©2000 Integrated Device Technology, Inc.
JUNE 2000
DSC 2746/11
1
HIGH SPEED
2K X 16 DUAL-PORT
SRAM
IDT7133SA/LA
IDT7143SA/LA
Features
High-speed access
Military: 25/35/45/55/70/90ns (max.)
Industrial: 25/35/55ns (max.)
Commercial: 20/25/35/45/55/70/90ns (max.)
Low-power operation
IDT7133/43SA
Active: 1150mW (typ.)
Standby: 5mW (typ.)
IDT7133/43LA
Active: 1050mW (typ.)
Standby: 1mW (typ.)
Versatile control for write: separate write control for lower
and upper byte of each port
MASTER IDT7133 easily expands data bus width to 32 bits
or more using SLAVE IDT7143
On-chip port arbitration logic (IDT7133 only)
Functional Block Diagram
NOTE:
1. IDT7133 (MASTER): BUSY is open drain output and requires pull-up resistor.
IDT7143 (SLAVE): BUSY is input.
BUSY output flag on IDT7133; BUSY input on IDT7143
Fully asynchronous operation from either port
Battery backup operation–2V data retention
TTL-compatible; single 5V (±10%) power supply
Available in 68-pin ceramic PGA, Flatpack, PLCC and 100-
pin TQFP
Military product compliant to MIL-PRF-38535 QML
Industrial temperature range (–40°C to +85°C) is available
for selected speeds
Description
The IDT7133/7143 are high-speed 2K x 16 Dual-Port Static RAMs.
The IDT7133 is designed to be used as a stand-alone 16-bit Dual-Port
RAM or as a “MASTER” Dual-Port RAM together with the IDT7143
“SLAVE” Dual-Port in 32-bit-or-more word width systems. Using the
IDT MASTER/SLAVE Dual-Port RAM approach in 32-bit-or-wider
I/O
CONTROL
MEMORY
ARRAY
ARBITRATION
LOGIC
(IDT7133 ONLY)
R/WLUB
CEL
R/WLLB
OEL
I/O0L - I/O7L
BUSYL
A0L
CEL
R/WRUB
CER
R/WRLB
OER
I/O8R -I/O
15R
I/O0R -I/O7R
BUSYR(1)
A0R
CER
2746 drw 01
A10L ADDRESS
DECODER
A10R
I/O
CONTROL
ADDRESS
DECODER
11 11
(1)
I/O8L -I/O
15L
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
2
2746 drw 02
10
11
12
13
14
15
16 IDT7133/43
J68-1 / F68-1(4)
68-Pin PLCC/Flatpack
Top View(5)
50
49
48
47
46
45
44
INDEX
17
18
19
20
21
22
23
24
25
26
51
52
53
54
55
56
57
58
59
60
98765432
1
68 67 66 65 64 63 62 61
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
A6L
A5L
A4L
A3L
A2L
A1L
A0L
A0R
A1R
A2R
A3R
A4R
A5R
BUSYL
BUSYR
CEL
CER
I/O
9L
I/O
10L
I/O
11L
I/O
13L
I/O
14L
I/O
15L
V
CC
(1)
I/O
0R
I/O
1R
I/O
2R
I/O
3R
I/O
4R
I/O
5R
I/O
6R
I/O
7R
I/O
1L
I/O
2L
I/O
3L
I/O
4L
I/O
5L
I/O
6L
I/O
7L
I/O
8L
V
CC
(1)
A
10L
A
9L
A
8L
A
7L
R/W
LLB
OE
L
I/O
9R
I/O
10R
I/O
12R
I/O
13R
I/O
14R
I/O
15R
A
6R
A
7R
A
8R
A
9R
I/O
8R
A
10R
GND
(2)
OE
R
R/W
RLB
R/W
RUB
I/O
11R
I/O
0L
I/O
12L
GND
(2)
R/W
LUB
Pin Configurations(1,2,3)
memory system applications results in full-speed, error-free operation
without the need for additional discrete logic.
Both devices provide two independent ports with separate control,
address, and I/O pins that permit independent, asynchronous access
for reads or writes to any location in memory. An automatic power
down feature, controlled by CE, permits the on-chip circuitry of each
port to enter a very low standby power mode.
Fabricated using IDTs CMOS high-performance technology, these
devices typically operate on only 1,150mW of power. Low-power (LA)
versions offer battery backup data retention capability, with each port
typically consuming 200µW for a 2V battery.
The IDT7133/7143 devices have identical pinouts. Each is packed
in a 68-pin ceramic PGA, 68-pin flatpack, 68-pin PLCC and 100-pin
TQFP. Military grade product is manufactured in compliance with the
latest revision of MIL-PRF-38535 QML, making it ideally suited to
military temperature applications demanding the highest level of
performance and reliability.
NOTES:
1. Both VCC pins must be connected to the power supply to ensure reliable
operation.
2. Both GND pins must be connected to the ground supply to ensure reliable
operation.
3. J68-Package body is approximately 0.95 in x 0.95 in x 0.17 in.
F68-Package body is approximately 1.18 in x 1.18 in x 0.16 in.
PN100-Package body is approximately 14mm x 14mm x 1.4mm.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
Index
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
100999897969594939291908988878685848382818079787776
IDT7133/43PF
PN100-1(4)
100-Pin TQFP
Top View(5)
N/C
N/C
N/C
N/C
I/O10L
I/O11L
I/O12L
I/O13L
GND
I/O14L
I/O15L
VCC
GND
I/O0R
I/O1R
I/O2R
I/O3R
VCC
I/O4R
I/O5R
I/O6R
N/C
N/C
N/C
N/C
2746 drw 03
N/C
N/C
N/C
N/C
A5L
A4L
A3L
A2L
A1L
A0L
N/C
GND
N/C
BUSYR
N/C
A0R
N/C
N/C
N/C
N/C
BUSYL
A1R
A2R
A3R
A4R
I/O9L
I/O8L
I/O7L
I/O6L
I/O5L
I/O4L
I/O3L
I/O2L
GND
I/O1L
I/O0L
OEL
VCC
R/W
LLB
CEL
R/W
LUB
N/C
N/C
N/C
A10L
A9L
A8L
A7L
A6L
I/O7R
I/O8R
I/O9R
I/O10R
I/O11R
I/O12R
I/O13R
I/O14R
GND
I/O15R
R/W
RLB
GND
N/C
N/C
A10R
A9R
A8R
A7R
A6R
A5R
N/C
N/CN/C
OE
R
CE
R
R/W
RUB
,
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
3
Pin Configurations(1,2,3) (con't.)
NOTES:
1. Both V CC pins must be connected to the power supply to ensure reliable operation.
2. Both GND pins must be connected to the ground supply to ensure reliable operation.
3. Package body is approximately 1.18 in x 1.18 in x 0.16 in.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
Pin Names
2746drw04
I/O0L
VCC(1)
A10L A9L
A8L A7L
A6L A5L
A4L
A3L
51
I/O1L
I/O2L
I/O3L
I/O4L
I/O5L
I/O6L
I/O7L
I/O8L I/O9L
I/O10L
I/O11L
I/O12L
I/O13L
I/O14L
I/O15L
VCC(1)
GND(2)
I/O0R
I/O1R
I/O2R
I/O3R
I/O4R
I/O5R
I/O6R I/O7R
I/O8R I/O9R
I/O10R I/O11R
I/O12R I/O13R
I/O14R I/O15R
A2L
A1L
A0L
R/WLUB
R/WLLB OEL
A2R
A3R
A4R
A5R A6R
A7R
A8R
A9R
A10R
R/WRLB
R/WRUB
OER
GND(2)
BUSYL
BUSYR
CEL
CER
50 48 46 44 42 40 38 36
A0R
A1R
52 49 47 45 43 41 39 37 3553 34
5455
5657
5859
6061
6263
6465
6667
168
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
18
17
19
20 21
22 23
24 25
26 27
28 29
30 31
32 33
IDT7133/43G
GU68-1(4)
68-Pin PGA
Top View(5)
Pin 1
Designator ABCDEFGHJKL
01
02
03
04
05
06
07
08
09
10
11
Left Port Right Port Names
CE
LCE
RChip Enab le
R/WLUB R/WRUB Up p er B y te Re ad / Wri te E nabl e
R/WLLB R/WRLB Lo we r B yte Re ad /Write Enab le
OELOEROutput Enable
A0L - A10L A0R - A10R Address
I/O0L - I/ O15L I/O0R - I/O15R Data Input/ Outp ut
BUSYLBUSYRBusy Flag
VCC Power
GND Ground
2746 tbl 01
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
4
Capacitance (TA = +25°C, f = 1.0mhz)
Recommended DC Operating
Conditions
Maximum Operating
Temperature and Supply Voltage(1,2)
Absolute Maximum Ratings(1)
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (Either port, VCC = 5.0V ± 10%)
NOTE:
1. At Vcc < 2.0V, input leakages are undefined.
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. VTERM must not exceed Vcc + 10% for more than 25% of the cycle time or 10ns
maximum, and is limited to < 20mA for the period of VTERM > Vcc + 10%.
NOTES:
1. This parameter is determined by device characterization but is not production
tested.
2. 3dV references the interpolated capacitance when the input and output switch from
0V to 3V or from 3V to 0V.
NOTES:
1. This is the parameter TA. This is the "instant on" case temperature.
NOTES:
1. VIL (min.) = -1.5V for pulse width less than 10ns.
2. VTERM must not exceed Vcc + 10%.
Symbol Rating Commercial
& I ndustrial Military Unit
VTERM(2) Terminal Voltage
with Res pe c t
to GND
-0.5 to +7.0 -0.5 to +7.0 V
TBIAS Temperature
Under Bias -55 to +125 -65 to +135 oC
TSTG Storage
Temperature -65 to +150 -65 to +150 oC
PT(3) Power
Dissipation 2.0 2.0 W
IOUT DC O ut p ut
Current 50 50 mA
2746 tbl 02
Grade Ambient
Temperature GND Vcc
Military -55OC to +125OC0V 5.0V
+ 10%
Commercial 0OC to +70OC0V5.0V
+ 10%
Industrial -40OC to +85OC0V 5.0V
+ 10%
2746 tbl 04
Symbol Parameter(1) Conditions(2) Max. Unit
CIN Input Capac itance VIN = 3dV 11 pF
COUT Outp ut Cap aci tance VOUT = 3dV 11 pF
2746 tbl 03
Symbol Parameter Min. Typ. Max. Unit
VCC Sup ply Voltage 4.5 5.0 5.5 V
GND Ground 0 0 0 V
VIH Input High Voltage 2.2 ____ 6.0(2) V
VIL Inp ut Lo w Vo ltag e -0.5(1) ____ 0.8 V
2 7 46 tb l 05
Symbol Parameter Test Conditions
7133SA
7143SA 7133LA
7143LA
UnitMin. Max. Min. Max.
|ILI| Inp ut Leak ag e Curre nt(1) VCC = 5. 5V, VIN = 0V to VCC ___ 10 ___ A
|ILO| Outp ut Le akag e Current CE = VIH, VOUT = 0V to VCC ___ 10 ___ A
VOL Outp ut Lo w Vo ltag e (I/ O0-I/O15)I
OL = 4mA ___ 0.4 ___ 0.4 V
VOL Op en Drain Outp ut Low Vo ltage
(BUSY
)IOL = 16mA ___ 0.5 ___ 0.5 V
VOH Outp ut Hig h Vo ltag e IOH = -4mA 2.4 ___ 2.4 ___ V
2746 tbl 06
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
5
NOTES:
1. VCC = 5V, TA = +25°C for Typ., and are not production tested. ICCDC = 180mA (typ.)
2. 'X' in part number indicates power rating (SA or LA)
3. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/ tRC, and using AC Test Conditions" of input levels of
GND to 3V.
4. f = 0 means no address or control lines change. Applies only to inputs at CMOS level standby.
5. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
DC Electrical Characteristics Operating
Temperature and Supply Voltage Range(2) (VCC = 5.0V ± 10%)
7133X20
7143X20
Com'l Only
7133X25
7143X25
Com'l, Ind
& Mili tary
7133X35
7143X35
Com'l, Ind
& Mili tary
Sym bol Parameter Test Condi tion Versi on Typ. (1) Max. Typ.(1) Max. Typ.(1) Max. Unit
ICC Dy na mi c Op e rating
Current
(Both Ports Active )
CE = VIL, Outp uts Disab led
f = fMAX(3)
COM'L S
L250
230 310
280 250
230 300
270 240
210 295
250 mA
MIL &
IND S
L____
____
____
____ 250
230 330
300 240
220 325
295
ISB1 Standby Current
(Bo th Po rts - TTL
Le vel Inputs)
CE
L and CER = VIH
f = fMAX(3)
COM'L S
L25
25 80
70 25
25 80
70 25
25 70
60 mA
MIL &
IND S
L____
____
____
____ 25
25 90
80 25
25 75
65
ISB2 Standby Current
(One Po rt - TTL
Le vel Inputs)
CE
"A" = VIL and CE"B" = VIH(4)
f=fMAX(3)
Active Port Outputs Disabled
COM'L S
L140
120 200
180 140
100 200
170 120
100 180
160 mA
MIL &
IND S
L____
____
____
____ 140
100 230
190 120
100 200
180
ISB3 Full Stand by Curre nt
(Bo th Po rts -
CM OS L e v e l Inp u ts )
Bo th Ports CEL and
CE
R > VCC - 0.2V
VIN > VCC - 0.2V o r
VIN < 0.2 V, f = 0 (4)
COM'L S
L1.0
0.2 15
51.0
0.2 15
41.0
0.2 15
4mA
MIL &
IND S
L____
____
____
____ 1.0
0.2 30
10 1.0
0.2 30
10
ISB4 Full Stand by Curre nt
(One Po rt -
CM OS L e v e l Inp u ts )
CE
"A" < 0.2V and
CE
"B" > VCC - 0.2V(5)
VIN > VCC - 0.2V o r V IN < 0.2V
Active Port Outputs Disabled
f = fMAX(3)
COM'L S
L140
120 190
170 140
120 190
170 120
100 170
150 mA
MIL &
IND S
L____
____
____
____ 140
120 220
200 120
100 190
170
2 746 tbl 07 a
7133X45
7143X45
Co m' l &
Military
7133X55
7143X55
Com'l, Ind
& Mili tary
7133X70/90
7143X70/90
Co m' l &
Military
Sym bol Parameter Test Condi ti on Versi on Typ. (1) Max. Typ.(1) Max. Typ.(1) Max. Unit
ICC Dy nam ic Op e r atin g
Current
(Bo th Po rts Ac tiv e )
CE = VIL, Outputs Disabled
f = fMAX(3)
COM'L S
L230
210 290
250 230
210 285
250 230
210 280
250 mA
MIL &
IND S
L230
210 320
290 230
210 315
285 230
210 310
280
ISB1 Stand by Curre nt
(Bo th Po rts - TTL
Le vel Inp uts)
CEL and CER = VIH
f = fMAX(3)
COM'L S
L25
25 75
65 25
25 70
60 25
25 70
60 mA
MIL &
IND S
L25
25 80
70 25
25 80
70 25
25 75
65
ISB2 S tand b y Current
(One Po rt - TTL
Le vel Inp uts)
CE"A" = VIL and CE"B" = VIH(4)
f=fMAX(3)
Active Port Outputs Disabled
COM'L S
L120
100 190
170 120
100 180
160 120
100 180
160 mA
MIL &
IND S
L120
100 210
190 120
100 210
190 120
100 200
180
ISB3 Full Stand by Current
(Bo th Po rts -
CMOS Lev e l Inp uts)
Bo th Ports CEL and
CER > VCC - 0.2V
VIN > VCC - 0.2V o r
VIN < 0.2 V, f = 0(4)
COM'L S
L1.0
0.2 15
41.0
0.2 15
41.0
0.2 15
4mA
MIL &
IND S
L1.0
0.2 30
10 1.0
0.2 30
10 1.0
0.2 30
10
ISB4 Full Stand by Current
(One Po rt -
CMOS Lev e l Inp uts)
CE"A" < 0.2V and
CE"B" > VCC - 0.2V(5)
VIN > VCC - 0.2V or V IN < 0.2V
Active Port Outputs Disabled
f = fMAX(3)
COM'L S
L120
100 180
160 120
100 170
150 120
100 170
150 mA
MIL &
IND S
L120
100 200
180 120
100 200
180 120
100 190
170
2746 tbl 07b
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
6
2746 drw 06
DATAOUT
775
1250
30pF
5V
DATAOUT
775
1250
5pF*
5V
BUSY
270
30pF
5V
Data Retention Waveform
AC Test Conditions
Data Retention Characteristics
(LA Version Only) VLC = 0.2V, VHC = VCC - 0.2V
NOTES:
1. Vcc = 2V, TA = +25°C, and are not production tested.
2. tRC = Read Cycle Time
3. This parameter is guaranteed by device characterization but is not production tested.
Figure 2. Output Load
(for tLZ, tHZ, tWZ, tOW)
*Including scope and jig
Figure 1. AC Output Test Load
Figure 3. BUSY Output Load
(IDT7133 only)
7133LA/7143LA
Symbol Parameter Test Condition Min. Typ. (1) Max. Unit
VDR VCC fo r Data Re te nti o n V CC = 2V 2.0 ___ ___ V
ICCDR Data Rete ntio n Curre nt CE
> VHC
VIN > VHC or < VLC
MIL. & IND. ___ 100 4000 µA
COM'L. ___ 100 1500
tCDR(3) Chip Dese lect to Data Re tention Time 0 ___ ___ V
tR(3) Operation Recovery Time tRC(2) ___ ___ V
2746 tbl 08
Inp ut P ul se Le v e l s
Inp ut Ris e/Fall Time s
Inp ut Timing Re fe rence Lev els
Outp ut Refe re nce Le vels
Outp ut Lo ad
GND to 3.0V
5ns M ax .
1.5V
1.5V
Fi gures 1, 2 and 3
2746 tbl 09
2746 drw 05
tCDR tR
CE
VCC
DATA RETENTION MODE
VDR
VDR >2V4.5V 4.5V
VIH
VIH
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
7
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage(3)
NOTES:
1. Transition is measured 0mV fromLow or High-impedance voltage with load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. 'X' in part number indicates power rating (SA or LA).
7133X20
7143X20
Com'l Only
7133X25
7143X25
Com'l, I nd
& Mi litary
7133X35
7143X35
Com'l, I nd
& Mi litary
UnitSymbol Parameter Min.Max.Min.Max.Min.Max.
READ CYCLE
tRC Read Cycle Time 20 ____ 25 ____ 35 ____ ns
tAA Address Access Time ____ 20 ____ 25 ____ 35 ns
tACE Chip Enable Acce ss Time ____ 20 ____ 25 ____ 35 ns
tAOE Outp ut Enab le Acc es s Time ____ 12 ____ 15 ____ 20 ns
tOH Output Ho ld fro m Address Change 0 ____ 0____ 0____ ns
tLZ Outp ut Lo w-Z Tim e(1,2) 0____ 0____ 0____ ns
tHZ Outp ut Hig h-Z Tim e (1,2) ____ 12 ____ 15 ____ 20 ns
tPU Chip En able to Power Up Time(2) 0____ 0____ 0____ ns
tPD Chi p Di s ab le to P o we r Do wn Ti me(2) ____ 20 ____ 50 ____ 50 ns
2 746 tb l 10 a
7133X45
7143X45
Com'l &
Military
7133X55
7143X55
Com'l, Ind
& Mi litary
7133X70/90
7143X70/90
Com'l &
Military
UnitSymbol Parameter Min.Max.Min.Max.Min.Max.
READ CYCLE
tRC Read Cycle Time 45 ____ 55 ____ 70/90 ____ ns
tAA Address Access Time ____ 45 ____ 55 ____ 70/90 ns
tACE Chip Enable Acce ss Time ____ 45 ____ 55 ____ 70/90 ns
tAOE Outp ut Enab le Acc es s Time ____ 25 ____ 30 ____ 40/40 ns
tOH Output Ho ld fro m Address Change 0 ____ 0____ 0/0 ____ ns
tLZ Outp ut Lo w-Z Tim e(1,2) 0____ 5____ 5/5 ____ ns
tHZ Outp ut Hig h-Z Tim e (1,2) ____ 20 ____ 20 ____ 25/25 ns
tPU Chip En able to Power Up Time(2) 0____ 0____ 0/0 ____ ns
tPD Chi p Di s ab le to P o we r Do wn Ti me(2) ____ 50 ____ 50 ____ 50/50 ns
2746 tbl 10b
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
8
TIMING WAVEFORM OF READ CYCLE NO. 1, EITHER SIDE(5)
TIMING WAVEFORM OF READ CYCLE NO. 2, EITHER SIDE(5)
NOTES:
1. Timing depends on which signal is asserted last, OE or CE.
2. Timing depends on which signal is deasserted first, OE or CE.
3. tBDD delay is required only in a case where the opposite port is completing a write operation to the same address location. For simultaneous read operations, BUSY has no
relationship to valid output data.
4. Start of valid data depends on which timing becomes effective last, t AOE, tACE, tAA, or tBDD.
5. R/W = VIH, and the address is valid prior to or coincidental with CE transition LOW.
2746 drw 07
tAA
tOH tOH
DATAOUT
ADDRESS
tRC
DATA VALIDPREVIOUS DATA VALID
BUSYOUT
tBDD(3,4)
2746 drw 08
tAOE
tLZ tHZ
DATAOUT
CE
tACE
VALID DATA
OE
CURRENT ICC
ISB
tPU
50%
tLZ tPD
50%
tHZ
(1)
(4)
(1)
(4)
(2)
(2)
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
9
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage(5)
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage from the Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization but not production tested.
3. For MASTER/SLAVE combination, t WC = tBAA + tWR + tWP, since R/W = VIL must occur after tBAA.
4. The specification for tDH must be met by the device supplying write data to the RAM under all operation conditions. Although tDH and tOW values will very over voltage and
temperature, the actual tDH will always be smaller than the actual tOW.
5. 'X' in part number indicates power rating (SA or LA).
Symbol Parameter
7133X20
7143X20
Co m'l On ly
7133X25
7143X25
Com'l, Ind
& Military
7133X35
7143X35
Com'l, Ind
& Military
UnitMin. Max. Min. Max. Min. Max.
WRI T E CYC L E
tWC Write Cycle Time(3) 20 ____ 25 ____ 35 ____ ns
tEW Chip Enable to End -o f-Write 15 ____ 20 ____ 25 ____ ns
tAW Address Valid to End-of-Write 15 ____ 20 ____ 25 ____ ns
tAS Address Set-up Time 0 ____ 0____ 0____ ns
tWP Write Pulse Width 15 ____ 20 ____ 25 ____ ns
tWR Write Re covery Time 0 ____ 0____ 0____ ns
tDW Data Valid to End-of-Write 15 ____ 15 ____ 20 ____ ns
tHZ Output High-Z Time (1,2) ____ 12 ____ 15 ____ 20 ns
tDH Data Ho ld Time (4) 0____ 0____ 0____ ns
tWZ Write Enable to Outp ut in High-Z(1,2) ____ 12 ____ 15 ____ 20 ns
tOW Outp u t Ac ti v e from E nd - o f-Wri te (1,2,4) 0____ 0____ 0____ ns
2746 tb l 11 a
Symbol Parameter
7133X45
7143X45
Com'l &
Military
7133X55
7143X55
Com'l, Ind
& Military
7133X70/90
7143X70/90
Com'l &
Military
UnitMin. Max. Min. Max. Min. Max.
WRI T E CYC L E
tWC Write Cycle Time(3) 45 ____ 55 ____ 70/90 ____ ns
tEW Chip Enable to End -o f-Write 30 ____ 40 ____ 50/50 ____ ns
tAW Address Valid to End-of-Write 30 ____ 40 ____ 50/50 ____ ns
tAS Address Set-up Time 0 ____ 0____ 0/0 ____ ns
tWP Write Pulse Width 30 ____ 40 ____ 50/50 ____ ns
tWR Write Re covery Time 0 ____ 0____ 0/0 ____ ns
tDW Data Valid to End-of-Write 20 ____ 25 ____ 30/30 ____ ns
tHZ Output High-Z Time (1,2) ____ 20 ____ 20 ____ 25/25 ns
tDH Data Ho ld Time (4) 5____ 5____ 5/5 ____ ns
tWZ Write Enable to Outp ut in High-Z(1,2) ____ 20 ____ 20 ____ 25/25 ns
tOW Outp u t Ac ti v e from E nd - o f-Wri te (1,2,4) 5____ 5____ 5/5 ____ ns
2746 tb l 11b
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
10
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage(6)
NOTES:
1. Port-to-port delay through RAM cells from writing port to reading port, refer to Timing Waveform of Write with Port-to-Port Read and Busy".
2. tBDD is calculated parameter and is greater of 0, tWDD - tWP (actual) or tDDD - tDW (actual).
3. To ensure that the earlier of the two ports wins.
4. To ensure that the write cycle is inhibited on port "B" during contention on port "A".
5. To ensure that a write cycle is completed on port "B" after contention on port "A".
6. 'X' in part number indicates power rating (SA or LA).
7133X20
7143X20
Com ' l On ly
7133X25
7143X25
Com'l, Ind
& Military
7133X35
7143X35
Com'l, Ind
& Military
Symbol Parameter Min.Max.Min.Max.Min.Max.Unit
BUSY TIMING (For MASTER 71V33)
tBAA BUSY Access Time from Addre ss ____ 20 ____ 20 ____ 30 ns
tBDA BUSY Disable Time from Address ____ 20 ____ 20 ____ 30 ns
tBAC BUSY Access Time from Chip Enable ____ 20 ____ 20 ____ 25 ns
tBDC BUSY Disable Time from Chip Enable ____ 17 ____ 20 ____ 25 ns
tWDD Write Pulse to Data Delay(1) ____ 40 ____ 50 ____ 60 ns
tDDD Write Data Valid to Re ad Data Delay (1) ____ 30 ____ 35 ____ 45 ns
tBDD BUSY Disable to Valid Data(2) ____ 25 ____ 30 ____ 35 ns
tAPS Arb itratio n Priority Se t-up Time (3) 5____ 5____ 5____ ns
tWH Write Hold After BUSY(5) 20 ____ 20 ____ 25 ____ ns
BUSY INPUT TIM ING (For SLAVE 71V43)
tWB BUSY In p ut to Write (4) 0____ 0____ 0____ ns
tWH Write Hold After BUSY(5) 20 ____ 20 ____ 25 ____ ns
tWDD Write Pulse to Data Delay(1) ____ 40 ____ 50 ____ 60 ns
tDDD Write Data Valid to Re ad Data Delay (1) ____ 30 ____ 35 ____ 45 ns
2746 tbl 12a
7133X45
7143X45
Com ' l &
Military
7133X55
7143X55
Com'l, Ind
& Military
7133X70/90
7143X70/90
Com ' l &
Military
Symbol Parameter Min.Max.Min.Max.Min.Max.Unit
BUSY TIMING (For MASTER 71V33)
tBAA BUSY Access Time from Addre ss ____ 40 ____ 40 ____ 45/45 ns
tBDA BUSY Disable Time from Address ____ 40 ____ 40 ____ 45/45 ns
tBAC BUSY Access Time from Chip Enable ____ 30 ____ 35 ____ 35/35 ns
tBDC BUSY Disable Time from Chip Enable ____ 25 ____ 30 ____ 30/30 ns
tWDD Write Pulse to Data Delay(1) ____ 80 ____ 80 ____ 90/90 ns
tDDD Write Data Valid to Re ad Data Delay (1) ____ 55 ____ 55 ____ 70/70 ns
tBDD BUSY Disable to Valid Data(2) ____ 40 ____ 40 ____ 40/40 ns
tAPS Arb itratio n Priority Se t-up Time (3) 5____ 5____ 5/5 ____ ns
tWH Write Hold After BUSY(5) 30 ____ 30 ____ 30/30 ____ ns
BUSY INP UT TI MING (For S LAVE 71V43)
tWB BUSY In p ut to Write (4) 0____ 0____ 0/0 ____ ns
tWH Write Hold After BUSY(5) 30 ____ 30 ____ 30/30 ____ ns
tWDD Write Pulse to Data Delay(1) ____ 80 ____ 80 ____ 90/90 ns
tDDD Write Data Valid to Re ad Data Delay (1) ____ 55 ____ 55 ____ 70/70 ns
2746 t b l 12b
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
11
NOTES:
1. R/W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (tEW or tWP) of a CE = VIL and a R/W = VIL.
3. tWR is measured from the earlier of CE or R/W going HIGH to the end of the write cycle.
4. During this period, the I/O pins are in the output state, and input signals must not be applied.
5. If the CE LOW transition occurs simultaneously with or after the R/W LOW transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal ( CE or R/W) is asserted last.
7. Timing depends on which enable signal is de-asserted first, CE or OE.
8. If OE is LOW during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off and data to be placed
on the bus for the required tDW. If OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the
specified tWP.
9. R/W for either upper or lower byte.
Write Cycle No. 2 (CE Controlled Timing)(1,5)
Timing Waveform of Write Cycle No. 1 (R/W Controlled Timing)(1,5,8)
CE
2746 drw 09
tAW
tAS
tWR
tDW
DATAIN
ADDRESS
tWC
R/W
tWP
tDH
DATAOUT
tWZ(7)
(4)
(2)
tOW
OE
(9)
tLZ
(7)
tHZ
(6)
(3)
(4)
(7)
tHZ
CE
2746 drw 10
tAW
tAS tWR
tDW
DATAIN
ADDRESS
tWC
R/W
tEW
tDH
(9)
(6) (2)
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
12
2746 drw 11
tDW
tAPS
ADDR"A"
tWC
MATCH
tWP
R/W"A"
DATAIN"A"
ADDR"B"
tDH
VALID
(1)
MATCH
BUSY"B"
tBDA
VALID
tBDD
tDDD(4)
tWDD
DATAOUT "B"
Timing Waveform of Write with Port-to-Port Read and BUSY(1,2,3)
Timing Waveform of Write with BUSY(3)
NOTES:
1. tWH must be met for both BUSY input (IDT7143, slave) and output (IDT7133, master).
2. BUSY is asserted on port "B" blocking R/W"B", until BUSY"B" goes HIGH.
3. All timing is the same for left and right ports. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
NOTES:
1. To ensure that the earlier of the two ports wins, tAPS is ignored for Slave (IDT7143).
2. CEL = CER = VIL
3. OE = VIL for the reading port.
4. All timing is the same for left and right ports. Port "A" may be either the left or right port. Port "B" is the port opposite from port "A".
2746 drw 12
R/W"A"
BUSY"B"
tWP
tWB
R/W"B"
tWH(1)
(2)
,
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
13
Timing Waveform of BUSY Arbitration Controlled by CE Timing(1)
Timing Waveform of BUSY Arbitration Controlled by Addresses(1)
NOTES:
1. All timing is the same for left and right ports. Port "A" may be either the left or right port. Port "B" is the port opposite from port " A".
2. If tAPS is not satisfied, the BUSY will be asserted on one side or the other, but there is no guarantee on which side BUSY will be asserted
(IDT7133 only).
tAPS(2)
2746 drw 13
ADDR"A" AND "B" ADDRESSES MATCH
CE"B"
BUSY"B"
tBAC tBDC
CE"A"
tRC
2746 drw 14
ADDR"A" ADDRESSES MATCH
ADDR"B"
BUSY "B"
ADDRESSES DO NOT MATCH
tWC
OR
tAPS
tBAA tBDA
(2)
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
14
Functional Description
The IDT7133/43 provides two ports with separate control, address
and I/O pins that permit independent access for reads or writes to any
location in memory. The IDT7133/43 has an automatic power down
feature controlled by CE. The CE controls on-chip power down circuitry
that permits the respective port to go into a standby mode when not
selected (CE HIGH). When a port is enabled, access to the entire
memory array is permitted. Non-contention READ/WRITE conditions
are illustrated in Truth Table 1.
Busy Logic
Busy Logic provides a hardware indication that both ports of the
RAM have accessed the same location at the same time. It also allows
one of the two accesses to proceed and signals the other side that the
RAM is busy. The BUSY pin can then be used to stall the access until
the operation on the other side is completed. If a write operation has
been attempted from the side that receives a BUSY indication, the
write signal is gated internally to prevent the write from proceeding.
The use of BUSY logic is not required or desirable for all applica-
tions. In some cases it may be useful to logically OR the BUSY outputs
together and use any BUSY indication as an interrupt source to flag the
event of an illegal or illogical operation. If the write inhibit function of
BUSY logic is not desirable, the BUSY logic can be disabled by using
the IDT7143 (SLAVE). In the IDT7143, the BUSY pin operates solely
as a write inhibit input pin. Normal operation can be programmed by
tying the BUSY pins HIGH. If desired, unintended write operations can
be prevented to a port by tying the BUSY pin for that port LOW. The
BUSY outputs on the IDT 7133 RAM are open drain and require pull-
up resistors.
Width Expansion with Busy Logic
Master/Slave Arrays
When expanding an IDT7133/43 RAM array in width while using
BUSY logic, one master part is used to decide which side of the RAM
array will receive a BUSY indication, and to output that indication. Any
number of slaves to be addressed in the same address range as the
master, use the BUSY signal as a write inhibit signal. Thus on the
IDT7133 RAM the BUSY pin is an output and on the IDT7143 RAM, the
BUSY pin is an input (see Figure 3).
Expanding the data bus width to 32 bits or more in a Dual-Port RAM
system implies that several chips will be active at the same time. If each
chip includes a hardware arbitrator, and the addresses for each chip
arrive at the same time, it is possible that one will activate its BUSYL
while another activates its BUSYR signal. Both sides are now BUSY
and the CPUs will await indefinitely for their port to become free.
To avoid the Busy Lock-Out problem, IDT has developed a
MASTER/SLAVE approach where only one hardware arbitrator, in the
MASTER, is used. The SLAVE has BUSY inputs which allow an
interface to the MASTER with no external components and with a
speed advantage over other systems.
When expanding Dual-Port RAMs in width, the writing of the SLAVE
RAMs must be delayed until after the BUSY input has settled.
Otherwise, the SLAVE chip may begin a write cycle during a contention
situation. Conversely, the write pulse must extend a hold time past
BUSY to ensure that a write cycle takes place after the contention is
resolved. This timing is inherent in all Dual-Port memory systems where
more than one chip is active at the same time.
The write pulse to the SLAVE should be delayed by the maximum
arbitration time of the MASTER. If, then, a contention occurs, the write
to the SLAVE will be inhibited due to BUSY from the MASTER.
Figure 4. Busy and chip enable routing for both width and depth expansion
with the IDT7133 (MASTER) and the IDT7143 (SLAVE).
VCC
R/W
BUSY
R/W
BUSY
IDT7133
MASTER
VCC
R/W
BUSY
R/W
BUSY
R/W
BUSY
R/W
BUSY
LEFT RIGHT
2746drw 15
IDT7143
SLAVE
270270
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
15
Truth Table I  Non-Contention Read/Write Control(4)
Truth Table II  Address BUSY
Arbitration
NOTES:
1. Pins BUSYL and BUSYR are both outputs on the IDT7133 (MASTER). Both are
inputs on the IDT7143 (SLAVE). On Slaves the BUSY input internally inhibits
writes.
2. "L" if the inputs to the opposite port were stable prior to the address and enable
inputs of this port. H if the inputs to the opposite port became stable after the
address and enable inputs of this port. If tAPS is not met, either BUSYL or BUSYR
= VIL will result BUSYL and BUSYR outputs can not be LOW simultaneously.
3. Writes to the left port are internally ignored when BUSYL outputs are driving LOW
regardless of actual logic level on the pin. Writes to the right port are internally
ignored when BUSYR outputs are driving LOW regardless of actual logic level on
the pin.
NOTES:
1. A0L - A10LA0R - A10R
2. If BUSY = LOW, data is not written.
3. If BUSY = LOW, data may not be valid, see tWDD and tDDD timing.
4. "H" = HIGH, "L" = LOW, "X" = Don t Care, "Z" = High-Impedance, "LB" = Lower Byte, "UB" = Upper Byte
LEFT OR RIGHT PORT(1)
FunctionR/WLB R/WUB CE OE I/O0-7 I/O8-15
X X H X Z Z Port Disable d and in Power Down Mo de, ISB2, ISB4
XXHX Z ZCE
R = CEL = VIH, Po we r Do wn Mo d e , ISB1 or ISB3
LLLXDATA
IN DATAIN Data on Lower Byte and Upper Byte Written into Memory(2)
LHLL
DATAIN DATAOUT Da ta o n Lowe r B yte Wri tte n into M e mo ry(2), Data in Memory Output on
Upper Byte(3)
HLLL
DATAOUT DATAIN Data i n Me mo ry Output o n Lower Byte (3), Data o n Up pe r By te Written into
Memory(2)
LHLHDATA
IN Z Data o n Lo we r Byte Written into Memory (2)
HLLH Z DATA
IN Da ta o n Up p e r B y te Wri tte n i nto M e mory(2)
HHLLDATA
OUT DATAOUT Data i n Me mo ry Output on Lo wer By te and Upp er Byte
H H L H Z Z High Impedance Outputs
2746 tbl 13
Inputs Outputs
Function
CELCERA0L-A10L
A0R-A10R BUSYL(1) BUSYR(1)
XXNO MATCHHHNormal
HXMATCHHHNormal
XHMATCHHHNormal
L L MATCH (2) (2) Write Inhib it(3)
2 7 46 tb l 14
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM Military, Industrial and Commercial Temperature Ranges
16
Ordering Information
XX
Power
XX
Speed
X
Package
X
Process/
Temperature
Range
Blank
I
B
Commercial (0°Cto+70
°C)
Industrial (-40°Cto+85
°C)
Military (-55°Cto+125
°C)
Compliant to MIL-PRF-38535 QML
J
G
F
PF
68-pin PLCC (J68-1)
68-pin PGA (GU68-1)
68-pin Flatplack (F68-1)
100-pin TQFP (PN100-1)
20
25
35
45
55
70
90
XXXX
Device
Type
IDT
Speed in nanoseconds
2746 drw 16
LA
SA Low Power
Standard Power
7133
7143 32K (2K x 16-Bit) MASTER Dual-Port RAM
32K (2K x 16-Bit) SLAVE Dual-Port RAM
Commercial Only
Commercial, Industrial & Military
Commercial, Industrial & Military
Commercial & Military
Commercial, Industrial & Military
Commercial & Military
Commercial & Military
CORPORATE HEADQUARTERS for SALES: for Tech Support:
2975 Stender Way 800-345-7015 or 408-727-6116 831-754-4613
Santa Clara, CA 95054 fax: 408-492-8674 DualPortHelp@idt.com
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
Datasheet Document History
12/18/98: Initiated datasheet document history
Converted to new format
Cosmetic and typographical corrections
Added additional notes to pin configurations
Page 2 corrected PN100 pinout
2/17/99: Corrected PF ordering code
3/9/99: Cosmetic and typographical corrections
6/9/99: Changed drawing format
10/1/99: Added Industrial Temperature Ranges and removed corresponding notes
11/10/99: Replaced IDT logo
4/1/00: Changed ±500mV to 0mV in notes
Page 2 Fixed overbar in pinout
6/26/00: Page 4 Increased storage temperature parameters
Clarified TA parameter
Page 5 DC Electrical parameterschanged wording from "open" to "disabled"