XL/ML1225 SCR
UNISONIC TECHNOLOGIES CO., LTD 2
www.unisonic.com.tw QW-R301-003,D
ABSOLUATE MAXIUM RATINGS (Ta= 25℃, unless otherwise specified)
PARAMETER SYMBOL TEST CONDITION RATINGS UNIT
XL1225 400
Repetitive Peak
Off-State Voltage ML1225 VDRM TJ =40 ~ 125°C
RGK =1kΩ 300 V
On-State Current IT(RMS) Tc=40°C 0.8 A
Average On-State Current IT(AV) Half Cycle=180,Tc=40°C 0.5 A
Peak Reverse Gate Voltage VGRM IGR=10uA 1 V
Peak Gate Current IGM 10us Max. 0.1 A
Gate Dissipation PG(AV) 20ms Max. 150 mW
Operating Temperature TJ +125 °C
Storage Temperature TSTG -40 ~ +150 °C
Note 1. Absolute maximum ratings are those values beyond which the device could be permanently damaged.
Absolute maximum ratings are stress ratings only and functional device operation is not implied.
2. The device is guaranteed to meet performance specification within 0℃~70 ℃operating temperature range
and assured by design from –20℃~85℃.
ELECTRICAL CHARACTERISTICS (Ta= 25℃, unless otherwise specified.)
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT
Off State Leakage Current IDRM @VDRM(RGK=1KΩ), TJ =125°C 0.1 mA
Off State Leakage Current IDRM @VDRM(RGK=1KΩ), TJ =25°C 1.0 µA
On State Voltage VT
T IT=0.4A
T IT=0.8A
1. 4
2.2 V
On State Threshold Voltage VT(TO) T
J =125°C 0.95 V
On State Slops Resistance Rt TJ =125°C 600 m
Gate Trigger Current IGT V
D=7V 200 µA
Gate Trigger Voltage VGT V
D=7V 0.8 V
Holding Current IH R
GK=1KΩ 5 mA
Latching Current IL R
GK=1KΩ 6 mA
Critical Rate of Voltage Rise DV/DT VD=0.67*VDRM(RGK=1KΩ),TJ =125℃ V/µs
Critical Rate of Current Rise DV/DT IG=10mA, dIG/dt=0.1A/µs,TJ =125℃ A/µs
Gate Controlled Delay Time TGD I
G=10mA, dIG/dt=0.1A/µs 2.2 µs
Commutated Turn-off Time TG TJ =85°C, VD=0.67*VDRM
VR=35V, IT=IT(AV)
200 µs
CLASSIFICATION OF IGT
RANK B C AA AB AC AD
RANGE 50-100µA 100-200µA 8-15µA 15-20µA 20-25µA 25-50µA