10
SEMICONDUCTOR
TECHNICAL DATA
ISO 9141
SERIAL LINK DRIVER
Order this document by MC33199/D
D SUFFIX
PLASTIC PACKAGE
CASE 751A
(SO–14)
14
1
Device Operating
Temperature Range Package
ORDERING INFORMATION
MC33199D TA = – 40° to +125°C SO–14
PIN CONNECTIONS
114
13
12
11
9
8
2
3
4
5
6
7
(Top View)
VCC
REF–IN–L
REF–IN–K
TXD
NC
REF–OUT
LO
RXD
VS
L
I1
Gnd
DIA
NC
1
MOTOROLA ANALOG IC DEVICE DATA
The MC33199D is a serial interface circuit used in diagnostic
applications. It is the interface between the microcontroller and the special
K and L Lines of the ISO diagnostic port. The MC33199D has been
designed to meet the “Diagnosis System ISO 9141” specification.
The device has a bi–directional bus K Line driver, fully protected against
short circuits and over temperature. It also includes the L Line receiver,
used during the wake up sequence in the ISO transmission.
The MC33199 has a unique feature which allows transmission baud rate
up to 200 k baud.
•Electrically Compatible with Specification “Diagnosis System ISO 9141”
•Transmission Speed Up to 200 k Baud
•Internal Voltage Reference Generator for Line Comparator Thresholds
•TXD, RXD and LO Pins are 5.0 V CMOS Compatible
•High Current Capability of DIA Pin (K Line)
•Short Circuit Protection for the K Line Input
•Over Temperature Shutdown with Hysteresis
•Large Operating Range of Driver Supply Voltage
•Full Operating Temperature Range
•ESD Protected Pins
+
–
+
–
C2
Thermal
Shutdown
Simplified Application
REF–OUT
LO
REF–IN–L
REF–IN–K
RXD
TXD
VCC
L
I1
DIA
Gnd
VS
I1
Source
Reference
Generator Protection
Current
Limit
VCC
Driver
C1
This device contains 94 active transistors.
Motorola, Inc. 1996 Rev 0
MC33199
2 MOTOROLA ANALOG IC DEVICE DATA
MAXIMUM RATINGS (Note 1)
Rating Symbol Value Unit
VS Supply Pin
DC Voltage Range
T ransient Pulse (Note 2) VS
Vpulse –0.5 to +40
–2.0 to +40
V
VCC Supply DC Voltage Range VCC –0.3 to +6.0 V
DIA and L Pins (Note 2)
DC Voltage Range
T ransient Pulse (Clamped by Internal Diode)
DC Source Current
DIA Low Level Sink Current
––0.5 to +40
–2.0
–50
Int. Limit
V
V
mA
mA
TXD DC Voltage Range – –0.3 to
VCC + 0.3 V
REF–IN DC Voltage Range
VS < VCC
VS > VCC
––0.3 to VCC
–0.3 to VS
V
ESD V oltage Capability (Note 3) V(ESD) ±2000 V
NOTES: 1.The device is compatible with Specification: “Diagnosis System ISO 9141”.
2.See the test circuit (Figure 23). T ransient test pulse according to ISO 76371 and DIN 40839;
highest test levels.
3.Human Body Model; C = 100 pF, R = 1500 Ω.
THERMAL RATINGS
Rating Symbol Value Unit
Storage Temperature Tstg –55 to +150 °C
Operating Junction Temperature TJ–40 to +150 °C
Thermal Resistance, Junction–to–Ambient RθJA 180 °C/W
Maximum Power Dissipation (@ TA = 105°C) PD250 mW
ELECTRICAL CHARACTERISTICS (– 40°C ≤ TA ≤ 125°C, 4.5 V ≤ VCC ≤ 5.5 V, 4.5 V ≤ VS ≤ 20 V, unless otherwise
noted. Typical values reflect approximate mean at 25°C, nominal VCC and VS, at time of device characterization.)
Characteristic Symbol Min Typ Max Unit
VCC PIN 1
VCC Supply Voltage Range VCC 4.5 – 5.5 V
VCC Supply Current (Note 1) ICC 0.5 1.0 1.5 mA
REF–IN–L PIN 2 AND REF–IN–K PIN 3
REF–IN–L and REF–IN–K Input Voltage Range
For 0 < VS < VCC
For VCC < VS < 40 V
Vinref 2.0
2.0 –
–VCC – 2.0 V
VS – 1.0 V
V
REF–IN–L and REF–IN–K Inputs Currents IVIN –5.0 – 5.0 µA
LO PIN 4
LO Open Collector Output
Low Level Voltage @ Iout = 1.0 mA
Low Level Voltage @ Iout = 4.0 mA
VOL –
–0.34
–0.7
0.8
V
RXD PIN 5
Pull–Up Resistor to VCC RRXD 1.5 2.0 2.5 kΩ
Low Level Voltage @ Iout = 1.0 mA VOL –0.3 0.7 V
NOTES: 1.Measured with TXD = VCC, I1 = VS, DIA and L high, no load. REF–IN–L and REF–IN–K connected to REF–OUT.
2.0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VDIA < 20 V, TXD high or floating.
3.When an over temperature is detected, the DIA output is forced “off”.
4.0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VL < 20 V.
5.At static “High” or “Low” level TXD, the current source I1 delivers a current of 3.0 mA (typ). Only during “Low” to “High” transition, does this current
increase to a higher value in order to charge the K Line capacitor (CL < 4.0 nF) in a short time (see Figure 3).
6.Measured with TXD = VCC, I1 = VS, DIA and L high, no load, REF–IN–L and REF–IN–K connected to REF–OUT.
MC33199
3
MOTOROLA ANALOG IC DEVICE DATA
ELECTRICAL CHARACTERISTICS (continued) (– 40°C ≤ TA ≤ 125°C, 4.5 V ≤ VCC ≤ 5.5 V, 4.5 V ≤ VS ≤ 20 V, unless otherwise
noted. Typical values reflect approximate mean at 25°C, nominal VCC and VS, at time of device characterization.)
Characteristic UnitMaxTypMinSymbol
TXD PIN 6
High Level Input Voltage VIH 0.7 VCC 2.8 – V
Low Level Input Voltage VIL –2.0 0.3 VCC V
Input Current @ 0 < VS < 40 V
TXD at High Level
TXD at Low Level IH
IL–200
–600 –
–30
–100
µA
DIA INPUT/OUTPUT PIN 9
Low Level Output Voltage @ I = 30 mA VOL 00.35 0.8 V
Drive Current Limit ILim 40 – 120 mA
High Level Input Threshold Voltage
(REF–IN–K Connected to REF–OUT) VIH Vref min
+ 0.25 V Vref
+ 0.325 V Vref max
+ 0.4 V V
Low Level Input Threshold Voltage
(REF–IN–K Connected to REF–OUT) VIL Vref min
– 0.2 V Vref
– 0.125 V Vref max
– 0.05 V V
Input Hysteresis VHyst 300 450 600 mV
Positive Clamp @ 5.0 mA VCl+ 37 40 44 V
Negative Clamp @ – 5.0 mA VCl– –1.5 –0.6 –0.3 V
Leakage Current (Note 2) ILeak 4.0 10 16 µA
Over Temperature Shutdown (Note 3) TLim 155 – – °C
L INPUT PIN 12
High Level Input Threshold Voltage
(REF–IN–L Connected to REF–OUT) VIH Vref min
+ 0.25 V Vref
+ 0.325 V Vref max
+ 0.4 V V
Low Level Input Threshold Voltage
(REF–IN–L Connected to REF–OUT) VIL Vref min
– 0.2 V Vref
– 0.125 V Vref max
– 0.05 V V
Input Hysteresis VHyst 300 450 600 mV
Leakage Current (Note 4) ILeak 4.0 10 16 µA
Positive Clamp @ 5.0 mA VCl+ 37 40 44 V
Negative Clamp @ – 5.0 mA VCl– –1.5 –0.6 –0.3 V
I1 PIN 11
Static Source Current I1s–4.0 –3.0 –2.0 mA
Static Saturation Voltage (I1s = – 2.0 mA) VI1(sat) VS – 1.2 VS – 0.8 VSV
Dynamic Source Current (Note 5) I1d–120 –80 –40 mA
Dynamic Saturation Voltage (II1(sat) = – 40 mA) VI1(dsat) VS – 2.7 VS – 0.85 VSV
VS PIN 13
VS Supply Voltage Range VS4.5 – 20 V
VS Supply Current (Note 6) IS0.5 1.3 2.0 mA
NOTES: 1.Measured with TXD = VCC, I1 = VS, DIA and L high, no load. REF–IN–L and REF–IN–K connected to REF–OUT.
2.0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VDIA < 20 V, TXD high or floating.
3.When an over temperature is detected, the DIA output is forced “off”.
4.0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VL < 20 V.
5.At static “High” or “Low” level TXD, the current source I1 delivers a current of 3.0 mA (typ). Only during “Low” to “High” transition, does this current
increase to a higher value in order to charge the K Line capacitor (CL < 4.0 nF) in a short time (see Figure 3).
6.Measured with TXD = VCC, I1 = VS, DIA and L high, no load, REF–IN–L and REF–IN–K connected to REF–OUT.
MC33199
4 MOTOROLA ANALOG IC DEVICE DATA
ELECTRICAL CHARACTERISTICS (continued) (– 40°C ≤ TA ≤ 125°C, 4.5 V ≤ VCC ≤ 5.5 V, 4.5 V ≤ VS ≤ 20 V, unless otherwise
noted. Typical values reflect approximate mean at 25°C, nominal VCC and VS, at time of device characterization.)
Characteristic UnitMaxTypMinSymbol
REF–OUT PIN 14
Output Voltage
3.0 < VS < 5.6 V and IRO = ±10 µA
5.6 < VS < 18 V and IRO = ±10 µA
18 < VS < 40 V and IRO = ±10 µA
Vref 2.7
0.5 x VS
8.5
–
–
–
3.3
0.56 x VS
10.8
V
Maximum Output Current Iout –50 – 50 µA
Pull–Up Resistor to VCC RPU 3.0 8.0 12 kΩ
NOTES: 1.Measured with TXD = VCC, I1 = VS, DIA and L high, no load. REF–IN–L and REF–IN–K connected to REF–OUT.
2.0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VDIA < 20 V, TXD high or floating.
3.When an over temperature is detected, the DIA output is forced “off”.
4.0 < VCC < 5.5 V, 0 < VS < 40 V, 0 < VL < 20 V.
5.At static “High” or “Low” level TXD, the current source I1 delivers a current of 3.0 mA (typ). Only during “Low” to “High” transition, does this current
increase to a higher value in order to charge the K Line capacitor (CL < 4.0 nF) in a short time (see Figure 3).
6.Measured with TXD = VCC, I1 = VS, DIA and L high, no load, REF–IN–L and REF–IN–K connected to REF–OUT.
DYNAMIC CHARACTERISTICS (– 40°C ≤ TA ≤ 125°C, 4.5 V ≤ VCC ≤ 5.5 V, 4.5 V ≤ VS ≤ 20 V, unless otherwise noted.)
Characteristic Symbol Min Typ Max Unit
T ransmission Speed 1/t Bit 0 – 200 k Baud
High or Low Bit T ime t Bit 5.0 – – µs
RXD Output
Low to High T ransition Delay Time
High to Low T ransition Delay Time tRDR
tRDF –
––
–450
450
ns
LO Output
Low to High T ransition Delay Time
High to Low T ransition Delay Time tLDR
tLDF –
––
–2.0
2.0
µs
DIA Output
Low to High T ransition Delay Time
High to Low T ransition Delay Time tDDR
tDDF –
––
–650
650
ns
I1 Output (VS – I1 > 2.7 V)
Rise T ime
Hold T ime tI1R
tI1F –
1.5 –
–0.3
4.5
µs
MC33199
5
MOTOROLA ANALOG IC DEVICE DATA
Figure 1. TXD to DIA AC Characteristic
+ 5.0 V
REF–OUT
Input
Signal
REF–IN–L
REF–IN–K
TXD 1.0 nF
+12 V
VCC Vbat
Test
Point
5.0 V
0 V
tBit TXD Input
Signal
tDDF
tDDR
10 V
DIA Output
Signal 2.0 V
I1
DIA
Gnd
REF–OUT
REF–IN–L
REF–IN–K
TXD
LO
RXD
+ 5.0 V +12 V
2.0 K
Test
Points2 x 30 pF
VCC Vbat
L
DIA
Gnd
Input
Signal
tBit
4.5 V
RXD to LO
Output Signal 0.4 V
12 V
0 V
DIA and L
Input Signal
tRDF/tLDF
tRDR/tLDR
Figure 2. DIA to TXD and L to LO AC Characteristics
tBit
tI1F
tI1H
TXD
Signal 5.0 V
0 V
Current Source
I1 Maximum Limit
Typical I1
Waveform
Current Source
I1 Minimum Limit
tI1R
120 mA
40 mA
4.0 mA
2.0 mA
Figure 3. Current Source I1 AC Characteristics
At static “High” or “Low” level TXD, the current source I1 delivers a
current of 3.0 mA (typ). Only during “Low” to “High” transition, does this
current increase to a higher value in order to charge the K Line
capacitor (Cl < 4.0 nF) in a short time.
REF–OUT
REF–IN–L
REF–IN–K
TXD
LO
RXD
+ 5.0 V +12 V
VCC Vbat
I1
DIA
Gnd
Input
Signal
To
Oscilloscope
10
Ω
33 nF
I1 Pulse
Current
DIA Discharge
Current
Figure 4. Current Source I1 and DIA Discharge
Current Test Schematic
MC33199
6 MOTOROLA ANALOG IC DEVICE DATA
–
Figure 5. Logic Diagram and Application Schematic
Figure 6. Typical Application with Several ECUs
Thermal
Shutdown
REF–OUT
LO
REF–IN–L
REF–IN–K
RXD
TXD
VCC = 5.0 V
L
I1
DIA
Gnd
VS
I1
Source
Reference
Generator Protection
Current
Limit
VCC
Driver
C1 +
+
–
C2
Vbat
RXD
TXD
RPU
Service Tester or
End of Line
Manufacturer
Programmation or
Checking System
Car Electronic Control Unit
MCU
L Line
K Line
+Vbat
RPU
L Line
K Line Service Tester or
End of Line
Manufacturer
Programmation or
Checking System
Car ISO Diagnostic
Connector
MC33199MCU
MC33199MCU
ECU #1
ECU #2
Car
Other
ECUs
MC33199
7
MOTOROLA ANALOG IC DEVICE DATA
–50
10
– 5.0
40
5.0
2.5
0
10
5.0
30
–50
1.4
REF–OUT, OUTPUT VOLT AGE (V)
REF–OUT, OUTPUT CURRENT (
µ
A)
VS, VOLTAGE (V)
IS, CURRENT (mA)
IS, SUPPLY CURRENT (mA)
VS, SUPPLY VOLTAGE (V)
REF–OUT, OUTPUT VOLT AGE (V)
VS, VOLTAGE (V)
VS, SUPPLY VOLTAGE (V)
ICC, SUPPLY CURRENT (mA)
TA, AMBIENT TEMPERATURE (
°
C)
Figure 7. ICC Supply Current
versus Temperature Figure 8. IS Supply Current
versus VS Supply Voltage
Figure 9. IS Supply Current
versus VS Supply Voltage Figure 10. VS Voltage
versus IS Current
Figure 11. REF–OUT Voltage
versus VS Supply Voltage Figure 12. REF–OUT Voltage
versus REF–OUT Current
1.2
1.0
0.8
0.6
0.4 – 25 0 25 50 75 100 125
2.0
1.5
1.0
0.5
010 15 20
25
20
15
10
5.0
010 15 20 25 30 35 40
IS, SUPPLY CURRENT (mA)
35
30
25
20
15 –1.0 3.0 7.0 11 15
8.0
6.0
4.0
2.0
05.0 10 15 20 25 30 35 40
8.0
6.0
4.0
0
2.0
–40–30–20–100 1020304050
–40
°
C
125
°
C
25
°
C
–40
°
C
125
°
C
25
°
C–40
°
C
125
°
C25
°
C
VCC = 5.5 V
VDIA = VL = VI1 = 20 V
VS = 18 V
VS = 6.0 V
MC33199
8 MOTOROLA ANALOG IC DEVICE DATA
IDIA,
600
70
0
12
2.5
550
–50
500
LO
IDIA, DIA CURRENT LIMIT (mA)
VDIA, VL, DIA AND L VOLTAGE (V)
TA, AMBIENT TEMPERATURE (
°
C)
VHyst, L AND DIA HYSTERESIS (mV)
TA, AMBIENT TEMPERATURE (
°
C)
Figure 13. L and DIA Hysteresis
versus Ambient Temperature Figure 14. L and DIA Current
versus L and DIA Voltage
Figure 15. DIA Saturation Voltage
versus Temperature Figure 16. DIA Current Limit
versus Temperature
Figure 17. RXD Pull–Up Resistor
versus Temperature Figure 18. TXD and LO Saturation Voltage
versus Temperature
480
460
440
420
400 – 25 0 25 50 75 100 125
10
8.0
10 15 20
500
450
400
350
300
VDIA(sat), DIA SATURATION VOLT AGE (mV)
66
62
500
400
300
200
100
0
6.0
4.0 5.0 25 35 4030
– 50 – 25 0 25 50 75 100 125
58
54
50
– 50 – 25 0 25 50 75 100 125
TA, AMBIENT TEMPERATURE (
°
C)
TA, AMBIENT TEMPERATURE (
°
C) TA, AMBIENT TEMPERATURE (
°
C)
2.4
2.3
2.2
2.1
2.0
1.9
1.8
1.7
1.6
1.5
– 50 – 25 0 25 50 75 100 125 – 50 – 25 0 25 50 75 100 125
RRXD, RXD PULL–UP RESISTOR (k )
Ω
VTXD(sat) , TXD AND VLO SATURATION (mV)
25
°
C
–40
°
C
125
°
C
IDIA = 40 mA
IL, DIA AND L CURRENT ( A)
µ
RXD
, VLO(sat)
MC33199
9
MOTOROLA ANALOG IC DEVICE DATA
TA, AMBIENT TEMPERATURE (
°
C)
4.4
–50
3.50
100
–50
1.0
tI1, I1 PULSE WIDTH ( s) I1, DC CURRENT (mA)
VS, SUPPLY VOLTAGE (V)
VI1(sat), I1 SATURATION VOLTAGE (V)
TA, AMBIENT TEMPERATURE (
°
C)
Figure 19. I1 Saturation Voltage
versus Temperature Figure 20. I1 Output DC Current
versus Temperature
Figure 21. I1 Output Pulse Current
versus VS Supply Voltage Figure 22. I1 Pulse Current Width
versus Temperature
0.9
0.8
0.7
0.6
0.5 – 25 0 25 50 75 100 125
3.25
3.00
2.75
2.50
2.25
–25 0 25
90
80
70
60
50
I1, OUTPUT CURRENT (mA)
4.2
4.0
3.8
3.6
3.4
2.00 50 100 12575
5.0 7.5 10 12.5 15 17.5 20 –50 – 25 0 25 50 75 100 125
TA, AMBIENT TEMPERATURE (
°
C)
40
µ
+12 V
I1
DIA
Gnd
L
Schaffner
Generator
2 x 1.0 nF
2 x 330 pF
100 nF
D2
D1
Figure 23. Transient Test Circuit Using Schaffner Generator
125
°
C
25
°
C
–40
°
C
I = 40 mA
I = 2.0 mA
Vbat
Test pulses are directly applied to VS and via a capacitor of 1.0 nF to
DIA and L. The voltage VS is limited to – 2.0 V/40 V by the transient
suppressor diode D1. Pulses can occur simultaneously or separately.
MC33199
10 MOTOROLA ANALOG IC DEVICE DATA
INTRODUCTION
The MC33199 is a serial interface circuit used in
diagnostic applications. It is the interface between the
microcontroller and the special K and L Lines of the ISO
diagnostic port. The MC33199 has been designed to meet
the “Diagnosis System ISO 9141” specification.
This product description will detail the functionality of the
device (see simplified application). The power supply and
reference voltage generator will be discussed followed by the
path functions between MCU, K and L Lines. A dedicated
paragraph will discuss the special functionality of the I1 pin in
it’s ability to accommodiate high baud rate transmissions.
Power Supplies and Reference Voltage
The device requires two power supplies to be used; a
5.0 V supply, VCC, which is normally connected to the MCU
supply. The device VCC pin is capable of sinking typically
1.0 mA during normal operation. A Vbat supply voltage, VS, is
normally tied to the car’s battery voltage. The Vbat pin can
sustain up to 40 V dc. Care should be taken to provide any
additional reverse battery and transient voltage protection in
excess of 40 V.
The voltage reference generator is supplied from both VCC
and Vbat pins. The voltage reference generator provides a
reference voltage for the K and L Line comparator
thresholds. The reference voltage is dependant on the Vbat
voltage; it is linear in relation to the Vbat voltage for all Vbat
voltages between 5.6 V and 18 V. Below 5.6 V and over 18 V
the reference voltage is clamped (see Figure 11). The
REF–OUT pin connects the reference voltage out externally
making it available for other application needs. The
REF–OUT pin is capable of supplying a current of 50 µA (see
Figure 12).
Path Functions Between MCU, K and L Lines
The path function from the MCU to the K Line uses a driver
to interface directly with the MCU through the TXD pin. The
TXD pin is CMOS compatible. This driver controls the On–Off
conduction of the power transistor. When the power
transistor is On, it pulls the DIA pin low. This pin is known as
K Line in the ISO 9141 specification. The DIA pin structure is
open collector and requires an external pull–up resistor for
use. Having an open collector without an internal pull–up
resistor allows several MC33199 to be connected to the K
Line while using a single pull–up resistor for the system (see
Figure 6). In order to protect the DIA pin against short circuits
to Vbat, the MC33199 incorporates an internal current limit
(see Figure 16) and thermal shutdown circuit. The current
limit feature makes it possible for the device to drive a K Line
bus having a large parasitic capacitor value (see Special
Functionality of I1 pin below).
The path from the DIA pin, or K Line, to the MCU is done
through a comparator. The comparator threshold voltage is
connected to REF–IN–K pin. It can be tied to the REF–OUT
voltage if a Vbat dependant threshold is required in the
application. The second input of this comparator is
connected internally to DIA pin. The output of this comparator
is available at the RXD output pin and normally connects to
an MCU I/O port. RXD pin has a 2.0 kΩ internal pull–up
resistor.
The path from the L Line, used during a wake–up
sequence of the transmission, to the MCU is done through a
second comparator. The comparator threshold voltage is
connected to REF–IN–L pin. The REF–IN–K pin can be tied
to the REF–OUT voltage if a Vbat dependant threshold is
required in the application. The second input of this
comparator is internally connected to L pin. The output of this
comparator is available on LO output pin, which is also an
open collector structure. The LO pin is normally connected to
an MCU I/O port.
The DIA and L pins can sustain up to 40 V dc. Care should
be taken to protect these pins from reverse battery and
transient voltages exceeding 40 V.
The DIA and L pins both have internal pull–down current
sources of typically 7.5 µA (see Figure 14). The L Line
exhibits a 10 µA pull–down current. The DIA pin has the
same behavior when it is in “off” state, that is when TXD is at
logic high level.
Special Functionality of I1 Pin
The MC33199 has a unique feature which accommodates
transmission baud rates of up to 200 k baud. In practice, the
K Line can be several meters long and have a large parasitic
capacitance value. Large parasitic capacitance values will
slow down the low to high transition of the K Line and limit the
baud rate transmission. For the K Line to go from low to high
level, the parasitic capacitor must first be charged, and can
only be charged through the pull–up resistor. A low pull–up
resistor value would result in fast charge time of the capacitor
but also large output currents to be supplied causing a high
power dissipation in the driver.
To avoid this problem, the MC33199 incorporates a
dynamic current source which is temporarily activated at the
low to high transition of the TXD pin when the DIA pin or K
Line switches from a low to high level (see Figures 3 and 4).
This current source is available at the I1 pin. The I1 pin has
a typical current capability of 80 mA. It is activated for 4.0 µs
(see Figures 21 and 22) and is automatically disabled after
this time. During this time it will charge the K Line parasitic
capacitor. This extra current will quickly increase the K Line
voltage up to Vbat, resulting in a reduced rise time of the K
Line. With this feature, the MC33199 ensures baud rate
transmission of up to 200 k baud.
During high to low transitions of the K Line, the parasitic
capacitor of the line will be discharged by the output
transistor of the DIA pin. In this case, the total current may
exceed the internal current limitation of the DIA pin. If so, the
current limit circuit will activate, limiting the discharge current
to typically 60 mA (see Figures 4 and 16).
If a high baud rate is necessary, the I1 pin should be
connected to the DIA as shown in the typical application
circuit shown in Figure 5. The I1 pin can be left open, if the I1
functionality and high baud rate are not required for the
application.
MC33199
11
MOTOROLA ANALOG IC DEVICE DATA
PIN DESCRIPTION
Pin 1: VCC
Power Supply pin; typically 5.0 V and requiring less than
1.5 mA.
Pin 2: REF–IN–L
Input reference for C2 comparator. This input can be
connected directly to REF–OUT with or without a resistor
network or to an external reference.
Pin 3: REF–IN–K
Input reference for C1 comparator. This input can be
connected directly to REF–OUT with or without a resistor
network or to an external reference.
Pin 4: LO
Output of C2 comparator and normally connected to a
microcontroller I/O. If L input > (REF–IN–L + Hyst/2); output
LO is in high state. If L< (REF–IN–L – Hyst/2); output LO is in
low state and the output transistor is “on”. This pin is an open
collector structure and requires a pull–up resistor to be
connected to VCC. Output drive capability of this output is
5.0 mA.
Pin 5: RXD
Receive output normally connected to a microcontroller
I/O. If DIA input > (REF–IN–L + Hyst/2); output LO is in high
state. If DIA < (REF–IN–L – Hyst/2); output LO is in low state
and the output transistor is “on”. This pin has an internal
pull–up resistor (typically 2.0 kΩ) connected to VCC. Drive
capability of this output is 5.0 mA.
Pin 6: TXD
Transmission input normally connected to a
microcontroller I/O. This pin controls the DIA output. If TXD is
high, the output DIA transistor is in the “off” state. If TXD is
low, the DIA output transistor is “on”.
Pin 9: DIA
Input/Output Diagnosis Bus line pin. This pin is an open
collector structure and is protected against overcurrent and
circuit shorts to Vbat and VS. Whenever the open collector
transistor turns “on” (TXD low), the Bus line is pulled to
ground and the DIA pin current is internally limited to nominal
value of 60 mA. The internal power transistor incorporates a
thermal shutdown circuit which forces the DIA output “off” in
the event of an over temperature condition. The DIA pin is
also the C1 comparator input. It is protected against both
positive and negative overvoltages by an internal 40 V zener
diode. This pin exhibits a constant input current of 7.5 µA.
Pin 10: Gnd
Ground reference for the entire device.
Pin 11: I1
Bus source current pin. It is normally tied to DIA pin and to
the Bus line. The current source I1 delivers a nominal current
of 3.0 mA at static “High” or “Low” levels of TXD. Only during
“Low” to “High” transitions, does this current increase to
a higher value so as to charge the key line capacitor
(Cl < 4.0 nF) in a short time (see Figures 3 and 4).
Pin 12: L
Input for C2 comparator . This pin is protected against both
positive and negative overvoltage by a 40 V zener diode. This
L Line is a second independent input. It can be used for wake
up sequence in ISO diagnosis or as an additional input bus
line. This pin exhibits a constant input current of 7.5 µA.
Pin 13: VS
12 V typical, or Vbat supply pin for the device. This pin is
protected against overvoltage transients.
Pin 14: REF–OUT
Internal reference voltage generator output pin. Its value
depends on VS (Vbat) values. This output can be directly
connected to REF–IN–L and REF–IN–K, or through a
resistor network. Maximum current capability is 50 µA.
MC33199
12 MOTOROLA ANALOG IC DEVICE DATA
D SUFFIX
PLASTIC PACKAGE
CASE 751A–03
(SO–14)
ISSUE F
OUTLINE DIMENSIONS
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
–A–
–B–
G
P7 PL
14 8
71 M
0.25 (0.010) B M
S
B
M
0.25 (0.010) A S
T
–T–
F
RX 45
SEATING
PLANE
D14 PL K
C
J
M
_
DIM MIN MAX MIN MAX
INCHESMILLIMETERS
A8.55 8.75 0.337 0.344
B3.80 4.00 0.150 0.157
C1.35 1.75 0.054 0.068
D0.35 0.49 0.014 0.019
F0.40 1.25 0.016 0.049
G1.27 BSC 0.050 BSC
J0.19 0.25 0.008 0.009
K0.10 0.25 0.004 0.009
M0 7 0 7
P5.80 6.20 0.228 0.244
R0.25 0.50 0.010 0.019
____
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MC33199/D
*MC33199/D*
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