HEXFET® Power MOSFET
PD - 9.1244C
lGeneration V Technology
lUltra Low On-Resistance
lN-Channel Mosfet
lSurface Mount
lAvailable in Tape & Reel
lDynamic dv/dt Rating
lFast Switching
Description
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve the
lowest possible on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer
with an extremely efficient device for use in a wide
variety of applications.
The SO-8 has been modified through a customized
leadframe for enhanced thermal characteristics and
multiple-die capability making it ideal in a variety of
power applications. With these improvements, multiple
devices can be used in an application with dramatically
reduced board space. The package is designed for
vapor phase, infra red, or wave soldering techniques.
Power dissipation of greater than 0.8W is possible in
a typical PCB mount application.
IRF7401
SO-8
VDSS = 20V
RDS(on) = 0.022
Parameter Max. Units
ID @ TA = 25°C 10 Sec. Pulsed Drain Current, VGS @ 4.5V 10
ID @ TA = 25°C Continuous Drain Current, VGS @ 4.5V 8.7
ID @ TA = 70°C Continuous Drain Current, VGS @ 4.5V 7.0
IDM Pulsed Drain Current 35
PD @TA = 25°C Power Dissipation 2.5 W
Linear Derating Factor 0.02 W/ °C
VGS Gate-to-Source Voltage ± 12 V
dv/dt Peak Diode Recovery dv/dt 5.0 V/ns
TJ, TSTG Junction and Storage Temperature Range -55 to + 150 °C
Absolute Maximum Ratings
A
Top View
8
1
2
3
45
6
7
D
D
D
DG
S
A
S
S
A
02/13/01
Thermal Resistance Ratings
Parameter Typ. Max. Units
RθJA Maximum Junction-to-Ambient––– 50 °C/W
IRF7401
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 20 ––– ––– VV
GS = 0V, ID = 250µA
V(BR)DSS/TJBreakdown Voltage Temp. Coefficient ––– 0.044 ––– V/°C Reference to 25°C, ID = 1mA
––– ––– 0.022 VGS = 4.5V, ID = 4.1A
––– ––– 0.030 VGS = 2.7V, ID = 3.5A
VGS(th) Gate Threshold Voltage 0.70 ––– ––– VV
DS = VGS, ID = 250µA
gfs Forward Transconductance 11 ––– ––– SV
DS = 15V, ID = 4.1A
––– ––– 1.0 VDS = 16V, VGS = 0V
––– ––– 25 VDS = 16V, VGS = 0V, TJ = 125 °C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 12V
Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -12V
QgTotal Gate Charge ––– ––– 48 ID = 4.1A
Qgs Gate-to-Source Charge ––– ––– 5.1 nC VDS = 16V
Qgd Gate-to-Drain ("Miller") Charge ––– ––– 20 VGS = 4.5V, See Fig. 6 and 12
td(on) Turn-On Delay Time ––– 13 ––– VDD = 10V
trRise Time ––– 72 ––– ID = 4.1A
td(off) Turn-Off Delay Time ––– 65 ––– RG = 6.0
tfFall Time ––– 92 ––– RD = 2.4Ω, See Fig. 10
Between lead tip
and center of die contact
Ciss Input Capacitance ––– 1600 ––– VGS = 0V
Coss Output Capacitance ––– 690 ––– pF VDS = 15V
Crss Reverse Transfer Capacitance ––– 310 ––– ƒ = 1.0MHz, See Fig. 5
Notes:
Parameter Min. Typ. Max. Units Conditions
ISContinuous Source Current MOSFET symbol
(Body Diode) showing the
ISM Pulsed Source Current integral reverse
(Body Diode) p-n junction diode.
VSD Diode Forward Voltage ––– ––– 1.0 V TJ = 25°C, IS = 2.0A, VGS = 0V
trr Reverse Recovery Time ––– 39 59 ns TJ = 25°C, IF = 4.1A
Qrr Reverse RecoveryCharge ––– 42 63 nC di/dt = 100A/µs
ton Forward Turn-On Time
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
ISD 4.1A, di/dt 100A/µs, VDD V(BR)DSS,
TJ 150°C
Pulse width 300µs; duty cycle 2%.
Source-Drain Ratings and Characteristics
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
––– ––– 35
––– ––– 3.1 A
S
D
G
IGSS
IDSS Drain-to-Source Leakage Current
LSInternal Source Inductance ––– 4.0 –––
LDInternal Drain Inductance ––– 2.5 ––– nH
ns
nA
µA
RDS(ON) Static Drain-to-Source On-Resistance
S
D
G
Surface mounted on FR-4 board, t 10sec.
IRF7401
Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics
1
10
100
1000
0.1 1 10 100
I , Drain-to-S ource C urrent (A )
D
V , Dra in -to -S o u rc e V o lta
g
e
(
V
)
DS
20
µ
s PULSE W IDTH
T = 2 5°C
A
V G S
T OP 7. 5V
5.0 V
4.0 V
3.5 V
3.0 V
2.5 V
2.0 V
B O TT O M 1 .5V
1.5V
A
1
10
100
1000
0.1 1 10 100
I , D ra in-to -So urc e Cu rre nt (A)
D
V , Dr a in -to -So urce Vo lta
g
e
(
V
DS
A
V G S
T OP 7 .5V
5.0 V
4.0 V
3.5 V
3.0 V
2.5 V
2.0 V
B O TT O M 1 .5V
1.5V
20
µ
s PULSE W IDTH
T = 1 50 °C
J
1
10
100
1000
1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
T = 25°C
T = 150°C
J
J
GS
V , Ga te -to -S ou rce V olta
g
e (V)
D
I , D rain-to -So urc e Curre nt (A )
A
V = 15V
20µs PULSE WIDTH
DS
0.0
0.5
1.0
1.5
2.0
-60 -40 -20 0 20 40 60 80 100 120 140 160
J
T , Junction Tem perature
(
°C
)
R , Dra in -to -S o urce On R e s is ta nce
DS(on)
(Normalized)
A
V = 4.5V
GS
I = 6.9A
D
IRF7401
Fig 7. Typical Source-Drain Diode
Forward Voltage Fig 8. Maximum Safe Operating Area
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
0
500
1000
1500
2000
2500
3000
1 10 100
C , Ca pa citanc e (p F)
DS
V , Dr ain -to -So u rc e Volt a
g
e
(
V
)
A
V = 0 V , f = 1MH z
C = C + C , C S H OR T E D
C = C
C = C + C
GS
iss
g
s
g
d ds
rss
g
d
oss ds
g
d
C
iss
C
oss
C
rss
0
2
4
6
8
10
0 1020304050
Q , To ta l Gate Ch a r
g
e
(
nC
)
G
V , Ga te -to- S ou r ce V o ltag e (V )
GS
A
FOR TEST CIRCUIT
SEE FIGURE 12
I = 4 .1 A
V = 1 6V
D
DS
0.1
1
10
100
0.0 1.0 2.0 3.0 4.0
T = 25°C
T = 150°C
J
J
V = 0 V
GS
V , S ource-to-Drain V olta
g
e
(
V
)
I , Re v ers e D ra in Cur ren t ( A )
SD
SD
A
1
10
100
0.1 1 10 100
OPERATION IN THIS AREA LIMITED
BY RDS
(
on
)
Single Pulse
T
T = 150 C
= 25 C
°°
J
A
V , Drain-to-Source Volta
g
e (V)
I , Drain Current (A)I , Drain Current (A)
DS
D
100us
1ms
10ms
IRF7401
0.1
1
10
100
0.0001 0.001 0.01 0.1 1 10 100
Notes:
1. Duty factor D = t / t
2. Peak T =P x Z + T
1 2
JDM thJA A
P
t
t
DM
1
2
t , Rectangular Pulse Duration (sec)
Thermal Response (Z )
1
thJA
0.01
0.02
0.05
0.10
0.20
D = 0.50
SINGLE PULSE
(THERMAL RESPONSE)
Fig 10a. Switching Time Test Circuit
+
-
VDS
90%
10%
VGS t
d(on)
t
r
t
d(off)
t
f
VDS
4.5V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 9. Maximum Drain Current Vs.
Ambient Temperature
Fig 10b. Switching Time Waveforms
RD
VGS
VDD
RGD.U.T.
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
25 50 75 100 125 150
0.0
2.0
4.0
6.0
8.0
10.0
T , Case Temperature ( C)
I , Drain Current (A)
°
C
D
IRF7401
Fig 12a. Basic Gate Charge Waveform Fig 12b. Gate Charge Test Circuit
D.U.T. V
DS
I
D
I
G
3mA
V
GS
.3µF
50K
.2µF
12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
QG
QGS QGD
VG
Charge
4.5V
IRF7401
P.W. Period
di/dt
Diode Recovery
dv/dt
Ripple 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current Body Diode Forward
Current
VGS=10V
VDD
ISD
Driver Gate Drive
D.U.T. ISD Waveform
D.U.T. VDS Waveform
Inductor Curent
D = P.W.
Period
+
-
+
+
+
-
-
-
RGVDD
dv/dt controlled by RG
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
D.U.T Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer
* Reverse Polarity for P-Channel
** Use P-Channel Driver for P-Channel Measurements
*
VGS*
**
Peak Diode Recovery dv/dt Test Circuit
[ ]
[ ]
*** VGS = 5.0V for Logic Level and 3V Drive Devices
[ ] ***
Fig 13. For N-Channel HEXFETS
IRF7401
Package Outline
SO-8 Outline
Dimensions are shown in millimeters (inches)
SO-8
Part Marking Information
E XA M PL E : TH IS IS AN IR F7 1 01
DATE CODE (YWW)
Y = LAST D IGIT OF THE YEAR
WW = W EEK
WA FE R
LO T CO D E
(LAST 4 DIGITS)
XXXX
BOTTOM
PART NUMBER
TOP
INTERNATIONAL
RECTIFIER
LOGO
F7101
312
K x 45°
C
8X
L
8X
θ
H
0.25
(
.010
)
M A M
A
0.10
(
.004
)
B 8X
0.25
(
.010
)
M C A S B S
- C -
6X
e
- B -
D
E
- A -
8 7 6 5
1 2 3 4
5
6
5
RECOMMENDED FOOTPRINT
0.72
(
.028
)
8X
1.78
(
.070
)
8X
6.46
(
.255
)
1.27
(
.050
)
3X
DIM INCHES MILLIMETERS
MIN MAX MIN MAX
A .0532 .0688 1.35 1.75
A1 .0040 .0098 0.10 0.25
B .014 .018 0.36 0.46
C .0075 .0098 0.19 0.25
D .189 .196 4.80 4.98
E .150 .157 3.81 3.99
e .050 BASIC 1.27 BASIC
e1 .025 BASIC 0.635 BASIC
H .2284 .2440 5.80 6.20
K .011 .019 0.28 0.48
L 0.16 .050 0.41 1.27
θ
0° 8° 0° 8°
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M-1982.
2. CONTROLLING DIMENSION : INCH.
3. DIMENSIONS ARE SHOWN IN MILLIMETERS
(
INCHES
)
.
4. OUTLINE CONFORMS TO JEDEC OUTLINE MS-012AA.
DIMENSION DOES NOT INCLUDE MOLD PROTRUSIONS
MOLD PROTRUSIONS NOT TO EXCEED 0.25
(
.006
)
.
DIMENSIONS IS THE LENGTH OF LEAD FOR SOLDERING TO A SUBSTRATE..
5
6
A1
e1
IRF7401
Tape & Reel Information
SO-8
Dimensions are shown in millimeters (inches)
4.10 (.161)
3.90 (.154)
1.60 (.062 )
1.50 (.059 )
1.85 (.072)
1.65 (.065)
5.30 (.208)
5.10 (.201)
5.55 (.218)
5.45 (.215)
2.60 (.102)
1.50 (.059)
6.50 (.255)
6.30 (.248)
8.10 (.318 )
7.90 (.311 )
FEED DIRECTIO N
TERMINATION
N UMB E R 1
2.05 (.080)
1.95 (.077)
0 .35 (.013)
0 .25 (.010)
12.30 (.484)
11.70 (.461)
2.20 ( .08 6)
2.00 ( .07 9)
15.40 (.607)
11.90 (.469)
2
50.00
(1.969)
M IN .
18 .4 0 (.724 )
M A X 3
14.40 (.566)
12.40 (.448)
3
33 0.00
(13.000)
M A X .
13 .2 0 ( .51 9)
12 .8 0 ( .50 4)
NOTES:
1 CONFORMS T O E IA -48 1 -1
2 INCLUDES F LANGE DISTORTION @ O UTER EDGE
3 DIMENSIONS MEASURED @ HUB
4 CONTROLLING DIMENSIO N : METRIC
1
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
http://www.irf.com/ Data and specifications subject to change without notice. 8/97