SPICE D e vice Model Si9948AEY
Siliconix 2
4/18/01
Document: 70517
Model Evaluation
P-Channel Device (TJ=25°C Unless Otherwise Noted)
Parameter Symbol Test Conditions Typ Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID= -250µA2V
On-State Drain CurrentaID(on) VDS = -5V, VGS = -10 V 30 A
Drain-Source On-State ResistancearDS(on) VGS = -10V, ID = -2.6A0.15 Ω
VGS = -4.5V, ID = -2.1A0.20 Ω
Forward Transconductanceagfs VDS = -15V, ID = -2.6A5.3 S
Diode Forward VoltageaVSD IS = -2A, VGS=0V 0.81 V
Dynamic
Total Gate ChargebQg9.5
Gate-Source ChargebQgs VDS= -30V, VGS= -10V,
ID= -2.6A2.5 nC
Gate-Drain ChargebQgd 1.8
Turn-On Delay Timeb,c td(on) 1.1
Rise Ti meb,c trVDD= -30V, RL= 30Ω7.4
Turn-Off Delay Timeb,c td(off) ID≅ -1A, VGEN= -10V,
RG= 6Ω22 ns
Fall Timeb,c tf8
Reverse Recovery Time trr IS= -2A, di/dt=100A/µs50
Notes:
a) Pulse test: Pulse Width ≤ 300 µsec, Duty Cycle ≤ 2%.
b) Independent of operating temperature.
c) Include only parasitic components presented in the model circuit