ANALOG LC?M0S DEVICES Latched 4/8 Channel Analog Multiplexers ADGS28A/ADG529A REV. A 1.1 Scope. This specification covers the detail requirements of CMOS monolithic analog multiplexers ADG528A and ADG529A with 8 channels and dual 4 channels, respectively. These multiplexers also feature high switching speeds, low Roy and on-chip latches to facilitate microprocessor interfacing. Break-Before- Make switching is guaranteed. 1.2 Part Number. The complete part number per Table 1 of this specification is as follows: Device Part Number' -1 ADG528AT(X)/883B -2 ADG529AT(X)/883B NOTE 'To complete the part number substitute the package identifier as shown in paragraph 1.2.3. 1.2.3 Case Outline. See Appendix 1 of General Specification ADI-M-1000: package outline: (X) Package Description Q Q-18 18-Pin Cerdip E E-20A 20-Terminal LCC 1.3 Absolute Maximum Ratings. (T, = +25C) VECO Ve cc enn eee cece tee e eee e een beeen eenenas 44V V+ toGND 26 eee eee ence bebe ene beneneeeenne 25V VtoGND 2... 2c eee nee n een eens cee eee e eee -25V Analog Inputs Voltage at $, D0. cc etc ete b ene ne eeeaes V- to V+ Continuous Current, Sor D 0.2.0... cece cence een ntenntnnenas 30 mA Pulsed Current $ or D 1 ms Duration, 10% Duty Cycle 2.02... cece cence enn 70 mA Digital Inputs Voltages ACLIN 0... ce eee eee eee ence ee nees V -4Vto V+ +4Vor 20 mA, Whichever Occurs First Power Dissipation (Package) Up to +75 ccc ence tence eben een eeentennes 470 mW/C Derates above +75C by 2.0... cee ce cece ee ence vane eteeennaes 6mWC Operating Temperature ....... 0.000.000 ccc cece cae nent neeees 55C to +125C Storage Temperature Range .... 2.0... 0.00 c cece eee nee e nent eeeeens 65C to + 150C Lead Temperature (Soldering 10 sec)... 2. ce eee nee tense ennenes +300C Junction Temperature (Ty) 2.0... ce cee tenet een eneny +175C 1.5 Thermal Characteristics. Thermal Resistance 0;< = 35C/W for Q-18 and E-20A 8;4 = 120C/W for Q-18 and E-20A SWITCHES & MULTIPLEXERS 15-71 SWITCHES & MULTIPLEXERS 3 aADGS28A/ADG529A SPECIFICATIONS Table 1. Design Sub Sub Limit Group | Group Test Symbol Device | Tyu-Tues | 1 2,3 Test Conditions'/Comments Units Switch ON Resistance Ros -1,2 | 400 300 400 Vs = +10 V; Vg = -10 V; O max Ipg = 1 mA; Test Circuit 1 -1,2 600 450 V+ = +10.8V;V- = -10.8 V; Omax Test Circuit 1 Source OFF Leakage Current | I; (OFF) -1,2 50 1 50 V+ = +16.5 V; V = -16.5 V; nA max Test Circuit 2 Drain OFF Leakage Current Ip (OFF) -1 200 1 200 Vp = Vs = +10 V; +nA max -2 100 1 100 V+ = +16.5V; V- = -16.5 V; Test Circuit 3 Channel ON Leakage Current | Ip (ON) -1 200 1 200 Vp = Vs = +10 V; +nA max -2 100 1 100 V+ = +16.5V;V- = -16.5 V; Test Circuit 4 Differential OFF Output lIpirr -2 25 25 V1 = +10 V; V2 = +10 V; tnA max Leakage Test Circuit Digital Input High Voltage Vonn -1,2 2.4 2.4 2.4 V min Digital Input Low Voltage Vint -1,2 0.8 0.8 0.8 V max High Level Input Current Inn -1,2 1 1 1 V+ = +16.5V; V~- = 16.5 V; +yA max Voy = +16.5V Low Level Input Current In -1,2 1 1 1 V+ = +165 V;V- = -16.5 V; +pA max Vn = 0V Supply Current tloc -1,2 1.5 LS 1.5 V+ = +16.5 V; V = 16.5 V; mA max =lec -1,2 | 02 0.2 02 Venn = 2.4 V3 Vin, = 0.8 V Subgroup 9, 10, 11 UrRANSITION trrans -1,2 400 Vl = +10 V, V2 = +10 V; ms max Test Circuit 6 Subgroup 9, 10, 11 __ ton (ENABLE, WRITE) ton (EN, WR) | -1,2 400 Test Circuit 7a, 7b, 7 ns max torr (ENABLE, RESET) | torr (EN, RS) | 1,2 | 400 Subgroup 12 Off Isolation Viso ~1,2 50 R, = 1k0;C, = 12 pF; Test Circuit 8 dB min Vin = 10 V pk-pk, f = 100 kHz; T, = +25C Subgroup 13 Crosstalk between Channels | Vcr -1,2 60 Vs = 20 V pk-pk; R, = 1 kA; dB min C, = 12 pF; T, = +25C; Test Circuit 9 Subgroup 14 Charge Injection Qn -1,2 50 Test Circuit 10 pC max Digital Input Capacitance Cry -1,2 20 pF max Source Capacitance, OFF C, (OFF) -1,2 20 pF max Drain Capacitance, OFF Cp (OFF) -1 100 pF max -2 50 pF max HOTE: DUAL SUPPLY OPERATION - +15 V Inless otherwise noted V+ = +15 V; V = -I15V. 15-72 SWITCHES & MULTIPLEXERS REV. AADGS28A/ADG529A Table 2. Design Sub Sub Limit Group | Group Test Symbol Device | Ta-Tas | 1 2,3 Test Conditions'/Comments Units Switch ON Resistance Ros -1,2 1000 700 1000 Vp = +10 V; V5 = 0 V3 Ipg = 0.5 mA 1 max V+ = +10.8 V; V = 0 V; Test Circuit 1 Source OFF Leakage Current 1, (OFF) -1,2 | 50 I 50 V+ = +16.5V;V =0V; +nA max Test Circuit 2 Drain OFF Leakage Current Ip (OFF) -1 200 1 200 V+ = +165V;V- =0V nA max ~2 100 1 100 V1 = +10 V/0 V; V2 = 0 W/+10 V; Test Circuit 3 Channel ON Leakage Current Ip (ON) -1 200 1 200 V+ = +16.5V;V- =0V; +nA max 2 100 1 100 | Vi= +10 VOV; V2 =0W/+10V Test Circuit 4 Differential OFF Output lor -2 25 25 V+ = +16.5V;V~ =0V nA max Leakage V1 = +10 V/0 V; V2 = 0 V/+10 V Test Circuit 5 Digital Input High Voltage Vinu -1,2 2.4 2.4 2.4 V min Digital Input Low Voltage Vint -1,2 0.8 0.8 0.8 V max High Level Input Current Inn -1,2 1 1 1 V+ = +16.5V;V- =0V; +tpA max Vin = +16.5V Low Level Input Current In -1,2 1 ! 1 V+ = +16.5V;V- =O0V; +A max Vin = 0V Supply Current tloe ~1,2 1.5 1.5 1.5 V+ = +16.5V;V- =0V; mA max Vinn = 2.4. V3 Van = 0.8V Subgroup 9, 10, 11 UPRANSITION trRaNs -1,2 600 V1 = 10 VA V; V2 = 0 V/10 V; ns max Test Circuit 6 Subgroup 9, 10, 11 __ ton (ENABLE, WRITE) ton (EN, WR) | -1,2 600 Test Circuit 7a, 7b, 7c ns max torr (ENABLE, RESET) torr (EN, RS) | ~1,2 | 600 Subgroup 12 Off Isolation Viso -1,2 50 dB min Subgroup 13 Crosstalk between Channels Ver ~1,2 6 dB min Subgroup 14 Charge Injection Qn -1,2 50 pC max Digital Input Capacitance Cy -1,2 20 pF max Source Capacitance, OFF C, (OFF) -1,2 20 pF max Drain Capacitance, OFF Cp (OFF) -1 100 pF max -2 50 pF max NOTE: SINGLE SUPPLY OPERATION - +15 V Unless otherwise noted V+ = +15.V;V =0V. REV. A SWITCHES & MULTIPLEXERS 15-73 SWITCHES & MULTIPLEXERS a 1a)ADGS28A/ADG529A 3.2.1 Functional Block Diagram and Terminal Assignments. ADG528A DECODER LATCHES AO Al A2 EN RS DIP Package a =ifa{]= Za jolpe= ETE Este =~ VF we jit @ ~& o 6 Ves [4 ac ADG528A si (5 | TOP VIEW (Not to Scale) ac s3[7 [a pia LCCC ADG528A TOP VIEW (Nat to Scale} 18-74 SWITCHES & MULTIPLEXERS S1A nt S4A o__1 \ $1B | ) DB mnt S4B | 1 1 Pin Assignments Ay A2 GND Voo $5 S6 $7 $B 18 A2 17 GND 16 Voo 15 SS 14 S6 NC = NO CONNECT ADGS529A Oof o_e) DA DECODER/ LATCHES AO A1 EN RS DIP Package oe wa [i] [18] S Ao E | A, EN (] 16} GND Ves { 4 : 15] Vou ADG5294 S1A GE] TOP VIEW 14] S1B (Not to Scale} S2A [ 6 13] S2B S3A ] 7 124 S38 S4A [2] rs] s4a DA} 9 10] DB LCCC go . 283 < 392 1 20 19 i+ vt us 18 GND 17 Voo ADG529A TOP VIEW 16 S1B (Nat to Scale} 15 S2B 14 S3B 9 < + an 1011 12 13 aq Q o a a 2 O % we = NO CONNECT REV. AREV. A ADGS28A/ADGS29A | Method 5005 MIL-STD-883 Test Requirements Subgroups (See Table 1) Interim Electrical Parameters 1 (Pre-Burn-In) Method 5004 Final Electrical Parameters, Method 5004 1*, 2, 3,9 Group A Electrical Parameters, Method 5005 | 1, 2, 3, 9, 10**, 11** Group C End Point Electrical Parameters, 1 NOTES *Indicates PDA applies to Subgroup 1. **Subgroups 10 & 11, if not tested, shall be guaranteed to the limits in the data sheet. TRUTH TABLES Table 3. ADG528A Truth Table A2| Al| AO | EN| WR| RS | ON SWITCH PAIR X |X /]X |X | | 1 | Retains Previous Switch Condition X |X |X |X xX 0 NONE (Address and Enable Latches Cleared) xX |X |X |0 0 1 NONE 0 0 0 1 0 1 1 0 0 1 1 0 1 2 0 1 0 1 0 1 3 0 1 1 1 0 1 4 1 0 0 1 0 1 5 1 0 1 1 0 1 6 ] ] 0 1 0 1 7 1 1 1 1 0 1 8 X = Dont Care Table 4. ADG529A Truth Table Al | AO | EN| WR| RS | ON SWITCH PAIR X |X |X + 1 Retains Previous Switch Condition X |X |X x 0 NONE (Address and Enable Latches Cleared) X |X |0 0 1 NONE 0 0 1 0 1 i 0 1 1 0 1 2 1 0 1 0 1 3 1 1 1 0 1 4 X = Dont Care 3.2.4 Microcircuit Technology Group. This microcircuit is covered by technology group (82). SWITCHES & MULTIPLEXERS 15-75 SWITCHES & MULTIPLEXERS a anADGS28A/ADG529A 4.2.1 Life Test/Burn-In Circuit. Steady state life test is per MIL-STD-883 Method 1005. Burn-in is per MIL-STD-883 Method 1015 test condition (B). -o s o Ip (OFF: O-ll0- vs x T + Ron = 4 = los Test Circuit 1 Test Circuit 2 Test Circuit 3 Fon lg (OFF) | (OFF) Yoo Vss vee F T_T Veo Wes Voo Vss EN F 0.8V DA 7 Ste i ae en 24" to (ON) ADG529A vi= GND oe Vv = v2 o (4) b GND ve Tv L Vv torr = Ina (OFF) log {OFF} Test Circuit 4 Test Circuit 5 'p (ON) lower Vou Vss 3v _| | ADDRESS ae __ fs Rive (Vin! ov Yop Vss Az st -w Al $2 THRU $7 fe AO 8 }- v2 s ADGS284" | oureuT EN o AS GNp WA] 2 imo 35pF traansition trRANsiTION * SIMILAR CONNECTION FOR ADG529A Test Circuit 6 Switching Time of Multiplexer, trransition 15-76 SWITCHES & MULTIPLEXERS REV. AADGS28A/ADG529A Voo Vs wy ENABLE 4 { T ooo DRIVE (Vin) 2av AS Voo = Vss ov { 50% A2 $1 } +5v ( I ( 1 Al $2 THRU $3 1 90% | OUTPUT ' toy 10% t AO ADG528A* 1 OUTPUT al ton IRoer | 1 EN (EN) EN) Vin 500 GND WR Thal 35pF *SIMILAR CONNECTION FOR ADG529A Test Circuit 7a Enable Delay, toy (EN), tore (EN) Yoo Vss 3V wa Yoo ss w 50% DRIVE (Vy) 2.4V d EN sib +sv ! \ A2 $2 THRU SB 1 . 7 ' al ' OUTPUT ADG528A* t 20% Ao D OUTPUT 1 be ton (WR) ~m| RS S Ko Wa 7 35pF | GND $ 501 J NOTE DEVICE MUST BE RESET PRIOR TO Vin APPLYING WR PULSE SIMILAR CONNECTION FOR ADG5294 Test Circuit 7b Write Turn-On Time, ton, (WR) Voo Vss av RS DRIVE (Vin) Yor Vss ~ soe 2av l EN si; sv ov A2 $2 THRU SB re 1 1 80% 1 ; AY ADGS28A | curry Ao p{--QuTPut 1 4 be tore (AS) HI wr tet _ RS ano 35pF NOTE: WR MUST BE PULSED LOW PRIOR TO APPLYING RS PULSE. 500 * SIMILAR CONNECTION FOR ADG5294 Test Circuit 7 _ Reset Turn-Off Time, tore (RS) REV. A SWITCHES & MULTIPLEXERS 15-77 SWITCHES & MULTIPLEXERS aADGS28A/ADG529A WR apGs2ga* AS 24v -15V AO Arh? 10nF 0.1 EN a2 b? & & Vss GND vu 3x50. s Yoo T5002 f vv xS0L) x 0.1 Vn _o% o $5 WwW pe 10yF or ~o- $6 We S or% ~o s7 WA ~o $8 wi "SIMILAR TYPE OF CIRCUIT APPLIES FOR ADGS294. Test Circuit 8 OFF Isolation WR = apGs2eat RS av AQ arT~q 2.4V O-] EN a2t4 ~15V Ves GND y 10pF ve o~% Voo +19V U b fo 2 o% p= $5 O.1pF 1 53 O0--0~o 56 o% So 87-4 Vo lb > o 58 10pF 1 <H 5002 Vinw *SIMILAR TYPE OF CIRCUIT APPLIES FOR ADG5294. Test Circuit 9 Crosstalk Between Channels Von Vss v Von Vss iN \ / = ov Ao RS ;24V t t Al Vo Wo p-=- 4 A2 ADG528A* 1 Rs S1 Dp : v t Vv. ve 1 wow ap) fre a 4 r _ L Inf ~ Qyy = CL x 4Vo $ Vin > sour GND WR j s *SIMILAR CONNECTION FOR A0G529A Test Circuit 10 Charge Injection 15-78 SWITCHES & MULTIPLEXERS REV. AADGS28A/ADG529A ONE PER BOARD ONE PEA \ BOARD WT 100k {a | wa as [ve} if] Ao apa a 2k EN {G Jen a2 [16 vy " 1k 16 J wv O Wwf 4 Wes GND [is }+#_________o ov 1/2 WATT 1 re] $1 TOP VIEW Voo| 14 }#e}--_~_ +15V (Not to Scale) 1/2 WATT +[e | sz $5 | 14 +[7 | sa se [12 >{"a | se s7{n 51k +10V Qa lo se fie t( ADG528A 5.1k -10V O AN NOTES UP = +15V; WR = GND; EN = OV; RS = 0V MAX CURRENT RATINGS MAX Ipp = 2mA MAX Wee = 2mA NOT THE ABSOLUTE MAX RATINGS MAX CONTINUOUS CURRENT 5S OR D = 20mA N.6. NOTE POWER RATINGS OF 1k RESISTORS ADG528A Static Burn-in Board ONE PER ONE PER = BOARD BOARD 100k ie | 2.2k L__T] AQ TOP VIEW A1/ 17 AA e WP {Not to Scale) EN -$_{G] EN GND i6}-#__________ ov 1k tk -15V ow] Vso Veo 18 }} ws +15 *1/2 WATT "12 WATT {E] S1A S1B] 14 -{a S2A S2B | 13 p>{7 | saa sap | 12 +La | saa sap [11 9 | DA De | 10 Led ADG529A fo} 5.1k 5.1k . AAA O -10V +10V QO A NOTES VP = +15V; WA = GND; EN = OV; RS = OV MAX CURRENT AATINGS MAX Ipp = 2mA MAX lee = 2mA NOT THE ABSOLUTE MAX RATINGS *N.B. NOTE POWER RATING OF 1k RESISTORS MAX CONTINUOUS CURRENT S OR D = 20mA ADG529A4 Static Burn-in Board REV. A SWITCHES & MULTIPLEXERS 15-79 SWITCHES & MULTIPLEXERS a i>