UT54ACS20/UT54ACTS20 Radiation-Hardened Dual 4-Input NAND Gates FEATURES * * * * * * PINOUTS 14-Pin DIP Top View radiation-hardened CMOS - Latchup immune High speed Low power consumption Single 5 volt supply Available QML Q or V processes Flexible package - 14-pin DIP - 14-lead flatpack A1 1 14 VDD B1 2 13 D2 NC 3 12 C2 C1 D1 4 5 11 10 NC B2 Y1 VSS 6 7 9 8 A2 Y2 DESCRIPTION The UT54ACS20 and the UT54ACTS20 are dual 4-input NAND gates. The circuits perform the Boolean functions Y = A B C D or Y = A + B + C + D in positive logic. The devices are characterized over full military temperature range of -55 C to +125 C. FUNCTION TABLE INPUTS A B C D NC B2 Y Y1 6 9 A2 VSS 7 8 Y2 X X H X L X X H X X L X H X X X L H C2 D2 LOGIC DIAGRAM A1 B1 C1 D1 LOGIC SYMBOL B2 C2 11 X A2 NC 12 10 L D1 D2 3 5 L & (2) (4) VDD 13 4 H C1 14 2 D1 H B1 1 B1 C1 H (1) A1 OUTPUT H A1 14-Lead Flatpack Top View (6) Y1 (5) A2 B2 C2 Y1 Y2 D2 (9) (10) (12) (8) Y2 (13) Note: 1. Logic symbol in accordance with ANSI/IEEE standard 91-1984 and IEC Publication 617-12. 29 RadHard MSI Logic UT54ACS20/UT54ACTS20 RADIATION HARDNESS SPECIFICATIONS 1 PARAMETER LIMIT UNITS Total Dose 1.0E6 rads(Si) SEU Threshold 2 80 MeV-cm2/mg SEL Threshold 120 MeV-cm2/mg Neutron Fluence 1.0E14 n/cm2 Notes: 1. Logic will not latchup during radiation exposure within the limits defined in the table. 2. Device storage elements are immune to SEU affects. ABSOLUTE MAXIMUM RATINGS SYMBOL PARAMETER LIMIT UNITS VDD Supply voltage -0.3 to 7.0 V VI/O Voltage any pin -.3 to VDD +.3 V TSTG Storage Temperature range -65 to +150 C TJ Maximum junction temperature +175 C TLS Lead temperature (soldering 5 seconds) +300 C Thermal resistance junction to case 20 C/W II DC input current 10 mA PD Maximum power dissipation 1 W JC Note: 1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMIT UNITS VDD Supply voltage 4.5 to 5.5 V VIN Input voltage any pin 0 to VDD V TC Temperature range -55 to + 125 C RadHard MSI Logic 30 UT54ACS20/UT54ACTS20 DC ELECTRICAL CHARACTERISTICS 7 (VDD = 5.0V 10%; VSS = 0V 6, -55 C < TC < +125 C) SYMBOL VIL VIH IIN PARAMETER CONDITION MIN Low-level input voltage 1 ACTS ACS High-level input voltage 1 ACTS ACS MAX UNIT 0.8 .3VDD V .5VDD .7VDD V Input leakage current ACTS/ACS VIN = V DD or VSS Low-level output voltage 3 ACTS ACS IOL = 8.0mA IOL = 100 A High-level output voltage 3 ACTS ACS IOH = -8.0mA IOH = -100 A Short-circuit output current 2 ,4 ACTS/ACS VO = VDD and VSS -200 Output current10 VIN = VDD or VSS 8 mA (Sink) VOL = 0.4V Output current10 VIN = VDD or VSS -8 mA (Source) VOH = VDD - 0.4V Ptotal Power dissipation 2, 8, 9 CL = 50pF 1.9 mW/ MHz IDDQ Quiescent Supply Current VDD = 5.5V 10 A Quiescent Supply Current Delta For input under test 1.6 mA VOL VOH IOS IOL IOH IDDQ ACTS -1 1 A 0.40 0.25 V .7VDD VDD - 0.25 V 200 mA VIN = VDD - 2.1V For all other inputs VIN = VDD or VSS VDD = 5.5V CIN COUT 31 Input capacitance 5 = 1MHz @ 0V 15 pF Output capacitance 5 = 1MHz @ 0V 15 pF RadHard MSI Logic UT54ACS20/UT54ACTS20 Notes: 1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: V IH = VIH (min) + 20%, - 0%; VIL = VIL(max) + 0%, - 50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed to VIH(min) and VIL(max). 2. Supplied as a design limit but not guaranteed or tested. 3. Per MIL-PRF-38535, for current density 5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765 pF/MHz. 4. Not more than one output may be shorted at a time for maximum duration of one second. 5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at frequency of 1MHz and a signal amplitude of 50mV rms maximum. 6. Maximum allowable relative shift equals 50mV. 7. All specifications valid for radiation dose 1E6 rads(Si). 8. Power does not include power contribution of any TTL output sink current. 9. Power dissipation specified per switching output. 10. This value is guaranteed based on characterization data, but not tested. AC ELECTRICAL CHARACTERISTICS 2 (VDD = 5.0V 10%; VSS = 0V 1, -55 C < TC < +125 C) SYMBOL PARAMETER MINIMUM MAXIMUM UNIT tPHL Input to Yn 1 15 ns tPLH Input to Yn 1 11 ns Notes: 1. Maximum allowable relative shift equals 50mV. 2. All specifications valid for radiation dose 1E6 rads(Si). RadHard MSI Logic 32