©2009 Integrated Device Technology, Inc.
JANUARY 2009
DSC 5626/6
1
Functional Block Diagram
Features:
128K x 36 Synchronous Bank-Switchable Dual-ported
SRAM Architecture
64 independent 2K x 36 banks
4 megabits of memory on chip
Bank access controlled via bank address pins
High-speed data access
Commercial: 3.4ns (200MHz)/3.6ns (166MHz)/
4.2ns (133MHz) (max.)
Industrial: 3.6ns (166MHz)/4.2ns (133MHz) (max.)
Selectable Pipelined or Flow-Through output mode
Counter enable and repeat features
Dual chip enables allow for depth expansion without
additional logic
Full synchronous operation on both ports
5ns cycle time, 200MHz operation (14Gbps bandwidth)
Fast 3.4ns clock to data out
1.5ns setup to clock and 0.5ns hold on all control, data, and
address inputs @ 200MHz
Data input, address, byte enable and control registers
Self-timed write allows fast cycle time
Separate byte controls for multiplexed bus and bus
matching compatibility
LVTTL- compatible, 3.3V (±150mV) power supply
for core
LVTTL compatible, selectable 3.3V (±150mV) or 2.5V
(±100mV) power supply for I/Os and control signals on
each port
Industrial temperature range (-40°C to +85°C) is
available at 166MHz and 133MHz
Available in a 208-pin Plastic Quad Flatpack (PQFP),
208-pin fine pitch Ball Grid Array (fpBGA), and 256-pin Ball
Grid Array (BGA)
Supports JTAG features compliant with IEEE 1149.1
HIGH-SPEED 3.3V 128K x 36
SYNCHRONOUS
BANK-SWITCHABLE
DUAL-PORT STATIC RAM
WITH 3.3V OR 2.5V INTERFACE
IDT70V7599S
2Kx36
MEMORY
ARRAY
(BANK 63)
MUX
MUX
PL/FT
L
OPT
L
CLK
L
ADS
L
CNTEN
L
REPEAT
L
R/W
L
CE
0L
CE
1L
BE
3L
BE
2L
BE
1L
BE
0L
OE
L
I/O
0L-35L
A
10L
A
0L
JTAG
2Kx36
MEMORY
ARRAY
(BANK 1)
MUX
MUX
2Kx36
MEMORY
ARRAY
(BANK 0)
MUX
MUX
CONTROL
LOGIC
I/O
CONTROL
BANK
DECODE
ADDRESS
DECODE
I/O
0R-35R
A
10R
A
0R
CONTROL
LOGIC
I/O
CONTROL
BANK
DECODE
ADDRESS
DECODE
5626 drw 01
BA
5R
BA
4R
BA
3R
BA
2R
BA
1R
BA
0R
BA
5L
BA
4L
BA
3L
BA
2L
BA
1L
BA
0L
,
PL/FT
R
OPT
R
CLK
R
ADS
R
CNTEN
R
REPEAT
R
R/W
R
CE
0R
CE
1R
BE
3R
BE
2R
BE
1R
BE
0R
OE
R
TMS
TCK
TRST
TDI
TDO
NOTE:
1. The Bank-Switchable dual-port uses a true SRAM
core instead of the traditional dual-port SRAM core.
As a result, it has unique operating characteristics.
Please refer to the functional description on page 19
for details.
6.42
2
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Description:
The IDT70V7599 is a high-speed 128Kx36 (4Mbit) synchronous
Bank-Switchable Dual-Ported SRAM organized into 64 independent
2Kx36 banks. The device has two independent ports with separate
control, address, and I/O pins for each port, allowing each port to access
any 2Kx36 memory block not already accessed by the other port.
Accesses by the ports into specific banks are controlled via the bank
address pins under the user's direct control.
Registers on control, data, and address inputs provide minimal setup
and hold times. The timing latitude provided by this approach allows
systems to be designed with very short cycle times. With an input data
Pin Configuration(1,2,3,4)
NOTES:
1. All VDD pins must be connected to 3.3V power supply.
2. All VDDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VIH (3.3V), and 2.5V if OPT pin for that port is
set to VIL (0V).
3. All VSS pins must be connected to ground supply.
4. Package body is approximately 15mm x 15mm x 1.4mm with 0.8mm ball pitch.
5. This package code is used to reference the package diagram.
6. This text does not indicate orientation of the actual part-marking.
A17
V
SS
B17
I/O
15R
C17
V
SS
D17
I/O
14R
E16
V
SS E17
I/O
13L
D16
I/O
14L
C16
I/O
15L
B16
I/O
16L
A16
I/O
17L
A15
OPT
L
B15
V
DDQR
C15
I/O
16R
D15
V
DDQL
E15
I/O
13R
E14
I/O
12L
D14
I/O
17R
D13
V
DD
C12
A
6L C14
V
DD
B14
V
SS
A14
A
0L
A12
CNTEN
L
B12
A
5L
C11
R/W
L
D12
A
3L
D11
REPEAT
L
C10
V
SS
B11
ADS
L
A11
CLK
L
D8
BE
0L
C8
BE
3L
A9
BE
1L
D9
V
DD
C9
CE
1L
B9
CE
0L
D10
OE
L
C7
A
10L
B8
BE
2L
A8
A
8L
B13
A
1L
A13
A
4L
A10
V
DD
D7
A
7L
B7
A
9L
A7
BA
1L
B6
BA
2L
C6
BA
3L
D6
BA
0L
A5
NC
B5
NC
C5
NC
D5
BA
4L
A4
TDO
B4
TDI
C4
PL/
FT
L
D4
I/O
20L
A3
V
SS
B3
I/O
18R
C3
V
DDQR
D3
I/O
21L
D2
V
SS
C2
I/O
19R
B2
V
SS
A2
IO
18L
A1
IO
19L
B1
I/O
20R
C1
V
DDQL
D1
I/O
22L
E1
I/O
23L E2
I/O
22R E3
V
DDQR E4
I/O
21R
F1
V
DDQL F2
I/O
23R F3
I/O
24L F4
V
SS
G1
I/O
26L G2
V
SS G3
I/O
25L
G4
I/O
24R
H1
V
DD H2
I/O
26R
H3
V
DDQR H4
I/O
25R
J1
V
DDQL J2
V
DD
J3
V
SS
J4
V
SS
K1
I/O
28R
K2
V
SS K3
I/O
27R
K4
V
SS
L1
I/O
29R L2
I/O
28L
L3
V
DDQR L4
I/O
27L
M1
V
DDQL M2
I/O
29L M3
I/O
30R M4
V
SS
N1
I/O
31L N2
V
SS N3
I/O
31R
N4
I/O
30L
P1
I/O
32R P2
I/O
32L P3
V
DDQR P4
I/O
35R
R1
V
SS R2
I/O
33L R3
I/O
34R R4
TCK
T1
I/O
33R
T2
I/O
34L T3
V
DDQL T4
TMS
U1
V
SS U2
I/O
35L U3
PL/
FT
RU4
NC
P5
TRST
R5
NC
U6
BA
0R
P12
CNTEN
R
P8
A
8R
U10
OE
R
P9
BE
1R
R8
BE
2R
T8
BE
3R
U9
V
DD
P10
V
DD
T11
R/W
R
U8
BE
0R
P11
CLK
R
R12
A
5R
T12
A
6R
U12
A
3R
P13
A
4R
P7
BA
1R
R13
A
1R
T13
A
2R
U13
A
0R
R6
BA
2R
T5
NC
U7
A
7R U14
V
DD
T14
V
SS
R14
V
SS
P14
I/O
2L P15
I/O
3L
R15
V
DDQL
T15
I/O
0R
U15
OPT
R
U16
I/O
0L
U17
I/O
1L
T16
V
SS T17
I/O
2R
R17
V
DDQR
R16
I/O
1R
P17
I/O
4L
P16
V
SS
N17
I/O
5L
N16
I/O
4R
N15
V
DDQL
N14
I/O
3R
M17
V
DDQR
M16
I/O
5R
M15
I/O
6L
M14
V
SS
L17
I/O
8L
L16
V
SS
L15
I/O
7L
L14
I/O
6R
K17
V
SS
K16
I/O
8R
K15
V
DDQL
K14
I/O
7R
J17
V
DDQR
J16
V
SS
J15
V
DD
J14
V
SS
H17
I/O
10R
H16
V
SS
H15
IO
9R
H14
V
DD
G17
I/O
11R
G16
I/O
10L
G15
V
DDQL
G14
I/O
9L
F17
V
DDQR
F16
I/O
11L
F14
V
SS
70V7599BF
BF-208
(5)
208-Pin fpBGA
Top View
(6)
F15
I/O
12R
R9
CE
0R R11
ADS
R
T6
BA
3R
T9
CE
1R
A6
BA
5L
B10
V
SS
C13
A
2L
P6
BA
5R
R10
V
SS
R7
A
9R
T10
V
SS
T7
A
10R
U5
BA
4R
5626 drw 02c ,
1
1/08/01
register, the IDT70V7599 has been optimized for applications having
unidirectional or bidirectional data flow in bursts. An automatic power down
feature, controlled by CE0 and CE1, permits the on-chip circuitry of each
port to enter a very low standby power mode. The dual chip enables also
facilitate depth expansion.
The 70V7599 can support an operating voltage of either 3.3V or 2.5V
on one or both ports, controllable by the OPT pins. The power supply for
the core of the device(VDD) remains at 3.3V. Please refer also to the
functional description on page 19.
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
3
Pin Configuration(1,2,3,4) (con't.)
NOTES:
1. All VDD pins must be connected to 3.3V power supply.
2. All VDDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VIH (3.3V), and 2.5V if OPT pin for that port is
set to VIL (0V).
3. All VSS pins must be connected to ground supply.
4. Package body is approximately 17mm x 17mm x 1.4mm, with 1.0mm ball-pitch.
5. This package code is used to reference the package diagram.
6. This text does not indicate orientation of the actual part-marking.
70V7599BC
BC-256(5)
256-Pin BGA
Top View (6)
E16
I/O
14R
D16
I/O
16R
C16
I/O
16L
B16
NC
A16
NC
A15
NC
B15
I/O
17L
C15
I/O
17R
D15
I/O
15L
E15
I/O
14L
E14
I/O
13L
D14
I/O
15R
D13
V
DD
C12
A
6L C14
OPT
L
B14
V
DD
A14
A
0L
A12
A
5L
B12
A
4L
C11
ADS
L
D12
V
DDQR
D11
V
DDQR
C10
CLK
L
B11
REPEAT
L
A11
CNTEN
L
D8
V
DDQR
C8
BE
1L
A9
CE
1L
D9
V
DDQL
C9
BE
0L
B9
CE
0L
D10
V
DDQL
C7
A
7L
B8
BE
3L
A8
BE
2L
B13
A
1L
A13
A
2L
A10
OE
L
D7
V
DDQR
B7
A
9L
A7
A
8L
B6
BA
1L
C6
A
10L
D6
V
DDQL
A5
BA
3L
B5
BA
4L
C5
BA
2L
D5
V
DDQL
A4
NC
B4
NC
C4
BA
5L
D4
PL/
FT
L
A3
NC
B3
TDO
C3
V
SS
D3
I/O
20L
D2
I/O
19R
C2
I/O
19L
B2
NC
A2
TDI
A1
NC
B1
I/O
18L
C1
I/O
18R
D1
I/O
20R
E1
I/O
21R E2
I/O
21L E3
I/O
22L E4
V
DDQL
F1
I/O
23L F2
I/O
22R F3
I/O
23R F4
V
DDQL
G1
I/O
24R G2
I/O
24L G3
I/O
25L
G4
V
DDQR
H1
I/O
26L H2
I/O
25R
H3
I/O
26R H4
V
DDQR
J1
I/O
27L J2
I/O
28R J3
I/O
27R J4
V
DDQL
K1
I/O
29R
K2
I/O
29L K3
I/O
28L
K4
V
DDQL
L1
I/O
30L L2
I/O
31R
L3
I/O
30R L4
V
DDQR
M1
I/O
32R M2
I/O
32L M3
I/O
31L M4
V
DDQR
N1
I/O
33L N2
I/O
34R N3
I/O
33R
N4
PL/
FT
R
P1
I/O
35R P2
I/O
34L P3
TMS
P4
BA
5R
R1
I/O
35L R2
NC
R3
TRST
R4
NC
T1
NC
T2
TCK
T3
NC
T4
NC
P5
BA
2R
R5
BA
4R
P12
A
6R
P8
BE
1R P9
BE
0R
R8
BE
3R
T8
BE
2R
P10
CLK
R
T11
CNTEN
R
P11
ADS
R
R12
A
4R
T12
A
5R
P13
A
3R
P7
A
7R
R13
A
1R
T13
A
2R
R6
BA
1R
T5
BA
3R T14
A
0R
R14
OPT
R
P14
I/O
0L P15
I/O
0R
R15
NC
T15
NC
T16
NC
R16
NC
P16
I/O
1L
N16
I/O
2R
N15
I/O
1R
N14
I/O
2L
M16
I/O
4L
M15
I/O
3L
M14
I/O
3R
L16
I/O
5R
L15
I/O
4R
L14
I/O
5L
K16
I/O
7L
K15
I/O
6L
K14
I/O
6R
J16
I/O
8L
J15
I/O
7R
J14
I/O
8R
H16
I/O
10R
H15
IO
9L
H14
I/O
9R
G16
I/O
11R
G15
I/O
11L
G14
I/O
10L
F16
I/O
12L
F14
I/O
12R F15
I/O
13R
R9
CE
0R R11
REPEAT
R
T6
BA
0R
T9
CE
1R
A6
BA
0L
B10
R/W
L
C13
A
3L
P6
A
10R
R10
R/W
R
R7
A
9R
T10
OE
R
T7
A
8R
,
E5
V
DD E6
V
DD E7
V
SS E8
V
SS E9
V
SS E10
V
SS E11
V
DD E12
V
DD E13
V
DDQR
F5
V
DD F6
V
SS F8
V
SS
F9
V
SS F10
V
SS F12
V
DD F13
V
DDQR
G5
V
SS G6
V
SS G7
V
SS
G8
V
SS G9
V
SS G10
V
SS G11
V
SS
G12
V
SS G13
V
DDQL
H5
V
SS H6
V
SS
H7
V
SS H8
V
SS H9
V
SS H10
V
SS
H11
V
SS H12
V
SS H13
V
DDQL
J5
V
SS J6
V
SS J7
V
SS J8
V
SS J9
V
SS J10
V
SS J11
V
SS J12
V
SS
J13
V
DDQR
K5
V
SS
K6
V
SS K7
V
SS
K8
V
SS
L5
V
DD L6
V
SS
L7
V
SS L8
V
SS
M5
V
DD M6
V
DD M7
V
SS M8
V
SS
N5
V
DDQR N6
V
DDQR N7
V
DDQL
N8
V
DDQL
K9
V
SS
K10
V
SS K11
V
SS
K12
V
SS
L9
V
SS L10
V
SS
L11
V
SS L12
V
DD
M9
V
SS M10
V
SS M11
V
DD M12
V
DD
N9
V
DDQR N10
V
DDQR N11
V
DDQL
N12
V
DDQL
K13
V
DDQR
L13
V
DDQL
M13
V
DDQL
N13
V
DD
F7
V
SS F11
V
SS
5626 drw 02d
,
11/08/01
6.42
4
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Pin Configuration(1,2,3,4) (con't.)
NOTES:
1. All VDD pins must be connected to 3.3V power supply.
2. All VDDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VIH (3.3V), and 2.5V if OPT pin for that port is set to VIL (0V).
3. All VSS pins must be connected to ground supply.
4. Package body is approximately 28mm x 28mm x 3.5mm.
5. This package code is used to reference the package diagram.
6. This text does not indicate orientation of the actual part-marking.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
156
155
154
153
152
151
150
149
148
147
146
145
144
143
142
141
140
139
138
137
136
135
134
133
132
131
130
129
128
127
126
125
124
123
122
121
120
119
118
117
116
115
114
113
112
111
110
109
108
107
106
105
208
207
206
205
204
203
202
201
200
199
198
197
196
195
194
193
192
191
190
189
188
187
186
185
184
183
182
181
180
179
178
177
176
175
174
173
172
171
170
169
168
167
166
165
164
163
162
161
160
159
158
157
70V7599DR
DR-208
(5)
208-Pin PQFP
Top View
(6)
I/O
19L
I/O
19R
I/O
20L
I/O
20R
V
DDQL
V
SS
I/O
21L
I/O
21R
I/O
22L
I/O
22R
V
DDQR
V
SS
I/O
23L
I/O
23R
I/O
24L
I/O
24R
V
DDQL
V
SS
I/O
25L
I/O
25R
I/O
26L
I/O
26R
V
DDQR
V
SS
V
DD
V
DD
V
SS
V
SS
V
DDQL
V
SS
I/O
27R
I/O
27L
I/O
28R
I/O
28L
V
DDQR
V
SS
I/O
29R
I/O
29L
I/O
30R
I/O
30L
V
DDQL
V
SS
I/O
31R
I/O
31L
I/O
32R
I/O
32L
V
DDQR
V
SS
I/O
33R
I/O
33L
I/O
34R
I/O
34L
V
SS
V
DDQL
I/O
35R
I/O
35L
PL/FT
R
TMS
TCK
TRST
NC
NC
NC
BA
5R
BA
4R
BA
3R
BA
2R
BA
1R
BA
0R
A
10R
A
9R
A
8R
A
7R
BE
3R
BE
2R
BE
1R
BE
0R
CE
1R
CE
0R
V
DD
V
DD
V
SS
V
SS
CLK
R
OE
R
R/W
R
ADS
R
CNTEN
R
REPEAT
R
A
6R
A
5R
A
4R
A
3R
A
2R
A
1R
A
0R
V
DD
V
SS
V
SS
OPT
R
I/O
0L
I/O
0R
V
DDQL
V
SS
I/O
16L
I/O
16R
I/O
15L
I/O
15R
V
SS
V
DDQL
I/O
14L
I/O
14R
I/O
13L
I/O
13R
V
SS
V
DDQR
I/O
12L
I/O
12R
I/O
11L
I/O
11R
V
SS
V
DDQL
I/O
10L
I/O
10R
I/O
9L
I/O
9R
V
SS
V
DDQR
V
DD
V
DD
V
SS
V
SS
V
SS
V
DDQL
I/O
8R
I/O
8L
I/O
7R
I/O
7L
V
SS
V
DDQR
I/O
6R
I/O
6L
I/O
5R
I/O
5L
V
SS
V
DDQL
I/O
4R
I/O
4L
I/O
3R
I/O
3L
V
SS
V
DDQR
I/O
2R
I/O
2L
I/O
1R
I/O
1L
V
SS
V
DDQR
I/O
18R
I/O
18L
V
SS
PL/FT
L
TDI
TDO
NC
NC
NC
BA
5L
BA
4L
BA
3L
BA
2L
BA
1L
BA
0L
A
10L
A
9L
A
8L
A
7L
BE
3L
BE
2L
BE
1L
BE
0L
CE
1L
CE
0L
V
DD
V
DD
V
SS
V
SS
CLK
L
OE
L
R/W
L
ADS
L
CNTEN
L
REPEAT
L
A
6L
A
5L
A
4L
A
3L
A
2L
A
1L
A
0L
V
DD
V
DD
V
SS
OPT
L
I/O
17L
I/O
17R
V
DDQR
V
SS
5626 drw 02a
,
11/08/01
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
5
Pin Names
Left Port Right Port Names
CE
0L
, CE
1L
CE
0R
, CE
1R
Chip Enables
R/W
L
R/W
R
Read/ Wr ite E nab l e
OE
L
OE
R
Output Enable
BA
0L
- BA
5L
BA
0R
- BA
5R
Bank Address
(4)
A
0L
- A
10L
A
0R
- A
10R
Address
I/O
0L
- I/O
35L
I/O
0R
- I/O
35R
Da ta In p ut/O utp u t
CLK
L
CLK
R
Clock
PL/FT
L
PL/FT
R
Pipeline/Flow-Through
ADS
L
ADS
R
Address Strobe Enable
CNTEN
L
CNTEN
R
Counte r Enable
REPEAT
L
REPEAT
R
Counter Repeat
(3)
BE
0L
- BE
3L
BE
0R
- BE
3R
Byte Enables (9-bit bytes)
V
DDQL
V
DDQR
Po we r (I/O Bus ) (3.3V o r 2.5V)
(1)
OPT
L
OPT
R
Op tio n fo r s e le c ting V
DDQX
(1,2)
V
DD
Po we r (3.3V)
(1)
V
SS
Gro und (0V)
TDI Te s t Data Inp ut
TDO Te st Data Outp ut
TCK Test Logic Clock (10MHz)
TMS Test Mode Select
TRST Re se t (Initi al iz e TA P Co ntro l le r)
56 26 tbl 01
NOTES:
1. VDD, OPTX, and VDDQX must be set to appropriate operating levels prior to
applying inputs on the I/Os and controls for that port.
2. OPTX selects the operating voltage levels for the I/Os and controls on that port.
If OPTX is set to VIH (3.3V), then that port's I/Os and controls will operate at 3.3V
levels and VDDQX must be supplied at 3.3V. If OPTX is set to VIL (0V), then that
port's I/Os and address controls will operate at 2.5V levels and VDDQX must be
supplied at 2.5V. The OPT pins are independent of one another—both ports can
operate at 3.3V levels, both can operate at 2.5V levels, or either can operate
at 3.3V with the other at 2.5V.
3. When REPEATX is asserted, the counter will reset to the last valid address loaded
via ADSX.
4. Accesses by the ports into specific banks are controlled by the bank address
pins under the user's direct control: each port can access any bank of memory
with the shared array that is not currently being accessed by the opposite port
(i.e., BA0L - BA 5L BA0R - BA5R). In the event that both ports try to access the
same bank at the same time, neither access will be valid, and data at the two
specific addresses targeted by the ports within that bank may be corrupted (in
the case that either or both ports are writing) or may result in invalid output (in
the case that both ports are trying to read).
6.42
6
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
NOTES:
1 . "H" = VIH, "L" = VIL, "X" = Don't Care.
2. ADS, CNTEN, REPEAT are set as appropriate for address access. Refers to Truth Table II for details.
3. OE is an asynchronous input signal.
4. It is possible to read or write any combination of bytes during a given access. A few representative samples have been illustrated here.
Truth Table I—Read/Write and Enable Control(1,2,3,4)
OE
3
CLK CE
0
CE
1
BE
3
BE
2
BE
1
BE
0
R/WByte 3
I/O
27-35
Byte 2
I/O
18-26
Byte 1
I/O
9-17
Byte 0
I/O
0-8
MODE
XHXXXXXXHigh-ZHigh-ZHigh-ZHigh-ZDeselectedPower Down
XX LXXXXXHigh-ZHigh-ZHigh-ZHigh-ZDeselectedPower Down
XL HHHHHXHigh-ZHigh-ZHigh-ZHigh-ZAll Bytes Deselected
XL H H H H L L High-Z High-Z High-Z D
IN
Wr ite to B y te 0 On ly
XLHHHLHLHigh-ZHigh-Z D
IN
High-Z Write to Byte 1 Only
XLHHLHHLHigh-Z D
IN
High-Z High-Z Write to Byte 2 Only
XLHLHHHL D
IN
High-Z High-Z High-Z Write to Byte 3 Only
XL H H H L L L High-Z High-Z D
IN
D
IN
Write to Lowe r 2 B y te s Only
XLHLLHHL D
IN
D
IN
High-Z High-Z Write to Uppe r 2 bytes Only
XLHLLLLL D
IN
D
IN
D
IN
D
IN
Write to All By tes
LL H H H H L H High-Z High-Z High-Z D
OUT
Re ad B y te 0 Only
LLHHHLHHHigh-ZHigh-ZD
OUT
Hig h -Z Re ad B y te 1 Onl y
LLHHLHHHHigh-Z D
OUT
High-Z High-Z Read Byte 2 Only
LLHLHHHH D
OUT
High-Z High-Z High-Z Read Byte 3 Only
LLHHHLLHHigh-ZHigh-ZD
OUT
D
OUT
Re ad Lowe r 2 By te s On ly
LLHLLHHH D
OUT
D
OUT
High-Z High-Z Read Upper 2 Byte s Only
LLHLLLLHD
OUT
D
OUT
D
OUT
D
OUT
Re ad All Bytes
HXXXXXXXXHigh-ZHigh-ZHigh-ZHigh-ZOutputs Disabled
5626 tbl 02
Truth Table II—Address and Address Counter Control(1,2,7)
NOTES:
1 . "H" = VIH, "L" = VIL, "X" = Don't Care.
2. Read and write operations are controlled by the appropriate setting of R/W, CE0, CE1, BEn and OE.
3. Outputs configured in flow-through output mode: if outputs are in pipelined mode the data out will be delayed by one cycle.
4. ADS and REPEAT are independent of all other memory control signals including CE0, CE1 and BEn
5. The address counter advances if CNTEN = VIL on the rising edge of CLK, regardless of all other memory control signals including CE0, CE1, BEn.
6. When REPEAT is asserted, the counter will reset to the last valid address loaded via ADS. This value is not set at power-up: a known location should be loaded
via ADS during initialization if desired. Any subsequent ADS access during operations will update the REPEAT address location.
7. The counter includes bank address and internal address. The counter will advance across bank boundaries. For example, if the counter is in Bank 0, at address
FFFh, and is advanced one location, it will move to address 0h in Bank 1. By the same token, the counter at FFFh in Bank 63 will advance to 0h in Bank 0. Refer
to Timing Waveform of Counter Repeat, page 18. Care should be taken during operation to avoid having both counters point to the same bank (i.e., ensure BA0L
- BA5L BA0R - BA5R), as this condition will invalidate the access for both ports. Please refer to the functional description on page 19 for details.
Address Previous
Address Addr
Used CLK ADS CNTEN REPEAT
(6)
I/O
(3)
MODE
An X An L
(4)
XHD
I/O
(n) Exte rnal Ad dress Used
XAnAn + 1
H L
(5)
HD
I/O
(n+1) Counter EnabledInternal Address generation
X An + 1 An + 1 HH HD
I/O
(n+1) External Address Blocked—Counter disab led (An + 1 reused)
XXAn
XX L
(4)
D
I/O
(0) Counter Set to last valid ADS lo ad
5626 tbl 03
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
7
Recommended Operating
Temperature and Supply Voltage(1) Recommended DC Operating
Conditions with VDDQ at 2.5V
Absolute Maximum Ratings(1)
NOTES:
1. Undershoot of VIL > -1.5V for pulse width less than 10ns is allowed.
2. VTERM must not exceed VDDQ + 100mV.
3 . To select operation at 2.5V levels on the I/Os and controls of a given port, the
OPT pin for that port must be set to VIL (0V), and VDDQX for that port must be supplied
as indicated above.
NOTES:
1 . Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. VTERM must not exceed VDD + 150mV for more than 25% of the cycle time or
4ns maximum, and is limited to < 20mA for the period of VTERM > VDD + 150mV.
NOTE:
1. This is the parameter TA. This is the "instant on" case temperature.
Grade Ambient
Temperature GND V
DD
Commercial 0
O
C to +70
O
C0V3.3V
+
150m V
Industrial -40
O
C to + 85
O
C0V3.3V
+
150m V
5626 tbl 04
Symbol Parameter Min. Typ. Max. Unit
V
DD
Co re Sup p ly Vol tag e 3.15 3. 3 3.45 V
V
DDQ
I/O Supp ly Voltag e
(3)
2.4 2.5 2.6 V
V
SS
Ground 0 0 0 V
V
IH
Inp u t Hig h Vo l tag e
(Ad d re ss & Co ntro l Inp uts ) 1.7
____
V
DDQ
+ 100mV
(2)
V
V
IH
Input High Voltage - I/O
(3)
1.7
____
V
DDQ
+ 100mV
(2)
V
V
IL
Inp u t Lo w Vo lta g e -0. 3
(1)
____
0.7 V
5626 tb l 0 5a
Symbol Rating Commercial
& Industrial Unit
V
TERM
(2)
Te rminal Vo ltag e
with Res pec t to
GND
-0.5 to +4.6 V
T
BIAS
Temperature
Und e r B ias -55 to +125
o
C
T
STG
Storage
Temperature -65 to +150
o
C
I
OUT
DC Outp ut Curre nt 50 mA
5626 tbl 06
Recommended DC Operating
Conditions with VDDQ at 3.3V
NOTES:
1. Undershoot of VIL > -1.5V for pulse width less than 10ns is allowed.
2. VTERM must not exceed VDDQ + 150mV.
3 . To select operation at 3.3V levels on the I/Os and controls of a given port, the
OPT pin for that port must be set to VIH (3.3V), and VDDQX for that port must be
supplied as indicated above.
Symbol Parameter Min. Typ. Max. Unit
V
DD
Core S up ply Vo ltage 3.15 3. 3 3.45 V
V
DDQ
I/O Supp ly Vo ltage
(3)
3.15 3.3 3.45 V
V
SS
Ground 0 0 0 V
V
IH
Input Hi g h Vol tag e
(Address & Contro l Inputs)
(3)
2.0
____
V
DDQ
+ 150mV
(2)
V
V
IH
In p ut Hi g h Vo l tag e - I/ O
(3)
2.0
____
V
DDQ
+ 150mV
(2)
V
V
IL
Inp ut Lo w Vo l tage -0.3
(1)
____
0.8 V
562 6 tbl 05b
6.42
8
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (VDD = 3.3V ± 150mV)
NOTES:
1. At VDD < 2.0V leakages are undefined.
2. VDDQ is selectable (3.3V/2.5V) via OPT pins. Refer to p.5 for details.
Symbol Parameter Test Conditions
70V7599S
UnitMin. Max.
|I
LI
| Inp ut Le akag e Curre nt
(1)
V
DDQ
= Max., V
IN
= 0V to V
DDQ
___
10 µA
|I
LO
| Outp ut Le akag e Curre nt
(1)
CE
0
= V
IH
or CE
1
= V
IL
, V
OUT
= 0V to V
DDQ
___
10 µA
V
OL
(3. 3V) Outp ut Lo w Vo ltag e
(2)
I
OL
= +4mA, V
DDQ
= Min.
___
0.4 V
V
OH
(3.3V) Output High Voltage
(2)
I
OH
= -4mA, V
DDQ
= Min. 2.4
___
V
V
OL
(2. 5V) Outp ut Lo w Vo ltag e
(2)
I
OL
= +2mA, V
DDQ
= Min.
___
0.4 V
V
OH
(2.5V) Output High Voltage
(2)
I
OH
= -2mA, V
DDQ
= Min. 2.0
___
V
5626 tbl 08
NOTES:
1. These parameters are determined by device characterization, but are not
production tested.
2. 3dV references the interpolated capacitance when the input and output switch
from 0V to 3V or from 3V to 0V.
3. COUT also references CI/O.
Capacitance(1)
(TA = +25°C, F = 1.0MHZ) PQFP ONLY
Symbol Parameter Conditions(2) Max. Unit
C
IN
Input Capacitance V
IN
= 3dV 8 pF
C
OUT
(3) Ou tp ut Cap aci tance V
OUT
= 3d V 10.5 pF
5626 tbl 07
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
9
DC Electrical Characteristics Over the Operating
T emperature and Supply Voltage Range(5) (VDD = 3.3V ± 150mV)
NOTES:
1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCYC, using "AC TEST CONDITIONS" at input
levels of GND to 3V.
2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby.
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
4. VDD = 3.3V, TA = 25°C for Typ, and are not production tested. IDD DC(f=0) = 120mA (Typ).
5. CEX = VIL means CE0X = VIL and CE1X = VIH
CEX = VIH means CE0X = VIH or CE1X = VIL
CEX < 0.2V means CE0X < 0.2V and CE1X > VDDQ - 0.2V
CEX > VDDQ - 0.2V means CE0X > VDDQ - 0.2V or CE1X < 0.2V
"X" represents "L" for left port or "R" for right port.
70V7599S200
(7)
Com'l Only 70V7599S166
(6)
Com'l
& I nd
70V7599S133
Com'l
& I nd
Symbol Parameter Test Condition Version Typ.
(4)
Max. Typ.
(4)
Max. Typ.
(4)
Max. Unit
I
DD
Dynamic Op e rating
Current (Both
Ports Activ e)
CE
L
and CE
R
= V
IL
,
Outputs Disab le d,
f = f
MAX
(1)
COM'L S 815 950 675 790 550 645 mA
IND S
____ ____
675 830 550 675
I
SB1
Standb y Current
(B oth P o rts - TTL
Lev el Inp u ts )
CE
L
= CE
R
= V
IH
f = f
MAX
(1)
COM'L S 340 410 275 340 250 295 mA
IND S
____ ____
275 355 250 310
I
SB2
Standb y Current
(One P o rt - TTL
Lev el Inp u ts )
CE
"A"
= V
IL
and CE
"B"
= V
IH
(3)
Active Po rt Outputs Disable d,
f=f
MAX
(1)
COM'L S 690 770 515 640 460 520 mA
IND S
____ ____
515 660 460 545
I
SB3
Full Standb y Curre nt
(B oth P o rts - CM OS
Lev el Inp u ts )
Both Ports CE
L
and CE
R
> V
DDQ
- 0. 2V,
V
IN
> V
DDQ
- 0.2V or V
IN
< 0.2V,
f = 0
(2)
COM'L S 10 30 10 30 10 30 mA
IND S
____ ____
10 40 10 40
I
SB4
Full Standb y Curre nt
(One P o rt - CMOS
Lev el Inp u ts )
CE
"A"
< 0.2V and CE
"B"
> V
DDQ
- 0.2V
(5)
V
IN
> V
DDQ
- 0.2V or V
IN
< 0.2V,
Active Port, Outputs Disabled,
f = f
MAX
(1)
COM'L S 690 770 515 640 460 520 mA
IND S
____ ____
515 660 460 545
5626 t b l 09
6. 166MHz Industrial Temperature not available in BF-208 package.
7. This speed grade available when VDDQ = 3.3.V for a specific port (i.e., OPTx = VIH). This speed grade available in BC-256 package only.
6.42
10
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
AC T est Conditions (VDDQ - 3.3V/2.5V)
Figure 1. AC Output Test load.
Figure 2. Output Test Load
(For tCKLZ, tCKHZ, tOLZ, and tOHZ).
*Including scope and jig.
Figure 3. Typical Output Derating (Lumped Capacitive Load).
Input Pulse Levels (Address & Controls)
In p ut P ul s e Le ve l s (I/ O s )
In p ut R ise / Fa ll Tim e s
In p ut Ti m ing Refere nc e L e v e l s
Outp ut Refe re nce Le v els
Outp ut Lo ad
GND to 3
.
0V/GND to 2.4V
GND to 3.0V /GND to 2. 4V
2ns
1.5V/1.25V
1.5V/1.25V
Fig ure s 1 and 2
5626 tbl 10
1.5V/1.25
50
50
5626 drw 03
10pF
(Tester)
D
ATA
OUT
,
5626 drw 04
590
5pF*
435
3.3V
DATA
OUT
,
833
5pF*
770
2
.
5
V
DATA
OUT
,
-1
1
2
3
4
5
6
7
20.5 30 50 80 100 200
10.5pF is the I/O capacitance of this
device, and 10pF is the AC Test Load
Capacitance.
Capacitance (pF)
tCD
(
Typical, ns)
5626 drw 05
,
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
11
AC Electrical Characteristics Over the Operating Temperature Range
(Read and Write Cycle Timing)(2) (VDD = 3.3V ± 150mV, TA = 0°C to +70°C)
NOTES:
1. The Pipelined output parameters (tCYC2, tCD2) apply to either or both left and right ports when FT/PIPEX = VIH. Flow-through parameters (tCYC1, tCD1) apply when
FT/PIPEX = VIL for that port.
2. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable (OE) and FT/PIPE. FT/PIPE should be treated as a
DC signal, i.e. steady state during operation.
3. These values are valid for either level of VDDQ (3.3V/2.5V). See page 5 for details on selecting the desired operating voltage levels for each port.
70V7599S200
(5)
Com'l Only 70V7599S166
(3,4)
Com'l
& I n d
70V7599S133
(3)
Com'l
& In d
Symbol Parameter Min.Max.Min.Max.Min.Max.Unit
t
CYC1
Clock Cycle Time (Flow-Through)
(1)
15
____
20
____
25
____
ns
t
CYC2
Clock Cycle Time (Pipelined)
(1)
5
____
6
____
7.5
____
ns
t
CH1
Clo c k Hig h Time (Fl ow-Throug h)
(1)
5
____
6
____
7
____
ns
t
CL1
Clo ck Low Ti me (Flo w-Thro ug h)
(1)
5
____
6
____
7
____
ns
t
CH2
Clock High Time (Pipelined)
(2)
2.0
____
2.1
____
2.6
____
ns
t
CL2
Clock Low Time (Pipelined)
(1)
2.0
____
2.1
____
2.6
____
ns
t
R
Clock Rise Time
____
1.5
____
1.5
____
1.5 ns
t
F
Clock Fall Time
____
1.5
____
1.5
____
1.5 ns
t
SA
Address Setup Time 1.5
____
1.7
____
1.8
____
ns
t
HA
Address Hold Time 0.5
____
0.5
____
0.5
____
ns
t
SC
Chip Enabl e Se tup Tim e 1.5
____
1.7
____
1.8
____
ns
t
HC
Chip Enabl e Hol d Tim e 0.5
____
0.5
____
0.5
____
ns
t
SB
Byte Enable Setup Time 1.5
____
1.7
____
1.8
____
ns
t
HB
B yte Enab le Hold Tim e 0.5
____
0.5
____
0.5
____
ns
t
SW
R/W S e tup Ti me 1.5
____
1.7
____
1.8
____
ns
t
HW
R/W Ho ld Ti me 0.5
____
0.5
____
0.5
____
ns
t
SD
Inp ut Data S e tup Time 1. 5
____
1.7
____
1.8
____
ns
t
HD
Inp ut Data Ho ld Tim e 0. 5
____
0.5
____
0.5
____
ns
t
SAD
ADS Se tup Tim e 1.5
____
1.7
____
1.8
____
ns
t
HAD
ADS Hol d Tim e 0.5
____
0.5
____
0.5
____
ns
t
SCN
CNTEN Se tup Time 1.5
____
1.7
____
1.8
____
ns
t
HCN
CNTEN Ho ld Time 0.5
____
0.5
____
0.5
____
ns
t
SRPT
REPEAT Setup Time 1.5
____
1.7
____
1.8
____
ns
t
HRPT
REPEAT Ho ld Ti me 0.5
____
0.5
____
0.5
____
ns
t
OE
Outp ut Enab le to Data Vali d
____
4.0
____
4.0
____
4.2 ns
t
OLZ
Outp ut E nab le to Outp ut Lo w-Z 0.5
____
0.5
____
0.5
____
ns
t
OHZ
Outp ut E nable to Outp ut Hig h-Z 1 3.4 1 3. 6 1 4.2 ns
t
CD1
Clo c k to Data Val id (Flo w-Thro ug h)
(1)
____
10
____
12
____
15 ns
t
CD2
Clock to Data Valid (Pipelined)
(1)
____
3.4
____
3.6
____
4.2 ns
t
DC
Da ta O utpu t Hol d A f te r C l o ck Hi gh 1
____
1
____
1
____
ns
t
CKHZ
Clock High to Output High-Z 13.413.614.2ns
t
CKLZ
Clo c k Hig h to Outp ut Lo w-Z 0.5
____
0.5
____
0.5
____
ns
Port-to-Port Delay
t
CO
Clock-to-Clock Offse t 5.0
____
6.0
____
7.5
____
ns
5626 tbl 11
4. 166MHz Industrial Temperature not available in BF-208 package.
5. This speed grade available when VDDQ = 3.3.V for a specific port (i.e., OPTx = VIH). This speed grade available in BC-256 package only.
6.42
12
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
An An + 1 An + 2 An + 3
t
CYC2
t
CH2
t
CL2
R/
W
ADDRESS
CE
0
CLK
CE
1
BE
n
(3)
DATA
OUT
OE
t
CD2
t
CKLZ
Qn Qn + 1 Qn + 2
t
OHZ
t
OLZ
t
OE
5626 drw 06
(1)
(1)
t
SC
t
HC
t
SB
t
HB
t
SW
t
HW
t
SA
t
HA
t
DC
t
SC
t
HC
t
SB
t
HB
(4)
(1 Latency)
(5)
(5)
Timing Wav eform of Read Cyc le for Pipelined Operation
(ADS Operation) (FT/PIPE'X' = VIH)(2)
NOTES:
1. OE is asynchronously controlled; all other inputs are synchronous to the rising clock edge.
2. ADS = VIL, CNTEN and REPEAT = VIH.
3. The output is disabled (High-Impedance state) by CE0 = VIH, CE1 = VIL, BEn = VIH following the next rising edge of the clock. Refer to
Truth Table 1.
4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers
are for reference use only.
5. If BEn was HIGH, then the appropriate Byte of DATAOUT for Qn + 2 would be disabled (High-Impedance state).
6. "x" denotes Left or Right port. The diagram is with respect to that port.
Timing Wa veform of Read Cyc le for Flow-through Output
(FT/PIPE"X" = VIL)(2,6)
An An + 1 An + 2 An + 3
t
CYC1
t
CH1
t
CL1
R/
W
ADDRESS
DATA
OUT
CE
0
CLK
OE
t
SC
t
HC
t
CD1
t
CKLZ
Qn Qn + 1 Qn + 2
t
OHZ
t
OLZ
t
OE
t
CKHZ
5626 drw 07
(5)
(1)
CE
1
BEn
(3)
t
SB
t
HB
t
SW
t
HW
t
SA
t
HA
t
DC
t
DC
(4)
t
SC
t
HC
t
SB
t
HB
(5)
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
13
t
SC
t
HC
CE
0(B1)
DDRESS
(B1)
A
0
A
1
A
2
A
3
A
4
A
5
t
SA
t
HA
CLK
Q
0
Q
1
Q
3
DATA
OUT(B1)
t
CH2
t
CL2
t
CYC2
DDRESS
(B2)
A
0
A
1
A
2
A
3
A
4
A
5
t
SA
t
HA
CE
0(B2)
DATA
OUT(B2)
Q
2
Q
4
t
CD2
t
CD2
t
CKHZ
t
CD2
t
CKLZ
t
DC
t
CKHZ
t
CD2
t
CKLZ
t
SC
t
HC
t
CKHZ
t
CKLZ
t
CD2
A
6
A
6
t
DC
t
SC
t
HC
t
SC
t
HC
5626 drw 08
Timing Waveform of a Multi-Device Pipelined Read(1,2)
NOTES:
1. B1 Represents Device #1; B2 Represents Device #2. Each Device consists of one IDT70V7599 for this waveform,
and are setup for depth expansion in this example. ADDRESS(B1) = ADDRESS(B2) in this situation.
2. BEn, OE, and ADS = VIL; CE1(B1), CE1(B2), R/W, CNTEN, and REPEAT = VIH.
Timing Waveform of a Multi-Device Flow-Through Read(1,2)
t
SC
t
HC
CE
0(B1)
ADDRESS
(B1)
A
0
A
1
A
2
A
3
A
4
A
5
t
SA
t
HA
CLK
5626 drw 09
D
0
D
3
t
CD1
t
CKLZ
t
CKHZ
(1) (1)
D
1
DATA
OUT(B1)
t
CH1
t
CL1
t
CYC1
(1)
ADDRESS
(B2)
A
0
A
1
A
2
A
3
A
4
A
5
t
SA
t
HA
CE
0(B2)
DATA
OUT(B2)
D
2
D
4
t
CD1
t
CD1
t
CKHZ
t
DC
t
CD1
t
CKLZ
t
SC
t
HC
(1)
t
CKHZ
(1)
t
CKLZ
(1)
t
CD1
A
6
A
6
t
DC
t
SC
t
HC
t
SC
t
HC
D
5
t
CD1
t
CKLZ
(1)
t
CKHZ
(1)
6.42
14
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
CLK
"A"
R/W
"A"
BANK ADDRESS
AND ADDRESS
"A"
DATA
IN"A"
CLK
"B"
R/W
"B"
BANK ADDRESS
AND ADDRESS
"B"
DATA
OUT"B"
t
SW
t
HW
t
SA
t
HA
t
SD
t
HD
t
SW
t
HW
t
SA
t
HA
t
CD2
Dn
An
An
Dn
5626 drw 10
t
DC
t
CO
(3)
Timing Wa v ef orm of Port A Write to Pipelined P ort B R ead(1,2,4)
Timing Waveform with Port-to-Port Flow-Through Read(1,2,4)
DATA
IN "A"
CLK
"B"
R/W
"B"
BANK ADDRESS
AND ADDRESS
"A"
R/W
"A"
CLK
"A"
BANK ADDRESS
AND ADDRESS
"B"
An
An
Dn
t
DC
DATA
OUT "B"
5626 drw 11
Dn
t
SW
t
HW
t
SA
t
HA
t
SD
t
HD
t
HW
t
CD1
t
CO
(3)
t
DC
t
SA
t
SW
t
HA
NOTES:
1. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH.
2. OE = VIL for Port "B", which is being read from. OE = VIH for Port "A", which is being written to.
3. If tCO < minimum specified, then operations from both ports are INVALID. If tCO minimum, then data from Port "B" read is available on first Port "B" clock cycle
(ie, time from write to valid read on opposite port will be tCO + tCYC2 + tCD2).
4. All timing is the same for Left and Right ports. Port "A" may be either Left or Right port. Port "B" is the opposite of Port "A"
NOTES:
1. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH.
2. OE = VIL for the Right Port, which is being read from. OE = VIH for the Left Port, which is being written to.
3. If tCO < minimum specified, then operations from both ports are INVALID. If tCO minimum, then data from Port "B" read is available on first Port "B" clock cycle
(i.e., time from write to valid read on opposite port will be tCO + tCD1).
4. All timing is the same for both left and right ports. Port "A" may be either left or right port. Port "B" is the opposite of Port "A".
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
15
R/
W
ADDRESS An An +1 An + 2 An + 2 An + 3 An + 4
DATA
IN
Dn + 2
CE
0
CLK
5626 drw 12
Qn Qn + 3
DATA
OUT
CE
1
BE
n
t
CD2
t
CKHZ
t
CKLZ
t
CD2
t
SC
t
HC
t
SB
t
HB
t
SW
t
HW
t
SA
t
HA
t
CH2
t
CL2
t
CYC2
READ NOP READ
t
SD
t
HD
(3)
(1)
t
SW
t
HW
WRITE
(4)
Timing Waveform of Pipelined Read-to-Write-to-Read
(OE = VIL)(2)
NOTES:
1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
2. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH. "NOP" is "No Operation".
3. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers
are for reference use only.
4. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.
R/
W
ADDRESS An An +1 An + 2 An + 3 An + 4 An + 5
DATA
IN
Dn + 3Dn + 2
CE
0
CLK
5626 drw 13
DATA
OUT
Qn Qn + 4
CE
1
BE
n
OE
t
CH2
t
CL2
t
CYC2
t
CKLZ
t
CD2
t
OHZ
t
CD2
t
SD
t
HD
READ WRITE READ
t
SC
t
HC
t
SB
t
HB
t
SW
t
HW
t
SA
t
HA
(3)
(1)
t
SW
t
HW
(4)
Timing Waveform of Pipelined Read-to-Write-to-Read ( OE Controlled)(2)
NOTES:
1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
2. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH.
3. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference
use only.
4. This timing does not meet requirements for fastest speed grade. This waveform indicates how logically it could be done if timing so allows.
6.42
16
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Timing Waveform of Flow-Through Read-to-Write-to-Read (OE = VIL)(2)
Timing Waveform of Flow-Through Read-to-Write-to-Read (OE Controlled)(2)
NOTES:
1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
2. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH.
3. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for
reference use only.
4. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.
R/
W
ADDRESS An An +1 An + 2 An + 2 An + 3 An + 4
DATA
IN
Dn + 2
CE
0
CLK
5626 drw 14
Qn
DATA
OUT
CE
1
BEn
t
CD1
Qn + 1
t
CH1
t
CL1
t
CYC1
t
SD
t
HD
t
CD1
t
CD1
t
DC
t
CKHZ
Qn + 3
t
CD1
t
DC
t
SC
t
HC
t
SB
t
HB
t
SW
t
HW
t
SA
t
HA
READ NOP READ
t
CKLZ
(3)
(1)
t
SW
t
HW
WRITE
(4)
R/
W
ADDRESS An An +1 An + 2 An + 3 An + 4 An + 5
(3)
DATA
IN
Dn + 2
CE
0
CLK
5626 drw 15
Qn
DATA
OUT
CE
1
BEn
t
CD1
t
CH1
t
CL1
t
CYC1
t
SD
t
HD
t
CD1
t
DC
Qn + 4
t
CD1
t
DC
t
SC
t
HC
t
SB
t
HB
t
SW
t
HW
t
SA
t
HA
READ WRITE READ
t
CKLZ
(1)
Dn + 3
t
OHZ
t
SW
t
HW
OE
t
OE
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
17
ADDRESS An
CLK
DATAOUT Qx - 1
(2)
Qx Qn Qn + 2
(2)
Qn +
3
ADS
CNTEN
t
CYC2
tCH2 tCL2
5626 drw 16
tSA tHA
tSAD tHAD
tCD2
tDC
READ
EXTERNAL
ADDRESS READ WITH COUNTER COUNTER
HOLD
tSAD tHAD
tSCN tHCN
READ
WITH
COUNTER
Qn + 1
Timing Waveform of Pipelined Read with Address Counter Advance(1)
NOTES:
1. CE0, OE, BEn = VIL; CE1, R/W, and REPEAT = VIH.
2. If there is no address change via ADS = VIL (loading a new address) or CNTEN = VIL (advancing the address), i.e. ADS = VIH and CNTEN = VIH, then
the data output remains constant for subsequent clocks.
Timing Waveform of Flow-Through Read with Address Counter Advance(1)
ADDRESS An
CLK
DATAOUT Qx
(2)
Qn Qn + 1 Qn + 2 Qn + 3
(2)
Qn + 4
ADS
CNTEN
tCYC1
tCH1 tCL1
5626 drw 17
tSA tHA
tSAD tHAD
READ
EXTERNAL
ADDRESS
READ WITH COUNTER COUNTER
HOLD
tCD1
tDC
tSAD tHAD
tSCN tHCN
READ
WITH
COUNTER
6.42
18
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Timing Waveform of Write with Address Counter Advance
(Flow-through or Pipelined Inputs)(1,6)
NOTES:
1. CE0, BEn, and R/W = VIL; CE1 and REPEAT = VIH.
2. CE0, BEn = VIL; CE1 = VIH.
3. The "Internal Address" is equal to the "External Address" when ADS = VIL and equals the counter output when ADS = VIH.
4. No dead cycle exists during REPEAT operation. A READ or WRITE cycle may be coincidental with the counter REPEAT cycle: Address loaded by last valid
ADS load will be accessed. For more information on REPEAT function refer to Truth Table II.
5. CNTEN = VIL advances Internal Address from ‘An’ to ‘An +1’. The transition shown indicates the time required for the counter to advance. The ‘An +1’Address is
written to during this cycle.
6. The counter includes bank address and internal address. The counter will advance across bank boundaries. For example, if the counter is in Bank 0, at address
FFFh, and is advanced one location, it will move to address 0h in Bank 1. By the same token, the counter at FFFh in Bank 63 will advance to 0h in Bank 0.
7. For Pipelined Mode user should add 1 cycle latency for outputs as per timing waveform of read cycle for pipelined operations.
ADDRESS An
CLK
DATA
IN
Dn Dn + 1 Dn + 1 Dn + 2
ADS
CNTEN
t
CH2
t
CL2
t
CYC2
5626 drw 18
INTERNAL
(3)
ADDRESS An
(5)
An + 1 An + 2 An + 3 An + 4
Dn + 3 Dn + 4
t
SA
t
HA
t
SAD
t
HAD
WRITE
COUNTER HOLD WRITE WITH COUNTER
WRITE
EXTERNAL
ADDRESS
WRITE
WITH COUNTER
t
SD
t
HD
t
SCN
t
HCN
Timing Waveform of Counter Repeat for Flow Through Mode(2,6,7)
ADDRESS An
t
CYC2
CLK
DATA
IN
R/
W
REPEAT
5626 drw 19
INTERNAL
(3)
ADDRESS
ADS
CNTEN
WRITE TO
ADS
ADDRESS
An
ADVANCE
COUNTER
WRITE TO
An+1
ADVANCE
COUNTER
WRITE TO
An+2
HOLD
COUNTER
WRITE TO
An+2
REPEAT
READ LAST
ADS
ADDRESS
An
DATA
OUT
t
SA
t
HA
,
An
t
SAD
t
HAD
t
SW
t
HW
t
SCN
t
HCN
t
SRPT
t
HRPT
t
SD
t
HD
t
CD1
An+1 An+2 An+2 An An+1 An+2 An+2
D
0
D
1
D
2
D
3
An An+1 An+2 An+2
ADVANCE
COUNTER
READ
An+1
ADVANCE
COUNTER
READ
An+2
HOLD
COUNTER
READ
An+2
(4)
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
19
Functional Description
The IDT70V7599 is a high-speed 128Kx36 (4 Mbit) synchronous
Bank-Switchable Dual-Ported SRAM organized into 64 independent
2Kx36 banks. Based on a standard SRAM core instead of a traditional true
dual-port memory core, this bank-switchable device offers the benefits of
increased density and lower cost-per-bit while retaining many of the
features of true dual-ports. These features include simultaneous, random
access to the shared array, separate clocks per port, 166 MHz operating
speed, full-boundary counters, and pinouts compatible with the IDT70V3599
(128Kx36) dual-port family.
The two ports are permitted independent, simultaneous access into
separate banks within the shared array. Access by the ports into specific
banks are controlled by the bank address pins under the user's direct
control: each port can access any bank of memory with the shared array
that is not currently being accessed by the opposite port (i.e., BA0L - BA5L
BA0R - BA5R). In the event that both ports try to access the same bank
at the same time, neither access will be valid, and data at the two specific
addresses targeted by the ports within that bank may be corrupted (in the
case that either or both ports are writing) or may result in invalid output (in
the case that both ports are trying to read).
The IDT70V7599 provides a true synchronous Dual-Port Static RAM
5626 drw 20
IDT70V7599
CE
0
CE
1
CE
1
CE
0
CE
0
CE
1
B
A
6(1)
CE
1
CE
0
V
DD
V
DD
IDT70V7599
IDT70V7599
IDT70V7599
Control Inputs
Control Inputs
Control Inputs
Control Inputs BE,
R/W,
OE,
CLK,
ADS,
REPEAT
,
CNTEN
,
Figure 4. Depth and Width Expansion with IDT70V7599
interface. Registered inputs provide minimal setup and hold times on
address, data and all critical control inputs.
An asynchronous output enable is provided to ease asynchronous
bus interfacing. Counter enable inputs are also provided to stall the
operation of the address counters for fast interleaved memory applications.
A HIGH on CE0 or a LOW on CE1 for one clock cycle will power down
the internal circuitry on each port (individually controlled) to reduce static
power consumption. Dual chip enables allow easier banking of multiple
IDT70V7599S for depth expansion configurations. Two cycles are
required with CE0 LOW and CE1 HIGH to read valid data on the outputs.
Depth and Width Expansion
The IDT70V7599 features dual chip enables (refer to Truth
Table I) in order to facilitate rapid and simple depth expansion with no
requirements for external logic. Figure 4 illustrates how to control the
various chip enables in order to expand two devices in depth.
The IDT70V7599 can also be used in applications requiring expanded
width, as indicated in Figure 4. Through combining the control signals, the
devices can be grouped as necessary to accommodate applications
needing 72-bits or wider.
NOTE:
1. In the case of depth expansion, the additional address pin logically serves as an extension of the bank address. Accesses by the ports into specific banks are
controlled by the bank address pins under the user's direct control: each port can access any bank of memory within the shared array that is not currently
being accessed by the opposite port (i.e., BA0L - BA6L BA0R - BA6R). In the event that both ports try to access the same bank at the same time, neither
access will be valid, and data at the two specific addresses targeted by the parts within that bank may be corrupted (in the case that either or both parts are
writing) or may result in invalid output (in the case that both ports are trying to read).
6.42
20
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
JT AG AC Electrical
Characteristics(1,2,3,4)
70V7599
Symbol Parameter Min. Max. Units
t
JCYC
JTAG Clock Input Period 100
____
ns
t
JCH
JTAG Clock HIGH 40
____
ns
t
JCL
JTAG Clock Low 40
____
ns
t
JR
JTAG Clock Rise Time
____
3
(1)
ns
t
JF
JTAG Clock Fall Time
____
3
(1)
ns
t
JRST
JTAG Rese t 50
____
ns
t
JRSR
JTAG Rese t Recovery 50
____
ns
t
JCD
J TAG Data Outp ut
____
25 ns
t
JDC
J TA G Da ta O utput Hold 0
____
ns
t
JS
JTAG Se tup 15
____
ns
t
JH
JTAG Hold 15
____
ns
5626 tbl 12
NOTES:
1. Guaranteed by design.
2. 30pF loading on external output signals.
3. Refer to AC Electrical Test Conditions stated earlier in this document.
4. JTAG operations occur at one speed (10MHz). The base device may run at
any speed specified in this datasheet.
JTAG Timing Specifications
TCK
Device Inputs
(1)
/
TDI/TMS
D
evice Outputs
(2)
/
TDO
TRST
t
JCD
t
JDC
t
JRST
t
JS
t
JH
t
JCYC
t
JRSR
t
JF
t
JCL
t
JR
t
JCH
5626 drw 21
,
Figure 5. Standard JTAG Timing
NOTES:
1. Device inputs = All device inputs except TDI, TMS, TRST, and TCK.
2. Device outputs = All device outputs except TDO.
6.42
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
21
Identification Register Definitions
Instruction Fiel d Value Descripti on
Revision Numbe r (31:28) 0x0 Reserved for version number
IDT De vic e ID (27: 12) 0x 308 De fi ne s IDT part numb e r
IDT JE DEC ID (11:1) 0x33 A llo ws u ni que id e ntif ic atio n o f d ev ic e v e nd or as IDT
ID Re g is ter Ind ic ator B it (Bi t 0) 1 Ind ic ate s the p re se nce o f an ID re gi ste r
5626 tbl 13
Scan Register Sizes
Regi ster Nam e Bit Si ze
Instruction (IR) 4
Bypass (BYR) 1
Id e n ti fi ca ti o n (IDR ) 3 2
Boundary Scan (BSR) Note (3)
5626 tbl 14
System Interface Parameters
Instruction Code Description
EXTEST 0000 Forces contents of the boundary scan ce lls o nto the device outp uts
(1)
.
Places the boundary scan register (BSR) between TDI and TDO.
BYPASS 1111 Places the by pass registe r (BYR) between TDI and TDO.
IDCODE 0010 Loads the ID register (IDR) with the vendor ID code and places the
register between TDI and TDO.
HIGHZ 0100 Places the bypass register (BYR) be tween TDI and TDO. Forces all
device output drivers to a High-Z state.
CLAMP 0011 Uses BYR. Forces contents of the boundary scan cells onto the device
outp uts. Places the by pass register (BYR) betwe en TDI and TDO.
SAMPLE/PRELOAD 0001 Places the boundary scan registe r (BSR) between TDI and TDO.
SA MP LE al lo ws d ata fro m d e vi ce inp uts
(2)
and o utp uts
(1)
to be captured
in the bo undary scan cells and shifted serially through TDO. PRELOAD
all o ws d ata to be inp ut se riall y i nto the bo und ary s c a n ce ll s vi a the TDI.
RE SERV ED Al l o the r co d e s Se ve ral c o mb i natio ns are re se rv ed . Do no t us e c o d es othe r than tho se
identified above.
5626 tbl 15
NOTES:
1. Device outputs = All device outputs except TDO.
2. Device inputs = All device inputs except TDI, TMS, TRST, and TCK.
3. The Boundary Scan Descriptive Language (BSDL) file for this device is available on the IDT website (www.idt.com), or by contacting your local
IDT sales representative.
6.42
22
IDT70V7599S
High-Speed 128K x 36 Synchronous Bank-Switchable Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Ordering Information
A
Power
999
Speed
A
Package
A
Process/
Temperature
Range
Blank
ICommercial (0°C to +70°C)
Industrial (-40°C to +85°C)
BF
DR
BC
208-pin fpBGA (BF-208)
208-pin PQFP (DR-208)
256-pin BGA (BC-256)
200
166
133
XXXXX
Device
Type
Speed in Megahertz
5626 drw 22
S Standard Power
70V7599 4Mbit (128K x 36-Bit) Synchronous Bank-Switchable Dual-Port RAM
Commercial Only
(1)
Commercial & Industrial
(2)
Commercial & Industrial
,
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
CORPORATE HEADQUARTERS for SALES: for Tech Support:
6024 Silver Creek Valley Road 800-345-7015 or 408-284-8200 408-284-2794
San Jose, CA 95138 fax: 408-284-2775 DualPortHelp@idt.com
www.idt.com
Datasheet Document History:
1/5/00: Initial Public Offering
10/19/01: Page 2, 3 & 4 Added date revision for pin configurations
Page 9 Changed ISB3 values for commercial and industrial DC Electrical Characteristics
Page 11 Changed tOE value in AC Electrical Characteristics, please refer to Errata #SMEN-01-05
Page 20 Increased tJCD from 20ns to 25ns, please refer to Errata #SMEN-01-04
Page 1 & 22 Replaced TM logo with ® logo
03/18/02: Page 1, 9, 11 & 22 Added 200MHz specification
Page 9 Tightened power numbers in DC Electrical Characteristics
Page 14 Changed waveforms to show INVALID operation if tCO < minimum specified
Page 1 - 22 Removed "Preliminary" status
12/4/02: Page 9, 11 & 22 Designated 200 Mhz speed grade available in BC-256 package only
01/16/04: Page 11 Added byte enable setup time and byte enable hold time parameters and values to all speed grades in the AC Electrical
Characteristics Table
07/25/08: Page 9 Corrected a typo in the DC Chars table
01/29/09: Page 22 Removed "IDT" from orderable part number
NOTES:
1. Available in BC-256 package only.
2. Industrial Temperature at 166Mhz not available in BF-208 package.