Revision 4 Actel's SmartFusion Intelligent Mixed Signal FPGAs Microcontroller Subsystem (MSS) * * * * * * * * * * * * (R) Hard 100 MHz 32-Bit ARM CortexTM-M3 - 1.25 DMIPS/MHz Throughput from Zero Wait State Memory - Memory Protection Unit (MPU) - Single Cycle Multiplication, Hardware Divide - JTAG Debug (4 wires), Serial Wire Debug (SWD, 2 wires), and Single Wire Viewer (SWV) Interfaces Internal Memory - Embedded Nonvolatile Flash Memory (eNVM), 128 Kbytes to 512 Kbytes - Embedded High-Speed SRAM (eSRAM), 16 Kbytes to 64 Kbytes, Implemented in 2 Physical Blocks to Enable Simultaneous Access from 2 Different Masters Multi-Layer AHB Communications Matrix - Provides up to 16 Gbps of On-Chip Memory Bandwidth,1 Allowing Multi-Master Schemes 10/100 Ethernet MAC with RMII Interface2 Programmable External Memory Controller, Which Supports: - Asynchronous Memories - NOR Flash, SRAM, PSRAM - Synchronous SRAMs Two I2C Peripherals Two 16550 Compatible UARTs Two SPI Peripherals Two 32-Bit Timers 32-Bit Watchdog Timer 8-Channel DMA Controller to Offload the Cortex-M3 from Data Transactions Clock Sources - 32 KHz to 20 MHz Main Oscillator - Battery-Backed 32 KHz Low Power Oscillator with Real-Time Counter (RTC) - 100 MHz Embedded RC Oscillator; 1% Accurate - Embedded Analog PLL with 4 Output Phases (0, 90, 180, 270) High-Performance FPGA * * * * * Based on Actel's proven ProASIC(R)3 FPGA Fabric Low Power, Firm-Error Immune 130-nm, 7-Layer Metal, Flash-Based CMOS Process Nonvolatile, Live at Power-Up, Retains Program When Powered Off 350 MHz System Performance Embedded SRAMs and FIFOs - Variable Aspect Ratio 4,608-Bit SRAM Blocks - x1, x2, x4, x9, and x18 Organizations - True Dual-Port SRAM (excluding x18) * * * - Programmable Embedded FIFO Control Logic Secure ISP with 128-Bit AES via JTAG FlashLock(R) to Secure FPGA Contents Five Clock Conditioning Circuits (CCCs) with up to 2 Integrated Analog PLLs - Phase Shift, Multiply/Divide, and Delay Capabilities - Frequency: Input 1.5-350 MHz, Output 0.75 to 350 MHz Programmable Analog Analog Front-End (AFE) * * * * * Up to Three 12-Bit SAR ADCs - 500 Ksps in 12-Bit Mode - 550 Ksps in 10-Bit Mode - 600 Ksps in 8-Bit Mode Internal 2.56 V Reference or Optional External Reference One First-Order DAC (sigma-delta) per ADC - 12-Bit 500 Ksps Update Rate Up to 5 High-Performance Analog Signal Conditioning Blocks (SCB) per Device, Each Including: - Two High-Voltage Bipolar Voltage Monitors (with 4 input ranges from 2.5 V to -11.5/+14 V) with 1% Accuracy - High Gain Current Monitor, Differential Gain = 50, up to 14 V Common Mode - Temperature Monitor (Resolution = 1/4C in 12-Bit Mode; Accurate from -55C to 150C) Up to Ten High-Speed Voltage Comparators (tpd = 15 ns) Analog Compute Engine (ACE) * * * * Offloads Cortex-M3-Based MSS from Analog Initialization and Processing of ADC, DAC, and SCBs Sample Sequence Engine for ADC and DAC Parameter Set-Up Post-Processing Engine for Functions such as LowPass Filtering and Linear Transformation Easily Configured via GUI in Libero(R) Integrated Design (IDE) Software I/Os and Operating Voltage * * * * FPGA I/Os - LVDS, PCI, PCI-X, up to 24 mA IOH/IOL - Up to 350 MHz MSS I/Os - Schmitt Trigger, up to 6 mA IOH, 8 mA IOL - Up to 180 MHz Single 3.3 V Power Supply with On-Chip 1.5 V Regulator External 1.5 V Is Allowed by Bypassing Regulator (digital VCC = 1.5 V for FPGA and MSS, analog VCC = 3.3 V and 1.5 V) 1 Theoretical maximum 2 A2F200 and larger devices September 2010 (c) 2010 Actel Corporation I Actel's SmartFusion Intelligent Mixed Signal FPGAs SmartFusion Family Product Table A2F0601 A2F200 A2F500 System Gates 60,000 200,000 500,000 Tiles (D-flip-flops) 1,536 4,608 11,520 8 8 24 Flash (Kbytes) 128 256 512 SRAM (Kbytes) 16 64 64 SmartFusion Device FPGA Fabric RAM Blocks (4,608 bits) Microcontroller Subsystem (MSS) Cortex-M3 with memory protection unit (MPU) 10/100 Ethernet MAC Yes No External Memory Controller (EMC) 24-bit address,16-bit data DMA 8 Ch I2C 2 SPI 2 16550 UART 2 32-Bit Timer 2 PLL Programmable Analog Yes 1 32 KHz Low Power Oscillator 1 100 MHz On-Chip RC Oscillator 1 Main Oscillator (32 KHz to 20 MHz) 1 1 23 ADCs (8-/10-/12-bit SAR) 1 2 34 DACs (12-bit sigma-delta) 1 2 34 Signal Conditioning Blocks (SCBs) 1 4 54 Comparators2 2 8 104 Current Monitors2 1 4 54 Temperature Monitors2 1 4 54 Bipolar High Voltage Monitors2 2 8 104 Notes: 1. Under definition; subject to change. 2. These functions share I/O pins and may not all be available at the same time. See the Analog Front-End Overview section in the SmartFusion Programmable Analog User's Guide for details. 3. Two PLLs are available in CS288 and FG484 (one PLL in FG256). 4. Available on FG484 only. FG256 and CS288 packages offer the same programmable analog capabilities as A2F200. II R ev i si o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Package I/Os: MSS + FPGA I/Os Device A2F060 Package FG256 CS288 FG256 FG484 CS288 FG256 FG484 Direct Analog Input 6 8 8 8 8 8 12 Total Analog Input 10 24 24 24 24 24 32 Total Analog Output 1 2 2 2 2 2 3 MSS I/Os 25 31 25 41 31 25 41 FPGA I/Os 66 78 66 94 78 66 128 Total I/Os 102 135 117 161 135 117 204 1,2 A2F200 A2F500 Notes: 1. 16 MSS I/Os are multiplexed and can be used as FPGA I/Os, if not needed for MSS. These I/Os support Schmitt triggers and support only LVTTL and LVCMOS (1.5 / 1.8 / 2.5, 3.3 V) standards. 2. 9 MSS I/Os are primarily for 10/100 Ethernet MAC and are also multiplexed and can be used as FPGA I/Os if Ethernet MAC is not used in a design. These I/Os support Schmitt triggers and support only LVTTL and LVCMOS (1.5 / 1.8 / 2.5, 3.3 V standards. SmartFusion Device Status Device Status A2F060 Advance A2F200 Production A2F500 Production Revision 4 III Actel's SmartFusion Intelligent Mixed Signal FPGAs SmartFusion Block Diagram CortexTM-M3 Supervisor PLL OSC RC + JTAG NVIC PPB SysReg SysTick Microcontroller Subsystem ENVM WDT 32 KHz RTC 3V SWD Programmable Analog MPU - SPI 1 APB UART 1 EFROM I2C 1 IAP FPGA Fabric ESRAM S D I APB SPI 2 Timer1 UART 2 Timer2 I2C 2 AHB Bus Matrix PDMA APB EMC 10/100 EMAC SCB Temp. Mon. Volt Mon. (ABPS) Curr. Mon. Comparator Analog Compute Engine DAC (SDD) ADC Volt Mon. (ABPS) Curr. Mon. Comparator ADC Post Processing Engine ........ DAC (SDD) SRAM Legend: SDD - Sigma-delta DAC SCB - Signal conditioning block PDMA - Peripheral DMA IAP - In-application programming ABPS - Active bipolar prescaler WDT - Watchdog Timer SWD - Serial Wire Debug IV VersaTiles ............ SCB Temp. Mon. ............ .... Sample Sequencing Engine R ev i si o n 4 SRAM SRAM ........ SRAM SRAM SRAM Actel SmartFusion Intelligent Mixed Signal FPGAs SmartFusion System Architecture Bank 0 Bank 5 Bank 1 Embedded FlashROM (eFROM) ISP AES Decryption Charge Pumps Embedded NVM (eNVM) Bank 4 Embedded SRAM (eSRAM) SCB SCB ADC and DAC ADC and DAC SCB Bank 2 Cortex-M3 Microcontroller Subsystem (MSS) SCB Bank 3 Osc. CCC PLL/CCC MSS FPGA Analog Note: Architecture for A2F500 Revision 4 V Actel's SmartFusion Intelligent Mixed Signal FPGAs Product Ordering Codes A2F200 M3 F _ FG 1 G 484 Y I Application (junction temperature range) Blank = Commercial (0 to +85C) I = Industrial (-40 to +100C) ES = Engineering Silicon (room temperature only) Security Feature* Y = Device Includes License to Implement IP Based on the Cryptograhpy Research, Inc. (CRI) Patent Portfolio Package Lead Count 256 288 484 Lead-Free Packaging Options Blank = Standard Packaging G = RoHS-Compliant (green) Packaging H = Halogen-Free Packaging Package Type FG = Fine Pitch Ball Grid Array (1.0 mm pitch) CS = Chip Scale Package (0.5 mm pitch) Speed Grade Blank = 80 MHz MSS Speed; FPGA Fabric at Standard Speed -1 = 100 MHz MSS Speed; FPGA Fabric 15% Faster than Standard eNVM Size A = 8 Kbytes B = 16 Kbytes C = 32 Kbytes D = 64 Kbytes E = 128 Kbytes F = 256 Kbytes G = 512 Kbytes CPU Type M3 = Cortex-M3 Part Number SmartFusion Devices A2F060 = 60,000 System Gates A2F200 = 200,000 System Gates A2F500 = 500,000 System Gates Note: *Most devices in the SmartFusion family can be ordered with the Y suffix. Devices with a package size greater or equal to 5x5 mm are supported. Contact your local Actel sales representative for more information. Temperature Grade Offerings SmartFusion Devices A2F060 A2F200 A2F500 CS288 - C, I C, I FG256 C, I C, I C, I FG484 - C, I C, I Notes: 1. C = Commercial Temperature Range: 0C to 85C Junction 2. I = Industrial Temperature Range: -40C to 100C Junction VI R ev i si o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Table of Contents SmartFusion Device Family Overview Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1 General Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1 SmartFusion DC and Switching Characteristics General Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-1 Calculating Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-10 User I/O Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-21 VersaTile Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-57 Global Resource Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-61 RC Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-63 Main and Lower Power Crystal Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-64 Clock Conditioning Circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-65 FPGA Fabric SRAM and FIFO Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-67 Embedded Nonvolatile Memory Block (eNVM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-77 Embedded FlashROM (eFROM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-77 JTAG 1532 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-77 Programmable Analog Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-79 Serial Peripheral Interface (SPI) Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-89 Inter-Integrated Circuit (I2C) Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-91 SmartFusion Development Tools SmartFusion Ecosystem . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2 Software Integrated Design Environment (IDE) Choices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-3 Operating System and Middleware Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-3 SmartFusion Programming In-System Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . In-Application Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Typical Programming and Erase Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-5 4-6 4-7 4-7 Pin Descriptions Supply Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-1 User-Defined Supply Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-4 User Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-5 Special Function Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-6 JTAG Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-8 Microcontroller Subsystem (MSS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-10 Analog Front-End (AFE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-12 Analog Front-End Pin-Level Function Multiplexing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14 288-Pin CSP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-16 256-Pin FBGA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-25 484-Pin FBGA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-35 Revision 4 Table of Contents Datasheet Information List of Changes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-1 Datasheet Categories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-6 Actel Safety Critical, Life Support, and High-Reliability Applications Policy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-6 Revision 4 1 - SmartFusion Device Family Overview Introduction The Actel SmartFusionTM family of intelligent mixed signal FPGAs builds on the technology first introduced with the Fusion mixed signal FPGAs. SmartFusion devices are made possible by integrating FPGA technology with programmable high-performance analog and hardened ARM(R) CortexTM-M3 microcontroller blocks on a flash semiconductor process. The SmartFusion family takes its name from the fact that these three discrete technologies are integrated on a single chip, enabling the lowest cost of ownership and smallest footprint solution to you. General Description Microcontroller Subsystem (MSS) The MSS is composed of a 100 MHz Cortex-M3 processor and integrated peripherals, which are interconnected via a multi-layer AHB bus matrix (ABM). This matrix allows the Cortex-M3 processor, FPGA fabric master, Ethernet message authentication controller (MAC), when available, and peripheral DMA (PDMA) controller to act as masters to the integrated peripherals, FPGA fabric, embedded nonvolatile memory (eNVM), embedded synchronous RAM (eSRAM), external memory controller (EMC), and analog compute engine (ACE) blocks. SmartFusion devices of different densities offer various sets of integrated peripherals. Available peripherals include SPI, I2C, and UART serial ports, embedded FlashROM (EFROM), 10/100 Ethernet MAC, timers, phase-locked loops (PLLs), oscillators, real-time counters (RTC), and peripheral DMA controller (PDMA). Programmable Analog Analog Front-End (AFE) SmartFusion devices offer an enhanced analog front-end compared to Fusion devices. The successive approximation register analog-to-digital converters (SAR ADC) are similar to those found on Fusion devices. SmartFusion also adds first order sigma-delta digital-to-analog converters (SDD DAC). SmartFusion can handle multiple analog signals simultaneously with its signal conditioning blocks (SCBs). SCBs are made of a combination of active bipolar prescalers (ABPS), comparators, current monitors and temperature monitors. ABPS modules allow larger bipolar voltages to be fed to the ADC. Current monitors take the voltage across an external sense resistor and convert it to a voltage suitable for the ADC input range. Similarly, the temperature monitor reads the current through an external PNjunction (diode or transistor) and converts it internally for the ADC. The SCB also includes comparators to monitor fast signal thresholds without using the ADC. The output of the comparators can be fed to the analog compute engine or the ADC. Analog Compute Engine (ACE) The mixed signal blocks found in SmartFusion are controlled and connected to the rest of the system via a dedicated processor called the analog compute engine (ACE). The role of the ACE is to offload control of the analog blocks from the Cortex-M3, thus offering faster throughput or better power consumption compared to a system where the main processor is in charge of monitoring the analog resources. The ACE is built to handle sampling, sequencing, and post-processing of the ADCs, DACs, and SCBs. Revision 4 1 -1 SmartFusion Device Family Overview ProASIC3 FPGA Fabric The Actel SmartFusion family, based on the proven, low power, firm-error immune ProASIC(R)3 flash FPGA architecture, benefits from the advantages only flash-based devices offer: Reduced Cost of Ownership Advantages to the designer extend beyond low unit cost, high performance, and ease of use. Flashbased SmartFusion devices are live at power-up and do not need to be loaded from an external boot PROM at each power-up. On-board security mechanisms prevent access to the programming information and enable secure remote updates of the FPGA logic. Designers can perform secure remote in-system programming (ISP) to support future design iterations and critical field upgrades, with confidence that valuable IP cannot be compromised or copied. Secure ISP can be performed using the industry standard AES algorithm with MAC data authentication on the device. Low Power Flash-based SmartFusion devices exhibit power characteristics similar to those of an ASIC, making them an ideal choice for power-sensitive applications. With SmartFusion devices, there is no power-on current and no high current transition, both of which are common with SRAM-based FPGAs. SmartFusion devices also have low dynamic power consumption and support both low power standby mode and very low power sleep mode, offering further power savings. Security As the nonvolatile, flash-based SmartFusion family requires no boot PROM, there is no vulnerable external bitstream. SmartFusion devices incorporate FlashLock(R), which provides a unique combination of reprogrammability and design security without external overhead, advantages that only an FPGA with nonvolatile flash programming can offer. SmartFusion devices utilize a 128-bit flash-based key lock and a separate AES key to secure programmed IP and configuration data. The FlashROM data in Fusion devices can also be encrypted prior to loading. Additionally, the flash memory blocks can be programmed during runtime using the AES128 block cipher encryption standard (FIPS Publication 192). SmartFusion devices with AES-based security allow for secure remote field updates over public networks, such as the Internet, and ensure that valuable IP remains out of the hands of system overbuilders, system cloners, and IP thieves. As an additional security measure, the FPGA configuration data of a programmed Fusion device cannot be read back, although secure design verification is possible. During design, the user controls and defines both internal and external access to the flash memory blocks. Security, built into the FPGA fabric, is an inherent component of the SmartFusion family. The flash cells are located beneath seven metal layers, and many device design and layout techniques have been used to make invasive attacks extremely difficult. SmartFusion with FlashLock and AES security is unique in being highly resistant to both invasive and noninvasive attacks. Your valuable IP is protected, making secure remote ISP possible. A SmartFusion device provides the most impenetrable security for programmable logic designs. Single Chip Flash-based FPGAs store their configuration information in on-chip flash cells. Once programmed, the configuration data is an inherent part of the FPGA structure, and no external configuration data needs to be loaded at system power-up (unlike SRAM-based FPGAs). Therefore, flash-based SmartFusion FPGAs do not require system configuration components such as electrically erasable programmable read-only memories (EEPROMs) or microcontrollers to load device configuration data during power-up. This reduces bill-of-materials costs and PCB area, and increases system security and reliability. Live at Power-Up Flash-based SmartFusion devices are live at power-up (LAPU). LAPU SmartFusion devices greatly simplify total system design and reduce total system cost by eliminating the need for complex programmable logic devices (CPLDs). SmartFusion LAPU clocking (PLLs) replaces off-chip clocking resources. In addition, glitches and brownouts in system power will not corrupt the SmartFusion device flash configuration. Unlike SRAM-based FPGAs, the device will not have to be reloaded when system power is restored. This enables reduction or complete removal of expensive voltage monitor and 1-2 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs brownout detection devices from the PCB design. Flash-based SmartFusion devices simplify total system design and reduce cost and design risk, while increasing system reliability. Immunity to Firm Errors Firm errors occur most commonly when high-energy neutrons, generated in the atmosphere, strike a configuration cell of an SRAM FPGA. The energy of the collision can change the state of the configuration cell and thus change the logic, routing, or I/O configuration behavior in an unpredictable way. Another source of radiation-induced firm errors is alpha particles. For alpha radiation to cause a soft or firm error, its source must be in very close proximity to the affected circuit. The alpha source must be in the package molding compound or in the die itself. While low-alpha molding compounds are being used increasingly, this helps reduce but does not entirely eliminate alpha-induced firm errors. Firm errors are impossible to prevent in SRAM FPGAs. The consequence of this type of error can be a complete system failure. Firm errors do not occur in SmartFusion flash-based FPGAs. Once it is programmed, the flash cell configuration element of SmartFusion FPGAs cannot be altered by high energy neutrons and is therefore immune to errors from them. Recoverable (or soft) errors occur in the user data SRAMs of all FPGA devices. These can easily be mitigated by using error detection and correction (EDAC) circuitry built into the FPGA fabric. Revision 4 1 -3 2 - SmartFusion DC and Switching Characteristics General Specifications Operating Conditions Stresses beyond the operating conditions listed in Table 2-1 may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Absolute Maximum Ratings are stress ratings only; functional operation of the device at these or any other conditions beyond those listed under the Recommended Operating Conditions specified in Table 2-3 on page 2-3 is not implied. Table 2-1 * Absolute Maximum Ratings Symbol Parameter Limits Units VCC DC core supply voltage -0.3 to 1.65 V VJTAG JTAG DC voltage -0.3 to 3.75 V VPP Programming voltage -0.3 to 3.75 V VCCPLLx Analog power supply (PLL) -0.3 to 1.65 V VCCFPGAIOBx DC FPGA I/O buffer supply voltage -0.3 to 3.75 V VCCMSSIOBx DC MSS I/O buffer supply voltage -0.3 to 3.75 V VI I/O input voltage -0.3 V to 3.6 V V (when I/O hot insertion mode is enabled) -0.3 V to (VCCxxxxIOBx + 1 V) or 3.6 V, whichever voltage is lower (when I/O hotinsertion mode is disabled) VCC33A Analog clean 3.3 V supply to the analog circuitry -0.3 to 3.75 V VCC33ADCx Analog 3.3 V supply to ADC -0.3 to 3.75 V VCC33AP Analog clean 3.3 V supply to the charge pump -0.3 to 3.75 V VCC33SDDx Analog 3.3 V supply to the sigma-delta DAC -0.3 to 3.75 V VAREFx Voltage reference for ADC 1.0 to 3.75 V VCCRCOSC Analog supply to the integrated RC oscillator -0.3 to 3.75 V VDDBAT External battery supply -0.3 to 3.75 V VCCMAINXTAL Analog supply to the main crystal oscillator -0.3 to 3.75 V VCCLPXTAL Analog supply to the low power 32 kHz crystal oscillator -0.3 to 3.75 V VCCENVM Embedded nonvolatile memory supply VCC15A VCC15ADCx Analog 1.5 V supply to the analog circuitry Analog 1.5 V supply to the ADC -0.3 to 1.65 V -0.3 to 1.65 V -0.3 to 1.65 V Note: The device should be operated within the limits specified by the datasheet. During transitions, the input signal may undershoot or overshoot according to the limits shown in Table 2-5 on page 2-4. Revision 4 2 -1 SmartFusion DC and Switching Characteristics Table 2-2 * Analog Maximum Ratings Parameter Conditions Min. Max. Units -11.5 14.4 V -11 14 V GDEC[1:0] = 01 (10.24 V range) -11.5 12 V GDEC[1:0] = 10 (5.12 V range) -6 6 V GDEC[1:0] = 11 (2.56 V range) -3 3 V Absolute maximum -0.3 14.4 V Recommended -11 14 V -0.3 3 V TMB_DI_ON = 1 (direct ADC in) -0.3 3 V TMB_DI_ON = 0 (ADC isolated) -0.3 3 V -0.3 3 V -0.3 3.6 V ABPS[n] pad voltage (relative to ground) GDEC[1:0] = 00 (15.36 V range) Absolute maximum Recommended CM[n] pad voltage relative to ground) CMB_DI_ON = 0 (ADC isolated) COMP_EN = 0 (comparator off, for the associated even-numbered comparator) CMB_DI_ON = 0 (ADC isolated) COMP_EN = 1 (comparator on) TM[n] pad voltage (relative to ground) COMP_EN = 1(comparator on) TMB_DI_ON = 1 (direct ADC in) ADC[n] pad voltage (relative to ground) 2-2 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Table 2-3 * Recommended Operating Conditions Parameter1 Symbol TJ VCC Commercial Industrial Units 0 to +85 -40 to +100 C 1.425 to 1.575 1.425 to 1.575 V 1.425 to 3.6 1.425 to 3.6 V 3.15 to 3.45 3.15 to 3.45 V 0 to 3.6 0 to 3.6 V 1.425 to 1.575 1.425 to 1.575 V 1.425 to 1.575 1.425 to 1.575 V 1.7 to 1.9 1.7 to 1.9 V 2.5 V DC supply voltage 2.3 to 2.7 2.3 to 2.7 V 3.3 V DC supply voltage 3.0 to 3.6 3.0 to 3.6 V 2.375 to 2.625 2.375 to 2.625 V 3.0 to 3.6 3.0 to 3.6 V Junction temperature 2 1.5 V DC core supply voltage VJTAG JTAG DC voltage VPP Programming voltage Programming mode Operation3 VCCPLLx Analog power supply (PLL) VCCFPGAIOBx/ 1.5 V DC supply voltage VCCMSSIOBx4 1.8 V DC supply voltage LVDS differential I/O LVPECL differential I/O VCC33A5 Analog clean 3.3 V supply to the analog circuitry 3.15 to 3.45 3.15 to 3.45 V VCC33ADCx5 Analog 3.3 V supply to ADC 3.15 to 3.45 3.15 to 3.45 V VCC33AP5 Analog clean 3.3 V supply to the charge pump 3.15 to 3.45 3.15 to 3.45 V VCC33SDDx5 Analog 3.3 V supply to sigma-delta DAC 3.15 to 3.45 3.15 to 3.45 V VAREFx Voltage reference for ADC 2.527 to 3.3 2.527 to 3.3 V VCCRCOSC Analog supply to the integrated RC oscillator 3.15 to 3.45 3.15 to 3.45 V VDDBAT External battery supply 2.7 to 3.63 2.7 to 3.63 V VCCMAINXTAL5 Analog supply to the main crystal oscillator 3.15 to 3.45 3.15 to 3.45 V VCCLPXTAL5 Analog supply to the low power 32 KHz crystal oscillator 3.15 to 3.45 3.15 to 3.45 V VCCENVM Embedded nonvolatile memory supply 1.425 to 1.575 1.425 to 1.575 V VCC15A2 Analog 1.5 V supply to the analog circuitry 1.425 to 1.575 1.425 to 1.575 V VCC15ADCx2 Analog 1.5 V supply to the ADC 1.425 to 1.575 1.425 to 1.575 V Notes: 1. All parameters representing voltages are measured with respect to GND unless otherwise specified. 2. The following 1.5 V supplies should be connected together while following proper noise filtering practices: VCC, VCC15A, and VCC15ADCx. 3. VPP can be left floating during operation (not programming mode). 4. The ranges given here are for power supplies only. The recommended input voltage ranges specific to each I/O standard are given in Table 2-18 on page 2-25. VCCxxxxIOBx should be at the same voltage within a given I/O bank. 5. The following 3.3 V supplies should be connected together while following proper noise filtering practices: VCC33A, VCC33ADCx, VCC33AP, VCC33SDDx, VCCMAINXTAL, and VCCLPXTAL. Revision 4 2 -3 SmartFusion DC and Switching Characteristics Table 2-4 * FPGA and Embedded Flash Programming, Storage and Operating Limits Product Grade Commercial Industrial Storage Temperature Element Grade Programming Cycles Retention Min. TJ = 0C FPGA/FlashROM 500 20 years Min. TJ = 85C Embedded Flash < 1,000 20 years < 10,000 10 years < 15,000 5 years Min. TJ = -40C FPGA/FlashROM 500 20 years Min. TJ = 100C Embedded Flash < 1,000 20 years < 10,000 10 years < 15,000 5 years Table 2-5 * Overshoot and Undershoot Limits 1 VCCxxxxIOBx 2.7 V or less 3V Average VCCxxxxIOBx-GND Overshoot or Undershoot Duration as a Percentage of Clock Cycle2 Maximum Overshoot/ Undershoot2 10% 1.4 V 5% 1.49 V 10% 1.1 V 5% 1.19 V 3.3 V 10% 0.79 V 5% 0.88 V 3.6 V 10% 0.45 V 5% 0.54 V Notes: 1. Based on reliability requirements at 85C. 2. The duration is allowed at one out of six clock cycles. If the overshoot/undershoot occurs at one out of two cycles, the maximum overshoot/undershoot has to be reduced by 0.15 V. 3. This table does not provide PCI overshoot/undershoot limits. Power Supply Sequencing Requirement SmartFusion devices have an on-chip 1.5 V regulator, but usage of an external 1.5 V supply is also allowed while the on-chip regulator is disabled. In that case, the 3.3 V supplies (VCC33A, etc.) should be powered before 1.5 V (VCC, etc.) supplies. The 1.5 V supplies should be enabled only after 3.3 V supplies reach a value higher than 2.7 V. I/O Power-Up and Supply Voltage Thresholds for Power-On Reset (Commercial and Industrial) Sophisticated power-up management circuitry is designed into every SmartFusion(R) device. These circuits ensure easy transition from the powered-off state to the powered-up state of the device. The many different supplies can power up in any sequence with minimized current spikes or surges. In addition, the I/O will be in a known state through the power-up sequence. The basic principle is shown in Figure 2-1 on page 2-6. There are five regions to consider during power-up. SmartFusion I/Os are activated only if ALL of the following three conditions are met: 1. VCC and VCCxxxxIOBx are above the minimum specified trip points (Figure 2-1 on page 2-6). 2. VCCxxxxIOBx > VCC - 0.75 V (typical) 2-4 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 3. Chip is in the SoC Mode. VCCxxxxIOBx Trip Point: Ramping up: 0.6 V < trip_point_up < 1.2 V Ramping down: 0.5 V < trip_point_down < 1.1 V VCC Trip Point: Ramping up: 0.6 V < trip_point_up < 1.1 V Ramping down: 0.5 V < trip_point_down < 1 V VCC and VCCxxxxIOBx ramp-up trip points are about 100 mV higher than ramp-down trip points. This specifically built-in hysteresis prevents undesirable power-up oscillations and current surges. Note the following: * During programming, I/Os become tristated and weakly pulled up to VCCxxxxIOBx. * JTAG supply, PLL power supplies, and charge pump VPUMP supply have no influence on I/O behavior. PLL Behavior at Brownout Condition Actel recommends using monotonic power supplies or voltage regulators to ensure proper power-up behavior. Power ramp-up should be monotonic at least until VCC and VCCPLLx exceed brownout activation levels. The VCC activation level is specified as 1.1 V worst-case (see Figure 2-1 on page 2-6 for more details). When PLL power supply voltage and/or VCC levels drop below the VCC brownout levels (0.75 V 0.25 V), the PLL output lock signal goes low and/or the output clock is lost. Refer to the "Power-Up/-Down Behavior of Low Power Flash Devices" chapter of the ProASIC3 FPGA Fabric User's Guide for information on clock and lock recovery. Internal Power-Up Activation Sequence 1. Core 2. Input buffers Output buffers, after 200 ns delay from input buffer activation Revision 4 2 -5 SmartFusion DC and Switching Characteristics VCC = VCCxxxxIOBx + VT where VT can be from 0.58 V to 0.9 V (typically 0.75 V) VCC VCC = 1.575 V Region 4: I/O buffers are ON. I/Os are functional (except differential but slower because Region 1: I/O Buffers are OFF VCCxxxxIOBx Region 5: I/O buffers are ON and power supplies are within specification. I/Os meet the entire datasheet and timer specifications for speed, VIH / VIL , VOH / VOL , etc. below specification. For the same reason, input buffers do not meet VIH / VIL levels, and output buffers do not meet VOH / VOL levels. VCC = 1.425 V Region 2: I/O buffers are ON. I/Os are functional (except differential inputs) but slower because VCCxxxxIOBx / VCC are below specification. For the same reason, input buffers do not meet VIH / VIL levels, and output buffers do not meet VOH / VOL levels. Activation trip point: Va = 0.85 V 0.25 V Deactivation trip point: Vd = 0.75 V 0.25 V Region 1: I/O buffers are OFF Activation trip point: Va = 0.9 V 0.3 V Deactivation trip point: Vd = 0.8 V 0.3 V Figure 2-1 * 2-6 Region 3: I/O buffers are ON. I/Os are functional; I/O DC specifications are met, but I/Os are slower because the VCC is below specification. Min VCCxxxxIOBx datasheet specification voltage at a selected I/O standard; i.e., 1.425 V or 1.7 V or 2.3 V or 3.0 V I/O State as a Function of VCCxxxxIOBx and VCC Voltage Levels R e vi s i o n 4 VCCxxxxIOBx Actel SmartFusion Intelligent Mixed Signal FPGAs Thermal Characteristics Introduction The temperature variable in the Actel Designer software refers to the junction temperature, not the ambient, case, or board temperatures. This is an important distinction because dynamic and static power consumption will cause the chip's junction temperature to be higher than the ambient, case, or board temperatures. EQ 1 through EQ 3 give the relationship between thermal resistance, temperature gradient, and power. T J - A JA = ----------------P EQ 1 TJ - TB JB = -----------------P EQ 2 JC TJ - TC = -----------------P EQ 3 where JA = Junction-to-air thermal resistance JB = Junction-to-board thermal resistance JC = Junction-to-case thermal resistance TJ = Junction temperature TA = Ambient temperature TB = Board temperature (measured 1.0 mm away from the package edge) TC = Case temperature P = Total power dissipated by the device Table 2-6 * Package Thermal Resistance JA Die Size Product (mm) Still Air 1.0 m/s 2.5 m/s JC JB Units A2F200M3F-FG256 X = 4.0; Y = 5.6 33.7 30.0 28.3 9.3 24.8 C/W A2F200M3F-FG484 X = 5.10; Y = 7.3 21.8 18.2 16.7 7.7 16.8 C/W Revision 4 2 -7 SmartFusion DC and Switching Characteristics Theta-JA Junction-to-ambient thermal resistance (JA) is determined under standard conditions specified by JEDEC (JESD-51), but it has little relevance in actual performance of the product. It should be used with caution but is useful for comparing the thermal performance of one package to another. A sample calculation showing the maximum power dissipation allowed for the A2F200-FG484 package under forced convection of 1.0 m/s and 75C ambient temperature is as follows: T J(MAX) - T A(MAX) Maximum Power Allowed = ------------------------------------------- JA EQ 4 where JA = 19.00C/W (taken from Table 2-6 on page 2-7). TA = 75.00C - 75.00C = 1.3 W Maximum Power Allowed = 100.00C ---------------------------------------------------19.00C/W EQ 5 The power consumption of a device can be calculated using the Actel power calculator. The device's power consumption must be lower than the calculated maximum power dissipation by the package. If the power consumption is higher than the device's maximum allowable power dissipation, a heat sink can be attached on top of the case, or the airflow inside the system must be increased. Theta-JB Junction-to-board thermal resistance (JB) measures the ability of the package to dissipate heat from the surface of the chip to the PCB. As defined by the JEDEC (JESD-51) standard, the thermal resistance from junction to board uses an isothermal ring cold plate zone concept. The ring cold plate is simply a means to generate an isothermal boundary condition at the perimeter. The cold plate is mounted on a JEDEC standard board with a minimum distance of 5.0 mm away from the package edge. Theta-JC Junction-to-case thermal resistance (JC) measures the ability of a device to dissipate heat from the surface of the chip to the top or bottom surface of the package. It is applicable for packages used with external heat sinks. Constant temperature is applied to the surface in consideration and acts as a boundary condition. This only applies to situations where all or nearly all of the heat is dissipated through the surface in consideration. Calculation for Heat Sink For example, in a design implemented in an A2F200-FG484 package with 2.5 m/s airflow, the power consumption value using the power calculator is 3.00 W. The user-dependent Ta and Tj are given as follows: TJ = 100.00C TA = 70.00C From the datasheet: JA = 17.00C/W JC = 8.28C/W TJ - TA - 70C- = 1.76 W P = ------------------ = 100C ---------------------------------- JA 17.00 W EQ 6 2-8 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs The 1.76 W power is less than the required 3.00 W. The design therefore requires a heat sink, or the airflow where the device is mounted should be increased. The design's total junction-to-air thermal resistance requirement can be estimated by EQ 7: TJ - TA 100C - 70C- = 10.00C/W - = ---------------------------------- JA(total) = -----------------P 3.00 W EQ 7 Determining the heat sink's thermal performance proceeds as follows: JA(TOTAL) = JC + CS + SA EQ 8 where JA SA = 0.37C/W = Thermal resistance of the interface material between the case and the heat sink, usually provided by the thermal interface manufacturer = Thermal resistance of the heat sink in C/W SA = JA(TOTAL) - JC - CS EQ 9 SA = 13.33C/W - 8.28C/W - 0.37C/W = 5.01C/W A heat sink with a thermal resistance of 5.01C/W or better should be used. Thermal resistance of heat sinks is a function of airflow. The heat sink performance can be significantly improved with increased airflow. Carefully estimating thermal resistance is important in the long-term reliability of an Actel FPGA. Design engineers should always correlate the power consumption of the device with the maximum allowable power dissipation of the package selected for that device. Note: The junction-to-air and junction-to-board thermal resistances are based on JEDEC standard (JESD-51) and assumptions made in building the model. It may not be realized in actual application and therefore should be used with a degree of caution. Junction-to-case thermal resistance assumes that all power is dissipated through the case. Temperature and Voltage Derating Factors Table 2-7 * Temperature and Voltage Derating Factors for Timing Delays (normalized to TJ = 85C, worst-case VCC = 1.425 V) Array Voltage VCC (V) Junction Temperature (C) -40C 0C 25C 70C 85C 100C 1.425 0.86 0.91 0.93 0.98 1.00 1.03 1.500 0.81 0.86 0.88 0.93 0.95 0.97 1.575 0.78 0.83 0.85 0.90 0.91 0.94 Revision 4 2 -9 SmartFusion DC and Switching Characteristics Calculating Power Dissipation Quiescent Supply Current Table 2-8 * Quiescent Supply Current Characteristics Parameter VPP eNVM (reset/off) LPXTAL (enable/disable) 0 V1 3.3 V 0V N/A 0V 0V 0V Off Disable Disable 0 V1,2 3.3 V 0V N/A 0V 0V 0V Off Enable Disable 0V 0V 0V 3.3 V 0V 0V 0V Off Enable Disable 3.3 V 1.5 V N/A 3.3 V N/A N/A Reset Enable Disable 5 On Modes A2F200 1.5 V Domain MAINXTAL (enable/disable) VJTAG Standby mode VCCRCOSC Time Keeping mode VDDBAT Sleep VCC / VCC15A / VCC15ADCx VCCPLLx / VCOMPLAx VCCENVM Power-down VCC33A / VCC33ADCx VCC33AP / VCC33SDDx VCCMAINXTAL / VCCLPXTAL Modes and Power Supplies VCCxxxxIOBx VCCFPGAIOBx VCCMSSIOBx Power Supplies Configuration A2F500 3.3 V Domain3 1.5 V Domain 3.3 V Domain IDC14 Power-down N/A N/A IDC24 Sleep N/A N/A IDC3 Time Keeping mode N/A 10 A N/A 10 A IDC4 Standby mode 3 mA 1 mA TBD 1 mA Notes: 1. When using PU_N, the I/O supplies can be turned off during Sleep and Power-Down modes. Power to the I/O should be restored as the device transitions to SoC Mode by the same control that triggers PU_N. 2. When using RTC_MATCH to trigger transition to SoC mode, I/O supply may be restored by using the 1.5 V as a trigger, or by maintaining at least one I/O bank supply ON during Sleep mode to restore the supply to all other IO banks. 3. Current monitors and temperature monitors should not be used when Power-down and/or Sleep mode are required by the application. 4. Power mode and Sleep mode are consuming higher current than expected in the current version of silicon. These specifications will be updated when a new version of the silicon is available. 5. On means proper voltage is applied. Refer to Table 2-3 on page 2-3 for recommended operating conditions. 2- 10 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Power-Down and Sleep Mode Implementation VCCRCOSC, VJTAG, and VPP should be connected to ground during Power-Down and Sleep modes. Note that when VJTAG is not powered, the 1.5 V voltage regulator cannot be enabled through TRSTB. VCCRCOSC, VPP and VJTAG can be controlled through an external switch. Actel recommends ADG839, ADG849, or ADG841 as possible switches. Figure 2-2 shows the implementation for controlling VPP. The IN signal of the switch can be connected to PTBASE of the SmartFusion device. VCCRCOSC and VJTAG can be controlled in same manner. 3.3 V VPP Supply ADG841 SmartFusion VPP Pin of SmartFusion S IN External Pass Transister PTBASE 2N2222 PTEM Figure 2-2 * 1.5 V Implementation to Control VPP Power per I/O Pin Table 2-9 * Summary of I/O Input Buffer Power (per pin) - Default I/O Software Settings Applicable to FPGA I/O Banks VCCFPGAIOBx (V) Static Power PDC7 (mW) Dynamic Power PAC9 (W/MHz) 3.3 V LVTTL / 3.3 V LVCMOS 3.3 - 16.22 2.5 V LVCMOS 2.5 - 4.65 1.8 V LVCMOS 1.8 - 1.65 1.5 V LVCMOS (JESD8-11) 1.5 - 0.98 3.3 V PCI 3.3 - 17.64 3.3 V PCI-X 3.3 - 17.64 LVDS 2.5 2.26 0.95 LVPECL 3.3 5.72 1.63 Single-Ended Differential Revision 4 2- 11 SmartFusion DC and Switching Characteristics Table 2-10 * Summary of I/O Input Buffer Power (per pin) - Default I/O Software Settings Applicable to MSS I/O Banks VCCMSSIOBx (V) Static Power PDC7 (mW) Dynamic Power PAC9 (W/MHz) 3.3 V LVTTL / 3.3 V LVCMOS 3.3 - 17.21 3.3 V LVCMOS / 3.3 V LVCMOS - Schmitt trigger 3.3 - 20.00 2.5 V LVCMOS 2.5 - 5.55 2.5 V LVCMOS - Schmitt trigger 2.5 - 7.03 1.8 V LVCMOS 1.8 - 2.61 1.8 V LVCMOS - Schmitt trigger 1.8 - 2.72 1.5 V LVCMOS (JESD8-11) 1.5 - 1.98 1.5 V LVCMOS (JESD8-11) - Schmitt trigger 1.5 - 1.93 Single-Ended Table 2-11 * Summary of I/O Output Buffer Power (per pin) - Default I/O Software Settings* Applicable to FPGA I/O Banks CLOAD (pF) VCCFPGAIOBx (V) Static Power PDC8 (mW) Dynamic Power PAC10 (W/MHz) 3.3 V LVTTL / 3.3 V LVCMOS 35 3.3 - 468.67 2.5 V LVCMOS 35 2.5 - 267.48 1.8 V LVCMOS 35 1.8 - 149.46 1.5 V LVCMOS (JESD8-11) 35 1.5 - 103.12 3.3 V PCI 10 3.3 - 201.02 3.3 V PCI-X 10 3.3 - 201.02 LVDS - 2.5 7.74 89.71 LVPECL - 3.3 19.54 167.54 Single-Ended Differential Note: *Dynamic power consumption is given for standard load and software default drive strength and output slew. Table 2-12 * Summary of I/O Output Buffer Power (per pin) - Default I/O Software Settings Applicable to MSS I/O Banks CLOAD (pF) VCCMSSIOBx (V) Static Power PDC8 (mW)2 Dynamic Power PAC10 (W/MHz)3 3.3 V LVTTL / 3.3 V LVCMOS 10 3.3 - 155.65 2.5 V LVCMOS 10 2.5 - 88.23 1.8 V LVCMOS 10 1.8 - 45.03 1.5 V LVCMOS (JESD8-11) 10 1.5 - 31.01 Single-Ended 2- 12 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Power Consumption of Various Internal Resources Table 2-13 * Different Components Contributing to Dynamic Power Consumption in SmartFusion Devices Power Supply Parameter Definition Name Device Domain A2F200 A2F500 Units PAC1 Clock contribution of a Global Rib VCC 1.5 V 9.3 W/MHz PAC2 Clock contribution of a Global Spine VCC 1.5 V 0.8 W/MHz PAC3 Clock contribution of a VersaTile row VCC 1.5 V 0.81 W/MHz PAC4 Clock contribution of a VersaTile used as a sequential module VCC 1.5 V 0.11 W/MHz PAC5 First contribution of a VersaTile used as a sequential module VCC 1.5 V 0.07 W/MHz PAC6 Second contribution of a VersaTile used as a sequential module VCC 1.5 V 0.29 W/MHz PAC7 Contribution of a VersaTile used as a combinatorial module VCC 1.5 V 0.29 W/MHz PAC8 Average contribution of a routing net VCC 1.5 V 0.70 W/MHz PAC9 Contribution of an I/O input pin (standard VCCxxxxIOBx/VCC dependent) See Table 2-9 and Table 2-10 on page 2-12 PAC10 Contribution of an I/O output pin (standard VCCxxxxIOBx/VCC dependent) See Table 2-11 and Table 2-12 on page 2-12 PAC11 Average contribution of a RAM block during a read operation VCC 1.5 V 25.00 W/MHz PAC12 Average contribution of a RAM block during a write operation VCC 1.5 V 30.00 W/MHz PAC13 Dynamic Contribution for PLL VCC 1.5 V 2.60 W/MHz PAC15 Contribution of NVM block during a read operation (F < 33MHz) VCC 1.5 V 358.00 W/MHz PAC16 1st contribution of NVM block during a read operation (F > 33MHz) VCC 1.5 V 12.88 mW PAC17 2nd contribution of NVM block during a read operation (F > 33MHz) VCC 1.5 V 4.80 W/MHz PAC18 Main Crystal Oscillator contribution VCCMAINXTAL 3.3 V 1.98 mW PAC19a RC Oscillator contribution VCCRCOSC 3.3 V PAC19b RC Oscillator contribution VCC 1.5 V 3.00 mW PAC20a Analog Block Dynamic Power Contribution of the ADC VCC33ADCx 3.3 V 8.25 mW PAC20b Analog Block Dynamic Power Contribution of the ADC VCC15ADCx 1.5 V 3.00 mW PAC21 Low Power Crystal Oscillator contribution VCCLPXTAL 3.3 V 33.00 W PAC22 MSS Dynamic Power Contribution Running Drysthone at 100MHz1 VCC 1.5 V 67.50 mW PAC23 Temperature Monitor Power Contribution See Table 2-91 on page 2-80 - 1.23 mW - Revision 4 3.30 mW 2- 13 SmartFusion DC and Switching Characteristics Table 2-13 * Different Components Contributing to Dynamic Power Consumption in SmartFusion Devices Power Supply Parameter Definition Name Device Domain A2F200 A2F500 Units PAC24 Current Monitor Power Contribution See Table 2-90 on page 2-79 - 1.03 mW PAC25 ABPS Power Contribution See Table 2-93 on page 2-83 - 0.70 mW PAC26 Sigma-Delta DAC Power Contribution2 See Table 2-95 on page 2-85 - 0.59 mW PAC27 Comparator Power Contribution See Table 2-94 on page 2-84 - 0.96 mW PAC28 Voltage Regulator Power Contribution3 See Table 2-96 on page 2-87 - 36.30 mW Notes: 1. For a different use of MSS peripherals and resources, refer to SmartPower. 2. Assumes Input = Half Scale Operation mode. 3. Assumes 100 mA load on 1.5 V domain. 2- 14 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Table 2-14 * Different Components Contributing to the Static Power Consumption in SmartFusion Devices Power Supply Parameter Definition Device Name Domain A2F200 A2F500 Units VCC 1.5 V 1.50 mW 1.50 mW PDC1 Core static power contribution PDC2 Device static power contribution in Standby Mode See Table 2-8 on page 2-10 - PDC3 Device static power contribution in Time Keeping mode See Table 2-8 on page 2-10 3.3 V 0.00 mW PDC4 eNVM static power contribution See Table 2-8 on page 2-10 1.5 V 1.19 mW PDC7 Static contribution per input (standard dependent contribution) pin VCCxxxxIOBx/VCC See Table 2-9 and Table 2-10 on page 2-12. PDC8 Static contribution per input (standard dependent contribution) pin VCCxxxxIOBx/VCC See Table 2-11 and Table 2-12 on page 2-12. PDC9 Static contribution per PLL VCC 1.5 V 2.55 mW Table 2-15 * eNVM Dynamic Power Consumption Parameter Description Condition Min. Typ. Max. Units eNVM System eNVM array operating power Idle Read operation PNVMCTRL 795 A See Table 2-13 on page 2-13. Erase 900 A Write 900 A 20 W/MHz eNVM controller operating power Revision 4 2- 15 SmartFusion DC and Switching Characteristics Power Calculation Methodology This section describes a simplified method to estimate power consumption of an application. For more accurate and detailed power estimations, use the SmartPower tool in the Libero IDE software. The power calculation methodology described below uses the following variables: * The number of PLLs/CCCs as well as the number and the frequency of each output clock generated * The number of combinatorial and sequential cells used in the design * The internal clock frequencies * The number and the standard of I/O pins used in the design * The number of RAM blocks used in the design * The number of eNVM blocks used in the design * The analog block used in the design, including the temperature monitor, current monitor, ABPS, sigma-delta DAC, comparator, low power crystal oscillator, RC oscillator and the main crystal oscillator * Toggle rates of I/O pins as well as VersaTiles--guidelines are provided in Table 2-16 on page 2-20. * Enable rates of output buffers--guidelines are provided for typical applications in Table 2-17 on page 2-20. * Read rate and write rate to the memory--guidelines are provided for typical applications in Table 2-17 on page 2-20. * Read rate to the eNVM blocks The calculation should be repeated for each clock domain defined in the design. Methodology Total Power Consumption--PTOTAL SoC Mode, Standby Mode, and Time Keeping Mode. PTOTAL = PSTAT + PDYN PSTAT is the total static power consumption. PDYN is the total dynamic power consumption. Total Static Power Consumption--PSTAT SoC Mode PSTAT = PDC1 + (NeNVM-BLOCKS * PDC4) + (NINPUTS * PDC7) + (NOUTPUTS * PDC8) + (NPLLS * PDC9) NeNVM-BLOCKS is the number of eNVM blocks available in the device. NINPUTS is the number of I/O input buffers used in the design. NOUTPUTS is the number of I/O output buffers used in the design. NPLLS is the number of PLLs available in the device. Standby Mode PSTAT = PDC2 Time Keeping Mode PSTAT = PDC3 Total Dynamic Power Consumption--PDYN SoC Mode PDYN = PCLOCK + PS-CELL + PC-CELL + PNET + PINPUTS + POUTPUTS + PMEMORY + PPLL + PeNVM+ PXTL-OSC + PRC-OSC + PAB + PLPXTAL-OSC 2- 16 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Standby Mode PDYN = PRC-OSC + PLPXTAL-OSC Time Keeping Mode PDYN = PLPXTAL-OSC Global Clock Dynamic Contribution--PCLOCK SoC Mode PCLOCK = (PAC1 + NSPINE * PAC2 + NROW * PAC3 + NS-CELL * PAC4) * FCLK NSPINE is the number of global spines used in the user design--guidelines are provided in Table 2-16 on page 2-20. NROW is the number of VersaTile rows used in the design--guidelines are provided in Table 2-16 on page 2-20. FCLK is the global clock signal frequency. NS-CELL is the number of VersaTiles used as sequential modules in the design. Standby Mode and Time Keeping Mode PCLOCK = 0 W Sequential Cells Dynamic Contribution--PS-CELL SoC Mode PS-CELL = NS-CELL * (PAC5 + (1 / 2) * PAC6) * FCLK NS-CELL is the number of VersaTiles used as sequential modules in the design. When a multi-tile sequential cell is used, it should be accounted for as 1. 1 is the toggle rate of VersaTile outputs--guidelines are provided in Table 2-16 on page 2-20. FCLK is the global clock signal frequency. Standby Mode and Time Keeping Mode PS-CELL = 0 W Combinatorial Cells Dynamic Contribution--PC-CELL SoC Mode PC-CELL = NC-CELL* (1 / 2) * PAC7 * FCLK NC-CELL is the number of VersaTiles used as combinatorial modules in the design. 1 is the toggle rate of VersaTile outputs--guidelines are provided in Table 2-16 on page 2-20. FCLK is the global clock signal frequency. Standby Mode and Time Keeping Mode PC-CELL = 0 W Routing Net Dynamic Contribution--PNET SoC Mode PNET = (NS-CELL + NC-CELL) * (1 / 2) * PAC8 * FCLK NS-CELL is the number VersaTiles used as sequential modules in the design. NC-CELL is the number of VersaTiles used as combinatorial modules in the design. 1 is the toggle rate of VersaTile outputs--guidelines are provided in Table 2-16 on page 2-20. FCLK is the frequency of the clock driving the logic including these nets. Revision 4 2- 17 SmartFusion DC and Switching Characteristics Standby Mode and Time Keeping Mode PNET = 0 W I/O Input Buffer Dynamic Contribution--PINPUTS SoC Mode PINPUTS = NINPUTS * (2 / 2) * PAC9 * FCLK Where: NINPUTS is the number of I/O input buffers used in the design. 2 is the I/O buffer toggle rate--guidelines are provided in Table 2-16 on page 2-20. FCLK is the global clock signal frequency. Standby Mode and Time Keeping Mode PINPUTS = 0 W I/O Output Buffer Dynamic Contribution--POUTPUTS SoC Mode POUTPUTS = NOUTPUTS * (2 / 2) * 1 * PAC10 * FCLK Where: NOUTPUTS is the number of I/O output buffers used in the design. 2 is the I/O buffer toggle rate--guidelines are provided in Table 2-16 on page 2-20. 1 is the I/O buffer enable rate--guidelines are provided in Table 2-17 on page 2-20. FCLK is the global clock signal frequency. Standby Mode and Time Keeping Mode POUTPUTS = 0 W FPGA Fabric SRAM Dynamic Contribution--PMEMORY SoC Mode PMEMORY = (NBLOCKS * PAC11 * 2 * FREAD-CLOCK) + (NBLOCKS * PAC12 * 3 * FWRITE-CLOCK) Where: NBLOCKS is the number of RAM blocks used in the design. FREAD-CLOCK is the memory read clock frequency. 2 is the RAM enable rate for read operations--guidelines are provided in Table 2-17 on page 2-20. 3 the RAM enable rate for write operations--guidelines are provided in Table 2-17 on page 2-20. FWRITE-CLOCK is the memory write clock frequency. Standby Mode and Time Keeping Mode PMEMORY = 0 W PLL/CCC Dynamic Contribution--PPLL SoC Mode PPLL = PAC13 * FCLKOUT FCLKIN is the input clock frequency. FCLKOUT is the output clock frequency.1 Standby Mode and Time Keeping Mode 1.The PLL dynamic contribution depends on the input clock frequency, the number of output clock signals generated by the PLL, and the frequency of each output clock. If a PLL is used to generate more than one output clock, include each output clock in the formula output clock by adding its corresponding contribution (PAC14 * FCLKOUT product) to the total PLL contribution. 2- 18 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs PPLL = 0 W Embedded Nonvolatile Memory Dynamic Contribution--PeNVM SoC Mode The eNVM dynamic power consumption is a piecewise linear function of frequency. PeNVM = NeNVM-BLOCKS * 4 * PAC15 * FREAD-eNVM when FREAD-eNVM 33 MHz, PeNVM = NeNVM-BLOCKS * 4 *(PAC16 + PAC17 * FREAD-eNVM) when FREAD-eNVM > 33 MHz Where: NeNVM-BLOCKS is the number of eNVM blocks used in the design. 4 is the eNVM enable rate for read operations. Default is 0 (eNVM mainly in idle state). FREAD-eNVM is the eNVM read clock frequency. Standby Mode and Time Keeping Mode PeNVM = 0 W Main Crystal Oscillator Dynamic Contribution--PXTL-OSC SoC Mode PXTL-OSC = PAC18 Standby Mode PXTL-OSC = 0 W Time Keeping Mode PXTL-OSC = 0 W Low Power Oscillator Crystal Dynamic Contribution--PLPXTAL-OSC Operating, Standby, and Time Keeping Mode PLPXTAL-OSC = PAC21 RC Oscillator Dynamic Contribution--PRC-OSC SoC Mode PRC-OSC = PAC19A + PAC19B Standby Mode and Time Keeping Mode PRC-OSC = 0 W Analog System Dynamic Contribution--PAB SoC Mode PAB = PAC23 * NTM + PAC24 * NCM + PAC25 * NABPS + PAC26 * NSDD + PAC27 * NCOMP + PADC * NADC + PVR Where: NCM is the number of current monitor blocks NTM is the number of temperature monitor blocks NSDD is the number of sigma-delta DAC blocks NABPS is the number of ABPS blocks NADC is the number of ADC blocks NCOMP is the number of comparator blocks PVR= PAC28 PADC= PAC20A + PAC20B Revision 4 2- 19 SmartFusion DC and Switching Characteristics Guidelines Toggle Rate Definition A toggle rate defines the frequency of a net or logic element relative to a clock. It is a percentage. If the toggle rate of a net is 100%, this means that the net switches at half the clock frequency. Below are some examples: * The average toggle rate of a shift register is 100%, as all flip-flop outputs toggle at half of the clock frequency. * The average toggle rate of an 8-bit counter is 25%: - Bit 0 (LSB) = 100% - Bit 1 = 50% - Bit 2 = 25% - ... - Bit 7 (MSB) = 0.78125% - Average toggle rate = (100% + 50% + 25% + 12.5% + . . . 0.78125%) / 8. Enable Rate Definition Output enable rate is the average percentage of time during which tristate outputs are enabled. When non-tristate output buffers are used, the enable rate should be 100%. Table 2-16 * Toggle Rate Guidelines Recommended for Power Calculation Component 1 2 Definition Guideline Toggle rate of VersaTile outputs 10% I/O buffer toggle rate 10% Table 2-17 * Enable Rate Guidelines Recommended for Power Calculation Component 2- 20 Definition Guideline 1 I/O output buffer enable rate 2 FPGA fabric operations read 12.5% 3 FPGA fabric SRAM enable rate for write operations 12.5% 4 eNVM enable rate for read operations < 5% SRAM Toggle rate of the logic driving the output buffer enable rate R e visio n 4 for Actel SmartFusion Intelligent Mixed Signal FPGAs User I/O Characteristics Timing Model I/O Module (Non-Registered) Combinational Cell Combinational Cell Y LVPECL (applicable to Advanced I/O banks only) Y tPD = 0.57 ns tPD = 0.49 ns tDP = 1.38 ns I/O Module (Non-Registered) Combinational Cell Y LVTTL Output drive strength = 12 mA High slew rate tDP = 2.71 ns (Advanced I/O Banks) tPD = 0.89 ns I/O Module (Non-Registered) Combinational Cell I/O Module (Registered) Y LVTTL Output drive strength = 8 mA High slew rate tDP = 3.76 ns (Advanced I/O Banks) tPY = 1.08 ns LVPECL (Applicable to Advanced I/O Banks only) D tPD = 0.51 ns Q I/O Module (Non-Registered) Combinational Cell Y tICLKQ = 0.24 ns tISUD = 0.27 ns LVCMOS 1.5 V Output drive strength = 4 mA High slew rate tDP = 4.08 ns (Advanced I/O Banks) tPD = 0.48 ns Input LVTTL Clock Register Cell tPY = 0.78 ns (Advanced I/O Banks) D Combinational Cell Y Q I/O Module (Non-Registered) LVDS, BLVDS, M-LVDS (Applicable for Advanced I/O Banks only) Figure 2-3 * D Q D tPD = 0.47 ns tCLKQ = 0.56 ns tSUD = 0.44 ns tPY = 1.27 ns I/O Module (Registered) Register Cell Q LVTTL 3.3 V Output drive strength = 12 mA High slew rate tDP = 2.71 ns (Advanced I/O Banks) tCLKQ = 0.56 ns tSUD = 0.44 ns tOCLKQ = 0.60 ns tOSUD = 0.32 ns Input LVTTL Clock Input LVTTL Clock tPY = 0.78 ns (Advanced I/O Banks) tPY = 0.78 ns (Advanced I/O Banks) Timing Model Operating Conditions: -1 Speed, Commercial Temperature Range (TJ = 85C), Worst Case VCC = 1.425 V Revision 4 2- 21 SmartFusion DC and Switching Characteristics tPY tDIN D PAD Q DIN Y CLK tPY = MAX(tPY(R), tPY(F)) tDIN = MAX(tDIN(R), tDIN(F)) To Array I/O Interface VIH PAD Vtrip Vtrip VIL VCC 50% 50% Y GND tPY (R) tPY (F) VCC 50% DIN GND Figure 2-4 * 2- 22 50% tDOUT tDOUT (R) (F) Input Buffer Timing Model and Delays (example) R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs tDOUT tDP D Q D PAD DOUT Std Load CLK From Array tDP = MAX(tDP(R), tDP(F)) tDOUT = MAX(tDOUT(R), tDOUT(F)) I/O Interface tDOUT (R) D 50% tDOUT VCC (F) 50% 0V VCC DOUT 50% 50% 0V VOH Vtrip Vtrip PAD tDP (F) tDP (R) Figure 2-5 * VOL Output Buffer Model and Delays (example) Revision 4 2- 23 SmartFusion DC and Switching Characteristics tEOUT D Q CLK E tZL, tZH, tHZ, tLZ, tZLS, tZHS EOUT D Q PAD DOUT CLK D tEOUT = MAX(tEOUT(r), tEOUT(f)) I/O Interface VCC D VCC 50% E 50% tEOUT (F) tEOUT (R) VCC 50% EOUT 50% tZL PAD 50% tHZ Vtrip tZH VCCxxxxIOBx 90% VCCxxxxIOBx Vtrip VOL VCC D VCC E 50% EOUT PAD tEOUT (R) 2- 24 tEOUT (F) VCC 50% 50% 50% tZLS tZHS VOH Vtrip Figure 2-6 * 50% 50% tLZ Vtrip VOL Tristate Output Buffer Timing Model and Delays (example) R e visio n 4 10% VCCxxxxIOBx Actel SmartFusion Intelligent Mixed Signal FPGAs Overview of I/O Performance Summary of I/O DC Input and Output Levels - Default I/O Software Settings Table 2-18 * Summary of Maximum and Minimum DC Input and Output Levels Applicable to Commercial Conditions--Software Default Settings Applicable to FPGA I/O Banks VIL VIH VOL VOH IOL1 IOH1 mA mA Drive Slew Min. Strgth. Rate V Max. V Min. V Max. V Max. V Min. V 3.3 V LVTTL / 12 mA High -0.3 3.3 V LVCMOS 0.8 2 3.6 0.4 2.4 0.7 1.7 I/O Standard 2.5 V LVCMOS 12 mA High -0.3 12 12 3.6 0.7 1.7 12 12 1.8 V LVCMOS 12 mA High -0.3 0.35 * 0.65* VCCxxxxIOBx VCCxxxxIOBx 3.6 0.45 VCCxxxxIOBx - 0.45 12 12 1.5 V LVCMOS 12 mA High -0.3 0.35 * 0.65* VCCxxxxIOBx VCCxxxxIOBx 3.6 0.25 * 0.75* VCCxxxxIOBx VCCxxxxIOBx 12 12 3.3 V PCI Per PCI specifications 3.3 V PCI-X Per PCI-X specifications Notes: 1. Currents are measured at 85C junction temperature. 2. Output slew rate can be extracted by the IBIS Models. Table 2-19 * Summary of Maximum and Minimum DC Input and Output Levels Applicable to Commercial Conditions--Software Default Settings Applicable to MSS I/O Banks VIL I/O Standard Drive Slew Min. Strgth. Rate V VIH VOL VOH IOL1 IOH1 mA mA Max. V Min. V Max. V Max. V Min. V 3.3 V LVTTL / 8 mA 3.3 V LVCMOS High -0.3 0.8 2 3.6 0.4 2.4 8 8 2.5 V LVCMOS 8 mA High -0.3 0.7 1.7 3.6 0.7 1.7 8 8 1.8 V LVCMOS 4 mA High -0.3 0.35* VCCxxxxIOBx 0.65* VCCxxxxIOBx 3.6 0.45 VCCxxxxIOBx - 0.45 4 4 1.5 V LVCMOS 2 mA High -0.3 0.35* VCCxxxxIOBx 0.65* VCCxxxxIOBx 3.6 0.25* 0.75* VCCxxxxIOBx VCCxxxxIOBx 2 2 Notes: 1. Currents are measured at 85C junction temperature. 2. Output slew rate can be extracted by the IBIS Models. Revision 4 2- 25 SmartFusion DC and Switching Characteristics Table 2-20 * Summary of Maximum and Minimum DC Input Levels Applicable to Commercial Conditions in all I/O Bank Types Commercial IIL IIH DC I/O Standards A A 3.3 V LVTTL / 3.3 V LVCMOS 15 15 2.5 V LVCMOS 15 15 1.8 V LVCMOS 15 15 1.5 V LVCMOS 15 15 3.3 V PCI 15 15 3.3 V PCI-X 15 15 Summary of I/O Timing Characteristics - Default I/O Software Settings Table 2-21 * Summary of AC Measuring Points Applicable to All I/O Bank Types Measuring Trip Point (Vtrip) Standard 3.3 V LVTTL / 3.3 V LVCMOS 1.4 V 2.5 V LVCMOS 1.2 V 1.8 V LVCMOS 0.90 V 1.5 V LVCMOS 0.75 V 3.3 V PCI 0.285 * VCCxxxxIOBx (RR) 0.615 * VCCxxxxIOBx (FF) 3.3 V PCI-X 0.285 * VCCxxxxIOBx (RR) 0.615 * VCCxxxxIOBx (FF) LVDS Cross point LVPECL Cross point Table 2-22 * I/O AC Parameter Definitions Parameter 2- 26 Parameter Definition tDP Data to pad delay through the output buffer tPY Pad to data delay through the input buffer tDOUT Data to output buffer delay through the I/O interface tEOUT Enable to output buffer tristate control delay through the I/O interface tDIN Input buffer to data delay through the I/O interface tHZ Enable to pad delay through the output buffer--High to Z tZH Enable to pad delay through the output buffer--Z to High tLZ Enable to pad delay through the output buffer--Low to Z tZL Enable to pad delay through the output buffer--Z to Low tZHS Enable to pad delay through the output buffer with delayed enable--Z to High tZLS Enable to pad delay through the output buffer with delayed enable--Z to Low R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 0.50 2.57 0.03 1.01 0.32 2.62 2.35 2.58 2.72 4.33 4.06 ns 1.8 V LVCMOS 12 mA High 35 - 0.50 3.01 0.03 0.93 0.32 3.01 3.01 2.76 2.70 4.73 4.73 ns 1.5 V LVCMOS 12 mA High 35 - 0.50 3.58 0.03 1.10 0.32 3.49 3.58 2.93 2.73 5.20 5.30 ns 10 251 0.50 2.06 0.03 0.66 0.32 2.09 1.50 2.46 2.75 3.81 3.21 ns 1 0.50 2.06 0.03 0.64 0.32 2.09 1.50 2.46 2.75 3.81 3.21 ns 3.3 V PCI 3.3 V PCI-X Per PCI spec High Units - tZHS (ns) 35 tZLS (ns) High tHZ (ns) 12 mA tLZ (ns) 2.5 V LVCMOS tZH (ns) 0.50 2.56 0.03 0.90 0.32 2.60 1.97 2.50 2.82 4.32 3.68 ns tZL (ns) - tEOUT (ns) 35 tPY (ns) External Resistor () High tDIN (ns) Capacitive Load (pF) 12 mA tDP (ns) Slew Rate 3.3 V LVTTL / 3.3 V LVCMOS I/O Standard tDOUT (ns) Drive Strength Table 2-23 * Summary of I/O Timing Characteristics--Software Default Settings -1 Speed Grade, Worst Commercial-Case Conditions: TJ = 85C, Worst Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx (per standard) Applicable to FPGA I/O Banks Per PCI-X spec High 10 25 LVDS 24 mA High - - 0.50 1.44 0.03 1.27 - - - - - - - ns LVPECL 24 mA High - - 0.50 1.38 0.03 1.08 - - - - - - - ns Notes: 1. Resistance is used to measure I/O propagation delays as defined in PCI specifications. See Figure 2-11 on page 2-40 for connectivity. This resistor is not required during normal operation. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 0.03 0.78 1.09 0.37 1.96 1.55 1.83 2.04 ns 2.5 V LVCMOS 8 mA High 10 - 0.50 1.96 0.03 0.99 1.16 0.37 2.00 1.82 1.82 1.93 ns 1.8 V LVCMOS 4 mA High 10 - 0.50 2.31 0.03 0.91 1.37 0.37 2.35 2.27 1.84 1.87 ns 1.5 V LVCMOS 2 mA High 10 - 0.50 2.70 0.03 1.07 1.55 0.37 2.75 2.67 1.87 1.85 ns Units 1.92 tHZ (ns) tDIN (ns) 0.50 tLZ (ns) tDP (ns) - tZH (ns) tDOUT (ns) 10 tZL (ns) External Resistor High tEO UT (ns) Capacitive Load (pF) 8 mA tPYS (ns) Slew Rate 3.3 V LVTTL / 3.3 V LVCMOS I/O Standard tPY (ns) Drive Strength Table 2-24 * Summary of I/O Timing Characteristics--Software Default Settings -1 Speed Grade, Worst Commercial-Case Conditions: TJ = 85C, Worst Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx (per standard) Applicable to MSS I/O Banks Notes: 1. Resistance is used to measure I/O propagation delays as defined in PCI specifications. See Figure 2-11 on page 2-40 for connectivity. This resistor is not required during normal operation. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Revision 4 2- 27 SmartFusion DC and Switching Characteristics Detailed I/O DC Characteristics Table 2-25 * Input Capacitance Symbol Definition Conditions Min. Max. Units CIN Input capacitance VIN = 0, f = 1.0 MHz 8 pF CINCLK Input capacitance on the clock pin VIN = 0, f = 1.0 MHz 8 pF Table 2-26 * I/O Output Buffer Maximum Resistances1 Applicable to FPGA I/O Banks Standard 3.3 V LVTTL / 3.3 V LVCMOS 2.5 V LVCMOS 1.8 V LVCMOS 1.5 V LVCMOS 3.3 V PCI/PCI-X Drive Strength RPULL-DOWN ()2 RPULL-UP ()3 2 mA 100 300 4 mA 100 300 6 mA 50 150 8 mA 50 150 12 mA 25 75 16 mA 17 50 24 mA 11 33 2 mA 100 200 4 mA 100 200 6 mA 50 100 8 mA 50 100 12 mA 25 50 16 mA 20 40 24 mA 11 22 2 mA 200 225 4 mA 100 112 6 mA 50 56 8 mA 50 56 12 mA 20 22 16 mA 20 22 2 mA 200 224 4 mA 100 112 6 mA 67 75 8 mA 33 37 12 mA 33 37 Per PCI/PCI-X specification 25 75 Notes: 1. These maximum values are provided for information only. Minimum output buffer resistance values depend on VCCxxxxIOBx, drive strength selection, temperature, and process. For board design considerations and detailed output buffer resistances, use the corresponding IBIS models located on the Actel website at http://www.actel.com/download/ibis/default.aspx (also generated by the Actel Libero IDE toolset). 2. R(PULL-DOWN-MAX) = (VOLspec) / IOLspec 3. R(PULL-UP-MAX) = (VCCImax - VOHspec) / IOHspe c 2- 28 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Table 2-27 * I/O Output Buffer Maximum Resistances1 Applicable to MSS I/O Banks Drive Strength RPULL-DOWN ()2 RPULL-UP ()3 3.3 V LVTTL / 3.3 V LVCMOS 8mA 50 150 2.5 V LVCMOS 8 mA 50 100 1.8 V LVCMOS 4 mA 100 112 1.5 V LVCMOS 2 mA 200 224 Standard Notes: 1. These maximum values are provided for informational reasons only. Minimum output buffer resistance values depend on VCCxxxxIOBx, drive strength selection, temperature, and process. For board design considerations and detailed output buffer resistances, use the corresponding IBIS models located on the Actel website at http://www.actel.com/download/ibis/default.aspx. 2. R(PULL-DOWN-MAX) = (VOLspec) / IOLspec 3. R(PULL-UP-MAX) = (VCCImax - VOHspec) / IOHspe c Table 2-28 * I/O Weak Pull-Up/Pull-Down Resistances Minimum and Maximum Weak Pull-Up/Pull-Down Resistance Values R(WEAK PULL-UP)1 () R(WEAK PULL-DOWN)2 () VCCxxxxIOBx Min. Max. Min. Max. 3.3 V 10 k 45 k 10 k 45 k 2.5 V 11 k 55 k 12 k 74 k 1.8 V 18 k 70 k 17 k 110 k 1.5 V 19 k 90 k 19 k 140 k Notes: 1. R(WEAK PULL-DOWN-MAX) = (VOLspec) / I(WEAK PULL-DOWN-MIN) 2. R(WEAK PULL-UP-MAX) = (VCCImax - VOHspec) / I(WEAK PULL-UP-MIN) Revision 4 2- 29 SmartFusion DC and Switching Characteristics Table 2-29 * I/O Short Currents IOSH/IOSL Applicable to FPGA I/O Banks Drive Strength IOSL (mA)* IOSH (mA)* 2 mA 27 25 4 mA 27 25 6 mA 54 51 8 mA 54 51 12 mA 109 103 16 mA 127 132 24 mA 181 268 2 mA 18 16 4 mA 18 16 6 mA 37 32 8 mA 37 32 12 mA 74 65 16 mA 87 83 24 mA 124 169 2 mA 11 9 4 mA 22 17 6 mA 44 35 8 mA 51 45 12 mA 74 91 16 mA 74 91 2 mA 16 13 4 mA 33 25 6 mA 39 32 8 mA 55 66 12 mA 55 66 Per PCI/PCI-X specification 109 103 Drive Strength IOSL (mA)* IOSH (mA)* 3.3 V LVTTL / 3.3 V LVCMOS 8 mA 54 51 2.5 V LVCMOS 8 mA 37 32 1.8 V LVCMOS 4 mA 22 17 1.5 V LVCMOS 2 mA 16 13 3.3 V LVTTL / 3.3 V LVCMOS 2.5 V LVCMOS 1.8 V LVCMOS 1.5 V LVCMOS 3.3 V PCI/PCI-X Note: *TJ = 85C. Table 2-30 * I/O Short Currents IOSH/IOSL Applicable to MSS I/O Banks Note: *TJ = 85C 2- 30 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs The length of time an I/O can withstand IOSH/IOSL events depends on the junction temperature. The reliability data below is based on a 3.3 V, 12 mA I/O setting, which is the worst case for this type of analysis. For example, at 100C, the short current condition would have to be sustained for more than 2200 operation hours to cause a reliability concern. The I/O design does not contain any short circuit protection, but such protection would only be needed in extremely prolonged stress conditions. Table 2-31 * Duration of Short Circuit Event before Failure Temperature Time before Failure -40C > 20 years 0C > 20 years 25C > 20 years 70C 5 years 85C 2 years 100C 6 months Table 2-32 * Schmitt Trigger Input Hysteresis Hysteresis Voltage Value (typical) for Schmitt Mode Input Buffers Input Buffer Configuration Hysteresis Value (typical) 3.3 V LVTTL / LVCMOS / PCI / PCI-X (Schmitt trigger mode) 240 mV 2.5 V LVCMOS (Schmitt trigger mode) 140 mV 1.8 V LVCMOS (Schmitt trigger mode) 80 mV 1.5 V LVCMOS (Schmitt trigger mode) 60 mV Table 2-33 * I/O Input Rise Time, Fall Time, and Related I/O Reliability Input Buffer Input Rise/Fall Time (min.) Input Rise/Fall Time (max.) Reliability LVTTL/LVCMOS No requirement 10 ns * 20 years (100C) LVDS/B-LVDS/ M-LVDS/LVPEC L No requirement 10 ns * 10 years (100C) * The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the noise is low, then the rise time and fall time of input buffers can be increased beyond the maximum value. The longer the rise/fall times, the more susceptible the input signal is to the board noise. Actel recommends signal integrity evaluation/characterization of the system to ensure that there is no excessive noise coupling into input signals. Revision 4 2- 31 SmartFusion DC and Switching Characteristics Single-Ended I/O Characteristics 3.3 V LVTTL / 3.3 V LVCMOS Low-Voltage Transistor-Transistor Logic (LVTTL) is a general-purpose standard (EIA/JESD) for 3.3 V applications. It uses an LVTTL input buffer and push-pull output buffer. Table 2-34 * Minimum and Maximum DC Input and Output Levels Applicable to FPGA I/O Banks 3.3 V LVTTL / 3.3 V LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH mA mA Max. mA1 Max. mA1 IIL IIH Drive Strength Min. V Max. V Min. V Max. V Max. V Min. V 2 mA -0.3 0.8 2 3.6 0.4 2.4 2 2 27 25 15 15 4 mA -0.3 0.8 2 3.6 0.4 2.4 4 4 27 25 15 15 6 mA -0.3 0.8 2 3.6 0.4 2.4 6 6 54 51 15 15 8 mA -0.3 0.8 2 3.6 0.4 2.4 8 8 54 51 15 15 12 mA -0.3 0.8 2 3.6 0.4 2.4 12 12 109 103 15 15 16 mA -0.3 0.8 2 3.6 0.4 2.4 16 16 127 132 15 15 24 mA -0.3 0.8 2 3.6 0.4 2.4 24 24 181 268 10 10 IIL IIH A2 A2 Notes: 1. Currents are measured at 100C junction temperature and maximum voltage. 2. Currents are measured at 85C junction temperature. 3. Software default selection highlighted in gray. Table 2-35 * Minimum and Maximum DC Input and Output Levels Applicable to MSS I/O Banks 3.3 V LVTTL / 3.3 V LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH mA mA Max. mA1 Max. mA1 54 51 Drive Strength Min. V Max. V Min. V Max. V Max. V Min. V 8 mA -0.3 0.8 2 3.6 0.4 2.4 8 8 A2 A2 15 Notes: 1. Currents are measured at 100C junction temperature and maximum voltage. 2. Currents are measured at 85C junction temperature. 3. Software default selection highlighted in gray. R to VCCxxxxIOBx for tLZ / tZL / tZLS R=1K Test Point Test Point 35 pF Datapath R to GND for tHZ / tZH / tZHS 35 pF for tZH / tZHS / tZL / tZLS Enable Path 5 pF for tHZ / tLZ Figure 2-7 * AC Loading Table 2-36 * AC Waveforms, Measuring Points, and Capacitive Loads Input Low (V) 0 Input High (V) Measuring Point* (V) VREF (typ.) (V) CLOAD (pF) 3.3 1.4 - 35 Note: *Measuring point = Vtrip. See Table 2-21 on page 2-26 for a complete table of trip points. 2- 32 R e visio n 4 15 Actel SmartFusion Intelligent Mixed Signal FPGAs Timing Characteristics Table 2-37 * 3.3 V LVTTL / 3.3 V LVCMOS High Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 3.0 V Applicable to FPGA I/O Banks Drive Strength Speed Grade tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 4 mA -1 0.50 5.87 0.03 0.90 0.32 5.98 5.05 2.03 2.00 7.70 6.77 ns 8 mA -1 0.50 3.76 0.03 0.90 0.32 3.83 3.12 2.29 2.46 5.55 4.84 ns 12 mA -1 0.5 2.71 0.03 0.90 0.32 2.76 2.17 2.463 2.75 4.48 3.88 ns 16 mA -1 0.50 2.56 0.03 0.90 0.32 2.60 1.97 2.50 2.82 4.32 3.68 ns 24 mA -1 0.50 2.36 0.03 0.90 0.32 2.40 1.63 2.55 3.11 4.12 3.34 ns Notes: 1. Software default selection highlighted in gray. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-38 * 3.3 V LVTTL / 3.3 V LVCMOS Low Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 3.0 V Applicable to FPGA I/O Banks Drive Strength Speed Grade tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 4 mA -1 0.50 7.87 0.03 0.90 0.32 8.01 6.83 2.03 1.88 9.73 8.54 ns 8 mA -1 0.50 5.58 0.03 0.90 0.32 5.68 4.82 2.29 2.33 7.40 6.54 ns 12 mA -1 0.50 4.28 0.03 0.90 0.32 4.36 3.74 2.46 2.62 6.08 5.45 ns 16 mA -1 0.50 3.99 0.03 0.90 0.32 4.07 3.50 2.50 2.69 5.78 5.22 ns 24 mA -1 0.50 3.72 0.03 0.90 0.32 3.79 3.49 2.54 2.98 5.50 5.20 ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-39 * 3.3 V LVTTL / 3.3 V LVCMOS High Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 3.0 V Applicable to MSS I/O Banks Drive Strength 8 mA Speed Grade tDOUT -1 0.50 tDP tDIN tPY 1.924 0.033 0.781 tPYS tEOUT tZL tZH tLZ tHZ Units 1.09 0.37 1.96 1.55 1.83 2.04 ns Notes: 1. Software default selection highlighted in gray. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Revision 4 2- 33 SmartFusion DC and Switching Characteristics 2.5 V LVCMOS Low-Voltage CMOS for 2.5 V is an extension of the LVCMOS standard (JESD8-5) used for generalpurpose 2.5 V applications. It uses a 5 V-tolerant input buffer and push-pull output buffer. Table 2-40 * Minimum and Maximum DC Input and Output Levels Applicable to FPGA I/O Banks 2.5 V LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH mA mA Max. mA1 Max. mA1 IIL IIH Drive Strength Min. V Max. V Min. V Max. V Max. V Min. V 2 mA -0.3 0.7 1.7 2.7 0.7 1.7 2 2 18 16 15 15 4 mA -0.3 0.7 1.7 2.7 0.7 1.7 4 4 18 16 15 15 6 mA -0.3 0.7 1.7 2.7 0.7 1.7 6 6 37 32 15 15 8 mA -0.3 0.7 1.7 2.7 0.7 1.7 8 8 37 32 15 15 12 mA -0.3 0.7 1.7 2.7 0.7 1.7 12 12 74 65 15 15 16 mA -0.3 0.7 1.7 2.7 0.7 1.7 16 16 87 83 15 15 24 mA -0.3 0.7 1.7 2.7 0.7 1.7 24 24 124 169 15 15 IIL IIH A2 A2 Notes: 1. Currents are measured at high temperature (100C junction temperature) and maximum voltage. 2. Currents are measured at 85C junction temperature. 3. Software default selection highlighted in gray. Table 2-41 * Minimum and Maximum DC Input and Output Levels Applicable to MSS I/O Banks 2.5 V LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH mA mA Max. mA1 Max., mA1 37 32 Drive Strength Min. V Max. V Min. V Max. V Max. V Min. V 8 mA -0.3 0.7 1.7 3.6 0.7 1.7 8 8 A2 A2 15 Notes: 1. Currents are measured at high temperature (100C junction temperature) and maximum voltage. 2. Currents are measured at 85C junction temperature. 3. Software default selection highlighted in gray. R to VCCxxxxIOBx for tLZ / tZL / tZLS R=1K Test Point Test Point 35 pF Datapath R to GND for tHZ / tZH / tZHS 35 pF for tZH / tZHS / tZL / tZLS Enable Path 5 pF for tHZ / tLZ Figure 2-8 * AC Loading Table 2-42 * AC Waveforms, Measuring Points, and Capacitive Loads Input Low (V) 0 Input High (V) Measuring Point* (V) VREF (typ.) (V) CLOAD (pF) 2.5 1.2 - 35 * Measuring point = Vtrip. See Table 2-21 on page 2-26 for a complete table of trip points. 2- 34 R e visio n 4 15 Actel SmartFusion Intelligent Mixed Signal FPGAs Timing Characteristics Table 2-43 * 2.5 V LVCMOS High Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 2.3 V Applicable to FPGA I/O Banks Drive Speed Strength Grade tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 4 mA -1 0.46 6.65 0.03 1.01 0.32 6.01 6.65 2.05 1.77 7.72 8.36 ns 8 mA -1 0.46 3.96 0.03 1.01 0.32 3.86 3.96 2.34 2.30 5.58 5.68 ns 12 mA -1 0.50 2.73 0.03 1.01 0.32 2.78 2.63 2.53 2.64 4.50 4.35 ns 16 mA -1 0.50 2.57 0.03 1.01 0.32 2.62 2.35 2.58 2.72 4.33 4.06 ns 24 mA -1 0.50 2.37 0.03 1.01 0.32 2.41 1.87 2.64 3.07 4.13 3.59 ns Notes: 1. Software default selection highlighted in gray. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-44 * 2.5 V LVCMOS Low Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 2.3 V Applicable to FPGA I/O Banks Drive Strength Speed Grade tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 4 mA -1 0.46 8.74 0.03 1.01 0.32 8.61 8.74 2.05 1.69 10.32 10.46 ns 8 mA -1 0.46 6.11 0.03 1.01 0.32 6.22 5.99 2.34 2.22 7.93 7.71 ns 12 mA -1 0.50 4.74 0.03 1.01 0.32 4.83 4.54 2.53 2.55 6.54 6.26 ns 16 mA -1 0.50 4.42 0.03 1.01 0.32 4.50 4.24 2.58 2.64 6.22 5.95 ns 24 mA -1 0.50 4.22 0.03 1.01 0.32 4.22 4.22 2.63 2.97 5.94 5.94 ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-45 * 2.5 V LVCMOS High Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 3.0 V Applicable to MSS I/O Banks Drive Strength 8 mA Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units -1 0.50 1.96 0.03 0.99 1.16 0.37 2.00 1.82 1.82 1.93 ns Notes: 1. Software default selection highlighted in gray. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Revision 4 2- 35 SmartFusion DC and Switching Characteristics 1.8 V LVCMOS Low-voltage CMOS for 1.8 V is an extension of the LVCMOS standard (JESD8-5) used for generalpurpose 1.8 V applications. It uses a 1.8 V input buffer and a push-pull output buffer. Table 2-46 * Minimum and Maximum DC Input and Output Levels Applicable to FPGA I/O Banks 1.8 V LVCMOS VIL Drive Min. Strength V VOL VOH IOL IOH IOSL IOSH Max. Max. V V Min. V mA mA Max. mA1 Max. mA1 A2 A2 VIH Max. V Min. V IIL IIH 2 mA -0.3 0.35 * VCCxxxxIOBx 0.65 * VCCxxxxIOBx 1.9 0.45 VCCxxxxIOBx - 0.45 2 2 11 9 15 15 4 mA -0.3 0.35 * VCCxxxxIOBx 0.65 * VCCxxxxIOBx 1.9 0.45 VCCxxxxIOBx - 0.45 4 4 22 17 15 15 6 mA -0.3 0.35 * VCCxxxxIOBx 0.65 * VCCxxxxIOBx 1.9 0.45 VCCxxxxIOBx - 0.45 6 6 44 35 15 15 8 mA -0.3 0.35 * VCCxxxxIOBx 0.65 * VCCxxxxIOBx 1.9 0.45 VCCxxxxIOBx - 0.45 8 8 51 45 15 15 12 mA -0.3 0.35 * VCCxxxxIOBx 0.65 * VCCxxxxIOBx 1.9 0.45 VCCxxxxIOBx 12 12 - 0.45 74 91 15 15 16 mA -0.3 0.35 * VCCxxxxIOBx 0.65 * VCCxxxxIOBx 1.9 0.45 VCCxxxxIOBx 16 16 - 0.45 74 91 15 15 Notes: 1. Currents are measured at high temperature (100C junction temperature) and maximum voltage. 2. Currents are measured at 85C junction temperature. 3. Software default selection highlighted in gray. Table 2-47 * Minimum and Maximum DC Input and Output Levels Applicable to MSS I/O Banks 1.8 V LVCMOS VIL Drive Min. Strength V 4 mA -0.3 VOL VOH IOL IOH Max. Max. V V Min. V Max. mA mA mA1 VIH Max. V Min. V 0.35 * VCCxxxxIOBx 0.65 * VCCxxxxIOBx 3.6 0.45 VCCxxxxIOBx - 0.45 4 4 IOSL 22 IOSH IIL 17 15 Notes: 1. Currents are measured at high temperature (100C junction temperature) and maximum voltage. 2. Currents are measured at 85C junction temperature. 3. Software default selection highlighted in gray. R to VCCxxxxIOBx for tLZ / tZL / tZLS R=1K Test Point Test Point 35 pF Datapath R to GND for tHZ / tZH / tZHS 35 pF for tZH / tZHS / tZL / tZLS Enable Path 5 pF for tHZ / tLZ Figure 2-9 * AC Loading Table 2-48 * AC Waveforms, Measuring Points, and Capacitive Loads Input Low (V) 0 Input High (V) Measuring Point* (V) VREF (typ.) (V) CLOAD (pF) 1.8 0.9 - 35 * Measuring point = Vtrip. See Table 2-21 on page 2-26 for a complete table of trip points. 2- 36 R e visio n 4 IIH Max. mA1 A2 A2 15 Actel SmartFusion Intelligent Mixed Signal FPGAs Timing Characteristics Table 2-49 * 1.8 V LVCMOS High Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 1.7 V Applicable to FPGA I/O Banks Drive Speed Strength Grade tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 2 mA -1 0.50 9.10 0.03 0.93 0.32 7.01 9.10 2.13 1.27 8.72 10.82 ns 4 mA -1 0.50 5.30 0.03 0.93 0.32 4.50 5.30 2.47 2.18 6.21 7.02 ns 6 mA -1 0.50 3.41 0.03 0.93 0.32 3.21 3.41 2.71 2.59 4.92 5.13 ns 8 mA -1 0.50 3.01 0.03 0.93 0.32 3.01 3.01 2.76 2.70 4.73 4.73 ns 12 mA -1 0.50 2.71 0.03 0.93 0.324 2.76 2.33 2.84 3.13 4.48 4.05 ns 16 mA -1 0.50 2.71 0.03 0.93 0.32 2.76 2.33 2.84 3.13 4.48 4.05 ns Notes: 1. Software default selection highlighted in gray. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-50 * 1.8 V LVCMOS Low Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 1.7 V Applicable to FPGA I/O Banks Drive Strength Speed Grade tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 2 mA -1 0.50 11.91 0.03 1.01 0.32 10.83 11.91 2.13 1.23 12.54 13.63 ns 4 mA -1 0.50 8.04 0.03 1.01 0.32 7.99 8.04 2.48 2.10 9.70 9.75 ns 6 mA -1 0.50 6.17 0.03 1.01 0.32 6.29 6.02 2.71 2.51 8.00 7.73 ns 8 mA -1 0.50 5.76 0.03 1.01 0.32 5.86 5.60 2.77 2.62 7.58 7.31 ns 12 mA -1 0.50 5.59 0.03 1.01 0.32 5.55 5.59 2.84 3.03 7.27 7.31 ns 16 mA -1 0.50 5.59 0.03 1.01 0.32 5.55 5.59 2.84 3.03 7.27 7.31 ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-51 * 1.8 V LVCMOS High Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 1.7 V Applicable to MSS I/O Banks Drive Strength 4 mA Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units -1 0.50 2.31 0.03 0.91 1.37 0.37 2.35 2.27 1.84 1.87 ns Notes: 1. Software default selection highlighted in gray. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Revision 4 2- 37 SmartFusion DC and Switching Characteristics 1.5 V LVCMOS (JESD8-11) Low-Voltage CMOS for 1.5 V is an extension of the LVCMOS standard (JESD8-5) used for generalpurpose 1.5 V applications. It uses a 1.5 V input buffer and a push-pull output buffer. Table 2-52 * Minimum and Maximum DC Input and Output Levels Applicable to FPGA I/O Banks 1.5 V LVCMOS VIL Drive Min. Strength V VIH Max. V Min. V Max. V VOL VOH Max. V Min. V IOL IOH IOSL Max. mA mA mA1 IOSH IIL IIH Max. mA1 A2 A2 2 mA -0.3 0.35 * 0.65 * 1.575 0.25* 0.75 * VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx 2 2 16 13 15 15 4 mA - 0.3 0.35* 0.65 * 1.575 0.25* 0.75 * VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx 4 4 33 25 15 15 6 mA - 0.35 * 0.65 * 1.575 0.25* 0.75 * 0.3 VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx 6 6 39 32 15 15 8 mA - 0.35 * 0.65 * 1.575 0.3 VCCxxxxIOBx VCCxxxxIOBx 8 8 55 66 15 15 12 mA - 0.35 * 0.65 * 1.575 0.25 * 0.75 * 12 12 0.3 VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx 55 66 15 15 0.25* VCC 0.75 * VCCxxxxIOBx Notes: 1. Currents are measured at high temperature (100C junction temperature) and maximum voltage. 2. Currents are measured at 85C junction temperature. 3. Software default selection highlighted in gray. Table 2-53 * Minimum and Maximum DC Input and Output Levels Applicable to MSS I/O Banks 1.5 V LVCMOS VIL Drive Min. Strength V 2 mA -0.3 VOL VOH IOL IOH IOSL IOSH IIL IIH Max. V Min. V Max. Max. A mA mA mA1 mA1 A2 2 VIH Max. V Min. V Max. V 0.35 * 0.65 * 1.575 0.25 * 0.75 * VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx VCCxxxxIOBx 2 2 16 13 15 15 Notes: 1. Currents are measured at high temperature (100C junction temperature) and maximum voltage. 2. Currents are measured at 85C junction temperature. 3. Software default selection highlighted in gray. R to VCCxxxxIOBx for tLZ / tZL / tZLS R=1K Test Point Test Point 35 pF Datapath Enable Path R to GND for tHZ / tZH / tZHS 35 pF for tZH / tZHS / tZL / tZLS 5 pF for tHZ / tLZ Figure 2-10 * AC Loading Table 2-54 * AC Waveforms, Measuring Points, and Capacitive Loads Input Low (V) 0 Input High (V) Measuring Point* (V) VREF (typ.) (V) CLOAD (pF) 1.5 0.75 - 35 * Measuring point = Vtrip. See Table 2-21 on page 2-26 for a complete table of trip points. 2- 38 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Timing Characteristics Table 2-55 * 1.5 V LVCMOS High Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 1.425 V Applicable to FPGA I/O Banks Drive Strength Speed Grade tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 2m -1 0.50 6.42 0.03 1.10 0.32 5.23 6.42 2.60 2.12 6.95 8.13 ns 4 mA -1 0.50 4.08 0.03 1.10 0.32 3.72 4.08 2.87 2.61 5.44 5.79 ns 6 mA -1 0.50 3.58 0.03 1.10 0.32 3.49 3.58 2.93 2.73 5.20 5.30 ns 8 mA -1 0.50 3.13 0.03 1.10 0.32 3.19 2.74 3.03 3.22 4.90 4.46 ns 12 mA -1 0.50 3.13 0.03 1.10 0.32 3.19 2.74 3.03 3.22 4.90 4.46 ns Notes: 1. Software default selection highlighted in gray. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-56 * 1.5 V LVCMOS Low Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 1.4 V Applicable to FPGA I/O Banks Drive Strength Speed Grade tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 2 mA -1 0.50 9.81 0.03 1.01 0.32 9.83 9.81 2.61 2.03 11.54 11.52 ns 4 mA -1 0.50 7.68 0.03 1.01 0.32 7.82 7.32 2.88 2.51 9.54 9.04 ns 6 mA -1 0.50 7.16 0.03 1.01 0.32 7.29 6.82 2.94 2.63 9.01 8.54 ns 8 mA -1 0.50 6.83 0.03 1.01 0.32 6.96 6.82 3.03 3.11 8.68 8.54 ns 12 mA -1 0.50 6.83 0.03 1.01 0.32 6.96 6.82 3.03 3.11 8.68 8.54 ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-57 * 1.5 V LVCMOS High Slew Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 3.0 V Applicable to MSS I/O Banks Drive Strength 2 mA Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units -1 0.50 2.70 0.03 1.07 1.55 0.37 2.75 2.67 1.87 1.85 ns Notes: 1. Software default selection highlighted in gray. 2. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Revision 4 2- 39 SmartFusion DC and Switching Characteristics 3.3 V PCI, 3.3 V PCI-X Peripheral Component Interface for 3.3 V standard specifies support for 33 MHz and 66 MHz PCI Bus applications. Table 2-58 * Minimum and Maximum DC Input and Output Levels 3.3 V PCI/PCI-X VIL Min. V Drive Strength VIH Max. V Min. V Max. V Per PCI specification VOL VOH IOL IOH IOSL IOSH Max. V Min. V mA mA Max. mA1 Max. mA1 IIL IIH A2 A2 Per PCI curves 15 15 Notes: 1. Currents are measured at high temperature (100C junction temperature) and maximum voltage. 2. Currents are measured at 85C junction temperature. AC loadings are defined per the PCI/PCI-X specifications for the datapath; Actel loadings for enable path characterization are described in Figure 2-11. R to VCCXXXXIOBX for tDP (F) R = 25 R to GND for tDP (R) Test Point R=1k Test Point R to GND for tHZ / tZH / tZHS 10 pF for tZH / tZHS / tZL / tZLS Enable Path Datapath R to VCCXXXXIOBX for tLZ / tZL/ tZLS 5 pF for tHZ / tLZ Figure 2-11 * AC Loading AC loadings are defined per PCI/PCI-X specifications for the datapath; Actel loading for tristate is described in Table 2-59. Table 2-59 * AC Waveforms, Measuring Points, and Capacitive Loads Input Low (V) Input High (V) Measuring Point* (V) VREF (typ.) (V) CLOAD (pF) 3.3 0.285 * VCCxxxxIOBx for tDP(R) 0.615 * VCCxxxxIOBx for tDP(F) - 10 0 * Measuring point = Vtrip. See Table 2-21 on page 2-26 for a complete table of trip points. Timing Characteristics Table 2-60 * 3.3 V PCI Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 3.0 V Applicable to FPGA I/O Banks Speed Grade -1 tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 0.50 2.06 0.03 0.66 0.32 2.09 1.50 2.46 2.75 3.81 3.21 ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Table 2-61 * 3.3 V PCI-X Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCxxxxIOBx = 3.0 V Applicable to Standard Plus I/O Banks Speed Grade -1 tDOUT tDP tDIN tPY tEOUT tZL tZH tLZ tHZ tZLS tZHS Units 0.50 2.06 0.03 0.64 0.32 2.09 1.50 2.46 2.75 3.81 3.21 ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 40 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Differential I/O Characteristics Physical Implementation Configuration of the I/O modules as a differential pair is handled by Actel Designer software when the user instantiates a differential I/O macro in the design. Differential I/Os can also be used in conjunction with the embedded Input Register (InReg), Output Register (OutReg), Enable Register (EnReg), and Double Data Rate (DDR). However, there is no support for bidirectional I/Os or tristates with the LVPECL standards. LVDS Low-Voltage Differential Signaling (ANSI/TIA/EIA-644) is a high-speed, differential I/O standard. It requires that one data bit be carried through two signal lines, so two pins are needed. It also requires external resistor termination. The full implementation of the LVDS transmitter and receiver is shown in an example in Figure 2-12. The building blocks of the LVDS transmitter-receiver are one transmitter macro, one receiver macro, three board resistors at the transmitter end, and one resistor at the receiver end. The values for the three driver resistors are different from those used in the LVPECL implementation because the output standard specifications are different. Along with LVDS I/O, SmartFusion also supports Bus LVDS structure and Multipoint LVDS (M-LVDS) configuration (up to 40 nodes). Bourns Part Number: CAT16-LV4F12 OUTBUF_LVDS FPGA P 165 140 N 165 P Z0 = 50 Z0 = 50 FPGA + - 100 INBUF_LVDS N Figure 2-12 * LVDS Circuit Diagram and Board-Level Implementation Revision 4 2- 41 SmartFusion DC and Switching Characteristics Table 2-62 * LVDS Minimum and Maximum DC Input and Output Levels DC Parameter Description Min. Typ. Max. Units 2.375 2.5 2.625 V VCCFPGAIOBx Supply voltage VOL Output low voltage 0.9 1.075 1.25 V VOH IOL Output high voltage 1.25 1.425 1.6 V 1 Output lower current 0.65 0.91 1.16 mA 1 Output high current 0.65 0.91 1.16 mA 2.925 V IOH VI Input voltage IIH2 0 Input high leakage current 15 A IIL2 Input low leakage current 15 A VODIFF Differential output voltage VOCM 250 350 450 mV Output common mode voltage 1.125 1.25 1.375 V VICM Input common mode voltage 0.05 1.25 2.35 V VIDIFF Input differential voltage 100 350 mV Notes: 1. IOL / IOH defined by VODIFF /(resistor network). 2. Currents are measured at 85C junction temperature. Table 2-63 * AC Waveforms, Measuring Points, and Capacitive Loads Input Low (V) 1.075 Input High (V) Measuring Point* (V) VREF (typ.) (V) 1.325 Cross point - * Measuring point = Vtrip. See Table 2-21 on page 2-26 for a complete table of trip points. Timing Characteristics Table 2-64 * LVDS Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCFPGAIOBx = 2.3 V Speed Grade -1 tDOUT tDP tDIN tPY Units 0.50 1.44 0.03 1.27 ns Note: For the derating values at specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 42 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs B-LVDS/M-LVDS Bus LVDS (B-LVDS) and Multipoint LVDS (M-LVDS) specifications extend the existing LVDS standard to high-performance multipoint bus applications. Multidrop and multipoint bus configurations may contain any combination of drivers, receivers, and transceivers. Actel LVDS drivers provide the higher drive current required by B-LVDS and M-LVDS to accommodate the loading. The drivers require series terminations for better signal quality and to control voltage swing. Termination is also required at both ends of the bus since the driver can be located anywhere on the bus. These configurations can be implemented using the TRIBUF_LVDS and BIBUF_LVDS macros along with appropriate terminations. Multipoint designs using Actel LVDS macros can achieve up to 200 MHz with a maximum of 20 loads. A sample application is given in Figure 2-13. The input and output buffer delays are available in the LVDS section in Table 2-64. Example: For a bus consisting of 20 equidistant loads, the following terminations provide the required differential voltage, in worst-case commercial operating conditions, at the farthest receiver: RS = 60 and RT = 70 , given Z0 = 50 (2") and Zstub = 50 (~1.5"). Receiver Transceiver EN R + RS Zstub Z0 RT Z 0 D EN T - + RS Zstub Driver RS Zstub - Zstub RS Zstub EN + RS Zstub Transceiver EN R - + RS Receiver RS Zstub EN T - + RS Zstub RS BIBUF_LVDS - RS ... Z0 Z0 Z0 Z0 Z0 Z0 Z0 Z0 Z0 Z0 RT Figure 2-13 * B-LVDS/M-LVDS Multipoint Application Using LVDS I/O Buffers Revision 4 2- 43 SmartFusion DC and Switching Characteristics LVPECL Low-Voltage Positive Emitter-Coupled Logic (LVPECL) is another differential I/O standard. It requires that one data bit be carried through two signal lines. Like LVDS, two pins are needed. It also requires external resistor termination. The full implementation of the LVDS transmitter and receiver is shown in an example in Figure 2-14. The building blocks of the LVPECL transmitter-receiver are one transmitter macro, one receiver macro, three board resistors at the transmitter end, and one resistor at the receiver end. The values for the three driver resistors are different from those used in the LVDS implementation because the output standard specifications are different. Bourns Part Number: CAT16-PC4F12 OUTBUF_LVPECL FPGA P 100 + - 100 187 W Z0 = 50 100 N FPGA P Z0 = 50 INBUF_LVPECL N Figure 2-14 * LVPECL Circuit Diagram and Board-Level Implementation Table 2-65 * Minimum and Maximum DC Input and Output Levels DC Parameter Description Min. VCCFPGAIOBx Supply Voltage Max. Min. 3.0 Max. Min. 3.3 Max. Units 3.6 V VOL Output Low Voltage 0.96 1.27 1.06 1.43 1.30 1.57 V VOH Output High Voltage 1.8 2.11 1.92 2.28 2.13 2.41 V VIL, VIH Input Low, Input High Voltages 0 3.3 0 3.6 0 3.9 V VODIFF Differential Output Voltage 0.625 0.97 0.625 0.97 0.625 0.97 V VOCM Output Common-Mode Voltage 1.762 1.98 1.762 1.98 1.762 1.98 V VICM Input Common-Mode Voltage 1.01 2.57 1.01 2.57 1.01 2.57 V VIDIFF Input Differential Voltage 300 300 300 mV Table 2-66 * AC Waveforms, Measuring Points, and Capacitive Loads Input Low (V) 1.64 Input High (V) Measuring Point* (V) VREF (typ.) (V) 1.94 Cross point - * Measuring point = Vtrip. See Table 2-21 on page 2-26 for a complete table of trip points. Timing Characteristics Table 2-67 * LVPECL Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V, Worst-Case VCCFPGAIOBx = 3.0 V Speed Grade -1 tDOUT tDP tDIN tPY Units 0.50 1.38 0.03 1.08 ns Note: For the derating values at specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 44 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs I/O Register Specifications Fully Registered I/O Buffers with Synchronous Enable and Asynchronous Preset INBUF Preset L DOUT Data_out C PRE D Q DFN1E1P1 E Y F Core Array G PRE D Q DFN1E1P1 TRIBUF CLKBUF CLK INBUF Enable INBUF Data Pad Out D E E EOUT B H I A J K INBUF INBUF D_Enable CLK CLKBUF Enable Data Input I/O Register with: Active High Enable Active High Preset Positive-Edge Triggered PRE D Q DFN1E1P1 E Data Output Register and Enable Output Register with: Active High Enable Active High Preset Postive-Edge Triggered Figure 2-15 * Timing Model of Registered I/O Buffers with Synchronous Enable and Asynchronous Preset Revision 4 2- 45 SmartFusion DC and Switching Characteristics Table 2-68 * Parameter Definition and Measuring Nodes Parameter Name Parameter Definition Measuring Nodes (from, to)* tOCLKQ Clock-to-Q of the Output Data Register tOSUD Data Setup Time for the Output Data Register F, H tOHD Data Hold Time for the Output Data Register F, H tOSUE Enable Setup Time for the Output Data Register G, H tOHE Enable Hold Time for the Output Data Register G, H tOPRE2Q Asynchronous Preset-to-Q of the Output Data Register tOREMPRE Asynchronous Preset Removal Time for the Output Data Register L, H tORECPRE Asynchronous Preset Recovery Time for the Output Data Register L, H tOECLKQ Clock-to-Q of the Output Enable Register tOESUD Data Setup Time for the Output Enable Register J, H tOEHD Data Hold Time for the Output Enable Register J, H tOESUE Enable Setup Time for the Output Enable Register K, H tOEHE Enable Hold Time for the Output Enable Register K, H tOEPRE2Q Asynchronous Preset-to-Q of the Output Enable Register tOEREMPRE Asynchronous Preset Removal Time for the Output Enable Register I, H tOERECPRE Asynchronous Preset Recovery Time for the Output Enable Register I, H tICLKQ Clock-to-Q of the Input Data Register A, E tISUD Data Setup Time for the Input Data Register C, A tIHD Data Hold Time for the Input Data Register C, A tISUE Enable Setup Time for the Input Data Register B, A tIHE Enable Hold Time for the Input Data Register B, A tIPRE2Q Asynchronous Preset-to-Q of the Input Data Register D, E tIREMPRE Asynchronous Preset Removal Time for the Input Data Register D, A tIRECPRE Asynchronous Preset Recovery Time for the Input Data Register D, A * See Figure 2-15 on page 2-45 for more information. 2- 46 R e visio n 4 H, DOUT L, DOUT H, EOUT I, EOUT Actel SmartFusion Intelligent Mixed Signal FPGAs Fully Registered I/O Buffers with Synchronous Enable and Asynchronous Clear CC D Q DFN1E1C1 EE Core Array D Q DFN1E1C1 TRIBUF INBUF Data Data_out FF Pad Out DOUT Y GG INBUF Enable EOUT E E BB CLR CLR LL INBUF CLR CLKBUF CLK HH AA JJ DD KK Data Input I/O Register with Active High Enable Active High Clear Positive-Edge Triggered D Q DFN1E1C1 E INBUF CLKBUF CLK Enable INBUF D_Enable CLR Data Output Register and Enable Output Register with Active High Enable Active High Clear Positive-Edge Triggered Figure 2-16 * Timing Model of the Registered I/O Buffers with Synchronous Enable and Asynchronous Clear Revision 4 2- 47 SmartFusion DC and Switching Characteristics Table 2-69 * Parameter Definition and Measuring Nodes Parameter Name Parameter Definition Measuring Nodes (from, to)* tOCLKQ Clock-to-Q of the Output Data Register tOSUD Data Setup Time for the Output Data Register FF, HH tOHD Data Hold Time for the Output Data Register FF, HH tOSUE Enable Setup Time for the Output Data Register GG, HH tOHE Enable Hold Time for the Output Data Register GG, HH tOCLR2Q Asynchronous Clear-to-Q of the Output Data Register tOREMCLR Asynchronous Clear Removal Time for the Output Data Register LL, HH tORECCLR Asynchronous Clear Recovery Time for the Output Data Register LL, HH tOECLKQ Clock-to-Q of the Output Enable Register tOESUD Data Setup Time for the Output Enable Register JJ, HH tOEHD Data Hold Time for the Output Enable Register JJ, HH tOESUE Enable Setup Time for the Output Enable Register KK, HH tOEHE Enable Hold Time for the Output Enable Register KK, HH tOECLR2Q Asynchronous Clear-to-Q of the Output Enable Register II, EOUT tOEREMCLR Asynchronous Clear Removal Time for the Output Enable Register II, HH tOERECCLR Asynchronous Clear Recovery Time for the Output Enable Register II, HH tICLKQ Clock-to-Q of the Input Data Register AA, EE tISUD Data Setup Time for the Input Data Register CC, AA tIHD Data Hold Time for the Input Data Register CC, AA tISUE Enable Setup Time for the Input Data Register BB, AA tIHE Enable Hold Time for the Input Data Register BB, AA tICLR2Q Asynchronous Clear-to-Q of the Input Data Register DD, EE tIREMCLR Asynchronous Clear Removal Time for the Input Data Register DD, AA tIRECCLR Asynchronous Clear Recovery Time for the Input Data Register DD, AA * See Figure 2-16 on page 2-47 for more information. 2- 48 R e visio n 4 HH, DOUT LL, DOUT HH, EOUT Actel SmartFusion Intelligent Mixed Signal FPGAs Input Register tICKMPWH tICKMPWL CLK 50% 50% Enable 50% 1 50% 50% 50% tIHD tISUD Data 50% 50% 50% 0 tIWPRE 50% tIRECPRE tIREMPRE 50% 50% tIHE Preset tISUE 50% tIWCLR 50% Clear tIRECCLR 50% tIREMCLR 50% tIPRE2Q 50% Out_1 50% tICLR2Q 50% tICLKQ Figure 2-17 * Input Register Timing Diagram Timing Characteristics Table 2-70 * Input Data Register Propagation Delays Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tICLKQ Clock-to-Q of the Input Data Register 0.24 ns tISUD Data Setup Time for the Input Data Register 0.27 ns tIHD Data Hold Time for the Input Data Register 0.00 ns tISUE Enable Setup Time for the Input Data Register 0.38 ns tIHE Enable Hold Time for the Input Data Register 0.00 ns tICLR2Q Asynchronous Clear-to-Q of the Input Data Register 0.46 ns tIPRE2Q Asynchronous Preset-to-Q of the Input Data Register 0.46 ns tIREMCLR Asynchronous Clear Removal Time for the Input Data Register 0.00 ns tIRECCLR Asynchronous Clear Recovery Time for the Input Data Register 0.23 ns tIREMPRE Asynchronous Preset Removal Time for the Input Data Register 0.00 ns tIRECPRE Asynchronous Preset Recovery Time for the Input Data Register 0.23 ns tIWCLR Asynchronous Clear Minimum Pulse Width for the Input Data Register 0.22 ns tIWPRE Asynchronous Preset Minimum Pulse Width for the Input Data Register 0.22 ns tICKMPWH Clock Minimum Pulse Width High for the Input Data Register 0.36 ns tICKMPWL Clock Minimum Pulse Width Low for the Input Data Register 0.32 ns Note: For the derating values at specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Revision 4 2- 49 SmartFusion DC and Switching Characteristics Output Register tOCKMPWH tOCKMPWL CLK 50% 50% 50% 50% 50% 50% 50% tOSUD tOHD 1 Data_out Enable 50% 50% 0 50% tOWPRE tOHE Preset tOSUE tOREMPRE tORECPRE 50% 50% 50% tOWCLR 50% Clear tOREMCLR tORECCLR 50% 50% tOPRE2Q 50% DOUT 50% tOCLR2Q 50% tOCLKQ Figure 2-18 * Output Register Timing Diagram Timing Characteristics Table 2-71 * Output Data Register Propagation Delays Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tOCLKQ Clock-to-Q of the Output Data Register 0.60 ns tOSUD Data Setup Time for the Output Data Register 0.32 ns tOHD Data Hold Time for the Output Data Register 0.00 ns tOSUE Enable Setup Time for the Output Data Register 0.44 ns tOHE Enable Hold Time for the Output Data Register 0.00 ns tOCLR2Q Asynchronous Clear-to-Q of the Output Data Register 0.82 ns tOPRE2Q Asynchronous Preset-to-Q of the Output Data Register 0.82 ns tOREMCLR Asynchronous Clear Removal Time for the Output Data Register 0.00 ns tORECCLR Asynchronous Clear Recovery Time for the Output Data Register 0.23 ns tOREMPRE Asynchronous Preset Removal Time for the Output Data Register 0.00 ns tORECPRE Asynchronous Preset Recovery Time for the Output Data Register 0.23 ns tOWCLR Asynchronous Clear Minimum Pulse Width for the Output Data Register 0.22 ns tOWPRE Asynchronous Preset Minimum Pulse Width for the Output Data Register 0.22 ns tOCKMPWH Clock Minimum Pulse Width High for the Output Data Register 0.36 ns tOCKMPWL Clock Minimum Pulse Width Low for the Output Data Register 0.32 ns Note: For the derating values at specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 50 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Output Enable Register tOECKMPWH tOECKMPWL CLK 50% 50% 50% 50% 50% 50% 50% tOESUD tOEHD 1 D_Enable Enable Preset 50% 0 50% 50% tOESUEtOEHE tOEWPRE tOEREMPRE tOERECPRE 50% 50% 50% tOEWCLR 50% Clear tOEPRE2Q EOUT 50% tOERECCLR 50% tOEREMCLR 50% tOECLR2Q 50% 50% tOECLKQ Figure 2-19 * Output Enable Register Timing Diagram Revision 4 2- 51 SmartFusion DC and Switching Characteristics Timing Characteristics Table 2-72 * Output Enable Register Propagation Delays Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tOECLKQ Clock-to-Q of the Output Enable Register 0.45 ns tOESUD Data Setup Time for the Output Enable Register 0.32 ns tOEHD Data Hold Time for the Output Enable Register 0.00 ns tOESUE Enable Setup Time for the Output Enable Register 0.44 ns tOEHE Enable Hold Time for the Output Enable Register 0.00 ns tOECLR2Q Asynchronous Clear-to-Q of the Output Enable Register 0.68 ns tOEPRE2Q Asynchronous Preset-to-Q of the Output Enable Register 0.68 ns tOEREMCLR Asynchronous Clear Removal Time for the Output Enable Register 0.00 ns tOERECCLR Asynchronous Clear Recovery Time for the Output Enable Register 0.23 ns tOEREMPRE Asynchronous Preset Removal Time for the Output Enable Register 0.00 ns tOERECPRE Asynchronous Preset Recovery Time for the Output Enable Register 0.23 ns tOEWCLR Asynchronous Clear Minimum Pulse Width for the Output Enable Register 0.22 ns tOEWPRE Asynchronous Preset Minimum Pulse Width for the Output Enable Register 0.22 ns tOECKMPWH Clock Minimum Pulse Width High for the Output Enable Register 0.36 ns tOECKMPWL Clock Minimum Pulse Width Low for the Output Enable Register 0.32 ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 52 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs DDR Module Specifications Input DDR Module Input DDR INBUF Data A D Out_QF (to core) E Out_QR (to core) FF1 B CLK CLKBUF FF2 C CLR INBUF DDR_IN Figure 2-20 * Input DDR Timing Model Table 2-73 * Parameter Definitions Parameter Name Parameter Definition Measuring Nodes (from, to) tDDRICLKQ1 Clock-to-Out Out_QR B, D tDDRICLKQ2 Clock-to-Out Out_QF B, E tDDRISUD Data Setup Time of DDR input A, B tDDRIHD Data Hold Time of DDR input A, B tDDRICLR2Q1 Clear-to-Out Out_QR C, D tDDRICLR2Q2 Clear-to-Out Out_QF C, E tDDRIREMCLR Clear Removal C, B tDDRIRECCLR Clear Recovery C, B Revision 4 2- 53 SmartFusion DC and Switching Characteristics CLK tDDRISUD Data 1 2 3 4 5 6 tDDRIHD 7 8 9 tDDRIRECCLR CLR tDDRIREMCLR tDDRICLKQ1 tDDRICLR2Q1 Out_QF 2 6 4 tDDRICLKQ2 tDDRICLR2Q2 Out_QR 3 5 7 Figure 2-21 * Input DDR Timing Diagram Timing Characteristics Table 2-74 * Input DDR Propagation Delays Worst Commercial-Case Conditions: TJ = 85C, Worst Case VCC = 1.425 V Parameter Description -1 Units tDDRICLKQ1 Clock-to-Out Out_QR for Input DDR 0.39 ns tDDRICLKQ2 Clock-to-Out Out_QF for Input DDR 0.28 ns tDDRISUD Data Setup for Input DDR 0.29 ns tDDRIHD Data Hold for Input DDR 0.00 ns tDDRICLR2Q1 Asynchronous Clear-to-Out Out_QR for Input DDR 0.58 ns tDDRICLR2Q2 Asynchronous Clear-to-Out Out_QF for Input DDR 0.47 ns tDDRIREMCLR Asynchronous Clear Removal time for Input DDR 0.00 ns tDDRIRECCLR Asynchronous Clear Recovery time for Input DDR 0.23 ns tDDRIWCLR Asynchronous Clear Minimum Pulse Width for Input DDR 0.22 ns tDDRICKMPWH Clock Minimum Pulse Width High for Input DDR 0.36 ns tDDRICKMPWL Clock Minimum Pulse Width Low for Input DDR 0.32 ns FDDRIMAX Maximum Frequency for Input DDR 350 MHz Note: For derating values at specific junction temperature and voltage-supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 54 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Output DDR Module Output DDR A Data_F (from core) X FF1 B CLK CLKBUF E X C X D Data_R (from core) Out 0 X 1 X OUTBUF FF2 B X CLR INBUF C X DDR_OUT Figure 2-22 * Output DDR Timing Model Table 2-75 * Parameter Definitions Parameter Name Parameter Definition Measuring Nodes (from, to) tDDROCLKQ Clock-to-Out B, E tDDROCLR2Q Asynchronous Clear-to-Out C, E tDDROREMCLR Clear Removal C, B tDDRORECCLR Clear Recovery C, B tDDROSUD1 Data Setup Data_F A, B tDDROSUD2 Data Setup Data_R D, B tDDROHD1 Data Hold Data_F A, B tDDROHD2 Data Hold Data_R D, B Revision 4 2- 55 SmartFusion DC and Switching Characteristics CLK tDDROSUD2 tDDROHD2 1 Data_F 2 tDDROREMCLR Data_R 6 4 3 5 tDDROHD1 7 8 9 10 11 tDDRORECCLR tDDROREMCLR CLR tDDROCLR2Q Out tDDROCLKQ 7 2 8 3 9 4 10 Figure 2-23 * Output DDR Timing Diagram Timing Characteristics Table 2-76 * Output DDR Propagation Delays Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tDDROCLKQ Clock-to-Out of DDR for Output DDR 0.71 ns tDDROSUD1 Data_F Data Setup for Output DDR 0.38 ns tDDROSUD2 Data_R Data Setup for Output DDR 0.38 ns tDDROHD1 Data_F Data Hold for Output DDR 0.00 ns tDDROHD2 Data_R Data Hold for Output DDR 0.00 ns tDDROCLR2Q Asynchronous Clear-to-Out for Output DDR 0.81 ns tDDROREMCLR Asynchronous Clear Removal Time for Output DDR 0.00 ns tDDRORECCLR Asynchronous Clear Recovery Time for Output DDR 0.23 ns tDDROWCLR1 Asynchronous Clear Minimum Pulse Width for Output DDR 0.22 ns tDDROCKMPWH Clock Minimum Pulse Width High for the Output DDR 0.36 ns tDDROCKMPWL Clock Minimum Pulse Width Low for the Output DDR 0.32 ns FDDOMAX Maximum Frequency for the Output DDR 350 MHz Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 56 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs VersaTile Characteristics VersaTile Specifications as a Combinatorial Module The SmartFusion library offers all combinations of LUT-3 combinatorial functions. In this section, timing characteristics are presented for a sample of the library. For more details, refer to the IGLOO/e, Fusion, ProASIC3/E, and SmartFusion Macro Library Guide. A A B A OR2 Y AND2 A Y B B B XOR2 A B C Y A A B C NOR2 B A A Y INV NAND3 A MAJ3 B Y NAND2 XOR3 Y Y 0 MUX2 B Y Y 1 C S Figure 2-24 * Sample of Combinatorial Cells Revision 4 2- 57 SmartFusion DC and Switching Characteristics tPD A NAND2 or Any Combinatorial Logic B Y tPD = MAX(tPD(RR), tPD(RF), tPD(FF), tPD(FR)) where edges are applicable for the particular combinatorial cell VCC 50% 50% A, B, C GND VCC 50% 50% OUT GND VCC tPD tPD (FF) (RR) tPD OUT (FR) 50% tPD GND (RF) Figure 2-25 * Timing Model and Waveforms 2- 58 R e visio n 4 50% Actel SmartFusion Intelligent Mixed Signal FPGAs Timing Characteristics Table 2-77 * Combinatorial Cell Propagation Delays Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Combinatorial Cell Equation Parameter -1 Units Y = !A tPD 0.39 ns Y=A*B tPD 0.48 ns Y = !(A * B) tPD 0.48 ns Y=A+B tPD 0.49 ns NOR2 Y = !(A + B) tPD 0.49 ns XOR2 Y=AB tPD 0.75 ns MAJ3 Y = MAJ(A, B, C) tPD 0.71 ns XOR3 Y=ABC tPD 0.89 ns MUX2 Y = A !S + B S tPD 0.51 ns AND3 Y=A*B*C tPD 0.57 ns INV AND2 NAND2 OR2 Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. VersaTile Specifications as a Sequential Module The SmartFusion library offers a wide variety of sequential cells, including flip-flops and latches. Each has a data input and optional enable, clear, or preset. In this section, timing characteristics are presented for a representative sample from the library. For more details, refer to the IGLOO/e, Fusion, ProASIC3/E, and SmartFusion Macro Library Guide. Data D Q Out Data En DFN1 D Out Q DFN1E1 CLK CLK PRE Data D Q Out Data En DFN1C1 D Q Out DFI1E1P1 CLK CLK CLR Figure 2-26 * Sample of Sequential Cells Revision 4 2- 59 SmartFusion DC and Switching Characteristics tCKMPWH tCKMPWL CLK 50% 50% tSUD 50% Data EN PRE 50% tRECPRE tREMPRE 50% 50% 50% CLR tPRE2Q 50% tREMCLR tRECCLR tWCLR Out 50% 50% 0 tWPRE tHE 50% 50% tHD 50% tSUE 50% 50% 50% 50% tCLR2Q 50% 50% tCLKQ Figure 2-27 * Timing Model and Waveforms Timing Characteristics Table 2-78 * Register Delays Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tCLKQ Clock-to-Q of the Core Register 0.56 ns tSUD Data Setup Time for the Core Register 0.44 ns tHD Data Hold Time for the Core Register 0.00 ns tSUE Enable Setup Time for the Core Register 0.46 ns tHE Enable Hold Time for the Core Register 0.00 ns tCLR2Q Asynchronous Clear-to-Q of the Core Register 0.41 ns tPRE2Q Asynchronous Preset-to-Q of the Core Register 0.41 ns tREMCLR Asynchronous Clear Removal Time for the Core Register 0.00 ns tRECCLR Asynchronous Clear Recovery Time for the Core Register 0.23 ns tREMPRE Asynchronous Preset Removal Time for the Core Register 0.00 ns tRECPRE Asynchronous Preset Recovery Time for the Core Register 0.23 ns tWCLR Asynchronous Clear Minimum Pulse Width for the Core Register 0.22 ns tWPRE Asynchronous Preset Minimum Pulse Width for the Core Register 0.22 ns tCKMPWH Clock Minimum Pulse Width High for the Core Register 0.32 ns tCKMPWL Clock Minimum Pulse Width Low for the Core Register 0.36 ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 60 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Global Resource Characteristics A2F200 Clock Tree Topology Clock delays are device-specific. Figure 2-28 is an example of a global tree used for clock routing. The global tree presented in Figure 2-28 is driven by a CCC located on the west side of the A2F200 device. It is used to drive all D-flip-flops in the device. Central Global Rib VersaTile Rows CCC Global Spine Figure 2-28 * Example of Global Tree Use in an A2F200 Device for Clock Routing Revision 4 2- 61 SmartFusion DC and Switching Characteristics Global Tree Timing Characteristics Global clock delays include the central rib delay, the spine delay, and the row delay. Delays do not include I/O input buffer clock delays, as these are I/O standard-dependent, and the clock may be driven and conditioned internally by the CCC module. For more details on clock conditioning capabilities, refer to the "Clock Conditioning Circuits" section on page 2-65. Table 2-79 presents minimum and maximum global clock delays for the A2F200 device. Minimum and maximum delays are measured with minimum and maximum loading. Timing Characteristics Table 2-79 * A2F200 Global Resource Worst Commercial-Case Conditions: TJ = 85C, VCC = 1.425 V -1 1 Parameter Description Min. Max.2 Units tRCKL Input Low Delay for Global Clock 0.51 0.76 ns tRCKH Input High Delay for Global Clock 0.51 0.80 ns tRCKMPWH Minimum Pulse Width High for Global Clock ns tRCKMPWL Minimum Pulse Width Low for Global Clock ns tRCKSW Maximum Skew for Global Clock FRMAX Maximum Frequency for Global Clock 0.29 ns MHz Notes: 1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element, located in a lightly loaded row (single element is connected to the global net). 2. Value reflects maximum load. The delay is measured on the clock pin of the farthest sequential element, located in a fully loaded row (all available flip-flops are connected to the global net in the row). 3. For specific junction temperature and voltage-supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 62 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs RC Oscillator The table below describes the electrical characteristics of the RC oscillator. RC Oscillator Characteristics Table 2-80 * Electrical Characteristics of the RC Oscillator Parameter Description FRC Condition Operating frequency Min. Typ. Max. Units 100 MHz 1 % Period jitter (at 5 K cycles) 100 ps Cycle-to-cycle jitter (at 5 K cycles) 100 ps Period jitter (at 5 K cycles) with 1 KHz / 300 mV peak-to-peak noise on power supply 150 ps Cycle-to-cycle jitter (at 5 K cycles) with 1 KHz / 300 mV peak-to-peak noise on power supply 150 ps Output duty 3.3 V domain cycle 1 % Operating current 2 mA Accuracy Temperature: 0C to 85C Voltage: 3.3 V 5% Output jitter IDYNRC 1.5 V domain Revision 4 2- 63 SmartFusion DC and Switching Characteristics Main and Lower Power Crystal Oscillator The tables below describes the electrical characteristics of the main and low power crystal oscillator. Table 2-81 * Electrical Characteristics of the Main Crystal Oscillator Parameter Description Operating frequency Condition Min. Using external crystal Using ceramic resonator Using RC Network Typ. Max. Units 0.032 20 MHz 0.5 8 MHz 0.032 4 MHz Output duty cycle IDYNXTAL ISTBXTAL 50 % Output jitter With 10 MHz crystal 50 ps RMS Operating current RC 0.6 mA 0.032-0.2 0.6 mA 0.2-2.0 0.6 mA 2.0-20.0 0.6 mA 10 A 0.5 Vp-p Standby current of crystal oscillator PSRRXTAL Power supply noise tolerance VIHXTAL Input logic level High VILXTAL Input logic level Low Startup time 90% of VCC V 10% of VCC V RC s 0.032-0.2 s 0.2-2.0 s 2.0-20.0 s Table 2-82 * Electrical Characteristics of the Low Power Oscillator Parameter Description Condition Min. Typ. Max. Units Operating frequency 32 KHz Output duty cycle 50 % Output jitter 50 ps RMS 10 A IDYNXTAL Operating current 32 KHz ISTBXTAL Standby current of crystal oscillator A Power supply noise tolerance 0.5 Vp-p PSRRXTAL VIHXTAL Input logic level High VILXTAL Input logic level Low Startup time 2- 64 90% of VCC V 10% of VCC Test load used: 20 pF R e visio n 4 2.5 V s Actel SmartFusion Intelligent Mixed Signal FPGAs Clock Conditioning Circuits CCC Electrical Specifications Timing Characteristics Table 2-83 * SmartFusion CCC/PLL Specification Parameter Minimum Clock Conditioning Circuitry Input Frequency fIN_CCC Typical 1.5 Clock Conditioning Circuitry Output Frequency fOUT_CCC 0.75 Delay Increments in Programmable Delay Blocks2, 3 Maximum Units 350 MHz 1 MHz 350 160 ps Number of Programmable Values in Each Programmable Delay Block 32 Input Period Jitter 1.5 CCC Output Peak-to-Peak Period Jitter FCCC_OUT ns Max Peak-to-Peak Period Jitter 1 Global Network Used 3 Global Networks Used 0.75 MHz to 24 MHz 0.50% 0.70% 24 MHz to 100 MHz 1.00% 1.20% 100 MHz to 250 MHz 1.75% 2.00% 250 MHz to 350 MHz 2.50% 5.60% Acquisition Time LockControl = 0 300 s LockControl = 1 6.0 ms 1.6 ns Tracking Jitter 4 LockControl = 0 LockControl = 1 0.8 ns 48.5 5.15 % Delay Range in Block: Programmable Delay 12,3 0.6 5.56 ns Delay Range in Block: Programmable Delay 22,3 0.025 5.56 ns Output Duty Cycle Delay Range in Block: Fixed Delay2,3 2.2 ns Notes: 1. One of the CCC outputs (GLA0) is used as an MSS clock and is limited to 100 MHz (maximum) by software. Details regarding CCC/PLL are in the "PLLs, Clock Conditioning Circuitry, and On-Chip Crystal Oscillators" chapter of the SmartFusion Microcontroller Subsystem User's Guide. 2. This delay is a function of voltage and temperature. See Table 2-7 on page 2-9 for deratings. 3. TJ = 25C, VCC = 1.5 V 4. Tracking jitter is defined as the variation in clock edge position of PLL outputs with reference to the PLL input clock edge. Tracking jitter does not measure the variation in PLL output period, which is covered by the period jitter parameter. Revision 4 2- 65 SmartFusion DC and Switching Characteristics Output Signal Tperiod_max Tperiod_min Note: Peak-to-peak jitter measurements are defined by Tpeak-to-peak = Tperiod_max - Tperiod_min. Figure 2-29 * Peak-to-Peak Jitter Definition 2- 66 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs FPGA Fabric SRAM and FIFO Characteristics FPGA Fabric SRAM RAM512X18 RAM4K9 ADDRA11 ADDRA10 DOUTA8 DOUTA7 RADDR8 RADDR7 RD17 RD16 ADDRA0 DINA8 DINA7 DOUTA0 RADDR0 RD0 RW1 RW0 DINA0 WIDTHA1 WIDTHA0 PIPEA WMODEA BLKA WENA CLKA PIPE REN RCLK ADDRB11 ADDRB10 DOUTB8 DOUTB7 ADDRB0 DOUTB0 DINB8 DINB7 WADDR8 WADDR7 WADDR0 WD17 WD16 WD0 DINB0 WW1 WW0 WIDTHB1 WIDTHB0 PIPEB WMODEB BLKB WENB CLKB WEN WCLK RESET RESET Figure 2-30 * RAM Models Revision 4 2- 67 SmartFusion DC and Switching Characteristics Timing Waveforms tCYC tCKH tCKL CLK tAS tAH A0 ADD A1 A2 tBKS tBKH BLK_B tENS tENH WEN_B tCKQ1 DO Dn D0 D1 D2 tDOH1 Figure 2-31 * RAM Read for Pass-Through Output tCYC tCKH tCKL CLK t AS tAH A1 A0 ADD A2 tBKS tBKH BLK_B tENH tENS WEN_B tCKQ2 DO Dn D0 D1 tDOH2 Figure 2-32 * RAM Read for Pipelined Output 2- 68 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs tCYC tCKH tCKL CLK tAS tAH A0 ADD A1 A2 tBKS tBKH BLK_B tENS tENH WEN_B tDS DI0 DI tDH DI1 D2 Dn DO Figure 2-33 * RAM Write, Output Retained (WMODE = 0) tCYC tCKH tCKL CLK tAS tAH A0 ADD A1 A2 tBKS tBKH BLK_B tENS WEN_B tDS DI0 DI DO (pass-through) DO (pipelined) tDH DI1 Dn DI2 DI1 DI0 DI0 Dn DI1 Figure 2-34 * RAM Write, Output as Write Data (WMODE = 1) Revision 4 2- 69 SmartFusion DC and Switching Characteristics tCYC tCKH tCKL CLK RESET_B tRSTBQ DO Dm Dn Figure 2-35 * RAM Reset 2- 70 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Timing Characteristics Table 2-84 * RAM4K9 Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tAS Address setup time 0.25 ns tAH Address hold time 0.00 ns tENS REN_B, WEN_B setup time 0.15 ns tENH REN_B, WEN_B hold time 0.10 ns tBKS BLK_B setup time 0.24 ns tBKH BLK_B hold time 0.02 ns tDS Input data (DI) setup time 0.19 ns tDH Input data (DI) hold time 0.00 ns tCKQ1 Clock High to new data valid on DO (output retained, WMODE = 0) 1.81 ns Clock High to new data valid on DO (flow-through, WMODE = 1) 2.39 ns tCKQ2 Clock High to new data valid on DO (pipelined) 0.91 ns tC2CWWH Address collision clk-to-clk delay for reliable write after write on same address-- applicable to rising edge 0.30 ns tC2CRWH Address collision clk-to-clk delay for reliable read access after write on same address-- applicable to opening edge 0.45 ns tC2CWRH Address collision clk-to-clk delay for reliable write access after read on same address-- applicable to opening edge 0.49 ns tRSTBQ RESET_B Low to data out Low on DO (flow-through) 0.94 ns RESET_B Low to Data Out Low on DO (pipelined) 0.94 ns tREMRSTB RESET_B removal 0.29 ns tRECRSTB RESET_B recovery 1.52 ns tMPWRSTB RESET_B minimum pulse width 0.22 ns tCYC Clock cycle time 3.28 ns FMAX Maximum clock frequency 305 MHz Note: For the derating values at specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Revision 4 2- 71 SmartFusion DC and Switching Characteristics Table 2-85 * RAM512X18 Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tAS Address setup time 0.25 ns tAH Address hold time 0.00 ns tENS REN_B, WEN_B setup time 0.09 ns tENH REN_B, WEN_B hold time 0.06 ns tDS Input data (DI) setup time 0.19 ns tDH Input data (DI) hold time 0.00 ns tCKQ1 Clock High to new data valid on DO (output retained, WMODE = 0) 2.19 ns tCKQ2 Clock High to new data valid on DO (pipelined) 0.91 ns tC2CRWH Address collision clk-to-clk delay for reliable read access after write on same address--applicable to opening edge 0.50 ns tC2CWRH Address collision clk-to-clk delay for reliable write access after read on same address--applicable to opening edge 0.59 ns tRSTBQ RESET_B Low to data out Low on DO (flow-through) 0.94 ns RESET_B Low to data out Low on DO (pipelined) 0.94 ns tREMRSTB RESET_B removal 0.29 ns tRECRSTB RESET_B recovery 1.52 ns tMPWRSTB RESET_B minimum pulse width 0.22 ns tCYC Clock cycle time 3.28 ns FMAX Maximum clock frequency 305 MHz Note: For the derating values at specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 72 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs FIFO FIFO4K18 RW2 RW1 RW0 WW2 WW1 WW0 ESTOP FSTOP RD17 RD16 RD0 FULL AFULL EMPTY AEMPTY AEVAL11 AEVAL10 AEVAL0 AFVAL11 AFVAL10 AFVAL0 REN RBLK RCLK WD17 WD16 WD0 WEN WBLK WCLK RPIPE RESET Figure 2-36 * FIFO Model Revision 4 2- 73 SmartFusion DC and Switching Characteristics Timing Waveforms RCLK/ WCLK tMPWRSTB tRSTCK RESET_B tRSTFG EMPTY tRSTAF AEMPTY tRSTFG FULL tRSTAF AFULL WA/RA (Address Counter) MATCH (A0) Figure 2-37 * FIFO Reset tCYC RCLK tRCKEF EMPTY tCKAF AEMPTY WA/RA (Address Counter) NO MATCH NO MATCH Figure 2-38 * FIFO EMPTY Flag and AEMPTY Flag Assertion 2- 74 R e visio n 4 Dist = AEF_TH MATCH (EMPTY) Actel SmartFusion Intelligent Mixed Signal FPGAs tCYC WCLK tWCKFF FULL tCKAF AFULL WA/RA NO MATCH (Address Counter) NO MATCH Dist = AFF_TH MATCH (FULL) Figure 2-39 * FIFO FULL Flag and AFULL Flag Assertion WCLK WA/RA MATCH (Address Counter) (EMPTY) RCLK NO MATCH 1st Rising Edge After 1st Write NO MATCH NO MATCH NO MATCH Dist = AEF_TH + 1 2nd Rising Edge After 1st Write tRCKEF EMPTY tCKAF AEMPTY Figure 2-40 * FIFO EMPTY Flag and AEMPTY Flag Deassertion RCLK WA/RA MATCH (FULL) NO MATCH (Address Counter) 1st Rising Edge After 1st WCLK Read NO MATCH NO MATCH NO MATCH Dist = AFF_TH - 1 1st Rising Edge After 2nd Read tWCKF FULL tCKAF AFULL Figure 2-41 * FIFO FULL Flag and AFULL Flag Deassertion Revision 4 2- 75 SmartFusion DC and Switching Characteristics Timing Characteristics Table 2-86 * FIFO Worst Commercial-Case Conditions: TJ = 85C, VCC = 1.425 V Parameter Description -1 Units tENS REN_B, WEN_B Setup Time 1.40 ns tENH REN_B, WEN_B Hold Time 0.02 ns tBKS BLK_B Setup Time 0.19 ns tBKH BLK_B Hold Time 0.00 ns tDS Input Data (DI) Setup Time 0.19 ns tDH Input Data (DI) Hold Time 0.00 ns tCKQ1 Clock High to New Data Valid on DO (flow-through) 2.39 ns tCKQ2 Clock High to New Data Valid on DO (pipelined) 0.91 ns tRCKEF RCLK High to Empty Flag Valid 1.74 ns tWCKFF WCLK High to Full Flag Valid 1.66 ns tCKAF Clock HIGH to Almost Empty/Full Flag Valid 6.29 ns tRSTFG RESET_B Low to Empty/Full Flag Valid 1.72 ns tRSTAF RESET_B Low to Almost Empty/Full Flag Valid 6.22 ns tRSTBQ RESET_B Low to Data Out Low on DO (flow-through) 0.94 ns RESET_B Low to Data Out Low on DO (pipelined) 0.94 ns tREMRSTB RESET_B Removal 0.29 ns tRECRSTB RESET_B Recovery 1.52 ns tMPWRSTB RESET_B Minimum Pulse Width 0.22 ns tCYC Clock Cycle Time 3.28 ns FMAX Maximum Frequency for FIFO 305 MHz Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 76 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Embedded Nonvolatile Memory Block (eNVM) Electrical Characteristics Table 2-87 describes the eNVM maximum performance. Table 2-87 * eNVM Block Timing, Worst Commercial Case Conditions: TJ = 85C, VCC = 1.425 V A2F200 Parameter Description A2F500 -1 Std. -1 Std. Units tFMAXCLKeNVM Maximum frequency for clock for the control logic - 6 cycles (6:1:1:1*) 100 N/A 100 80 MHz tFMAXCLKeNVM Maximum frequency for clock for the control logic - 5 cycles (5:1:1:1*) 80 80 50 50 MHz Note: *6:1:1:1 indicates 6 cycles for the first access and 1 each for the next three accesses. 5:1:1:1 indicates 5 cycles for the first access and 1 each for the next three accesses. Embedded FlashROM (eFROM) Electrical Characteristics Table 2-88 describes the eFROM maximum performance Table 2-88 * FlashROM Access Time, Worse Commercial Case Conditions: TJ = 85C, VCC = 1.425 V Parameter Description -1 Units tCK2Q Clock to out 28.68 ns Fmax Maximum Clock frequency 15.00 MHz JTAG 1532 Characteristics JTAG timing delays do not include JTAG I/Os. To obtain complete JTAG timing, add I/O buffer delays to the corresponding standard selected; refer to the I/O timing characteristics in the "User I/O Characteristics" section on page 2-21 for more details. Timing Characteristics Table 2-89 * JTAG 1532 Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tDISU Test Data Input Setup Time 0.67 ns tDIHD Test Data Input Hold Time 1.33 ns tTMSSU Test Mode Select Setup Time 0.67 ns tTMDHD Test Mode Select Hold Time 1.33 ns tTCK2Q Clock to Q (data out) 8.00 ns tRSTB2Q Reset to Q (data out) 26.67 ns FTCKMAX TCK Maximum Frequency 19.00 MHz Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. Revision 4 2- 77 SmartFusion DC and Switching Characteristics Table 2-89 * JTAG 1532 Worst Commercial-Case Conditions: TJ = 85C, Worst-Case VCC = 1.425 V Parameter Description -1 Units tTRSTREM ResetB Removal Time 0.00 ns tTRSTREC ResetB Recovery Time 0.27 ns tTRSTMPW ResetB Minimum Pulse ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values. 2- 78 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Programmable Analog Specifications Current Monitor Unless otherwise noted, current monitor performance is specified at 25C with nominal power supply voltages, with the output measured using the internal voltage reference with the internal ADC in 12-bit mode and 91 Ksps, after digital compensation. All results are based on averaging over 16 samples. Table 2-90 * Current Monitor Performance Specification Specification Test Conditions Input voltage range (for driving ADC over full range)* Analog gain Min. Typical Max. Units 0 - 48 0 - 50 1 - 51 mV From the differential voltage across the input pads to the ADC input Input referred offset voltage 50 V/V -2.3 mV 0.5 % nom. (0.4 + 1.5%) mV plus % reading Gain error Slope of BFSL vs. 50 V/V Overall Accuracy Peak error from ideal transfer function, 25C Input referred noise 0 VDC input (no output averaging) 0.6 mVrms Common-mode rejection ratio 0 V to 12 VDC common-mode voltage 84 dB Analog settling time To 0.1% of final value (with ADC load) From CM_STB (High) 5 From ADC_START (High) 5 Input capacitance Input biased current s 200 s 8 pF Strobe = 0; IBIAS on CM[n] 0 A Strobe = 1; IBIAS on CM[n] 1 A Strobe = 0; IBIAS on TM[n] 2 A Strobe = 1; IBIAS on TM[n] 1 A 48 dB 150 A 140 A 50 A CM[n] or TM[n] pad, -40C to +100C over maximum input voltage range (plus is into pad) Power supply rejection ratio DC (0 - 10 KHz) Incremental operational current VCC33A monitor power supply current VCC33AP requirements (per current monitor instance, not including ADC or VCC15A VAREFx) Note: Under no condition should the TM pad ever be greater than 10 mV above than the CM pad. Revision 4 2- 79 SmartFusion DC and Switching Characteristics Temperature Monitor Unless otherwise noted, temperature monitor performance is specified with a 2N3904 diode-connected bipolar transistor from National Semiconductor or Infineon Technologies, nominal power supply voltages, with the output measured using the internal voltage reference with the internal ADC in 12-bit mode and 62.5 Ksps. After digital compensation. Unless otherwise noted, the specifications pertain to conditions where the SmartFusion device and the sensing diode are at the same temperature. Table 2-91 * Temperature Monitor Performance Specifications Specification Test Conditions Input diode temperature range Min. Max. Units -55 150 C 233.2 378.15 K Temperature sensitivity Typical 2.5 mV/K Extrapolated to 0K 0 V Input referred temperature offset At 25C (298.15K) error 1 C Gain error Slope of BFSL vs. 2.5 mV/K 1 % nom. Overall accuracy Peak error from ideal transfer function 2 C Input referred noise At 25C (298.15K) - no output averaging 4 C rms Output current Idle mode 100 A Final measurement phases 10 A Intercept Analog settling time Measured to 0.1% of final value, (with ADC load) From TM_STB (High) 5 From ADC_START (High) 5 s AT parasitic capacitance Power supply rejection ratio Input referred sensitivity error DC (0-10 KHz) temperature Variation due to device temperature (-40C to +100C). External temperature sensor held constant. Temperature monitor (TM) VCC33A operational power supply current VCC33AP requirements (per temperature monitor instance, not including ADC VCC15A or VAREFx) Note: All results are based on averaging over 64 samples. 2- 80 R e visio n 4 105 s 500 pF 48 C/V 0.0075 C/C 200 A 150 A 50 A Actel SmartFusion Intelligent Mixed Signal FPGAs Temperature Error Versus External Capacitance 1 0 Temperature Error (C) -1 -2 -3 -4 -5 -6 -7 1.00E -06 1.00E -05 1.00E -04 1.00E -03 1.00E -02 1.00E -01 1.00E+00 Capacitance (F) Figure 2-42 * Temperature Error Versus External Capacitance Analog-to-Digital Converter (ADC) Unless otherwise noted, ADC direct input performance is specified at 25C with nominal power supply voltages, with the output measured using the external voltage reference with the internal ADC in 12-bit mode and 500 KHz sampling frequency, after trimming and digital compensation. Table 2-92 * ADC Specifications Specification Test Conditions Min. Typ. Max. Units Input voltage range (for driving ADC over its full range) 2.56 Gain error 0.1 0.2 % 1 2 mV Input referred offset voltage Integral non-linearity (INL) V RMS deviation from BFSL Differential non-linearity (DNL) 10-bit mode 0.8 LSB 8-bit mode 0.2 LSB 12-bit mode 2.4 LSB 10-bit mode 0.6 LSB 8-bit mode 0.2 LSB 64 dB 10.4 Bits 12-bit mode 100 KHz 10 Bits 10-bit mode 10 KHz 9.6 Bits 10-bit mode 100 KHz 9.5 Bits 8-bit mode 10 KHz 7.9 Bits 8-bit mode 100 KHz 7.9 Bits Signal to noise ratio Effective number of bits (ENOB) -1 dBFS input - 1.76 dBENOB = SINAD -------------------------------------------6.02 dB/bit EQ 10 12-bit mode 10 KHz Note: All 3.3 V supplies are tied together and varied from 3.0 V to 3.6 V. 1.5 V supplies are held constant. Revision 4 2- 81 SmartFusion DC and Switching Characteristics Table 2-92 * ADC Specifications (continued) Specification Test Conditions Min. Typ. Full power bandwidth At -3 dB; -1 dBFS input Analog settling time To 0.1% of final value (with 1 Kohm source impedance and with ADC load) 2 Input capacitance Switched capacitance capacitor) 12 Max. 300 (ADC sample Units KHz s 15 pF Cs: Static capacitance (Figure 2-43) CM[n] input 3 pF TM[n] input 3 pF 3 pF 2 K ADC[n] input Input resistance Rin: Series resistance (Figure 2-43) Rsh: Shunt resistance, exclusive of switched capacitance effects (Figure 2-43) Input leakage current Power supply rejection ratio2 10 M -40C to +100C 1 A DC 52 dB ADC power supply operational current VCC33ADCx requirements VCC15A 2.5 mA 2 mA Note: All 3.3 V supplies are tied together and varied from 3.0 V to 3.6 V. 1.5 V supplies are held constant. Rin Cst Csw Figure 2-43 * ADC Input Model 2- 82 R e visio n 4 Rsh Actel SmartFusion Intelligent Mixed Signal FPGAs Analog Bipolar Prescaler (ABPS) With the ABPS set to its high range setting (GDEC = 00), a hypothetical input voltage in the range -15.36 V to +15.36 V is scaled and offset by the ABPS input amplifier to match the ADC full range of 0 V to 2.56 V using a nominal gain of -0.08333 V/V. However, due to reliability considerations, the voltage applied to the ABPS input should never be outside the range of -11.5 V to +14.4 V, restricting the usable ADC input voltage to 2.238 V to 0.080 V and the corresponding 12-bit output codes to the range of 3581 to 128 (decimal), respectively. Unless otherwise noted, ABPS performance is specified at 25C with nominal power supply voltages, with the output measured using the internal voltage reference with the internal ADC in 12-bit mode and 100 KHz sampling frequency, after trimming and digital compensation; and applies to all ranges. Table 2-93 * ABPS Performance Specifications Specification Test Conditions Min. Typ. Max. Units Input voltage range (for driving ADC GDEC[1:0] = 11 over its full range) GDEC[1:0] = 10 2.56 V 5.12 V GDEC[1:0] = 01 10.24 V See note 1 V GDEC[1:0] = 00 maximum rating) (limited by Analog gain (from input pad to ADC GDEC[1:0] = 11 input) GDEC[1:0] = 10 -0.5 V/V -0.25 V/V GDEC[1:0] = 01 -0.125 V/V GDEC[1:0] = 00 -0.0833 V/V 1 % GDEC[1:0] = 11 -3.8 mV GDEC[1:0] = 10 -7.5 mV GDEC[1:0] = 01 -15 mV GDEC[1:0] = 00 -22 mV 60 dB Gain error Input referred offset voltage SINAD Non-linearity RMS deviation from BFSL Effective number of bits (ENOB) GDEC[1:0] = 11 (2.56 range), -1 dBFS input - 1.76 dBENOB = SINAD -------------------------------------------6.02 dB/bit EQ 11 0.5 % FR 12-bit mode 10 KHz 9.8 Bits 12-bit mode 100 KHz 9.8 Bits 10-bit mode 10 KHz 9.2 Bits 10-bit mode 100 KHz 9.2 Bits 8-bit mode 10 KHz 7.8 Bits 8-bit mode 100 KHz 7.8 Bits 1 MHz Large-signal bandwidth -1 dBFS input Analog settling time To 0.1% of final value (with ADC load) Input resistance 10 1 Revision 4 s M 2- 83 SmartFusion DC and Switching Characteristics Table 2-93 * ABPS Performance Specifications (continued) Specification Test Conditions Power supply rejection ratio DC (0-1 KHz) ABPS power supply current requirements (not including ADC or VAREFx) ABPS_EN = 1 (operational mode) Min. Typ. Max. Units 85 dB VCC33A 130 A VCC33AP 81 A VCC15A 1 A Comparator Unless otherwise specified, performance is specified at 25C with nominal power supply voltages. Table 2-94 * Comparator Performance Specifications Specification Test Conditions Input voltage range Minimum 0 V Maximum 2.56 V Input offset voltage Min. HYS[1:0] = 00 Typ. 1 Max. 3 Units mV (no hysteresis) Input bias current Measured at 2.56 V 40 nA 10 M DC (0 - 10 KHz) 60 dB 100 mV overdrive 15 ns 25 ns 0 mV ( refers to rising and falling threshold HYS[1:0] = 01 shifts, respectively) HYS[1:0] = 10 10 mV 30 mV HYS[1:0] = 11 100 mV VCC33A 150 A VCC33AP 140 A 1 A Input resistance Power supply rejection ratio Propagation delay HYS[1:0] = 00 (no hysteresis) 100 mV overdrive HYS[1:0] = 10 (with hysteresis) Hysteresis Comparator current requirements HYS[1:0] = 00 VCC33A = 3.3 V COMP_EN = 1 (operational mode); VCC15A 2- 84 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Analog Sigma-Delta Digital to Analog Converter (DAC) Unless otherwise noted, sigma-delta DAC performance is specified at 25C with nominal power supply voltages, using the internal sigma-delta modulators with 16-bit inputs, HCLK = 100 MHz, modulator inputs updated at a 100 KHz rate, in voltage output mode with an external 160 pF capacitor to ground, after trimming and digital [pre-]compensation. Table 2-95 * Analog Sigma-Delta DAC Specification Test Conditions Resolution Min. Typ. Max. Units 8 16 24 bits Output range Current output mode Output Impedance Current output mode Output voltage compliance Current output mode Gain error Current output mode Output referred offset Integral non-linearity V 0 to 256 A 10 K 80 M 0-3.0 V 1 % 1 % With respect to GNDSDDx 1 mV Current output mode 1 A RMS deviation from BFSL 0.5 %FR 0.1 %FR Refer to Figure 2-44 on page 2-86 s 67 dB VCC33SDDx 30 A VCC15A 40 A VCC33SDDx 160 A VCC15A 40 A VCC33SDDx 290 A VCC15A 40 A Differential non-linearity Analog settling time Power supply rejection ratio 10 0 to 2.56 DC, full scale output Sigma-delta DAC power supply current Input = 0, EN = 1 requirements (not including VAREFx) (operational mode) Input = Half scale, EN = 1 (operational mode) Input = Full scale, EN = 1 (operational mode) Revision 4 2- 85 SmartFusion DC and Switching Characteristics Sigma Delta DAC Settling Time 220 200 180 Settling Time (us) 160 140 120 100 80 60 40 20 0 0 1 2 3 4 5 6 7 8 9 Input Code Figure 2-44 * Sigma-Delta DAC Setting Time 2- 86 R e visio n 4 10 32 48 64 128 255 Actel SmartFusion Intelligent Mixed Signal FPGAs Voltage Regulator Table 2-96 * Voltage Regulator Symbol Parameter Test Conditions VOUT Output voltage VOS Output offset voltage TJ = 25C ICC33A Operation current TJ = 25C TJ = 25C Min. Typ. Max. Unit 1.425 1.5 1.575 V 11 mV ILOAD = 1 mA 3.4 mA ILOAD = 100 mA 11 mA ILOAD = 0.5 A 21 mA VOUT Load regulation TJ = 25C ILOAD = 1mA to 0.5 A 5.8 mV VOUT Line regulation TJ = 25C VCC33A = 2.97 V to 3.63 V 5.3 mV/V 5.3 mV/V 5.3 mV/V ILOAD = 1 mA 0.63 V ILOAD = 100 mA 0.84 V ILOAD = 0.5 A 1.35 V ILOAD = 1 mA 48 A ILOAD = 100 mA 736 A ILOAD = 0.5 A 12 mA 200 ms ILOAD = 1 mA VCC33A = 2.97 V to 3.63 V ILOAD= 100 mA VCC33A = 2.97 V to 3.63 V ILOAD = 500mA Dropout voltage1 IPTBASE PTBase current 2 Startup time TJ = 25C TJ = 25C TJ = 25C Notes: 1. *Dropout voltage is defined as the minimum VCC33A voltage. The parameter is specified with respect to the output voltage. The specification represents the minimum input-to-output differential voltage required to maintain regulation. 2. Assumes 10 f. Revision 4 2- 87 SmartFusion DC and Switching Characteristics Typical Output Voltage 0.015 Load = 10 mA 0.01 Load = 100 mA Offset Voltage (V) 0.005 Load = 500 mA 0 -0.005 -0.01 -0.015 -0.02 -0.025 -40 -20 0 20 40 60 80 100 Temperature (C) Figure 2-45 * Typical Output Voltage Change in Output Voltage with Load (mV) Load Regulation 0 -1 -2 -3 -4 -5 -6 -7 -8 -9 -10 -40 -20 0 20 40 Temperature (C) Figure 2-46 * Load Regulation 2- 88 R e visio n 4 60 80 100 Actel SmartFusion Intelligent Mixed Signal FPGAs Serial Peripheral Interface (SPI) Characteristics This section describes the DC and switching of the SPI interface. Unless otherwise noted, all output characteristics given for a 35 pF load on the pins and all sequential timing characteristics are related to SPI_x_CLK. For timing parameter definitions, refer to Figure 2-47 on page 2-90. Table 2-97 * SPI Characteristics Commercial Case Conditions: TJ = 85C, VDD = 1.425 V, -1 Speed Grade Symbol sp1 sp2 sp3 Description and Condition A2F200 A2F500 Unit SPI_x_CLK = PCLK/2 NA 20 ns SPI_x_CLK = PCLK/4 40 40 ns SPI_x_CLK = PCLK/8 80 80 ns SPI_x_CLK = PCLK/16 0.16 0.16 s SPI_x_CLK = PCLK/32 0.32 0.32 s SPI_x_CLK = PCLK/64 0.64 0.64 s SPI_x_CLK = PCLK/128 1.28 1.28 s SPI_x_CLK = PCLK/256 2.56 2.56 s SPI_x_CLK = PCLK/2 NA 10 ns SPI_x_CLK = PCLK/4 20 20 ns SPI_x_CLK = PCLK/8 40 40 ns SPI_x_CLK = PCLK/16 0.08 0.08 s SPI_x_CLK = PCLK/32 0.16 0.16 s SPI_x_CLK = PCLK/64 0.32 0.32 s SPI_x_CLK = PCLK/128 0.64 0.64 s SPI_x_CLK = PCLK/256 1.28 1.28 us SPI_x_CLK = PCLK/2 NA 10 ns SPI_x_CLK = PCLK/4 20 20 ns SPI_x_CLK = PCLK/8 40 40 ns SPI_x_CLK = PCLK/16 0.08 0.08 s SPI_x_CLK = PCLK/32 0.16 0.16 s SPI_x_CLK = PCLK/64 0.32 0.32 s SPI_x_CLK = PCLK/128 0.64 0.64 s 1.28 1.28 s 4.7 4.7 ns 3.4 3.4 ns SPI_x_CLK minimum period SPI_x_CLK minimum pulse width high SPI_x_CLK minimum pulse width low SPI_x_CLK = PCLK/256 sp4 sp5 SPI_x_CLK, SPI_x_DO, SPI_x_SS rise time (10%-90%) SPI_x_CLK, SPI_x_DO, SPI_x_SS fall time (10%-90%) 1 1 Notes: 1. These values are provided for a load of 35 pF. For board design considerations and detailed output buffer resistances, use the corresponding IBIS models located on the Actel website: http://www.actel.com/download/ibis/default.aspx. 2. For allowable pclk configurations, refer to the Serial Peripheral Interface Controller section in the SmartFusion Microcontroller Subsystem User's Guide. Revision 4 2- 89 SmartFusion DC and Switching Characteristics Table 2-97 * SPI Characteristics Commercial Case Conditions: TJ = 85C, VDD = 1.425 V, -1 Speed Grade (continued) Symbol Description and Condition sp6 Data from master (SPI_x_DO) setup time sp7 2 Data from master (SPI_x_DO) hold time sp8 SPI_x_DI setup time sp9 2 SPI_x_DI hold time A2F200 A2F500 Unit 1 1 pclk cycles 1 1 pclk cycles 1 1 pclk cycles 1 1 pclk cycles 2 2 Notes: 1. These values are provided for a load of 35 pF. For board design considerations and detailed output buffer resistances, use the corresponding IBIS models located on the Actel website: http://www.actel.com/download/ibis/default.aspx. 2. For allowable pclk configurations, refer to the Serial Peripheral Interface Controller section in the SmartFusion Microcontroller Subsystem User's Guide. SP1 SP4 SP2 SP5 SP3 90% 50% 50% SPI_x_CLK SPO = 0 50% 10% 10% SPI_x_CLK SPO = 1 90% 90% SPI_x_SS 10% 1 0% SP4 SP5 SP6 SP7 90% 9 0% SPI_x_DO 5 0% 5 0% 10% SP8 SPI_x_DI MSB 50% SP9 MSB SP5 10% SP4 50% Figure 2-47 * SPI Timing for a Single Frame Transfer in Motorola Mode (SPH = 1) 2- 90 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Inter-Integrated Circuit (I2C) Characteristics This section describes the DC and switching of the I2C interface. Unless otherwise noted, all output characteristics given are for a 100 pF load on the pins. For timing parameter definitions, refer to Figure 248 on page 2-92. Table 2-98 * I2C Characteristics Commercial Case Conditions: TJ = 85C, VDD = 1.425 V, -1 Speed Grade Parameter Condition Value Unit Minimum input low voltage - SeeTable 2-35 on page 2-32 - Maximum input low voltage - See Table 2-35 - Minimum input high voltage - See Table 2-35 - Maximum input high voltage - See Table 2-35 - VOL Maximum output voltage low IOL = 8 mA See Table 2-35 - IIL Input current high - See Table 2-35 - IIH Input current low - See Table 2-35 - Vhyst Hysteresis of Schmitt trigger inputs - See Table 2-32 on page 2-31 V TFALL Fall time 2 VIHmin to VILMax, Cload = 400 pF 15.0 ns VIHmin to VILMax, Cload = 100 pF 4.0 ns VILMax to VIHmin, Cload = 400pF 19.5 ns VILMax to VIHmin, Cload = 100pF 5.2 ns VIN = 0, f = 1.0 MHz 8.0 pF VIL VIH TRISE Definition Rise time 2 Cin Pin capacitance Rpull-up Output buffer maximum pulldown Resistance 1 - 50 Rpull-down Output buffer maximum pull-up Resistance 1 - 150 Dmax Maximum data rate Fast mode 400 Kbps tLOW Low period of I2C_x_SCL 3 - 1 pclk cycles tHIGH 3 - 1 pclk cycles - 1 pclk cycles - 1 pclk cycles - 1 pclk cycles - 1 pclk cycles tHD;STA High period of I2C_x_SCL START hold time 3 tSU;STA START setup time tHD;DAT DATA hold time 3 tSU;DAT DATA setup time 3 3 Notes: 1. These maximum values are provided for information only. Minimum output buffer resistance values depend on VCCxxxxIOBx, drive strength selection, temperature, and process. For board design considerations and detailed output buffer resistances, use the corresponding IBIS models located on the Actel website at http://www.actel.com/download/ibis/default.aspx. 2. These values are provided for a load of 100 pF and 400 pF. For board design considerations and detailed output buffer resistances, use the corresponding IBIS models located on the Actel website at http://www.actel.com/download/ibis/default.aspx. 3. For allowable Pclk configurations, refer to the Inter-Integrated Circuit (I2C) Peripherals section in the SmartFusion Microcontroller Subsystem User's Guide. Revision 4 2- 91 Table 2-98 * I2C Characteristics Commercial Case Conditions: TJ = 85C, VDD = 1.425 V, -1 Speed Grade (continued) Parameter Definition 3 tSU;STO STOP setup time tFILT Maximum spike width filtered Condition Value Unit - 1 pclk cycles - 50 ns Notes: 1. These maximum values are provided for information only. Minimum output buffer resistance values depend on VCCxxxxIOBx, drive strength selection, temperature, and process. For board design considerations and detailed output buffer resistances, use the corresponding IBIS models located on the Actel website at http://www.actel.com/download/ibis/default.aspx. 2. These values are provided for a load of 100 pF and 400 pF. For board design considerations and detailed output buffer resistances, use the corresponding IBIS models located on the Actel website at http://www.actel.com/download/ibis/default.aspx. 3. For allowable Pclk configurations, refer to the Inter-Integrated Circuit (I2C) Peripherals section in the SmartFusion Microcontroller Subsystem User's Guide. SDA TRISE SCL tLOW tSU;STA S tHD;STA TFALL tHIGH tHD;DAT tSU;DAT tSU;STO P Figure 2-48 * I2C Timing Parameter Definition 3 - SmartFusion Development Tools SmartFusionTM applications will be developed by a multi-discipline team of designers working on one project or one designer acting in several roles. Actel has developed design tools and flows to meet the needs of three different skilled designers that can work smoothly together in a single project (Figure 3-1). * FPGA designers * Embedded software designers * Analog designers Embedded Design FPGA Design MSS Configurator MSS Configuration - Analog Configuration Design Entry, IP Library Simulation, Synthesis Compile, Layout Timing, Power Analysis Hardware Debug Drivers, Sample Projects Application Development Build Project Simulation Software Debug Hardware Interfaces FlashPro4, ULINK, J-LINK Figure 3-1 * Three Design Roles For FPGA designers, Libero(R) Integrated Design Environment (IDE) is Actel's comprehensive toolset for designing with all Actel FPGAs. Libero IDE includes industry leading synthesis, simulation, and placeand-route debug tools, including Synplicity(R) and ModelSim,(R) as well as innovative timing, power optimization, and power analysis. For embedded designers, Actel offers FREE SoftConsole Eclipse-based IDE, as well as evaluation versions from KeilTM and IAR Systems. Full versions of the latter are available from the respective suppliers. For analog designers, the microcontroller subsystem (MSS) configurator provides graphical setup for current, voltage, and temperature monitors, sample sequencing setup and post processing configuration, and DAC output. The MSS configurator creates a bridge between the FPGA and embedded designers so device configuration can be easily shared between multiple developers. Revision 4 3 -1 SmartFusion Development Tools The MSS configurator includes the following: * A simple configurator for the embedded designer to control the MSS peripherals and I/Os * A method to import and view a hardware configuration from the FPGA flow into the embedded flow containing the memory map * Automatic generation of drivers for any peripherals or soft IP used in the system configuration * Comprehensive analog configuration for the programmable analog components * Creation of a standard MSS block to be used in SmartDesign for connection of FPGA fabric designs and IP SmartFusion Ecosystem Actel has a long history of supplying comprehensive FPGA development tools and recognizes the benefit of partnering with industry leaders to deliver the optimum usability and productivity to users. Taking the same approach to processor development, Actel has partnered with key industry leaders in the microcontroller space to provide a robust solution that can be easily adopted by existing embedded developers and has an easy learning path for FPGA designers. Actel is partnering with Keil and IAR to provide software IDE support to SmartFusion Designers. In addition, Micrium provides support for SmartFusion with its new C/OS-III,TM TCP/IP,TM and C/ProbeTM products (Table 3-1 on page 3-3). Support for the Actel device and ecosystem resources is represented in Figure 3-2. Application Code RTOS HAL Physical Layer Figure 3-2 * Third Party TCP, HTTP, SMTP DHCP, LCD Protocol Stacks, File Systems, Interfaces Middleware Third Party C/OSII NVM Driver Timer Driver Ethernet Driver UART Driver SPI Driver RTOS - Real-Time Operating System 12C Driver Drivers Customer Alogorithms/ Intellectual Property Application Layer Actel or Third Party For Hard IP or Soft IP I2C, SPI, UART, NVM RAM, 10/100, Timer Hardware Abstraction Layer Actel CMSIS-based Target Hardware Platform Actel SmartFusion SmartFusion Ecosystem Starting from the base up, the ARM(R) CortexTM Microcontroller Software Interface Standard (CMSIS) hardware abstraction layer (HAL) is built on top of the SmartFusion hardware platform. Each of the peripherals has its own driver, whether it is hard IP or soft IP added in the FPGA fabric. Then on top of that we will work with third party real-time operating system (RTOS) vendors for OS, protocol stacks, and interfaces. A designer can add a custom application with all, some, or none of the layers below. 3-2 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Software Integrated Design Environment (IDE) Choices Software IDE SoftConsole Vision IDE Embedded Workbench www.actel.com www.keil.com www.iar.com Free with Libero IDE 32 K code limited 32 K code limited N/A Full version Full version Compiler GNU GCC RealView C/C++ IAR ARM Compiler Debugger GDB debug Vision Debugger C-SPY Debugger No Vision Simulator Yes FlashPro4 ULINK2 or ULINK-ME J-LINK or J-LINK Lite Website Free versions from Actel Available from Vendor Instruction Set Simulator Debug Hardware Operating System and Middleware Support Micrium is recognized as a leader in embedded software components. The company's flagship C/OS family is recognized for a variety of features and benefits, including unparalleled reliability, performance, dependability, impeccable source code, and vast documentation, available from www.micrium.com Table 3-1 * Micrium Embedded Software Components C/OS-III,TM Micrium's newest RTOS, is designed to save time on your next embedded project and puts greater control of the software in your hands, yet maintains Micrium's ease-of-use, ease-of-integration, short learning curve, unsurpassed documentation, and clean code. C/TCP-IPTM is a compact, reliable, and high-performance stack built from the ground up by Micrium and has the quality, scalability, and reliability that translates into a rapid configuration of network options, remarkable ease-ofuse, and rapid time-to-market. Revision 4 C/ProbeTM is one of the most useful tools in embedded systems design and puts you in the driver's seat, allowing you to take charge of virtually any variable, memory location, and I/O port in your embedded product, while your system is running--there's no need to stop. 3 -3 4 - SmartFusion Programming SmartFusion devices have three separate flash areas that can be programmed: 1. The FPGA fabric 2. The embedded nonvolatile memories (eNVMs) 3. The embedded flash ROM (eFROM) There are essentially three methodologies for programming these areas: 1. In-system programming (ISP) 2. In-application programming (IAP)--only the FPGA Fabric and the eNVM 3. Pre-programming (non-ISP) Programming, whether ISP or IAP methodologies are employed, can be done in two ways: 1. Securely using the on chip AES decryption logic 2. In plain text In-System Programming In-System Programming is performed with the aid of external JTAG programming hardware. Table 4-1 describes the JTAG programming hardware that will program a SmartFusion device and Table 4-2 defines the JTAG pins that provide the interface for the programming hardware. Table 4-1 * Supported JTAG Programming Hardware Source JTAG SWD1 SWV2 Program FPGA Program eFROM Program eNVM FlashPro3/4 Actel Yes No No Yes Yes Yes ULINK Pro Keil Yes Yes Yes Yes Yes Yes ULINK2 Keil Yes Yes Yes Yes Yes Yes IAR J-Link IAR Yes Yes Yes Yes Yes Yes Dongle Notes: 1. SWD = ARM Serial Wire Debug 2. SWV = ARM Serial Wire Viewer Table 4-2 * SmartFusion JTAG Pin Descriptions Pin Name Description JTAGSEL ARM Cortex-M3 or FPGA test access port (TAP) controller selection TRSTB Test reset bar TCK Test clock TMS Test mode select TDI Test data input TDO Test data output The JTAGSEL pin selects the FPGA TAP controller or the Cortex-M3 debug logic. When JTAG SEL is asserted, the FPGA TAP controller is selected and the TRSTB input into the Cortex-M3 is held in a reset state (logic 0), as depicted in Figure 4-1. Users should tie the JTAGSEL pin high externally. Revision 4 4 -5 SmartFusion Programming Note: Standard ARM JTAG connectors do not have access to the JTAGSEL pin. Actel's free Eclipsebased IDE, Soft Console, automatically sets JTAGSEL via FlashPro4 to the appropriate state for programming all memory regions. VJTAG (1.5 V to 3.3. V nominal) TAP Controller JTAG_SEL TRSTB FPGA TAP Controller Figure 4-1 * Cortex-M3 TRSTB FPGA Programming Control TRSTB Logic In-Application Programming In-application programming refers to the ability to reprogram the various flash areas under direct supervision of the Cortex-M3. Reprogramming the FPGA Fabric Using the Cortex-M3 In this mode, the Cortex-M3 is executing the programming algorithm on-chip. The IAP driver can be incorporated into the design project and executed from eNVM or eSRAM. Actel provides working example projects for SoftConsole, IAR, and Keil development environments. These can be downloaded via the Actel Firmware Catalog. The new bitstream to be programmed into the FPGA can reside on the user's printed circuit board (PCB) in a separate SPI flash memory. Alternately, the user can modify the existing projects supplied by Actel and, via custom handshaking software, throttle the download of the new image and program the FPGA a piece at a time in real time. A cost-effective and reliable approach would be to store the bitstream in an external SPI flash. Another option is storing a redundant bitstream image in an external SPI flash and loading the newest version into the FPGA only when receiving an IAP command. Since the FPGA I/Os are tristated or held at predefined or last known state during FPGA programming, the user must use MSS I/Os to interface to external memories. Since there are two SPI controllers in the MSS, the user can dedicate one to an SPI flash and the other to the particulars of an application. The amount of flash memory required to program the FPGA always exceeds the size of the eNVM block that is on-chip. The external memory controller (EMC) cannot be used as an interface to a memory device for storage of a bitstream because its I/O pads are FPGA I/Os; hence they are tristated when the FPGA is in a programming state. 4-6 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Re-Programming the eNVM Blocks Using the Cortex-M3 In this mode the Cortex-M3 is executing the eNVM programming algorithm from eSRAM. Since individual pages (132 bytes) of the eNVM can be write-protected, the programming algorithm software can be protected from inadvertent erasure. When reprogramming the eNVM, both MSS I/Os and FPGA I/Os are available as interfaces for sourcing the new eNVM image. Actel provides working example projects for SoftConsole, IAR, and Keil development environments. These can be downloaded via the Actel Firmware Catalog. Alternately, the eNVM can be reprogrammed by the Cortex-M3 via the IAP driver. This is necessary when using an encrypted image. Secure Programming For background, refer to the Security in Low Power Flash Devices application note on the Actel website. SmartFusion Secure ISP behaves identically to Fusion Secure ISP. Secure IAP of SmartFusion devices is accomplished by using the IAP driver. Only the FPGA fabric and the eNVM can be reprogrammed securely by using the IAP driver. Typical Programming and Erase Times Table 4-3 documents the typical programming and erase times for two components of SmartFusion devices, FPGA fabric and eNVM, using Actel's FlashPro hardware and software. These times will be different for other ISP and IAP methods. The Program action in FlashPro software includes erase, program, and verify to complete. The typical programming (including erase) time per page of the eNVM is 8 ms. Table 4-3 * Typical Programming and Erase Times FPGA Fabric (seconds) eNVM (seconds) A2F200 A2F500 A2F200 A2F500 Erase 21 21 N/A N/A Program 8 15 18 26 Verify 9 16 26 42 References Application Notes In-System Programming (ISP) of Actel's Low-Power Flash Devices Using FlashPro3 http://www.actel.com/documents/LPD_ISP_HBs.pdf Security in Low Power Flash Devices http://www.actel.com/documents/LPD_Security_HBs.pdf Programming Flash Devices http://www.actel.com/documents/Flash_Program_HBs.pdf Microprocessor Programming of Actel's Low-Power Flash Devices http://www.actel.com/documents/LPD_Microprocessor_HBs.pdf User's Guides DirectC User's Guide http://www.actel.com/documents/DirectC_UG.pdf Revision 4 4 -7 Actel SmartFusion Intelligent Mixed Signal FPGAs 5 - Pin Descriptions Supply Pins Name Type Description GND Ground Digital ground to the FPGA fabric, microcontroller subsystem and GPIOs GND15ADC0 Ground Quiet analog ground to the 1.5 V circuitry of the first analog-to-digital converter (ADC) GND15ADC1 Ground Quiet analog ground to the 1.5 V circuitry of the second ADC GND15ADC2 Ground Quite analog ground to the 1.5 V circuitry of the third ADC GND33ADC0 Ground Quiet analog ground to the 3.3 V circuitry of the first ADC GND33ADC1 Ground Quiet analog ground to the 3.3 V circuitry of the second ADC GND33ADC2 Ground Quiet analog ground to the 3.3 V circuitry of the third ADC GNDA Ground Quiet analog ground to the analog front-end GNDAQ Ground Quiet analog ground to the analog I/O of Actel SmartFusionTM devices GNDENVM Ground Digital ground to the embedded nonvolatile memory (eNVM) GNDLPXTAL Ground Analog ground to the low power 32 KHz crystal oscillator circuitry GNDMAINXTAL Ground Analog ground to the main crystal oscillator circuitry GNDQ Ground Quiet digital ground supply voltage to input buffers of I/O banks. Within the package, the GNDQ plane is decoupled from the simultaneous switching noise originated from the output buffer ground domain. This minimizes the noise transfer within the package and improves input signal integrity. GNDQ needs to always be connected on the board to GND. GNDRCOSC Ground Analog ground to the integrated RC oscillator circuit GNDSDD0 Ground Analog ground to the first sigma-delta DAC GNDSDD1 Ground Common analog ground to the second and third sigma-delta DACs GNDTM0 Ground Analog temperature monitor common ground for signal conditioning blocks SCB 0 and SCB 1 (see information for pins "TM0" and "TM1" in the "Analog Front-End (AFE)" section on page 5-12). GNDTM1 Ground Analog temperature monitor common ground for signal conditioning block SCB 2 and SBCB 3 (see information for pins "TM2" and "TM3" in the "Analog Front-End (AFE)" section on page 5-12). GNDTM2 Ground Analog temperature monitor common ground for signal conditioning block SCB4 GNDVAREF Ground Analog ground reference used by the ADC. This pad should be connected to a quiet analog ground. VCC Supply Digital supply to the FPGA fabric and MSS, nominally 1.5 V. VCC is also required for powering the JTAG state machine, in addition to VJTAG. Even when a SmartFusion device is in bypass mode in a JTAG chain of interconnected devices, both VCC and VJTAG must remain powered to allow JTAG signals to pass through the SmartFusion device. Notes: 1. The following 3.3 V supplies should be connected together while following proper noise filtering practices: VCC33A, VCC33ADCx, VCC33AP, VCC33SDDx, VCCMAINXTAL, and VCCLPXTAL. 2. The following 1.5 V supplies should be connected together while following proper noise filtering practices: VCC, VCC15A, and VCC15ADCx. Revision 4 5 -1 Pin Descriptions Name Type Description VCC15A Supply Clean analog 1.5 V supply to the analog circuitry VCC15ADC0 Supply Analog 1.5 V supply to the first ADC VCC15ADC1 Supply Analog 1.5 V supply to the second ADC VCC15ADC2 Supply Analog 1.5 V supply to the third ADC VCC33A Supply Clean 3.3 V analog supply to the analog circuitry. VCC33A is also used to feed the 1.5 V voltage regulator for designs that do not provide an external supply to VCC. Refer to the Voltage Regulator (VR), Power Supply Monitor (PSM), and Power Modes section in the SmartFusion Microcontroller Subsystem User's Guide for more information. VCC33ADC0 Supply Analog 3.3 V supply to the first ADC. VCC33ADC1 Supply Analog 3.3 V supply to the second ADC VCC33ADC2 Supply Analog 3.3 V supply to the third ADC VCC33AP Supply Analog clean 3.3 V supply to the charge pump. To avoid high current draw, VCC33AP should be powered up simultaneously with or after VCC33A. VCC33N Supply -3.3 V output from the voltage converter. A 2.2 F capacitor must be connected from this pin to GND. Analog charge pump capacitors are not needed if none of the analog SCB features are used and none of the SDDs are used. In that case it should be left unconnected. VCC33SDD0 Supply Analog 3.3 V supply to the first sigma-delta DAC VCC33SDD1 Supply Common analog 3.3 V supply to the second and third sigma-delta DACs VCCENVM Supply Digital 1.5 V power supply to the embedded nonvolatile memory blocks. To avoid high current draw, VCC should be powered up before or simultaneously with VCCENVM. VCCFPGAIOB0 Supply Digital supply to the FPGA fabric I/O bank 0 (north FPGA I/O bank) for the output buffers and I/O logic. Each bank can have a separate VCCFPGAIO connection. All I/Os in a bank will run off the same VCCFPGAIO supply. VCCFPGAIO can be 1.5 V, 1.8 V, 2.5 V, or 3.3 V, nominal voltage. Unused I/O banks should have their corresponding VCCFPGAIO pins tied to GND. VCCFPGAIOB1 Supply Digital supply to the FPGA fabric I/O bank 1 (east FPGA I/O bank) for the output buffers and I/O logic. VCCFPGAIOB5 Supply Digital supply to the FPGA fabric I/O bank 5 (west FPGA I/O bank) for the output buffers and I/O logic. Each bank can have a separate VCCFPGAIO connection. All I/Os in a bank will run off the same VCCFPGAIO supply. VCCFPGAIO can be 1.5 V, 1.8 V, 2.5 V, or 3.3 V, nominal voltage. Unused I/O banks should have their corresponding VCCFPGAIO pins tied to GND. Each bank can have a separate VCCFPGAIO connection. All I/Os in a bank will run off the same VCCFPGAIO supply. VCCFPGAIO can be 1.5 V, 1.8 V, 2.5 V, or 3.3 V, nominal voltage. Unused I/O banks should have their corresponding VCCFPGAIO pins tied to GND. VCCLPXTAL Supply Analog supply to the low power 32 KHz crystal oscillator VCCMAINXTAL Supply Analog supply to the main crystal oscillator circuit Notes: 1. The following 3.3 V supplies should be connected together while following proper noise filtering practices: VCC33A, VCC33ADCx, VCC33AP, VCC33SDDx, VCCMAINXTAL, and VCCLPXTAL. 2. The following 1.5 V supplies should be connected together while following proper noise filtering practices: VCC, VCC15A, and VCC15ADCx. 5-2 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Name Type Description VCCMSSIOB2 Supply Supply voltage to the microcontroller subsystem I/O bank 2 (east MSS I/O bank) for the output buffers and I/O logic VCCMSSIOB4 Supply Supply voltage to the microcontroller subsystem I/O bank 4 (west MSS I/O bank) for the output buffers and I/O logic. Each bank can have a separate VCCMSSIO connection. All I/Os in a bank will run off the same VCCMSSIO supply. VCCMSSIO can be 1.5 V, 1.8 V, 2.5 V, or 3.3 V, nominal voltage. Unused I/O banks should have their corresponding VCCMSSIO pins tied to GND. Each bank can have a separate VCCMSSIO connection. All I/Os in a bank will run off the same VCCMSSIO supply. VCCMSSIO can be 1.5 V, 1.8 V, 2.5 V, or 3.3 V, nominal voltage. Unused I/O banks should have their corresponding VCCMSSIO pins tied to GND. VCCPLLx Supply Analog 1.5 V supply to the PLL VCCRCOSC Supply Analog supply to the integrated RC oscillator circuit VCOMPLAx Supply Analog ground for the PLL VDDBAT Supply External battery connection to the low power 32 KHz crystal oscillator (along with VCCLPXTAL), RTC, and battery switchover circuit VJTAG Supply Digital supply to the JTAG controller SmartFusion devices have a separate bank for the dedicated JTAG pins. The JTAG pins can be run at any voltage from 1.5 V to 3.3 V (nominal). Isolating the JTAG power supply in a separate I/O bank gives greater flexibility in supply selection and simplifies power supply and PCB design. If the JTAG interface is neither used nor planned to be used, the VJTAG pin together with the TRSTB pin could be tied to GND. Note that VCC is required to be powered for JTAG operation; VJTAG alone is insufficient. If a SmartFusion device is in a JTAG chain of interconnected boards and it is desired to power down the board containing the device, this can be done provided both VJTAG and VCC to the device remain powered; otherwise, JTAG signals will not be able to transition the device, even in bypass mode. See "JTAG Pins" section on page 5-8. VPP Supply Digital programming circuitry supply SmartFusion devices support single-voltage in-system programming (ISP) of the configuration flash, embedded FlashROM (eFROM), and embedded nonvolatile memory (eNVM). For programming, VPP should be in the 3.3 V 5% range. During normal device operation, VPP can be left floating or can be tied to any voltage between 0 V and 3.6 V. When the VPP pin is tied to ground, it shuts off the charge pump circuitry, resulting in no sources of oscillation from the charge pump circuitry. For proper programming, 0.01 F and 0.33 F capacitors (both rated at 16 V) are to be connected in parallel across VPP and GND, and positioned as close to the FPGA pins as possible. Notes: 1. The following 3.3 V supplies should be connected together while following proper noise filtering practices: VCC33A, VCC33ADCx, VCC33AP, VCC33SDDx, VCCMAINXTAL, and VCCLPXTAL. 2. The following 1.5 V supplies should be connected together while following proper noise filtering practices: VCC, VCC15A, and VCC15ADCx. Revision 4 5 -3 Pin Descriptions User-Defined Supply Pins Name Type Polarity/Bus Size VAREF0 Input 1 Description Analog reference voltage for first ADC The SmartFusion device can be configured to generate a 2.56 V internal reference that can be used by the ADC. While using the internal reference, the reference voltage is output on the VAREFOUT pin for use as a system reference. If a different reference voltage is required, it can be supplied by an external source and applied to this pin. The valid range of values that can be supplied to the ADC is 1.0 V to 3.3 V. When VAREF0 is internally generated, a bypass capacitor must be connected from this pin to ground. The value of the bypass capacitor should be between 3.3 F and 22 F, which is based on the needs of the individual designs. The choice of the capacitor value has an impact on the settling time it takes the VAREF0 signal to reach the required specification of 2.56 V to initiate valid conversions by the ADC. If the lower capacitor value is chosen, the settling time required for VAREF0 to achieve 2.56 V will be shorter than when selecting the larger capacitor value. The above range of capacitor values supports the accuracy specification of the ADC, which is detailed in the datasheet. Designers choosing the smaller capacitor value will not obtain as much margin in the accuracy as that achieved with a larger capacitor value. See the Analog-to-Digital Converter (ADC) section in the SmartFusion Programmable Analog User's Guide for more information. Actel recommends customers use 10 F as the value of the bypass capacitor. Designers choosing to use an external VAREF0 need to ensure that a stable and clean VAREF0 source is supplied to the VAREF0 pin before initiating conversions by the ADC. To use the internal voltage reference, you must connect the VAREFOUT pin to the appropriate ADC VAREFx input--either the VAREF0 or VAREF1 pin--on the PCB. VAREF1 Input 1 Analog reference voltage for second ADC See "VAREF0" above for more information. VAREF2 Input 1 Analog reference voltage for third ADC See "VAREF0" above for more. VAREFOUT 5-4 Out 1 Internal 2.56 V voltage reference output. Can be used to provide the two ADCs with a unique voltage reference externally by connecting VAREFOUT to both VAREF0 and VAREF1. To use the internal voltage reference, you must connect the VAREFOUT pin to the appropriate ADC VAREFx input--either the VAREF0 or VAREF1 pin--on the PCB. R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs User Pins Name Type Polarity/Bus Size GPIO_x In/out 32 Description Microcontroller Subsystem (MSS) General Purpose I/O (GPIO). The MSS GPIO pin functions as an input, output, tristate, or bidirectional buffer with configurable interrupt generation and Schmitt trigger support. Input and output signal levels are compatible with the I/O standard selected. Unused GPIO pins are tristated and do not include pull-up or pull-down resistors. During power-up, the used GPIO pins are tristated with no pull-up or pull-down resistors until Sys boot configures them. Some of these pins are also multiplexed with integrated peripherals in the MSS (SPI, I2C, and UART). GPIOs can be routed to dedicated I/O buffers (MSSIOBUF) or in some cases to the FPGA fabric interface through an IOMUX. This allows GPIO pins to be multiplexed as either I/Os for the FPGA fabric, the ARM(R) CortexTM-M3 or for given integrated MSS peripherals. The MSS peripherals are not multiplexed with each other; they are multiplexed only with the GPIO block. For more information General Purpose I/O Block (GPIO) section in the SmartFusion Microcontroller Subsystem User's Guide. IO In/out FPGA user I/O The FPGA user I/O pin functions as an input, output, tristate or bidirectional buffer. Input and output signal levels are compatible with the I/O standard selected. Unused I/O pins are disabled by Libero IDE software and include a weak pull-up resistor. During power-up, the used I/O pins are tristated with no pull-up or pull-down resistors until I/O enable (there is a delay after voltage stabilizes, and different I/O banks power up sequentially to avoid a surge of ICCI). Some of these pins are also multiplexed with integrated peripherals in the MSS (Ethernet MAC and external memory controller). During programming, I/Os become tristated and weakly pulled up to VCCI. With the VCCI and VCC supplies continuously powered up, when the device transitions from programming to operating mode, the I/Os are instantly configured to the desired user configuration. For more information see the SmartFusion FPGA User I/Os section in the SmartFusion FPGA Fabric User's Guide. The naming convention used for each FPGA user I/O is: IOuxwByVz where: u = I/O pair number in bank, starting at 00 from the northwest I/O bank and incrementing clockwise. x = P (positive) or N (negative) or S (single-ended) or R (regular, singleended). w = D (differential pair) or P (pair) or S (single-ended) or R (regular, singleended). y = Bank number starting at 0 from northwest I/O bank and incrementing clockwise. z = VREF mini bank number. Revision 4 5 -5 Pin Descriptions Special Function Pins Name Type Polarity/Bus Size NC Description No connect This pin is not connected to circuitry within the device. These pins can be driven to any voltage or can be left floating with no effect on the operation of the device. DC Do not connect. This pin should not be connected to any signals on the PCB. These pins should be left unconnected. LPXIN In 1 Low power 32 KHz crystal oscillator. Input from the 32 KHz oscillator. Pin for connecting a low power 32 KHz watch crystal. If not used, the LPXIN pin can be left floating. For more information, see the PLLs, Clock Conditioning Circuitry, and OnChip Crystal Oscillators section in the SmartFusion Microcontroller Subsystem User's Guide. LPXOUT In 1 Low power 32 KHz crystal oscillator. Output to the 32 KHz oscillator. Pin for connecting a low power 32 KHz watch crystal. If not used, the LPXOUT pin can be left floating. For more information, see the PLLs, Clock Conditioning Circuitry, and OnChip Crystal Oscillators section in the SmartFusion Microcontroller Subsystem User's Guide. MAINXIN In 1 Main crystal oscillator circuit. Input to the crystal oscillator circuit. Pin for connecting an external crystal, ceramic resonator, or RC network. When using an external crystal or ceramic oscillator, external capacitors are also recommended. Refer to documentation from the crystal oscillator manufacturer for proper capacitor value. If using an external RC network or clock input, MAINXIN should be used and MAINXOUT left unconnected. For more information, see the PLLs, Clock Conditioning Circuitry, and On-Chip Crystal Oscillators section in the SmartFusion Microcontroller Subsystem User's Guide. MAINXOUT Out 1 Main crystal oscillator circuit. Output from the crystal oscillator circuit. Pin for connecting external crystal or ceramic resonator. When using an external crystal or ceramic oscillator, external capacitors are also recommended. Refer to documentation from the crystal oscillator manufacturer for proper capacitor value. If using external RC network or clock input, MAINXIN should be used and MAINXOUT left unconnected. For more information, see the PLLs, Clock Conditioning Circuitry, and On-Chip Crystal Oscillators section in the SmartFusion Microcontroller Subsystem User's Guide. NCAP 1 Negative capacitor connection. This is the negative terminal of the charge pump. A capacitor, with a 2.2 F recommended value, is required to connect between PCAP and NCAP. Analog charge pump capacitors are not needed if none of the analog SCB features are used and none of the SDDs are used. In that case it should be left unconnected. 5-6 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Name Type Polarity/Bus Size PCAP 1 Description Positive Capacitor connection. This is the positive terminal of the charge pump. A capacitor, with a 2.2 F recommended value, is required to connect between PCAP and NCAP. If this pin is not used, it must be left unconnected/floating. In this case, no capacitor is needed. Analog charge pump capacitors are not needed if none of the analog SCB features are used, and none of the SDDs are used. PTBASE 1 Pass transistor base connection This is the control signal of the voltage regulator. This pin should be connected to the base of an external pass transistor used with the 1.5 V internal voltage regulator and can be floating if not used. PTEM 1 Pass transistor emitter connection. This is the feedback input of the voltage regulator. This pin should be connected to the emitter of an external pass transistor used with the 1.5 V internal voltage regulator and can be floating if not used. MSS_RESET_N In Low Reset signal for the microcontroller subsystem. PU_N In Low Push-button is the connection for the external momentary switch used to turn on the 1.5 V voltage regulator and can be floating if not used. Revision 4 5 -7 Pin Descriptions JTAG Pins SmartFusion devices have a separate bank for the dedicated JTAG pins. The JTAG pins can be run at any voltage from 1.5 V to 3.3 V (nominal). VCC must also be powered for the JTAG state machine to operate, even if the device is in bypass mode; VJTAG alone is insufficient. Both VJTAG and VCC to the SmartFusion part must be supplied to allow JTAG signals to transition the SmartFusion device. Isolating the JTAG power supply in a separate I/O bank gives greater flexibility with supply selection and simplifies power supply and PCB design. If the JTAG interface is neither used nor planned to be used, the VJTAG pin together with the TRSTB pin could be tied to GND. Name JTAGSEL Type Polarity/ Bus Size In 1 Description JTAG controller selection Depending on the state of the JTAGSEL pin, an external JTAG controller will either see the FPGA fabric TAP/auxiliary TAP (High) or the Cortex-M3 JTAG debug interface (Low). The JTAGSEL pin should be connected to an external pull-up resistor such that the default configuration selects the FPGA fabric TAP. TCK In 1 Test clock Serial input for JTAG boundary scan, ISP, and UJTAG. The TCK pin does not have an internal pull-up/-down resistor. If JTAG is not used, it is recommended to tie off TCK to GND or VJTAG through a resistor placed close to the FPGA pin. This prevents JTAG operation in case TMS enters an undesired state. Note that to operate at all VJTAG voltages, 500 to 1 k will satisfy the requirements. Refer to Table 5-1 on page 5-9 for more information. TDI In 1 Test data Serial input for JTAG boundary scan, ISP, and UJTAG usage. There is an internal weak pull-up resistor on the TDI pin. TDO Out 1 Test data Serial output for JTAG boundary scan, ISP, and UJTAG usage. TMS HIGH Test mode select The TMS pin controls the use of the IEEE1532 boundary scan pins (TCK, TDI, TDO, TRST). There is an internal weak pull-up resistor on the TMS pin. TRSTB HIGH Boundary scan reset pin The TRST pin functions as an active low input to asynchronously initialize (or reset) the boundary scan circuitry. There is an internal weak pull-up resistor on the TRST pin. If JTAG is not used, an external pull-down resistor could be included to ensure the TAP is held in reset mode. The resistor values must be chosen from Table 5-1 on page 5-9 and must satisfy the parallel resistance value requirement. The values in Table 5-1 on page 5-9 correspond to the resistor recommended when a single device is used. The values correspond to the equivalent parallel resistor when multiple devices are connected via a JTAG chain. In critical applications, an upset in the JTAG circuit could allow entering an undesired JTAG state. In such cases, it is recommended that you tie off TRST to GND through a resistor placed close to the FPGA pin. The TRSTB pin also resets the serial wire JTAG - debug port (SWJ-DP) circuitry within the Cortex-M3. 5-8 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Table 5-1 * Recommended Tie-Off Values for the TCK and TRST Pins Tie-Off Resistance1, 2 VJTAG VJTAG at 3.3 V 200 to 1 k VJTAG at 2.5 V 200 to 1 k VJTAG at 1.8 V 500 to 1 k VJTAG at 1.5 V 500 to 1 k Notes: 1. The TCK pin can be pulled up/down. 2. The TRST pin can only be pulled down. 1. Equivalent parallel resistance if more than one device is on JTAG chain. Revision 4 5 -9 Pin Descriptions Microcontroller Subsystem (MSS) Name Type Polarity/ Bus Size Description External Memory Controller EMC_ABx Out 26 External memory controller address bus Can also be used as an FPGA user I/O (see "IO" on page 5-5). EMC_BYTENx Out LOW/2 External memory controller byte enable Can also be used as an FPGA user I/O (see "IO" on page 5-5). EMC_CLK Out Rise External memory controller clock Can also be used as an FPGA user I/O (see "IO" on page 5-5). EMC_CSx_N Out LOW/2 External memory controller chip selects Can also be used as an FPGA User IO (see "IO" on page 5-5). EMC_DBx In/out 16 External memory controller data bus Can also be used as an FPGA user I/O (see "IO" on page 5-5). EMC_OENx_N Out LOW/2 External memory controller output enables Can also be used as an FPGA User IO (see "IO" on page 5-5). EMC_RW_N Out Level External memory controller read/write. Read = High, write = Low. Can also be used as an FPGA user I/O (see "IO" on page 5-5). Inter-Integrated Circuit I2C_0_SCL (I2C) In/out Peripherals 1 I2C bus serial clock output. First I2C. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). I2C_0_SDA In/out 1 I2C bus serial data input/output. First I2C. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). I2C_1_SCL In/out 1 I2C bus serial clock output. Second I2C. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). I2C_1_SDA In/out 1 I2C bus serial data input/output. Second I2C. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). Serial Peripheral Interface (SPI) Controllers SPI_0_CLK Out 1 Clock. First SPI. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). SPI_0_DI In 1 Data input. First SPI. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). SPI_0_DO Out 1 Data output. First SPI. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). SPI_0_SS Out 1 Slave select (chip select). First SPI. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). SPI_1_CLK Out 1 Clock. Second SPI. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). SPI_1_DI In 1 Data input. Second SPI. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). 5- 10 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Name SPI_1_DO Type Polarity/ Bus Size Out 1 Description Data output. Second SPI. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). SPI_1_SS Out 1 Slave select (chip select). Second SPI. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). Universal Asynchronous Receiver/Transmitter (UART) Peripherals UART_0_RXD In 1 Receive data. First UART. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). UART_0_TXD Out 1 Transmit data. First UART. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). UART_1_RXD In 1 Receive data. Second UART. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). UART_1_TXD Out 1 Transmit data. Second UART. Can also be used as an MSS GPIO (see "GPIO_x" on page 5-5). Ethernet MAC MAC_CLK In Rise Receive clock. 50 MHz 50 ppm clock source received from RMII PHY. MAC_CRSDV In High Carrier sense/receive data valid for RMII PHY Can also be used as an FPGA User IO (see "IO" on page 5-5). MAC_MDC Out Rise RMII management clock Can also be used as an FPGA User IO (see "IO" on page 5-5). MAC_MDIO In/Out 1 RMII management data input/output Can also be used as an FPGA User IO (see "IO" on page 5-5). MAC_RXDx In 2 Ethernet MAC receive data. Data recovered and decoded by PHY. The RXD[0] signal is the least significant bit. Can also be used as an FPGA User I/O (see "IO" on page 5-5). MAC_RXER In HIGH Ethernet MAC receive error. If MACRX_ER is asserted during reception, the frame is received and status of the frame is updated with MACRX_ER. Can also be used as an FPGA user I/O (see "IO" on page 5-5). MAC_TXDx Out 2 Ethernet MAC transmit data. The TXD[0] signal is the least significant bit. Can also be used as an FPGA user I/O (see "IO" on page 5-5). MAC_TXEN Out HIGH Ethernet MAC transmit enable. When asserted, indicates valid data for the PHY on the TXD port. Can also be used as an FPGA User I/O (see "IO" on page 5-5). Revision 4 5- 11 Pin Descriptions Analog Front-End (AFE) Associated With Name Type ABPS0 In Description SCB 0 / active bipolar prescaler input 1. ADC/SDD SCB ADC0 SCB0 See the Active Bipolar Prescaler (ABPS) section in the SmartFusion Programmable Analog User's Guide. ABPS1 In SCB 0 / active bipolar prescaler Input 2 ADC0 SCB0 ABPS2 In SCB 1 / active bipolar prescaler Input 1 ADC0 SCB1 ABPS3 In SCB 1 / active bipolar prescaler Input 2 ADC0 SCB1 ABPS4 In SCB 2 / active bipolar prescaler Input 1 ADC1 SCB2 ABPS5 In SCB 2 / active bipolar prescaler Input 2 ADC1 SCB2 ABPS6 In SCB 3 / active bipolar prescaler Input 1 ADC1 SCB3 ABPS7 In SCB 3 / active bipolar prescaler input 2 ADC1 SCB3 ABPS8 In SCB 4 / active bipolar prescaler input 1 ADC2 SCB4 ABPS9 In SCB 4 / active bipolar prescaler input 2 ADC2 SCB4 ADC0 In ADC 0 direct input 0 / FPGA Input. ADC0 SCB0 ADC1 In ADC 0 direct input 1 / FPGA input ADC0 SCB0 ADC2 In ADC 0 direct input 2 / FPGA input ADC0 SCB1 ADC3 In ADC 0 direct input 3 / FPGA input ADC0 SCB1 ADC4 In ADC 1 direct input 0 / FPGA input ADC1 SCB2 ADC5 In ADC 1 direct input 1 / FPGA input ADC1 SCB2 ADC6 In ADC 1 direct input 2 / FPGA input ADC1 SCB3 ADC7 In ADC 1 direct input 3 / FPGA input ADC1 SCB3 ADC8 In ADC 2 direct input 0 / FPGA input ADC2 SCB4 ADC9 In ADC 2 direct input 1 / FPGA input ADC2 SCB4 ADC10 In ADC 2 direct input 2 / FPGA input ADC2 N/A ADC11 In ADC 2 direct input 3 / FPGA input ADC2 N/A CM0 In SCB 0 / high side of current monitor / comparator ADC0 SCB0 Positive input. See the Current Monitor section in the SmartFusion Programmable Analog User's Guide. CM1 In SCB 1 / high side of current monitor / comparator. Positive input. ADC0 SCB1 CM2 In SCB 2 / high side of current monitor / comparator. Positive input. ADC1 SCB2 CM3 In SCB 3 / high side of current monitor / comparator. Positive input. ADC1 SCB3 CM4 In SCB 4 / high side of current monitor / comparator. Positive input. ADC2 SCB4 TM0 In SCB 0 / low side of current monitor / comparator ADC0 SCB0 Negative input / high side of temperature monitor. See the Temperature Monitor section. Note: Unused analog inputs should be grounded. This aids in shielding and prevents an undesired coupling path. 5- 12 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Associated With Name Type Description ADC/SDD SCB TM1 In SCB 1 / low side of current monitor / comparator. Negative input / high side of temperature monitor. ADC0 SCB1 TM2 In SCB 2 / low side of current monitor / comparator. Negative input / high side of temperature monitor. ADC1 SCB2 TM3 In SCB 3 low side of current monitor / comparator. Negative input / high side of temperature monitor. ADC1 SCB3 TM4 In SCB 4 low side of current monitor / comparator. Negative input / high side of temperature monitor. ADC2 SCB4 SDD0 Out Output of SDD0 SDD0 N/A SDD1 Out Output of SDD1 SDD1 N/A SDD2 Out Output of SDD2 SDD2 N/A Note: Unused analog inputs should be grounded. This aids in shielding and prevents an undesired coupling path. Revision 4 5- 13 Pin Descriptions Analog Front-End Pin-Level Function Multiplexing Table 5-2 describes the relationships between the various internal signals found in the analog front-end (AFE) and how they are multiplexed onto the external package pins. Note that, in general, only one function is available for those pads that have numerous functions listed. The exclusion to this rule is when a comparator is used; the ADC can still convert either input side of the comparator. Table 5-2 * Relationships Between Signals in the Analog Front-End ADC Channel Dir.-In Current Option Prescaler Mon. ABPS0 ADC0_CH1 ABPS0_IN ABPS1 ADC0_CH2 ABPS1_IN ABPS2 ADC0_CH5 ABPS2_IN ABPS3 ADC0_CH6 ABPS3_IN ABPS4 ADC1_CH1 ABPS4_IN ABPS5 ADC1_CH2 ABPS5_IN ABPS6 ADC1_CH5 ABPS6_IN ABPS7 ADC1_CH6 ABPS7_IN ABPS8 ADC2_CH1 ABPS8_IN ABPS9 ADC2_CH2 ABPS9_IN ADC0 ADC0_CH9 ADC1 ADC0_CH10 Pin Temp. Mon. Compar. LVTTL SDD MUX Yes CMP1_P LVTTL0_IN Yes CMP1_N LVTTL1_IN SDDM0_OUT ADC2 ADC0_CH11 Yes CMP3_P LVTTL2_IN ADC3 ADC0_CH12 Yes CMP3_N LVTTL3_IN SDDM1_OUT ADC4 ADC1_CH9 Yes CMP5_P LVTTL4_IN ADC5 ADC1_CH10 Yes CMP5_N LVTTL5_IN SDDM2_OUT ADC6 ADC1_CH11 Yes CMP7_P LVTTL6_IN ADC7 ADC1_CH12 Yes CMP7_N LVTTL7_IN SDDM3_OUT ADC8 ADC2_CH9 Yes CMP9_P LVTTL8_IN ADC9 ADC2_CH10 Yes CMP9_N LVTTL9_IN SDDM4_OUT SDD ADC10 ADC2_CH11 Yes LVTTL10_IN ADC11 ADC2_CH12 Yes LVTTL11_IN CM0 ADC0_CH3 Yes CM0_H CMP0_P CM1 ADC0_CH7 Yes CM1_H CMP2_P CM2 ADC1_CH3 Yes CM2_H CMP4_P CM3 ADC1_CH7 Yes CM3_H CMP6_P CM4 ADC2_CH3 Yes CM4_H CMP8_P SDD0 ADC0_CH15 SDD0_OUT SDD1 ADC1_CH15 SDD1_OUT Notes: 1. 2. 3. 4. 5. 6. 7. ABPSx_IN: Input to active bipolar prescaler channel x. CMx_H/L: Current monitor channel x, high/low side. TMx_IO: Temperature monitor channel x. CMPx_P/N: Comparator channel x, positive/negative input. LVTTLx_IN: LVTTL I/O channel x. SDDMx_OUT: Output from sigma-delta DAC MUX channel x. SDDx_OUT: Direct output from sigma-delta DAC channel x. 5- 14 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Table 5-2 * Relationships Between Signals in the Analog Front-End ADC Channel Pin Dir.-In Current Option Prescaler Mon. Temp. Mon. Compar. SDD2 ADC2_CH15 TM0 ADC0_CH4 Yes CM0_L TM0_IO CMP0_N TM1 ADC0_CH8 Yes CM1_L TM1_IO CMP2_N TM2 ADC1_CH4 Yes CM2_L TM2_IO CMP4_N TM3 ADC1_CH8 Yes CM3_L TM3_IO CMP6_N TM4 ADC2_CH4 Yes CM4_L TM4_IO CMP8_N LVTTL SDD MUX SDD SDD2_OUT Notes: 1. 2. 3. 4. 5. 6. 7. ABPSx_IN: Input to active bipolar prescaler channel x. CMx_H/L: Current monitor channel x, high/low side. TMx_IO: Temperature monitor channel x. CMPx_P/N: Comparator channel x, positive/negative input. LVTTLx_IN: LVTTL I/O channel x. SDDMx_OUT: Output from sigma-delta DAC MUX channel x. SDDx_OUT: Direct output from sigma-delta DAC channel x. Revision 4 5- 15 Pin Descriptions Pin Assignment Tables 288-Pin CSP A1 Ball Pad Corner 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 A B C D E F G H J K L M N P R T U V W Y AA Note: Bottom view For Package Manufacturing and Environmental information, visit the Resource Center at http://www.actel.com/products/solutions/package/docs.aspx. 5- 16 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 288-Pin CSP Pin Number A2F200 Function A2F500 Function A1 VCCFPGAIOB0 VCCFPGAIOB0 A2 GNDQ GNDQ A3 EMC_CLK/GAA0/IO00NDB0V0 EMC_CLK/GAA0/IO02NDB0V0 A4 EMC_RW_N/GAA1/IO00PDB0V0 EMC_RW_N/GAA1/IO02PDB0V0 A5 GND GND A6 EMC_CS1_N/GAB1/IO01PDB0V0 EMC_CS1_N/GAB1/IO05PDB0V0 A7 EMC_CS0_N/GAB0/IO01NDB0V0 EMC_CS0_N/GAB0/IO05NDB0V0 A8 EMC_AB[0]/IO04NPB0V0 EMC_AB[0]/IO06NPB0V0 A9 VCCFPGAIOB0 VCCFPGAIOB0 A10 EMC_AB[4]/IO06NDB0V0 EMC_AB[4]/IO10NDB0V0 A11 EMC_AB[8]/IO08NPB0V0 EMC_AB[8]/IO13NPB0V0 A12 EMC_AB[14]/IO11NPB0V0 EMC_AB[14]/IO15NPB0V0 A13 GND GND A14 EMC_AB[18]/IO13NDB0V0 EMC_AB[18]/IO18NDB0V0 A15 EMC_AB[24]/IO16NDB0V0 EMC_AB[24]/IO20NDB0V0 A16 EMC_AB[25]/IO16PDB0V0 EMC_AB[25]/IO20PDB0V0 A17 VCCFPGAIOB0 VCCFPGAIOB0 A18 EMC_AB[20]/IO14NDB0V0 EMC_AB[20]/IO21NDB0V0 A19 EMC_AB[21]/IO14PDB0V0 EMC_AB[21]/IO21PDB0V0 A20 GNDQ GNDQ A21 GND GND AA1 ABPS1 ABPS1 AA2 GNDAQ GNDAQ AA3 GNDA GNDA AA4 VCC33N VCC33N AA5 SDD0 SDD0 AA6 ABPS0 ABPS0 AA7 GNDTM0 GNDTM0 AA8 ABPS2 ABPS2 AA9 VAREF0 VAREF0 AA10 GND15ADC0 GND15ADC0 AA11 ADC6 ADC6 AA12 ABPS7 ABPS7 AA13 TM2 TM2 AA14 ABPS4 ABPS4 AA15 SDD1 SDD1 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 17 Pin Descriptions 288-Pin CSP Pin Number A2F200 Function A2F500 Function AA16 GNDVAREF GNDVAREF AA17 VAREFOUT VAREFOUT AA18 PU_N PU_N AA19 VCC33A VCC33A AA20 PTEM PTEM AA21 GND GND B1 GND GND B21 GBB2/IO20NDB1V0 GBB2/IO27NDB1V0 C1 EMC_DB[15]/GAA2/IO71PDB5V0 EMC_DB[15]/GAA2/IO88PDB5V0 C3 VCOMPLA VCOMPLA0 C4 VCCPLL VCCPLL0 C5 VCCFPGAIOB0 VCCFPGAIOB0 C6 EMC_AB[1]/IO04PPB0V0 EMC_AB[1]/IO06PPB0V0 C7 GND GND C8 EMC_OEN0_N/IO03NDB0V0 EMC_OEN0_N/IO08NDB0V0 C9 EMC_AB[2]/IO05NDB0V0 EMC_AB[2]/IO09NDB0V0 C10 EMC_AB[5]/IO06PDB0V0 EMC_AB[5]/IO10PDB0V0 C11 VCCFPGAIOB0 VCCFPGAIOB0 C12 EMC_AB[9]/IO08PPB0V0 EMC_AB[9]/IO13PPB0V0 C13 EMC_AB[15]/IO11PPB0V0 EMC_AB[15]/IO15PPB0V0 C14 EMC_AB[19]/IO13PDB0V0 EMC_AB[19]/IO18PDB0V0 C15 GND GND C16 EMC_AB[22]/IO15NDB0V0 EMC_AB[22]/IO19NDB0V0 C17 EMC_AB[23]/IO15PDB0V0 EMC_AB[23]/IO19PDB0V0 C18 NC VCCPLL1 C19 NC VCOMPLA1 C21 GBA2/IO20PDB1V0 GBA2/IO27PDB1V0 D1 EMC_DB[14]/GAB2/IO71NDB5V0 EMC_DB[14]/GAB2/IO88NDB5V0 D3 VCCFPGAIOB5 VCCFPGAIOB5 D19 GND GND D21 VCCFPGAIOB1 VCCFPGAIOB1 E1 EMC_DB[13]/GAC2/IO70PDB5V0 EMC_DB[13]/GAC2/IO87PDB5V0 E3 EMC_DB[12]/IO70NDB5V0 EMC_DB[12]/IO87NDB5V0 E5 GNDQ GNDQ E6 EMC_BYTEN[0]/GAC0/IO02NDB0V0 EMC_BYTEN[0]/GAC0/IO07NDB0V0 E7 EMC_BYTEN[1]/GAC1/IO02PDB0V0 EMC_BYTEN[1]/GAC1/IO07PDB0V0 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 18 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 288-Pin CSP Pin Number A2F200 Function A2F500 Function E8 EMC_OEN1_N/IO03PDB0V0 EMC_OEN1_N/IO08PDB0V0 E9 EMC_AB[3]/IO05PDB0V0 EMC_AB[3]/IO09PDB0V0 E10 EMC_AB[10]/IO09NDB0V0 EMC_AB[10]/IO11NDB0V0 E11 EMC_AB[7]/IO07PDB0V0 EMC_AB[7]/IO12PDB0V0 E12 EMC_AB[13]/IO10PDB0V0 EMC_AB[13]/IO14PDB0V0 E13 EMC_AB[16]/IO12NDB0V0 EMC_AB[16]/IO17NDB0V0 E14 EMC_AB[17]/IO12PDB0V0 EMC_AB[17]/IO17PDB0V0 E15 GCB0/IO27NDB1V0 GCB0/IO34NDB1V0 E16 GCB1/IO27PDB1V0 GCB1/IO34PDB1V0 E17 GCB2/IO24PDB1V0 GCB2/IO33PDB1V0 E19 GCA0/IO28NDB1V0 GCA0/IO36NDB1V0 E21 GCA1/IO28PDB1V0 GCA1/IO36PDB1V0 F1 VCCFPGAIOB5 VCCFPGAIOB5 F3 GFB2/IO68NDB5V0 GFB2/IO85NDB5V0 F5 GFA2/IO68PDB5V0 GFA2/IO85PDB5V0 F6 EMC_DB[11]/IO69PDB5V0 EMC_DB[11]/IO86PDB5V0 F7 GND GND F8 GFC1/IO66PPB5V0 GFC1/IO83PPB5V0 F9 VCCFPGAIOB0 VCCFPGAIOB0 F10 EMC_AB[11]/IO09PDB0V0 EMC_AB[11]/IO11PDB0V0 F11 EMC_AB[6]/IO07NDB0V0 EMC_AB[6]/IO12NDB0V0 F12 EMC_AB[12]/IO10NDB0V0 EMC_AB[12]/IO14NDB0V0 F13 GND GND F14 GCC1/IO26PPB1V0 GCC1/IO35PPB1V0 F15 GNDQ GNDQ F16 VCCFPGAIOB1 VCCFPGAIOB1 F17 IO24NDB1V0 IO33NDB1V0 F19 GDB1/IO30PDB1V0 GDB1/IO39PDB1V0 F21 GDB0/IO30NDB1V0 GDB0/IO39NDB1V0 G1 IO67NDB5V0 IO84NDB5V0 G3 GFC2/IO67PDB5V0 GFC2/IO84PDB5V0 G5 GFB1/IO65PDB5V0 GFB1/IO82PDB5V0 G6 EMC_DB[10]/IO69NDB5V0 EMC_DB[10]/IO86NDB5V0 G9 GFC0/IO66NPB5V0 GFC0/IO83NPB5V0 G13 GCC0/IO26NPB1V0 GCC0/IO35NPB1V0 G16 GDA0/IO31NDB1V0 GDA0/IO40NDB1V0 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 19 Pin Descriptions 288-Pin CSP Pin Number A2F200 Function A2F500 Function G17 GDC1/IO29PDB1V0 GDC1/IO38PDB1V0 G19 GDC0/IO29NDB1V0 GDC0/IO38NDB1V0 G21 GND GND H1 EMC_DB[9]/GEC1/IO63PPB5V0 EMC_DB[9]/GEC1/IO80PPB5V0 H3 GND GND H5 GFB0/IO65NDB5V0 GFB0/IO82NDB5V0 H6 EMC_DB[7]/GEB1/IO62PDB5V0 EMC_DB[7]/GEB1/IO79PDB5V0 H8 GND GND H9 VCC VCC H10 GND GND H11 VCC VCC H12 GND GND H13 VCC VCC H14 GND GND H16 GDA1/IO31PDB1V0 GDA1/IO40PDB1V0 H17 GDC2/IO32PPB1V0 GDC2/IO41PPB1V0 H19 VCCFPGAIOB1 VCCFPGAIOB1 H21 GDB2/IO33PDB1V0 GDB2/IO42PDB1V0 J1 EMC_DB[4]/GEA0/IO61NPB5V0 EMC_DB[4]/GEA0/IO78NPB5V0 J3 EMC_DB[8]/GEC0/IO63NPB5V0 EMC_DB[8]/GEC0/IO80NPB5V0 J5 EMC_DB[1]/GEB2/IO59PDB5V0 EMC_DB[1]/GEB2/IO76PDB5V0 J6 EMC_DB[6]/GEB0/IO62NDB5V0 EMC_DB[6]/GEB0/IO79NDB5V0 J7 VCCFPGAIOB5 VCCFPGAIOB5 J8 VCC VCC J9 GND GND J10 VCC VCC J11 GND GND J12 VCC VCC J13 GND GND J14 VCC VCC J15 VPP VPP J16 IO32NPB1V0 IO41NPB1V0 J17 GNDQ GNDQ J19 VCCMAINXTAL VCCMAINXTAL J21 GDA2/IO33NDB1V0 GDA2/IO42NDB1V0 K1 GND GND Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 20 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 288-Pin CSP Pin Number A2F200 Function A2F500 Function K3 EMC_DB[5]/GEA1/IO61PPB5V0 EMC_DB[5]/GEA1/IO78PPB5V0 K5 EMC_DB[0]/GEA2/IO59NDB5V0 EMC_DB[0]/GEA2/IO76NDB5V0 K6 EMC_DB[3]/GEC2/IO60PPB5V0 EMC_DB[3]/GEC2/IO77PPB5V0 K8 GND GND K9 VCC VCC K10 GND GND K11 VCC VCC K12 GND GND K13 VCC VCC K14 GND GND K16 LPXOUT LPXOUT K17 GNDLPXTAL GNDLPXTAL K19 GNDMAINXTAL GNDMAINXTAL K21 MAINXIN MAINXIN L1 GNDRCOSC GNDRCOSC L3 VCCFPGAIOB5 VCCFPGAIOB5 L5 EMC_DB[2]/IO60NPB5V0 EMC_DB[2]/IO77NPB5V0 L6 GNDQ GNDQ L8 VCC VCC L9 GND GND L10 VCC VCC L12 VCC VCC L13 GND GND L14 VCC VCC L16 VCCLPXTAL VCCLPXTAL L17 VDDBAT VDDBAT L19 LPXIN LPXIN L21 MAINXOUT MAINXOUT M1 VCCRCOSC VCCRCOSC M3 MSS_RESET_N MSS_RESET_N M5 GPIO_5/IO42RSB4V0 GPIO_5/IO51RSB4V0 M6 GND GND M8 GND GND M9 VCC VCC M10 GND GND M11 VCC VCC Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 21 Pin Descriptions 288-Pin CSP Pin Number A2F200 Function A2F500 Function M12 GND GND M13 VCC VCC M14 GND GND M16 TMS TMS M17 VJTAG VJTAG M19 TDO TDO M21 TRSTB TRSTB N1 VCCMSSIOB4 VCCMSSIOB4 N3 GND GND N5 GPIO_4/IO43RSB4V0 GPIO_4/IO52RSB4V0 N6 GPIO_8/IO39RSB4V0 GPIO_8/IO48RSB4V0 N7 GPIO_9/IO38RSB4V0 GPIO_9/IO47RSB4V0 N8 VCC VCC N9 GND GND N10 VCC VCC N11 GND GND N12 VCC VCC N13 GND GND N14 VCC VCC N15 GND GND N16 TCK TCK N17 TDI TDI N19 GNDENVM GNDENVM N21 VCCENVM VCCENVM P1 MAC_MDC/IO48RSB4V0 MAC_MDC/IO57RSB4V0 P3 GPIO_7/IO40RSB4V0 GPIO_7/IO49RSB4V0 P5 GPIO_6/IO41RSB4V0 GPIO_6/IO50RSB4V0 P6 VCCMSSIOB4 VCCMSSIOB4 P8 GND GND P9 VCC VCC P10 GND GND P11 VCC VCC P12 GND GND P13 VCC VCC P14 GND GND P16 JTAGSEL JTAGSEL Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 22 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 288-Pin CSP Pin Number A2F200 Function A2F500 Function P17 I2C_0_SCL/GPIO_23 I2C_0_SCL/GPIO_23 P19 VCCMSSIOB2 VCCMSSIOB2 P21 GND GND R1 MAC_MDIO/IO49RSB4V0 MAC_MDIO/IO58RSB4V0 R3 MAC_TXEN/IO52RSB4V0 MAC_TXEN/IO61RSB4V0 R5 MAC_TXD[0]/IO56RSB4V0 MAC_TXD[0]/IO65RSB4V0 R6 MAC_CRSDV/IO51RSB4V0 MAC_CRSDV/IO60RSB4V0 R9 GNDA GNDA R13 GNDA GNDA R16 UART_1_RXD/GPIO_29 UART_1_RXD/GPIO_29 R17 UART_1_TXD/GPIO_28 UART_1_TXD/GPIO_28 R19 I2C_0_SDA/GPIO_22 I2C_0_SDA/GPIO_22 R21 I2C_1_SDA/GPIO_30 I2C_1_SDA/GPIO_30 T1 GND GND T3 MAC_TXD[1]/IO55RSB4V0 MAC_TXD[1]/IO64RSB4V0 T5 MAC_RXD[1]/IO53RSB4V0 MAC_RXD[1]/IO62RSB4V0 T6 MAC_RXER/IO50RSB4V0 MAC_RXER/IO59RSB4V0 T7 CM1 CM1 T8 ADC1 ADC1 T9 GND33ADC0 GND33ADC0 T10 VCC15ADC0 VCC15ADC0 T11 GND33ADC1 GND33ADC1 T12 VAREF1 VAREF1 T13 ADC4 ADC4 T14 TM3 TM3 T15 SPI_1_SS/GPIO_27 SPI_1_SS/GPIO_27 T16 VCCMSSIOB2 VCCMSSIOB2 T17 UART_0_RXD/GPIO_21 UART_0_RXD/GPIO_21 T19 UART_0_TXD/GPIO_20 UART_0_TXD/GPIO_20 T21 I2C_1_SCL/GPIO_31 I2C_1_SCL/GPIO_31 U1 MAC_RXD[0]/IO54RSB4V0 MAC_RXD[0]/IO63RSB4V0 U3 VCCMSSIOB4 VCCMSSIOB4 U5 VCC33SDD0 VCC33SDD0 U6 VCC15A VCC15A U7 ABPS3 ABPS3 U8 ADC2 ADC2 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 23 Pin Descriptions 288-Pin CSP Pin Number A2F200 Function A2F500 Function U9 VCC33ADC0 VCC33ADC0 U10 GND15ADC1 GND15ADC1 U11 VCC33ADC1 VCC33ADC1 U12 ADC7 ADC7 U13 ABPS6 ABPS6 U14 GNDTM1 GNDTM1 U15 SPI_1_CLK/GPIO_26 SPI_1_CLK/GPIO_26 U16 SPI_0_CLK/GPIO_18 SPI_0_CLK/GPIO_18 U17 SPI_0_SS/GPIO_19 SPI_0_SS/GPIO_19 U19 GND GND U21 SPI_1_DO/GPIO_24 SPI_1_DO/GPIO_24 V1 MAC_CLK MAC_CLK V3 GNDSDD0 GNDSDD0 V19 SPI_1_DI/GPIO_25 SPI_1_DI/GPIO_25 V21 VCCMSSIOB2 VCCMSSIOB2 W1 PCAP PCAP W3 NCAP NCAP W4 CM0 CM0 W5 TM0 TM0 W6 TM1 TM1 W7 ADC0 ADC0 W8 ADC3 ADC3 W9 GND33ADC0 GND33ADC0 W10 VCC15ADC1 VCC15ADC1 W11 GND33ADC1 GND33ADC1 W12 ADC5 ADC5 W13 CM3 CM3 W14 CM2 CM2 W15 ABPS5 ABPS5 W16 GNDAQ GNDAQ W17 VCC33SDD1 VCC33SDD1 W18 GNDSDD1 GNDSDD1 W19 PTBASE PTBASE W21 SPI_0_DI/GPIO_17 SPI_0_DI/GPIO_17 Y1 VCC33AP VCC33AP Y21 SPI_0_DO/GPIO_16 SPI_0_DO/GPIO_16 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 24 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 256-Pin FBGA A1 Ball Pad Corner 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 A B C D E F G H J K L M N P R T Note For Package Manufacturing and Environmental information, visit the Resource Center at http://www.actel.com/products/solutions/package/docs.aspx. . Revision 4 5- 25 Pin Descriptions 256-Pin FBGA Pin Number A2F200 Function A2F500 Function A1 GND GND A2 VCCFPGAIOB0 VCCFPGAIOB0 A3 EMC_AB[0]/IO04NDB0V0 EMC_AB[0]/IO06NDB0V0 A4 EMC_AB[1]/IO04PDB0V0 EMC_AB[1]/IO06PDB0V0 A5 GND GND A6 EMC_AB[3]/IO05PDB0V0 EMC_AB[3]/IO09PDB0V0 A7 EMC_AB[5]/IO06PDB0V0 EMC_AB[5]/IO10PDB0V0 A8 VCCFPGAIOB0 VCCFPGAIOB0 A9 GND GND A10 EMC_AB[14]/IO11NDB0V0 EMC_AB[14]/IO15NDB0V0 A11 EMC_AB[15]/IO11PDB0V0 EMC_AB[15]/IO15PDB0V0 A12 GND GND A13 EMC_AB[20]/IO14NDB0V0 EMC_AB[20]/IO21NDB0V0 A14 EMC_AB[24]/IO16NDB0V0 EMC_AB[24]/IO20NDB0V0 A15 VCCFPGAIOB0 VCCFPGAIOB0 A16 GND GND B1 EMC_DB[15]/GAA2/IO71PDB5V0 EMC_DB[15]/GAA2/IO88PDB5V0 B2 GND GND B3 Handling When Unused Can be grounded if I/O Bank0 is unused. Can be grounded if I/O Bank0 is unused. Can be grounded if I/O Bank0 is unused. EMC_BYTEN[1]/GAC1/IO02PDB0V0 EMC_BYTEN[1]/GAC1/IO07PDB0V0 B4 EMC_OEN0_N/IO03NDB0V0 EMC_OEN0_N/IO08NDB0V0 B5 EMC_OEN1_N/IO03PDB0V0 EMC_OEN1_N/IO08PDB0V0 B6 EMC_AB[2]/IO05NDB0V0 EMC_AB[2]/IO09NDB0V0 B7 EMC_AB[4]/IO06NDB0V0 EMC_AB[4]/IO10NDB0V0 B8 EMC_AB[9]/IO08PDB0V0 EMC_AB[9]/IO13PDB0V0 B9 EMC_AB[12]/IO10NDB0V0 EMC_AB[12]/IO14NDB0V0 B10 EMC_AB[13]/IO10PDB0V0 EMC_AB[13]/IO14PDB0V0 B11 EMC_AB[16]/IO12NDB0V0 EMC_AB[16]/IO17NDB0V0 B12 EMC_AB[18]/IO13NDB0V0 EMC_AB[18]/IO18NDB0V0 B13 EMC_AB[21]/IO14PDB0V0 EMC_AB[21]/IO21PDB0V0 B14 EMC_AB[25]/IO16PDB0V0 EMC_AB[25]/IO20PDB0V0 B15 GND GND B16 GNDQ GNDQ Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 26 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 256-Pin FBGA Pin Number A2F200 Function A2F500 Function C1 EMC_DB[14]/GAB2/IO71NDB5V0 EMC_DB[14]/GAB2/IO88NDB5V0 C2 VCCPLL VCCPLL0 C3 Handling When Unused Always power this pin. EMC_BYTEN[0]/GAC0/IO02NDB0V0 EMC_BYTEN[0]/GAC0/IO07NDB0V0 C4 VCCFPGAIOB0 VCCFPGAIOB0 C5 EMC_CS0_N/GAB0/IO01NDB0V0 EMC_CS0_N/GAB0/IO05NDB0V0 C6 EMC_CS1_N/GAB1/IO01PDB0V0 EMC_CS1_N/GAB1/IO05PDB0V0 C7 GND GND C8 EMC_AB[8]/IO08NDB0V0 EMC_AB[8]/IO13NDB0V0 C9 EMC_AB[11]/IO09PDB0V0 EMC_AB[11]/IO11PDB0V0 C10 VCCFPGAIOB0 VCCFPGAIOB0 C11 EMC_AB[17]/IO12PDB0V0 EMC_AB[17]/IO17PDB0V0 C12 EMC_AB[19]/IO13PDB0V0 EMC_AB[19]/IO18PDB0V0 C13 GND GND C14 GBA2/IO20PPB1V0 GBA2/IO27PPB1V0 C15 GCA2/IO23PDB1V0 GCA2/IO28PDB1V0 C16 IO23NDB1V0 IO28NDB1V0 D1 VCCFPGAIOB5 VCCFPGAIOB5 D2 VCOMPLA VCOMPLA0 D3 GND GND D4 GNDQ GNDQ D5 EMC_CLK/GAA0/IO00NDB0V0 EMC_CLK/GAA0/IO02NDB0V0 D6 EMC_RW_N/GAA1/IO00PDB0V0 EMC_RW_N/GAA1/IO02PDB0V0 D7 EMC_AB[6]/IO07NDB0V0 EMC_AB[6]/IO12NDB0V0 D8 EMC_AB[7]/IO07PDB0V0 EMC_AB[7]/IO12PDB0V0 D9 EMC_AB[10]/IO09NDB0V0 EMC_AB[10]/IO11NDB0V0 D10 EMC_AB[22]/IO15NDB0V0 EMC_AB[22]/IO19NDB0V0 D11 EMC_AB[23]/IO15PDB0V0 EMC_AB[23]/IO19PDB0V0 D12 GNDQ GNDQ D13 GBB2/IO20NPB1V0 GBB2/IO27NPB1V0 D14 GCB2/IO24PDB1V0 GCB2/IO33PDB1V0 D15 IO24NDB1V0 IO33NDB1V0 Can be grounded if I/O Bank0 is unused. Can be grounded if I/O Bank0 is unused. Can be grounded if I/O Bank5 is unused. Always ground this pin. Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 27 Pin Descriptions 256-Pin FBGA Pin Number A2F200 Function A2F500 Function Handling When Unused D16 VCCFPGAIOB1 VCCFPGAIOB1 Can be grounded if I/O Bank1 is unused. E1 EMC_DB[13]/GAC2/IO70PDB5V0 EMC_DB[13]/GAC2/IO87PDB5V0 E2 EMC_DB[12]/IO70NDB5V0 EMC_DB[12]/IO87NDB5V0 E3 GFA2/IO68PDB5V0 GFA2/IO85PDB5V0 E4 EMC_DB[10]/IO69NPB5V0 EMC_DB[10]/IO86NPB5V0 E5 GNDQ GNDQ E6 GND GND E7 VCCFPGAIOB0 VCCFPGAIOB0 E8 GND GND E9 VCCFPGAIOB0 VCCFPGAIOB0 E10 GND GND E11 VCCFPGAIOB0 VCCFPGAIOB0 E12 GCA1/IO28PDB1V0 GCA1/IO36PDB1V0 E13 VCCFPGAIOB1 VCCFPGAIOB1 E14 GCB1/IO27PDB1V0 GCB1/IO34PDB1V0 E15 GDC1/IO29PDB1V0 GDC1/IO38PDB1V0 E16 GDC0/IO29NDB1V0 GDC0/IO38NDB1V0 F1 EMC_DB[9]/GEC1/IO63PDB5V0 EMC_DB[9]/GEC1/IO80PDB5V0 F2 GND GND F3 GFB2/IO68NDB5V0 GFB2/IO85NDB5V0 F4 VCCFPGAIOB5 VCCFPGAIOB5 F5 EMC_DB[11]/IO69PPB5V0 EMC_DB[11]/IO86PPB5V0 F6 VCCFPGAIOB5 VCCFPGAIOB5 F7 GND GND F8 VCC VCC F9 GND GND F10 VCC VCC F11 GND GND F12 GCA0/IO28NDB1V0 GCA0/IO36NDB1V0 Can be grounded if I/O Bank0 is unused. Can be grounded if I/O Bank0 is unused. Can be grounded if I/O Bank0 is unused. Can be grounded if I/O Bank1 is unused. Can be grounded if I/O Bank5 is unused. Can be grounded if I/O Bank5 is unused. Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 28 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 256-Pin FBGA Pin Number A2F200 Function A2F500 Function F13 GNDQ GNDQ F14 GCB0/IO27NDB1V0 GCB0/IO34NDB1V0 F15 GND GND F16 VCCENVM VCCENVM G1 EMC_DB[8]/GEC0/IO63NDB5V0 EMC_DB[8]/GEC0/IO80NDB5V0 G2 EMC_DB[7]/GEB1/IO62PDB5V0 EMC_DB[7]/GEB1/IO79PDB5V0 G3 EMC_DB[6]/GEB0/IO62NDB5V0 EMC_DB[6]/GEB0/IO79NDB5V0 G4 GFC2/IO67PDB5V0 GFC2/IO84PDB5V0 G5 IO67NDB5V0 IO84NDB5V0 G6 GND GND G7 VCC VCC G8 GND GND G9 VCC VCC G10 GND GND G11 VCCFPGAIOB1 VCCFPGAIOB1 G12 VPP VPP G13 TRSTB TRSTB G14 TMS TMS Can be left floating. G15 TCK TCK Can be left floating. G16 GNDENVM GNDENVM H1 GND GND H2 EMC_DB[5]/GEA1/IO61PPB5V0 EMC_DB[5]/GEA1/IO78PPB5V0 H3 VCCFPGAIOB5 VCCFPGAIOB5 H4 EMC_DB[1]/GEB2/IO59PDB5V0 EMC_DB[1]/GEB2/IO76PDB5V0 H5 EMC_DB[0]/GEA2/IO59NDB5V0 EMC_DB[0]/GEA2/IO76NDB5V0 H6 VCCFPGAIOB5 VCCFPGAIOB5 H7 GND GND H8 VCC VCC H9 GND GND H10 VCC VCC H11 GND GND Handling When Unused Must be powered all the time. Can be grounded if I/O Bank1 is unused. Can be left floating as it has internal pull-down. Can be grounded if I/O Bank5 is unused. Can be grounded if I/O Bank5 is unused. Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 29 Pin Descriptions 256-Pin FBGA Pin Number A2F200 Function A2F500 Function H12 VJTAG VJTAG H13 TDO TDO Can be left floating. H14 TDI TDI Can be left floating. H15 JTAGSEL JTAGSEL H16 GND GND J1 EMC_DB[4]/GEA0/IO61NPB5V0 EMC_DB[4]/GEA0/IO78NPB5V0 J2 EMC_DB[3]/GEC2/IO60PDB5V0 EMC_DB[3]/GEC2/IO77PDB5V0 J3 EMC_DB[2]/IO60NDB5V0 EMC_DB[2]/IO77NDB5V0 J4 GNDRCOSC GNDRCOSC J5 GNDQ GNDQ J6 GND GND J7 VCC VCC J8 GND GND J9 VCC VCC J10 GND GND J11 VCCMSSIOB2 VCCMSSIOB2 J12 I2C_0_SCL/GPIO_23 I2C_0_SCL/GPIO_23 J13 I2C_0_SDA/GPIO_22 I2C_0_SDA/GPIO_22 J14 I2C_1_SCL/GPIO_31 I2C_1_SCL/GPIO_31 J15 VCCMSSIOB2 VCCMSSIOB2 J16 I2C_1_SDA/GPIO_30 I2C_1_SDA/GPIO_30 K1 MAC_MDIO/IO49RSB4V0 MAC_MDIO/IO58RSB4V0 K2 MAC_MDC/IO48RSB4V0 MAC_MDC/IO57RSB4V0 K3 VCCMSSIOB4 VCCMSSIOB4 Can be grounded if I/O Bank4 is unused. K4 MSS_RESET_N MSS_RESET_N Can be left floating as internal pull-up is there. K5 VCCRCOSC VCCRCOSC Must be powered all the time. K6 VCCMSSIOB4 VCCMSSIOB4 Can be grounded if I/O Bank4 is unused. K7 GND GND K8 VCC VCC K9 GND GND Handling When Unused Can be left floating as internal pull-up is there. Can be grounded if I/O Bank2 is unused. Can be grounded if I/O Bank2 is unused. Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 30 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 256-Pin FBGA Pin Number A2F200 Function A2F500 Function K10 VCC VCC K11 GND GND K12 UART_0_RXD/GPIO_21 UART_0_RXD/GPIO_21 K13 GND GND K14 UART_1_TXD/GPIO_28 UART_1_TXD/GPIO_28 K15 UART_1_RXD/GPIO_29 UART_1_RXD/GPIO_29 K16 UART_0_TXD/GPIO_20 UART_0_TXD/GPIO_20 L1 GND GND L2 MAC_TXEN/IO52RSB4V0 MAC_TXEN/IO61RSB4V0 L3 MAC_CRSDV/IO51RSB4V0 MAC_CRSDV/IO60RSB4V0 L4 MAC_RXER/IO50RSB4V0 MAC_RXER/IO59RSB4V0 L5 MAC_CLK MAC_CLK L6 GND GND L7 VCC VCC L8 GND GND L9 VCC VCC L10 GND GND L11 VCCMSSIOB2 VCCMSSIOB2 L12 SPI_1_DO/GPIO_24 SPI_1_DO/GPIO_24 L13 SPI_1_SS/GPIO_27 SPI_1_SS/GPIO_27 L14 SPI_1_CLK/GPIO_26 SPI_1_CLK/GPIO_26 L15 SPI_1_DI/GPIO_25 SPI_1_DI/GPIO_25 L16 GND GND M1 MAC_TXD[0]/IO56RSB4V0 MAC_TXD[0]/IO65RSB4V0 M2 MAC_TXD[1]/IO55RSB4V0 MAC_TXD[1]/IO64RSB4V0 M3 MAC_RXD[0]/IO54RSB4V0 MAC_RXD[0]/IO63RSB4V0 M4 GND GND M5 ADC3 ADC3 M6 GND15ADC0 GND15ADC0 M7 GND33ADC1 GND33ADC1 M8 GND33ADC1 GND33ADC1 M9 ADC4 ADC4 M10 GNDTM1 GNDTM1 Handling When Unused Can be left floating. Can be grounded if I/O Bank2 is unused. Can be left floating if unused. Can be left floating if unused. Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 31 Pin Descriptions 256-Pin FBGA Pin Number A2F200 Function A2F500 Function Handling When Unused M11 TM2 TM2 Can be left floating if unused. M12 CM2 CM2 Can be left floating if unused. M13 SPI_0_SS/GPIO_19 SPI_0_SS/GPIO_19 M14 VCCMSSIOB2 VCCMSSIOB2 M15 SPI_0_CLK/GPIO_18 SPI_0_CLK/GPIO_18 M16 SPI_0_DI/GPIO_17 SPI_0_DI/GPIO_17 N1 MAC_RXD[1]/IO53RSB4V0 MAC_RXD[1]/IO62RSB4V0 N2 VCCMSSIOB4 VCCMSSIOB4 Can be grounded if IO Bank4 is unused. N3 VCC15A VCC15A Must be powered all the time. N4 VCC33AP VCC33AP Either pull-down or connect to VCC33A. N5 ABPS3 ABPS3 Can be left floating if unused. N6 TM1 TM1 Can be left floating if unused. N7 GND33ADC0 GND33ADC0 N8 VCC33ADC1 VCC33ADC1 NEVER ground it. Can be left floating if unused. N9 ADC5 ADC5 Can be left floating if unused. N10 CM3 CM3 Can be left floating if unused. N11 GNDAQ GNDAQ N12 VAREFOUT VAREFOUT N13 GNDSDD1 GNDSDD1 N14 VCC33SDD1 VCC33SDD1 N15 GND GND N16 SPI_0_DO/GPIO_16 SPI_0_DO/GPIO_16 P1 GNDSDD0 GNDSDD0 P2 VCC33SDD0 VCC33SDD0 Can be left floating or pulled down if DAC0 is unused. P3 VCC33N VCC33N Must have 2.2 F CAP to ground. P4 GNDA GNDA P5 GNDAQ GNDAQ P6 CM1 CM1 Can be left floating if unused. P7 ADC2 ADC2 Can be left floating if unused. Can be grounded if IO Bank2 is unused. Can be left floating if unused. Can be floated or grounded if second and third DACs unused. Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 32 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 256-Pin FBGA Pin Number A2F200 Function A2F500 Function Handling When Unused P8 VCC15ADC0 VCC15ADC0 Must be powered all the time. P9 ADC6 ADC6 Can be left floating if unused. P10 TM3 TM3 Can be left floating if unused. P11 GNDA GNDA P12 VCCMAINXTAL VCCMAINXTAL P13 GNDLPXTAL GNDLPXTAL P14 VDDBAT VDDBAT P15 PTEM PTEM P16 PTBASE PTBASE Can be left floating if unused. R1 PCAP PCAP Connect 2.2 F CAP between PCAP and NCAP. R2 SDD0 SDD0 Can be left floating if unused. R3 ABPS0 ABPS0 Can be left floating if unused. R4 TM0 TM0 Can be left floating if unused. R5 ABPS2 ABPS2 Can be left floating if unused. R6 ADC1 ADC1 Can be left floating if unused. R7 VCC33ADC0 VCC33ADC0 R8 VCC15ADC1 VCC15ADC1 Must be powered all the time. R9 ADC7 ADC7 Can be left floating if unused. R10 ABPS7 ABPS7 Can be left floating if unused. R11 ABPS4 ABPS4 Can be left floating if unused. R12 MAINXIN MAINXIN Can be pulled-down if unused. R13 MAINXOUT MAINXOUT Must be left floating if unused. R14 LPXIN LPXIN Can be pulled-down if unused. R15 LPXOUT LPXOUT Must be left floating if unused. R16 VCC33A VCC33A T1 NCAP NCAP Connect 2.2uF CAP between PCAP and NCAP. T2 ABPS1 ABPS1 Can be left floating if unused. T3 CM0 CM0 Can be left floating if unused. T4 GNDTM0 GNDTM0 T5 ADC0 ADC0 Can be left floating if unused. T6 VAREF0 VAREF0 Can be left floating if unused. T7 GND33ADC0 GND33ADC0 T8 GND15ADC1 GND15ADC1 Pull-down to GND if unused. Pull-down to GND if unused. Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 33 Pin Descriptions 256-Pin FBGA Pin Number A2F200 Function A2F500 Function Handling When Unused T9 VAREF1 VAREF1 Can be left floating if unused. T10 ABPS6 ABPS6 Can be left floating if unused. T11 ABPS5 ABPS5 Can be left floating if unused. T12 SDD1 SDD1 Can be left floating if unused. T13 GNDVAREF GNDVAREF T14 GNDMAINXTAL GNDMAINXTAL T15 VCCLPXTAL VCCLPXTAL T16 PU_N PU_N Pull-down to GND if unused. Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 34 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 484-Pin FBGA A1 Ball Pad Corner 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 A B C D E F G H J K L M N P R T U V W Y AA AB Note For Package Manufacturing and Environmental information, visit the Resource Center at http://www.actel.com/products/solutions/package/docs.aspx. Revision 4 5- 35 Pin Descriptions 484-Pin FBGA Pin Number A2F200 Function A2F500 Function A1 GND GND A2 NC NC A3 NC NC A4 GND GND A5 EMC_CS0_N/GAB0/IO01NDB0V0 EMC_CS0_N/GAB0/IO05NDB0V0 A6 EMC_CS1_N/GAB1/IO01PDB0V0 EMC_CS1_N/GAB1/IO05PDB0V0 A7 GND GND A8 EMC_AB[0]/IO04NDB0V0 EMC_AB[0]/IO06NDB0V0 A9 EMC_AB[1]/IO04PDB0V0 EMC_AB[1]/IO06PDB0V0 A10 GND GND A11 NC NC A12 EMC_AB[7]/IO07PDB0V0 EMC_AB[7]/IO12PDB0V0 A13 GND GND A14 EMC_AB[12]/IO10NDB0V0 EMC_AB[12]/IO14NDB0V0 A15 EMC_AB[13]/IO10PDB0V0 EMC_AB[13]/IO14PDB0V0 A16 GND GND A17 NC IO16NDB0V0 A18 NC IO16PDB0V0 A19 GND GND A20 NC NC A21 NC NC A22 GND GND AA1 GPIO_4/IO43RSB4V0 GPIO_4/IO52RSB4V0 AA2 GPIO_12/IO37RSB4V0 GPIO_12/IO46RSB4V0 AA3 MAC_MDC/IO48RSB4V0 MAC_MDC/IO57RSB4V0 AA4 MAC_RXER/IO50RSB4V0 MAC_RXER/IO59RSB4V0 AA5 MAC_TXD[0]/IO56RSB4V0 MAC_TXD[0]/IO65RSB4V0 AA6 ABPS0 ABPS0 AA7 TM1 TM1 AA8 ADC1 ADC1 AA9 GND15ADC1 GND15ADC1 AA10 GND33ADC1 GND33ADC1 AA11 CM3 CM3 AA12 GNDTM1 GNDTM1 AA13 NC ADC10 AA14 NC ADC9 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 36 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 484-Pin FBGA Pin Number A2F200 Function A2F500 Function AA15 NC GND15ADC2 AA16 MAINXIN MAINXIN AA17 MAINXOUT MAINXOUT AA18 LPXIN LPXIN AA19 LPXOUT LPXOUT AA20 NC NC AA21 NC NC AA22 SPI_1_CLK/GPIO_26 SPI_1_CLK/GPIO_26 AB1 GND GND AB2 GPIO_13/IO36RSB4V0 GPIO_13/IO45RSB4V0 AB3 GPIO_14/IO35RSB4V0 GPIO_14/IO44RSB4V0 AB4 GND GND AB5 PCAP PCAP AB6 NCAP NCAP AB7 ABPS3 ABPS3 AB8 ADC3 ADC3 AB9 GND15ADC0 GND15ADC0 AB10 VCC33ADC1 VCC33ADC1 AB11 VAREF1 VAREF1 AB12 TM2 TM2 AB13 CM2 CM2 AB14 ABPS4 ABPS4 AB15 GNDAQ GNDAQ AB16 GNDMAINXTAL GNDMAINXTAL AB17 GNDLPXTAL GNDLPXTAL AB18 VCCLPXTAL VCCLPXTAL AB19 VDDBAT VDDBAT AB20 PTBASE PTBASE AB21 NC NC AB22 GND GND B1 EMC_DB[15]/GAA2/IO71PDB5V0 EMC_DB[15]/GAA2/IO88PDB5V0 B2 GND GND B3 NC NC B4 NC NC B5 VCCFPGAIOB0 VCCFPGAIOB0 B6 EMC_RW_N/GAA1/IO00PDB0V0 EMC_RW_N/GAA1/IO02PDB0V0 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 37 Pin Descriptions 484-Pin FBGA Pin Number A2F200 Function A2F500 Function B7 NC IO04PPB0V0 B8 VCCFPGAIOB0 VCCFPGAIOB0 B9 EMC_BYTEN[0]/GAC0/IO02NDB0V0 EMC_BYTEN[0]/GAC0/IO07NDB0V0 B10 EMC_AB[2]/IO05NDB0V0 EMC_AB[2]/IO09NDB0V0 B11 EMC_AB[3]/IO05PDB0V0 EMC_AB[3]/IO09PDB0V0 B12 EMC_AB[6]/IO07NDB0V0 EMC_AB[6]/IO12NDB0V0 B13 EMC_AB[14]/IO11NDB0V0 EMC_AB[14]/IO15NDB0V0 B14 EMC_AB[15]/IO11PDB0V0 EMC_AB[15]/IO15PDB0V0 B15 VCCFPGAIOB0 VCCFPGAIOB0 B16 EMC_AB[18]/IO13NDB0V0 EMC_AB[18]/IO18NDB0V0 B17 EMC_AB[19]/IO13PDB0V0 EMC_AB[19]/IO18PDB0V0 B18 VCCFPGAIOB0 VCCFPGAIOB0 B19 GBB0/IO18NDB0V0 GBB0/IO24NDB0V0 B20 GBB1/IO18PDB0V0 GBB1/IO24PDB0V0 B21 GND GND B22 GBA2/IO20PDB1V0 GBA2/IO27PDB1V0 C1 EMC_DB[14]/GAB2/IO71NDB5V0 EMC_DB[14]/GAB2/IO88NDB5V0 C2 NC NC C3 NC NC C4 NC IO01NDB0V0 C5 NC IO01PDB0V0 C6 EMC_CLK/GAA0/IO00NDB0V0 EMC_CLK/GAA0/IO02NDB0V0 C7 NC IO03PPB0V0 C8 NC IO04NPB0V0 C9 EMC_BYTEN[1]/GAC1/IO02PDB0V0 EMC_BYTEN[1]/GAC1/IO07PDB0V0 C10 EMC_OEN1_N/IO03PDB0V0 EMC_OEN1_N/IO08PDB0V0 C11 GND GND C12 VCCFPGAIOB0 VCCFPGAIOB0 C13 EMC_AB[8]/IO08NDB0V0 EMC_AB[8]/IO13NDB0V0 C14 EMC_AB[16]/IO12NDB0V0 EMC_AB[16]/IO17NDB0V0 C15 EMC_AB[17]/IO12PDB0V0 EMC_AB[17]/IO17PDB0V0 C16 EMC_AB[24]/IO16NDB0V0 EMC_AB[24]/IO20NDB0V0 C17 EMC_AB[22]/IO15NDB0V0 EMC_AB[22]/IO19NDB0V0 C18 EMC_AB[23]/IO15PDB0V0 EMC_AB[23]/IO19PDB0V0 C19 GBA0/IO19NPB0V0 GBA0/IO23NPB0V0 C20 NC NC Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 38 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 484-Pin FBGA Pin Number A2F200 Function A2F500 Function C21 GBC2/IO21PDB1V0 GBC2/IO30PDB1V0 C22 GBB2/IO20NDB1V0 GBB2/IO27NDB1V0 D1 GND GND D2 EMC_DB[12]/IO70NDB5V0 EMC_DB[12]/IO87NDB5V0 D3 EMC_DB[13]/GAC2/IO70PDB5V0 EMC_DB[13]/GAC2/IO87PDB5V0 D4 NC NC D5 NC NC D6 GND GND D7 NC IO00NPB0V0 D8 NC IO03NPB0V0 D9 GND GND D10 EMC_OEN0_N/IO03NDB0V0 EMC_OEN0_N/IO08NDB0V0 D11 EMC_AB[10]/IO09NDB0V0 EMC_AB[10]/IO11NDB0V0 D12 EMC_AB[11]/IO09PDB0V0 EMC_AB[11]/IO11PDB0V0 D13 EMC_AB[9]/IO08PDB0V0 EMC_AB[9]/IO13PDB0V0 D14 GND GND D15 GBC1/IO17PPB0V0 GBC1/IO22PPB0V0 D16 EMC_AB[25]/IO16PDB0V0 EMC_AB[25]/IO20PDB0V0 D17 GND GND D18 GBA1/IO19PPB0V0 GBA1/IO23PPB0V0 D19 NC NC D20 NC NC D21 IO21NDB1V0 IO30NDB1V0 D22 GND GND E1 GFC2/IO67PPB5V0 GFC2/IO84PPB5V0 E2 VCCFPGAIOB5 VCCFPGAIOB5 E3 GFA2/IO68PDB5V0 GFA2/IO85PDB5V0 E4 GND GND E5 NC NC E6 GNDQ GNDQ E7 VCCFPGAIOB0 VCCFPGAIOB0 E8 NC IO00PPB0V0 E9 NC NC E10 VCCFPGAIOB0 VCCFPGAIOB0 E11 EMC_AB[4]/IO06NDB0V0 EMC_AB[4]/IO10NDB0V0 E12 EMC_AB[5]/IO06PDB0V0 EMC_AB[5]/IO10PDB0V0 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 39 Pin Descriptions 484-Pin FBGA Pin Number A2F200 Function A2F500 Function E13 VCCFPGAIOB0 VCCFPGAIOB0 E14 GBC0/IO17NPB0V0 GBC0/IO22NPB0V0 E15 NC NC E16 VCCFPGAIOB0 VCCFPGAIOB0 E17 NC VCOMPLA1 E18 NC IO25NPB1V0 E19 GND GND E20 NC NC E21 VCCFPGAIOB1 VCCFPGAIOB1 E22 IO22NDB1V0 IO32NDB1V0 F1 GFB1/IO65PPB5V0 GFB1/IO82PPB5V0 F2 IO67NPB5V0 IO84NPB5V0 F3 GFB2/IO68NDB5V0 GFB2/IO85NDB5V0 F4 EMC_DB[10]/IO69NPB5V0 EMC_DB[10]/IO86NPB5V0 F5 VCCFPGAIOB5 VCCFPGAIOB5 F6 VCCPLL VCCPLL0 F7 VCOMPLA VCOMPLA0 F8 NC NC F9 NC NC F10 NC NC F11 NC NC F12 NC NC F13 EMC_AB[20]/IO14NDB0V0 EMC_AB[20]/IO21NDB0V0 F14 EMC_AB[21]/IO14PDB0V0 EMC_AB[21]/IO21PDB0V0 F15 GNDQ GNDQ F16 NC VCCPLL1 F17 NC IO25PPB1V0 F18 VCCFPGAIOB1 VCCFPGAIOB1 F19 IO23NDB1V0 IO28NDB1V0 F20 NC IO31PDB1V0 F21 NC IO31NDB1V0 F22 IO22PDB1V0 IO32PDB1V0 G1 GND GND G2 GFB0/IO65NPB5V0 GFB0/IO82NPB5V0 G3 EMC_DB[9]/GEC1/IO63PDB5V0 EMC_DB[9]/GEC1/IO80PDB5V0 G4 GFC1/IO66PPB5V0 GFC1/IO83PPB5V0 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 40 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 484-Pin FBGA Pin Number A2F200 Function A2F500 Function G5 EMC_DB[11]/IO69PPB5V0 EMC_DB[11]/IO86PPB5V0 G6 GNDQ GNDQ G7 NC NC G8 GND GND G9 VCCFPGAIOB0 VCCFPGAIOB0 G10 GND GND G11 VCCFPGAIOB0 VCCFPGAIOB0 G12 GND GND G13 VCCFPGAIOB0 VCCFPGAIOB0 G14 GND GND G15 VCCFPGAIOB0 VCCFPGAIOB0 G16 GNDQ GNDQ G17 NC IO26PDB1V0 G18 NC IO26NDB1V0 G19 GCA2/IO23PDB1V0 GCA2/IO28PDB1V0 G20 IO24NDB1V0 IO33NDB1V0 G21 GCB2/IO24PDB1V0 GCB2/IO33PDB1V0 G22 GND GND H1 EMC_DB[7]/GEB1/IO62PDB5V0 EMC_DB[7]/GEB1/IO79PDB5V0 H2 VCCFPGAIOB5 VCCFPGAIOB5 H3 EMC_DB[8]/GEC0/IO63NDB5V0 EMC_DB[8]/GEC0/IO80NDB5V0 H4 GND GND H5 GFC0/IO66NPB5V0 GFC0/IO83NPB5V0 H6 GFA1/IO64PDB5V0 GFA1/IO81PDB5V0 H7 GND GND H8 VCC VCC H9 GND GND H10 VCC VCC H11 GND GND H12 VCC VCC H13 GND GND H14 VCC VCC H15 GND GND H16 VCCFPGAIOB1 VCCFPGAIOB1 H17 IO25NDB1V0 IO29NDB1V0 H18 GCC2/IO25PDB1V0 GCC2/IO29PDB1V0 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 41 Pin Descriptions 484-Pin FBGA Pin Number A2F200 Function A2F500 Function H19 GND GND H20 GCC0/IO26NPB1V0 GCC0/IO35NPB1V0 H21 VCCFPGAIOB1 VCCFPGAIOB1 H22 GCB0/IO27NDB1V0 GCB0/IO34NDB1V0 J1 EMC_DB[6]/GEB0/IO62NDB5V0 EMC_DB[6]/GEB0/IO79NDB5V0 J2 EMC_DB[5]/GEA1/IO61PDB5V0 EMC_DB[5]/GEA1/IO78PDB5V0 J3 EMC_DB[4]/GEA0/IO61NDB5V0 EMC_DB[4]/GEA0/IO78NDB5V0 J4 EMC_DB[3]/GEC2/IO60PPB5V0 EMC_DB[3]/GEC2/IO77PPB5V0 J5 VCCFPGAIOB5 VCCFPGAIOB5 J6 GFA0/IO64NDB5V0 GFA0/IO81NDB5V0 J7 VCCFPGAIOB5 VCCFPGAIOB5 J8 GND GND J9 VCC VCC J10 GND GND J11 VCC VCC J12 GND GND J13 VCC VCC J14 GND GND J15 VCC VCC J16 GND GND J17 NC IO37PDB1V0 J18 VCCFPGAIOB1 VCCFPGAIOB1 J19 GCA0/IO28NDB1V0 GCA0/IO36NDB1V0 J20 GCA1/IO28PDB1V0 GCA1/IO36PDB1V0 J21 GCC1/IO26PPB1V0 GCC1/IO35PPB1V0 J22 GCB1/IO27PDB1V0 GCB1/IO34PDB1V0 K1 GND GND K2 EMC_DB[0]/GEA2/IO59NDB5V0 EMC_DB[0]/GEA2/IO76NDB5V0 K3 EMC_DB[1]/GEB2/IO59PDB5V0 EMC_DB[1]/GEB2/IO76PDB5V0 K4 NC IO74PPB5V0 K5 EMC_DB[2]/IO60NPB5V0 EMC_DB[2]/IO77NPB5V0 K6 NC IO75PDB5V0 K7 GND GND K8 VCC VCC K9 GND GND K10 VCC VCC Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 42 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 484-Pin FBGA Pin Number A2F200 Function A2F500 Function K11 GND GND K12 VCC VCC K13 GND GND K14 VCC VCC K15 GND GND K16 VCCFPGAIOB1 VCCFPGAIOB1 K17 NC IO37NDB1V0 K18 GDA1/IO31PDB1V0 GDA1/IO40PDB1V0 K19 GDA0/IO31NDB1V0 GDA0/IO40NDB1V0 K20 GDC1/IO29PDB1V0 GDC1/IO38PDB1V0 K21 GDC0/IO29NDB1V0 GDC0/IO38NDB1V0 K22 GND GND L1 NC IO73PDB5V0 L2 NC IO73NDB5V0 L3 NC IO72PPB5V0 L4 GND GND L5 NC IO74NPB5V0 L6 NC IO75NDB5V0 L7 VCCFPGAIOB5 VCCFPGAIOB5 L8 GND GND L9 VCC VCC L10 GND GND L11 VCC VCC L12 GND GND L13 VCC VCC L14 GND GND L15 VCC VCC L16 GND GND L17 GNDQ GNDQ L18 GDA2/IO33NDB1V0 GDA2/IO42NDB1V0 L19 VCCFPGAIOB1 VCCFPGAIOB1 L20 GDB1/IO30PDB1V0 GDB1/IO39PDB1V0 L21 GDB0/IO30NDB1V0 GDB0/IO39NDB1V0 L22 GDC2/IO32PDB1V0 GDC2/IO41PDB1V0 M1 NC IO71PDB5V0 M2 NC IO71NDB5V0 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 43 Pin Descriptions 484-Pin FBGA Pin Number A2F200 Function A2F500 Function M3 VCCFPGAIOB5 VCCFPGAIOB5 M4 NC IO72NPB5V0 M5 GNDQ GNDQ M6 NC IO68PDB5V0 M7 GND GND M8 VCC VCC M9 GND GND M10 VCC VCC M11 GND GND M12 VCC VCC M13 GND GND M14 VCC VCC M15 GND GND M16 VCCFPGAIOB1 VCCFPGAIOB1 M17 NC NC M18 GDB2/IO33PDB1V0 GDB2/IO42PDB1V0 M19 VJTAG VJTAG M20 GND GND M21 VPP VPP M22 IO32NDB1V0 IO41NDB1V0 N1 GND GND N2 NC IO70PDB5V0 N3 NC IO70NDB5V0 N4 VCCRCOSC VCCRCOSC N5 VCCFPGAIOB5 VCCFPGAIOB5 N6 NC IO68NDB5V0 N7 VCCFPGAIOB5 VCCFPGAIOB5 N8 GND GND N9 VCC VCC N10 GND GND N11 VCC VCC N12 GND GND N13 VCC VCC N14 GND GND N15 VCC VCC N16 NC GND Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 44 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 484-Pin FBGA Pin Number A2F200 Function A2F500 Function N17 NC NC N18 VCCFPGAIOB1 VCCFPGAIOB1 N19 VCCENVM VCCENVM N20 GNDENVM GNDENVM N21 NC NC N22 GND GND P1 NC IO69NDB5V0 P2 NC IO69PDB5V0 P3 GNDRCOSC GNDRCOSC P4 GND GND P5 NC NC P6 NC NC P7 GND GND P8 VCC VCC P9 GND GND P10 VCC VCC P11 GND GND P12 VCC VCC P13 GND GND P14 VCC VCC P15 GND GND P16 VCCFPGAIOB1 VCCFPGAIOB1 P17 TDI TDI P18 TCK TCK P19 GND GND P20 TMS TMS P21 TDO TDO P22 TRSTB TRSTB R1 MSS_RESET_N MSS_RESET_N R2 VCCFPGAIOB5 VCCFPGAIOB5 R3 GPIO_1/IO46RSB4V0 GPIO_1/IO55RSB4V0 R4 NC NC R5 NC NC R6 NC NC R7 NC NC R8 GND GND Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 45 Pin Descriptions 484-Pin FBGA Pin Number A2F200 Function A2F500 Function R9 VCC VCC R10 GND GND R11 VCC VCC R12 GND GND R13 VCC VCC R14 GND GND R15 VCC VCC R16 JTAGSEL JTAGSEL R17 NC NC R18 NC NC R19 NC NC R20 NC NC R21 VCCFPGAIOB1 VCCFPGAIOB1 R22 NC NC T1 GND GND T2 VCCMSSIOB4 VCCMSSIOB4 T3 GPIO_8/IO39RSB4V0 GPIO_8/IO48RSB4V0 T4 GPIO_11/IO57RSB4V0 GPIO_11/IO66RSB4V0 T5 GND GND T6 MAC_CLK MAC_CLK T7 VCCMSSIOB4 VCCMSSIOB4 T8 VCC33SDD0 VCC33SDD0 T9 VCC15A VCC15A T10 GNDAQ GNDAQ T11 GND33ADC0 GND33ADC0 T12 ADC7 ADC7 T13 NC TM4 T14 NC VAREF2 T15 VAREFOUT VAREFOUT T16 VCCMSSIOB2 VCCMSSIOB2 T17 SPI_1_DO/GPIO_24 SPI_1_DO/GPIO_24 T18 GND GND T19 NC NC T20 NC NC T21 VCCMSSIOB2 VCCMSSIOB2 T22 GND GND Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 46 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 484-Pin FBGA Pin Number A2F200 Function A2F500 Function U1 GND GND U2 GPIO_5/IO42RSB4V0 GPIO_5/IO51RSB4V0 U3 GPIO_10/IO58RSB4V0 GPIO_10/IO67RSB4V0 U4 VCCMSSIOB4 VCCMSSIOB4 U5 MAC_RXD[1]/IO53RSB4V0 MAC_RXD[1]/IO62RSB4V0 U6 NC NC U7 VCC33AP VCC33AP U8 VCC33N VCC33N U9 CM1 CM1 U10 VAREF0 VAREF0 U11 GND33ADC1 GND33ADC1 U12 ADC4 ADC4 U13 NC GNDTM2 U14 NC ADC11 U15 GNDVAREF GNDVAREF U16 VCC33SDD1 VCC33SDD1 U17 SPI_0_DO/GPIO_16 SPI_0_DO/GPIO_16 U18 UART_0_RXD/GPIO_21 UART_0_RXD/GPIO_21 U19 VCCMSSIOB2 VCCMSSIOB2 U20 I2C_1_SCL/GPIO_31 I2C_1_SCL/GPIO_31 U21 I2C_0_SCL/GPIO_23 I2C_0_SCL/GPIO_23 U22 GND GND V1 GPIO_0/IO47RSB4V0 GPIO_0/IO56RSB4V0 V2 GPIO_6/IO41RSB4V0 GPIO_6/IO50RSB4V0 V3 GPIO_9/IO38RSB4V0 GPIO_9/IO47RSB4V0 V4 MAC_MDIO/IO49RSB4V0 MAC_MDIO/IO58RSB4V0 V5 MAC_RXD[0]/IO54RSB4V0 MAC_RXD[0]/IO63RSB4V0 V6 GND GND V7 SDD0 SDD0 V8 ABPS1 ABPS1 V9 ADC2 ADC2 V10 VCC33ADC0 VCC33ADC0 V11 ADC6 ADC6 V12 ADC5 ADC5 V13 ABPS5 ABPS5 V14 NC ADC8 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 47 Pin Descriptions 484-Pin FBGA Pin Number A2F200 Function A2F500 Function V15 NC GND33ADC2 V16 NC NC V17 GND GND V18 SPI_0_DI/GPIO_17 SPI_0_DI/GPIO_17 V19 SPI_1_DI/GPIO_25 SPI_1_DI/GPIO_25 V20 UART_1_TXD/GPIO_28 UART_1_TXD/GPIO_28 V21 I2C_0_SDA/GPIO_22 I2C_0_SDA/GPIO_22 V22 I2C_1_SDA/GPIO_30 I2C_1_SDA/GPIO_30 W1 GPIO_2/IO45RSB4V0 GPIO_2/IO54RSB4V0 W2 GPIO_7/IO40RSB4V0 GPIO_7/IO49RSB4V0 W3 GND GND W4 MAC_CRSDV/IO51RSB4V0 MAC_CRSDV/IO60RSB4V0 W5 MAC_TXD[1]/IO55RSB4V0 MAC_TXD[1]/IO64RSB4V0 W6 NC SDD2 W7 GNDA GNDA W8 TM0 TM0 W9 ABPS2 ABPS2 W10 GND33ADC0 GND33ADC0 W11 VCC15ADC1 VCC15ADC1 W12 ABPS6 ABPS6 W13 NC CM4 W14 NC ABPS9 W15 NC VCC33ADC2 W16 GNDA GNDA W17 PU_N PU_N W18 GNDSDD1 GNDSDD1 W19 SPI_0_CLK/GPIO_18 SPI_0_CLK/GPIO_18 W20 GND GND W21 SPI_1_SS/GPIO_27 SPI_1_SS/GPIO_27 W22 UART_1_RXD/GPIO_29 UART_1_RXD/GPIO_29 Y1 GPIO_3/IO44RSB4V0 GPIO_3/IO53RSB4V0 Y2 VCCMSSIOB4 VCCMSSIOB4 Y3 GPIO_15/IO34RSB4V0 GPIO_15/IO43RSB4V0 Y4 MAC_TXEN/IO52RSB4V0 MAC_TXEN/IO61RSB4V0 Y5 VCCMSSIOB4 VCCMSSIOB4 Y6 GNDSDD0 GNDSDD0 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. 5- 48 R e visio n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs 484-Pin FBGA Pin Number A2F200 Function A2F500 Function Y7 CM0 CM0 Y8 GNDTM0 GNDTM0 Y9 ADC0 ADC0 Y10 VCC15ADC0 VCC15ADC0 Y11 ABPS7 ABPS7 Y12 TM3 TM3 Y13 NC ABPS8 Y14 NC GND33ADC2 Y15 NC VCC15ADC2 Y16 VCCMAINXTAL VCCMAINXTAL Y17 SDD1 SDD1 Y18 PTEM PTEM Y19 VCC33A VCC33A Y20 SPI_0_SS/GPIO_19 SPI_0_SS/GPIO_19 Y21 VCCMSSIOB2 VCCMSSIOB2 Y22 UART_0_TXD/GPIO_20 UART_0_TXD/GPIO_20 Note: Shading denotes pins that do not have completely identical functions from density to density. For example, the bank assignment can be different for an I/O, or the function might be available only on a larger density device. Revision 4 5- 49 6 - Datasheet Information List of Changes The following table lists critical changes that were made in each revision of the SmartFusion datasheet. Revision Changes Page Revision 4 Table 2-8 * Quiescent Supply Current Characteristics was revised. VCCRCOSC was (September 2010) moved to a column of its own with new values. VCCENVM was added to the table. Standby mode for VJTAG and VPP was changed from 0 V to N/A. "Disable" was changed to "Off "in the eNVM column. The column for RCOSC was deleted. 2-10 The "Power-Down and Sleep Mode Implementation" section was revised to include VCCROSC. 2-11 Revision 3 The "I/Os and Operating Voltage" section was revised to list "single 3.3 V power supply (September 2010) with on-chip 1.5 V regulator" and "external 1.5 V is allowed" (SAR 27663). I The CS288 package was added to the "Package I/Os: MSS + FPGA I/Os" table (SAR III, VI, VI 27101), "Product Ordering Codes" table, and "Temperature Grade Offerings" table (SAR 27044). The number of direct analog inputs for the FG256 package in A2F060 was changed from 8 to 6. Two notes were added to the "SmartFusion Family Product Table" indicating limitations for features of the A2F500 device: II Two PLLs are available in CS288 and FG484 (one PLL in FG256). [ADCs, DACs, SCBs, comparators, current monitors, and bipolar high voltage monitors are] Available on FG484 only. FG256 and CS288 packages offer the same programmable analog capabilities as A2F200. Table cells were merged in rows containing the same values for easier reading (SAR 24748). The security feature option was added to the "Product Ordering Codes" table. VI In Table 2-3 * Recommended Operating Conditions, the VDDBAT recommended operating range was changed from "2.97 to 3.63" to "2.7 to 3.63" (SAR 25246). Recommended operating range was changed to "3.15 to 3.45" for the following voltages: 2-3 VCC33A VCC33ADCx VCC33AP VCC33SDDx VCCMAINXTAL VCCLPXTAL Two notes were added to the table (SAR 27109): 1. The following 3.3 V supplies should be connected together while following proper noise filtering practices: VCC33A, VCC33ADCx, VCC33AP, VCC33SDDx, VCCMAINXTAL, and VCCLPXTAL. 2. The following 1.5 V supplies should be connected together while following proper noise filtering practices: VCC, VCC15A, and VCC15ADCx. In Table 2-3 * Recommended Operating Conditions, the description for VCCLPXTAL was corrected to change "32 Hz" to "32 KHz" (SAR 27110). 2-3 The "Power Supply Sequencing Requirement" section is new (SAR 27178). 2-4 Revision 4 6 -1 Datasheet Information Revision Revision 3 (continued) Changes Page Table 2-8 * Quiescent Supply Current Characteristics was revised to change most on/off entries to voltages. Note 5 was added, stating that "on" means proper voltage is applied. The values of 6 A and 16 A were removed for IDC1 and IDC2 for 3.3 V. A note was added for IDC1 and IDC2: "Power mode and Sleep mode are consuming higher current than expected in the current version of silicon. These specifications will be updated when new version of the silicon is available" (SAR 27926). 2-10 The "Power-Down and Sleep Mode Implementation" section is new (SAR 27178). 2-11 A note was added to Table 2-83 * SmartFusion CCC/PLL Specification, pertaining to fout_CCC, stating that "one of the CCC outputs (GLA0) is used as an MSS clock and is limited to 100 MHz (maximum) by software" (SAR 26388). 2-65 Table 2-87 * eNVM Block Timing, Worst Commercial Case Conditions: TJ = 85C, VCC = 1.425 V was revised. Values were included for A2F200 and A2F500, for -1 and Std. speed grades. A note was added to define 6:1:1:1 and 5:1:1:1 (SAR 26166). 2-77 The units were corrected (mV instead of V) for input referred offset voltage, GDEC[1:0] = 00 in Table 2-93 * ABPS Performance Specifications (SAR 25381). 2-83 The test condition values for operating current (ICC33A, typical) were changed in Table 2-96 * Voltage Regulator (SAR 26465). 2-87 Figure 2-45 * Typical Output Voltage was revised to add legends for the three curves, stating the load represented by each (SAR 25247). 2-88 The "SmartFusion Programming" chapter was moved to this document from the SmartFusion Subsystem Microcontroller User's Guide (SAR 26542). The "Typical Programming and Erase Times" section was added to this chapter. 4-5 Figure 4-1 * TRSTB Logic was revised to change 1.5 V to "VJTAG (1.5 V to 3.3 V nominal)" (SAR 24694). 4-6 Two notes were added to the "Supply Pins" table (SAR 27109): 5-1 1. The following supplies should be connected together while following proper noise filtering practices: VCC33A, VCC33ADCx, VCC33AP, VCC33SDDx, VCCMAINXTAL, and VCCLPXTAL. 2. The following 1.5 V supplies should be connected together while following proper noise filtering practices: VCC, VCC15A, and VCC15ADCx. The descriptions for the "VCC33N", "NCAP", and "PCAP" pins were revised to include 5-2, 5-6, information on what to do if analog SCB features and SDDs are not used (SAR 5-7 26744). 6-2 Information was added to the "User Pins" table regarding tristating of used and unused GPIO pins. The IO portion of the table was revised to state that unused I/O pins are disabled by Libero IDE software and include a weak pull-up resistor (SAR 26890). Information was added regarding behavior of used I/O pins during power-up. 5-5 The type for "EMC_RW_N" was changed from In/out to Out (SAR 25113). 5-10 A note was added to the "Analog Front-End (AFE)" table stating that unused analog inputs should be grounded (SAR 26744). 5-12 The "288-Pin CSP" section is new, with pin tables for A2F200 and A2F500 (SAR 27044). 5-16 The "256-Pin FBGA" pin table was replaced and now includes "Handling When Unused" information (SAR 27709). 5-25 R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Revision Revision 2 (May 2010) Revision 1 (March 2010) Revision 0 (March 2010) Changes Page Embedded nonvolatile flash memory (eNVM) was changed from "64 to 512 Kbytes" to "128 to 512 Kbytes" in the "Microcontroller Subsystem (MSS)" section and "SmartFusion Family Product Table" (SAR 26005). I, II The main oscillator range of values was changed to "32 KHz to 20 MHz" in the "Microcontroller Subsystem (MSS)" section and the "SmartFusion Family Product Table" (SAR 24906). I, II The value for tPD was changed from 50 ns to 15 ns for the high-speed voltage comparators listed in the "Analog Front-End (AFE)" section (SAR 26005). I The number of PLLs for A2F200 was changed from 2 to 1 in the "SmartFusion Family Product Table" (SAR 25093). II Values for direct analog input, total analog input, and total I/Os were updated for the FG256 package, A2F060, in the "Package I/Os: MSS + FPGA I/Os" table. The Max. column was removed from the table (SAR 26005). III The Speed Grade section of the "Product Ordering Codes" table was revised (SAR 25257). VI The "Product Ordering Codes" table was revised to add "blank" as an option for leadfree packaging and application (junction temperature range). VI Table 2-3 * Recommended Operating Conditions was revised. Ta (ambient temperature) was replaced with TJ (junction temperature). 2-3 PDC5 was deleted from Table 2-14 * Different Components Contributing to the Static Power Consumption in SmartFusion Devices. 2-15 The formulas in the footnotes for Table 2-28 * I/O Weak Pull-Up/Pull-Down Resistances were revised. 2-29 The values for input biased current were revised in Table 2-90 * Current Monitor Performance Specification. 2-79 The "Analog Front-End (AFE)" section was updated to change the throughput for 10bit mode from 600 Ksps to 550 Ksps. I The A2F060 device was added to product information tables. N/A The "Product Ordering Codes" table was updated to removed STD speed and add speed grade 1. Pre-production was removed from the application ordering code category. VI The "SmartFusion Block Diagram" was revised. IV The "Datasheet Categories" section was updated, referencing the "SmartFusion Block Diagram" table, which is new. The "VCCI" parameter was renamed to "VCCxxxxIOBx." 1-4, IV N/A "Advanced I/Os" were renamed to "FPGA I/Os." Generic pin names that represent multiple pins were standardized with a lower case x as a placeholder. For example, VAREFx designates VAREF0, VAREF1, and VAREF2. Modes were renamed as follows: Operating mode was renamed to SoC mode. 32KHz Active mode was renamed to Standby mode. Battery mode was renamed to Time Keeping mode. Table entries have been filled with values as data has become available. Revision 4 6 -3 Datasheet Information Revision Revision 0 (continued) Changes Page Table 2-1 * Absolute Maximum Ratings, Table 2-2 * Analog Maximum Ratings, and 2-1 Table 2-3 * Recommended Operating Conditions were revised extensively. through 2-3 Device names were updated in Table 2-6 * Package Thermal Resistance. 2-7 Table 2-8 * Quiescent Supply Current Characteristics was revised extensively. 2-10 Table 2-10 * Summary of I/O Input Buffer Power (per pin) - Default I/O Software Settings was revised extensively. 2-12 Removed "Example of Power Calculation." N/A Table 2-13 * Different Components Contributing to Dynamic Power Consumption in SmartFusion Devices was revised extensively. 2-13 Table 2-14 * Different Components Contributing to the Static Power Consumption in SmartFusion Devices was revised extensively. 2-15 The "Power Calculation Methodology" section was revised. 2-16 Table 2-80 * Electrical Characteristics of the RC Oscillator was revised extensively. 2-63 Table 2-82 * Electrical Characteristics of the Low Power Oscillator was revised extensively. 2-64 The parameter tRSTBQ was changed to TC2CWRH in Table 2-84 * RAM4K9. 2-71 The 12-bit mode row for integral non-linearity was removed from Table 2-92 * ADC Specifications. The typical value for 10-bit mode was revised. The table note was punctuated correctly to make it clear. 2-81 Figure 37-34 * Write Access after Write onto Same Address, Figure 37-34 * Read Access after Write onto Same Address, and Figure 37-34 * Write Access after Read onto Same Address were deleted. N/A Table 2-96 * Voltage Regulator was revised extensively. 2-87 The "Serial Peripheral Interface (SPI) Characteristics" section and "Inter-Integrated Circuit (I2C) Characteristics" section are new. 2-89, 2-91 "SmartFusion Development Tools" section was replaced with new content. 3-1 The pin description tables were revised by adding additional pins to reflect the pinout 5-1 for A2F500. through 5-14 The descriptions for "GNDSDD1" and "VCC33SDD1" were revised. Draft B (December 2009) 6-4 5-1, 5-2 The description for "VCC33A" was revised. 5-2 The pin tables for the "256-Pin FBGA" and "484-Pin FBGA" were replaced with tables that compare pin functions across densities for each package. 5-25 The "Digital I/Os" section was renamed to the "I/Os and Operating Voltage" section and information was added regarding digital and analog VCC. I The "SmartFusion Family Product Table" and "Package I/Os: MSS + FPGA I/Os" section were revised. II The terminology for the analog blocks was changed to "programmable analog," consisting of two blocks: the analog front-end and analog compute engine. This is reflected throughout the text and in the "SmartFusion Block Diagram". IV The "Product Ordering Codes" table was revised to add G as an ordering code for eNVM size. VI R e vi s i o n 4 Actel SmartFusion Intelligent Mixed Signal FPGAs Revision Draft B (continued) Changes Page Timing tables were populated with information that has become available for speed grade -1. N/A All occurrences of the VMV parameter were removed. N/A The SDD[n] voltage parameter was removed from Table 2-2 * Analog Maximum Ratings. 2-2 Table 36-4 * Flash Programming Limits - Retention, Storage and Operating Temperature was replaced with Table 2-4 * FPGA and Embedded Flash Programming, Storage and Operating Limits. 2-4 The "Thermal Characteristics" section was revised extensively. 2-7 Table 2-8 * Quiescent Supply Current Characteristics was revised significantly. 2-10 Table 2-13 * Different Components Contributing to Dynamic Power Consumption in SmartFusion Devices and Table 2-14 * Different Components Contributing to the Static Power Consumption in SmartFusion Devices were updated. 2-13 Figure 2-3 * Timing Model was updated. 2-21 The temperature associated with the reliability for LVTTL/LVCMOS in Table 2-33 * I/O Input Rise Time, Fall Time, and Related I/O Reliability was changed from 110 to 100. 2-31 The values in Table 2-77 * Combinatorial Cell Propagation Delays were updated. 2-59 Table 2-82 * Electrical Characteristics of the Low Power Oscillator is new. Table 2-81 * Electrical Characteristics of the Main Crystal Oscillator was revised. 2-64 Table 2-87 * eNVM Block Timing, Worst Commercial Case Conditions: TJ = 85C, VCC = 1.425 V and Table 2-88 * FlashROM Access Time, Worse Commercial Case Conditions: TJ = 85C, VCC = 1.425 V are new. 2-77 The performance tables in the "Programmable Analog Specifications" section were revised, including new data available. Table 2-95 * Analog Sigma-Delta DAC is new. 2-79 The "256-Pin FBGA" table for A2F200 is new. 4-15 Revision 4 6 -5 Datasheet Information Datasheet Categories Categories In order to provide the latest information to designers, some datasheet parameters are published before data has been fully characterized from silicon devices. The data provided for a given device, as highlighted in the "SmartFusion Device Status" table on page III, is designated as either "Product Brief," "Advance," "Preliminary," or "Production." The definitions of these categories are as follows: Product Brief The product brief is a summarized version of a datasheet (advance or production) and contains general product information. This document gives an overview of specific device and family information. Advance This version contains initial estimated information based on simulation, other products, devices, or speed grades. This information can be used as estimates, but not for production. This label only applies to the DC and Switching Characteristics chapter of the datasheet and will only be used when the data has not been fully characterized. Preliminary The datasheet contains information based on simulation and/or initial characterization. The information is believed to be correct, but changes are possible. Production This version contains information that is considered to be final. Export Administration Regulations (EAR) The products described in this document are subject to the Export Administration Regulations (EAR). They could require an approved export license prior to export from the United States. An export includes release of product or disclosure of technology to a foreign national inside or outside the United States. Actel Safety Critical, Life Support, and High-Reliability Applications Policy The Actel products described in this advance status document may not have completed Actel's qualification process. Actel may amend or enhance products during the product introduction and qualification process, resulting in changes in device functionality or performance. It is the responsibility of each customer to ensure the fitness of any Actel product (but especially a new product) for a particular purpose, including appropriateness for safety-critical, life-support, and other high-reliability applications. Consult Actel's Terms and Conditions for specific liability exclusions relating to life-support applications. A reliability report covering all of Actel's products is available on the Actel website at http://www.actel.com/documents/ORT_Report.pdf. Actel also offers a variety of enhanced qualification and lot acceptance screening procedures. Contact your local Actel sales office for additional reliability information. 6-6 R e vi s i o n 4 Actel is the leader in low-power FPGAs and mixed-signal FPGAs and offers the most comprehensive portfolio of system and power management solutions. Power Matters. Learn more at www.actel.com. Actel Corporation Actel Europe Ltd. Actel Japan Actel Hong Kong 2061 Stierlin Court Mountain View, CA 94043-4655 USA Phone 650.318.4200 Fax 650.318.4600 River Court,Meadows Business Park Station Approach, Blackwater Camberley Surrey GU17 9AB United Kingdom Phone +44 (0) 1276 609 300 Fax +44 (0) 1276 607 540 EXOS Ebisu Buillding 4F 1-24-14 Ebisu Shibuya-ku Tokyo 150 Japan Phone +81.03.3445.7671 Fax +81.03.3445.7668 http://jp.actel.com Room 2107, China Resources Building 26 Harbour Road Wanchai, Hong Kong Phone +852 2185 6460 Fax +852 2185 6488 www.actel.com.cn (c) Actel Corporation. All rights reserved. Actel, Actel Fusion, IGLOO, Libero, Pigeon Point, ProASIC, SmartFusion and the associated logos are trademarks or registered trademarks of Actel Corporation. All other trademarks and service marks are the property of their respective owners. 51700112-4/9.10