CDAC1
CDAC2
SARRegister1/2
S/H
S/H
Comparator
Comparator
CDAC3
CDAC4
SARRegister3/4
S/H
S/H
Comparator
Comparator
CDAC5
CDAC6
SARRegister5/6
StringDAC
Clock
Generator
S/H
S/H
Comparator
Comparator
Internal2.5V
Reference
I/O
Control
Logic
Config
Register
CH_A0
CONVST_A
CH_A1
AGND
AGND
REFC_A
CH_B0
CONVST_B
CH_B1
AGND
AGND
REFC_B
CH_C0
CONVST_C
CH_C1
AGND
AGND
REFC_C
REF IO_
HVSS
AVDD
AGND
ADS8556
ADS8557
ADS8558
Buffer
Buffer
Buffer
Buffer
HVDD
BVDD
BGND
HW/SW
REF /WR
EN
STBY
RESET
RANGE/XCLK
BUSY/INT
DB[15:0]
WORD/BYTE
PAR/SER
RD
CS/FS
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
16-, 14-, 12-Bit, Six-Channel, Simultaneous Sampling
ANALOG-TO-DIGITAL CONVERTERS
Check for Samples: ADS8556,ADS8557,ADS8558
1FEATURES DESCRIPTION
The ADS8556/7/8 contain six low-power, 16-, 14-, or
2Family of 16-, 14-, 12-Bit, Pin- and 12-bit, successive approximation register (SAR)
Software-Compatible ADCs based analog-to-digital converters (ADCs) with true
Six SAR ADCs Grouped in Three Pairs bipolar inputs. Each channel contains a
Maximum Data Rate Per Channel with Internal sample-and-hold circuit that allows simultaneous
high-speed multi-channel signal acquisition.
Conversion Clock and Reference:
ADS8556: 630kSPS (PAR) or 450kSPS (SER) The ADS8556/7/8 support data rates of up to
ADS8557: 670kSPS (PAR) or 470kSPS (SER) 730kSPS in parallel interface mode or up to 500kSPS
ADS8558: 730kSPS (PAR) or 500kSPS (SER) if the serial interface is used. The bus width of the
parallel interface can be set to eight or 16 bits. In
Maximum Data Rate with External Conversion serial mode, up to three output channels can be
Clock and Reference: activated.
800kSPS (PAR) or 530kSPS (SER) The ADS8556/7/8 is specified over the full industrial
Pin-Selectable or Programmable Input Voltage temperature range of 40°C to +125°C and is
Ranges: Up to ±12V available in an LQFP-64 package.
Excellent Signal-to-Noise Performance:
91.5dB (ADS8556)
85dB (ADS8557)
73.9dB (ADS8558)
Programmable and Buffered Internal
Reference: 0.5V to 2.5V and 0.5V to 3.0V
Comprehensive Power-Down Modes:
Deep Power-Down (Standby Mode)
Partial Power-Down
Auto-Nap Power-Down
Selectable Parallel or Serial Interface
Operating Temperature Range:
40°C to +125°C
LQFP-64 Package
APPLICATIONS
Power Quality Measurement
Protection Relays
Multi-Axis Motor Control
Programmable Logic Controllers
Industrial Data Acquisition
1Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Copyright ©20062012, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION(1)
RESOLUTION PACKAGE- PACKAGE ORDERING TRANSPORT
PRODUCT (Bits) LEAD DESIGNATOR NUMBER MEDIA, QUANTITY
ADS8556IPM Tray, 160
ADS8556I 16 LQFP-64 PM ADS8556IPMR Tape and Reel, 1000
ADS8557IPM Tray, 160
ADS8557I 14 LQFP-64 PM ADS8557IPMR Tape and Reel, 1000
ADS8558IPM Tray, 160
ADS8558I 12 LQFP-64 PM ADS8558IPMR Tape and Reel, 1000
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS(1)
Over operating free-air temperature range, unless otherwise noted. ADS8556, ADS8557, ADS8558 UNIT
Supply voltage, HVDD to AGND 0.3 to +18 V
Supply voltage, HVSS to AGND 18 to +0.3 V
Supply voltage, AVDD to AGND 0.3 to +6 V
Supply voltage, BVDD to BGND 0.3 to +6 V
Analog input voltage HVSS 0.3 to HVDD + 0.3 V
Reference input voltage with respect to AGND AGND 0.3 to AVDD + 0.3 V
Digital input voltage with respect to BGND BGND 0.3 to BVDD + 0.3 V
Ground voltage difference AGND to BGND ±0.3 V
Input current to all pins except supply 10 to +10 mA
Maximum virtual junction temperature, TJ+150 °C
Human body model (HBM) ±2000 V
JEDEC standard 22, test method A114-C.01, all pins
ESD ratings Charged device model (CDM) ±500 V
JEDEC standard 22, test method C101, all pins
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2Copyright ©20062012, Texas Instruments Incorporated
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
RECOMMENDED OPERATING CONDITIONS MIN TYP MAX UNIT
Supply voltage, AVDD to AGND 4.5 5 5.5 V
Low-voltage levels 2.7 3.0 3.6 V
Supply voltage, BVDD to BGND 5V logic levels 4.5 5 5.5 V
Range 1 (±2×VREF) 2 ×VREF 16.5 V
Input supply voltage, HVDD to AGND Range 2 (±4×VREF) 4 ×VREF 16.5 V
Range 1 (±2×VREF)16.5 2×VREF V
Input supply voltage, HVSS to AGND Range 2 (±4×VREF)16.5 4×VREF V
Reference input voltage (VREF) 0.5 2.5 3.0 V
Range 1 (±2×VREF)2×VREF +2 ×VREF V
Analog inputs
(also see the Analog Inputs section) Range 1 (±4×VREF)4×VREF +4 ×VREF V
Operating ambient temperature range, TA40 +125 °C
DISSIPATION RATINGS(1)
DERATING FACTOR TA+25°C TA= +70°C TA= +85°C TA= +125°C
PACKAGE ABOVE TA= +25°C POWER RATING POWER RATING POWER RATING POWER RATING
LQFP-64 20.8mW/°C 2.60W 1.66W 1.35W 0.52W
(1) Based on High-K θJA.
THERMAL CHARACTERISTICS
Over recommended operating conditions, unless otherwise noted. ADS8556, ADS8557, ADS8558
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Low-K thermal resistance(1) 74 °C/W
θJA Junction-to-air thermal resistance High-K thermal resistance(1) 48 °C/W
Junction-to-case thermal
θJC 16 °C/W
resistance
ADS8556, HVDD = +15V, HVSS = 15V, AVDD = 5V, 251.7 298.5 mW
BVDD = 3V, and fDATA = maximum
ADS8557, HVDD = +15V, HVSS = 15V, AVDD = 5V,
PDDevice power dissipation 253.2 303.0 mW
BVDD = 3V, and fDATA = maximum
ADS8558, HVDD = +15V, HVSS = 15V, AVDD = 5V, 262.2 318.0 mW
BVDD = 3V, and fDATA = maximum
(1) Modeled in accordance with the Low-K or High-K thermal metric definitions of EIA/JESD51-3.
Copyright ©20062012, Texas Instruments Incorporated 3
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
ELECTRICAL CHARACTERISTICS: ADS8556
Over recommended operating free-air temperature range of 40°C to +125°C, AVDD = 4.5V to 5V, BVDD = 2.7V to 5.5V,
HVDD = 10V to 15V, HVSS = 15V to 10V, VREF = 2.5V (internal), and fDATA = 630kSPS in parallel mode or 450kSPS in
serial mode, unless otherwise noted. ADS8556
PARAMETER CONDITIONS MIN TYP(1) MAX UNIT
DC ACCURACY
Resolution 16 Bits
No missing codes 16 Bits
At TA=40°C to +85°C3±1.5 3 LSB
Integral linearity error INL At TA=40°C to +125°C4±1.5 4 LSB
At TA=40°C to +85°C1±0.75 1.5 LSB
Differential linearity error DNL At TA=40°C to +125°C1±0.75 2 LSB
Offset error 4.0 ±0.8 4.0 mV
Offset error drift ±3.5 μV/°C
Gain error Referenced to voltage at REFIO 0.75 ±0.25 0.75 %FSR
Gain error drift Referenced to voltage at REFIO ±6 ppm/°C
Power-supply rejection ratio PSRR At output code FFFFh, related to AVDD 60 dB
SAMPLING DYNAMICS
Acquisition time tACQ 280 ns
Conversion time per ADC tCONV 1.26 μs
18.5 tCCLK
Internal conversion clock period tCCLK 68.0 ns
Parallel interface, 630 kSPS
internal clock and reference
Throughput rate fDATA Serial interface, 450 kSPS
internal clock and reference
AC ACCURACY
At fIN = 10kHz, TA=40°C to +85°C 90 91.5 dB
Signal-to-noise ratio SNR At fIN = 10kHz, TA=40°C to +125°C 89 91.5 dB
At fIN = 10kHz, TA=40°C to +85°C 87 89.5 dB
Signal-to-noise ratio + distortion SINAD At fIN = 10kHz, TA=40°C to +125°C 86.5 89.5 dB
At fIN = 10kHz, TA=40°C to +85°C94 90 dB
Total harmonic distortion(2) THD At fIN = 10kHz, TA=40°C to +125°C94 89.5
At fIN = 10kHz, TA=40°C to +85°C 90 95 dB
Spurious-free dynamic range SFDR At fIN = 10kHz, TA=40°C to +125°C 89.5 95 dB
Channel-to-channel isolation At fIN = 10kHz 100 dB
In 4 ×VREF mode 48 MHz
3dB small-signal bandwidth In 2 ×VREF mode 24 MHz
(1) All values are at TA= +25°C.
(2) Calculated on the first nine harmonics of the input frequency.
4Copyright ©20062012, Texas Instruments Incorporated
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
ELECTRICAL CHARACTERISTICS: ADS8557
Over recommended operating free-air temperature range of 40°C to +125°C, AVDD = 4.5V to 5.5V, BVDD = 2.7V to 5.5V,
HVDD = 10V to 15V, HVSS = 15V to 10V, VREF = 2.5V (internal), and fDATA = 670kSPS in parallel mode or 470kSPS in
serial mode, unless otherwise noted. ADS8557
PARAMETER CONDITIONS MIN TYP(1) MAX UNIT
DC ACCURACY
Resolution 14 Bits
No missing codes 14 Bits
Integral linearity error INL 1±0.4 1 LSB
Differential linearity error DNL 1±0.25 1 LSB
Offset error 4±0.8 4 mV
Offset error drift ±3.5 μV/°C
Gain error Referenced to voltage at REFIO 0.75 ±0.25 0.75 %FSR
Gain error drift Referenced to voltage at REFIO ±6 ppm/°C
Power-supply rejection ratio PSRR At output code FFFFh, related to AVDD 60 dB
SAMPLING DYNAMICS
Acquisition time tACQ 280 ns
Conversion time per ADC tCONV 1.19 μs
18.5 tCCLK
Internal conversion clock period tCCLK 64.1 ns
Parallel interface, 670 kSPS
internal clock and reference
Throughput rate fDATA Serial interface, 470 kSPS
internal clock and reference
AC ACCURACY
Signal-to-noise ratio SNR At fIN = 10kHz 84 85 dB
Signal-to-noise ratio + distortion SINAD At fIN = 10kHz 83 84 dB
Total harmonic distortion(2) THD At fIN = 10kHz 91 86 dB
Spurious-free dynamic range SFDR At fIN = 10kHz 86 92 dB
Channel-to-channel isolation At fIN = 10kHz 100 dB
In 4 ×VREF mode 48 MHz
3dB small-signal bandwidth In 2 ×VREF mode 24 MHz
(1) All values are at TA= +25°C.
(2) Calculated on the first nine harmonics of the input frequency.
Copyright ©20062012, Texas Instruments Incorporated 5
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
ELECTRICAL CHARACTERISTICS: ADS8558
Over recommended operating free-air temperature range of 40°C to +125°C, AVDD = 4.5V to 5V, BVDD = 2.7V to 5.5V,
HVDD = 10V to 15V, HVSS = 15V to 10V, VREF = 2.5V (internal), and fDATA = 730kSPS in parallel mode or 500kSPS in
serial mode, unless otherwise noted. ADS8558
PARAMETER CONDITIONS MIN TYP(1) MAX UNIT
DC ACCURACY
Resolution 12 Bits
No missing codes 12 Bits
Integral linearity error INL 0.75 ±0.2 0.75 LSB
Differential linearity error DNL 0.5 ±0.2 0.5 LSB
Offset error 4±0.8 4 mV
Offset error drift ±3.5 μV/°C
Gain error Referenced to voltage at REFIO 0.75 ±0.25 0.75 %FSR
Gain error drift Referenced to voltage at REFIO ±6 ppm/°C
Power-supply rejection ratio PSRR At output code FFFFh, related to AVDD 60 dB
SAMPLING DYNAMICS
Acquisition time tACQ 280 ns
Conversion time per ADC tCONV 1.09 μs
18.5 tCCLK
Internal conversion clock period tCCLK 58.8 ns
Parallel interface, 730 kSPS
internal clock and reference
Throughput rate fDATA Serial interface, 500 kSPS
internal clock and reference
AC ACCURACY
Signal-to-noise ratio SNR At fIN = 10kHz 73 73.9 dB
Signal-to-noise ratio + distortion SINAD At fIN = 10kHz 73 73.8 dB
Total harmonic distortion(2) THD At fIN = 10kHz 89 84 dB
Spurious-free dynamic range SFDR At fIN = 10kHz 84 92 dB
Channel-to-channel isolation At fIN = 10kHz 100 dB
In 4 ×VREF mode 48 MHz
3dB small-signal bandwidth In 2 ×VREF mode 24 MHz
(1) All values are at TA= +25°C.
(2) Calculated on the first nine harmonics of the input frequency.
6Copyright ©20062012, Texas Instruments Incorporated
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
ELECTRICAL CHARACTERISTICS: GENERAL
Over recommended operating free-air temperature range of 40°C to +125°C, AVDD = 4.5V to 5.5V, BVDD = 2.7V to 5.5V,
HVDD = 10V to 15V, HVSS = 15V to 10V, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
ADS8556, ADS8557, ADS8558
PARAMETER CONDITIONS MIN TYP(1) MAX UNIT
ANALOG INPUT
RANGE pin/RANGE bit = 0 4×VREF +4 ×VREF V
Bipolar full-scale range CHXX RANGE pin/RANGE bit = 1 2×VREF +2 ×VREF V
Input range = ±4×VREF 10 pF
Input capacitance Input range = ±2×VREF 20 pF
Input leakage current No ongoing conversion ±1μA
Aperture delay 5 ns
Aperture delay matching Common CONVST for all channels 250 ps
Aperture jitter 50 ps
EXTERNAL CLOCK INPUT (XCLK)
External clock frequency fXCLK An external reference must be used for fXCLK >fCCLK 1 18 20 MHz
External clock duty cycle 45 55 %
REFERENCE VOLTAGE OUTPUT (REFOUT)
2.5V operation, REFDAC = 0x3FF 2.485 2.5 2.515 V
2.5V operation, REFDAC = 0x3FF at +25°C 2.496 2.5 2.504 V
Reference voltage VREF 3.0V operation, REFDAC = 0x3FF 2.985 3.0 3.015 V
3.0V operation, REFDAC = 0x3FF at +25°C 2.995 3.0 3.005 V
Reference voltage drift dVREF/dT ±10 ppm/°C
Power-supply rejection ratio PSRR 73 dB
Output current IREFOUT DC current 2 2 mA
Short-circuit current(2) IREFSC 50 mA
Turn-on settling time tREFON 10 ms
At CREF_x pins 4.7 10 μF
External load capacitance At REFIO pins 100 470 nF
Tuning range REFDAC Internal reference output voltage range 0.2 ×VREF VREF V
REFDAC resolution 10 Bits
REFDAC differential nonlinearity DNLDAC 1±0.1 1 LSB
REFDAC integral nonlinearity INLDAC 2±0.1 2 LSB
REFDAC offset error VOSDAC VREF = 0.5V (DAC = 0x0CC) 4±0.65 4 LSB
REFERENCE VOLTAGE INPUT (REFIN)
Reference input voltage VREFIN 0.5 2.5 3.025 V
Input resistance 100 M
Input capacitance 5 pF
Reference input current 1 μA
SERIAL CLOCK INPUT (SCLK)
Serial clock input frequency fSCLK 0.1 36 MHz
Serial clock period tSCLK 0.0278 10 μs
Serial clock duty cycle 40 60 %
DIGITAL INPUTS(3)
Logic family CMOS with Schmitt-Trigger
High-level input voltage 0.7 ×BVDD BVDD + 0.3 V
Low-level input voltage BGND 0.3 0.3 ×BVDD V
Input current VI= BVDD to BGND 50 +50 nA
Input capacitance 5 pF
(1) All values are at TA= +25°C.
(2) Reference output current is not limited internally.
(3) Specified by design.
Copyright ©20062012, Texas Instruments Incorporated 7
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
ELECTRICAL CHARACTERISTICS: GENERAL (continued)
Over recommended operating free-air temperature range of 40°C to +125°C, AVDD = 4.5V to 5.5V, BVDD = 2.7V to 5.5V,
HVDD = 10V to 15V, HVSS = 15V to 10V, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
ADS8556, ADS8557, ADS8558
PARAMETER CONDITIONS MIN TYP(1) MAX UNIT
DIGITAL OUTPUTS(4)
Logic family CMOS
High-level output voltage IOH = 100μA BVDD 0.6 BVDD V
Low-level output voltage IOH =100μA BGND BGND + 0.4 V
High-impedance-state output current 50 50 nA
Output capacitance 5 pF
Load capacitance 30 pF
POWER-SUPPLY REQUIREMENTS
Analog supply voltage AVDD 4.5 5.0 5.5 V
Buffer I/O supply voltage BVDD 2.7 3.0 5.5 V
Input positive supply voltage HVDD 5.0 10.0 16.5 V
Input negative supply voltage HVSS 16.5 10.0 5.0 V
fDATA = maximum 30.0 36.0 mA
ADS8556, fDATA = 250kSPS (auto-NAP mode) 14.0 16.5 mA
ADS8557, fDATA = 250kSPS (auto-NAP mode) 14.0 17.0 mA
Analog supply current(5) IAVDD ADS8558, fDATA = 250kSPS (auto-NAP mode) 14.0 18.0 mA
Auto-NAP mode, no ongoing conversion, 4.0 6.0 mA
internal conversion clock
Power-down mode 0.1 50.0 μA
fDATA = maximum 0.9 2.0 mA
fDATA = 250kSPS (auto-NAP mode) 0.5 1.5 mA
Buffer I/O supply current(6) IBVDD Auto-NAP mode, no ongoing conversion, 0.1 10.0 μA
internal conversion clock
Power-down mode 0.1 10.0 μA
ADS8556, fDATA = maximum 3.0 3.5 mA
ADS8557, fDATA = maximum 3.1 3.6 mA
ADS8558, fDATA = maximum 3.3 4.0 mA
Input positive supply current(7) IHVDD fDATA = 250kSPS (auto-NAP mode) 1.6 2.0 mA
Auto-NAP mode, no ongoing conversion, 0.2 0.3 μA
internal conversion clock
Power-down mode 0.1 10.0 μA
ADS8556, fDATA = maximum 3.6 4.0 mA
ADS8557, fDATA = maximum 3.6 4.2 mA
ADS8558, fDATA = maximum 4.0 4.8 mA
Input negative supply current(8) IHVSS fDATA = 250kSPS (auto-NAP mode) 1.8 2.2 mA
Auto-NAP mode, no ongoing conversion, 0.2 0.25 μA
internal conversion clock
Power-down mode 0.1 10.0 μA
(4) Specified by design.
(5) At AVDD = 5V.
(6) At BVDD = 3V, parallel mode, load capacitance = 6pF/pin.
(7) At HVDD = 15V.
(8) At HVSS = 15V.
8Copyright ©20062012, Texas Instruments Incorporated
R =200
SER WR =130
SW W
R =200W
SER R =130
SW W
C =5pF
PAR
C =20pF
S
C =20pF
S
CH_XX
AGND
Inputrange: 2V±REF
VDC
R =200
SER WR =130
SW W
R =200W
SER R =130
SW W
C =5pF
PAR
C =10pF
S
C =10pF
S
CH_XX
AGND
Inputrange: 4V±REF
VDC
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
ELECTRICAL CHARACTERISTICS: GENERAL (continued)
Over recommended operating free-air temperature range of 40°C to +125°C, AVDD = 4.5V to 5.5V, BVDD = 2.7V to 5.5V,
HVDD = 10V to 15V, HVSS = 15V to 10V, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
ADS8556, ADS8557, ADS8558
PARAMETER CONDITIONS MIN TYP(1) MAX UNIT
POWER-SUPPLY REQUIREMENTS (continued)
ADS8556, fDATA = maximum 251.7 298.5 mW
ADS8557, fDATA = maximum 253.2 303.0 mW
ADS8558, fDATA = maximum 262.2 318.0 mW
ADS8556, fDATA = 250kSPS (auto-NAP mode) 122.5 150.0 mW
Power dissipation(9) ADS8557, fDATA = 250kSPS (auto-NAP mode) 122.5 152.5 mW
ADS8558, fDATA = 250kSPS (auto-NAP mode) 122.5 157.5 mW
Auto-NAP mode, no ongoing conversion, 26.0 38.3 mW
internal conversion clock
Power-down mode 3.8 580.0 μW
(9) At AVDD = 5V, BVDD = 3V, HVDD = 15V, and HVSS = 15V.
Figure 1. EQUIVALENT INPUT CIRCUITS
Copyright ©20062012, Texas Instruments Incorporated 9
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
CH_C1
AVDD
AVDD
CH_C0
AGND
AGND
CH_B1
AVDD
AVDD
CH_B0
AGND
AGND
CH_A1
AVDD
AVDD
CH_A0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
DB14/REFBUFEN
DB13/SDI
DB12
DB11
DB10/SDO_C
DB9/SDO_B
DB8/SDO_A
BGND
BVDD
DB7/HB /DC
EN EN
DB6/SCLK
DB5/DCIN_A
DB4/DCIN_B
DB3/DCIN_C
DB2/SEL_C
DB1/SEL_B
DB15
DB0/SEL_A
REF /WR
EN
BUSY/INT
HW/SW
CSFS/
PAR/SER
RD
AVDD
CONVST_C
AGND
CONVST_B
REFC_C
CONVST_A
AGND
STBY
REFC_B
AGND
AGND
AVDD
REFC_A
RANGE/XCLK
AGND
RESET
AGND
WORD/BYTE
REFIO
HVSS
AVDD
HVDD
AGND
AGND
64 63 62 61 60 59 58 57 56 55 54
17 18 19 20 21 22 23 24 25 26 27
53 52 51 50 49
28 29 30 31 32
ADS8556
ADS8557
ADS8558
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
PIN CONFIGURATION
PM PACKAGE
LQFP-64
(TOP VIEW)
10 Copyright ©20062012, Texas Instruments Incorporated
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
TERMINAL FUNCTIONS
DESCRIPTION
NAME PIN # TYPE(1) PARALLEL INTERFACE (PAR/SER = 0) SERIAL INTERFACE (PAR/SER = 1)
Hardware mode (HW/SW = 0):
Reference buffers enable input.
When low, all reference buffers are enabled (mandatory if
internal reference is used). When high, all reference buffers
Data bit 14 input/output
DB14/REFBUFEN 1 DIO/DI are disabled.
Output is '0'for the ADS8557/8 Software mode (HW/SW = 1):Connect to BGND or BVDD.
The reference buffers are controlled by bit C24 (REFBUF) in
control register (CR).
Data bit 13 input/output Hardware mode (HW/SW = 0): Connect to BGND
DB13/SDI 2 DIO/DI Output is MSB for the ADS8557 and '0'for the Software mode (HW/SW = 1): Serial data input
ADS8558
Data bit 12 input/output
DB12 3 DIO Connect to BGND
Output is '0'for the ADS8558
Data bit 11 input/output
DB11 4 DIO Connect to BGND
Output is MSB for the ADS8558
When SEL_C = 1, data output for channel C
DB10/SDO_C 5 DIO/DO Data bit 10 input/output When SEL_C = 0, this pin should be tied to BGND
When SEL_B = 1, data output for channel B
When SEL_B = 0, this pin should be tied to BGND
DB9/SDO_B 6 DIO/DO Data bit 9 input/output When SEL_C = 0, data from channel C1 are also available
on this output
Data output for channel A
When SEL_C = 0, data from channel C0 are also available
DB8/SDO_A 7 DIO/DO Data bit 8 input/output on this output
When SEL_C = 0 and SEL_B = 0, SDO_A acts as the single
data output for all channels
BGND 8 P Buffer IO ground, connect to digital ground plane
Buffer IO supply, connect to digital supply (2.7V to 5.5V). Decouple with a 1μF ceramic capacitor or a combination
BVDD 9 P of 100nF and 10μF ceramic capacitors to BGND.
Word mode (WORD/BYTE = 0):
Data bit 7 input/output Daisy-chain enable input.
Byte mode (WORD/BYTE = 1):
DB7/HBEN/DCEN 10 DIO/DI/DI When high, DB[5:3] serve as daisy-chain inputs DCIN[A:C].
High byte enable input. If daisy-chain mode is not used, connect to BGND.
When high, the high byte is output first on
DB[15:8]. When low, the low byte is output first on
DB[15:8].
Word mode (WORD/BYTE = 0):
Data bit 6 input/output
DB6/SCLK 11 DIO/DI Serial interface clock input (36MHz max)
Byte mode (WORD/BYTE = 1):
Connect to BGND or BVDD
Word mode (WORD/BYTE = 0):
Data bit 5 input/output When DCEN = 1, daisy-chain data input for channel A
DB5/DCIN_A 12 DIO/DI When DCEN = 0, connect to BGND
Byte mode (WORD/BYTE = 1):
Connect to BGND or BVDD
Word mode (WORD/BYTE = 0): When SEL_B = 1 and DCEN = 1, daisy-chain data input for
Data bit 4 input/output
DB4/DCIN_B 13 DIO/DI channel B
Byte mode (WORD/BYTE = 1): When DCEN = 0, connect to BGND
Connect to BGND or BVDD
Word mode (WORD/BYTE = 0): When SEL_C = 1 and DCEN = 1, daisy-chain data input for
Data bit 3 input/output
DB3/DCIN_C 14 DIO/DI channel C
Byte mode (WORD/BYTE = 1): When DCEN = 0, connect to BGND
Connect to BGND or BVDD
Word mode (WORD/BYTE = 0):
Data bit 2 input/output Select SDO_C input.
DB2/SEL_C 15 DIO/DI When high, SDO_C is active. When low, SDO_C is disabled.
Byte mode (WORD/BYTE = 1):
Connect to BGND or BVDD
Word mode (WORD/BYTE = 0):
Data bit 1 input/output Select SDO_B input.
DB1/SEL_B 16 DIO/DI When high, SDO_B is active. When low, SDO_B is disabled.
Byte mode (WORD/BYTE = 1):
Connect to BGND or BVDD
(1) AI = analog input; AIO = analog input/output; DI = digital input; DO = digital output; DIO = digital input/output; and P = power supply.
Copyright ©20062012, Texas Instruments Incorporated 11
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
TERMINAL FUNCTIONS (continued)
DESCRIPTION
NAME PIN # TYPE(1) PARALLEL INTERFACE (PAR/SER = 0) SERIAL INTERFACE (PAR/SER = 1)
Word mode (WORD/BYTE = 0): Select SDO_A input.
Data bit 0 (LSB) input/output
DB0/SEL_A 17 DIO/DI When high, SDO_A is active. When low, SDO_A is disabled.
Byte mode (WORD/BYTE = 1): Should always be high.
Connect to BGND or BVDD
When CR bit C21 = 0 (BUSY/INT), converter busy status output. Transitions high when a conversion has been
started and remains high during the entire process. Transitions low when the conversion data of all six channels
are latched to the output register and remains low thereafter.
In sequential mode (SEQ = 1 in the CR), the BUSY output transitions high when a conversion has been started
BUSY/INT 18 DO and goes low for a single conversion clock cycle (tCCLK) whenever a channel pair conversion is completed.
When bit C21 = 1 (BUSY/INT in CR), interrupt output. This bit transitions high after a conversion has been
completed and remains high until the conversion result has been read.
The polarity of BUSY/INT output can be changed using bit C20 (BUSY L/H) in the control register.
Chip select input. Frame synchronization.
CS/FS 19 DI/DI When low, the parallel interface is enabled. When The falling edge of FS controls the frame transfer.
high, the interface is disabled.
Read data input.
RD 20 DI When low, the parallel data output is enabled. Connect to BGND
When high, the data output is disabled.
Hardware mode (HW/SW = 0): Conversion start of channel pair C.
The rising edge of this signal initiates simultaneous conversion of analog signals at inputs CH_C[1:0]. CONVST_C
should remain high during the entire conversion cycle, otherwise both ADCs of channel C are put in partial
CONVST_C 21 DI power-down mode (see the Reset and Power-down Modes sections).
Software mode (HW/SW = 1): Conversion start of channel pair C in sequential mode (CR bit C23 = 1) only;
connect to BGND or BVDD otherwise
Hardware mode (HW/SW = 0): Conversion start of channel pair B.
The rising edge of this signal initiates simultaneous conversion of analog signals at inputs CH_B[1:0]. CONVST_B
should remain high during the entire conversion cycle; otherwise, both ADCs of channel B are put into partial
CONVST_B 22 DI power-down mode (see the Reset and Power-down Modes sections).
Software mode (HW/SW = 1): Conversion start of channel pair B in sequential mode (CR bit C23 = 1) only;
connect to BGND or BVDD otherwise
Hardware mode (HW/SW = 0): Conversion start of channel pair A.
The rising edge of this signal initiates simultaneous conversion of analog signals at inputs CH_A[1:0]. CONVST_A
should remain high during the entire conversion cycle; otherwise, both ADCs of channel A are put into partial
CONVST_A 23 DI power-down mode (see the Reset and Power-down Modes sections).
Software mode (HW/SW = 1): Conversion start of all selected channels except in sequential mode
(CR bit C23 = 1): Conversion start of channel pair A only
Standby mode input. When low, the entire device is powered-down (including the internal clock and reference).
STBY 24 DI When high, the device operates in normal mode.
25, 32,
37, 38, Analog ground, connect to analog ground plane
43, 44,
AGND P Pin 25 may have a dedicated ground if the difference between its potential and AGND is always kept within
49, 52, ±300mV.
53, 55,
57, 59
26, 34, Analog power supply (4.5V to 5.5V). Decouple each pin with a 100nF ceramic capacitor to AGND. Use an
35, 40, additional 10μF capacitor to AGND close to the device but without compromising the placement of the smaller
AVDD 41, 46, P capacitor. Pin 26 may have a dedicated power supply if the difference between its potential and AVDD is always
47, 50, kept within ±300mV.
60
Hardware mode (HW/SW = 0): Input voltage range select input.
When low, the analog input range is ±4VREF. When high, the analog input range is ±2VREF.
RANGE/XCLK 27 DI/DIO Software mode (HW/SW = 1): External conversion clock input, if CR bit C11 (CLKSEL) is set high or internal
conversion clock output, if CR bit C10 (CLKOUT_EN) is set high. If not used, connect to BVDD or BGND.
Reset input, active high. Aborts any ongoing conversions. Resets the internal control register to 0x000003FF. The
RESET 28 DI RESET pulse should be at least 50ns long.
Output mode selection input.
When low, data are transferred in word mode using
DB[15:0]. When high, data are transferred in byte
WORD/BYTE 29 DI Connect to BGND
mode using DB[15:8] with the byte order controlled
by HBEN pin while two accesses are required for a
complete 16-bit transfer.
Negative supply voltage for the analog inputs (16.5V to 5V).
HVSS 30 P Decouple with a 100nF ceramic capacitor to AGND placed next to the device and a 10μF capacitor to AGND close
to the device but without compromising the placement of the smaller capacitor.
12 Copyright ©20062012, Texas Instruments Incorporated
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
TERMINAL FUNCTIONS (continued)
DESCRIPTION
NAME PIN # TYPE(1) PARALLEL INTERFACE (PAR/SER = 0) SERIAL INTERFACE (PAR/SER = 1)
Positive supply voltage for the analog inputs (5V to 16.5V). Decouple with a 100nF ceramic capacitor to AGND
HVDD 31 P placed next to the device and a 10μF capacitor to AGND close to the device but without compromising the
placement of the smaller capacitor.
Analog input of channel A0. The input voltage range is controlled by RANGE pin in hardware mode or CR bit C26
CH_A0 33 AI (RANGE_A) in software mode.
Analog input of channel A1. The input voltage range is controlled by RANGE pin in hardware mode or CR bit C26
CH_A1 36 AI (RANGE_A) in software mode.
Analog input of channel B0. The input voltage range is controlled by RANGE pin in hardware mode or CR bit C27
CH_B0 39 AI (RANGE_B) in software mode.
Analog input of channel B1. The input voltage range is controlled by RANGE pin in hardware mode or CR bit C27
CH_B1 42 AI (RANGE_B) in software mode.
Analog input of channel C0. The input voltage range is controlled by RANGE pin in hardware mode or CR bit C28
CH_C0 45 AI (RANGE_C) in software mode.
Analog input of channel C1. The input voltage range is controlled by RANGE pin in hardware mode or CR bit C28
CH_C1 48 AI (RANGE_C) in software mode.
Reference voltage input/output (0.5V to 3.025V).
The internal reference is enabled via REFEN/WR pin in hardware mode or CR bit C25 (REFEN) in software mode.
REFIO 51 AIO The output value is controlled by the internal DAC (CR bits C[9:0]). Connect a 470nF ceramic decoupling
capacitor between this pin and pin 52.
Decoupling capacitor for reference of channels A.
REFC_A 54 AI Connect a 10μF ceramic decoupling capacitor between this pin and pin 53.
Decoupling capacitor for reference of channels B.
REFC_B 56 AI Connect a 10μF ceramic decoupling capacitor between this pin and pin 55.
Decoupling capacitor for reference of channels C.
REFC_C 58 AI Connect a 10μF ceramic decoupling capacitor between this pin and pin 57.
Interface mode selection input.
PAR/SER 61 DI When low, the parallel interface is selected. When high, the serial interface is enabled.
Mode selection input.
HW/SW 62 DI When low, the hardware mode is selected and part works according to the settings of external pins. When high,
the software mode is selected in which the device is configured by writing into the control register.
Hardware mode (HW/SW = 0): Hardware mode (HW/SW = 0):
Internal reference enable input. Internal reference enable input.
When high, the internal reference is enabled (the When high, the internal reference is enabled (the reference
reference buffers are to be enabled). When low, buffers are to be enabled). When low, the internal reference
the internal reference is disabled and an external is disabled and an external reference should be applied at
REFEN/WR 63 DI reference is applied at REFIO. REFIO.
Software mode (HW/SW = 1): Write input.
The parallel data input is enabled, when CS and Software mode (HW/SW = 1): Connect to BGND or BVDD.
WR are low. The internal reference is enabled by The internal reference is enabled by CR bit C25 (REFEN).
the CR bit C25 (REFEN).
Data bit 15 (MSB) input/output
DB15 64 DIO Connect to BGND
Output is '0'for the ADS8557/8
Copyright ©20062012, Texas Instruments Incorporated 13
CONVST_x
BUSY
(C20 = C21 = 0)
FS
SCLK
ADS8556
SDO_x
tD1
t2
tD2 tH2
tD4
t1
SDI or
DCIN_x
tS1
tH1
Don’t Care Don’t
Care
tSCLK
132
CH_x0
MSB
tD3
CH_x1
LSB
CH_x1
D1
CH_x1
D2
CH_x1
D3
D31 D0
D1D2
D3
tCONV tACQ
t3
tS3
XCLK
(C11 = 1)
tS3
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
TIMING CHARACTERISTICS
Figure 2. Serial Operation Timing Diagram (All Three SDOs Active)
Serial Interface Timing Requirements(1)
Over recommended operating free-air temperature range at 40°C to +125°C, AVDD = 5V, and BVDD = 2.7V to 5.5V, unless
otherwise noted. ADS8556, ADS8557, ADS8558
TEST
PARAMETER CONDITION MIN TYP MAX UNIT
tACQ Acquisition time 280 ns
ADS8556 1.26 µs
tCONV Conversion time ADS8557 1.19 µs
ADS8558 1.09 µs
t1CONVST_x low time 20 ns
t2BUSY low to FS low time 0 ns
ADS8556 40 ns
t3Bus access finished to next conversion start time ADS8557 20 ns
ADS8558 0 ns
tD1 CONVST_x high to BUSY high delay 5 20 ns
tD2 FS low to SDO_x active delay 5 12 ns
tD3 SCLK rising edge to new data valid delay 15 ns
tD4 FS high to SDO_x 3-state delay 10 ns
tH1 Input data to SCLK falling edge hold time 5 ns
tH2 Output data to SCLK rising edge hold time 5 ns
tS1 Input data to SCLK falling edge setup time 3 ns
CONVST_x high to XCLK falling or rising edge setup
tS3 6 ns
time
tSCLK Serial clock period 0.0278 10 μs
(1) All input signals are specified with tR= tF= 1.5ns (10% to 90% of BVDD) and timed from a voltage level of (VIL + VIH)/2.
14 Copyright ©20062012, Texas Instruments Incorporated
CONVST_A
CONVST_B
CONVST_C
BUSY
(C20 = C21 = 0)
CS
DB[15:0]
tD1
t2
t1
RD
t4
CH
A0
CH
A1
CH
B0
CH
B1
CH
C0
CH
C1
t5
tD5
t6
tH3
t7
tACQ
t3
tCONV
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
Figure 3. Parallel Read Access Timing Diagram
Parallel Interface Timing Requirements (Read Access)(1)
Over recommended operating free-air temperature range at 40°C to +125°C, AVDD = 5V, and BVDD = 2.7V to 5.5V, unless
otherwise noted. ADS8556, ADS8557, ADS8558
TEST
PARAMETER CONDITION MIN TYP MAX UNIT
tACQ Acquisition time 280 ns
ADS8556 1.26 µs
tCONV Conversion time ADS8557 1.19 µs
ADS8558 1.09 µs
t1CONVST_x low time 20 ns
t2BUSY low to CS low time 0 ns
ADS8556 40 ns
Bus access finished to next conversion
t3ADS8557 20 ns
start time(2) ADS8558 0 ns
t4CS low to RD low time 0 ns
t5RD high to CS high time 0 ns
t6RD pulse width 30 ns
t7Minimum time between two read accesses 10 ns
tD1 CONVST_x high to BUSY high delay 5 20 ns
tD5 RD falling edge to output data valid delay 20 ns
tH3 Output data to RD rising edge hold time 5 ns
(1) All input signals are specified with tR= tF= 1.5ns (10% to 90% of BVDD) and timed from a voltage level of (VIL + VIH)/2.
(2) Refer to CS signal or RD, whichever occurs first.
Copyright ©20062012, Texas Instruments Incorporated 15
CS
DB[15:0]
WR
t8
tH4
t9
tS2
C
[31:16]
t11
t10
C
[15:0]
C
[31:24]
C
[23:16]
C
[15:8]
C
[7:0]
WordMode
(WORD/BYTE=0)
By dte Mo e
(WORD/BYTE=1)
Don’t
Care
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
Figure 4. Parallel Write Access Timing Diagram
Parallel Interface Timing Requirements (Write Access)(1)
Over recommended operating free-air temperature range at 40°C to +125°C, AVDD = 5V, and BVDD = 2.7V to 5.5V, unless
otherwise noted. ADS8556, ADS8557, ADS8558
PARAMETER MIN TYP MAX UNIT
t8CS low to WR low time 0 ns
t9WR low pulse width 15 ns
t10 WR high pulse width 10 ns
t11 WR high to CS high time 0 ns
tS2 Output data to WR rising edge setup time 5 ns
tH4 Data output to WR rising edge hold time 5 ns
(1) All input signals are specified with tR= tF= 1.5ns (10% to 90% of BVDD) and timed from a voltage level of (VIL + VIH)/2.
16 Copyright ©20062012, Texas Instruments Incorporated
3.0
2.5
2.0
1.5
1.0
0.5
0
0.5
1.0
1.5
2.0
2.5
3.0
-
-
-
-
-
-
IntegralNonlinearity(LSB)
0 8190 16380 24570 32760 40950 49140 57330 65520
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
3.0
2.5
2.0
1.5
1.0
0.5
0
0.5
1.0
1.5
2.0
2.5
3.0
-
-
-
-
-
-
IntegralNonlinearity(LSB)
0 8190 16380 24570 32760 40950 49140 57330 65520
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
1.5
1.0
0.5
0
0.5
1.0
-
-
DifferentialNonlinearity(LSB)
0 8190 16380 24570 32760 40950 49140 57330 65520
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
1.5
1.0
0.5
0
0.5
1.0
-
-
DifferentialNonlinearity(LSB)
0 8190 16380 24570 32760 40950 49140 57330 65520
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
1.0
0.8
0.6
0.4
0.2
0
0.2
0.4
0.6
0.8
1.0
-
-
-
-
-
IntegralNonlinearity(LSB)
0 2000 4000 6000 8000 10000 12000 14000 16000
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
1.0
0.8
0.6
0.4
0.2
0
0.2
0.4
0.6
0.8
1.0
-
-
-
-
-
IntegralNonlinearity(LSB)
0 2000 4000 6000 8000 10000 12000 14000 16000
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
TYPICAL CHARACTERISTICS
At +25°C, over entire supply voltage range, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
INL vs CODE INL vs CODE
(ADS8556 ±10VIN Range) (ADS8556 ±5VIN Range)
Figure 5. Figure 6.
DNL vs CODE DNL vs CODE
(ADS8556 ±10VIN Range) (ADS8556 ±5VIN Range)
Figure 7. Figure 8.
INL vs CODE INL vs CODE
(ADS8557 ±10VIN Range) (ADS8557 ±5VIN Range)
Figure 9. Figure 10.
Copyright ©20062012, Texas Instruments Incorporated 17
1.0
0.8
0.6
0.4
0.2
0
0.2
0.4
0.6
0.8
1.0
-
-
-
-
-
DifferentialNonlinearity(LSB)
0 2000 4000 6000 8000 10000 12000 14000 16000
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
1.0
0.8
0.6
0.4
0.2
0
0.2
0.4
0.6
0.8
1.0
-
-
-
-
-
DifferentialNonlinearity(LSB)
0 2000 4000 6000 8000 10000 12000 14000 16000
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
0.75
0.50
0.25
0
0.25
0.50
0.75
-
-
-
IntegralNonlinearity(LSB)
0 500 1000 1500 2000 2500
3000
3500 4000
Code
AVDD =BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
InternalReference
-
DATA
4
3
2
1
0
1
2
3
4
-
-
-
-
OffsetError(mV)
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
0.75
0.50
0.25
0
0.25
0.50
0.75
-
-
-
GainError(%)
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
TYPICAL CHARACTERISTICS (continued)
At +25°C, over entire supply voltage range, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
DNL vs CODE DNL vs CODE
(ADS8557 ±10VIN Range) (ADS8557 ±5VIN Range)
Figure 11. Figure 12.
INL vs CODE DNL vs CODE
(ADS8558) (ADS8558)
Figure 13. Figure 14.
OFFSET ERROR vs TEMPERATURE GAIN ERROR vs TEMPERATURE
Figure 15. Figure 16.
18 Copyright ©20062012, Texas Instruments Incorporated
30
40
50
60
70
80
90
-
-
-
-
-
-
-
Power-SupplyRejectionRatio(dB)
0 20 40 60 80 100
120
140 200
AVDDNoiseFrequency(kHz)
160 180
C =100nFonAVDD
SUPPLY
5500
5000
4500
4000
3500
3000
2500
2000
1500
1000
500
NumberofOccurrences
-3-2-1 0 1
2
Code
AVDD=BVDD=5V
HVSS= 15V
HVDD=15V
8192Samples
Range=+4 V
InternalReference
T=+25 C
-
´REF
°
94
92
90
88
86
84
82
80
78
76
74
72
70
Signal-to-NoiseRatio(dB)
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
ADS8556
ADS8558
ADS8557
AVDD=BVDD=5V
HVSS= 15V,HVDD=15V
f =10kHz,f =Max
Range= 4 V
InternalReference
-
± ´
SIGNAL DATA
REF
94
92
90
88
86
84
82
80
78
76
74
72
70
Signal-to-NoiseRatioandDistortion(dB)
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
ADS8556
ADS8558
ADS8557
AVDD=BVDD=5V
HVSS= 15V,HVDD=15V
f =10kHz,f =Max
Range= 4 V
InternalReference
-
± ´
SIGNAL DATA
REF
-86
88
90
92
94
96
98
-
-
-
-
-
-
TotalHarmonicDistortion(dB)
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
ADS8556
ADS8558
ADS8557
AVDD=BVDD=5V,HVSS= 15V,HVDD=15V
f =10kHz,f =Max,Range= 4 V
InternalReference
-
± ´
SIGNAL DATA REF
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
TYPICAL CHARACTERISTICS (continued)
At +25°C, over entire supply voltage range, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
PSRR vs AVDD NOISE FREQUENCY CONVERSION TIME vs TEMPERATURE
Figure 17. Figure 18.
CODE HISTOGRAM
(8192 Hits) SNR vs TEMPERATURE
Figure 19. Figure 20.
SINAD vs TEMPERATURE THD vs TEMPERATURE
Figure 21. Figure 22.
Copyright ©20062012, Texas Instruments Incorporated 19
100
98
96
94
92
90
88
86
Spurious-FreeDynamicRange(dB)
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
ADS8556
ADS8558
ADS8557
AVDD=BVDD=5V
HVSS= 15V,HVDD=15V
f =10kHz,f =Max
Range= 4 V
InternalReference
-
± ´
SIGNAL DATA
REF
0
20
40
60
80
100
120
140
160
180
-
-
-
-
-
-
-
-
-
Amplitude(dB)
0 25 50 75 100 125
150
175 250
Frequency(kHz)
200 225
AVDD=BVDD=5V
HVSS= 15V
HVDD=15V
f =500kSPS
f =10kHz
Range= 4 V
InternalReference
T=+25 C
-
± ´
°
SAMPLE
SIGNAL
REF
0
20
40
60
80
100
120
140
160
180
-
-
-
-
-
-
-
-
-
Amplitude(dB)
0 25 50 75 100 125
150
175 250
Frequency(kHz)
200 225
AVDD=BVDD=5V
HVSS= 15V,HVDD=15V
f =500kSPS
f =10kHz
Range= 2 V
InternalReference
T=+25 C
-
± ´
°
SAMPLE
SIGNAL
REF
120
115
110
105
100
95
90
85
80
Isolation(dB)
030 60 90 120 150
180
210 300
NoiseFrequency(kHz)
240 270
AVDD=BVDD=5V
HVSS= 15V
HVDD=15V
f =Max
Range= 2 V
InternalReference
-
± ´
DATA
REF
2.504
2.503
2.502
2.501
2.500
2.499
2.498
2.497
2.496
V (V)
REF
4.5 4.6 4.7 4.8 4.9 5.0
5.1
5.2 5.5
AVDD(V)
5.3 5.4
VREF
2.504
2.503
2.502
2.501
2.500
2.499
2.498
2.497
2.496
V (V)
REF
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
TYPICAL CHARACTERISTICS (continued)
At +25°C, over entire supply voltage range, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
FREQUENCY SPECTRUM
SFDR vs TEMPERATURE (2048-Point FFT, fIN = 10kHz, ±10VIN Range)
Figure 23. Figure 24.
FREQUENCY SPECTRUM CHANNEL-TO-CHANNEL ISOLATION vs
(2048-Point FFT, fIN = 10kHz, ±5VIN Range) INPUT NOISE FREQUENCY
Figure 25. Figure 26.
INTERNAL REFERENCE VOLTAGE vs INTERNAL REFERENCE VOLTAGE vs TEMPERATURE
ANALOG SUPPLY VOLTAGE (2.5V Mode) (2.5V Mode)
Figure 27. Figure 28.
20 Copyright ©20062012, Texas Instruments Incorporated
3.005
3.004
3.003
3.002
3.001
3.000
2.999
2.998
2.997
2.996
2.995
V (V)
REF
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
36
34
32
30
28
26
24
22
20
18
16
14
12
10
IAVDD(mA)
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
f =Max
DATA
f =250kSPS(A-NAP)
DATA
AVDD=5V
InternalReference
36
34
32
30
28
26
24
22
20
18
16
14
12
10
8
6
4
2
IAVDD(mA)
0 45 90 135 180 225
270
315 630
SampleRate(kSPS)
360 405 450
NormalOperation
A-NAPMode
AVDD=5V
InternalReference
495 540 585
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
IBVDD(mA)
-40 -25 -10 5 20 35
50
65 125
Temperature( C)°
80 95 110
f =Max
DATA
f =250kSPS(A-NAP)
DATA
BVDD=5V
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0
InputSupplyCurrent(mA)
5 6 7 8 9 10
11
12 15
HVDD,|HVSS|(V)
13 14
IHVSS(f =Max)
DATA
IHVDD(f =Max)
DATA
IHVSS( )250kSPSA-NAP
IHVDD( )250kSPSA-NAP
ADS8556
ADS8557
ADS8558
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SBAS404B OCTOBER 2006REVISED JANUARY 2012
TYPICAL CHARACTERISTICS (continued)
At +25°C, over entire supply voltage range, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
INTERNAL REFERENCE VOLTAGE vs TEMPERATURE
(3.0V Mode) ANALOG SUPPLY CURRENT vs TEMPERATURE
Figure 29. Figure 30.
ADS8556
ANALOG SUPPLY CURRENT vs DATA RATE BUFFER I/O SUPPLY CURRENT vs TEMPERATURE
Figure 31. Figure 32.
ADS8556 ADS8556
INPUT SUPPLY CURRENT vs TEMPERATURE INPUT SUPPLY CURRENT vs INPUT SUPPLY VOLTAGE
Figure 33. Figure 34.
Copyright ©20062012, Texas Instruments Incorporated 21
3.6
3.3
3.0
2.7
2.4
2.1
1.8
1.5
1.2
0.9
0.6
0.3
0
IHVxx(mA)
090 180 270 630
DataRate(kSPS)
HVSS= 15V
HVDD=15V
Range= 4 V
-
± ´ REF
360 450 540
IHVSS(A-NAP)
IHVDD(A-NAP)
IHVSS
IHVDD
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
TYPICAL CHARACTERISTICS (continued)
At +25°C, over entire supply voltage range, VREF = 2.5V (internal), and fDATA = maximum, unless otherwise noted.
ADS8556
INPUT SUPPLY CURRENT vs DATA RATE
Figure 35.
22 Copyright ©20062012, Texas Instruments Incorporated
f =
-3dB
ln(2) (n+1)´
2 tp ´ ACQ
R <
SOURCE
tACQ
C ln(2) (n+1)´
S
-(R +R )
SER SW
ADS8556
ADS8557
ADS8558
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SBAS404B OCTOBER 2006REVISED JANUARY 2012
GENERAL DESCRIPTION
period, there is no further input current flow and the
The ADS8556/7/8 series include six 16-, 14-, and input impedance is greater than 1M. To ensure a
12-bit analog-to-digital converters (ADCs) defined start condition, the sampling capacitors of the
respectively that operate based on the successive ADS8556/7/8 are pre-charged to a fixed internal
approximation register (SAR) principle. The voltage, before switching into sampling mode.
architecture is designed on the charge redistribution
principle, which inherently includes a To maintain the linearity of the converter, the inputs
sample-and-hold function. The six analog inputs are should always remain within the specified range of
grouped into three channel pairs. These channel HVSS 0.2V to HVDD + 0.2V.
pairs can be sampled and converted simultaneously, The minimum 3dB bandwidth of the driving
preserving the relative phase information of the operational amplifier can be calculated using
signals of each pair. Separate conversion start Equation 1:
signals allow simultaneous sampling on each channel
pair: on four channels or on all six channels.
These devices accept single-ended, bipolar analog
input signals in the selectable ranges of ±4VREF or where:
±2VREF with an absolute value of up to ±12V; see the n = 16, 14, or 12; nis the resolution of the
Analog Inputs section. ADS8556/7/8 (1)
The devices offer an internal 2.5V/3V reference With a minimum acquisition time of tACQ = 280ns, the
source followed by a 10-bit digital-to-analog converter required minimum bandwidth of the driving amplifier
(DAC) that allows the reference voltage VREF to be is 6.7MHz for the ADS8556, 6MHz for the ADS8557,
adjusted in 2.44mV or 2.93mV steps, respectively. or 5.2MHz for the ADS8558. The required bandwidth
The ADS8556/7/8 also offer a selectable parallel or can be lower if the application allows a longer
serial interface that can be used in hardware or acquisition time. A gain error occurs if a given
software mode; see the Device Configuration section application does not fulfill the bandwidth requirement
for details. shown in Equation 1.
A driving operational amplifier may not be required, if
ANALOG the impedance of the signal source (RSOURCE) fulfills
the requirement of Equation 2:
This section addresses the analog input circuit, the
ADCs and control signals, and the reference design
of the device.
Analog Inputs where:
n = 16, 14, or 12; nis the resolution of the ADC,
The inputs and the converters are of single-ended,
bipolar type. The absolute voltage range can be CS= 10pF is the sample capacitor value for VIN =
selected using the RANGE pin (in hardware mode) or ±4×VREF mode,
RANGE_x bits (in software mode) in the control RSER = 200is the input resistor value,
register ( CR) to either ±4VREF or ±2VREF. With the and RSW = 130is the switch resistance value
reference set to 2.5V (CR bit C18 = 0), the input (2)
voltage range can be ±10V or ±5V. With the
reference source set to 3V (CR bit C18 = 1), an input With tACQ = 280ns, the maximum source impedance
voltage range of ±12V or ±6V can be configured. The should be less than 2.0kfor the ADS8556, 2.3k
logic state of the RANGE pin is latched with the for the ADS8557, and 2.7kfor the ADS8558 in VIN
falling edge of BUSY (if CR bit C20 = 0). =±4VREF mode or less than 0.8kfor the ADS8556,
1.0kfor the ADS8557, and 1.2kfor the ADS8558
The input current on the analog inputs depends on in VIN =±2VREF mode. The source impedance can be
the actual sample rate, input voltage, and signal higher if the application allows longer acquisition time.
source impedance. Essentially, the current into the
analog inputs charges the internal capacitor array Analog-to-Digital Converter (ADC)
only during the sampling period (tACQ). The source of
the analog input voltage must be able to charge the The devices include six ADCs that operate with either
input capacitance of 10pF in ±4VREF mode or 20pF in an internal or an external conversion clock. The
±2VREF to a 12-, 14-, 16-bit accuracy level within the conversion time can be as low as 1.09μs with internal
acquisition time of 280ns at maximum data rate; see conversion clock (ADS8558). When an external clock
the Equivalent Input Circuit. During the conversion and reference are used, the minimum conversion
time is 925ns.
Copyright ©20062012, Texas Instruments Incorporated 23
CONVST_A
CONVST_C
BUSY
(C20=C21=0)
CS
DB[15:0]
RD
CONVST_B
CH
A0
CH
A1
CH
C0
CH
C1
CH
A0
CH
A1
CH
C0
CONVST_B
DB[15:0]
CONVST_A
CONVST_B
CH
B0
CH
B1
CH
B0
CH
B1
CH
B0
CH
B1
CH
B0
RD
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
Conversion Clock next edge of the conversion clock. CONVST_x should
remain high during the entire conversion cycle; this is
The device uses either an internally-generated or an while the BUSY signal remains active. A falling edge
external (XCLK) conversion clock signal (in software during an ongoing conversion puts the related ADC
mode only). In default mode, the device generates an pair into partial power-down mode (see the Reset and
internal clock. When the CLKSEL bit is set high (bit Power-Down Modes section for more details).
C11 in the CR), an external conversion clock of up to
20MHz (max) can be applied on pin 27. In both For simultaneous sampling, it is recommended to
cases, 18.5 clock cycles are required for a complete connect all associated CONVST_x pins together. If
conversion including the pre-charging of the sample the CONVST_x signals are not tied together, a
capacitors. The external clock can remain low maximum skew of 4 ns must be ensured for all three
between conversions. signals in any order. A CONVST_x signal issued
during an ongoing conversion on any channel is
The conversion clock duty cycle should be 50%. blocked, except in sequential mode (see the
However, the ADS8556/7/8 function properly with a Sequential Mode section for more details).
duty cycle between 45% and 55%. If a parallel interface is used, the behavior of the
CONVST_x output port depends on which CONVST_x signals
have been issued. Figure 36 shows examples of
The analog inputs of each channel pair (CH_x0/1) are different scenarios.
held with the rising edge of the corresponding
CONVST_x signal. Only in software mode (except
sequential mode), CONVST_A is used for all six
ADCs. The conversion automatically starts with the
NOTE: Boxed areas indicate the minimum required frame to acquire all data.
Figure 36. Data Output versus CONVST_x
24 Copyright ©20062012, Texas Instruments Incorporated
f =
-3dB
ln(2)
2 tp ´ CONV
V =
REF
Range (Code+1)´
1024
ADS8556
ADS8557
ADS8558
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SBAS404B OCTOBER 2006REVISED JANUARY 2012
BUSY/INT Table 1 lists some examples of internal reference
DAC settings with a reference range set to 2.5V.
The BUSY signal indicates if a conversion is in However, to ensure proper performance, the DAC
progress. It goes high with a rising edge of any output voltage should not be programmed below
CONVST_x signal and goes low when the output 0.5V.
data of the last channel pair are available in the
respective output register. The readout of the data The buffered output of the DAC should be decoupled
can be initiated immediately after the falling edge of with a 100nF capacitor (minimum); for best
BUSY. A falling edge of a CONVST_x input during an performance, a 470nF capacitor is recommended. If
ongoing conversion (when BUSY is high) powers the internal reference is placed into power-down
down the corresponding ADC pair. (default), an external reference voltage can drive the
REFIO pin.
In sequential mode, the BUSY signal goes low only
for one clock cycle. See the Sequential Mode section The voltage at the REFIO pin is buffered with three
for more details. internal amplifiers, one for each ADC pair. The output
of each buffer needs to be decoupled with a 10μF
The polarity of the BUSY/INT signal can be changed capacitor between pin pairs 53 and 54, 55 and 56,
using CR bit C20. and 57 and 58. The 10μF capacitors are available as
ceramic 0805-SMD components and in X5R quality.
Reference The internal reference buffers can be powered down
The ADS8556/7/8 provides an internal, low-drift 2.5V to decrease the power dissipation of the device. In
reference source. To increase the input voltage this case, external reference drivers can be
range, the reference voltage can be switched to 3V connected to REFC_A, REFC_B, and REFC_C pins.
mode using the VREF bit (bit C18 in the CR). The With 10μF decoupling capacitors, the minimum
reference feeds a 10-bit string-DAC controlled by bits required bandwidth can be calculated using
C[9:0] in the control register. The buffered DAC Equation 4:
output is connected to the REFIO pin. In this way, the
voltage at this pin is programmable in 2.44mV
(2.92mV in 3V mode) steps and adjustable to the (4)
application needs without additional external With the minimum tCONV of 1.09μs, the external
components. The actual output voltage can be reference buffers require a minimum bandwidth of
calculated using Equation 3:102kHz.
Table 1. DAC Setting Examples (2.5V Operation)
where: DECIMAL BINARY HEXADECIMAL
VREF OUT (V) CODE CODE CODE
Range = the chosen maximum reference voltage 0.500 204 00 1100 1100 CC
output range (2.5V or 3V), 1.25 511 01 1111 1111 1FF
Code = the decimal value of the DAC register
content (3) 2.500 1023 11 1111 1111 3FF
Copyright ©20062012, Texas Instruments Incorporated 25
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
DIGITAL significant bit (MSB), the output data are changed at
the rising edge of SCLK, so that the host processor
This section describes the digital control and the can read it at the following falling edge. Output data
timing of the device in detail. of the ADS8557 and ADS8558 maintain the 16-bit
format with leading zeros.
Device Configuration Serial data input SDI are latched at the falling edge of
Depending on the desired mode of operation, the SCLK.
ADS8556/7/8 can be configured using the external
pins and/or the control register ( CR), as shown in The serial interface can be used with one, two, or
Table 2. three output ports. These ports are enabled with pins
SEL_A, SEL_B, and SEL_C. If all three serial data
Parallel Interface output ports (SDO_A, SDO_B, and SDO_C) are
selected, the data can be read with either two 16-bit
To use the device with the parallel interface, the data transfers or with one 32-bit data transfer. The
PAR/SER pin should be held low. The maximum data of channels CH_x0 are available first, followed
achievable data throughput rate using the internal by data from channels CH_x1. The maximum
clock is 630kSPS for the ADS8556, 670kSPS for the achievable data throughput rate is 450kSPS for the
ADS8557, and 730kSPS for the ADS8558 in this ADS8556, 470kSPS for the ADS8557, and 500kSPS
case. for the ADS8558 in this case.
Access to the ADS8556/7/8 is controlled as illustrated If the application allows a data transfer using two
in Figure 3 and Figure 4.ports only, SDO_A and SDO_B outputs are used.
The device outputs data from channel CH_A0
The device can either operate with a 16-bit followed by CH_A1 and CH_C0 on SDO_A, while
(WORD/BYTE pin set low) or an 8-bit (WORD/BYTE data from channel CH_B0 followed by CH_B1 and
pin set high) parallel interface. If 8-bit operation is CH_C1 occurs on SDO_B. In this case, a data
used, the HBEN pin selects if the low-byte (DB7 low) transfer of three consecutive 16-bit words or one
or the high-byte (DB7 high) is available on the data continuous 48-bit word is supported. The maximum
output DB[15:8] first. achievable data throughput rate is 375kSPS for the
ADS8556, 390kSPS for the ADS8557, and 400kSPS
Serial Interface for the ADS8558.
The serial interface mode is selected by setting the The output SDO_A is selected if only one serial data
PAR/SER pin high. In this case, each data transfer port is used in the application. The data are available
starts with the falling edge of the frame in the following order: CH_A0, CH_A1, CH_B0,
synchronization input (FS). The conversion results CH_B1, CH_C0, and, finally CH_C1. Data can be
are presented on the serial data output pins SDO_A, read using six 16-bit transfers, three 32-bit transfers,
SDO_B, and SDO_C depending on the selections or a single 96-bit transfer. The maximum achievable
made using the SEL_x pins. Starting with the most data throughput rate is 250kSPS for the ADS8556/7
and 260kSPS for the ADS8558 in this case.
Figure 2 (the serial operation timing diagram) and
Figure 37 show all possible scenarios in more detail.
Table 2. ADS8556/7/8 Configuration Settings
HARDWARE MODE (HW/SW = 0) SOFTWARE MODE (HW/SW = 1)
CONVERSION START CONTROLLED BY SEPARATE CONVERSION START CONTROLLED BY CONVST_A
INTERFACE MODE CONVST_x PINS PIN ONLY, EXCEPT IN SEQUENTIAL MODE
Configuration using control register bits C[31:0] only;
Parallel Configuration using pins, optionally, control bits C[22:18], status of pins 27 (only if used as RANGE input) and 63 is
(PAR/SER = 0) C[15:13], and C[9:0] disregarded
Configuration using control register bits C[31:0] only;
status of pins 1, 27 (only if used as RANGE input), and
Serial Configuration using pins, optionally, control bits C[22:18], 63 is disregarded; each access requires a control register
(PAR/SER = 1) C[15:13], and C[9:0]; bits C[31:24] are disregarded update via SDI (see the Serial Interface section for
details)
26 Copyright ©20062012, Texas Instruments Incorporated
CONVST_A
CONVST_B
CONVST_C
BUSY
(C20=C21=0)
FS
SDO_A
CHA0
CHB0
CHA1
CHB1
CHC0
CHC1
CHA0 CHA1 CHB0 CHB1 CHC0 CHC1
FS
SDO_A
SDO_B
SEL_A =1,SEL B=_ SEL_C 0=
SEL_A =SEL_B 1,= SEL_C 0= 4 SCLK8 s
9 SCLK6 s
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
Figure 37. Serial Interface: Data Output with One or Two Active SDOs
word and byte modes. In word mode, the first write
Hardware Mode access updates only the upper eight bits and stores
the lower eight bits (C[23:16]) for an update that
With the HW/SW input (pin 62) set low, the device takes place with the second write access along with
functions are controlled via the pins and, optionally, C[15:0].
control register bits C[22:18], C[15:13], and C[9:0]. If the serial interface is used, input data containing
It is possible to generally use the part in hardware control register contents are required with each read
mode but to switch it into software mode to initialize access to the device in this mode (combined
or adjust the control register settings (for example, read/write access). For initialization purposes, all 32
the internal reference DAC) and back to hardware bits of the register should be set (bit C16 must be set
mode thereafter. to '1' during that access to allow the update of the
entire register content). To minimize switching noise
Software Mode on the interface, an update of the first eight bits
When the HW/SW input is set high, the device (C[31:24]) with the remaining bits held low can be
operates in software mode with functionality set only performed thereafter.
by the control register bits (corresponding pin settings Figure 38 illustrates the different control register
are ignored). update options.
If parallel interface is used, an update of all control
register settings is performed by issuing two 16-bit Control Register (CR);
write accesses on pins DB[15:0] in word mode or four Default Value = 0x000003FF
8-bit accesses on pins DB[15:8] in byte mode (to The control register settings can only be changed in
avoid losing data, the entire sequence must be software mode and are not affected when switching
finished before starting a new conversion). CS should to hardware mode thereafter. The register values are
be held low during the two or four write accesses to independent from input pin settings. Changes are
completely update the configuration register. It is also active with the rising edge of WR in parallel interface
possible to update only the upper eight bits (C[31:24]) mode or with the 32nd falling SCLK edge of the
using a single write access and pins DB[15:8] in both access in which the register content has been
updated in serial mode. Optionally, the register can
also be partially updated by writing only the upper
eight bits (C[31:24]). The CR content is defined in
Table 3.
Copyright ©20062012, Texas Instruments Incorporated 27
RESET
(orPower-Up)
BUSY
(C20=C21=0)
FS
SDI C[31:0]
InitializationData
C
[31:24]
C
[31:24]
WR
DB[15:0] C
[31:16]
WR
C
[15:0]
C
[31:24]
C
[23:16]
DB[15:8] C
[15:8]
C
[7:0]
C
[31:24]
C
[31:24]
PAR/SER=1
PAR/SER=0;WORD/BYTE=0
PAR/SER=0;WORD/BYTE=1
CS
C
[15:0]
C
[23:16]
InitializationData
InitializationData
ContinuousUpdate ContinuousUpdate
Update
Update
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
Figure 38. Control Register Update Options
28 Copyright ©20062012, Texas Instruments Incorporated
ADS8556
ADS8557
ADS8558
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SBAS404B OCTOBER 2006REVISED JANUARY 2012
Table 3. Control Register (CR)
ACTIVE IN
BIT NAME DESCRIPTION HARDWARE MODE
0 = Channel pair C disabled for next conversion (default)
C31 CH_C No
1 = Channel pair C enabled
0 = Channel pair B disabled for next conversion (default)
C30 CH_B No
1 = Channel pair B enabled
0 = Channel pair A disabled for next conversion (default)
C29 CH_A No
1 = Channel pair A enabled
0 = Input voltage range selection for channel pair C: 4VREF (default)
C28 RANGE_C No
1 = Input voltage range selection for channel pair C: 2VREF
0 = Input voltage range selection for channel pair B: 4VREF (default)
C27 RANGE_B No
1 = Input voltage range selection for channel pair B: 2VREF
0 = Input voltage range selection for channel pair A: 4VREF (default)
C26 RANGE_A No
1 = Input voltage range selection for channel pair A: 2VREF
0 = Internal reference source disabled (default)
C25 REFEN No
1 = Internal reference source enabled
0 = Internal reference buffers enabled (default)
C24 REFBUF No
1 = Internal reference buffers disabled
0 = Sequential convert start mode disabled (default)
C23 SEQ No
1 = Sequential convert start mode enabled (bit 11 must be '1' in this case)
0 = Normal operation (default)
C22 A-NAP Yes
1 = Auto-NAP feature enabled
0 = BUSY/INT pin in normal mode (BUSY) (default)
C21 BUSY/INT Yes
1 = BUSY/INT pin in interrupt mode (INT)
0 = BUSY active high while INT active low (default)
C20 BUSY L/H Yes
1 = BUSY active low while INT active high
C19 Dont use This bit is always set to '0'
0 = Internal reference voltage: 2.5V (default)
C18 VREF Yes
1 = Internal reference voltage: 3V
0 = Normal operation (conversion results available on SDO_x) (default)
C17 READ_EN Yes
1 = Control register contents output on SDO_x with next access
0 = Control register bits C[31:24] update only (serial mode only) (default)
C16 C23:0_EN Yes
1 = Entire control register update enabled (serial mode only)
0 = Normal operation (default)
C15 PD_C Yes
1 = Power-down for channel pair Cenabled (bit 31 must be '0' in this case)
0 = Normal operation (default)
C14 PD_B Yes
1 = Power-down for channel pair Benabled (bit 30 must be '0' in this case)
0 = Normal operation (default)
C13 PD_A Yes
1 = Power-down for channel pair Aenabled (bit 29 must be '0' in this case)
C12 Don't use This bit is always '0'
0 = Normal operation with internal conversion clock (mandatory in hardware mode) (default)
C11 CLKSEL No
1 = External conversion clock (applied through pin 27) used
0 = Normal operation (default)
C10 CLKOUT_EN No
1 = Internal conversion clock available at pin 27
C9 REFDAC[9] Bit 9 (MSB) of reference DAC value; default = 1 Yes
C8 REFDAC[8] Bit 8 of reference DAC value; default = 1 Yes
C7 REFDAC[7] Bit 7 of reference DAC value; default = 1 Yes
C6 REFDAC[6] Bit 6 of reference DAC value; default = 1 Yes
C5 REFDAC[5] Bit 5 of reference DAC value; default = 1 Yes
C4 REFDAC[4] Bit 4 of reference DAC value; default = 1 Yes
C3 REFDAC[3] Bit 3 of reference DAC value; default = 1 Yes
C2 REFDAC[2] Bit 2 of reference DAC value; default = 1 Yes
C1 REFDAC[1] Bit 1 of reference DAC value; default = 1 Yes
C0 REFDAC[0] Bit 0 (LSB) of reference DAC value; default = 1 Yes
Copyright ©20062012, Texas Instruments Incorporated 29
CONV TS _A
CONV TS _B
CONV TS _C
BUSY
(C20=0)
tCCLK
EOC(1)
CHAx
EOC(1)
CHBx
EOC(1)
CHCx
CS
RD
D[15:0]
XCLK
CH
A0
CH
A1
CH
B0
CH
B1
CH
C0
CH
C1
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
Daisy-Chain Mode (in Serial Mode Only)
The serial interface of the ADS8556/7/8 supports a
daisy-chain feature that allows cascading of multiple
devices to minimize the board space requirements
and simplify routing of the data and control lines. In
this case, pins DB5/DCIN_A, DB4/DCIN_B, and
DB3/DCIN_C are used as serial data inputs for
channels A, B, and C, respectively. Figure 40 shows
an example of a daisy-chain connection of three
devices sharing a common CONVST line to allow
simultaneous sampling of 18 analog channels along
with the corresponding timing diagram. To activate
the daisy-chain mode, the DCEN pin must be pulled
high. As a result of the time specifications tS1, tH1, and
tD3, the maximum SCLK frequency that may be used
in daisy-chain mode is 27.78MHz (assuming 50%
duty cycle).
Sequential Mode (in Software Mode with External (1) EOC = end of conversion (internal signal).
Conversion clock Only) Figure 39. Sequential Mode Timing
The three channel pairs of the ADS8556/7/8 can be
run in sequential mode, with the corresponding
CONVST_x signals interleaved, when an external Output Data Format
clock is used. To activate the device in sequential The data output format of the ADS8556/7/8 is binary
mode, CR bits C11 (CLKSEL) and C23 (SEQ) must twos complement, as shown in Table 4.
be asserted. In this case, the BUSY output indicates
a finished conversion by going low (when C20 = 0) or For the ADS8557, which delivers 14-bit conversion
high (when C20 = 1) for only a single conversion results, the leading two bits of the 16-bit frame are '0'
clock cycle in case of ongoing conversions of any in the serial interface mode. In parallel interface
other channel pairs. Figure 39 shows the behavior of mode, the output pins DB[15:14] are held low.
the BUSY output in this mode. Each conversion start Respectively, as the ADS8558 outputs 12 bits of
should be initiated during the high phase of the data, the first four bits of a serial 16-bit frame are
external clock, as shown in Figure 39. The minimum zeros, in parallel interface mode the output pins
time required between two CONVST_x pulses is the DB[15:12] are held low.
time required to read the conversion result of a
channel (pair).
Table 4. Output Data Format
BINARY CODE (HEXADECIMAL CODE)
DESCRIPTION INPUT VOLTAGE VALUE ADS8556 ADS8557 ADS8558
0111 1111 1111 1111 0001 1111 1111 1111 0000 0111 1111 1111
Positive full-scale +4VREF or +2VREF (7FFF) (1FFF) (7FF)
0000 0000 0000 0000 0000 0000 0000 0000 0000 0000 0000 0000
Midscale + 0.5LSB VREF/(2 ×resolution) (0000) (0000) (0000)
1111 1111 1111 1111 0011 1111 1111 1111 0000 1111 1111 1111
Midscale 0.5LSB VREF/(2 ×resolution) (FFFF) (3FFF) (FFF)
1000 0000 0000 0000 0010 0000 0000 0000 0000 1000 0000 0000
Negative full-scale 4VREF or 2VREF (8000) (2000) (800)
30 Copyright ©20062012, Texas Instruments Incorporated
CONVST
BUSY
(C20 = C21 = 0)
FS
SDO_x #3 Don’t Care 16-Bit Data CHx0
ADS8556 #3
ADS8556
#1
CONVST_A
FS
SCLK
SDO_A
SDO_B
SDO_C
ADS8556
#2
SDO_A
SDO_B
SDO_C
ADS8556
#3
SDO_A
SDO_B
SDO_C
DCIN_A
DCIN_B
DCIN_C
DC = 0
EN
CONVST_A
FS
SCLK
CONVST_A
FS
SCLK
CONVST
FS
SCLK
16-Bit Data CHx1
ADS8556 #3
16-Bit Data CHx0
ADS8556 #2
16-Bit Data CHx1
ADS8556 #2
16-Bit Data CHx0
ADS8556 #1
16-Bit Data CHx1
ADS8556 #1
DCIN_A
DCIN_B
DCIN_C
To
Processing
Unit
DC = 1
EN DC = 1
EN
UndefinedZone
0.400
0.125
AVDD(V)
t(s)
5.500
5.000
4.000
3.000
2.000
1.000
0
1.500
SpecifiedSupply
VoltageRange
POR
TriggerLevel
0.350
4.500
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
Figure 40. Example of Daisy-Chaining Three ADS8556s
Reset and Power-Down Modes
The device supports two reset mechanisms: a
power-on reset (POR) and a pin-controlled reset
(RESET) that can be issued using pin 28. Both the
POR and RESET act as a master reset that causes
any ongoing conversion to be interrupted, the control
register content to be set to the default value, and all
channels to be switched into sample mode.
When the device is powered up, the POR sets the
device in default mode when AVDD reaches 1.5V.
When the device is powered down, the POR circuit
requires AVDD to remain below 125mV at least
350ms to ensure proper discharging of internal
capacitors and to ensure correct behavior of the
device when powered up again. If the AVDD drops
below 400mV but remains above 125mV (see the
undefined zone in Figure 41), the internal POR
capacitor does not discharge fully and the device
requires a pin-controlled reset to perform correctly Figure 41. POR: Relevant Voltage Levels
after the recovery of AVDD.
Copyright ©20062012, Texas Instruments Incorporated 31
BUSY
ADCCH_Bx
CONVST_A/C
ACQ CONV Power-Down ACQ CONV ACQ
ACQ CONV ACQ CONV ACQ
ADCCH_Ax/Cx
RESET
6 t´CCLK Min
CONVST_B
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
The entire device, except the digital interface, can be results). The next rising edge of the CONVST_x
powered down by pulling the STBY pin low (pin 24). signal should be issued at least six conversion cycle
As the digital interface section remains active, data periods after the reset pulse and starts a new
can be retrieved while in stand-by mode. To power conversion, as shown in Figure 42. The internal
the part on again, the STBY pin must be brought reference remains active during the partial
high. The device is ready to start a new conversion power-down mode.
after 10ms required to activate and settle the internal The auto-NAP power-down mode is enabled by
circuitry. This user-controlled approach can be used asserting the A-NAP bit (C22) in the control register.
in applications that require lower data throughput If the auto-NAP mode is enabled, the ADS8556/7/8
rates and lowest power dissipation. The content of automatically reduce the current requirement to 6mA
CR is not changed during standby mode. It is not after finishing a conversion; thus, the end of
required to perform a pin-controlled reset after conversion actually activates the power-down mode.
returning to normal operation. Triggering a new conversion by applying a positive
While the standby mode impacts the entire device, CONVST_x edge puts the device back into normal
each device channel pair can also be individually operation, starts the acquisition of the analog input,
switched off by setting control register bits C[15:13] and automatically starts a new conversion six
(PD_x). When reactivated, the relevant channel pair conversion clock cycles later. Therefore, a complete
requires 10ms to fully settle before starting a new conversion cycle takes 24.5 conversion clock cycles;
conversion. The internal reference remains active, thus, the maximum throughput rate in auto-NAP
except all channels are powered down at the same power-down mode is reduced to a maximum of
time. 380kSPS for the ADS8556, 395kSPS for the
ADS8557, and 420kSPS for the ADS8558 in serial
In partial power-down mode, each of the three mode. In parallel mode, the maximum data rates are
channel pairs of the ADS8556/7/8 can be individually 500kSPS for the ADS8556, 530kSPS for the
put into a power-saving condition that reduces the ADS8557, and 580kSPS for the ADS8558. The
current requirement to 2mA per channel pair by internal reference remains active during the auto-NAP
bringing the corresponding CONVST_x signal low mode. Table 5 compares the analog current
during an ongoing conversion when BUSY is high. requirements of the devices in the different modes.
The relevant channel pair is activated again by
issuing a RESET pulse (to avoid loss of data from the
active channels, this RESET pulse should be
generated after retrieving the latest conversion
Figure 42. Partial Power-Down
32 Copyright ©20062012, Texas Instruments Incorporated
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
Table 5. Maximum Analog Current (IAVDD) Demand of the ADS8556/7/8
NORMAL
OPERATION POWER-UP POWER-UP
ANALOG TO TO NORMAL TO NEXT
OPERATIONAL CURRENT ACTIVATED POWER- OPERATION CONVERSION
MODE (IAVDD) ENABLED BY BY DOWN DELAY RESUMED BY DELAY START TIME DISABLED BY
12mA/channel
Normal operation pair (maximum Power on CONVST_x ————Power off
data rate)
Partial CONVST_x
2mA (channel At falling edge
power-down of Power on low while RESET pulse Immediate 6 ×tCCLK Power off
pair x) of BUSY
channel pair x BUSY is high
A-NAP = 1 (CR Each end of At falling edge A-NAP = 0 (CR
Auto-NAP 6mA CONVST_x Immediate 6 ×tCCLK
bit) conversion of BUSY bit)
Immediate after
Power-down of 16μA (channel PD_x = 1 (CR PD_x = 0 (CR
HW/SW = 1 Immediate completing 10ms HW/SW = 0
channel pair x pair x) bit) bit) register update
Stand-by 50μA Power on STBY = 0 Immediate STBY = 1 Immediate 10ms Power off
The AVDD supply provides power to the internal
circuitry of the ADC. It can be set in the range of 4.5V
GROUNDING to 5.5V. Because the supply current of the device is
All GND pins should be connected to a clean ground typically 30mA, it is not possible to use a passive
reference. This connection should be kept as short as filter between the digital board supply of the
possible to minimize the inductance of this path. It is application and the AVDD pin. A linear regulator is
recommended to use vias connecting the pads recommended to generate the analog supply voltage.
directly to the ground plane. In designs without Each AVDD pin should be decoupled to AGND with a
ground planes, the ground trace should be kept as 100nF capacitor. In addition, a single 10μF capacitor
wide as possible. Avoid connections that are too should be placed close to the device but without
close to the grounding point of a microcontroller or compromising the placement of the smaller capacitor.
digital signal processor. Optionally, each supply pin can be decoupled using a
1μF ceramic capacitor without the requirement for a
Depending on the circuit density on the board, 10μF capacitor.
placement of the analog and digital components, and
the related current loops, a single solid ground plane The BVDD supply is only used to drive the digital I/O
for the entire printed circuit board (PCB) or a buffers and can be set in the range of 2.7V to 5.5V.
dedicated analog ground area may be used. In case This range allows the device to interface with most
of a separated analog ground area, ensure a state-of-the-art processors and controllers. To limit
low-impedance connection between the analog and the noise energy from the external digital circuitry to
digital ground of the ADC by placing a bridge the device, BVDD should be filtered. A 10resistor
underneath (or next) to the ADC. Otherwise, even can be placed between the external digital circuitry
short undershoots on the digital interface lower and the device, because the current drawn is typically
than 300mV lead to the conduction of ESD diodes below 2mA (depending on the external loads). A
causing current flow through the substrate and bypass ceramic capacitor of 1μF (or alternatively, a
degrading the analog performance. pair of 100nF and 10μF capacitors) should be placed
between the BVDD pin and pin 8.
During PCB layout, care should be taken to avoid any
return currents crossing sensitive analog areas or The high-voltage supplies (HVSS and HVDD) are
signals. connected to the analog inputs. Noise and glitches on
these supplies directly couple into the input signals.
SUPPLY Place a 100nF ceramic decoupling capacitor, located
as close to the device as possible, between each of
The ADS8556/7/8 require four separate supplies: the pins 30, 31, and AGND. An additional 10μF capacitor
analog supply for the ADC (AVDD), the buffer I/O is used that should be placed close to the device but
supply for the digital interface (BVDD), and the without compromising the placement of the smaller
high-voltage supplies driving the analog input circuitry capacitor.
(HVDD and HVSS). Generally, there are no specific
requirements with regard to the power sequencing of Figure 43 shows a layout recommendation for the
the device. However, when HVDD is supplied before ADS8556/7/8 along with the proper decoupling and
AVDD, the internal ESD structure conducts, reference capacitor placement and connections.
increasing IHVDD beyond the specified value.
Copyright ©20062012, Texas Instruments Incorporated 33
ADS8556/7/8
TopView
To
BVDD
ToAVDD
1
mF
To
HVSS/HVDD
0.1 Fm
ToAVDD ToAVDD
To
AVDD
0.1 Fm
ToAVDD
0.1
mF
0.1
mF
0.1
mF
0.1
mF
ToA DVD
0.1 Fm
10 Fm
0.1 Fm
10 Fm
LEG DEN
TOPlayer;copperpourandtraces
Lower layer;AGNDarea
Lower layer;BGNDarea
Via
10 Fm10 Fm10 Fm
AVDD
AVDD
48
45
AGND
AGND
42
AVDD
AVDD
39
AGND
AGND
36
AVDD
AVDD
33
64 63 62 61
AVDD
AGND
58
AGND
56
AGND
54
AGND
AGND
AVDD
AGND
1
2
3
4
7
BGND
6
5
BVDD
10
11
12
15
16
14
13
17 18 19 20 23 29
24
AVDD
27
AGND
HVSS
HVDD
AGND
28
21 22
0.1
mF
0.1
mF
AVDDSource
10
mF
ToDUT
0.1 Fm
51
0.47 Fm
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
(1) All 0.1μF, 0.47μF, and 1μF capacitors should be placed as close to the ADS8556/7/8 as possible.
(2) All 10μF capacitors should be close to the device but without compromising the placement of the smaller capacitors.
Figure 43. Layout Recommendation
34 Copyright ©20062012, Texas Instruments Incorporated
R2
R1
RF
OPA2211
HVDD
BVDD
AGND
AGND
Input #1
R2
R1
RF
Input #2
HVSS
CF
CF
AGND
CH_A0
CH_A1 RANGE
STBY
REF /WR
EN
10 Fm
10 Fm
AGND
REFC_A
REFC_B CONVST_B
CONVST_C
RESET
CS
RD
DB[15:0]
CONVST_A
0.47 Fm
10 Fm
AGND
REFIO
REFC_C
R2
R1
RF
OPA2211
HVDD
AGND
AGND
Input #3
R2
R1
RF
Input #4
HVSS
CF
CF
AGND
CH_B0
CH_B1
R2
R1
RF
OPA2211
HVDD
AGND
AGND
Input #5
R2
R1
RF
Input #6
HVSS
CF
CF
AGND
CH_C0 PAR/SER
CH_C1
HW/SW
WORD/BYTE
BGND
Host
Controller
ADS8556
AVDD
AVDD
AVDD
AVDD
AGND
AGND
AGND
AGND
AGND
AGND
AGND
AGND
AGND
AGND
AVDD
AVDD
BVDD
BGND
HVSS
AGND
AGND
HVDD
AVDD
AVDD
AVDD
BGND
AVDD
AVDD
0.1 Fm
0.1 Fm
0.1 Fm
0.1 Fm
0.1 Fm
0.1 Fm
0.1 Fm
0.1 Fm
10 Fm
10 Fm
0.1 Fm
0.1 FmAGND
1 Fm
10 Fm
AGND
BVDD
HVSS
HVSS
ADS8556
ADS8556
ADS8557
ADS8558
www.ti.com
SBAS404B OCTOBER 2006REVISED JANUARY 2012
APPLICATION INFORMATION The actual values of the resistors and capacitors
The minimum configuration of the ADS8556/7/8 in depend on the bandwidth and performance
parallel mode is shown in Figure 44. In this case, the requirements of the application. For highest data rate,
BUSY signal is not used while the SW generates the it is recommended to use a filter capacitor value of
required signals in a timely manner. TIsOPA2211 is 1nF and a series resistor of 22to fulfill the settling
used as an input driver, supporting bandwidth that requirements to an accuracy level of 16 bits within the
allows running the device at the maximum data rate. acquisition time of 280ns.
Figure 44. Minimum Configuration in Parallel Interface Mode
Copyright ©20062012, Texas Instruments Incorporated 35
ADS8556
ADS8557
ADS8558
SBAS404B OCTOBER 2006REVISED JANUARY 2012
www.ti.com
REVISION HISTORY
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (August 2009) to Revision B Page
Updated Figure 2 ................................................................................................................................................................ 14
Changed unit column for all tCONV rows in the Serial Interface Timing Requirements table ............................................... 14
Added tS3 row to Serial Interface Timing Requirements table ............................................................................................ 14
Updated Figure 3 ................................................................................................................................................................ 15
Changed unit column for all tCONV rows in Parallel Interface Timing Requirements (Read Access) table ......................... 15
Changed second paragraph of CONVST_x section ........................................................................................................... 24
Changed minimum bandwidth value in last sentence of Reference section ...................................................................... 25
Updated Figure 40 .............................................................................................................................................................. 31
Updated Figure 44 .............................................................................................................................................................. 35
36 Copyright ©20062012, Texas Instruments Incorporated
PACKAGE OPTION ADDENDUM
www.ti.com 30-Nov-2011
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status (1) Package Type Package
Drawing Pins Package Qty Eco Plan (2) Lead/
Ball Finish MSL Peak Temp (3) Samples
(Requires Login)
ADS8556IPM ACTIVE LQFP PM 64 160 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR
ADS8556IPMR ACTIVE LQFP PM 64 1000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR
ADS8557IPM ACTIVE LQFP PM 64 160 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR
ADS8557IPMR ACTIVE LQFP PM 64 1000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR
ADS8558IPM ACTIVE LQFP PM 64 160 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR
ADS8558IPMR ACTIVE LQFP PM 64 1000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
PACKAGE OPTION ADDENDUM
www.ti.com 30-Nov-2011
Addendum-Page 2
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
ADS8556IPMR LQFP PM 64 1000 330.0 24.4 13.0 13.0 2.1 16.0 24.0 Q2
ADS8557IPMR LQFP PM 64 1000 330.0 24.4 13.0 13.0 2.1 16.0 24.0 Q2
ADS8558IPMR LQFP PM 64 1000 330.0 24.4 13.0 13.0 2.1 16.0 24.0 Q2
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Jul-2012
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
ADS8556IPMR LQFP PM 64 1000 367.0 367.0 45.0
ADS8557IPMR LQFP PM 64 1000 367.0 367.0 45.0
ADS8558IPMR LQFP PM 64 1000 367.0 367.0 45.0
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Jul-2012
Pack Materials-Page 2
MECHANICAL DATA
MTQF008A – JANUARY 1995 – REVISED DECEMBER 1996
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PM (S-PQFP-G64) PLASTIC QUAD FLATPACK
4040152/C 11/96
32
17 0,13 NOM
0,25
0,45
0,75
Seating Plane
0,05 MIN
Gage Plane
0,27
33
16
48
1
0,17
49
64
SQ
SQ
10,20
11,80
12,20
9,80
7,50 TYP
1,60 MAX
1,45
1,35
0,08
0,50 M
0,08
0°–7°
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-026
D. May also be thermally enhanced plastic with leads connected to the die pads.
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46C and to discontinue any product or service per JESD48B. Buyers should
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TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
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