RADIATION TEST CONCLUSIONS Six samples plus one control sample were used during testing. Each sample was biased and exposed to radiation using a dose rate of 360 rad(Si)/hour at room temperature. All parameters remained within specifications limits with the exception of hFE1 which was outside the limits at 119Krad respectively. Post annealing at room temperature for 24 hours had no appreciable effect. Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 5551 Issue 1 2N2222ACSM-RH Test Condition : TID Parameter : DC Current Gain : hFE 1 VCE = 10V, IC = 100A 1 2 3 4 5 6 7 Statistics Min Limit Min Max Mean Sigma TEST TST001 : EXPOSURE 0 kRad 32 kRad 59 kRad 119 kRad 157 160 158 157 158 86 50 29 159 88 50 29 158 84 48 28 158 86 49 29 158 88 50 29 158 101 64 40 35 158 159 158 0 35 84 101 89 6 35 48 64 52 6 TEST TST002 : ANNEALING 0 Hour 24 Hour 1 157 159 2 29 30 3 29 30 4 28 29 5 29 30 6 29 31 7 40 43 Statistics Min Limit Min Max Mean Sigma 35 28 40 31 5 35 28 40 31 5 35 29 43 32 5 DC Curent Gain : hFE 1 200 hFE 1 160 120 80 40 0 0 kRad 32 kRad 59 kRad 119 kRad Step (kRad) DC Current Gain : hFE 1 200 hFE 1 160 120 80 40 0 0 Hour 24 Hour Step (Hour) Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 5551 Issue 1 1 2 3 4 5 6 7 Statistics Min Limit Min Max Mean Sigma Semelab plc. TEST TST001 : EXPOSURE 0 kRad 32 kRad 59 kRad 119 kRad 184 185 184 183 185 132 108 89 185 130 107 88 185 129 107 87 184 130 108 88 185 130 108 88 186 139 116 98 75 184 186 185 1 75 129 139 132 4 75 107 116 109 3 75 87 98 90 4 TEST TST002 : ANNEALING 0 Hour 24 Hour 1 183 182 2 89 90 3 88 90 4 87 89 5 88 90 6 88 90 7 98 100 Statistics Min Limit Min Max Mean Sigma Telephone +44(0)1455 556565. Fax +44(0)1455 552612. 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