µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
D
3-Terminal Regulators
D
Output Current up to 100 mA
D
No External Components
D
Internal Thermal-Overload Protection
D
Internal Short-Circuit Current Limiting
D
Direct Replacements for Fairchild µA78L00
Series
description
This series of fixed-voltage integrated-circuit
voltage regulators is designed for a wide range of
applications. These applications include on-card
regulation for elimination of noise and distribution
problems associated with single-point regulation.
In addition, they can be used with power-pass
elements to make high-current voltage regulators.
One of these regulators can deliver up to 100 mA
of output current. The internal limiting and
thermal-shutdown features of these regulators
make them essentially immune to overload. When
used as a replacement for a zener diode-resistor
combination, an effective improvement in output
impedance can be obtained, together with lower
bias current.
The µA78L00C series is characterized for
operation over the virtual junction temperature
range of 0°C to 125°C.
AVAILABLE OPTIONS
PACKAGED DEVICES
T
J
VO(NOM)
(V)
SMALL OUTLINE
(D) PLASTIC CYLINDRICAL
(LP) SOT-89
(PK) CHIP
FORM
J
(V)
OUTPUT VOLTAGE TOLERANCE (Y)
5% 10% 5% 10% 5% 10%
0°C to
125°C
2.6
5
6.2
8
9
10
12
15
µA78L02ACD
µA78L05ACD
µA78L06ACD
µA78L08ACD
µA78L09ACD
µA78L10ACD
µA78L12ACD
µA78L15ACD
µA78L05CD
µA78L06CD
µA78L08CD
µA78L09CD
µA78L12CD
µA78L15CD
µA78L02ACLP
µA78L05ACLP
µA78L06ACLP
µA78L08ACLP
µA78L09ACLP
µA78L10ACLP
µA78L12ACLP
µA78L15ACLP
µA78L02CLP
µA78L05CLP
µA78L06CLP
µA78L08CLP
µA78L09CLP
µA78L10CLP
µA78L12CLP
µA78L15CLP
µA78L02ACPK
µA78L05ACPK
µA78L06ACPK
µA78L08ACPK
µA78L09ACPK
µA78L10ACPK
µA78L12ACPK
µA78L15ACPK
µA78L02CPK
µA78L05CPK
µA78L06CPK
µA78L08CPK
µA78L09CPK
µA78L10CPK
µA78L12CPK
µA78L15CPK
µA78L02Y
µA78L05Y
µA78L06Y
µA78L08Y
µA78L09Y
µA78L10Y
µA78L12Y
µA78L15Y
D and LP packages are available taped and reeled. Add the suffix R to the device type (e.g., µA78L05ACDR). The PK package is only available
taped and reeled (e.g., µA78L02ACPKR). Chip forms are tested at TA = 25°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 1999, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
D PACKAGE
(TOP VIEW)
1
2
3
4
8
7
6
5
OUTPUT
COMMON
COMMON
NC
INPUT
COMMON
COMMON
NC
LP PACKAGE
(TOP VIEW)
PK PACKAGE
(TOP VIEW)
NC – No internal connection
INPUT
COMMON
OUTPUT
INPUT
COMMON
OUTPUT
TO–226AA
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
2POST OFFICE BOX 655303 DALLAS, TEXAS 75265
schematic
20 k
1 kto 14 k
INPUT
OUTPUT
COMMON
NOTE: Resistor values shown are nominal.
1.4 k
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
absolute maximum ratings over operating temperature range (unless otherwise noted)
µA78Lxx UNIT
In
p
ut voltage VI
µA78L02AC, µA78L05C–µA78L09C, µA78L10AC 30
V
Inp
u
t
v
oltage
,
V
IµA78L12C, µA78L12AC, µA78L15C, µA78L15AC 35
V
D package 97
Package thermal impedance, θJA (see Notes 1 and 2) LP package 156 °C
PK package 52
Virtual junction temperature range, TJ0 to 150 °C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260 °C
Storage temperature range, Tstg –65 to 150 °C
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only , and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may af fect device reliability.
NOTES: 1. Maximum power dissipation is a function of TJ(max), θJA, and TA. The maximum allowable power dissipation at any allowable
ambient temperature is PD = (TJ(max) – TA)/θJA. Operating at the absolute maximum TJ of 150°C can impact reliability. Due to
variations in individual device electrical characteristics and thermal resistance, the built-in thermal-overload protection may be
activated at power levels slightly above or below the rated dissipation.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
recommended operating conditions
MIN MAX UNIT
µA78L02AC 4.75 20
µA78L05C, µA78L05AC 7 20
µA78L06C, µA78L06AC 8.5 20
In
p
ut voltage VI
µA78L08C, µA78L08AC 10.5 23
V
Inp
u
t
v
oltage
,
V
IµA78L09C, µA78L09AC 11.5 24
V
µA78L10AC 12.5 25
µA78L12C, µA78L12AC 14.5 27
µA78L15C, µA78L15AC 17.5 30
Output current, IO100 mA
Operating virtual junction temperature, TJ0 125 °C
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
4POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics at specified virtual junction temperature, VI = 9 V, IO = 40 mA (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
T
µA78L02C
PARAMETER
TEST
CONDITIONS
T
J
MIN TYP MAX
V 475Vto20V
I 1 mA to 40 mA
25°C2.5 2.6 2.7
Output voltage
V
I =
4
.
75
V
t
o
20
V
,
I
O =
1
m
A
t
o
40
m
A
0°C to 125°C2.45 2.75 V
IO = 1 mA to 70 mA 0°C to 125°C2.45 2.75
In
p
ut voltage regulation
VI = 4.75 V to 20 V
25
°
C
20 100
Inp
u
t
v
oltage
reg
u
lation
VI = 5 V to 20 V
25°C
16 75
Ripple rejection VI = 6 V to 20 V, f = 120 Hz 25°C 43 51 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA
25
°
C
12 50
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA
25°C
6 25
Output noise voltage f = 10 Hz to 100 kHz 25°C 30 µV
Dropout voltage 25°C 1.7 V
Bias current
25°C3.6 6
Bias
c
u
rrent
125°C5.5
Bias current change
VI = 5 V to 20 V
0°Cto125°C
2.5
Bias
c
u
rrent
change
IO = 1 mA to 40 mA
0°C
t
o
125°C
0.1
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 10 V, IO = 40 mA (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TJ
µA78L05C µA78L05AC
PARAMETER
TEST
CONDITIONS
T
J
MIN TYP MAX MIN TYP MAX
V 7Vto20V
I 1 mA to 40 mA
25°C 4.6 5 5.4 4.8 5 5.2
Output voltage
V
I =
7
V
t
o
20
V
,
I
O =
1
m
A
t
o
40
m
A
0°C to 125°C4.5 5.5 4.75 5.25 V
IO = 1 mA to 70 mA 0°C to 125°C4.5 5.5 4.75 5.25
Input VI = 7 V to 20 V
25
°
C
32 200 32 150
voltage regulation VI = 8 V to 20 V
25°C
26 150 26 100
Ripple rejection VI = 8 V to 18 V, f = 120 Hz 25°C 40 49 41 49 dB
Output IO = 1 mA to 100 mA
25
°
C
15 60 15 60
voltage regulation IO = 1 mA to 40 mA
25°C
8 30 8 30
Output
noise voltage f = 10 Hz to 100 kHz 25°C 42 42 µV
Dropout voltage 25°C 1.7 1.7 V
Bias current
25°C 3.8 6 3.8 6
Bias
c
u
rrent
125°C 5.5 5.5
Bias VI = 8 V to 20 V
0°Cto125°C
1.5 1.5
current change IO = 1 mA to 40 mA
0°C
t
o
125°C
0.2 0.1
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics at specified virtual junction temperature, VI = 12 V, IO = 40 mA (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TJ
µA78L06C µA78L06AC
UNIT
PARAMETER
TEST
CONDITIONS
T
J
MIN TYP MAX MIN TYP MAX
UNIT
V 85Vto20V
I 1 mA to 40 mA
25°C5.7 6.2 6.7 5.95 6.2 6.45
Output voltage
V
I =
8
.
5
V
t
o
20
V
,
I
O =
1
m
A
t
o
40
m
A
0°C to 125°C5.6 6.8 5.9 6.5 V
IO = 1 mA to 70 mA 0°C to 125°C5.6 6.8 5.9 6.5
Input VI = 8.5 V to 20 V
25
°
C
35 200 35 175
mV
voltage regulation VI = 9 V to 20 V
25°C
29 150 29 125
mV
Ripple rejection VI = 10 V to 20 V, f = 120 Hz 25°C 39 48 40 48 dB
Output IO = 1 mA to 100 mA
25
°
C
16 80 16 80
mV
voltage regulation IO = 1 mA to 40 mA
25°C
9 40 9 40
mV
Output
noise voltage f = 10 Hz to 100 kHz 25°C 46 46 µV
Dropout voltage 25°C 1.7 1.7 V
Bias current
25°C3.9 6 3.9 6
mA
Bias
c
u
rrent
125°C5.5 5.5
mA
Bias VI = 9 V to 20 V
0°Cto125°C
1.5 1.5
mA
current change IO = 1 mA to 40 mA
0°C
t
o
125°C
0.2 0.1
mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 14 V, IO = 40 mA (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TJ
µA78L08C µA78L08AC
UNIT
PARAMETER
TEST
CONDITIONS
T
J
MIN TYP MAX MIN TYP MAX
UNIT
V 105Vto23V
I 1 mA to 40 mA
25°C7.36 8 8.64 7.7 8 8.3
Output voltage
V
I =
10
.
5
V
t
o
23
V
,
I
O =
1
m
A
t
o
40
m
A
0°C to 125°C7.2 8.8 7.6 8.4 V
IO = 1 mA to 70 mA 0°C to 125°C7.2 8.8 7.6 8.4
Input voltage VI = 10.5 V to 23 V
25
°
C
42 200 42 175
mV
g
regulation VI = 11 V to 23 V
25°C
36 150 36 125
mV
Ripple rejection VI = 13 V to 23 V, f = 120 Hz 25°C 36 46 37 46 dB
Output voltage IO = 1 mA to 100 mA
25
°
C
18 80 18 80
mV
g
regulation IO = 1 mA to 40 mA
25°C
10 40 10 40
mV
Output
noise voltage f = 10 Hz to 100 kHz 25°C 54 54 µV
Dropout voltage 25°C 1.7 1.7 V
Bias current
25°C4 6 4 6
mA
Bias
c
u
rrent
125°C5.5 5.5
mA
Bias VI = 5 V to 20 V
0°Cto125°C
1.5 1.5
mA
current change IO = 1 mA to 40 mA
0°C
t
o
125°C
0.2 0.1
mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
6POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics at specified virtual junction temperature, VI = 16 V, IO = 40 mA (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TJ
µA78L09C µA78L09AC
PARAMETER
TEST
CONDITIONS
T
J
MIN TYP MAX MIN TYP MAX
V 12Vto24V
I 1 mA to 40 mA
25°C8.3 9 9.7 8.6 9 9.4
Output voltage
V
I =
12
V
t
o
24
V
,
I
O =
1
m
A
t
o
40
m
A
0°C to 125°C8.1 9.9 8.55 9.45 V
IO = 1 mA to 70 mA 0°C to 125°C8.1 9.9 8.55 9.45
Input VI = 12 V to 24 V
25
°
C
45 225 45 175
voltage regulation VI = 13 V to 24 V
25°C
40 175 40 125
Ripple rejection VI = 15 V to 25 V, f = 120 Hz 25°C 36 45 38 45 dB
Output IO = 1 mA to 100 mA
25
°
C
19 90 19 90
voltage regulation IO = 1 mA to 40 mA
25°C
11 40 11 40
Output
noise voltage f = 10 Hz to 100 kHz 25°C 58 58 µV
Dropout voltage 25°C 1.7 1.7 V
Bias current
25°C4.1 6 4.1 6
Bias
c
u
rrent
125°C5.5 5.5
Bias VI = 13 V to 24 V
0°Cto125°C
1.5 1.5
current change IO = 1 mA to 40 mA
0°C
t
o
125°C
0.2 0.1
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 14 V, IO = 40 mA (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
T
µA78L10AC
PARAMETER
TEST
CONDITIONS
T
J
MIN TYP MAX
V 13Vto25V
I 1 mA to 40 mA
25°C9.6 10 10.4
Output voltage
V
I =
13
V
t
o
25
V
,
I
O =
1
m
A
t
o
40
m
A
0°C to 125°C9.5 10.5 V
IO = 1 mA to 70 mA 0°C to 125°C9.5 10.5
In
p
ut voltage regulation
VI = 13 V to 25 V
25
°
C
51 175
Inp
u
t
v
oltage
reg
u
lation
VI = 14 V to 25 V
25°C
42 125
Ripple rejection VI = 15 V to 25 V, f = 120 Hz 25°C 37 44 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA
25
°
C
20 90
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA
25°C
11 40
Output noise voltage f = 10 Hz to 100 kHz 25°C 62 µV
Dropout voltage 25°C 1.7 V
Bias current
25°C4.2 6
Bias
c
u
rrent
125°C5.5
Bias current change
VI = 14 V to 25 V
0°Cto125°C
1.5
Bias
c
u
rrent
change
IO = 1 mA to 40 mA
0°C
t
o
125°C
0.1
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics at specified virtual junction temperature, VI = 19 V, IO = 40 mA (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TJ
µA78L12C µA78L12AC
UNIT
PARAMETER
TEST
CONDITIONS
T
J
MIN TYP MAX MIN TYP MAX
UNIT
V 14Vto27V
I 1 mA to 40 mA
25°C11.1 12 12.9 11.5 12 12.5
Output voltage
V
I =
14
V
t
o
27
V
,
I
O =
1
m
A
t
o
40
m
A
0°C to 125°C10.8 13.2 11.4 12.6 V
IO = 1 mA to 70 mA 0°C to 125°C10.8 13.2 11.4 12.6
Input VI = 14.5 V to 27 V
25
°
C
55 250 55 250
mV
voltage regulation VI = 16 V to 27 V
25°C
49 200 49 200
mV
Ripple rejection VI = 15 V to 25 V, f = 120 Hz 25°C 36 42 37 42 dB
Output IO = 1 mA to 100 mA
25
°
C
22 100 22 100
mV
voltage regulation IO = 1 mA to 40 mA
25°C
13 50 13 50
mV
Output
noise voltage f = 10 Hz to 100 kHz 25°C 70 70 µV
Dropout voltage 25°C 1.7 1.7 V
Bias current
25°C4.3 6.5 4.3 6.5
mA
Bias
c
u
rrent
125°C6 6
mA
Bias VI = 16 V to 27 V
0°Cto125°C
1.5 1.5
mA
current change IO = 1 mA to 40 mA
0°C
t
o
125°C
0.2 0.1
mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 23 V, IO = 40 mA (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TJ
µA78L15C µA78L15AC
UNIT
PARAMETER
TEST
CONDITIONS
T
J
MIN TYP MAX MIN TYP MAX
UNIT
V 175Vto30V
I 1 mA to 40 mA
25°C13.8 15 16.2 14.4 15 15.6
Output
voltage
V
I =
17
.
5
V
t
o
30
V
,
I
O =
1
m
A
t
o
40
m
A
0°C to 125°C13.5 16.5 14.25 15.75 V
voltage
IO = 1 mA to 70 mA 0°C to 125°C13.5 16.5 14.25 15.75
Input
voltage
VI = 17.5 V to 30 V
25°C
65 300 65 300
mV
vo
lt
age
regulation VI = 20 V to 30 V
25°C
58 250 58 250
mV
Ripple
rejection VI = 18.5 V to 28.5 V, f = 120 Hz 25°C 33 39 34 39 dB
Output
voltage
IO = 1 mA to 100 mA
25
°
C
25 150 25 150
mV
vo
lt
age
regulation IO = 1 mA to 40 mA
25°C
15 75 15 75
mV
Output
noise voltage f = 10 Hz to 100 kHz 25°C 82 82 µV
Dropout
voltage 25°C 1.7 1.7 V
Bias current
25°C4.6 6.5 4.6 6.5
mA
Bias
c
u
rrent
125°C6 6
mA
Bias VI = 10 V to 30 V
0°Cto125°C
1.5 1.5
mA
current change IO = 1 mA to 40 mA
0°C
t
o
125°C
0.2 0.1
mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
8POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics at specified virtual junction temperature, VI = 9 V, IO = 40 mA, TJ = 25°C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
µA78L02Y
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
Output voltage 2.6 V
In
p
ut voltage regulation
VI = 4.75 V to 20 V 20
Inp
u
t
v
oltage
reg
u
lation
VI = 5 V to 20 V 16
Ripple rejection VI = 6 V to 20 V, f = 120 Hz 51 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA 12
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA 6
Output noise voltage f = 10 Hz to 100 kHz 30 µV
Dropout voltage 1.7 V
Bias current 3.6 mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 10 V, IO = 40 mA, T J = 25°C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
µA78L05Y
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
Output voltage 5 V
In
p
ut voltage regulation
VI = 7 V to 20 V 32
Inp
u
t
v
oltage
reg
u
lation
VI = 8 V to 20 V 26
Ripple rejection VI = 8 V to 18 V, f = 120 Hz 49 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA 15
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA 8
Output noise voltage f = 10 Hz to 100 kHz 42 µV
Dropout voltage 1.7 V
Bias current 3.8 mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 12 V, IO = 40 mA, T J = 25°C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
µA78L06Y
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
Output voltage 6.2 V
In
p
ut voltage regulation
VI = 8.5 V to 20 V 35
Inp
u
t
v
oltage
reg
u
lation
VI = 9 V to 20 V 29
Ripple rejection VI = 10 V to 20 V, f = 120 Hz 48 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA 16
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA 9
Output noise voltage f = 10 Hz to 100 kHz 46 µV
Dropout voltage 1.7 V
Bias current 3.9 mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics at specified virtual junction temperature, VI = 14 V, IO = 40 mA, T J = 25°C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
µA78L08Y
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
UNIT
Output voltage 8 V
In
p
ut voltage regulation
VI = 10.5 V to 23 V 42
mV
Inp
u
t
v
oltage
reg
u
lation
VI = 11 V to 23 V 36
mV
Ripple rejection VI = 13 V to 23 V, f = 120 Hz 46 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA 18
mV
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA 10
mV
Output noise voltage f = 10 Hz to 100 kHz 54 µV
Dropout voltage 1.7 V
Bias current 4 mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 16 V, IO = 40 mA, T J = 25°C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
µA78L09Y
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
UNIT
Output voltage 9 V
In
p
ut voltage regulation
VI = 12 V to 24 V 45
mV
Inp
u
t
v
oltage
reg
u
lation
VI = 13 V to 24 V 40
mV
Ripple rejection VI = 15 V to 25 V, f = 120 Hz 45 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA 19
mV
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA 11
mV
Output noise voltage f = 10 Hz to 100 kHz 58 µV
Dropout voltage 1.7 V
Bias current 4.1 mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 14 V, IO = 40 mA, T J = 25°C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
µA78L10Y
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
UNIT
Output voltage 10 V
In
p
ut voltage regulation
VI = 13 V to 25 V 51
mV
Inp
u
t
v
oltage
reg
u
lation
VI = 14 V to 25 V 42
mV
Ripple rejection VI = 15 V to 25 V, f = 120 Hz 44 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA 20
mV
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA 11
mV
Output noise voltage f = 10 Hz to 100 kHz 62 µV
Dropout voltage 1.7 V
Bias current 4.2 mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
10 POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics at specified virtual junction temperature, VI = 19 V, IO = 40 mA, T J = 25°C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
µA78L12Y
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
Output voltage 12 V
In
p
ut voltage regulation
VI = 14.5 V to 27 V 55
Inp
u
t
v
oltage
reg
u
lation
VI = 16 V to 27 V 49
Ripple rejection VI = 15 V to 25 V, f = 120 Hz 42 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA 22
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA 13
Output noise voltage f = 10 Hz to 100 kHz 70 µV
Dropout voltage 1.7 V
Bias current 4.3 mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
electrical characteristics at specified virtual junction temperature, VI = 23 V, IO = 40 mA, T J = 25°C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
µA78L15Y
PARAMETER
TEST
CONDITIONS
MIN TYP MAX
Output voltage 15 V
In
p
ut voltage regulation
VI = 17.5 V to 30 V 65
Inp
u
t
v
oltage
reg
u
lation
VI = 20 V to 30 V 58
Ripple rejection VI = 18.5 V to 28.5 V, f = 120 Hz 39 dB
Out
p
ut voltage regulation
IO = 1 mA to 100 mA 25
O
u
tp
u
t
v
oltage
reg
u
lation
IO = 1 mA to 40 mA 15
Output noise voltage f = 10 Hz to 100 kHz 82 µV
Dropout voltage 1.7 V
Bias current 4.6 mA
Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. All characteristics are
measured with a 0.33-µF capacitor across the input and a 0.1-µF capacitor across the output.
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
11
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
VO
VI
0.1 µF0.33 µF
µA78Lxx
Figure 1. Fixed-Output Regulator
OUTIN G
–VO
COM
+
VIIL
µA78Lxx
Figure 2. Positive Regulator in Negative Configuration (VI Must Float)
R1
0.33 µF
Input Output
µA78Lxx
0.1 µF
IO
R2
Figure 3. Adjustable-Output Regulator
VO(Reg) R1
Input
IO
IO = (VO/R1) + IO Bias Current
0.33 µF
µA78Lxx
Output
Figure 4. Current Regulator
µA78L00 SERIES
POSITIVE-VOLTAGE REGULATORS
SLVS010I – JANUARY 1976 – REVISED JULY 1999
12 POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
µA78L15
0.1 µF1N4001
0.1 µF1N4001
0.33 µF
0.33 µF
1N4001
1N4001
VO = 15 V
VO = –15 V
20-V Input
–20-V Input µA79L15
Figure 5. Regulated Dual Supply
operation with a load common to a voltage of opposite polarity
In many cases, a regulator powers a load that is not connected to ground but, instead, is connected to a voltage
source of opposite polarity (e.g., operational amplifiers, level-shifting circuits, etc.). In these cases, a clamp
diode should be connected to the regulator output as shown in Figure 6. This protects the regulator from output
polarity reversals during startup and short-circuit operation.
µA78Lxx VO
VI
– VO
1N4001
or
Equivalent
Figure 6. Output Polarity-Reversal-Protection Circuit
reverse-bias protection
Occasionally, the input voltage to the regulator can collapse faster than the output voltage. This can occur, for
example, when the input supply is crowbarred during an output overvoltage condition. If the output voltage is
greater than approximately 7 V , the emitter-base junction of the series-pass element (internal or external) could
break down and be damaged. To prevent this, a diode shunt can be employed as shown in Figure 7.
µA78Lxx VO
VI
Figure 7. Reverse-Bias-Protection Circuit
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated