CY62148E MoBL(R) 4-Mbit (512 K x 8) Static RAM Features Functional Description Very high speed: 45 ns The CY62148E is a high performance CMOS static RAM organized as 512 K words by 8-bits. This device features advanced circuit design to provide ultra low active current. This is ideal for providing More Battery LifeTM (MoBL) in portable applications such as cellular telephones. The device also has an automatic power-down feature that significantly reduces power consumption when addresses are not toggling. Placing the device into standby mode reduces power consumption by more than 99% when deselected (CE HIGH). The eight input and output pins (I/O0 through I/O7) are placed in a high impedance state when the device is deselected (CE HIGH), Outputs are disabled (OE HIGH), or during an active Write operation (CE LOW and WE LOW) Voltage range: 4.5 V to 5.5 V Pin compatible with CY62148B Ultra low standby power Typical standby current: 1 A Maximum standby current: 7 A (Industrial) Ultra low active power Typical active current: 2.0 mA at f = 1 MHz Easy memory expansion with CE, and OE features Automatic power-down when deselected Complementary metal oxide semiconductor (CMOS) for optimum speed and power Available in Pb-free 32-pin thin small outline package (TSOP) II and 32-pin small-outline integrated circuit (SOIC)[1] packages To write to the device, take Chip Enable (CE) and Write Enable (WE) inputs LOW. Data on the eight I/O pins (I/O0 through I/O7) is then written into the location specified on the address pins (A0 through A18). To read from the device, take Chip Enable (CE) and Output Enable (OE) LOW while forcing Write Enable (WE) HIGH. Under these conditions, the contents of the memory location specified by the address pins appear on the I/O pins. Logic Block Diagram I/O00 IO INPUT BUFFER I/O1 IO 1 I/O2 IO 2 SENSE AMPS ROW DECODER 512K x 8 ARRAY I/O3 IO 3 I/O4 IO 4 I/O5 IO 5 I/O6 IO 6 CE I/O IO77 POWER DOWN A17 A18 A13 A14 OE A15 COLUMN DECODER WE A16 A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 Note 1. SOIC package is available only in 55 ns speed bin. Cypress Semiconductor Corporation Document #: 38-05442 Rev. *J * 198 Champion Court * San Jose, CA 95134-1709 * 408-943-2600 Revised July 14, 2011 CY62148E MoBL(R) Contents Pin Configuration ............................................................. 3 Product Portfolio .............................................................. 3 Maximum Ratings ............................................................. 4 Operating Range ............................................................... 4 Capacitance ...................................................................... 4 Thermal Resistance .......................................................... 5 Data Retention Characteristics ....................................... 6 Switching Characteristics ................................................ 7 Switching Waveforms ...................................................... 8 Truth Table ........................................................................ 9 Ordering Information ...................................................... 10 Document #: 38-05442 Rev. *J Ordering Code Definitions ......................................... 10 Package Diagrams .......................................................... 11 Acronyms ........................................................................ 13 Document Conventions ................................................. 13 Units of Measure ....................................................... 13 Document History Page ................................................. 14 Sales, Solutions, and Legal Information ...................... 16 Worldwide Sales and Design Support ....................... 16 Products .................................................................... 16 PSoC Solutions ......................................................... 16 Page 2 of 16 CY62148E MoBL(R) Pin Configuration Figure 1. 32-pin SOIC/TSOP II Pinout Top View A17 A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 I/O1 I/O2 VSS 1 32 31 2 3 4 30 29 5 6 28 27 26 25 7 8 9 10 24 23 22 11 12 13 14 15 16 21 20 19 18 17 VCC A15 A18 WE A13 A8 A9 A11 OE A10 CE I/O7 I/O6 I/O5 I/O4 I/O3 Product Portfolio Power Dissipation VCC Range (V) Product CY62148ELL TSOP II CY62148ELL SOIC Speed (ns) Range Min Typ[2] Max Industrial 4.5 5.0 5.5 Industrial / Automotive-A 4.5 5.0 5.5 Operating ICC (mA) f = 1 MHz f = fmax Standby ISB2 (A) Typ[2] Max Typ[2] Max Typ[2] Max 45 2 2.5 15 20 1 7 55 2 2.5 15 20 1 7 Note 2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 C. Document #: 38-05442 Rev. *J Page 3 of 16 CY62148E MoBL(R) Maximum Ratings Exceeding maximum ratings may shorten the useful life of the device. User guidelines are not tested. Storage temperature ............................... -65 C to + 150 C Output current into outputs (LOW) .............................. 20 mA Static discharge voltage........................................... > 2001 V (per MIL-STD-883, Method 3015) Latch-up current ......................................................> 200 mA Ambient temperature with power applied .......................................... -55 C to + 125 C Operating Range Supply voltage to ground potential.................. -0.5 V to 6.0 V (VCCmax + 0.5 V) Device DC voltage applied to outputs in high Z state [3, 4] .............. -0.5 V to 6.0 V (VCCmax + 0.5 V) Range CY62148E Ambient Temperature VCC[5] Industrial / -40 C to +85 C 4.5 V to 5.5 V Automotive-A DC input voltage [3, 4] .......... -0.5 V to 6.0 V (VCCmax + 0.5 V) Electrical Characteristics Over the operating range Parameter Description Test Conditions 55 ns [6] 45 ns Unit Min Typ[7] Max Min Typ[7] Max 2.4 - - 2.4 - - V VOL Output HIGH voltage IOH = -1 mA Output LOW voltage IOL = 2.1 mA - - 0.4 - - 0.4 V VIH Input HIGH voltage VCC = 4.5 V to 5.5 V 2.2 - VCC + 0.5 2.2 - VCC + 0.5 V VIL Input LOW voltage VCC = 4.5 V to 5.5 V For TSOPII package -0.5 - 0.8 - - - V - - - -0.5 - 0.6[8] VOH For SOIC package IIX Input leakage current GND < VI < VCC -1 - +1 -1 - +1 A IOZ Output leakage current -1 - +1 -1 - +1 A ICC VCC operating supply f = fmax = 1/tRC current f = 1 MHz VCC = VCC(max), IOUT = 0 mA CMOS levels - 15 20 - 15 20 mA - 2 2.5 - 2 2.5 CE > VCC - 0.2 V, VIN > VCC - 0.2 V or VIN < 0.2 V, f = 0, VCC = VCC(max) - 1 7 - 1 7 ISB2 [9] Automatic CE power-down current -- CMOS inputs GND < VO < VCC, output disabled A Capacitance Parameter[10] Description CIN Input capacitance COUT Output capacitance Test Conditions TA = 25 C, f = 1 MHz, VCC = VCC(Typ) Max Unit 10 pF 10 pF Notes 3. VIL(min) = -2.0 V for pulse durations less than 20 ns for I < 30 mA. 4. VIH(max) = VCC + 0.75 V for pulse durations less than 20 ns. 5. Full device AC operation assumes a minimum of 100 s ramp time from 0 to VCC(min) and 200 s wait time after VCC stabilization. 6. SOIC package is available only in 55 ns speed bin. 7. Typical values are included for reference and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 C. 8. Under DC conditions the device meets a VIL of 0.8 V. However, in dynamic conditions Input LOW Voltage applied to the device must not be higher than 0.6 V. This is applicable to SOIC package only. Refer to AN13470 for details. 9. Chip enable (CE) must be HIGH at CMOS level to meet the ISB2 / ICCDR spec. Other inputs can be left floating. 10. Tested initially and after any design or process changes that may affect these parameters. Document #: 38-05442 Rev. *J Page 4 of 16 CY62148E MoBL(R) Thermal Resistance Parameter [11] Description JA Thermal resistance (junction to ambient) JC Thermal resistance (junction to case) Test Conditions 32-pin SOIC Package 32-pin TSOP II Package Unit 75 77 C/W 10 13 C/W Still air, soldered on a 3 x 4.5 inch, two-layer printed circuit board Figure 2. AC Test Loads and Waveforms R1 VCC OUTPUT ALL INPUT PULSES 3.0 V 30 pF INCLUDING JIG AND SCOPE 90% 10% R2 GND Rise Time = 1 V/ns Equivalent to: 90% 10% Fall Time = 1 V/ns THEVENIN EQUIVALENT OUTPUT RTH V Parameter [11] 5.0 V Unit R1 1800 R2 990 RTH 639 VTH 1.77 V Note 11. Tested initially and after any design or process changes that may affect these parameters. Document #: 38-05442 Rev. *J Page 5 of 16 CY62148E MoBL(R) Data Retention Characteristics Over the operating range Parameter Description Min Typ[12] Max Unit 2 - - V - 1 7 A 0 - - ns TSOP II 45 - - ns SOIC 55 - - ns Conditions VDR VCC for data retention ICCDR[13] Data retention current tCDR Chip deselect to data retention time tR[14] Operation recovery time VCC = VDR, CE > VCC - 0.2 V, VIN > VCC - 0.2 V or VIN < 0.2 V Industrial / Automotive-A Figure 3. Data Retention Waveform DATA RETENTION MODE VCC VCC(min) tCDR VDR > 2.0 V VCC(min) tR CE Notes 12. Typical values are included for reference and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 C. 13. Chip enable (CE) must be HIGH at CMOS level to meet the ISB2 / ICCDR spec. Other inputs can be left floating. 14. Full device operation requires linear VCC ramp from VDR to VCC(min) > 100 s or stable at VCC(min) > 100 s. Document #: 38-05442 Rev. *J Page 6 of 16 CY62148E MoBL(R) Switching Characteristics Over the operating range Parameter [15] Description 55 ns[16] 45 ns Min Max Min Max Unit Read Cycle tRC Read cycle time 45 - 55 - ns tAA Address to data valid - 45 - 55 ns tOHA Data hold from address change 10 - 10 - ns tACE CE LOW to data valid - 45 - 55 ns tDOE OE LOW to data valid - 22 - 25 ns 5 - 5 - ns [17] tLZOE OE LOW to low Z tHZOE OE HIGH to high Z [17, 18] - 18 - 20 ns tLZCE CE LOW to low Z [17] 10 - 10 - ns tHZCE CE HIGH to high Z [17, 18] - 18 - 20 ns tPU CE LOW to power-up 0 - 0 - ns CE HIGH to power-down - 45 - 55 ns tWC Write cycle time 45 - 55 - ns tSCE CE LOW to write end 35 - 40 - ns tAW Address setup to write end 35 - 40 - ns tHA Address hold from write end 0 - 0 - ns tSA Address setup to write start 0 - 0 - ns tPWE WE pulse width 35 - 40 - ns tSD Data setup to write end 25 - 25 - ns tHD Data hold from write end 0 - 0 - ns tHZWE WE LOW to high Z [17, 18] - 18 - 20 ns 10 - 10 - ns tPD Write tLZWE Cycle[19] WE HIGH to low Z [17] Notes 15. Test conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3 V, and output loading of the specified IOL/IOH as shown in the AC Test Loads and Waveforms on page 5. 16. SOIC package is available only in 55 ns speed bin. 17. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device. 18. tHZOE, tHZCE, and tHZWE transitions are measured when the outputs enter a high impedance state. 19. The internal wre.ite time of the memory is defined by the overlap of WE, CE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing should be referenced to the edge of the signal that terminates the write. Document #: 38-05442 Rev. *J Page 7 of 16 CY62148E MoBL(R) Switching Waveforms Figure 4. Read Cycle No. 1 (Address Transition Controlled) [20, 21] tRC RC ADDRESS tOHA DATA OUT tAA PREVIOUS DATA VALID DATA VALID Figure 5. Read Cycle No. 2 (OE Controlled) [21, 22] ADDRESS tRC CE tACE OE tHZOE tDOE tHZCE tLZOE HIGH IMPEDANCE DATA OUT DATA VALID tLZCE tPD tPU VCC SUPPLY CURRENT HIGH IMPEDANCE 50% 50% ICC ISB Figure 6. Write Cycle No. 1 (WE Controlled, OE HIGH During Write) [23, 24] tWC ADDRESS tSCE CE tAW tSA tHA tPWE WE OE tSD DATA I/O NOTE 25 tHD DATA VALID tHZOE Notes 20. Device is continuously selected. OE, CE = VIL. 21. WE is HIGH for read cycles. 22. Address valid before or similar to CE transition LOW. 23. Data I/O is high impedance if OE = VIH. 24. If CE goes HIGH simultaneously with WE HIGH, the output remains in high impedance state. 25. During this period, the I/Os are in output state and input signals must not be applied. Document #: 38-05442 Rev. *J Page 8 of 16 CY62148E MoBL(R) Figure 7. Write Cycle No. 2 (CE Controlled) [26, 27] tWC ADDRESS tSCE CE tSA tAW tHA tPWE WE tSD DATA I/O tHD DATA VALID Figure 8. Write Cycle No. 3 (WE Controlled, OE LOW) [27] tWC ADDRESS tSCE CE tAW tSA tHA tPWE WE tSD NOTE 28 DATA I/O tHD DATA VALID tLZWE tHZWE Truth Table CE WE OE H[29] X X High Z I/O Deselect/power-down Mode Standby (ISB) Power L H L Data out Read Active (ICC) L L X Data in Write Active (ICC) L H H High Z Selected, outputs disabled Active (ICC) Notes 26. Data I/O is high impedance if OE = VIH. 27. If CE goes HIGH simultaneously with WE HIGH, the output remains in high impedance state. 28. During this period, the I/Os are in output state and input signals must not be applied. 29. Chip enable (CE) must be HIGH at CMOS level to meet the ISB2 / ICCDR spec. Other inputs can be left floating. Document #: 38-05442 Rev. *J Page 9 of 16 CY62148E MoBL(R) Ordering Information Table 1 lists the CY62148E MoBL(R) key package features and ordering codes. The table contains only the parts that are currently available. If you do not see what you are looking for, contact your local sales representative. For more information, visit the Cypress website at www.cypress.com and refer to the product summary page at http://www.cypress.com/products. Table 1. Key features and Ordering Information Speed (ns) 45 55 Ordering Code Package Diagram Package Type Operating Range CY62148ELL-45ZSXI 51-85095 32-pin TSOP II (Pb-free) Industrial CY62148ELL-45ZSXA 51-85095 32-pin TSOP II (Pb-free) Automotive-A CY62148ELL-55SXI 51-85081 32-pin SOIC (Pb-free) Industrial CY62148ELL-55SXA 51-85081 32-pin SOIC (Pb-free) Automotive-A Contact your local Cypress sales representative for availability of these parts. Ordering Code Definitions CY 621 4 8 E LL - XX XX X X Temperature Grade: X = I or A I = Industrial; A = Automotive-A Pb-free Package Type: XX = ZS or S ZS= 32-pin TSOP II S = 32-pin SOIC Speed Grade: XX = 45 ns or 55 ns LL = Low Power E = Process Technology 90 nm Bus width = x 8 Density = 4-Mbit Family Code: MoBL SRAM family Company ID: CY = Cypress Document #: 38-05442 Rev. *J Page 10 of 16 CY62148E MoBL(R) Package Diagrams Figure 9. 32-pin TSOP II, 51-85095 51-85095 *B Document #: 38-05442 Rev. *J Page 11 of 16 CY62148E MoBL(R) Figure 10. 32-pin (450-Mil) Molded SOIC, 51-85081 51-85081-*C Document #: 38-05442 Rev. *J Page 12 of 16 CY62148E MoBL(R) Acronyms Document Conventions Acronym Description CMOS complementary metal oxide semiconductor I/O input/output OE output enable MoBL more battery life SOIC small-outline integrated circuit SRAM static random access memory TSOP thin small outline package WE write enable Document #: 38-05442 Rev. *J Units of Measure Symbol Unit of Measure ns nano seconds V Volts MHz Mega Hertz A micro Amperes mA milli Amperes pF pico Farads ohms C degree Celsius W Watts % percent Page 13 of 16 CY62148E MoBL(R) Document History Page Document Title: CY62148E MoBL(R), 4-Mbit (512 K x 8) Static RAM Document Number: 38-05442 Revision ECN Orig. of Change Submission Date ** 201580 AJU 01/08/04 New datasheet *A 249276 SYT See ECN Changed from Advance Information to Preliminary Moved Product Portfolio to Page 2 Added RTSOP II and Removed FBGA Package Changed VCC stabilization time in footnote #7 from 100 s to 200 s Changed ICCDR from 2.0 A to 2.5 A Changed typo in Data Retention Characteristics(tR) from 100 s to tRC ns Changed tOHA from 6 ns to 10 ns for both 35 ns and 45 ns Speed Bin Changed tHZOE, tHZWE from 12 to 15 ns for 35 ns Speed Bin and 15 to 18 ns for 45 ns Speed Bin Changed tSCE from 25 to 30 ns for 35 ns Speed Bin and 40 to 35 ns for 45 ns Speed Bin Changed tHZCE from 12 to18 ns for 35 ns Speed Bin and 15 to 22 ns for 45 ns Speed Bin Changed tSD from 15 to 18 ns for 35 ns Speed Bin and 20 to 22 ns for 45 ns Speed Bin Changed tDOE from 15 to 18 ns for 35 ns Speed Bin Corrected typo in Package Name Changed Ordering Information to include Pb-free Packages *B 414820 ZSD See ECN Changed from Preliminary to Final Changed the address of Cypress Semiconductor Corporation on Page #1 from "3901 North First Street" to "198 Champion Court" Removed 35ns Speed Bin Removed "L" version of CY62148E Changed ICC (Typ) value from 1.5 mA to 2 mA at f=1 MHz Changed ICC (Max) value from 2 mA to 2.5 mA at f=1 MHz Changed ICC (Typ) value from 12 mA to 15 mA at f=fmax Removed ISB1 spec from the Electrical characteristics table Changed ISB2 Typ values from 0.7 A to 1 A and Max values from 2.5 A to 7 A Modified footnote #4 to include current limit Removed redundant footnote on DNU pins Changed the AC testload capacitance from 100 pF to 30 pF on page #4 Changed test load parameters R1, R2, RTH and VTH from 1838 , 994 , 645 and 1.75 V to 1800 , 990 , 639 and 1.77 V Changed ICCDR from 2.5 A to 7 A Added ICCDR typical value Changed tLZOE from 3 ns to 5 ns Changed tLZCE and tLZWE from 6 ns to 10 ns Changed tHZCE from 22 ns to 18 ns Changed tPWE from 30 ns to 35 ns Changed tSD from 22 ns to 25 ns Updated the ordering information table and replaced Package Name column with Package Diagram *C 464503 NXR See ECN Included Automotive Range in product offering Updated the Ordering Information *D 485639 VKN See ECN Corrected the operating range to 4.5 V - 5.5 V on page# 3 *E 833080 VKN See ECN Added footnote #8 Added VILspec for SOIC package. Document #: 38-05442 Rev. *J Description of Change Page 14 of 16 CY62148E MoBL(R) Document History Page (continued) Document Title: CY62148E MoBL(R), 4-Mbit (512 K x 8) Static RAM Document Number: 38-05442 Revision ECN Orig. of Change Submission Date *F 890962 VKN See ECN *G 2947039 VKN 06/10/2010 *H 3006318 AJU 08/23/10 *I 3235744 RAME 04/20/2011 Updated Functional Description (Removed the line "For best practice recommendations, refer to the Cypress application note AN1064, SRAM System Guidelines"). Updated Package Diagrams. *J 3302815 RAME 07/14/2011 Updated as per latest template and updated table of contents. Document #: 38-05442 Rev. *J Description of Change Added Automotive-A part and its related information Removed Automotive-E part and its related information Added footnote #2 related to SOIC package Added footnote #9 related to ISB2 Added AC values for 55 ns Industrial-SOIC range Updated Ordering Information table Added "CY62148ELL-45ZSXA" part in Ordering information. Added footnote related to chip enable in Truth Table Updated Package Diagrams Added Contents, PSoC Solutions, and Sales, Solutions, and Legal Information. Template update. Updated table of contents. Added acronyms, units of measure and ordering code definitions. Added reference to note 12 to parameter ICCDR on page 5. Page 15 of 16 CY62148E MoBL(R) Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer's representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. Products Automotive Clocks & Buffers Interface Lighting & Power Control PSoC Solutions cypress.com/go/automotive cypress.com/go/clocks psoc.cypress.com/solutions cypress.com/go/interface PSoC 1 | PSoC 3 | PSoC 5 cypress.com/go/powerpsoc cypress.com/go/plc Memory Optical & Image Sensing PSoC Touch Sensing USB Controllers Wireless/RF cypress.com/go/memory cypress.com/go/image cypress.com/go/psoc cypress.com/go/touch cypress.com/go/USB cypress.com/go/wireless (c) Cypress Semiconductor Corporation, 2004-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress' product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document #: 38-05442 Rev. *J Revised July 14, 2011 Page 16 of 16 More Battery Life is a trademark and MoBL is a registered trademark of Cypress Semiconductor Corporation. All products and company names mentioned in this document may be the trademarks of their respective holders.