APTM100A13DG
APTM100A13DG
Rev 2 Decembe
, 2006
www.microsemi.com 2 - 6
All ratings @ Tj = 25°C unless otherwise specified
Electrical Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
VGS = 0V,VDS= 1000V Tj = 25°C 600 µA
IDSS Zero Gate Voltage Drain Current VGS = 0V,VDS= 800V Tj = 125°C 2
mA
RDS(on) Drain – Source on Resistance VGS = 10V, ID = 32.5A 130 156
mΩ
VGS(th) Gate Threshold Voltage VGS = VDS, ID = 6mA 3 5 V
IGS S Gate – Source Leakage Current VGS = ±30 V, VDS = 0V ±450 nA
Dynamic Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
Cis s Input Capacitance 15.2
Coss Output Capacitance 2.6
Crss Reverse Transfer Capacitance
VGS = 0V
VDS = 25V
f = 1MHz 0.42
nF
Qg Total gate Charge 562
Qgs Gate – Source Charge 75
Qgd Gate – Drain Charge
VGS = 10V
VBus = 500V
ID = 65A 363
nC
Td(on) Tur n-on Delay Ti me 9
Tr Rise Time 9
Td(off) Turn-off Delay Time 50
Tf Fall Time
Inductive switching @ 125°C
VGS = 15V
VBus = 667V
ID = 65A
RG = 0.5Ω 24
ns
Eon Turn-on Switching Energy 2.13
Eoff Turn-off Switching Energy
Inductive switching @ 25°C
VGS = 15V, VBu s = 667V
ID = 65A, RG = 0.5Ω 0.46 mJ
Eon Turn-on Switching Energy 4.4
Eoff Turn-off Switching Energy
Inductive switching @ 125°C
VGS = 15V, VBu s = 667V
ID = 65A, RG = 0.5Ω 0.57 mJ
Series diode ratings and characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
VRRM Maximum Repetitive Reverse Voltage 1200 V
Tj = 25°C 150
IRM Maximum Reverse Leakage Current VR=1200V Tj = 125°C 600
µA
IF DC Forward Current Tc = 100°C 120 A
IF = 120A 2.5 3
IF = 240A 3 VF Diode Forward Voltage
IF = 120A Tj = 125°C 1.8
V
Tj = 25°C 265
trr Reverse Recovery Time Tj = 125°C 350 ns
Tj = 25°C 1120
Qrr Reverse Recovery Charge
IF = 120A
VR = 800V
di/dt = 400A/µs
Tj = 125°C 5800 nC