LP2995
LP2995 DDR Termination Regulator
Literature Number: SNVS190K
LP2995
March 28, 2011
DDR Termination Regulator
General Description
The LP2995 linear regulator is designed to meet the JEDEC
SSTL-2 and SSTL-3 specifications for termination of DDR-
SDRAM. The device contains a high-speed operational am-
plifier to provide excellent response to load transients. The
output stage prevents shoot through while delivering 1.5A
continuous current and transient peaks up to 3A in the appli-
cation as required for DDR-SDRAM termination. The LP2995
also incorporates a VSENSE pin to provide superior load regu-
lation and a VREF output as a reference for the chipset and
DDR DIMMS.
Patents Pending
Features
Low output voltage offset
Works with +5v, +3.3v and 2.5v rails
Source and sink current
Low external component count
No external resistors required
Linear topology
Available in SO-8, PSOP-8 or LLP-16 packages
Low cost and easy to use
Applications
DDR Termination Voltage
SSTL-2
SSTL-3
Typical Application Circuit
20039302
© 2011 National Semiconductor Corporation 200393 www.national.com
LP2995 DDR Termination Regulator
Connection Diagrams
SO-8 (M08A) Package
20039320
Top View
LQA- 16 Package
20039304
Top View
PSOP-8 (MRA08A) Package
20039350
Top View
Pin Descriptions
SO-8 Pin or PSOP-8
Pin LLP Pin Name Function
1 1,3,4,6,9, 13,16 NC No internal connection. Can be used for vias.
2 2 GND Ground.
3 5 VSENSE Feedback pin for regulating VTT.
4 7 VREF Buffered internal reference voltage of VDDQ/2.
5 8 VDDQ Input for internal reference equal to VDDQ/2.
6 10 AVIN Analog input pin.
7 11, 12 PVIN Power input pin.
8 14, 15 VTT Output voltage for connection to termination resistors.
EP EP Exposed pad thermal connection. Connect to soft Ground.
Ordering Information
Order Number Package Type NSC Package Drawing Supplied As
LP2995M SO-8 M08A 95 Units per Rail
LP2995MX SO-8 M08A 2500 Units Tape and Reel
LP2995MR PSOP-8 MRA08A 95 Units per Rail
LP2995MRX PSOP-8 MRA08A 2500 Units Tape and Reel
LP2995LQ LLP-16 LQA16A 1000 Units Tape and Reel
LP2995LQX LLP-16 LQA16A 4500 Units Tape and Reel
www.national.com 2
LP2995
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
AVIN to GND −0.3V to +6V
PVIN to GND -0.3V to AVIN
VDDQ (Note 2) −0.3V to +6V
Storage Temp. Range −65°C to +150°C
Junction Temperature 150°C
PSOP-8 Thermal Resistance (θJA)43°C/W
SO-8 Thermal Resistance (θJA)151°C/W
LLP-16 Thermal Resistance (θJA)51°C/W
Lead Temperature (Soldering, 10 sec) 260°C
ESD Rating (Note 8) 1kV
Operating Range
Junction Temp. Range (Note 6) 0°C to +125°C
AVIN to GND 2.2V to 5.5V
PVIN to GND 2.2V to AVIN
Electrical Characteristics Specifications with standard typeface are for TJ = 25°C and limits in boldface type
apply over the full Operating Temperature Range (TJ = 0°C to +125°C). Unless otherwise specified,
AVIN = PVIN = 2.5V, VDDQ = 2.5V (Note 7).
Symbol Parameter Conditions Min Typ Max Units
VREF VREF Voltage IREF_OUT = 0mA 1.21 1.235 1.26 V
VOSVTT VTT Output Voltage Offset IOUT = 0A
(Note 3)
−15
−20
0 15
20
mV
ΔVTT/VTT Load Regulation
(Note 4)
IOUT = 0 to 1.5A 0.5 %
IOUT = 0 to −1.5A −0.5
ZVREF VREF Output Impedance IREF = −5µA to +5µA 5 k
ZVDDQ VDDQ Input Impedance 100 k
IqQuiescent Current IOUT = 0A
(Note 5)
250 400 µA
Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is
intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions see Electrical Characteristics.
The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under
the listed test conditions.
Note 2: VDDQ voltage must be less than 2 x (AVIN - 1) or 6V, whichever is smaller.
Note 3: VTT offset is the voltage measurement defined as VTT subtracted from VREF.
Note 4: Load regulation is tested by using a 10ms current pulse and measuring VTT.
Note 5: Quiescent current defined as the current flow into AVIN.
Note 6: At elevated temperatures, devices must be derated based on thermal resistance. The device in the SO-8 package must be derated at θJA = 151° C/W
junction to ambient with no heat sink. The device in the LLP-16 must be derated at θJA = 51° C/W junction to ambient.
Note 7: Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality
Control (SQC) methods. The limits are used to calculate National's Average Outgoing Quality Level (AOQL).
Note 8: The human body model is a 100pF capacitor discharged through a 1.5k resistor into each pin.
3 www.national.com
LP2995
Typical Performance Characteristics
Iq vs VIN (25°C)
20039309
Iq vs Temperature ( VIN = 2.5V)
20039310
Iq vs VIN (0, 25, 85, and 125°C)
20039311
VREF vs IREF
20039312
VREF vs Temperature (No Load)
20039313
VTT vs IOUT (0, 25, 85, and 125°C)
20039314
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LP2995
VTT vs IOUT
20039315
Maximum Output Current (Sourcing) vs VIN
(VDDQ = 2.5)
20039316
Maximum Output Current (Sinking) vs VIN
(VDDQ = 2.5)
20039317
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LP2995
Block Diagram
20039301
Description
The LP2995 is a linear bus termination regulator designed to
meet the JEDEC requirements of SSTL-2 and SSTL-3. The
LP2995 is capable of sinking and sourcing current at the out-
put VTT, regulating the voltage to equal VDDQ / 2. A buffered
reference voltage that also tracks VDDQ / 2 is generated on
the VREF pin for providing a global reference to the DDR-
SDRAM and Northbridge Chipset. VTT is designed to track the
VREF voltage with a tight tolerance over the entire current
range while preventing shoot through on the output stage.
Series Stub Termination Logic (SSTL) was created to im-
prove signal integrity of the data transmission across the
memory bus. This termination scheme is essential to prevent
data error from signal reflections while transmitting at high
frequencies encountered with DDR RAM. The most common
form of termination is Class II single parallel termination. This
involves using one Rs series resistor from the chipset to the
memory and one Rt termination resistor. This implementation
can be seen below in Figure 1.
20039308
FIGURE 1.
Typical values for RS and RT are 25 Ohms although these can
be changed to scale the current requirements from the
LP2995. For determination of the current requirements of
DDR-SDRAM termination please refer to the accompanying
application notes.
www.national.com 6
LP2995
Pin Descriptions
AVIN AND PVIN
AVIN and PVIN are the input supply pins for the LP2995. AVIN
is used to supply all the internal control circuitry for the two
op-amps and the output stage of VREF. PVIN is used exclu-
sively to provide the rail voltage for the output stage on the
power operational amplifier used to create VTT. For SSTL-2
applications AVIN and PVIN pins should be connected di-
rectly and tied to the 2.5V rail for optimal performance. This
eliminates the need for bypassing the two supply pins sepa-
rately.
VDDQ
VDDQ is the input that is used to create the internal reference
voltage for regulating VTT and VREF. This voltage is generated
by two internal 50k resistors. This guarantees that VTT and
VREF will track VDDQ / 2 precisely. The optimal implementa-
tion of VDDQ is as a remote sense for the reference input.
This can be achieved by connecting VDDQ directly to the 2.5V
rail at the DIMM. This ensures that the reference voltage
tracks the DDR memory rails precisely without a large voltage
drop from the power lines. For SSTL-2 applications VDDQ will
be a 2.5V signal, which will create a 1.25V reference voltage
on VREF and a 1.25V termination voltage at VTT. For SSTL-3
applications it may be desirable to have a different scaling
factor for creating the internal reference voltage besides 0.5.
For instance a typical value that is commonly used is to have
the reference voltage equal VDDQ*0.45. This can be
achieved by placing a resistor in series with the VDDQ pin to
effectively change the resistor divider.
VSENSE
The purpose of the sense pin is to provide improved remote
load regulation. In most motherboard applications the termi-
nation resistors will connect to VTT in a long plane. If the output
voltage was regulated only at the output of the LP2995, then
the long trace will cause a significant IR drop, resulting in a
termination voltage lower at one end of the bus than the other.
The VSENSE pin can be used to improve this performance, by
connecting it to the middle of the bus. This will provide a better
distribution across the entire termination bus.
Note: If remote load regulation is not used, then the VSENSE pin must still be
connected to VTT.
VREF
VREF provides the buffered output of the internal reference
voltage VDDQ / 2. This output should be used to provide the
reference voltage for the Northbridge chipset and memory.
Since these inputs are typically an extremely high impedance,
there should be little current drawn from VREF. For improved
performance, an output bypass capacitor can be used, locat-
ed close to the pin, to help with noise. A ceramic capacitor in
the range of 0.1 µF to 0.01 µF is recommended.
VTT
VTT is the regulated output that is used to terminate the bus
resistors. It is capable of sinking and sourcing current while
regulating the output precisely to VDDQ / 2. The LP2995 is
designed to handle peak transient currents of up to ± 3A with
a fast transient response. The maximum continuous current
is a function of VIN and can be viewed in the TYPICAL PER-
FORMANCE CHARACTERISTICS section. If a transient is
expected to last above the maximum continuous current rat-
ing for a significant amount of time then the output capacitor
should be sized large enough to prevent an excessive voltage
drop. Despite the fact that the LP2995 is designed to handle
large transient output currents it is not capable of handling
these for long durations, under all conditions. The reason for
this is the standard packages are not able to thermally dissi-
pate the heat as a result of the internal power loss. If large
currents are required for longer durations, then care should
be taken to ensure that the maximum junction temperature is
not exceeded. Proper thermal derating should always be
used (please refer to the Thermal Dissipation section).
Component Selection
INPUT CAPACITOR
The LP2995 does not require a capacitor for input stability,
but it is recommended for improved performance during large
load transients to prevent the input rail from dropping. The
input capacitor should be located as close as possible to the
PVIN pin. Several recommendations exist dependent on the
application required. A typical value recommended for AL
electrolytic capacitors is 50 µF. Ceramic capacitors can also
be used, a value in the range of 10 µF with X5R or better would
be an ideal choice. The input capacitance can be reduced if
the LP2995 is placed close to the bulk capacitance from the
output of the 2.5V DC-DC converter.
OUTPUT CAPACITOR
The LP2995 has been designed to be insensitive of output
capacitor size or ESR (Equivalent Series Resistance). This
allows the flexibility to use any capacitor desired. The choice
for output capacitor will be determined solely on the applica-
tion and the requirements for load transient response of VTT.
As a general recommendation the output capacitor should be
sized above 100 µF with a low ESR for SSTL applications with
DDR-SDRAM. The value of ESR should be determined by the
maximum current spikes expected and the extent at which the
output voltage is allowed to droop. Several capacitor options
are available on the market and a few of these are highlighted
below:
AL - It should be noted that many aluminum electrolytics only
specify impedance at a frequency of 120 Hz, which indicates
they have poor high frequency performance. Only aluminum
electrolytics that have an impedance specified at a higher fre-
quency (between 20 kHz and 100 kHz) should be used for the
LP2995. To improve the ESR several AL electrolytics can be
combined in parallel for an overall reduction. An important
note to be aware of is the extent at which the ESR will change
over temperature. Aluminum electrolytic capacitors can have
their ESR rapidly increase at cold temperatures.
Ceramic - Ceramic capacitors typically have a low capaci-
tance, in the range of 10 to 100 µF range, but they have
excellent AC performance for bypassing noise because of
very low ESR (typically less than 10 m). However, some
dielectric types do not have good capacitance characteristics
as a function of voltage and temperature. Because of the typ-
ically low value of capacitance it is recommended to use
ceramic capacitors in parallel with another capacitor such as
an aluminum electrolytic. A dielectric of X5R or better is rec-
ommended for all ceramic capacitors.
Hybrid - Several hybrid capacitors such as OS-CON and SP
are available from several manufacturers. These offer a large
capacitance while maintaining a low ESR. These are the best
solution when size and performance are critical, although
their cost is typically higher than any other capacitor.
Capacitor recommendations for different application circuits
can be seen in the accompanying application notes with sup-
porting evaluation boards.
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LP2995
Thermal Dissipation
Since the LP2995 is a linear regulator any current flow from
VTT will result in internal power dissipation generating heat.
To prevent damaging the part from exceeding the maximum
allowable junction temperature, care should be taken to der-
ate the part dependent on the maximum expected ambient
temperature and power dissipation. The maximum allowable
internal temperature rise (TRmax) can be calculated given the
maximum ambient temperature (TAmax) of the application and
the maximum allowable junction temperature (TJmax).
TRmax = TJmax − TAmax
From this equation, the maximum power dissipation (PDmax)
of the part can be calculated:
PDmax = TRmax / θJA
The θJA of the LP2995 will be dependent on several variables:
the package used; the thickness of copper; the number of vias
and the airflow. For instance, the θJA of the SO-8 is 163°C/W
with the package mounted to a standard 8x4 2-layer board
with 1oz. copper, no airflow, and 0.5W dissipation at room
temperature. This value can be reduced to 151.2°C/W by
changing to a 3x4 board with 2 oz. copper that is the JEDEC
standard. Figure 2 shows how the θJA varies with airflow for
the two boards mentioned.
20039321
FIGURE 2. θJA vs Airflow (SO-8)
Layout is also extremely critical to maximize the output cur-
rent with the LLP package. By simply placing vias under the
DAP the θJA can be lowered significantly. Figure 3 shows the
LLP thermal data when placed on a 4-layer JEDEC board with
copper thickness of 0.5/1/1/0.5 oz. The number of vias, with
a pitch of 1.27 mm, has been increased to the maximum of 4
where a θJA of 50.41°C/W can be obtained. Via wall thickness
for this calculation is 0.036 mm for 1oz. Copper.
20039322
FIGURE 3. LLP-16 θJA vs # of Vias (4 Layer JEDEC Board))
Additional improvements in lowering the θJA can also be
achieved with a constant airflow across the package. Main-
taining the same conditions as above and utilizing the 2x2 via
array, Figure 4 shows how the θJA varies with airflow.
20039323
FIGURE 4. θJA vs Airflow Speed (JEDEC Board with 4
Vias)
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LP2995
Typical Application Circuits
The typical application circuit used for SSTL-2 termination
schemes with DDR-SDRAM can be seen in Figure 5.
20039306
FIGURE 5. SSTL-2 Implementation
For SSTL-3 and other applications it may be desirable to
change internal reference voltage scaling from VDDQ * 0.5.
An external resistor in series with the VDDQ pin can be used
to lower the reference voltage. Internally two 50 k resistors
set the output VTT to be equal to VDDQ * 0.5. The addition of
a 11.1 k external resistor will change the internal reference
voltage causing the two outputs to track VDDQ * 0.45. An
implementation of this circuit can be seen in Figure 6.
20039307
FIGURE 6. SSTL-3 Implementation
Another application that is sometimes required is to increase
the VTT output voltage from the scaling factor of VDDQ * 0.5.
This can be accomplished independently of VREF by using a
resistor divider network between VTT, VSENSE and Ground. An
example of this circuit can be seen in Figure 7.
20039303
FIGURE 7.
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LP2995
PCB Layout Considerations
1. AVIN and PVIN should be tied together for optimal
performance. A local bypass capacitor should be placed
as close as possible to the PVIN pin.
2. GND should be connected to a ground plane with
multiple vias for improved thermal performance.
3. VSENSE should be connected to the VTT termination bus
at the point where regulation is required. For
motherboard applications an ideal location would be at
the center of the termination bus.
4. VDDQ can be connected remotely to the VDDQ rail input
at either the DIMM or the Chipset. This provides the most
accurate point for creating the reference voltage.
5. VREF should be bypassed with a 0.01 µF or 0.1 µF
ceramic capacitor for improved performance. This
capacitor should be located as close as possible to the
VREF pin.
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LP2995
Physical Dimensions inches (millimeters) unless otherwise noted
8-Lead Small Outline Package (M8)
NS Package Number M08A
11 www.national.com
LP2995
16-Lead LLP Package (LD)
NS Package Number LQA16A
8-Lead PSOP Package (PSOP-8)
NS Package Number MRA08A
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LP2995
Notes
13 www.national.com
LP2995
Notes
LP2995 DDR Termination Regulator
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