REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
a
ADF4110/ADF4111/ADF4112/ADF4113
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700 World Wide Web Site: http://www.analog.com
Fax: 781/326-8703 © Analog Devices, Inc., 2001
RF PLL Frequency Synthesizers
FEATURES
ADF4110: 550 MHz
ADF4111: 1.2 GHz
ADF4112: 3.0 GHz
ADF4113: 4.0 GHz
2.7 V to 5.5 V Power Supply
Separate Charge Pump Supply (VP) Allows Extended
Tuning Voltage in 3 V Systems
Programmable Dual Modulus Prescaler 8/9, 16/17,
32/33, 64/65
Programmable Charge Pump Currents
Programmable Antibacklash Pulsewidth
3-Wire Serial Interface
Analog and Digital Lock Detect
Hardware and Software Power-Down Mode
APPLICATIONS
Base Stations for Wireless Radio (GSM, PCS, DCS,
CDMA, WCDMA)
Wireless Handsets (GSM, PCS, DCS, CDMA, WCDMA)
Wireless LANS
Communications Test Equipment
CATV Equipment
GENERAL DESCRIPTION
The ADF4110 family of frequency synthesizers can be used
to implement local oscillators in the upconversion and down-
conversion sections of wireless receivers and transmitters. They
consist of a low-noise digital PFD (Phase Frequency Detector),
a precision charge pump, a programmable reference divider,
programmable A and B counters and a dual-modulus prescaler
(P/P + 1). The A (6-bit) and B (13-bit) counters, in conjunction
with the dual modulus prescaler (P/P + 1), implement an N
divider (N = BP + A). In addition, the 14-bit reference counter
(R Counter), allows selectable REFIN frequencies at the PFD
input. A complete PLL (Phase-Locked Loop) can be imple-
mented if the synthesizer is used with an external loop filter and
VCO (Voltage Controlled Oscillator).
Control of all the on-chip registers is via a simple 3-wire interface.
The devices operate with a power supply ranging from 2.7 V to
5.5 V and can be powered down when not in use.
FUNCTIONAL BLOCK DIAGRAM
REFERENCE
N = BP + A
FUNCTION
LATCH
PRESCALER
P/P +1
13-BIT
B COUNTER
6-BIT
A COUNTER
14-BIT
R COUNTER
24-BIT
INPUT REGISTER
R COUNTER
LATCH
A, B COUNTER
LATCH
PHASE
FREQUENCY
DETECTOR
CHARGE
PUMP
M3 M2 M1
HIGH Z
MUX MUXOUT
CP
AVDD
SDOUT
19
13
14
22
SDOUT
FROM
FUNCTION
LATCH
DGNDAGNDCE
RFINB
RFINA
LE
DATA
CLK
REFIN
CPGND
VP
DVDD
AVDD
LOCK
DETECT
ADF4110/ADF4111
ADF4112/ADF4113
RSET
CURRENT
SETTING 2
CPI3 CPI2 CPI1 CPI6 CPI5 CPI4
CURRENT
SETTING 1
6
LOAD
LOAD
REV. A
–2–
ADF4110/ADF4111/ADF4112/ADF4113–SPECIFICATIONS
1
(AVDD = DVDD = 3 V 10%, 5 V 10%; AVDD VP 6.0 V; AGND = DGND = CPGND = 0 V; RSET = 4.7 k; dBm referred to 50 ; TA = TMIN to TMAX unless
otherwise noted.)
Parameter B Version B Chips
2
Unit Test Conditions/Comments
RF CHARACTERISTICS (3 V) See Figure 3 for Input Circuit.
RF Input Frequency Use a square wave for lower frequencies,
ADF4110 80/550 80/550 MHz min/max below the minimum level stated.
ADF4110 50/550 50/550 MHz min/max Input Level = –10 dBm
ADF4111 0.08/1.2 0.08/1.2 GHz min/max
ADF4112 0.2/3.0 0.2/3.0 GHz min/max
ADF4112 0.1/3.0 0.1/3.0 GHz min/max Input Level = –10 dBm
ADF4113 0.2/3.7 0.2/3.7 GHz min/max Input Level = –10 dBm
RF Input Sensitivity –15/0 –15/0 dBm min/max
Maximum Allowable Prescaler
Output Frequency
3
165 165 MHz max
RF CHARACTERISTICS (5 V)
RF Input Frequency Use a square wave for lower frequencies,
ADF4110 80/550 80/550 MHz min/max below the minimum level stated.
ADF4111 0.08/1.4 0.08/1.4 GHz min/max
ADF4112 0.1/3.0 0.1/3.0 GHz min/max
ADF4113 0.2/3.7 0.2/3.7 GHz min/max
ADF4113 0.2/4.0 0.2/4.0 GHz min/max Input Level = –5 dBm
RF Input Sensitivity –10/0 –10/0 dBm min/max
Maximum Allowable Prescaler
Output Frequency
3
200 200 MHz max
REFIN CHARACTERISTICS
REFIN Input Frequency 5/100 5/100 MHz min/max For f < 5 MHz, use dc-coupled square
wave, (0 to V
DD
).
Reference Input Sensitivity
4
–5 –5 dBm min AC-Coupled. When DC-Coupled:
0 to V
DD
max (CMOS-Compatible)
REFIN Input Capacitance 10 10 pF max
REFIN Input Current ±100 ±100 µA max
PHASE DETECTOR
Phase Detector Frequency
5
55 55 MHz max
CHARGE PUMP
I
CP
Sink/Source Programmable: See Table V
High Value 5 5 mA typ With R
SET
= 4.7 k
Low Value 625 625 µA typ
Absolute Accuracy 2.5 2.5 % typ With R
SET
= 4.7 k
R
SET
Range 2.7/10 2.7/10 k typ See Table V
I
CP
3-State Leakage Current 1 1 nA typ
Sink and Source Current Matching 2 2 % typ 0.5 V V
CP
V
P
– 0.5
I
CP
vs. V
CP
1.5 1.5 % typ 0.5 V V
CP
V
P
– 0.5
I
CP
vs. Temperature 2 2 % typ V
CP
= V
P
/2
LOGIC INPUTS
V
INH
, Input High Voltage 0.8 × DV
DD
0.8 × DV
DD
V min
V
INL
, Input Low Voltage 0.2 × DV
DD
0.2 × DV
DD
V max
I
INH
/I
INL
, Input Current ±1±1µA max
C
IN
, Input Capacitance 10 10 pF max
LOGIC OUTPUTS
V
OH
, Output High Voltage DV
DD
– 0.4 DV
DD
– 0.4 V min I
OH
= 500 µA
V
OL
, Output Low Voltage 0.4 0.4 V max I
OL
= 500 µA
POWER SUPPLIES
AV
DD
2.7/5.5 2.7/5.5 V min/V max
DV
DD
AV
DD
AV
DD
V
P
AV
DD
/6.0 AV
DD
/6.0 V min/V max AV
DD
V
P
6.0 V
I
DD6
(AI
DD
+ DI
DD
) See TPCs 21a and 21b
ADF4110 5.5 4.5 mA max 4.5 mA Typical
ADF4111 5.5 4.5 mA max 4.5 mA Typical
ADF4112 7.5 6.5 mA max 6.5 mA Typical
ADF4113 11 8.5 mA max 8.5 mA Typical
I
P
0.5 0.5 mA max T
A
= 25°C
Low Power Sleep Mode 1 1 µA typ
REV. A –3–
ADF4110/ADF4111/ADF4112/ADF4113
Parameter B Version B Chips
2
Unit Test Conditions/Comments
NOISE CHARACTERISTICS
ADF4113 Phase Noise Floor
7
–171 –171 dBc/Hz typ @ 25 kHz PFD Frequency
–164 –164 dBc/Hz typ @ 200 kHz PFD Frequency
Phase Noise Performance
8
@ VCO Output
ADF4110: 540 MHz Output
9
–91 –91 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
ADF4111: 900 MHz Output
10
–87 –87 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
ADF4112: 900 MHz Output
10
–90 –90 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
ADF4113: 900 MHz Output
10
–91 –91 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
ADF4111: 836 MHz Output
11
–78 –78 dBc/Hz typ @ 300 Hz Offset and 30 kHz PFD Frequency
ADF4112: 1750 MHz Output
12
–86 –86 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
ADF4112: 1750 MHz Output
13
–66 –66 dBc/Hz typ @ 200 Hz Offset and 10 kHz PFD Frequency
ADF4112: 1960 MHz Output
14
–84 –84 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
ADF4113: 1960 MHz Output
14
–85 –85 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency
ADF4113: 3100 MHz Output
15
–86 –86 dBc/Hz typ @ 1 kHz Offset and 1 MHz PFD Frequency
Spurious Signals
ADF4110: 540 MHz Output
9
–97/–106 –97/–106 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4111: 900 MHz Output
10
–98/–110 –98/–110 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4112: 900 MHz Output
10
–91/–100 –91/–100 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4113: 900 MHz Output
10
–100/–110 –100/–110 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4111: 836 MHz Output
11
–81/–84 –81/–84 dBc typ @ 30 kHz/60 kHz and 30 kHz PFD Frequency
ADF4112: 1750 MHz Output
12
–88/–90 –88/–90 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4112: 1750 MHz Output
13
–65/–73 –65/–73 dBc typ @ 10 kHz/20 kHz and 10 kHz PFD Frequency
ADF4112: 1960 MHz Output
14
–80/–84 –80/–84 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4113: 1960 MHz Output
14
–80/–84 –80/–84 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4113: 3100 MHz Output
15
–80/–82 –82/–82 dBc typ @ 1 MHz/2 MHz and 1 MHz PFD Frequency
NOTES
1
Operating temperature range is as follows: B Version: –40°C to +85°C.
2
The B Chip specifications are given as typical values.
3
This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency
which is less than this value.
4
AV
DD
= DV
DD
= 3 V; For AV
DD
= DV
DD
= 5 V, use CMOS-compatible levels.
5
Guaranteed by design.
6
T
A
= 25°C; AV
DD
= DV
DD
= 3 V; P = 16; SYNC = 0; DLY = 0; RF
IN
for ADF4110 = 540 MHz; RF
IN
for ADF4111, ADF4112, ADF4113 = 900 MHz.
7
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20 logN (where N is the N divider value).
8
The phase noise is measured with the EVAL-ADF411XEB1 Evaluation Board and the HP8562E Spectrum Analyzer. The spectrum analyzer provides the REFIN for
the synthesizer (f
REFOUT
= 10 MHz @ 0 dBm). SYNC = 0; DLY = 0 (See Table III).
9
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; Offset frequency = 1 kHz; f
RF
= 540 MHz; N = 2700; Loop B/W = 20 kHz.
10
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; Offset frequency = 1 kHz; f
RF
= 900 MHz; N = 4500; Loop B/W = 20 kHz.
11
f
REFIN
= 10 MHz; f
PFD
= 30 kHz; Offset frequency = 300 Hz; f
RF
= 836 MHz; N = 27867; Loop B/W = 3 kHz.
12
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; Offset frequency = 1 kHz; f
RF
= 1750 MHz; N = 8750; Loop B/W = 20 kHz.
13
f
REFIN
= 10 MHz; f
PFD
= 10 kHz; Offset frequency = 200 Hz; f
RF
= 1750 MHz; N = 175000; Loop B/W = 1 kHz.
14
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; Offset frequency = 1 kHz; f
RF
= 1960 MHz; N = 9800; Loop B/W = 20 kHz.
15
f
REFIN
= 10 MHz; f
PFD
= 1 MHz; Offset frequency = 1 kHz; f
RF
= 3100 MHz; N = 3100; Loop B/W = 20 kHz.
Specifications subject to change without notice.
TIMING CHARACTERISTICS
1
Limit at T
MIN
to T
MAX
Parameter (B Version) Unit Test Conditions/Comments
t
1
10 ns min DATA to CLOCK Setup Time
t
2
10 ns min DATA to CLOCK Hold Time
t
3
25 ns min CLOCK High Duration
t
4
25 ns min CLOCK Low Duration
t
5
10 ns min CLOCK to LE Setup Time
t
6
20 ns min LE Pulsewidth
NOTES
1
Guaranteed by design but not production tested.
Specifications subject to change without notice.
(AVDD = DVDD = 3 V 10%, 5 V 10%; AVDD VP 6.0 V; AGND = DGND = CPGND = 0 V;
RSET = 4.7 k; TA = TMIN to TMAX unless otherwise noted.)
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–4–
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumu-
late on the human body and test equipment and can discharge without detection. Although the
ADF4110/ADF4111/ADF4112/ADF4113 features proprietary ESD protection circuitry, permanent
damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS
1, 2
(T
A
= 25°C unless otherwise noted)
AV
DD
to GND
3
. . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
AV
DD
to DV
DD
. . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
V
P
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
P
to AV
DD
. . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +5.5 V
Digital I/O Voltage to GND . . . . . . . . –0.3 V to V
DD
+ 0.3 V
Analog I/O Voltage to GND . . . . . . . . . –0.3 V to V
P
+ 0.3 V
REF
IN
, RF
IN
A, RF
IN
B to GND . . . . . . –0.3 V to V
DD
+ 0.3 V
RF
IN
A to RF
IN
B . . . . . . . . . . . . . . . . . . . . . . . . . . . ±320 mV
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Maximum Junction Temperature . . . . . . . . . . . . . . . . 150°C
TSSOP θ
JA
Thermal Impedance . . . . . . . . . . . . . 150.4°C/W
CSP θ
JA
Thermal Impedance (Paddle Soldered) . . . 122°C/W
CSP θ
JA
Thermal Impedance
(Paddle Not Soldered) . . . . . . . . . . . . . . . . . . . . . 216°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . 215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 220°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
This device is a high-performance RF integrated circuit with an ESD rating of
< 2 kV and it is ESD sensitive. Proper precautions should be taken for handling
and assembly.
3
GND = AGND = DGND = 0 V.
TRANSISTOR COUNT
6425 (CMOS) and 303 (Bipolar).
ORDERING GUIDE
Model Temperature Range Package Description Package Option*
ADF4110BRU –40°C to +85°C Thin Shrink Small Outline Package (TSSOP) RU-16
ADF4110BCP –40°C to +85°C Chip Scale Package (CSP) CP-20
ADF4111BRU –40°C to +85°C Thin Shrink Small Outline Package (TSSOP) RU-16
ADF4111BCP –40°C to +85°C Chip Scale Package (CSP) CP-20
ADF4112BRU –40°C to +85°C Thin Shrink Small Outline Package (TSSOP) RU-16
ADF4112BCP –40°C to +85°C Chip Scale Package (CSP) CP-20
ADF4113BRU –40°C to +85°C Thin Shrink Small Outline Package (TSSOP) RU-16
ADF4113BCP –40°C to +85°C Chip Scale Package (CSP) CP-20
ADF4113BCHIPS –40°C to +85°C DICE DICE
*Contact the factory for chip availability.
CLOCK
DATA
LE
LE
DB20 (MSB) DB19 DB2 DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t6
t5
t1t2
t3t4
Figure 1. Timing Diagram
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–5–
PIN FUNCTION DESCRIPTIONS
Pin No. Mnemonic Function
1R
SET
Connecting a resistor between this pin and CPGND sets the maximum charge pump output current. The
nominal voltage potential at the R
SET
pin is 0.56 V. The relationship between I
CP
and R
SET
is
IR
CP
SET
max
.
=23 5
So, with R
SET
= 4.7 k, I
CPmax
= 5 mA.
2 CP Charge Pump Output. When enabled this provides ±I
CP
to the external loop filter, which in turn drives the
external VCO.
3 CPGND Charge Pump Ground. This is the ground return path for the charge pump.
4 AGND Analog Ground. This is the ground return path of the prescaler.
5RF
IN
B Complementary Input to the RF Prescaler. This point should be decoupled to the ground plane with
a small bypass capacitor, typically 100 pF. See Figure 3.
6RF
IN
A Input to the RF Prescaler. This small signal input is ac-coupled from the VCO.
7AV
DD
Analog Power Supply. This may range from 2.7 V to 5.5 V. Decoupling capacitors to the analog ground
plane should be placed as close as possible to this pin. AV
DD
must be the same value as DV
DD
.
8 REF
IN
Reference Input. This is a CMOS input with a nominal threshold of V
DD
/2 and an equivalent input resis-
tance of 100 k. See Figure 2. This input can be driven from a TTL or CMOS crystal oscillator or it
can be ac-coupled.
9 DGND Digital Ground.
10 CE Chip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-
state mode. Taking the pin high will power up the device depending on the status of the power-down bit F2.
11 CLK Serial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched into
the 24-bit shift register on the CLK rising edge. This input is a high impedance CMOS input.
12 DATA Serial Data Input. The serial data is loaded MSB rst with the two LSBs being the control bits. This
input is a high impedance CMOS input.
13 LE Load Enable, CMOS Input. When LE goes high, the data stored in the shift registers is loaded into one
of the four latches, the latch being selected using the control bits.
14 MUXOUT This multiplexer output allows either the Lock Detect, the scaled RF or the scaled Reference Frequency
to be accessed externally.
15 DV
DD
Digital Power Supply. This may range from 2.7 V to 5.5 V. Decoupling capacitors to the digital ground
plane should be placed as close as possible to this pin. DV
DD
must be the same value as AV
DD
.
16 V
P
Charge Pump Power Supply. This should be greater than or equal to V
DD
. In systems where V
DD
is 3 V,
it can be set to 6 V and used to drive a VCO with a tuning range of up to 6 V.
PIN CONFIGURATIONS
TSSOP
TOP VIEW
(Not to Scale)
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
R
SET
V
P
ADF4110
ADF4111
ADF4112
ADF4113
CP DV
DD
CPGND MUXOUT
AGND LE
RF
IN
BDATA
RF
IN
ACLK
AV
DD
CE
REF
IN
DGND
CHIP SCALE PACKAGE
TOP VIEW
(Not to Scale)
CPGND
AGND
AGND
RFINB
RFINA
MUXOUT
LE
DATA
CLK
CE
ADF4110
ADF4111
ADF4112
ADF4113
CP
RSET
VP
DVDD
DVDD
AVDD
AVDD
REFIN
DGND
DGND
1
2
3
4
5
15
14
13
12
11
20
19
18
17
16
6
7
8
9
10
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–6–
FREQ-UNIT PARAM-TYPE DATA-FORMAT KEYWORD IMPEDANCE – OHMS
GHz S MA R 50
FREQ MAGS11 ANGS11
1.05 0.9512 –40.134
1.10 0.93458 –43.747
1.15 0.94782 –44.393
1.20 0.96875 –46.937
1.25 0.92216 –49.6
1.30 0.93755 –51.884
1.35 0.96178 –51.21
1.40 0.94354 –53.55
1.45 0.95189 –56.786
1.50 0.97647 –58.781
1.55 0.98619 –60.545
1.60 0.95459 –61.43
1.65 0.97945 –61.241
1.70 0.98864 –64.051
1.75 0.97399 –66.19
1.80 0.97216 –63.775
FREQ MAGS11 ANGS11
0.05 0.89207 –2.0571
0.10 0.8886 –4.4427
0.15 0.89022 –6.3212
0.20 0.96323 –2.1393
0.25 0.90566 –12.13
0.30 0.90307 –13.52
0.35 0.89318 –15.746
0.40 0.89806 –18.056
0.45 0.89565 –19.693
0.50 0.88538 –22.246
0.55 0.89699 –24.336
0.60 0.89927 –25.948
0.65 0.87797 –28.457
0.70 0.90765 –29.735
0.75 0.88526 –31.879
0.80 0.81267 –32.681
0.85 0.90357 –31.522
0.90 0.92954 –34.222
0.95 0.92087 –36.961
1.00 0.93788 –39.343
TPC 1. S-Parameter Data for the ADF4113 RF Input (Up
to 1.8 GHz)
RF INPUT FREQUENCY GHz
04
23
35
RF INPUT POWER dBm
0
15
20
25
30
5
10
1
VDD = 3V
VP = 3V
TA = +85C
TA = +25C
TA = 40C
5
TPC 2. Input Sensitivity (ADF4113)
2kHz 1kHz 900MHz +1kHz +2kHz
V
DD
= 3V, V
P
= 5V
ICP = 5mA
PFD FREQUENCY = 200kHz
LOOP BANDWIDTH = 20kHz
RES. BANDWIDTH = 10Hz
VIDEO BANDWIDTH = 10Hz
SWEEP = 1.9 SECONDS
AVERAGES = 19
91.0dBc/Hz
REFERENCE
LEVEL = 4.2dBm
OUTPUT POWER dB
100
90
80
70
60
50
40
30
20
10
0
TPC 3. ADF4113 Phase Noise (900 MHz, 200 kHz, 20 kHz)
2kHz 1kHz 900MHz +1kHz +2kHz
V
DD
= 3V, V
P
= 5V
ICP = 5mA
PFD FREQUENCY = 200kHz
LOOP BANDWIDTH = 20kHz
RES. BANDWIDTH = 10Hz
VIDEO BANDWIDTH = 10Hz
SWEEP = 1.9 SECONDS
AVERAGES = 19
REFERENCE
LEVEL = 4.2dBm
OUTPUT POWER dB
100
90
80
70
60
50
40
30
20
10
0
92.5dBc/Hz
TPC 4. ADF4113 Phase Noise (900 MHz, 200 kHz,
20 kHz) with DLY and SYNC Enabled
10dB/DIVISION R
L
= 40dBc/Hz RMS NOISE = 0.52
100Hz FREQUENCY OFFSET FROM 900MHz CARRIER 1MHz
0.52 rms
PHASE NOISE dBc/Hz
90
80
70
60
50
40
100
110
120
130
140
TPC 5. ADF4113 Integrated Phase Noise (900 MHz,
200 kHz, 20 kHz, Typical Lock Time: 400
µ
s)
10dB/DIVISION RL = 40dBc/Hz RMS NOISE = 0.62
100Hz FREQUENCY OFFSET FROM 900MHz CARRIER 1MHz
0.62 rms
PHASE NOISE dBc/Hz
90
80
70
60
50
40
100
110
120
130
140
TPC 6. ADF4113 Integrated Phase Noise (900 MHz,
200 kHz, 35 kHz, Typical Lock Time: 200
µ
s)
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–7–
400kHz 200kHz 900MHz +200kHz +400kHz
V
DD
= 3V, V
P
= 5V
I
CP
= 5mA
PFD FREQUENCY = 200kHz
LOOP BANDWIDTH = 20kHz
RES. BANDWIDTH = 1kHz
VIDEO BANDWIDTH = 1kHz
SWEEP = 2.5 SECONDS
AVERAGES = 30
REFERENCE
LEVEL = 4.2dBm
90.2dBc
OUTPUT POWER dB
100
90
80
70
60
50
40
30
20
10
0
TPC 7. ADF4113 Reference Spurs (900 MHz, 200 kHz,
20 kHz)
400kHz 200kHz 900MHz +200kHz +400kHz
V
DD
= 3V, V
P
= 5V
I
CP
= 5mA
PFD FREQUENCY = 200kHz
LOOP BANDWIDTH = 35kHz
RES. BANDWIDTH = 1kHz
VIDEO BANDWIDTH = 1kHz
SWEEP = 2.5 SECONDS
AVERAGES = 30
REFERENCE
LEVEL = 4.2dBm
89.3dBc
OUTPUT POWER dB
100
90
80
70
60
50
40
30
20
10
0
TPC 8. ADF4113 Reference Spurs (900 MHz, 200 kHz,
35 kHz)
400Hz 200Hz 1750MHz +200Hz +400Hz
V
DD
= 3V, V
P
= 5V
I
CP
= 5mA
PFD FREQUENCY = 30kHz
LOOP BANDWIDTH = 3kHz
RES. BANDWIDTH = 10kHz
VIDEO BANDWIDTH = 10kHz
SWEEP = 477ms
AVERAGES = 10
REFERENCE
LEVEL = 8.0dBm
75.2dBc/Hz
OUTPUT POWER dB
100
90
80
70
60
50
40
30
20
10
0
TPC 9. ADF4113 Phase Noise (1750 MHz, 30 kHz, 3 kHz)
10dB/DIVISION RL = 40dBc/Hz RMS NOISE = 1.6
100Hz FREQUENCY OFFSET FROM 1750MHz CARRIER 1MHz
1.6 rms
PHASE NOISE dBc/Hz
90
80
70
60
50
40
100
110
120
130
140
TPC 10. ADF4113 Integrated Phase Noise (1750 MHz,
30 kHz, 3 kHz)
80kHz 40kHz 1750MHz +40kHz +80kHz
V
DD
= 3V, V
P
= 5V
I
CP
= 5mA
PFD FREQUENCY = 30kHz
LOOP BANDWIDTH = 3kHz
RES. BANDWIDTH = 3Hz
VIDEO BANDWIDTH = 3Hz
SWEEP = 255 SECONDS
POSITIVE PEAK DETECT
MODE
REFERENCE
LEVEL = 5.7dBm
0
10
20
30
40
50
60
70
80
90
100
POWER OUTPUT dB
79.6dBc
TPC 11. ADF4113 Reference Spurs (1750 MHz, 30 kHz,
3 kHz)
2kHz 1kHz 3100MHz +1kHz +2kHz
VDD = 3V, VP = 5V
ICP = 5mA
PFD FREQUENCY = 1MHz
LOOP BANDWIDTH = 100kHz
RES. BANDWIDTH = 10Hz
VIDEO BANDWIDTH = 10Hz
SWEEP = 1.9 SECONDS
AVERAGES = 45
REFERENCE
LEVEL = 4.2dBm
86.6dBc/Hz
OUTPUT POWER dB
100
90
80
70
60
50
40
30
20
10
0
TPC 12. ADF4113 Phase Noise (3100 MHz, 1 MHz,
100 kHz)
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–8–
10dB/DIVISION RL = 40dBc/Hz RMS NOISE = 1.7
100Hz FREQUENCY OFFSET FROM 3100MHz CARRIER 1MHz
1.7 rms
PHASE NOISE dBc/Hz
90
80
70
60
50
40
100
110
120
130
140
TPC 13. ADF4113 Integrated Phase Noise (3100 MHz,
1 MHz, 100 kHz)
2MHz 1MHz 3100MHz +1MHz +2MHz
VDD = 3V, VP = 5V
ICP = 5mA
PFD FREQUENCY = 1MHz
LOOP BANDWIDTH =
100kHz
RES. BANDWIDTH = 1kHz
VIDEO BANDWIDTH = 1kHz
SWEEP = 13 SECONDS
AVERAGES = 1
REFERENCE
LEVEL = 17.2dBm
80.6dBc
OUTPUT POWER dB
100
90
80
70
60
50
40
30
20
10
0
TPC 14. ADF4113 Reference Spurs (3100 MHz, 1 MHz,
100 kHz)
PHASE DETECTOR FREQUENCY kHz
1 10000100 1000
180
PHASE NOISE dBc/Hz
140
150
160
170
120
130
10
V
DD
= 3V
V
P
= 5V
TPC 15. ADF4113 Phase Noise (Referred to CP Output)
vs. PFD Frequency
TEMPERATURE C
10040 0 20 40 60 80
100
PHASE NOISE dBc/Hz
70
80
90
60
20
V
DD
= 3V
V
P
= 3V
TPC 16. ADF4113 Phase Noise vs. Temperature
(900 MHz, 200 kHz, 20 kHz)
TEMPERATURE C
10040 0 20 40 60 80
100
FIRST REFERENCE SPUR dBc
70
80
90
60
20
V
DD
= 3V
V
P
= 5V
TPC 17. ADF4113 Reference Spurs vs. Temperature
(900 MHz, 200 kHz, 20 kHz)
TUNING VOLTAGE Volts
50234
105
FIRST REFERENCE SPUR dBc
75
85
95
5
1
V
DD
= 3V
V
P
= 5V
65
35
45
55
15
25
TPC 18. ADF4113 Reference Spurs (200 kHz) vs. V
TUNE
(900 MHz, 200 kHz, 20 kHz)
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–9–
TEMPERATURE C
10040 0 20 40 60 80
100
PHASE NOISE dBc/Hz
70
80
90
60
20
V
DD
= 3V
V
P
= 5V
TPC 19. ADF4113 Phase Noise vs. Temperature
(836 MHz, 30 kHz, 3 kHz)
TEMPERATURE C
10040 0 20 40 60 80
100
FIRST REFERENCE SPUR dBc
70
80
90
60
20
V
DD
= 3V
V
P
= 5V
TPC 20. ADF4113 Reference Spurs vs. Temperature
(836 MHz, 30 kHz, 3 kHz)
0
AI
DD
mA
1
PRESCALER VALUE
8/9 16/17 32/33 64/65
2
3
6
8
9
10
4
5
7
0
ADF4113
ADF4112
ADF4110
ADF4111
TPC 21a. AI
DD
vs. Prescaler Value
PRESCALER OUTPUT FREQUENCY MHz
2000 150
0
DIDD mA
VDD = 3V
VP = 3V
3.0
2.5
1.5
1.0
2.0
0.5
10050
TPC 21b. DI
DD
vs. Prescaler Output Frequency
(ADF4110, ADF4111, ADF4112, ADF4113)
VCP Volts
3.50 1 1.5 2 2.5 3
2
lCP mA
5
4
3
6
0.5
VPP = 5V
ICP SETTING : 5mA
4 4.5 5
3
0
1
2
1
6
4
5
TPC 22. Charge Pump Output Characteristics for ADF4110 Family
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–10–
CIRCUIT DESCRIPTION
REFERENCE INPUT SECTION
The reference input stage is shown in Figure 2. SW1 and SW2
are normally-closed switches. SW3 is normally-open. When
power-down is initiated, SW3 is closed and SW1 and SW2 are
opened. This ensures that there is no loading of the REF
IN
pin
on power-down.
BUFFER
TO R COUNTER
REFIN
100k
NC
SW2
SW3
NO
NC
SW1
POWER-DOWN
CONTROL
Figure 2. Reference Input Stage
RF INPUT STAGE
The RF input stage is shown in Figure 3. It is followed by a
2-stage limiting amplier to generate the CML (Current Mode
Logic) clock levels needed for the prescaler.
AV
DD
AGND
500500
1.6V
BIAS
GENERATOR
RF
IN
A
RF
IN
B
Figure 3. RF Input Stage
PRESCALER (P/P+1)
The dual-modulus prescaler (P/P+1), along with the A and B
counters, enables the large division ratio, N, to be realized
(N = BP + A). The dual-modulus prescaler, operating at CML
levels, takes the clock from the RF input stage and divides it
down to a manageable frequency for the CMOS A and B counters.
The prescaler is programmable. It can be set in software to 8/9,
16/17, 32/33, or 64/65. It is based on a synchronous 4/5 core.
A AND B COUNTERS
The A and B CMOS counters combine with the dual modulus
prescaler to allow a wide ranging division ratio in the PLL feed-
back counter. The counters are specified to work when the
prescaler output is 200 MHz or less. Thus, with an RF input
frequency of 2.5 GHz, a prescaler value of 16/17 is valid but a
value of 8/9 is not valid.
Pulse Swallow Function
The A and B counters, in conjunction with the dual modulus
prescaler, make it possible to generate output frequencies that
are spaced only by the Reference Frequency divided by R. The
equation for the VCO frequency is as follows:
f
VCO
= [(P × B) + A] × f
REFIN
/R
f
VCO
Output frequency of external voltage controlled oscilla-
tor (VCO).
PPreset modulus of dual modulus prescaler
BPreset Divide Ratio of binary 13-bit counter (3 to 8191).
APreset Divide Ratio of binary 6-bit swallow counter (0 to
63).
f
REFIN
Output frequency of the external reference frequency
oscillator.
RPreset divide ratio of binary 14-bit programmable refer-
ence counter (1 to 16383).
R COUNTER
The 14-bit R counter allows the input reference frequency to be
divided down to produce the reference clock to the phase fre-
quency detector (PFD). Division ratios from 1 to 16,383 are
allowed.
13-BIT B
COUNTER
6-BIT A
COUNTER
PRESCALER
P/P + 1
FROM RF
INPUT STAGE
MODULUS
CONTROL
N = BP + A
LOAD
LOAD
TO PFD
Figure 4. A and B Counters
PHASE FREQUENCY DETECTOR (PFD) AND CHARGE
PUMP
The PFD takes inputs from the R counter and N counter
(N = BP + A) and produces an output proportional to the phase
and frequency difference between them. Figure 5 is a simplied
schematic. The PFD includes a programmable delay element
which controls the width of the antibacklash pulse. This pulse
ensures that there is no dead zone in the PFD transfer function
and minimizes phase noise and reference spurs. Two bits in the
Reference Counter Latch, ABP2 and ABP1 control the width
of the pulse. See Table III.
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–11–
PROGRAMMABLE
DELAY U3
CLR2
Q2D2
U2
CLR1
Q1D1
CHARGE
PUMP
DOWN
UP
HI
HI
U1
ABP1 ABP2
R DIVIDER
N DIVIDER
CP OUTPUT
R DIVIDER
N DIVIDER
CP
CPGND
V
P
Figure 5. PFD Simplified Schematic and Timing
(In Lock)
MUXOUT AND LOCK DETECT
The output multiplexer on the ADF4110 family allows the
user to access various internal points on the chip. The state of
MUXOUT is controlled by M3, M2 and M1 in the function
latch. Table V shows the full truth table. Figure 6 shows the
MUXOUT section in block diagram form.
Lock Detect
MUXOUT can be programmed for two types of lock detect:
digital lock detect and analog lock detect.
Digital lock detect is active high. When LDP in the R counter
latch is set to 0, digital lock detect is set high when the phase
error on three consecutive Phase Detector cycles is less than 15 ns.
With LDP set to 1, five consecutive cycles of less than 15 ns
are required to set the lock detect. It will stay set high until a
phase error of greater than 25 ns is detected on any subsequent
PD cycle.
The N-channel open-drain analog lock detect should be oper-
ated with an external pull-up resistor of 10 k nominal. When
lock has been detected this output will be high with narrow low-
going pulses.
CONTROLMUX
DVDD
MUXOUT
DGND
ANALOG LOCK DETECT
DIGITAL LOCK DETECT
R COUNTER OUTPUT
N COUNTER OUTPUT
SDOUT
Figure 6. MUXOUT Circuit
INPUT SHIFT REGISTER
The ADF4110 family digital section includes a 24-bit input shift
register, a 14-bit R counter and a 19-bit N counter, comprising
a 6-bit A counter and a 13-bit B counter. Data is clocked into
the 24-bit shift register on each rising edge of CLK. The data is
clocked in MSB rst. Data is transferred from the shift register
to one of four latches on the rising edge of LE. The destination
latch is determined by the state of the two control bits (C2, C1)
in the shift register. These are the two LSBs DB1, DB0 as
shown in the timing diagram of Figure 1. The truth table for
these bits is shown in Table VI. Table I shows a summary of
how the latches are programmed.
Table I. C2, C1 Truth Table
Control Bits
C2 C1 Data Latch
0 0 R Counter
0 1 N Counter (A and B)
1 0 Function Latch (Including Prescaler)
1 1 Initialization Latch
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–12–
Table II. ADF4110 Family Latch Summary
N COUNTER LATCH
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3
DB13
B13 B12 B11 B8 B7 B6 B5 B4 B2 B1 A6 A5 A4 A3 A2 A1 C2 (0) C1 (1)B3
13-BIT B COUNTER
CONTROL
BITS
RESERVED
DB2 DB1 DB0
G1 B10 B9
6-BIT A COUNTER
CP GAIN
FUNCTION LATCH
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3DB13
CPI6 CPI5 CPI4 CPI1 TC4 TC3 TC2 TC1 F4 F3 F2 M3 M2 M1 PD1 F1 C2 (1) C1 (0)F5
TIMER COUNTER
CONTROL
CONTROL
BITS
PRESCALER
VALUE
DB2 DB1 DB0
PD2 CPI3 CPI2
POWER-
DOWN 2
MUXOUT
CONTROL
CURRENT
SETTING
1
CURRENT
SETTING
2
FASTLOCK
MODE
FASTLOCK
ENABLE
CP
THREE-
STATE
PD
POLARITY
POWER-
DOWN 1
COUNTER
RESET
P1P2
INITIALIZATION LATCH
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3DB13
CPI6 CPI5 CPI4 CPI1 TC4 TC3 TC2 TC1 F4 F3 F2 M3 M2 M1 PD1 F1 C2 (1) C1 (1)F5
TIMER COUNTER
CONTROL
CONTROL
BITS
PRESCALER
VALUE
DB2 DB1 DB0
PD2 CPI3 CPI2
POWER-
DOWN 2
MUXOUT
CONTROL
CURRENT
SETTING
1
CURRENT
SETTING
2
FASTLOCK
MODE
FASTLOCK
ENABLE
CP
THREE-
STATE
PD
POLARITY
POWER-
DOWN 1
COUNTER
RESET
P1P2
TEST
MODE BITS
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3DB13
LDP T2 T1 R14 R13 R12 R11 R10 R8 R7 R6 R5 R4 R3 R2 R1 C2 (0) C1 (0)R9
14-BIT REFERENCE COUNTER, R
CONTROL
BITS
RESERVED
DB2 DB1 DB0
SYNCDLY ABP2 ABP1
ANTI-
BACKLASH
WIDTH
SYNC
DLY
LOCK
DETECT
PRECISION
REFERENCE COUNTER LATCH
X
XX
X = DON'T CARE
X = DON'T CARE
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–13–
Table III. Reference Counter Latch Map
OPERATION
LDP
THREE CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN
15ns MUST OCCUR BEFORE LOCK DETECT IS SET.
FIVE CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN
15ns MUST OCCUR BEFORE LOCK DETECT IS SET.
0
1
TEST MODE BITS SHOULD
BE SET TO 00 FOR NORMAL
OPERATION
R14
0
0
0
0
1
1
1
1
R13
0
0
0
0
1
1
1
1
R12
0
0
0
0
1
1
1
1
R3
0
0
0
1
1
1
1
1
R2
0
1
1
0
0
0
1
1
R1
1
0
1
0
0
1
0
1
DIVIDE RATIO
1
2
3
4
16380
16381
16382
16383
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
TEST
MODE BITS
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3
DB13
LDP T2 T1 R14 R13 R12 R11 R10 R8 R7 R6 R5 R4 R3 R2 R1 C2 (0) C1 (0)R9
14-BIT REFERENCE COUNTER
CONTROL
BITS
RESERVED
DB2 DB1 DB0
SYNCDLY ABP2 ABP1
ANTI-
BACKLASH
WIDTH
SYNC
DLY
LOCK
DETECT
PRECISION
ABP1ABP2
0
0
1
1
0
1
0
1
3.0ns
1.5ns
6.0ns
3.0ns
ANTIBACKLASH PULSEWIDTH
SYNCDLY
0
0
1
1
0
1
0
1
NORMAL OPERATION
OUTPUT OF PRESCALER IS RESYNCHRONIZED
WITH NONDELAYED VERSION OF RF INPUT
NORMAL OPERATION
OUTPUT OF PRESCALER IS RESYNCHRONIZED
WITH DELAYED VERSION OF RF INPUT
OPERATION
X
X = DON'T
CARE
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–14–
Table IV. AB Counter Latch Map
THESE BITS ARE NOT USED
BY THE DEVICE AND ARE
DON'T CARE BITS
A6
0
0
0
0
1
1
1
1
A5
0
0
0
0
1
1
1
1
A2
0
0
1
1
0
0
1
1
A1
0
1
0
1
0
1
0
1
A COUNTER
DIVIDE RATIO
0
1
2
3
60
61
62
63
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
B13
0
0
0
0
0
1
1
1
1
B12
0
0
0
0
0
1
1
1
1
B11
0
0
0
0
0
1
1
1
1
B3 B2 B1 B COUNTER DIVIDE RATIO••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
••••••••••
0
0
0
0
1
1
1
1
1
0
0
1
1
0
0
0
1
1
0
1
0
1
0
0
1
0
1
NOT ALLOWED
NOT ALLOWED
NOT ALLOWED
3
4
8188
8189
8190
8191
13-BIT B COUNTER
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3DB13
B13 B12 B11 B8 B7 B6 B5 B4 B2 B1 A6 A5 A4 A3 A2 A1 C2 (0) C1 (1)B3
6-BIT A COUNTER
CONTROL
BITS
RESERVED
DB2 DB1 DB0
G1 B10 B9
CP GAIN
*SEE TABLE 5
F4 (FUNCTION LATCH)
FASTLOCK ENABLE* CP GAIN OPERATION
0
0
1
1
0
1
0
1
CHARGE PUMP CURRENT
SETTTING 1 IS PERMANENTLY USED
CHARGE PUMP CURRENT SETTING
2 IS PERMANENTLY USED
CHARGE PUMP CURRENT SETTING
1 IS USED
CHARGE PUMP CURRENT IS SWITCHED
TO SETTING 2. THE TIME SPENT IN
SETTING 2 IS DEPENDENT UPON WHICH
FASTLOCK MODE IS USED. SEE FUNCTION
LATCH DESCRIPTION N = BP + A, P IS PRESCALER VALUE SET IN THE
FUNCTION LATCH B MUST BE GREATER THAN OR
EQUAL TO A. FOR CONTINUOUSLY ADJACENT VALUES
OF (N
X
F
REF
), AT THE OUTPUT, N
MIN
IS (P
2
-P).
X
X = DON'T CARE
X
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–15–
Table V. Function Latch Map
M3
0
0
0
0
1
1
1
1
M2
0
0
1
1
0
0
1
1
M1
0
1
0
1
0
1
0
1
OUTPUT
THREE-STATE OUTPUT
DIGITAL LOCK DETECT
(ACTIVE HIGH)
N DIVIDER OUTPUT
DV
DD
R DIVIDER OUTPUT
ANALOG LOCK DETECT
(N-CHANNEL OPEN-DRAIN)
SERIAL DATA OUTPUT
DGND
F1
0
1
COUNTER
OPERATION
NORMAL
R, A, B COUNTERS
HELD IN RESET
F2
0
1
PHASE DETECTOR
POLARITY
NEGATIVE
POSITIVE
F3
0
1
CHARGE PUMP OUTPUT
NORMAL
THREE-STATE
0
1
1
1
CE PIN
PD2 PD1 MODE
ASYNCHRONOUS POWER-DOWN
NORMAL OPERATION
ASYNCHRONOUS POWER-DOWN
SYNCHRONOUS POWER-DOWN
X
X
0
1
X
0
1
1
F5
X
0
1
FASTLOCK MODE
FASTLOCK DISABLED
FASTLOCK MODE 1
FASTLOCK MODE2
F4
0
1
1
P1
0
1
0
1
PRESCALER VALUE
8/9
16/17
32/33
64/65
P2
0
0
1
1
CPI6
CPI3
CPI5
CPI2
CPI4
CPI1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
I
CP
(mA)
2.7k4.7k10k
1.09
2.18
3.26
4.35
5.44
6.53
7.62
8.70
0.63
1.25
1.88
2.50
3.13
3.75
4.38
5.00
0.29
0.59
0.88
1.76
1.47
1.76
2.06
2.35
CURRENT
SETTTING
2
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3
DB13
CPI6 CPI5 CPI4 CPI1
TC4 TC3 TC2 TC1 F4 F3 F2 M3 M2 M1
PD1
F1
C2(1) C1(0)
F5
CONTROL
BITS
PRESCALER
VALUE
DB2 DB1 DB0
PD2
P1
CPI3 CPI2
POWER-
DOWN 2
CURRENT
SETTTING
1
TIMER COUNTER
CONTROL
FASTLOCK
MODE
FASTLOCK
ENABLE
CP
THREE-STATE
PD
POLARITY
MUXOUT
CONTROL
POWER-
DOWN 1
COUNTER
RESET
P2
TC4
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
TC3
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
TC2
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
TC1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
TIMEOUT
(PFD CYCLES)
3
7
11
15
19
23
27
31
35
39
43
47
51
55
59
63
SEE PAGE 17
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–16–
Table VI. Initialization Latch Map
M3
0
0
0
0
1
1
1
1
M2
0
0
1
1
0
0
1
1
M1
0
1
0
1
0
1
0
1
OUTPUT
THREE-STATE OUTPUT
DIGITAL LOCK DETECT
(ACTIVE HIGH)
N DIVIDER OUTPUT
DV
DD
R DIVIDER OUTPUT
ANALOG LOCK DETECT
(N-CHANNEL OPEN-DRAIN)
SERIAL DATA OUTPUT
DGND
TC4
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
TC3
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
TC2
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
TC1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
TIMEOUT
(PFD CYCLES)
3
7
11
15
19
23
27
31
35
39
43
47
51
55
59
63
F1
0
1
COUNTER
OPERATION
NORMAL
R, A, B
COUNTERS
HELD IN RESET
F2
0
1
PHASE DETECTOR
POLARITY
NEGATIVE
POSITIVE
F3
0
1
CHARGE PUMP
OUTPUT NORMAL
THREE-STATE
0
1
1
1
CE PIN
PD2 PD1
MODE
ASYNCHRONOUS POWER-DOWN
NORMAL OPERATION
ASYNCHRONOUS POWER-DOWN
SYNCHRONOUS POWER-DOWN
X
X
0
1
X
0
1
1
F5
X
0
1
FASTLOCK MODE
FASTLOCK DISABLED
FASTLOCK MODE 1
FASTLOCK MODE2
F4
0
1
1
P1
0
1
0
1
PRESCALER VALUE
8/9
16/17
32/33
64/65
P2
0
0
1
1
CPI6
CPI3
CPI5
CPI2
CPI4
CPI1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
I
CP
(mA)
2.7k4.7k10k
1.09
2.18
3.27
4.35
5.44
6.53
7.62
8.70
0.63
1.25
1.88
2.50
3.13
3.75
4.38
5.00
0.29
0.59
0.88
1.76
1.47
1.76
2.06
2.35
CURRENT
SETTTING
2
DB23
DB22
DB21
DB20 DB19
DB18
DB17 DB16 DB15 DB14
DB12 DB11 DB10
DB9 DB8 DB7 DB6 DB5 DB4 DB3
DB13
CPI6 CPI5 CPI4 CPI1
TC4
TC3 TC2 TC1
F4 F3 F2
M3 M2 M1 PD1
F1
C2 (1) C1 (1)
F5
CONTROL
BITS
PRESCALER
VALUE
DB2 DB1 DB0
PD2P1 CPI3 CPI2
POWER-
DOWN 2
CURRENT
SETTTING
1
TIMER COUNTER
CONTROL
FASTLOCK
MODE
FASTLOCK
ENABLE
CP
THREE-STATE
PD
POLARITY
MUXOUT
CONTROL
POWER-
DOWN 1
COUNTER
RESET
P2
SEE PAGE 17
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–17–
THE FUNCTION LATCH
With C2, C1 set to 1, 0, the on-chip function latch will be pro-
grammed. Table V shows the input data format for programming
the Function Latch.
Counter Reset
DB2 (F1) is the counter reset bit. When this is 1, the R counter
and the A, B counters are reset. For normal operation this bit
should be 0. Upon powering up, the F1 bit needs to be disabled,
the N counter resumes counting in “close” alignment with the R counter.
(The maximum error is one prescaler cycle.)
Power-Down
DB3 (PD1) and DB21 (PD2) on the ADF4110 family, provide
programmable power-down modes. They are enabled by the
CE pin.
When the CE pin is low, the device is immediately disabled
regardless of the states of PD2, PD1.
In the programmed asynchronous power-down, the device pow-
ers down immediately after latching a 1 into bit PD1, with the
condition that PD2 has been loaded with a 0.
In the programmed synchronous power-down, the device power-
down is gated by the charge pump to prevent unwanted frequency
jumps. Once the power-down is enabled by writing a 1 into
bit PD1 (on condition that a 1 has also been loaded to PD2),
the device will go into power-down on the occurrence of the next
charge pump event.
When a power-down is activated (either synchronous or asynchro-
nous mode including CE-pin-activated power-down), the
following events occur:
All active dc current paths are removed.
The R, N, and timeout counters are forced to their load state
conditions.
The charge pump is forced into three-state mode.
The digital clock detect circuitry is reset.
The RF
IN
input is debiased.
The reference input buffer circuitry is disabled.
The input register remains active and capable of loading and
latching data.
MUXOUT Control
The on-chip multiplexer is controlled by M3, M2, M1 on the
ADF4110 family. Table V shows the truth table.
Fastlock Enable Bit
DB9 of the Function Latch is the Fastlock Enable Bit. Only
when this is 1 is Fastlock enabled.
Fastlock Mode Bit
DB10 of the Function Latch is the Fastlock Enable bit. When
Fastlock is enabled, this bit determines which Fastlock Mode is
used. If the Fastlock Mode bit is 0 then Fastlock Mode 1
is selected and if the Fastlock Mode bit is 1, then Fastlock
Mode 2 is selected.
Fastlock Mode 1
The charge pump current is switched to the contents of Current
Setting 2.
The device enters Fastlock by having a 1 written to the CP
Gain bit in the AB counter latch. The device exits Fastlock by
having a 0 written to the CP Gain bit in the AB counter latch.
Fastlock Mode 2
The charge pump current is switched to the contents of Current
Setting 2.
The device enters Fastlock by having a 1 written to the CP
Gain bit in the AB counter latch. The device exits Fastlock under
the control of the Timer Counter. After the timeout period deter-
mined by the value in TC4TC1, the CP Gain bit in the AB
counter latch is automatically reset to 0 and the device reverts
to normal mode instead of Fastlock. See Table V for the time-
out periods.
Timer Counter Control
The user has the option of programming two charge pump cur-
rents. The intent is that the Current Setting 1 is used when the
RF output is stable and the system is in a static state. Current
Setting 2 is meant to be used when the system is dynamic
and in a state of change (i.e., when a new output frequency is
programmed).
The normal sequence of events is as follows:
The user initially decides what the preferred charge pump cur-
rents are going to be. For example, they may choose 2.5 mA as
Current Setting 1 and 5 mA as the Current Setting 2.
At the same time, they must also decide how long they want the
secondary current to stay active before reverting to the primary
current. This is controlled by the Timer Counter Control Bits
DB14 to DB11 (TC4TC1) in the Function Latch. The truth
table is given in Table V.
When the user wishes to program a new output frequency, he
can simply program the AB counter latch with new values for A
and B. At the same time, he can set the CP Gain bit to a 1,
which sets the charge pump with the value in CPI6CPI4 for a
period of time determined by TC4TC1. When this time is up,
the charge pump current reverts to the value set by CPI3 CPI1.
At the same time the CP Gain bit in the A, B Counter latch is
reset to 0 and is now ready for the next time the user wishes
to change the frequency again.
Note that there is an enable feature on the Timer Counter. It is
enabled when Fastlock Mode 2 is chosen by setting the Fastlock
Mode bit (DB10) in the Function Latch to 1.
Charge Pump Currents
CPI3, CPI2, CPI1 program Current Setting 1 for the charge
pump. CPI6, CPI5, CPI4 program Current Setting 2 for the
charge pump. The truth table is given in Table V.
Prescaler Value
P2 and P1 in the Function Latch set the prescaler values. The
prescaler value should be chosen so that the prescaler output
frequency is always less than or equal to 200 MHz. Thus, with
an RF frequency of 2 GHz, a prescaler value of 16/17 is valid
but a value of 8/9 is not.
PD Polarity
This bit sets the Phase Detector Polarity Bit. See Table V.
CP Three-State
This bit controls the CP output pin. With the bit set high, the
CP output is put into three-state. With the bit set low, the CP
output is enabled.
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–18–
THE INITIALIZATION LATCH
When C2, C1 = 1, 1, the Initialization Latch is programmed.
This is essentially the same as the Function Latch (programmed
when C2, C1 = 1, 0).
However, when the Initialization Latch is programmed an addi-
tional internal reset pulse is applied to the R and AB counters.
This pulse ensures that the AB counter is at load point when the
AB counter data is latched and the device will begin counting in
close phase alignment.
If the Latch is programmed for synchronous power-down (CE
pin is High; PD1 bit is High; PD2 bit is Low), the internal pulse
also triggers this power-down. The prescaler reference and the
oscillator input buffer are unaffected by the internal reset pulse and
so close phase alignment is maintained when counting resumes.
When the rst AB counter data is latched after initialization, the
internal reset pulse is again activated. However, successive AB
counter loads after this will not trigger the internal reset pulse.
DEVICE PROGRAMMING AFTER INITIAL POWER-UP
After initially powering up the device, there are three ways to
program the device.
Initialization Latch Method
Apply V
DD
. Program the Initialization Latch (11 in 2 LSBs
of input word). Make sure that F1 bit is programmed to 0.
Then do an R load (00 in 2 LSBs). Then do an AB load (01
in 2 LSBs).
When the Initialization Latch is loaded, the following occurs:
1. The function latch contents are loaded.
2. An internal pulse resets the R, A, B, and timeout counters
to load state conditions and also three-states the charge pump.
Note that the prescaler bandgap reference and the oscillator
input buffer are unaffected by the internal reset pulse, allow-
ing close phase alignment when counting resumes.
3. Latching the rst AB counter data after the initialization word
will activate the same internal reset pulse. Successive AB loads
will not trigger the internal reset pulse unless there is another
initialization.
The CE Pin Method
Apply V
DD
.
Bring CE low to put the device into power-down. This is an
asynchronous power-down in that it happens immediately.
Program the Function Latch (10). Program the R Counter Latch
(00). Program the AB Counter Latch (01).
Bring CE high to take the device out of power-down. The R
and AB counters will now resume counting in close alignment.
Note that after CE goes high, a duration of 1 µs may be required
for the prescaler bandgap voltage and oscillator input buffer bias
to reach steady state.
CE can be used to power the device up and down in order to
check for channel activity. The input register does not need to
be reprogrammed each time the device is disabled and enabled
as long as it has been programmed at least once after V
DD
was
initially applied.
The Counter Reset Method
Apply V
DD
.
Do a Function Latch Load (10 in 2 LSBs). As part of this, load
1 to the F1 bit. This enables the counter reset.
Do an R Counter Load (00 in 2 LSBs) Do an AB Counter
Load (01 in 2 LSBs). Do a Function Latch Load (10 in
2 LSBs). As part of this, load 0 to the F1 bit. This disables
the counter reset.
This sequence provides the same close alignment as the initial-
ization method. It offers direct control over the internal reset.
Note that counter reset holds the counters at load point and three-
states the charge pump, but does not trigger synchronous power-
down. The counter reset method requires an extra function latch
load compared to the initialization latch method.
RESYNCHRONIZING THE PRESCALER OUTPUT
Table III (the Reference Counter Latch Map) shows two bits,
DB22 and DB21 that are labelled DLY and SYNC respectively.
These bits affect the operation of the prescaler.
With SYNC = 1, the prescaler output is resynchronized with
the RF input. This has the effect of reducing jitter due to the
prescaler and can lead to an overall improvement in synthesizer
phase noise performance. Typically, a 1 dB to 2 dB improve-
ment is seen in the ADF4113. The lower bandwidth devices can
show an even greater improvement. For example, the ADF4110
phase noise is typically improved by 3 dB when SYNC is enabled.
With DLY = 1, the prescaler output is resynchronized with a
delayed version of the RF input.
If the SYNC feature is used on the synthesizer, some care must
be taken. At some point, (at certain temperatures and output
frequencies), the delay through the prescaler will coincide with
the active edge on RF input and this will cause the SYNC fea-
ture to break down. So, it is important when using the SYNC
feature to be aware of this. Adding a delay to the RF signal, by
programming DLY = 1, will extend the operating frequency
and temperature somewhat. Using the SYNC feature will also
increase the value of the AI
DD
for the device. With a 900 MHz
output, the ADF4113 AI
DD
increases by about 1.3 mA when
SYNC is enabled and a further 0.3 mA if DLY is enabled.
All the typical performance plots on the data sheet except for
TPC 4 apply for DLY and SYNC = 0, i.e., no resynchroniza-
tion or delay enabled.
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–19–
APPLICATIONS SECTION
Local Oscillator for GSM Base Station Transmitter
The following diagram shows the ADF4111/ADF4112/ADF4113
being used with a VCO to produce the LO for a GSM base station
transmitter.
The reference input signal is applied to the circuit at FREF
IN
and, in this case, is terminated in 50 . Typical GSM system
would have a 13 MHz TCXO driving the Reference Input
without any 50 termination. In order to have a channel
spacing of 200 kHz (the GSM standard), the reference input
must be divided by 65, using the on-chip reference divider
of the ADF4111/ADF4112/ADF4113.
The charge pump output of the ADF4111/ADF4112/ADF4113
(Pin 2) drives the loop filter. In calculating the loop filter com-
ponent values, a number of items need to be considered. In this
example, the loop filter was designed so that the overall phase
margin for the system would be 45 degrees. Other PLL system
specifications are:
V
DD
V
P
AV
DD
DV
DD
ADF4111
ADF4112
ADF4113
V
P
1nF
4.7k
5.6k620pF
3.3k
8.2nF
VCO190-902T
V
CC
C
B
P
18
100pF
100pF
18
18
RF
OUT
71516
2
14
6
5
8
FREF
IN
1000pF 1000pF
51
REF
IN
MUXOUT LOCK
DETECT
51
100pF
349
100pF
CPGND
AGND
DGND
RF
IN
A
RF
IN
B
CE
CLK
DATA
LE
SPI COMPATIBLE SERIAL BUS
DECOUPLING CAPACITORS ON AVDD, DVDD, VP OF THE ADF411X
AND ON THE POSITIVE SUPPLY OF THE VCO190-902T HAVE
BEEN OMITTED FROM THE DIAGRAM TO AID CLARITY.
R
SET
CP
1
Figure 7. Local Oscillator for GSM Base Station
K
D
= 5 mA
K
V
= 12 MHz/V
Loop Bandwidth = 20 kHz
F
REF
= 200 kHz
N = 4500
Extra Reference Spur Attenuation = 10 dB
All of these specifications are needed and used to come up with
the loop filter components values shown in Figure 7.
The loop filter output drives the VCO, which, in turn, is fed
back to the RF input of the PLL synthesizer and also drives
the RF Output terminal. A T-circuit configuration provides
50 matching between the VCO output, the RF output and
the RF
IN
terminal of the synthesizer.
In a PLL system, it is important to know when the system is in
lock. In Figure 7, this is accomplished by using the MUXOUT
signal from the synthesizer. The MUXOUT pin can be pro-
grammed to monitor various internal signals in the synthesizer.
One of these is the LD or lock-detect signal.
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–20–
USING A D/A CONVERTER TO DRIVE R
SET
PIN
You can use a D/A converter to drive the R
SET
pin of the
ADF4110 family and thus increase the level of control over the
charge pump current I
CP
. This can be advantageous in wideband
applications where the sensitivity of the VCO varies over the
tuning range. To compensate for this, the I
CP
may be varied to
maintain good phase margin and ensure loop stability. See
Figure 8.
SHUTDOWN CIRCUIT
The attached circuit in Figure 9 shows how to shut down both
the ADF4110 family and the accompanying VCO. The ADG701
switch goes closed circuit when a Logic 1 is applied to the IN
input. The low-cost switch is available in both SOT-23 and
micro SO packages.
WIDEBAND PLL
Many of the wireless applications for synthesizers and VCOs in
PLLs are narrowband in nature. These applications include
the various wireless standards like GSM, DSC1800, CDMA or
WCDMA. In each of these cases, the total tuning range for the
local oscillator is less than 100 MHz. However, there are also
wide band applications where the local oscillator could have up
to an octave tuning range. For example, cable TV tuners have a
total range of about 400 MHz. Figure 10 shows an applica-
tion where the ADF4113 is used to control and program the
Micronetics M3500-2235. The loop filter was designed for an
RF output of 2900 MHz, a loop bandwidth of 40 kHz, a PFD
frequency of 1 MHz, I
CP
of 10 mA (2.5 mA synthesizer I
CP
multiplied by the gain factor of 4), VCO K
D
of 90 MHz/V (sen-
sitivity of the M3500-2235 at an output of 2900 MHz) and a
phase margin of 45°C.
In narrow-band applications, there is generally a small variation
in output frequency (generally less than 10%) and also a small
variation in VCO sensitivity over the range (typically 10% to 15%).
However, in wide band applications both of these parameters
have a much greater variation. In Figure 10, for example, we have
25% and +17% variation in the RF output from the nominal
2.9 GHz. The sensitivity of the VCO can vary from 120 MHz/V
at 2750 MHz to 75 MHz/V at 3400 MHz (+33%, 17%).
Variations in these parameters will change the loop bandwidth.
This in turn can affect stability and lock time. By changing the
programmable I
CP
, it is possible to get compensation for these
varying loop conditions and ensure that the loop is always operat-
ing close to optimal conditions.
ADF4111
ADF4112
ADF4113
2.7k
VCO
GND
18
100pF
100pF
18
18
RF
OUT
2
6
5
8
FREF
IN
REF
IN
51
100pF
100pF
RF
IN
A
RF
IN
B
POWER SUPPLY CONNECTIONS AND DECOUPLING
CAPACITORS ARE OMITTED FOR CLARITY.
R
SET
CP LOOP
FILTER
CE
CLK
DATA
LE
SPI COMPATIBLE SERIAL BUS
AD5320
12-BIT
V-OUT DAC
MUXOUT LOCK
DETECT
14
INPUT OUTPUT
RSET
1
Figure 8. Driving the R
SET
Pin with a D/A Converter
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–21–
V
DD
V
P
AV
DD
DV
DD
ADF4110
ADF4111
ADF4112
ADF4113
V
P
4.7k
VCO
V
CC
GND
18
100pF
100pF
18
18
RF
OUT
71516
2
1
6
5
8REF
IN
51
100pF
349
100pF
CPGND
AGND
DGND
RF
IN
A
RF
IN
B
DECOUPLING CAPACITORS AND INTERFACE SIGNALS HAVE
BEEN OMITTED FROM THE DIAGRAM TO AID CLARITY.
R
SET
CP
CE
POWER-DOWN CONTROL V
DD
S
IN
DGND
LOOP
FILTER
ADG701
FREF
IN
Figure 9. Local Oscillator Shutdown Circuit
V
DD
V
P
AV
DD
DV
DD
ADF4113
V
P
2.8nF
680
130pF
3.3k
19nF
M3500-2235
V
CC
18
100pF
100pF
18
18
RF
OUT
715 16
2
14
6
5
8
1000pF 1000pF
51
REF
IN
MUXOUT LOCK
DETECT
51
100pF
349
100pF
CPGND
AGND
DGND
RF
IN
A
RF
IN
B
CE
CLK
DATA
LE
SPI-COMPATIBLE SERIAL BUS
DECOUPLING CAPACITORS ON AV
DD
, DV
DD
, V
P
OF THE ADF4113
AND ON VCC OF THE M3500-2250 HAVE BEEN OMITTED FROM
THE DIAGRAM TO AID CLARITY.
R
SET
CP
4.7k
12V
V_TUNE
GND
20V
1k
AD820
3k
OUT
FREF
IN
Figure 10. Wideband Phase Locked Loop
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–22–
RSET
ADF4113
18
100pF
18
REFIN
100pF
RFINARFINB
CP
SERIAL
DIGITAL
NTERFACE
TCXO
OSC 3B1-13M0
100pF
620pF
3.9k
3.3k
9.1nF
4.7k
18
100pF
RFOUT
POWER SUPPLY CONNECTIONS AND DECOUPLING
CAPACITORS ARE OMITTED FROM DIAGRAM FOR CLARITY.
AD9761
TxDAC
REFIO
FS ADJ
MODULATED
DIGITAL
DATA
QOUTB
IOUTA
IOUTB
QOUTA
AD8346
LOIN LOIP
VOUT
100pF 100pF
2k
51
910pF VCO190-1960T
IBBP
IBBN
QBBP
QBBN
LOW-PASS
FILTER
LOW-PASS
FILTER
Figure 11. Direct Conversion Transmitter Solution
DIRECT CONVERSION MODULATOR
In some applications a direct conversion architecture can be used
in base station transmitters. Figure 11 shows the combination
available from ADI to implement this solution.
The circuit diagram shows the AD9761 being used with the
AD8346. The use of dual integrated DACs such as the AD9761
with specified ±0.02 dB and ±0.004 dB gain and offset match-
ing characteristics ensures minimum error contribution (over
temperature) from this portion of the signal chain.
The Local Oscillator (LO) is implemented using the ADF4113.
In this case, the OSC 3B1-13M0 provides the stable 13 MHz
reference frequency. The system is designed for a 200 kHz
channel spacing and an output center frequency of 1960 MHz.
The target application is a WCDMA base station transmitter.
Typical phase noise performance from this LO is 85 dBc/Hz at
a 1 kHz offset.
The LO port of the AD8346 is driven in single-ended fashion.
LOIN is ac-coupled to ground with the 100 pF capacitor and
LOIP is driven through the ac coupling capacitor from a 50
source. An LO drive level of between 6 dBm and 12 dBm is
required. The circuit of Figure 11 gives a typical level of 8 dBm.
The RF output is designed to drive a 50 load but must be
ac-coupled as shown in Figure 11. If the I and Q inputs are
driven in quadrature by 2 V p-p signals, the resulting output
power will be around 10 dBm.
REV. A
ADF4110/ADF4111/ADF4112/ADF4113
–23–
INTERFACING
The ADF4110 family has a simple SPI-compatible serial inter-
face for writing to the device. SCLK, SDATA and LE control
the data transfer. When LE (Latch Enable) goes high, the 24 bits
which have been clocked into the input register on each rising
edge of SCLK will get transferred to the appropriate latch. See
Figure 1 for the Timing Diagram and Table I for the Latch
Truth Table.
The maximum allowable serial clock rate is 20 MHz. This means
that the maximum update rate possible for the device is 833 kHz or
one update every 1.2 microseconds. This is certainly more than
adequate for systems that will have typical lock times in hundreds
of microseconds.
ADuC812 Interface
Figure 12 shows the interface between the ADF4110 family and
the ADuC812 microconverter. Since the ADuC812 is based on
an 8051 core, this interface can be used with any 8051-based
microcontroller. The microconverter is set up for SPI Master
Mode with CPHA = 0. To initiate the operation, the I/O port
driving LE is brought low. Each latch of the ADF4110 family
needs a 24-bit word. This is accomplished by writing three 8-bit
bytes from the microconverter to the device. When the third
byte has been written the LE input should be brought high to
complete the transfer.
On first applying power to the ADF4110 family, it needs three
writes (one each to the R counter latch, the N counter latch and
the initialization latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control power-
down (CE input) and to detect lock (MUXOUT configured as
lock detect and polled by the port input).
When operating in the mode described, the maximum SCLOCK
rate of the ADuC812 is 4 MHz. This means that the maximum
rate at which the output frequency can be changed will be
166 kHz.
SCLOCK
MOSI
I/O PORTS
ADuC812
SCLK
SDATA
LE
CE
MUXOUT
(LOCK DETECT)
ADF4110
ADF4111
ADF4112
ADF4113
Figure 12. ADuC812 to ADF4110 Family Interface
ADSP-2181 Interface
Figure 13 shows the interface between the ADF4110 family and
the ADSP-21xx Digital Signal Processor. The ADF4110 family
needs a 24-bit serial word for each latch write. The easiest way
to accomplish this using the ADSP-21xx family is to use the
Autobuffered Transmit Mode of operation with Alternate
Framing. This provides a means for transmitting an entire
block of serial data before an interrupt is generated.
SCLK
DT
I/O FLAGS
ADSP-21xx
SCLK
SDATA
LE
CE
MUXOUT
(LOCK DETECT)
ADF4110
ADF4111
ADF4112
ADF4113
TFS
Figure 13. ADSP-21xx to ADF4110 Family Interface
Set up the word length for 8 bits and use three memory loca-
tions for each 24-bit word. To program each 24-bit latch, store
the three 8-bit bytes, enable the Autobuffered mode and then
write to the transmit register of the DSP. This last operation
initiates the autobuffer transfer.
PCB DESIGN GUIDELINES FOR CHIP SCALE PACKAGE
The lands on the chip scale package (CP-20), are rectangular.
The printed circuit board pad for these should be 0.1 mm longer
than the package land length and 0.05 mm wider than the pack-
age land width. The land should be centered on the pad. This
will ensure that the solder joint size is maximized.
The bottom of the chip scale package has a central thermal pad.
The thermal pad on the printed circuit board should be at least
as large as this exposed pad. On the printed circuit board, there
should be a clearance of at least 0.25 mm between the thermal
pad and the inner edges of the pad pattern. This will ensure that
shorting is avoided.
Thermal vias may be used on the printed circuit board thermal
pad to improve thermal performance of the package. If vias are
used, they should be incorporated in the thermal pad at 1.2 mm
pitch grid. The via diameter should be between 0.3 mm and
0.33 mm and the via barrel should be plated with 1 oz. copper
to plug the via.
The user should connect the printed circuit board thermal pad
to AGND.
REV. A
–24–
C00391a–3–1/01 (rev. A)
PRINTED IN U.S.A.
ADF4110/ADF4111/ADF4112/ADF4113
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
Chip Scale
(CP-20)
1
20
5
6
11
16
15
BOTTOM
VIEW
10
0.096 (2.45)
0.091 (2.30) SQ
0.085 (2.15)
0.024 (0.60)
0.017 (0.42)
0.009 (0.24)
0.024 (0.60)
0.017 (0.42)
0.009 (0.24)
0.030 (0.75)
0.022 (0.55)
0.014 (0.35)
0.012 (0.30)
0.009 (0.23)
0.007 (0.18)
0.020 (0.50)
BSC
12MAX
0.039 (1.00) MAX
0.033 (0.85) NOM
0.008 (0.20)
REF
0.031 (0.80) MAX
0.026 (0.65) NOM
0.002 (0.05)
0.0004 (0.01)
0.0 (0.0)
PIN 1
INDICATOR
TOP
VIEW
0.148 (3.75)
BSC SQ
0.157 (4.0)
BSC SQ
CONTROLLING DIMENSIONS ARE IN MILLIMETERS
Thin Shrink Small Outline
(RU-16)
16 9
81
0.256 (6.50)
0.246 (6.25)
0.177 (4.50)
0.169 (4.30)
PIN 1
0.201 (5.10)
0.193 (4.90)
SEATING
PLANE
0.006 (0.15)
0.002 (0.05)
0.0118 (0.30)
0.0075 (0.19)
0.0256 (0.65)
BSC
0.0433 (1.10)
MAX
0.0079 (0.20)
0.0035 (0.090)
0.028 (0.70)
0.020 (0.50)
8
0
ADF4110/ADF4111/ADF4112/ADF4113Revision History
Location Page
Changed Data Sheet from REV. 0 to REV. A.
Changes to DC Specifications in B Version, B Chips, Unit and Test Conditions/Comments columns . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Changes to Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Change to RF
IN
A Function text . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Changes to Figure 8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
New graph addedTPC 22 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Change to PD Polarity Box in Table V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Change to PD Polarity Box in Table VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Change to PD Polarity paragraph . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Addition of new material (PCB Design Guidelines for Chip-Scale Package) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Replacement of CP-20 Outline with CP-20 [2] outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24