A
Microchip Technology Company
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
Data Sheet
www.microchip.com
Features
LPC Interface Flash
SST49LF080A: 1024K x8 (8 Mbit)
Conforms to Intel LPC Interface Specification 1.0
Flexible Erase Capability
Uniform 4 KByte Sectors
Uniform 64 KByte overlay blocks
64 KByte Top Boot Block protection
Chip-Erase for PP Mode Only
Single 3.0-3.6V Read and Write Operations
Superior Reliability
Endurance: 100,000 Cycles (typical)
Greater than 100 years Data Retention
Low Power Consumption
Active Read Current: 6 mA (typical)
Standby Current: 10 µA (typical)
Fast Sector-Erase/Byte-Program Operation
Sector-Erase Time: 18 ms (typical)
Block-Erase Time: 18 ms (typical)
Chip-Erase Time: 70 ms (typical)
Byte-Program Time: 14 µs (typical)
Chip Rewrite Time: 16 seconds (typical)
Single-pulse Program or Erase
Internal timing generation
Two Operational Modes
Low Pin Count (LPC) Interface mode for
in-system operation
Parallel Programming (PP) Mode for fast production pro-
gramming
LPC Interface Mode
5-signal communication interface supporting byte Read
and Write
33 MHz clock frequency operation
WP# and TBL# pins provide hardware write protect for
entire chip and/or top boot block
Standard SDP Command Set
Data# Polling and Toggle Bit for End-of-Write detection
5 GPI pins for system design flexibility
4 ID pins for multi-chip selection
Parallel Programming (PP) Mode
11-pin multiplexed address and 8-pin data
I/O interface
Supports fast programming In-System on
programmer equipment
CMOS and PCI I/O Compatibility
Packages Available
32-lead PLCC
32-lead TSOP (8mm x 14mm)
All non-Pb (lead-free) devices are RoHS compliant
8 Mbit LPC Flash
SST49LF080A
The SST49LF080A flash memory device is designed to interface with the LPC
bus for PC and Internet Appliance application in compliance with Intel Low Pin
Count (LPC) Interface Specification 1.0. Two interface modes are supported: LPC
mode for in-system operations and Parallel Programming (PP) mode to interface
with programming equipment. The SST49LF080A flash memory device is manu-
factured with SST's proprietary, high-performance SuperFlash® Technology. The
split-gate cell design and thick-oxide tunneling injector attain better reliability and
manufacturability compared with alternate approaches
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
2
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Product Description
The SST49LF080A flash memory device is designed to interface with the LPC bus for PC and Internet
Appliance application in compliance with Intel Low Pin Count (LPC) Interface Specification 1.0. Two
interface modes are supported: LPC mode for in-system operations and Parallel Programming (PP)
mode to interface with programming equipment.
The SST49LF080A flash memory device is manufactured with SST’s proprietary, high-performance
SuperFlash Technology. The split-gate cell design and thick-oxide tunneling injector attain better reli-
ability and manufacturability compared with alternate approaches. The SST49LF080A device signifi-
cantly improves performance and reliability, while lowering power consumption. The SST49LF080A
device writes (Program or Erase) with a single 3.0-3.6V power supply. It uses less energy during Erase
and Program than alternative flash memory technologies. The total energy consumed is a function of
the applied voltage, current and time of application. For any give voltage range, the SuperFlash tech-
nology uses less current to program and has a shorter erase time; the total energy consumed during
any Erase or Program operation is less than alternative flash memory technologies. The
SST49LF080A product provides a maximum Byte-Program time of 20 µsec. The entire memory can be
erased and programmed byte-by-byte typically in 16 seconds when using status detection features
such as Toggle Bit or Data# Polling to indicate the completion of Program operation. The SuperFlash
technology provides fixed Erase and Program time, independent of the number of Erase/Program
cycles that have performed. Therefore the system software or hardware does not have to be calibrated
or correlated to the cumulative number of Erase cycles as is necessary with alternative flash memory
technologies, whose Erase and Program time increase with accumulated Erase/Program cycles.
To meet high density, surface mount requirements, the SST49LF080A device is offered in 32-lead
TSOP and 32-lead PLCC packages. See Figures 2 and 3 for pin assignments and Table 1 for pin
descriptions.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
3
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Functional Block Diagram
Figure 1: Functional Block Diagram
1235 B1.0
Y-Decoder
I/O Buffers and Data Latches
Address Buffers Latches
X-Decoder
SuperFlash
Memory
Control Logic
LCLK
RST# CE#MODE
GPI[4:0]
Programmer
Interface
WP#
TBL#
INIT#
ID[3:0]
LFRAME#
R/C#
OE#
WE#
A[10:0]
DQ[7:0]
LAD[3:0]
LPC
Interface
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
4
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Pin Assignments
Figure 2: Pin Assignments for 32-lead PLCC
Figure 3: Pin Assignments for 32-lead TSOP (8mm x 14mm)
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A7(GPI1)
A6 (GPI0)
A5 (WP#)
A4 (TBL#)
A3 (ID3)
A2 (ID2)
A1 (ID1)
A0 (ID0)
DQ0 (LAD0)
MODE (MODE)
NC (CE#)
NC
NC
VDD (VDD)
OE# (INIT#)
WE# (LFRAME#)
NC
DQ7 (RES)
4 3 21323130
A8 (GPI2)
A9 (GPI3)
RST# (RST#)
NC
VDD (VDD)
R/C# (LCLK)
A10 (GPI4)
32-lead PLCC
Top View
1235 32-plcc P1.0
14 15 16 17 18 19 20
DQ1 (LAD1)
DQ2 (LAD2)
VSS (VSS)
DQ3 (LAD3)
DQ4 (RES)
DQ5 (RES)
DQ6 (RES)
( ) Designates LPC Mode
NC
NC
NC
NC (CE#)
MODE (MODE)
A10 (GPI4)
R/C# (LCLK)
VDD (VDD)
NC
RST# (RST#)
A9 (GPI3)
A8 (GPI2)
A7 (GPI1)
A6 (GPI0)
A5 (WP#)
A4 (TBL#)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
OE# (INIT#)
WE# (LFRAME#)
VDD (VDD)
DQ7 (RES)
DQ6 (RES)
DQ5 (RES)
DQ4 (RES)
DQ3 (LAD3)
VSS (VSS)
DQ2 (LAD2)
DQ1 (LAD1)
DQ0 (LAD0)
A0 (ID0)
A1 (ID1)
A2 (ID2)
A3 (ID3)
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1235 32-tsop P2.0
Standard Pinout
Top View
Die Up
( ) Designates LPC Mode
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
5
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Table 1: Pin Description
Symbol Pin Name Type1
Interface
FunctionsPP LPC
A10-A0Address I X Inputs for low-order addresses during Read and Write operations.
Addresses are internally latched during a Write cycle. For the pro-
gramming interface, these addresses are latched by R/C# and share
the same pins as the high-order address inputs.
DQ7-DQ0Data I/O X To output data during Read cycles and receive input data during
Write cycles. Data is internally latched during a Write cycle. The out-
puts are in tri-state when OE# is high.
OE# Output Enable I X To gate the data output buffers.
WE# Write Enable I X To control the Write operations.
MODE Interface
Mode Select
I X X This pin determines which interface is operational. When held high,
programmer mode is enabled and when held low, LPC mode is
enabled. This pin must be setup at power-up or before return from
reset and not change during device operation. This pin must be held
high (VIH) for PP mode and low (VIL) for LPC mode.
INIT# Initialize I X This is the second reset pin for in-system use. This pin is inter-
nally combined with the RST# pin; If this pin or RST# pin is driven
low, identical operation is exhibited.
ID[3:0] Identification
Inputs
I X These four pins are part of the mechanism that allows multiple parts to
be attached to the same bus. The strapping of these pins is used to
identify the component.The boot device must have ID[3:0]=0000 for all
subsequent devices should use sequential up-count strapping. These
pins are internally pulled-down with a resistor between 20-100 K
GPI[4:0] General
Purpose
Inputs
I X These individual inputs can be used for additional board flexibility. The
state of these pins can be read through LPC registers. These inputs
should be at their desired state before the start of the PCI clock cycle dur-
ing which the read is attempted, and should remain in place until the end
of the Read cycle. Unused GPI pins must not be floated.
TBL# Top Block
Lock
I X When low, prevents programming to the boot block sectors at top of
memory. When TBL# is high it disables hardware write protection for
the top block sectors. This pin cannot be left unconnected.
LAD[3:0] Address and
Data
I/O X To provide LPC control signals, as well as addresses and Command
Inputs/Outputs data.
LCLK Clock I X To provide a clock input to the control unit
LFRAME#
Frame I X To indicate start of a data transfer operation; also used to abort
an LPC cycle in progress.
RST# Reset I X X To reset the operation of the device
WP# Write Protect I X When low, prevents programming to all but the highest addressable
blocks. When WP# is high it disables hardware write protection for
these blocks. This pin cannot be left unconnected.
R/C# Row/Column
Select
IX
Select for the Programming interface, this pin determines whether the address
pins are pointing to the row addresses, or to the column addresses.
RES Reserved X These pins must be left unconnected.
VDD Power Supply PWR X X To provide power supply (3.0-3.6V)
VSS Ground PWR X X Circuit ground (0V reference)
CE# Chip Enable I X This signal must be asserted to select the device. When CE# is low,
the device is enabled. When CE# is high, the device is placed in low
power standby mode.
NC No Connection I X X Unconnected pins.
T1.0 25026
1. I=Input, O=Output
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
6
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Device Memory Maps
Figure 4: Device Memory Map
0FFFFFH
0F0000H
0EFFFFH
0E0000H
0DFFFFH
0D0000H
0CFFFFH
0C0000H
0BFFFFH
0B0000H
0AFFFFH
0A0000H
09FFFFH
090000H
08FFFFH
080000H
07FFFFH
070000H
06FFFFH
060000H
05FFFFH
050000H
04FFFFH
040000H
03FFFFH
030000H
02FFFFH
020000H
01FFFFH
010000H
00FFFFH
Block 7
Block 8
Block 6
Block 5
Block 4
Block 3
Block 2
Block 1
Block 15
Block 14
Block 13
Block 12
Block 11
Block 10
Block 9
Block 0
(64 KByte)
1235 F03.0
WP# for
Block 0 14
TBL#
4 KByte Sector 1
4 KByte Sector 2
4 KByte Sector 15
4 KByte Sector 0
Boot Block
002000H
001000H
000000H
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
7
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Design Considerations
SST recommends a high frequency 0.1 µF ceramic capacitor to be placed as close as possible
between VDD and VSS less than 1 cm away from the VDD pin of the device. Additionally, a low fre-
quency 4.7 µF electrolytic capacitor from VDD to VSS should be placed within 5 cm of the VDD pin. If you
use a socket for programming purposes add an additional 1-10 µF next to each socket.
Product Identification
The Product Identification mode identifies the device as the SST49LF080A and manufacturer as SST.
Mode Selection
The SST49LF080A flash memory devices can operate in two distinct interface modes: the LPC mode
and the Parallel Programming (PP) mode. The mode pin is used to set the interface mode selection. If
the mode pin is set to logic High, the device is in PP mode. If the mode pin is set Low, the device is in
the LPC mode. The mode selection pin must be configured prior to device operation. The mode pin is
internally pulled down if the pin is left unconnected. In LPC mode, the device is configured to its host
using standard LPC interface protocol. Communication between Host and the SST49LF080A occurs
via the 4-bit I/O communication signals, LAD [3:0] and LFRAME#. In PP mode, the device is pro-
grammed via an 11-bit address and an 8-bit data I/O parallel signals. The address inputs are multi-
plexed in row and column selected by control signal R/C# pin. The row addresses are mapped to the
lower internal addresses (A10-0), and the column addresses are mapped to the higher internal
addresses (AMS-11). See Figure 4, the Device Memory Map, for address assignments.
Table 2: Product Identification
Address Data
Manufacturer’s ID 0000H BFH
Device ID
SST49LF080A 0001H 5BH
T2.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
8
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
LPC Mode
Device Operation
The LPC mode uses a 5-signal communication interface, a 4-bit address/data bus, LAD[3:0], and a
control line, LFRAME#, to control operations of the SST49LF080A. Cycle type operations such as
Memory Read and Memory Write are defined in Intel Low Pin Count Interface Specification, Revision
1.0. JEDEC Standard SDP (Software Data Protection) Program and Erase commands sequences are
incorporated into the standard LPC memory cycles. See Figures 7 through 12 for command
sequences.
LPC signals are transmitted via the 4-bit Address/Data bus (LAD[3:0]), and follow a particular
sequence, depending on whether they are Read or Write operations. LPC memory Read and Write
cycle is defined in Tables 5 and 6.
Both LPC Read and Write operations start in a similar way as shown in Figures 5 and 6. The host
(which is the term used here to describe the device driving the memory) asserts LFRAME# for two or
more clocks and drives a start value on the LAD[3:0] bus.
At the beginning of an operation, the host may hold the LFRAME# active for several clock cycles, and
even change the Start value. The LAD[3:0] bus is latched every rising edge of the clock. On the cycle
in which LFRAME# goes inactive, the last latched value is taken as the Start value. CE# must be
asserted one cycle before the start cycle to select the SST49LF080A for Read and Write operations.
Once the SST49LF080A identifies the operation as valid (a start value of all zeros), it next expects a
nibble that indicates whether this is a memory Read or Write cycle. Once this is received, the device is
now ready for the Address cycles. The LPC protocol supports a 32-bit address phase. The
SST49LF080A encodes ID and register space access in the address field. See Table 3 for address bits
definition.
For Write operation the Data cycle will follow the Address cycle, and for Read operation TAR and
SYNC cycles occur between the Address and Data cycles. At the end of every operation, the control of
the bus must be returned to the host by a 2-clock TAR cycle.
Table 3: Address bits definition
A31:A
251
1. The top 32MByte address range FFFF FFFFH to FE00 0000H and the bottom 128 KByte memory access address
000F FFFFH to 000E 0000H are decoded.
A24:A23 A22 A21:A
20 A19:A0
1111 111b or 0000 000b ID[3:2]2
2. See Table 7 for multiple device selection configuration
1 = Memory Access
0 = Register access
ID[1:0]2Device Memory address
T3.1 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
9
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
CE#
The CE# pin, enables and disables the SST49LF080A, controlling read and write access of the device.
To enable the SST49LF080A, the CE# pin must be driven low one clock cycle prior to LFRAME# being
driven low. The device will enter standby mode when internal Write operations are completed and CE#
is high.
LFRAME#
The LFRAME# signifies the start of a (frame) bus cycle or the termination of an undesired cycle.
Asserting LFRAME# for two or more clock cycle and driving a valid START value on LAD[3:0] will initi-
ate device operation. The device will enter standby mode when internal operations are completed and
LFRAME# is high.
TBL#, WP#
The Top Boot Lock (TBL#) and Write Protect (WP#) pins are provided for hardware write protection of
device memory. The TBL# pin is used to Write-Protect 16 boot sectors (64 KByte) at the highest mem-
ory address range for the SST49LF080A. The WP# pin write protects the remaining sectors in the
flash memory.
An active low signal at the TBL# pin prevents Program and Erase operations of the top boot sectors.
When TBL# pin is held high, the write protection of the top boot sectors is disabled. The WP# pin
serves the same function for the remaining sectors of the device memory. The TBL# and WP# pins
write protection functions operate independently of one another.
Both TBL# and WP# pins must be set to their required protection states prior to starting a Program or
Erase operation. A logic level change occurring at the TBL# or WP# pin during a Program or Erase
operation could cause unpredictable results.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
10
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
INIT#, RST#
AV
IL on INIT# or RST# pin initiates a device reset. INIT# and RST# pins have the same function
internally. It is required to drive INIT# or RST# pins low during a system reset to ensure proper
CPU initialization. During a Read operation, driving INIT# or RST# pins low deselects the device
and places the output drivers, LAD[3:0], in a high-impedance state. The reset signal must be held
low for a minimal duration of time TRSTP. A reset latency will occur if a reset procedure is performed
during a Program or Erase operation. See Table 19, Reset Timing Parameters for more informa-
tion. A device reset during an active Program or Erase will abort the operation and memory con-
tents may become invalid due to data being altered or corrupted from an incomplete Erase or
Program operation.
System Memory Mapping
The LPC interface protocol has address length of 32-bit or 4 GByte. The SST49LF080A will
respond to addresses in the range as specified in Table 4.
Refer to “Multiple Device Selection” section for more detail on strapping multiple SST49LF080A
devices to increase memory densities in a system and “Registers” section on valid register
addresses.
Table 4: Address Decoding Range
ID Strapping Device Access Address Range Memory Size
Device #0 - 3 Memory Access FFFF FFFFH : FFC0 0000H 4 MByte
Register Access FFBF FFFFH : FF80 0000H 4 MByte
Device #4 - 7 Memory Access FF7F FFFFH : FF40 0000H 4 MByte
Register Access FF3F FFFFH : FF00 0000H 4 MByte
Device #8 - 11 Memory Access FEFF FFFFH : FEC0 0000H 4 MByte
Register Access FEBF FFFFH : FE80 0000H 4 MByte
Device #12 - 15 Memory Access FE7F FFFFH : FE40 0000H 4 MByte
Register Access FE3F FFFFH : FE00 0000H 4 MByte
Device #01
1. For device #0 (Boot Device), SST49LF080A decodes the physical addresses of the top 2 blocks (including Boot
Block) both at
system memory ranges FFFF FFFFH to FFFE 0000H and 000F FFFFH to 000E 0000H.
Memory Access 000F FFFFH : 000E 0000H 128 KByte
T4.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
11
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 5: LPC Read Cycle Waveform
Table 5: LPC Read Cycle
Clock
Cycle
Field
Name
Field
Contents
LAD[3:0]1
LAD[3:0]
Direction Comments
1 START 0000 IN LFRAME# must be active (low) for the part to respond.
Only the last start field (before LFRAME# transitions
high) should be recognized.
2 CYCTYPE
+ DIR
010X IN Indicates the type of cycle. Bits 3:2 must be “01b” for memory
cycle. Bit 1 indicates the type of transfer “0” for Read. Bit 0 is
reserved.
3-10 ADDRESS YYYY IN Address Phase for Memory Cycle. LPC protocol sup-
ports a 32-bit address phase. YYYY is one nibble of the
entire address. Addresses are transferred most-signifi-
cant nibble fist. See Table 3 for address bits definition
and Table 4 for valid memory address range.
11 TAR0 1111 IN
then Float
In this clock cycle, the host has driven the bus to all 1s
and then floats the bus. This is the first part of the bus
“turnaround cycle.”
12 TAR1 1111 (float) Float
then OUT
The SST49LF080A takes control of the bus during this
cycle
13 SYNC 0000 OUT The SST49LF080A outputs the value 0000b indicating
that data will be available during the next clock cycle.
14 DATA ZZZZ OUT This field is the least-significant nibble of the data byte.
15 DATA ZZZZ OUT This field is the most-significant nibble of the data byte.
16 TAR0 1111 OUT
then Float
In this clock cycle, the SST49LF080A has driven the bus
to all 1s and then floats the bus. This is the first part of
the bus “turnaround cycle.”
17 TAR1 1111 (float) Float
then IN
The host takes control of the bus during this cycle
T5.0 25026
1. Field contents are valid on the rising edge of the present clock cycle.
1235 F04.0
LCLK
CE#
LFRAME#
LAD[3:0]
0000b 010Xb A[23:20]
A[19:16]
A[3:0]A[7:4]A[11:8]A[15:12] 1111b Tri-State
2Clocks
TA R 0
Load Address in 8 Clocks
Address
1Clock 1Clock
Start
CYCTYPE
+
DIR
TA R
1Clock
Sync Data
Data Out 2 Clocks
0000b D[7:4]D[3:0]
A[31:28] A[27:24]
TA R 1
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
12
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 6: LPC Write Cycle Waveform
Table 6: LPC Write Cycle
Clock
Cycle
Field
Name
Field
Contents
LAD[3:0]1
LAD[3:0]
Direction Comments
1 START 0000 IN LFRAME# must be active (low) for the part to
respond. Only the last start field (before
LFRAME# transitions high) should be recog-
nized.
2 CYCTYPE
+ DIR
011X IN Indicates the type of cycle. Bits 3:2 must be
“01b” for memory cycle. Bit 1 indicates the
type of transfer “1” for Write. Bit 0 is reserved.
3-10 ADDRESS YYYY IN Address Phase for Memory Cycle. LPC protocol
supports a 32-bit address phase. YYYY is one
nibble of the entire address. Addresses are
transferred most-significant nibble first. See
Table 3 for address bits definition and Table 4 for
valid memory address range.
11 DATA ZZZZ IN This field is the least-significant nibble of the data
byte.
12 DATA ZZZZ IN This field is the most-significant nibble of the
data byte.
13 TAR0 1111 IN then Float In this clock cycle, the host has driven the bus to
all ‘1’s and then floats the bus. This is the first
part of the bus “turnaround cycle.”
14 TAR1 1111 (float) Float then
OUT
The SST49LF080A takes control of the bus dur-
ing this cycle.
15 SYNC 0000 OUT The SST49LF080A outputs the values 0000, indicat-
ing that it has received data or a flash command.
16 TAR0 1111 OUT then
Float
In this clock cycle, the SST49LF080A has driven
the bus to all ‘1’s and then floats the bus. This is
the first part of the bus “turnaround cycle.”
17 TAR1 1111 (float) Float then IN Host resumes control of the bus during this cycle.
T6.0 25026
1. Field contents are valid on the rising edge of the present clock cycle.
1235 F05.0
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20]
A[19:16]
A[3:0]A[7:4]A[11:8]A[15:12] 1111b Tri-State
2Clocks
TA R 0
Load Address in 8 Clocks
Address
1Clock 1Clock
Start
CYCTYPE
+
DIR
TA R
1Clock
Sync
Data
Load Data in 2 Clocks
0000bD[7:4]D[3:0]
LCLK
CE#
A[31:28] A[27:24]
Data
TA R 1
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
13
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Response To Invalid Fields
During LPC Read/Write operations, the SST49LF080A will not explicitly indicate that it has received
invalid field sequences. The response to specific invalid fields or sequences is as follows:
Address out of range: The SST49LF080A will only respond to address ranges as specified in Table 4.
ID mismatch: ID information is included in every address cycle. The SST49LF080A will compare ID
bits in the address field with the hardware ID strapping. If there is a mis-match, the device will ignore
the cycle. See Multiple Device Selection section for details.
Once valid START, CYCTYPE + DIR, valid address range and ID bits are received, the SST49LF080A
will always complete the bus cycle. However, if the device is busy performing a flash Erase or Program
operation, no new internal Write command (memory write or register write) will be executed. As long
as the states of LAD[3:0] and LAD[4] are known, the response of the SST49LF080A to signals
received during the LPC cycle should be predictable.
Abort Mechanism
If LFRAME# is driven low for one or more clock cycles after the start of an LPC cycle, the cycle will be
terminated. The host may drive the LAD[3:0] with ‘1111b’ (ABORT nibble) to return the interface to
ready mode. The ABORT only affects the current bus cycle. For a multi-cycle command sequence,
such as the Erase or Program SDP commands, ABORT doesn’t interrupt the entire command
sequence, but only the current bus cycle of the command sequence. The host can re-send the bus
cycle and continue the SDP command sequence after the device is ready again.
Write Operation Status Detection
The SST49LF080A device provides two software means to detect the completion of a Write (Program
or Erase) cycle, in order to optimize the system Write cycle time. The software detection includes two
status bits: Data# Polling, D[7], and Toggle Bit, D[6]. The End-of-Write detection mode is incorporated
into the LPC Read Cycle. The actual completion of the nonvolatile write is asynchronous with the sys-
tem; therefore, either a Data# Polling or Toggle Bit read may be simultaneous with the completion of
the Write cycle. If this occurs, the system may possibly get an erroneous result, i.e., valid data may
appear to conflict with either D[7] or D[6]. In order to prevent spurious rejection, if an erroneous result
occurs, the software routine should include a loop to read the accessed location an additional two (2)
times. If both reads are valid, then the device has completed the Write cycle, otherwise the rejection is
valid.
Data# Polling
When the SST49LF080A device is in the internal Program operation, any attempt to read D[7] will pro-
duce the complement of the true data. Once the Program operation is completed, D[7] will produce
true data. Note that even though D[7] may have valid data immediately following the completion of an
internal Write operation, the remaining data outputs may still be invalid: valid data on the entire data
bus will appear in subsequent successive Read cycles after an interval of 1 µs. During internal Erase
operation, any attempt to read D[7] will produce a ‘0’. Once the internal Erase operation is completed,
D[7] will produce a ‘1’. Proper status will not be given using Data# Polling if the address is in the invalid
range.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
14
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Toggle Bit
During the internal Program or Erase operation, any consecutive attempts to read D[6] will produce
alternating 0s and 1s, i.e., toggling between 0 and 1. When the internal Program or Erase operation is
completed, the toggling will stop.
Multiple Device Selection
Multiple LPC flash devices may be strapped to increase memory densities in a system. The four ID
pins, ID[3:0], allow up to 16 devices to be attached to the same bus by using different ID strapping in a
system. BIOS support, bus loading, or the attaching bridge may limit this number. The boot device
must have an ID of 0 (determined by ID[3:0]); subsequent devices use incremental numbering. Equal
density must be used with multiple devices.
When used as a boot device, ID[3:0] must be strapped as 0000; all subsequent devices should use a
sequential up-count strapping (i.e. 0001, 0010, 0011, etc.). With the hardware strapping, ID informa-
tion is included in every LPC address memory cycle. The ID bits in the address field are inverse of the
hardware strapping. The address bits [A24:A23,A
21:A20] are used to select the device with proper IDs.
See Table 7 for IDs. The SST49LF080A will compare these bits with ID[3:0]’s strapping values. If there
is a mismatch, the device will ignore the remainder of the cycle.
Table 7: Multiple Device Selection Configuration
Device #
Hardware Strapping Address Bits Decoding
ID[3:0] A24 A23 A21 A20
0 (Boot device) 0000 1 1 1 1
1 0001 1 1 1 0
2 0010 1 1 0 1
3 0011 1 1 0 0
4 0100 1 0 1 1
5 0101 1 0 1 0
6 0110 1 0 0 1
7 0111 1 0 0 0
8 1000 0 1 1 1
9 1001 0 1 1 0
10 1010 0 1 0 1
11 1011 0 1 0 0
12 1100 0 0 1 1
13 1101 0 0 1 0
14 1110 0 0 0 1
15 1111 0 0 0 0
T7.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
15
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Registers
There are two registers available on the SST49LF080A, the General Purpose Inputs Registers
(GPI_REG) and the JEDEC ID Registers. Since multiple LPC memory devices may be used to
increase memory densities, these registers appear at its respective address location in the 4 GByte
system memory map. Unused register locations will read as 00H. Any attempt to read registers during
internal Write operation will respond as “Write operation status detection” (Data# Polling or Toggle Bit).
Any attempt to write any registers during internal Write operation will be ignored. Table 9 lists
GPI_REG and JEDEC ID address locations for SST49LF080A with its respective device strapping.
Table 8: General Purpose Inputs Register
Bit Function
Pin #
32-PLCC 32-TSOP
7:5 Reserved - -
4 GPI[4]
Reads status of general
purpose input pin
30 6
3 GPI[3]
Reads status of general
purpose input pin
311
2 GPI[2]
Reads status of general
purpose input pin
412
1 GPI[1]
Reads status of general
purpose input pin
513
0 GPI[0]
Reads status of general
purpose input pin
614
T8.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
16
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
General Purpose Inputs Register
The GPI_REG (General Purpose Inputs Register) passes the state of GPI[4:0] pins at power-up on the
SST49LF080A. It is recommended that the GPI[4:0] pins be in the desired state before LFRAME# is
brought low for the beginning of the next bus cycle, and remain in that state until the end of the cycle.
There is no default value since this is a pass-through register. See the General Purpose Inputs Regis-
ter table for the GPI_REG bits and function, and Table 9 for memory address locations for its respec-
tive device strapping.
JEDEC ID Registers
The JEDEC ID registers identify the device as SST49LF080A and manufacturer as SST in LPC mode.
See Table 9 for memory address locations for its respective JEDEC ID location.
Table 9: Memory Map Register Addresses for SST49LF080A
Device # Hardware Strapping ID[3:0] GPI_REG
JEDEC ID
Manufacturer Device
0 (Boot device) 0000 FFBC 0100H FFBC 0000H FFBC 0001H
1 0001 FFAC 0100H FFAC 0000H FFAC 0001H
2 0010 FF9C 0100H FF9C 0000H FF9C 0001H
3 0011 FF8C 0100H FF8C 0000H FF8C 0001H
4 0100 FF3C 0100H FF3C 0000H FF3C 0001H
5 0101 FF2C 0100H FF2C 0000H FF2C 0001H
6 0110 FF1C 0100H FF1C 0000H FF1C 0001H
7 0111 FF0C 0100H FF0C 0000H FF0C 0001H
8 1000 FEBC 0100H FEBC 0000H FEBC 0001H
9 1001 FEAC 0100H FEAC 0000H FEAC 0001H
10 1010 FE9C 0100H FE9C 0000H FE9C 0001H
11 1011 FE8C 0100H FE8C 0000H FE8C 0001H
12 1100 FE3C 0100H FE3C 0000H FE3C 0001H
13 1101 FE2C 0100H FE2C 0000H FE2C 0001H
14 1110 FE1C 0100H FE1C 0000H FE1C 0001H
15 1111 FE0C 0100H FE0C 0000H FE0C 0001H
T9.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
17
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Parallel Programming Mode
Device Operation
Commands are used to initiate the memory operation functions of the device. The data portion of the
software command sequence is latched on the rising edge of WE#. During the software command
sequence the row address is latched on the falling edge of R/C# and the column address is latched on
the rising edge of R/C#.
Reset
Driving the RST# low will initiate a hardware reset of the SST49LF080A. See Table 25 for Reset timing
parameters and Figure 17 for Reset timing diagram.
Read
The Read operation of the SST49LF080A device is controlled by OE#. OE# is the output control and is
used to gate data from the output pins. Refer to the Read cycle timing diagram, Figure 18, for further
details.
Byte-Program Operation
The SST49LF080A device is programmed on a byte-by-byte basis. Before programming, one must
ensure that the sector in which the byte is programmed is fully erased. The Byte-Program operation is
initiated by executing a four-byte command load sequence for Software Data Protection with address
(BA) and data in the last byte sequence. During the Byte-Program operation, the row address (A10-A0)
is latched on the falling edge of R/C# and the column address (A21-A11) is latched on the rising edge of
R/C#. The data bus is latched on the rising edge of WE#. The Program operation, once initiated, will
be completed, within 20 µs. See Figure 22 for Program operation timing diagram and Figure 34 for its
flowchart. During the Program operation, the only valid reads are Data# Polling and Toggle Bit. During
the internal Program operation, the host is free to perform additional tasks. Any commands written dur-
ing the internal Program operation will be ignored.
Sector-Erase Operation
The Sector-Erase operation allows the system to erase the device on a sector-by-sector basis. The
sector architecture is based on uniform sector size of 4 KByte. The Sector-Erase operation is initiated
by executing a six-byte command load sequence for Software Data Protection with Sector-Erase com-
mand (30H) and sector address (SA) in the last bus cycle. The internal Erase operation begins after
the sixth WE# pulse. The End-of-Erase can be determined using either Data# Polling or Toggle Bit
methods. See Figure 23 for Sector-Erase timing waveforms. Any commands written during the Sector-
Erase operation will be ignored.
Block-Erase Operation
The Block-Erase Operation allows the system to erase the device in 64 KByte uniform block size for
the SST49LF080A. The Block-Erase operation is initiated by executing a six-byte command load
sequence for Software Data Protection with Block-Erase command (50H) and block address. The
internal Block-Erase operation begins after the sixth WE# pulse. The End-of-Erase can be determined
using either Data# Polling or Toggle Bit methods. See Figure 24 for Block-Erase timing waveforms. Any
commands written during the Block-Erase operation will be ignored.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
18
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Chip-Erase Operation
The SST49LF080A devices provide a Chip-Erase operation, which allows the user to erase the entire
memory array to the “1s” state. This is useful when the entire device must be quickly erased.
The Chip-Erase operation is initiated by executing a six- byte Software Data Protection command
sequence with Chip-Erase command (10H) with address 5555H in the last byte sequence. The internal
Erase operation begins with the rising edge of the sixth WE#. During the internal Erase operation, the
only valid read is Toggle Bit or Data# Polling. See Table 11 for the command sequence, Figure 25 for
Chip-Erase timing diagram, and Figure 37 for the flowchart. Any commands written during the Chip-
Erase operation will be ignored.
Write Operation Status Detection
The SST49LF080A devices provide two software means to detect the completion of a Write (Program
or Erase) cycle, in order to optimize the system Write cycle time. The software detection includes two
status bits: Data# Polling D[7] and Toggle Bit D[6]. The End-of-Write detection mode is enabled after
the rising edge of WE# which initiates the internal Program or Erase operation.
The actual completion of the nonvolatile write is asynchronous with the system; therefore, either a
Data# Polling or Toggle Bit read may be simultaneous with the completion of the Write cycle. If this
occurs, the system may possibly get an erroneous result, i.e., valid data may appear to conflict with
either D[7] or D[6]. In order to prevent spurious rejection, if an erroneous result occurs, the software
routine should include a loop to read the accessed location an additional two (2) times. If both reads
are valid, then the device has completed the Write cycle, otherwise the rejection is valid.
Data# Polling (DQ7)
When the SST49LF080A device is in the internal Program operation, any attempt to read DQ7will pro-
duce the complement of the true data. Once the Program operation is completed, DQ7will produce
true data. Note that even though DQ7may have valid data immediately following the completion of an
internal Write operation, the remaining data outputs may still be invalid: valid data on the entire data
bus will appear in subsequent successive Read cycles after an interval of 1 µs. During internal Erase
operation, any attempt to read DQ7will produce a ‘0’. Once the internal Erase operation is completed,
DQ7will produce a ‘1’. The Data# Polling is valid after the rising edge of fourth WE# pulse for Program
operation. For Sector-, Block-, or Chip-Erase, the Data# Polling is valid after the rising edge of sixth
WE# pulse. See Figure 20 for Data# Polling timing diagram and Figure 35 for a flowchart. Proper sta-
tus will not be given using Data# Polling if the address is in the invalid range.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
19
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Toggle Bit (DQ6)
During the internal Program or Erase operation, any consecutive attempts to read DQ6will produce
alternating ‘0’s and ‘1’s, i.e., toggling between 0 and 1. When the internal Program or Erase operation
is completed, the toggling will stop. The device is then ready for the next operation. The Toggle Bit is
valid after the rising edge of fourth WE# pulse for Program operation. For Sector-, Block-, or Chip-
Erase, the Toggle Bit is valid after the rising edge of sixth WE# pulse. See Figure 21 for Toggle Bit tim-
ing diagram and Figure 35 for a flowchart.
Data Protection (PP Mode)
The SST49LF080A devices provide both hardware and software features to protect nonvolatile data
from inadvertent writes.
Hardware Data Protection
Noise/Glitch Protection: A WE# pulse of less than 5 ns will not initiate a Write cycle.
VDD Power Up/Down Detection: The Write operation is inhibited when VDD is less than 1.5V.
Write Inhibit Mode: Forcing OE# low, WE# high will inhibit the Write operation. This prevents inadver-
tent writes during power-up or power-down.
Software Data Protection (SDP)
The SST49LF080A provides the JEDEC approved Software Data Protection scheme for all data alter-
ation operation, i.e., Program and Erase. Any Program operation requires the inclusion of a series of
three-byte sequence. The three-byte load sequence is used to initiate the Program operation, provid-
ing optimal protection from inadvertent Write operations, e.g., during the system power-up or power-
down. Any Erase operation requires the inclusion of a six-byte load sequence.
Table 10:Operation Modes Selection (PP Mode)
Mode RST# OE# WE# DQ Address
Read VIH VIL VIH DOUT AIN
Program VIH VIH VIL DIN AIN
Erase VIH VIH VIL X1
1. X can be VIL or VIH, but no other value.
Sector or Block address,
XXH for Chip-Erase
Reset VIL X X High Z X
Write Inhibit VIH
X
VIL
X
X
VIH
High Z/DOUT
High Z/DOUT
X
X
Product Identification VIH VIL VIH Manufacturer’s ID
(BFH) Device ID2
2. Device ID = 5BH for SST49LF080A
See Table 11
T10.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
20
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Software Command Sequence
Table 11:Software Command Sequence
Command
Sequence
1st1
Cycle
1. LPC mode use consecutive Write cycles to complete a command sequence; PP mode use consecutive bus cycles to
complete a command sequence.
2nd1
Cycle
3rd1
Cycle
4th1
Cycle
5th1
Cycle
6th1
Cycle
Addr2
2. YYYY = A[31:16]. In LPC mode, during SDP command sequence, YYYY must be within memory address range speci-
fied in Table 4. In PP mode, YYYY can be VIL or VIH, but no other value.
Data Addr2Data Addr2Data Addr2Data Addr2Data Addr2Data
Byte-Program
YYYY 5555H AAH YYYY 2AAA
H
55H YYYY 5555
H
A0H PA
3
3. PA = Program Byte address
Data
Sector-Erase YYYY 5555H AAH YYYY 2AAA
H
55H YYYY 5555
H
80H YYYY 5555
H
AAH YYYY 2AAA
H
55H SA
X4
4. SAXfor Sector-Erase Address
30H
Block-Erase YYYY 5555H AAH YYYY 2AAA
H
55H YYYY 5555
H
80H YYYY 5555
H
AAH YYYY 2AAA
H
55H BA
X5
5. BAXfor Block-Erase Address
50H
Chip-Erase6
6. Chip-Erase is supported in PP mode only
YYYY 5555H AAH YYYY 2AAA
H
55H YYYY 5555
H
80H YYYY 5555
H
AAH YYYY 2AAA
H
55H YYYY 5555
H
10H
Software
ID Entry
YYYY 5555H AAH YYYY 2AAA
H
55H YYYY 5555
H
90H Read ID
7
7. SST Manufacturer’s ID = BFH, is read with A0=0.
With A19-A1= 0; SST49LF080A Device ID = 5BH, is read with A0=1.
Software
ID Exit8
8. Both Software ID Exit operations are equivalent
XXXX XXXXH F0H
Software
ID Exit8
YYYY 5555H AAH YYYY 2AAA
H
55H YYYY 5555
H
F0H
T11.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
21
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 7: Program Command Sequence (LPC Mode)
1235 F06.0
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] 0101b 0101b 0101b 1010b0101b 1010b Tri-State
TA R
Load Address YYYY 5555H in 8 Clocks
Write the 1st command to the device in LPC mode.
Address1
1 Clock 1 Clock
1st Start
Memory
Write
Cycle
TA R
SyncData Start next
Command
1 Clock
1 Clock2 ClocksLoad Data AAH in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] 1010b 1010b 1010b 0101b0010b 0101b Tri-State
TA R
Load Address YYYY 2AAAH in 8 Clocks
Write the 2nd command to the device in LPC mode.
Address1
1 Clock 1 Clock
2nd Start
Memory
Write
Cycle
TA R
SyncData Start next
Command
1 Clock
1 Clock2 ClocksLoad Data 55H in 2 Clocks
1111b 0000b
LCLK
LFRAME#
Load Address YYYY 5555H in 8 Clocks
Write the 3rd command to the device in LPC mode.
1 Clock 1 Clock
3rd Start
1 Clock
1 Clock2 ClocksLoad Data A0H in 2 Clocks
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] A[11:8] A[7:4] A[3:0] D[7:4]A[15:12] D[3:0] Tri-State
TA R
Load Ain in 8 Clocks
Write the 4th command (target locations to be programmed) to the device in LPC mode.
Address1
1 Clock 1 Clock
4th Start
Memory
Write
Cycle
TA R
SyncData
Internal
program start
Internal
program start
1 Clock2 ClocksLoad Data in 2 Clocks
1111b 0000b
CE#
CE#
CE#
CE#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] 0101b 0101b 0101b 1010b0101b 0000b Tri-State
TA RAddress1
TA R
SyncData
Start next
Command
1111b 0000b
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
Note: 1. Address must be within memory address range specified in Table 4.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
22
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 8: Data# Polling Command Sequence (LPC Mode)
1235 F07.0
0000b 011Xb A[11:8] A[7:4] A[3:0] Dn[7:4]
A[15:12]
D[3:0] Tri-State
TA R
Load Address in 8 Clocks
Write the last command (Program or Erase) to the device in LPC mode.
Address1
1 Clock 1 Clock
1st Start
Memory
Write
Cycle
TA R
SyncData Start next
Command
1 Clock
1 Clock2 ClocksLoad Data in 2 Clocks
1111b 0000b 0000b
LAD[3:0]
Read the DQ7to see if internal write complete or not.
LCLK
LFRAME#
LAD[3:0]
0000b 010Xb A[11:8] A[7:4] A[3:0] D7,xxx
A[15:12]
XXXXbTri-State
TA R
Load Address in 8 Clocks
When internal write complete, the DQ7will equal to D7.
Address1
1 Clock 1 Clock
Start
Memory
Read
Cycle
TA R
Sync Data
Next start
1 Clock
Data out 2 Clocks1 Clock2 Clocks
1111b 0000b 0000b
LFRAME#
LCLK
0000b 010Xb A[11:8] A[7:4] A[3:0]
D7#,xxx
A[15:12]
XXXXbTri-State
TA R
Load Address in 8 Clocks
Address1
1 Clock 1 Clock
Start
Memory
Read
Cycle
TA R
Sync Data
Next start
1 Clock
Data out 2 Clocks1 Clock2 Clocks
1111b 0000b 0000b
CE#
CE#
A[23:20] A[19:16]
A[23:20] A[19:16]
A[23:20] A[19:16]
LFRAME#
LAD[3:0]
LCLK
CE#
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
Note: 1. Address must be within memory address range specified in Table 4.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
23
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 9: Toggle Bit Command Sequence (LPC Mode)
1235 F08.0
LFRAME#
LAD[3:0]
0000b 011Xb A[11:8] A[7:4] A[3:0] D[7:4]
A[15:12]
D[3:0] Tri-State
TAR
Load Address in 8 Clocks
Write the last command (Program or Erase) to the device in LPC mode.
Address1
1 Clock 1 Clock
1st Start Memory
Write
Cycle TAR
SyncData Start next
Command
1 Clock
1 Clock2 ClocksLoad Data in 2 Clocks
1111b 0000b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 010Xb
X,D6#,XXb
XXXXbTri-State
TAR
Load Address in 8 Clocks
Read the DQ6 to see if internal write complete or not.
Address1
1 Clock 1 Clock
Start Memory
Read
Cycle TAR
Sync Data
Next start
1 Clock
Data out 2 Clocks1 Clock2 Clocks
1111b 0000b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 010Xb
X,D6,XXb
XXXXbTri-State
TAR
Load Address in 8 Clocks
When internal write complete, the DQ6 will stop toggle.
Address1
1 Clock 1 Clock
Start Memory
Read
Cycle TAR
Sync Data
Next start
1 Clock
Data out 2 Clocks1 Clock2 Clocks
1111b 0000b 0000b
CE#
CE#
LCLK
CE#
A[11:8] A[7:4] A[3:0]
A[15:12]
A[11:8] A[7:4] A[3:0]
A[15:12]
A[23:20] A[19:16]
A[23:20] A[19:16]
A[23:20] A[19:16]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
Note: 1. Address must be within memory address range specified in Table 4.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
24
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 10:Sector-Erase Command Sequence (LPC Mode)
1235 F12.0
LFRAME#
LAD[3:0]
0000b 011Xb 0101b 0101b 0101b 1010b0101b 1010b Tri-State
TA R
Load Address YYYY 5555H in 8 Clocks
Write the 1st command to the device in LPC mode.
Address1
1 Clock 1 Clock
1st Start
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data AAH in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb 1010b 1010b 1010b 0101b0010b 0101b Tri-State
TA R
Load Address YYYY 2AAAH in 8 Clocks
Write the 2nd command to the device in LPC mode.
Address1
1 Clock 1 Clock
2nd Start
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data 55H in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb 0101b 0101b 0101b 1000b0101b 0000b Tri-State
TA R
Load Address YYYY 55 55H in 8 Clocks
Write the 3rd command to the device in LPC mode.
Address1
1 Clock 1 Clock
3rd Start
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data 80H in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb 0101b 0101b 0101b 1010b0101b 1010b Tri-State
TA R
Load Address YYYY 55 55H in 8 Clocks
Write the 4th command to the device in LPC mode.
Address1
1 Clock 1 Clock
4th Start
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data AAH in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb 1010b 1010b 1010b 0101b0010b 0101b
XXXXb XXXXb XXXXb 0011b
SAX
0000b
Tri-State
TA R
Load Address YYYY 2A AA in 8 ClocksH
Load Sector Address in 8 Clocks
Write the 5th command to the device in LPC mode.
Address1
1 Clock 1 Clock
5th
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data 55H in 2 Clocks
Load Data “30” in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb Tri-State
TA R
Write the 6th command (target sector to be erased) to the device in LPC mode.
SAX= Sector Address
Address1
1 Clock 1 Clock
6th Start
Memory
Write
Cycle
TA R
SyncData
Internal
erase start
Internal
erase start
1 Clock2 Clocks
1111b 0000b
CE#
CE#
CE#
CE#
CE#
LCLK
CE#
A[23:20] A[19:16]
A[23:20] A[19:16]
A[23:20] A[19:16]
A[23:20] A[19:16]
A[23:20] A[19:16]
A[23:20] A[19:16]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
25
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 11:Block-Erase Command Sequence (LPC Mode)
1235 F10.0
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] 0101b 0101b 0101b 1010b0101b 1010b Tri-State
TA R
Load Address YYYY 55 55H in 8 Clocks
Write the 1st command to the device in LPC mode.
Address1
1 Clock 1 Clock
1st Start
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data AAH in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] 1010b 1010b 1010b 0101b0010b 0101b Tri-State
TA R
Load Address YYYY 2AAAH in 8 Clocks
Write the 2nd command to the device in LPC mode.
Address1
1 Clock 1 Clock
2nd Start
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data 55H in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] 0101b 0101b 0101b 1000b0101b 0000b Tri-State
TA R
Load Address YYYY 55 55H in 8 Clocks
Write the 3rd command to the device in LPC mode.
Address1
1 Clock 1 Clock
3rd Start
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data 80H in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] 0101b 0101b 0101b 1010b0101b 1010b Tri-State
TA R
Load Address YYYY 5555H in 8 Clocks
Write the 4th command to the device in LPC mode.
Address1
1 Clock 1 Clock
4th Start
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data AAH in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] A[19:16] 1010b 1010b 1010b 0101b0010b 0101b
A[19:16] XXXXb XXXXb XXXXb 0101b
BA
X
0000b
Tri-State
TA R
Load Address YYYY 2A AAH in 8 Clocks
Load Block Address in 8 Clocks
Write the 5th command to the device in LPC mode.
Address1
1 Clock 1 Clock
5th
Memory
Write
Cycle
TA R
SyncData
Start next
Command
1 Clock
1 Clock2 ClocksLoad Data 55H in 2 Clocks
Load Data “50” in 2 Clocks
1111b 0000b
LCLK
LFRAME#
LAD[3:0]
0000b 011Xb A[23:20] Tri-State
TA R
Write the 6th command (target sector to be erased) to the device in LPC mode.
BAX= Block Address
Address1
1 Clock 1 Clock
6th Start
Memory
Write
Cycle
TA R
SyncData
Internal
erase start
Internal
erase start
1 Clock2 Clocks
1111b 0000b
CE#
CE#
CE#
CE#
CE#
LCLK
CE#
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
A[31:28] A[27:24]
Note: 1. Address must be within memory address range specified in Table 4.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
26
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 12:Register Readout Command Sequence (LPC Mode)DS25086
0000b 010Xb 1111b Tri-State
TA R
Load Address in 8 Clocks
Address1
1 Clock 1 Clock
Start
Memory
Read
Cycle
TA R
Sync Data Start next
1 Clock
Data out 2 Clocks1 Clock2 Clocks
0000b D[3:0] D[7:4] 0000b
1235 F11.0
LFRAME#
LAD[3:0]
LCLK
CE#
A[23:20] A[19:16] A[11:8] A[7:4] A[3:0]A[15:12]A[31:28] A[27:24]
Note: 1. See Table 9 for register addresses.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
27
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Electrical Specifications
The AC and DC specifications for the LPC interface signals (LA0[3:0], LFRAME, LCLCK and RST#) as
defined in Section 4.2.2.4 of the PCI local Bus specification, Rev. 2.1. Refer to Table 14 for the DC volt-
age and current specifications. Refer to Tables 18 through 21 and Tables 23 through 25 for the AC tim-
ing specifications for Clock, Read, Write, and Reset operations.
Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute
Maximum Stress Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these conditions or conditions greater than those defined in the
operational sections of this datasheet is not implied. Exposure to absolute maximum stress rating con-
ditions may affect device reliability.)
Temperature Under Bias .............................................. -55°C to +125°C
Storage Temperature................................................. -65°C to +150°C
D.C. Voltage on Any Pin to Ground Potential .............................-0.5V to VDD+0.5V
Transient Voltage (<20 ns) on Any Pin to Ground Potential ..................-2.0V to VDD+2.0V
Package Power Dissipation Capability (Ta=25°C).................................... 1.0W
Surface Mount Solder Reflow Temperature1...........................260°C for 10 seconds
1. Excluding certain with-Pb 32-PLCC units, all packages are 260°C capable in both non-Pb and with-Pb solder versions.
Certain with-Pb 32-PLCC package types are capable of 240°C for 10 seconds; please consult the factory for the latest
information.
Output Short Circuit Current2................................................... 50mA
2. Outputs shorted for no more than one second. No more than one output shorted at a time.
Table 12:Operating Range
Range Ambient Temp VDD
Commercial 0°C to +85°C 3.0-3.6V
T12.1 25026
Table 13:AC Conditions of Test1
1. See Figures 28 and 29
Input Rise/Fall Time Output Load
3ns C
L=30pF
T13.1 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
28
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
DC Characteristics
Table 14:DC Operating Characteristics (All Interfaces)
Symbol Parameter
Limits
Test ConditionsMin Max Units
IDD1
1. IDD active while a Read or Write (Program or Erase) operation is in progress.
Active VDD Current LCLK (LPC mode) and Address Input (PP
mode)=VILT/VIHT
at f=33 MHz (LPC mode) or 1/TRC min (PP Mode)
All other inputs=VIL or VIH
Read 12 mA All outputs = open, VDD=VDD Max
Write 24 mA See Note2
2. For PP Mode: OE# = WE# = VIH; For LPC Mode:f=1/T
RC min, LFRAME# = VIH, CE# = VIL.
ISB Standby VDD Current
(LPC Interface)
100 µA LCLK (LPC mode) and Address Input (PP
mode)=VILT/VIHT
at f=33 MHz (LPC mode) or 1/TRC min (PP Mode)
LFRAME#=0.9 VDD, f=33 MHz, CE#=0.9 VDD,
VDD=VDD Max, All other inputs 0.9 VDD or 0.1
VDD
IRY3
3. The device is in Ready mode when no activity is on the LPC bus.
Ready Mode VDD Cur-
rent
(LPC Interface)
10 mA LCLK (LPC mode) and Address Input (PP
mode)=VILT/VIHT
at f=33 MHz (LPC mode) or 1/TRC min (PP Mode)
LFRAME#=VIL, f=33 MHz, VDD=VDD Max
All other inputs 0.9 VDD or 0.1 VDD
IIInput Current for Mode
and ID[3:0] pins
200 µA VIN=GND to VDD,V
DD=VDD Max
ILI Input Leakage Current 1 µA VIN=GND to VDD,V
DD=VDD Max
ILO Output Leakage Cur-
rent
AV
OUT=GND to VDD,V
DD=VDD Max
VIHI INIT# Input High Volt-
age
1.1 VDD+0.
5
VV
DD=VDD Max
VILI INIT# Input Low Volt-
age
-0.5 0.4 V VDD=VDD Min
VIL Input Low Voltage -0.5 0.3 VDD VV
DD=VDD Min
VIH Input High Voltage 0.5
VDD
VDD+0.
5
VV
DD=VDD Max
VOL Output Low Voltage 0.1 VDD VI
OL=1500 µA, VDD=VDD Min
VOH Output High Voltage 0.9
VDD
VI
OH=-500 µA, VDD=VDD Min
T14.0 25026
Table 15:Recommended System Power-up Timings
Symbol Parameter Minimum Units
TPU-READ1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter
Power-up to Read Operation 100 µs
TPU-WRITE1Power-up to Write Operation 100 µs
T15.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
29
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 13:LCLK Waveform (LPC Mode)
Table 16:Pin Capacitance (VDD=3.3V, Ta=25 °C, f=1 Mhz, other pins open)
Parameter Description Test Condition Maximum
CI/O1I/O Pin Capacitance VI/O=0V 12 pF
CIN1Input Capacitance VIN=0V 12 pF
T16.0 25026
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Table 17:Reliability Characteristics
Symbol Parameter
Minimum
Specification Units Test Method
NEND1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Endurance 10,000 Cycles JEDEC Standard A117
TDR1Data Retention 100 Years JEDEC Standard A103
ILTH1Latch Up 100 + IDD mA JEDEC Standard 78
T17.0 25026
Table 18:Clock Timing Parameters (LPC Mode)
Symbol Parameter Min Max Units
TCYC LCLK Cycle Time 30 ns
THIGH LCLK High Time 11 ns
TLOW LCLK Low Time 11 ns
- LCLK Slew Rate (peak-to-peak) 1 4 V/ns
- RST# or INIT# Slew Rate 50 mV/ns
T18.0 25026
1235 F12.0
0.4 VDD p-to-p
(minimum)
Tcyc
Thigh
Tlow
0.4 VDD
0.3 VDD
0.6 VDD
0.2 VDD
0.5 VDD
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
30
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 14:Reset Timing Diagram (LPC Mode)
Table 19:Reset Timing Parameters, VDD=3.0-3.6V (LPC Mode)
Symbol Parameter Min Max Units
TPRST VDD stable to Reset Low 1 ms
TKRST Clock Stable to Reset Low 100 µs
TRSTP RST# Pulse Width 100 ns
TRSTF RST# Low to Output Float 48 ns
TRST1RST# High to LFRAME# Low 1 µs
TRSTE RST# Low to reset during Sector-/Block-Erase or Pro-
gram
10 µs
T19.0 25026
1. There may be additional latency due toTRSTE if a reset procedure is performed during a Program or Erase operation.
CLK
VDD
RST#/INIT#
LFRAME#
LAD[3:0]
1235 F13.0
TPRST
TKRST TRSTP
TRSTF
TRSTE Sector-/Block-Erase
or Program operation
aborted
TRST
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
31
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
AC Characteristics
Table 20:Read/Write Cycle Timing Parameters, VDD=3.0-3.6V (LPC Mode)
Symbol Parameter Min Max Units
TCYC Clock Cycle Time 30 ns
TSU Data Set Up Time to Clock Rising 7 ns
TDH Clock Rising to Data Hold Time 0 ns
TVAL1
1. Minimum and maximum times have different loads. See PCI spec.
Clock Rising to Data Valid 2 11 ns
TBP Byte Programming Time 20 µs
TSE Sector-Erase Time 25 ms
TBE Block-Erase Time 25 ms
TON Clock Rising to Active (Float to Active Delay) 2 ns
TOFF Clock Rising to Inactive (Active to Float Delay) 28 ns
T20.0 25026
Table 21:AC Input/Output Specifications (LPC Mode)
Symbol Parameter Min Max Units Conditions
IOH(AC) Switching Current
High
-12 VDD
-17.1(VDD-VOUT)
Equation
C1
1. See PCI spec.
mA
mA
0<V
OUT 0.3 VDD
0.3 VDD <V
OUT < 0.9 VDD
0.7 VDD <V
OUT <V
DD
(Test Point) -32 VDD mA VOUT = 0.7 VDD
IOL(AC) Switching Current
Low
16 VDD
26.7 VOUT
Equation
D1
mA
mA
VDD >VOUT 0.6 VDD
0.6 VDD >V
OUT > 0.1 VDD
0.18 VDD >V
OUT >0
(Test Point) 38 VDD mA VOUT = 0.18 VDD
ICL Low Clamp Current -25+(VIN+1)/0.015 mA -3 < VIN -1
ICH High Clamp Current 25+(VIN-VDD-1)/0.015 mA VDD+4 > VIN VDD+1
slewr2
2. PCI specification output load is used.
Output Rise Slew
Rate
1 4 V/ns 0.2 VDD-0.6 VDD load
slewf2Output Fall Slew
Rate
1 4 V/ns 0.6 VDD-0.2 VDD load
T21.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
32
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 15:Output Timing Parameters (LPC Mode)
Figure 16:Input Timing Parameters (LPC Mode)
Table 22:Interface Measurement Condition Parameters (LPC Mode)
Symbol Value Units
VTH1
1. The input test environment is done with 0.1 VDD of overdrive over VIH and VIL. Timing parameters must be met with no
more overdrive than this. VMAX specified the maximum peak-to-peak waveform allowed for measuring input timing. Pro-
duction testing may use different voltage values, but must correlate results back to these parameters
0.6 VDD V
VTL10.2 VDD V
VTEST 0.4 VDD V
VMAX10.4 VDD V
Input Signal Edge Rate 1 V/ns
T22.0 25026
TVAL
TOFF
TON
1235 F14.0
LCLK
LAD [3:0]
(Valid Output Data)
LAD [3:0]
(Float Output Data)
VTEST VTL
VTH
TSU
TDH
Inputs
Valid
1235 F15.0
LCLK
LAD [3:0]
(Valid Input Data)
VTEST
VTL
VMAX
VTH
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
33
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Table 23:Read Cycle Timing Parameters, VDD=3.0-3.6V (PP Mode)
Symbol Parameter Min Max Units
TRC Read Cycle Time 270 ns
TRST RST# High to Row Address Setup 1 µs
TAS R/C# Address Set-up Time 45 ns
TAH R/C# Address Hold Time 45 ns
TAA Address Access Time 120 ns
TOE Output Enable Access Time 60 ns
TOLZ OE# Low to Active Output 0 ns
TOHZ OE# High to High-Z Output 35 ns
TOH Output Hold from Address Change 0 ns
T23.0 25026
Table 24:Program/Erase Cycle Timing Parameters, VDD=3.0-3.6V (PP Mode)
Symbol Parameter Min Max Units
TRST RST# High to Row Address Setup 1 µs
TAS R/C# Address Setup Time 50 ns
TAH R/C# Address Hold Time 50 ns
TCWH R/C# to Write Enable High Time 50 ns
TOES OE# High Setup Time 20 ns
TOEH OE# High Hold Time 20 ns
TOEP OE# to Data# Polling Delay 40 ns
TOET OE# to Toggle Bit Delay 40 ns
TWP WE# Pulse Width 100 ns
TWPH WE# Pulse Width High 100 ns
TDS Data Setup Time 50 ns
TDH Data Hold Time 5 ns
TIDA Software ID Access and Exit Time 150 ns
TBP Byte Programming Time 20 µs
TSE Sector-Erase Time 25 ms
TBE Block-Erase Time 25 ms
TSCE Chip-Erase Time 100 ms
T24.0 25026
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
34
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 17:Reset Timing Diagram (PP Mode)
Table 25:Reset Timing Parameters, VDD=3.0-3.6V (PP Mode)
Symbol Parameter Min Max Units
TPRST VDD stable to Reset Low 1 ms
TRSTP RST# Pulse Width 100 ns
TRSTF RST# Low to Output Float 48 ns
TRST1RST# High to Row Address Setup 1 µs
TRSTE RST# Low to reset during Sector-/Block-Erase or Pro-
gram
10 µs
TRSTC RST# Low to reset during Chip-Erase 50 µs
T25.0 25026
1. There may be additional reset latency due to TRSTE or TRSTC if a reset procedure is performed during a Program or
Erase operation.
VDD
RST#
Addresses
R/C#
DQ7-0
1235 F16.0
TPRST
TRSTP
TRSTF
TRSTE
Row Address
Sector-/Block-Erase
or Program operation
aborted
TRST
TRSTC Chip-Erase
aborted
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
35
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 18:Read Cycle Timing Diagram (PP Mode)
Figure 19:Write Cycle Timing Diagram (PP Mode)
RST#
TRST
1235 F17.0
Column Address
Data Valid High-Z
Row AddressColumn AddressRow Address
Addresses
R/C#
VIH
High-Z
TRC
TAS TAH TAH
TAA
TOE
TOLZ
TOHZ
TOH
TAS
WE#
OE#
DQ7-0
1235 F18.0
Column AddressRow Address
Data Valid
RST#
Addresses
R/C#
TRST
TAS TAH
TCWH
TWP
TOES TWPH
TOEH
TDH
TDS
TAH
TAS
WE#
OE#
DQ7-0
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
36
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 20:Data# Polling Timing Diagram (PP Mode)
Figure 21:Toggle Bit Timing Diagram (PP Mode)
Figure 22:Byte-Program Timing Diagram (PP Mode)
1235 F19.0
Addresses
R/C#
TOEP
Row Column
WE#
OE#
DQ7D#D D# D
1235 F20.0
Addresses
R/C#
TOET
Row Column
WE#
OE#
DQ6D D
5555 55552AAA
A14-0
(Internal AMS-0)
R/C#
OE#
WE#
DQ7-0
BA
Internal Program Starts
AA 55 A0 DATA
BA = Byte-Program Address
AMS = Most Significant Address 1235 F21.0
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
37
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 23:Sector-Erase Timing Diagram (PP Mode)
Figure 24:Block-Erase Timing Diagram (PP Mode)
Figure 25:Chip-Erase Timing Diagram (PP Mode)
5555 5555 5555 2AAA SAX
2AAA
A14-0
(Internal AMS-0)
R/C#
OE#
WE#
DQ7-0
Internal Erase Starts
AA 55 80 AA 55 30
SAX= Sector Address 1235 F22.0
5555 5555 5555 2AAA BA
X
2AAA
A
14-0
(Internal A
MS-0
)
R/C#
OE#
WE#
DQ
7-0
Internal Erase Starts
AA 55 80 AA 55 50
BA
X
= Block Address 1235 F23.0
5555 5555 5555 2AAA 55552AAA
A14-0
(Internal AMS-0)
R/C#
OE#
WE#
DQ7-0
Internal Erase Starts
AA 55 80 AA 55 10
1235 F24.0
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
38
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 26:Software ID Entry and Read (PP Mode)
Figure 27:Software ID Exit (PP Mode)
5555 5555 0000 0001
2AAA
A14-0
(Internal AMS-0)
R/C#
OE#
WE#
DQ7-0 AA
1235 F25.0
Device ID
BF
55 90
TWP
TWPH TIDA TAA
Note: Device ID = 5BH for SST49LF080A
5555 5555
2AAA
A14-0
(Internal AMS-0)
R/C#
OE#
WE#
DQ7-0 AA
1235 F26.0
55 F0
TIDA
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
39
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 28:AC Input/Output Reference Waveforms
Figure 29:A Test Load Example
Figure 30:Read Flowchart (LPC Mode)
1235 F27.0
REFERENCE POINTS OUTPUTINPUT VIT
VIHT
VILT
VOT
AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measure-
ment reference points for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall
times (10% 90%) are <3 ns.
Note: VIT -V
INPUT Test
VOT -V
OUTPUT Test
VIHT -V
INPUT HIGH Test
VILT -V
INPUT LOW Test
1235 F28.0
TO TESTER
TO DUT
CL
1235 F29.0
Address: AIN
Read Data: DOUT
Cycle: 1
Read
Command Sequence
Available for
Next Command
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
40
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 31:Byte-Program Flowchart (LPC Mode)
1235 F30.0
Address: 5555H
Write Data: AAH
Cycle: 1
Address: 2AAAH
Write Data: 55H
Cycle: 2
Address: 5555H
Write Data: A0H
Cycle: 3
Address: AIN
Write Data: DIN
Cycle: 4
Available for
Next Byte
Wait TBP
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
41
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 32:Erase Command Sequences Flowchart (LPC Mode)
1235 F31.0
Sector-Erase
Command Sequence
Address: 5555H
Write Data: AAH
Cycle: 1
Address: 2AAAH
Write Data: 55H
Cycle: 2
Address: 5555H
Write Data: 80H
Cycle: 3
Address: 5555H
Write Data: AAH
Cycle: 4
Address: 2AAAH
Write Data: 55H
Cycle: 5
Sector erased
to FFH
Address: SAX
Write Data: 30H
Cycle: 6
Wait TSE
Available for
Next Command
Block-Erase
Command Sequence
Address: 5555H
Write Data: AAH
Cycle: 1
Address: 2AAAH
Write Data: 55H
Cycle: 2
Address: 5555H
Write Data: 80H
Cycle: 3
Address: 5555H
Write Data: AAH
Cycle: 4
Address: 2AAAH
Write Data: 55H
Cycle: 5
Block erased
to FFH
Address: BAX
Write Data: 50H
Cycle: 6
Wait TBE
Available for
Next Command
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
42
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 33:Software Product ID Command Sequences Flowchart (LPC Mode)
1235 F32.0
Software Product ID Entry
Command Sequence
Wait TIDA
Software Product ID Exit
Command Sequence
Wait T
IDA
Wait TIDA
Address: 5555H
Write Data: AAH
Cycle: 1
Address: 2AAAH
Write Data: 55H
Cycle: 2
Address: 5555H
Write Data: 90H
Cycle: 3
Address: 5555H
Write Data: AAH
Cycle: 1
Address: XXXXH
Write Data: F0H
Cycle: 1
Address: 2AAAH
Write Data: 55H
Cycle: 2
Address: 5555H
Write Data: F0H
Cycle: 3
Address: 0001H
Read Data: BFH
Cycle: 4
Address: 0002H
Read Data:
Cycle: 5
Available for
Next Command
Available for
Next Command
Available for
Next Command
Note: X can be VIL or VIH, but no other value.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
43
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 34:Byte-Program Command Sequences Flowchart (PP Mode)
1235 F33.0
Start
Write data: AAH
Address: 5555H
Write data: 55H
Address: 2AAAH
Write data: A0H
Address: 5555H
Load Byte
Address/Byte
Data
Wait for end of
Program (TBP,
Data# Polling
bit, or Toggle bit
operation)
Program
Completed
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
44
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 35:Wait Options Flowchart (PP Mode)
1235 F34.0
Wait T
BP
,
T
SCE
,T
BE
,
or T
SE
Byte-
Program/Erase
Initiated
Internal Timer Toggle Bit
Ye s
Ye s
No
No
Program/Erase
Completed
Does DQ
6
match
Read same
byte
Data# Polling
Program/Erase
Completed
Program/Erase
Completed
Read byte
Is DQ
7
=
true data
Read DQ
7
Byte-
Program/Erase
Initiated
Byte-
Program/Erase
Initiated
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
45
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 36:Software Product ID Command Sequences Flowchart (PP Mode)
1235 F35.0
Write data: AAH
Address: 5555H
Software Product ID Entry
Command Sequence
Write data: 55H
Address: 2AAAH
Write data: 90H
Address: 5555H
Wait TIDA
Read Software ID
Write data: AAH
Address: 5555H
Software Product ID Exit
Command Sequence
Write data: 55H
Address: 2AAAH
Write data: F0H
Address: 5555H
Write data: F0H
Address: XXH
Return to normal
operation
Wait TIDA
Wait TIDA
Return to normal
operation
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
46
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 37:Erase Command Sequence Flowchart (PP Mode)
1235 F36.0
Write data: AAH
Address: 5555H
Chip-Erase
Command Sequence
Write data: 55H
Address: 2AAAH
Write data: 80H
Address: 5555H
Write data: 55H
Address: 2AAAH
Write data: 10H
Address: 5555H
Write data: AAH
Address: 5555H
Wait TSCE
Chip erased
to FFH
Write data: AAH
Address: 5555H
Sector-Erase
Command Sequence
Write data: 55H
Address: 2AAAH
Write data: 80H
Address: 5555H
Write data: 55H
Address: 2AAAH
Write data: 30H
Address: SAX
Write data: AAH
Address: 5555H
Wait TSE
Sector erased
to FFH
Write data: AAH
Address: 5555H
Block-Erase
Command Sequence
Write data: 55H
Address: 2AAAH
Write data: 80H
Address: 5555H
Write data: 55H
Address: 2AAAH
Write data: 50H
Address: BAX
Write data: AAH
Address: 5555H
Wait TBE
Block erased
to FFH
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
47
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Product Ordering Information
Valid combinations for SST49LF080A
SST49LF080A-33-4C-WHE SST49LF080A-33-4C-NHE
Note:Valid combinations are those products in mass production or will be in mass production. Consult your SST
sales representative to confirm availability of valid combinations and to determine availability of new combi-
nations.
SST 49 LF 080A - 33 - 4C - NHE
XX XX XXXX - XX - XX -XXX
Environmental Attribute
E1= non-Pb
Package Modifier
H = 32 leads
Package Type
N = PLCC
W = TSOP (type 1, die up, 8mm x
14mm)
Operating Temperature
C = Commercial = 0°C to +85°C
Minimum Endurance
4 = 10,000 cycles
Serial Access Clock Frequency
33 = 33 MHz
Version
Device Density
080 = 8 Mbit
Voltage Range
L = 3.0-3.6V
1. Environmental suffix “E” denotes non-Pb sol-
der. SST non-Pb solder devices are “RoHS
Compliant”.
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
48
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Packaging Diagrams
Figure 38:32-lead Plastic Lead Chip Carrier (PLCC)
SST Package Code: NH
.040
.030
.021
.013
.530
.490
.095
.075
.140
.125
.032
.026
.032
.026
.029
.023
.453
.447
.553
.547
.595
.585
.495
.485 .112
.106
.042
.048
.048
.042
.015 Min.
TOP VIEW SIDE VIEW BOTTOM VIEW
1232
.400
BSC
32-plcc-NH-3
Note: 1. Complies with JEDEC publication 95 MS-016 AE dimensions, although some dimensions may be more stringent.
2. All linear dimensions are in inches (max/min).
3. Dimensions do not include mold flash. Maximum allowable mold flash is .008 inches.
4. Coplanarity: 4 mils.
.050
BSC
.050
BSC
Optional
Pin #1
Identifier .020 R.
MAX. R.
x30°
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
49
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 39:32-lead Thin Small Outline Package (TSOP) 8mm x 14mm
SST Package Code: WH
32-tsop-WH-7
Note: 1. Complies with JEDEC publication 95 MO-142 BA dimensions,
although some dimensions may be more stringent.
2. All linear dimensions are in millimeters (max/min).
3. Coplanarity: 0.1 mm
4. Maximum allowable mold flash is 0.15 mm at the package ends, and 0.25 mm between leads.
1.20
max.
1mm
Pin # 1 Identifier
12.50
12.30
14.20
13.80
0.70
0.50
8.10
7.90 0.27
0.17
0.50
BSC
1.05
0.95
0.15
0.05
0.70
0.50
0°-
DETAIL
©2011 Silicon Storage Technology, Inc. DS25086A 11/11
50
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Table 26:Revision History
Revision Description Date
00 Initial release
(SST49LF080A previously released in data sheet S71206)
Apr 2003
01 Added statement that non-Pb devices are RoHS compliant to Features
section
Updated Surface Mount Solder Reflow Temperature information
Added footnote to Product Ordering Information section
Removed leaded part numbers
Jan 2006
02 Updated Table 5 on page 11 May 2006
AApplied new document format
Released document under letter revision system
Updated Spec number from S71235 to DS25086
Nov 2011
©
2011 Silicon Storage Technology, Inc–a Microchip Technology Company. All rights reserved.
SST, Silicon Storage Technology, the SST logo, SuperFlash, MTP, and FlashFlex are registered trademarks of Silicon Storage Tech-
nology, Inc. MPF, SQI, Serial Quad I/O, and Z-Scale are trademarks of Silicon Storage Technology, Inc. All other trademarks and
registered trademarks mentioned herein are the property of their respective owners.
Specifications are subject to change without notice. Refer to www.microchip.com for the most recent documentation. For the most current
package drawings, please see the Packaging Specification located at http://www.microchip.com/packaging.
Memory sizes denote raw storage capacity; actual usable capacity may be less.
SST makes no warranty for the use of its products other than those expressly contained in the Standard Terms and Conditions of
Sale.
For sales office locations and information, please see www.microchip.com.
Silicon Storage Technology, Inc.
A Microchip Technology Company
www.microchip.com
ISBN:978-1-61341-753-9