DATA SH EET
Product data sheet 2003 Dec 12
DISCRETE SEMICONDUCTORS
PBSS5130T
30 V, 1 A
PNP low VCEsat (BISS) transistor
db
ook, halfpage
M3D088
2003 Dec 12 2
NXP Semiconductors Product data sheet
30 V, 1 A
PNP low VCEsat (BISS) transistor PBSS5130T
FEATURES
Low collector-emitter saturation volt age VCEsat
High collector current capability: IC and ICM
Higher efficiency leading to less heat generation
Reduced printed-circuit bo ard requirements
Cost effective alternative to MOSFETS in specific
applications.
APPLICATIONS
Power management
DC/DC converters
Supply line switching
Battery charger
LCD backlighting.
Peripheral drivers
Driver in low su pply voltage applications (e.g. lamps
and LEDs)
Inductive load driver (e.g. relays ,
buzzers and motors).
DESCRIPTION
PNP low VCEsat transistor in a SOT23 plastic package.
MARKING
Note
1. * = p : made in Hong Kong
* = t : made in Malaysia
* = W : made in China.
TYPE NUMBER MARKING CODE(1)
PBSS5130T *3E
PINNING
PIN DESCRIPTION
1base
2emitter
3collector
handbook, halfpage
21
3
MAM256
Top view
2
3
1
Fig.1 Simplified outline (SOT23 ) and symbo l .
QUICK REFERENCE DATA
SYMBOL PARAMETER MAX. UNIT
VCEO collector-emitter voltage 30 V
ICcollector current (DC) 1 A
ICRP repetitive peak collector
current 1.5 A
RCEsat equivalent on-resistance 220 mΩ
2003 Dec 12 3
NXP Semiconductors Pr oduct data shee t
30 V, 1 A
PNP low VCEsat (BISS) transistor PBSS5130T
ORDERING INFORMATION
LIMITING VALUES
In accordance with the Absolute Max imum Rating System (IEC 60134).
Notes
1. Device mounted o n an FR4 printed-circuit board , single-side d copper, tinplated, s tandard footprint.
2. Device mounted on an FR4 printed-circuit board, single sided-copper, tinplated, mounting pad for collector 1 cm2.
THERMAL CHARACTE RISTICS
Notes
1. Device mounted o n an FR4 printed-circuit board , single-side d copper, tinplated and standard footp rint.
2. Device mounted on an FR4 printed-circuit board, single-sided copper, tinplated and mounting pad for collector 1 cm2.
TYPE NUMBER PACKAGE
NAME DESCRIPTION VERSION
PBSS5130T plastic surface mounted package; 3 leads SOT23
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VCBO collector-base volta ge open emitter 30 V
VCEO collector-emitter voltage open base 30 V
VEBO emitter-base voltage open collector 5 V
ICcollector current (DC) 1 A
ICM peak collector current 3 A
IBM peak base current 300 mA
Ptot total power dissipation Tamb 25 °C
note 1 300 mW
note 2 480 mW
Tstg storage temperature 65 +150 °C
Tjjunction temperature 150 °C
Tamb operating ambient temperature 65 +150 °C
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to
ambient in free air
note 1 417 K/W
note 2 260 K/W
2003 Dec 12 4
NXP Semiconductors Pr oduct data shee t
30 V, 1 A
PNP low VCEsat (BISS) transistor PBSS5130T
CHARACTERISTICS
Tamb = 25 °C unless otherwise specified.
Note
1. Pulse test: tp 300 μs; δ 0.02.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
ICBO collector-base cut-off current VCB = 30 V; IE = 0 100 nA
VCB = 30 V; IE = 0; Tj = 150 °C 50 μA
IEBO emitter-base cut-off current VEB = 4 V; IC = 0 100 nA
hFE DC current gain VCE = 2 V; IC = 100 mA 300 450
VCE = 2 V; IC = 500 mA 260 350
VCE = 2 V; IC = 1 A 210 290
VCEsat collector-emitter saturation voltage IC = 100 mA; IB = 1 mA 100 mV
IC = 1 A; IB = 50 mA 225 mV
RCEsat equivalent on-re sistance IC = 500 mA; IB = 50 mA; note 1 220 mΩ
VBEon base-emitter turn-on voltage VCE = 2 V; IC = 100 mA 0.75 V
fTtransition frequency IC = 100 mA; VCE = 10 V;
f = 100 MHz 100 200 MHz
Cccollector ca pacitance VCB = 10 V; IE = Ie = 0; f = 1 MHz 28 pF
2003 Dec 12 5
NXP Semiconductors Pr oduct data shee t
30 V, 1 A
PNP low VCEsat (BISS) transistor PBSS5130T
PACKAGE OUTLINE
UNIT A
1
max. b
p
cDE e
1
H
E
L
p
Qwv
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
04-11-04
06-03-16
IEC JEDEC JEITA
mm 0.1 0.48
0.38 0.15
0.09 3.0
2.8 1.4
1.2 0.95
e
1.9 2.5
2.1 0.55
0.45 0.1
0.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
SOT23 TO-236AB
bp
D
e1
e
A
A1
Lp
Q
detail X
HE
E
w
M
v
M
A
B
AB
0 1 2 mm
scale
A
1.1
0.9
c
X
12
3
Plastic surface-mounted package; 3 leads SOT2
3
2003 Dec 12 6
NXP Semiconductors Pr oduct data shee t
30 V, 1 A
PNP low VCEsat (BISS) transistor PBSS5130T
DATA SHEET STATUS
Notes
1. Please consult the most recently issued document befor e initiating or co mpleting a design.
2. The product s ta tus of device(s) described in this do cument may have changed since this docu ment was published
and may differ in case of multiple devices. The latest product status information is available on th e Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the produc t s pecification.
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General Information in this document is believed to be
accurate and reliable . H ow ev er, NXP Semiconductors
does not give any representations or warranties,
expressed or implied, as to the accuracy or completeness
of such information and shall have no liability for the
consequenc es of use of such informa tio n.
Right to make changes NXP Semiconductors
reserves the right to make changes to informa tion
published in this doc ument, including without limitation
specifications and product descriptions, at any time and
without notice. This document supersedes and replaces all
information supplied prior to the publication hereo f.
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not designed, au thorized or warran ted to be suitable for
use in medical, military, aircraft, space or life support
equipment, nor in applications where failure or malfunction
of an NXP Semiconductors product can reasonably be
expected to result in pe rs onal injury, death or severe
property or environmental damage. NXP Semiconductors
accepts no liability for inclusion and/or use of NXP
Semiconductors products in such equipment or
applications and therefor e s uc h inclusion and/or use is at
the customer’s own risk .
Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modification .
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratin gs only and
operation of the device at these or any other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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products are sold subject to the general terms and
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infringement and limitation of liability, unless explicitly
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Export control This document as well as the item(s)
described herein may be subject to export control
regulations. Export might require a prior authorization from
national author ities.
Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values an d
Characteristics sections of this document, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal
definitions and disclaimer s. No changes were made to the tech nical content, except for package outline
drawings which were updated to the latest version.
Printed in The Netherlands R75/01/pp7 Date of release: 2003 Dec 12 Document orde r number: 9397 750 11901