SSDSA2CW080G3K5 - INTEL - Datasheet.Directory

Order Number: 325152-001US

March 2011

Intel® Solid-State Drive 320 Series

Product Specification

1. Performance values vary by capacity.

2. 4 KB = 4,096 bytes.

3. Device Initiated Power Management (DIPM)-enabled.

Form Factors: 1.8-inch and 2.5-inch

Capacity:

— 80/160/300 GB (1.8-inch)

— 40/80/120/160/300/600 GB (2.5-inch)

Components: Intel® 25nm NAND Flash Memory

Multi-Level Cell (MLC)

Bandwidth Performance1

(Iometer* Queue Depth 32)

— Sustained sequential read: Up to 270 MB/s

— Sustained sequential write: Up to 220 MB/s

Read and Write IOPS1

(Iometer Queue Depth 32)

—Random 4 KB

2 reads: Up to 39,500 IOPS

—Random 4 KB

2 writes: Up to 23,000 IOPS

Latency (average sequential)

— Read: 75 µs (TYP)

— Write: 90 µs (TYP)

AES 128-bit Encryption

Compatibility

—Intel

® SSD Toolbox with Intel® SSD Optimizer

—Intel

® Data Migr ation Software

—Intel

® Rapid Storage Technology

—Intel

® 6 Series Express Chipsets

(with SATA 6Gb/s)

—SATA Revision 2.6

—ATA8-ACS

— SSD-enhanced S.M.A.R.T. ATA feature set

— Native Command Queuing (NCQ)

command set

— Data Set Management Command

Trim attribute

Power Management

— 3.3 V (1.8-inch form factor) or

5 V (2.5-inch form factor) SATA Supply Rail

— SATA interface power management

— OS-aware hot plug/remov al

— Enhanced power-loss data protection

Power

— Active (MobileMark* 2007 W orkload):

150 mW (TYP)

—Idle

3: 100 mW (TYP)

Temperature

—Operating: 0

o C to 70o C

— Non-Operating: -55o C to 95o C

Reliability

— Uncorrectable Bit Error Rate (UBER):

1 sector per 1016 bits read

— Mean Time Between Failures (MTBF):

1,200,000 hours

Shock (operating and non-operating):

1,500 G/0.5 msec

Vibration

— Operating: 2.17 GRMS (5-700 Hz)

— Non-operating: 3.13 GRMS (5-800 Hz)

Weight

— 1.8-inch form factor: up to 49 grams

— 2.5-inch 7mm form factor: up to 82 grams

— 2.5-inch 9.5mm form factor: up to 88 grams

Certifications and Declarations:

—UL*

—CE*

—C-Tick*

—BSMI*

—KCC*

—Microsoft* WHQL

— VCCI*

—SATA-IO*

Product Ecological Compliance

—RoHS*

Intel® Solid-State Drive 320 Series

Product Specification March 2011

2Order Number: 325152-001US

Ordering Information

Contact your local Intel sales representative for ordering information.

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specifications. Current characterized errata are available on request.

Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.

Copies of documents which have an order number and a re referenced in this document, or other Intel literature, may be obtain ed by c all ing 1-80 0- 54 8-

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Intel and the Intel logo are trademarks of Intel Corporation in the U.S. and other countries.

*Other names and brands may be claimed as the property of others.

Intel® Solid-State Drive 320 Series

March 2011 Product Specification

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Intel® Solid-State Drive 320 Series

Contents

1.0 Overview...................................................................................................................5

2.0 Product Specifications ...............................................................................................6

2.1 Capacity ............................................................................................................6

2.2 Performance.......................................................................................................6

2.3 Electrical Characteristics.......................................................................................7

2.4 Environmental Conditions.................. .. .. ............. .. ............. .. ............ .. ............. .. ....7

2.5 Product Regulatory Compliance.............................................................................8

2.6 Reliability...........................................................................................................9

2.7 Hot Plug Support.................................................................................................9

3.0 Mechanical Information...........................................................................................10

3.1 1.8-inch Form Factor ......... .. .. ............. ............. ............ ............. ....................... ..10

3.2 2.5-inch Form Factors............... .. ............ ............. ....................... ............. ..........11

4.0 Pin and Signal Descriptions .....................................................................................13

4.1 Pin Locations ....................................................................................................13

4.1.1 1.8-inch Form Factor Pin Locations ...........................................................13

4.1.2 2.5-inch Form Factor Pin Locations ...........................................................13

4.2 Signal Descriptio ns................... ............ ............. ............ ............. ............. ..........14

4.2.1 Connector Pin Signal Definitions...............................................................14

4.2.2 Power Pin Signal Definitions.....................................................................14

5.0 Supported Command Sets........................................................................................16

5.1 ATA General Feature Command Set .....................................................................16

5.2 Power Management Command Set.......................................................................16

5.3 Security Mode Feature Set..................................................................................17

5.4 SMART Command Set........................................................................................17

5.4.1 SMART Attributes...................................................................................18

5.4.2 S.M.A.R.T. Logs .....................................................................................19

5.5 Device Statistics............ .. .. ....................... ........................ ....................... ..........20

5.6 SMART Command Transport (SCT) ......................................................................21

5.7 Data Set Management Command Set...................................................................21

5.8 Host Protected Area Command Set......................................................................21

5.9 48-Bit Address Command Set .............................................................................22

5.10 Device Configuration Overlay Command Set ................. .. .. ... ............ .. ............. .. .. ..22

5.11 General Purpose Log Command Set .....................................................................22

5.12 Native Command Queuing..................................................................................22

5.13 Software Settings Preservation............................................................................22

5.14 Device Initiated Power Management (DIPM)..........................................................22

6.0 Certifications and Declarations................................................................................23

7.0 References ..............................................................................................................23

8.0 Terms and Acronyms ...............................................................................................24

9.0 Revision History ......................................................................................................25

A IDENTIFY DEVICE Command Data ...........................................................................26

Intel® Solid-State Drive 320 Series

Product Specification March 2011

4Order Number: 325152-001US

Intel® Solid-State Drive 320 Series

March 2011 Product Specification

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Intel® Solid-State Drive 320 Series

1.0 Overview

This document describes the specifications and capabilities of the Intel® Solid-State

Drive 320 Series (Intel® SSD 320 Series).

The Intel SSD 320 Series delivers leading performance for Serial Advanced Technology

Attachment (SATA)-based computers in capacities up to 600GB.

By combining Intel's lea ding 25 nm NAND flas h memory tec hnolo gy with SATA 3Gb/s

interface support, the Intel SSD 320 Seri es de li vers sequential read speeds of up to

270 MB/s and sequential write speeds of up to 220 MB/s.

The industry-standard 1.8-inch and 2.5-inch form factors enable interchangeability

with existing hard disk drives (HDDs) and native SATA HDD drop-in replacement with

the enhanced performance, reliability, ruggedness, and power savings offered by an

SSD.

As compared to standard SATA HDDs, the Intel SSD 320 Series offers these key

features:

• High I/O and throughput performance

•Low power

• Increased system responsiveness

• High reliability

• Enhanced ruggedness

Intel® Solid-State Drive 320 Series

Product Specification March 2011

6Order Number: 325152-001US

Intel® Solid-State Drive 320 Series

2.0 Product Specifications

2.1 Capacity

Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.

LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.

The total usable capacity of the SSD may be less than the total phys ical capacity because a small portion of the capacity is

used for NAND flash management and maintenance purposes.

2.2 Performance

Notes: 1. Performance measured using Iometer* with queue depth set to 32; measurements are performed on 8 GB of

LBA range. Write Cache enabled. 4 KB = 4,096 bytes.

Note: 1. Performance measured using Iometer with queue depth equal to 32.

Notes: 1. Based on sequential 4 KB (4,096 bytes) at queue depth 1 Iometer workload. Write Cache Enabled.

2. Power On To Ready time assumes proper shutdown.

Table 1. User Addressable Sectors

Intel SSD 320 Series Unformatted Capacity

(Total User Addressable Sectors in LBA Mode)

40 GB 78,165,360

80 GB 156,301,488

120 GB 234,441,648

160 GB 312,581,808

300 GB 586,072,368

600 GB 1,172,123,568

Table 2. Random Read and Write Input/Output Operations Per Second (IOPS)

Specification1Unit Intel SSD 320 Series

40 GB 80 GB 120 GB 160 GB 300 GB 600 GB

Random 4 KB Read (up to) IOPS 30,000 38,000 38,000 39,000 39,500 39,500

Random 4 KB W rite ( up to) IOPS 3,700 10,000 14,000 21,000 23,000 23,000

Table 3. Maximum Sustained Sequential Read and Write Bandwidth

Specification1Unit Intel SSD 320 Series

40 GB 80 GB 120 GB 160 GB 300 GB 600 GB

Sequential Read (up to) MB/s 200 270 270 270 270 270

Sequential Write (up to) MB/s 45 90 130 165 205 220

Table 4. Latency

Specification Intel SSD 320 Series

40 GB 80 GB 120 GB 160 GB 300 GB 600 GB

Latency1

Read

Write

Power On to Ready2

75 µs (TYP)

90 µs (TYP)

2.0 s (TYP)

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Intel® Solid-State Drive 320 Series

2.3 Electrical Characteristics

Notes:

1. Active power measured during execution of MobileMark* 2007 with DIPM (Device Initiated Power Management) enabled.

2. Idle power defined as SSD at idle with DIPM enabled.

2.4 Environmental Conditions

Notes:

1. Temperature gradient measured without condensation.

2. Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws.

Stimulus may be applied in the X, Y or Z axis. Shock specification is measured using root mean square (RMS) value.

3. Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting

screws. Stimulus may be applied in the X, Y or Z axis. Measured specification is in root mean squared form. Vibration

specification measured using RMS value.

Table 5. Operating Voltage and Power Consumption

Electrical Characteristics Value

Operating Voltage for 5 V (+/- 5%)

Min

Max 4.75 V

5.25 V

Power Consumption (Typical)

Active1

Idle2150 mW

100 mW

Table 6. Temperature, Shock, Vibration

Temperature Range

Ambient Temperature

Operating

Non-operating 0 – 70 oC

-55 – 95 oC

Temperature Gradient1

Operating

Non-operating 30 (Typical) oC/hr

30 (Typical) oC/hr

Humidity

Operating

Non-operating 5 – 95 %

5 – 95 %

Shock and Vibration Range

Shock2

Operating

Non-operating 1,500 G (Max) at 0.5 msec

1,500 G (Max) at 0.5 msec

Vibration3

Operating

Non-operating 2.17 GRMS (5-700 Hz) Max

3.13 GRMS (5-800 Hz) Max

Intel® Solid-State Drive 320 Series

Product Specification March 2011

8Order Number: 325152-001US

Intel® Solid-State Drive 320 Series

2.5 Product Regulatory Compliance

The Intel SSD 320 Series meets or exceeds the regulatory or certification requirements

in Table 7.

Table 7. Product Regulatory Compliance Specifications

Title Description Region for which

conformity declared

European Union Low Voltage

Directive (LVD) 2006/95/EC EN 60950-1 2nd edition for Informatio n Technology Equipment -

Safety - Part 1: General Requirements European Union

UL/CSA 60950-1, Second Edition

CAN/CSA-C22.2 No. 60950-1-07

Second Edition

Information Technology Equipment - Safety - Part 1:

General Requirements USA/Canada

CFR Title 47 Part 15 Radio Frequency Devices - Subpart B (Unintentional Radiators) USA

ICES-003 Issue 4 Interference Causing Equipment Standard Canada

EN 55022:2006 Information technology equipment -

Radio disturbance characteristics -

Limits and methods of measurement European Union

CNS 14348:2006 Information technology equipment -

Radio disturbance characteristics -

Limits and methods of measurement Taiwan

VCCI V3/2010.04 Information technology equipment -

Radio disturbance characteristics -

Limits and methods of measurement Japan

KN22 (2008-5) Information technology equipment -

Radio disturbance characteristics -

Limits and methods of measurement Korea

CISPR 22:2006 Information technology equipment -

Radio disturbance characteristics -

Limits and methods of measurement International

EN 55024:1998 Information technology equipment -

Immunity characteristics -

Limits and methods of measurement (CISPR 24:1997, modified) European Union

KN24 (2008-5) Information technology equipment -

Immunity characteristics -

Limits and methods of measurement (CISPR 24:1997, modified) Korea

Intel® Solid-State Drive 320 Series

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Intel® Solid-State Drive 320 Series

2.6 Reliability

The Intel SSD 320 Series meets or exceeds SSD endurance and data retention

requirements as specified in the JESD218 specification.

Reliability specifications are listed in Table 8.

2.7 Hot Plug Support

Hot Plug insertion and removal is supported in the presence of a proper connector and

appropriate operation system (OS), as described in the SATA 2.6 specification.

This product supports asynchronous signal recovery and issues an unsolicited COMINIT

when first mated with a powered connector to guarantee reliable detection by a host

system without hardware device detection.

Table 8. Reliability Specifications

Parameter Value

Uncorrectable Bit Error Rate (UBER) 1 sector in 1016 bits read, max

Unrecoverable bit error rate will not exceed one sector in the

specified number of bits read. In the unlikely event of a

nonrecoverable read error, the SSD will report it as a read failure to

the host; the sector in error is considered corrupt and is not

returned to the host.

Mean Time Between Failure (MTBF) 1,200,000 hours

Mean Time Between Failure is estimated based on Telcordia*

methodology and demonstrated through Reliability Demonstration

Test (RDT).

Power On/Off Cycles 50,000 cycles

Power On/Off Cycles is defined as power being removed from the

SSD , and then rest ored. Most host sys tems remov e power from the

SSD when entering suspend and hibernate as well as on a system

shutdown.

Minimum Useful Life/Endurance Rating 5 years

The SSD will have a minimum of five years of useful life under

typical client workloads with up to 20 GB of host writes per day.

Insertion Cycles 250 insertion/removal cycles

The SSD supports up to 250 insertion/removal cycles on SATA/

power cable.

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3.0 Mechanical Information

3.1 1.8-inch Form Factor

Figure 1 shows the physical package information for the 1.8-inch Intel SSD 320 Series.

All dimensions are in millimeters.

Figure 1. Dimensions for 1.8-inch Form Factor

2,500

1,350

1,650

0.353.30

5.00 0.35

0.6078.50

54.00

DETAIL A

SCALE 5 : 1

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Intel® Solid-State Drive 320 Series

3.2 2.5-inch Form Factors

Figure 2 shows the physical package information for the 7mm height 2.5-inch

Intel SSD 320 Series. All dimensions are in millimeters.

Figure 2. Dimensions for 7mm 2.5-inch Form Factor

4.80

3.00

DETAIL A

SCALE 4 : 1

0.3

90.60

9.40

14.00

61.72

3.5 0.38

90.60

.00

7 - 0.50

100.45 Max

69.85 0.25

SECTION B-B

SCALE 2 : 1

DETAIL C

SCALE 4 : 1

0.50

Intel® Solid-State Drive 320 Series

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Intel® Solid-State Drive 320 Series

Figure 3 shows the physical package information for the 9.5mm height 2.5-inch

Intel SSD 320 Series. All dimensions are in millimeters.

Figure 3. Dimensions for 9.5mm 2.5-inch Form Factor

4.80

DETAIL A

SCALE 4 : 1

0.3

DETAIL C

SCALE 4 : 1

0.50

90.60

9.50

.00

0.20

3.00

3.5 0.38

90.60

9.40

14.00

61.72

SCALE 2 : 1

SECTION B-B

100.45 Max

69.85 0.25

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Intel® Solid-State Drive 320 Series

4.0 Pin and Signal Descriptions

4.1 Pin Locations

4.1.1 1.8-inch Form Factor Pin Locations

4.1.2 2.5-inch Form Factor Pin Locations

Note: 2.5-inch connector supports in-built latching capability.

Figure 4. Layout of Signal and Power Segment Pins

Figure 5. Layout of Signal and Power Segment Pins

Signal Segment S1 Power Segment P1

Intel® Solid-State Drive 320 Series

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Intel® Solid-State Drive 320 Series

4.2 Signal Descriptions

4.2.1 Connector Pin Signal Defi nitions

Note: Key and spacing separate sign al and power s egments.

4.2.2 Power Pin Signal Definitions

Notes:

1. All mate sequences assume zero angular offset between connectors.

2. P1 and P2 are internally connected to one another within the device.

3. Ground connectors P3 and P4 may contact before the other 1st mate pins in both the power and signal connectors to

discharge ESD in a suitably configure backplane connector.

4. P5 and P6 are not connected internally to the device. The host may put 5V on these pins.

5. The host may ground P7 if it is not used for Device Activity Signal (DAS).

6. P8 and P9 should not be connected by the host.

Table 9. Serial ATA Connector Pin Signal Definitions —

1.8-inch and 2.5-inch Form Factors

Pin Function Definition

S1 Ground 1st mate

S2 A+ Differential signal pair A

S3 A-

S4 Ground 1st mate

S5 B- Differential signal pair B

S6 B+

S7 Ground 1st mate

Table 10. Serial ATA Power Pin Definitions — 1.8-inch Form Factor

Pin Function Definition Mating Order1

P12V33 3.3 V Power 2nd Mate

P22V33 3.3 V Power, pre-charge 2nd Mate

P33Ground 1st Mate

P43Ground 1st Mate

P54V55 V Power. Not connected 1st Mate

P64V55 V Power. Not connected 2nd Mate

P75DAS Device Activity Signal 2nd Mate

Key Key NC NC

P86Optional Manufacturing Test Pin 2nd Mate

P96Optional Manufacturing Test Pin 2nd Mate

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Intel® Solid-State Drive 320 Series

Notes:

1. All pins are in a single row, with a 1.27 m m (0.050-inch) pitch.

2. Pins P1, P2 and P3 are connected together, although they are not connected internally to the device. The host may put

3.3 V on these pins.

3. The mating sequence is:

• the ground pins P4-P6, P10, P12 and the 5V power pin P7.

• the signal pins and the rest of the 5V power pins P8-P9.

4. Ground connectors P4 and P12 may contact before the other 1st mate pins in both the power and signal connectors to

discharge ESD in a suitably configured backplane connector.

5. Power pins P7, P8, and P9 are internally connected to one another within the device.

6. The host may ground P11 if it is not used for Device Activity Signal (DAS).

7. Pins P13, P14 and P15 are connected together, although they are not connected internally to the device. The host ma y put

12 V on these pins.

Table 11. Serial ATA Power Pin Definitions — 2.5-inch Form Factor

Pin1Function Definition Mating Order

P12Not connected (3.3 V Power)

P22Not connected (3.3 V Power)

P32Not connected (3.3 V Power; pre-charge) 2nd Mate

P43,4 Ground 1st Mate

P53Ground 1st Mate

P63Ground 1st Mate

P73,5 V55 V Power 1st Mate

P83,5 V55 V Power 2nd Mate

P93,5 V55 V Power 2nd Mate

P103Ground 1st Mate

P116DAS Device Activity Signal 2nd Mate

P123, 4 Ground 1st Mate

P137V12 12 V Power; not used 1st Mate

P147V12 12 V Power; not used 2nd Mate

P157V12 12 V Power; not used 2nd Mate

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5.0 Supported Command Sets

The Intel SSD 320 Series supports all the mandatory ATA (Advanced Technology

Attachment) commands defined in the AT A8-ACS specification described in this section.

5.1 ATA General Feature Command Set

The Intel SSD 320 Series supports the ATA General Feature command set (non-

PACKET), which consists of:

• EXECUTE DEVICE DIAGNOSTIC

• FLUSH CACHE

•IDENTIFY DEVICE

Note: See Appendix A, “IDENTIFY DEVICE Command Data” on page 26 for details on the sector data

returned after issuing an IDENTIFY DEVICE command.

•READ DMA

•READ SECTOR(S)

• READ VERIFY SECTOR(S)

•SEEK

• SET FEATURES

•WRITE DMA

• WRITE SECTOR(S)

•READ MULTIPLE

•SET MULTIPLE MODE

•WRITE MULTIPLE

The Intel SSD 320 Series also supports the following optional commands:

• READ BUFFFER

• WRITE BUFFER

•NOP

• DOWNLOAD MICROCODE

5.2 Power Management Comman d Set

The Intel SSD 320 Series supports the Power Management command set, which

consists of:

•CHECK POWER MODE

•IDLE

• IDLE IMMEDIATE

•SLEEP

•STANDBY

• STANDBY IMMEDI ATE

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Intel® Solid-State Drive 320 Series

5.3 Security Mode Feature Set

The Intel SSD 320 Series supports the Security Mode command set, which consists of:

•SECURITY SET PASSWORD

• SECURITY UNLOCK

• SECURITY ERASE PREPARE

• SECURITY ERASE UNIT

• SECURITY FREEZE LOCK

• SECURITY DISABLE PASSWORD

5.4 SMART Command Set

The Intel SSD 320 Series supports the SMART command set, which consists of:

•SMART READ DATA

•SMART READ ATTRIBUTE THRESHOLDS

• SMART ENABLE/DISAB LE ATTRIBUT E A UTOSA VE

• SMART SAVE AT TRIB UTE VALUES

• SMART EXECUTE OFF-LINE IMMEDIATE

• SMART READ LOG SECTOR

•SMART WRITE LOG SECTOR

• SMART ENABLE OPERATIONS

•SMART DISABLE OPERATIONS

•SMART RETURN STATUS

• SMART ENABLE/DISABLE AUTOMATIC OFFLINE

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Intel® Solid-State Drive 320 Series

5.4.1 SMART Attributes

Table 12 lists the SMART attributes supported by the Intel SSD 320 Series and the

corresponding status flags and threshold settings.

Table 12. SMART Attributes

ID Attribute Status Flags1Threshold

SP EC ER PE OC PW

03h Spin Up Time

Reports a fixed value o f zero (0). 100000 0 (none)

04h Start/Stop Count

Reports a fixed value o f zero (0). 110000 0 (none)

05h

Re-allocated Sector Count

The raw value of this attribute shows the

number o f retired blocks s ince leaving the

factory (grown defect count).

110010 0 (none)

09h

Power-On Hours Count

Reports the cumulative number of power-on

hours over the life of the device. However,

the On/Off status of the Device Initiated

Power Management (DIPM) feature will

affect the numb er of ho urs reported. If DIPM

is turned On, the recorded value for

power-on hours does not include the time

that the device is in a "slumber" state. If

DIPM is turned Off, the recorded value for

power-on hours should match the clock

time, as all three device states are counted:

active, idle and slumber.

110010 0 (none)

0Ch

Power Cycle Count

The raw value of this attribute reports the

cumulative number of power cycle events

over the life of the device.

110010 0 (none)

AAhAvailable Reserved Space 110011 10

ABh Program Fail Count

Percentage of NAND program failures. 110010 0 (none)

ACh Erase Fail Count

Percentage of NAND erase failures. 110010 0 (none)

B8h

End-to-End Error Detection Count

Reports number of errors encounter ed

during LBA tag checks, within the SSD data

path.

110011 90

C0h

Power-Off Retract Count (Unsafe Shutdown

Count)

The raw value of this attribute reports the

cumulative number of unsafe (unclean)

shutdown events over the life of the de vice.

An unsafe shutdown occurs whenever the

device is powered off without STANDBY

IMMEDIAT E being the last command.

110010 0 (none)

E1h

Host Writes

The raw value of this attribute reports the

total number of sectors written by the host

system. The raw value is increased by 1 for

every 65,536 sectors (32MB) written by

the host.

110010 0 (none)

E8h

Available Reserved Space

This attribute reports the number of reserve

blocks remaining. The normalized value

begins at 100 (64h), which corresponds to

100 percent availability of the reserved

space. The threshold value for this attribute

is 10 percent availability.

110011 10

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Intel® Solid-State Drive 320 Series

Note: 1. The following table defines the SMART Attributes status flags.

5.4.2 S.M.A.R.T. Logs

The Intel SSD 320 Series implements the following Log Addresses: 00h, 02h, 03h, 06h,

and 07h.

The Intel SSD 320 Series implements host vendor specific logs (addresses 80h-9Fh) as

read and write scratchpads, where the default value is zero (0). Intel SSD 320 Series

does not write any specific v alues to these logs unless directed by the host through the

appropriate commands.

The Intel SSD 320 Series also implements a device vendor specific log at address A9h

as a read-only log area with a default value of zero (0).

E9h

Media Wearout Indicator

This attribute reports the number of cycles

the NAND media has undergone. The

normalized v alue declines linearly from 100

to 1 as the average erase cycle count

increases from 0 to the maximum rated

cycles.

Once the normalized v alue reaches 1, the

number will not decrease, although it is likely

that significant additional wear can be put

on the device.

110010 0 (none)

F1h Total LBAs Written

Counts sectors written by the host. 110010 0 (none)

F2h Total LBAs Read

Counts sectors read by the host. 110010 0 (none)

Table 12. SMART Attributes (Continued)

ID Attribute Status Flags1Threshold

SP EC ER PE OC PW

Status

Flag Description Value = 0 Value = 1

SP Self-preserving attribute Not a self-preserving attribute Self-preserving attribute

EC Event count attribute Not an event count attribute Event count attribute

ER Error rate attribute Not an error rate attribute Error rate attribute

PE Performance attribute Not a perform ance attribut e Performance attribute

OC Online collection attribute Collected only during offline activity Collected during both off lin e and

online activity

PW Pre-fail warrant y attribute Advisory Pre-fail

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5.5 Device Statistics

In addition to the SMART attribute structure, statistics pertaining to the operation and

health of the Intel SSD 320 Series can be reported to the host on request through the

Device Statistics log as defined in the ATA specification.

The Device Statistics log is a read-only GPL/SMART log located at read log address

0x04 and is accessible using READ LOG EXT, READ LOG DMA EXT or SMART READ LOG

commands.

Table 13 lists the Device Statistics supported by the Intel SSD 320 Series.

Table 13. Device Statistics Log

Page Offset Description Equivalent SMART attribute

if applicable

0x00 - List of Supported Pages -

0x01 - General Statistics

0x08 Power Cycle Count 0Ch

0x10 Power-On Hours 09h

0x18 Logical Sectors Written E1h

0x20 Num Write Commands - incremented by

one for every host write command -

0x28 Logical Sectors Read F2h

0x30 Num Read Commands - incremented by

one for every host write command -

0x04 - General Errors Statistics 0x08 Num Reported Uncorrectable Errors BBh

0x10 Num Resets Between Command

Acceptance and Completion -

0x06 - Transport Statistics 0x08 Num Hardware Resets -

0x10 Num ASR Events -

0x18 Num Interface CRC Errors -

0x07 - Solid State Device Statistics 0x08 Percentage Used Endurance Indicator

E9h

Note: This device statistic

counts up from 0 rather than

down from 100, and may go

beyond 100 for drives that

exceed their expected lifetime.

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5.6 SMART Command Transport (SCT)

With SMART Command Transport (SCT), a host can send commands and data to an

SSD and receive status and data from an S SD using standard write/read comm ands to

manipulate two SMART Logs:

• Log Address E0h ("SCT Comm and/Status") — used to send commands and retrieve

status

• Log Address E1h ("SCT Data Transfer") — used to transport data

The Intel SSD 320 Series supports the following standard SCT actions:

• W rite Same — Intel SSD 320 Series implements this action code as described in the

ATA specification.

• Error Recovery Control — Intel SSD 320 Series accepts this action code, and will

store and return error-recovery time limit values.

• Feature Control - Intel SSD 320 Series supports feature code 0001h (write cache)

and feature code 0002h (write cache reordering).

5.7 Data Set Management Command Set

The Intel SSD 320 Series supports the Data Set Management command set Trim

attribute, which consists of:

• DATA SET MANAGEMENT

5.8 Host Protected Area Command Set

The Intel SSD 320 Series supports the Host Protected Area command set, which

consists of:

• READ NATIVE MAX ADDRESS

• SET MAX ADDRESS

• READ NATIVE MAX ADDRESS EXT

• SET MAX ADDRESS EXT

The Intel SSD 320 Series also supports the following optional commands:

• SE T MAX SET PASS WORD

•SET MAX LOCK

• SET MAX FREEZE LOCK

• SET MAX UNLOCK

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5.9 48-Bit Address Command Set

The Intel SSD 320 Series supports the 48-bit Address command set, which consists of:

• FLUSH CACHE EXT

•READ DMA EXT

• READ NATIVE MAX ADDRESS

• READ NATIVE MAX ADDRESS EXT

• READ SECTOR(S) EXT

• READ VERIFY SECTOR(S) EXT

• SET MAX ADDRESS EXT

•WRITE DMA EXT

•WRITE MULTIPLE EXT

• WRITE SECTOR(S) EXT

5.10 Device Configuration Overlay Command Set

The Intel SSD 32 0 Series supports the Devic e Configura tion Overla y command set, which

consists of:

• DEVICE CONFIGURATION FREEZE LOCK

• DEVICE CONFIGURATION IDENTITY

• DEVICE CONFIGURATION RESTORE

• DEVICE CONFIGURATION SET

5.11 General Purpose Log Command Set

The Intel SSD 320 Series supports the General Purpose Log command set, which

consists of:

• READ LOG EXT

•WRITE LOG EXT

5.12 Native Command Queuing

The Intel SSD 320 Series supports the Native Command Queuing (NCQ) command set,

which includes:

• READ FPDMA QUEUED

• WRITE FPDMA QUEUED

Note: With a maximum queue depth equal to 32.

5.13 Software Settings Preservation

The Intel SSD 320 Series supports the SET FEATURES parameter to enable/disable the

preservation of software settings.

5.14 Device Initiated Power Management (DIPM)

The Intel SSD 320 Series supports the SET FEATURES parameter to enable Device

Initiated Power Management.

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6.0 Certifications and Declarations

Table 14 describes the Device Certifications supported by the Intel SSD 320 Series.

7.0 References

Table 15 identifies the standards information referenced in this document.

Table 14. Device Certifications and Declarations

Certification Description

CE Compliant Indicates conformity with the essential health and safety requirements described in European

Directives Low Voltage Directive and EMC Directive.

UL Certified Underwriters Laboratories, Inc. Component Recognition UL60950-1.

C-Tick Compliant Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic

Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).

BSMI Compliant Compliance to the Taiwan EMC standard “Limits and methods of me asur emen t of radio disturbance

characteristics of information technology equipment, CNS 13438 Class B.”

KCC Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control Regulation

and meets the Electromagnetic Compatibility (EMC) Framework requirements of the R adio Research

Laboratory (RRL) Ministry of Information and Communication Republic of Korea.

Microsoft WHQL Microsoft Windows Hardware Quality Labs

RoHS Compliant Restriction of Hazardous Substance Directive

VCCI Voluntary Control Council for Interface to cope with disturbance problems caused by personal

computers or f acsimile.

SATA-IO Indicates certified logo program from Serial ATA International Organization.

Table 15. Standards References

Date or

Rev. # Title Location

Sept 2010 Solid-State Driv e (SSD) R equirements and Endur ance Test Method

(JESD218) http://www.jedec.org/standards-

documents/docs/jesd218

Dec 2008 VCC I http://www.vcci.jp/vcci_e/

June 2009 RoHS Search for material description datashe et

at http://qdms.intel.com/

August 2009 ATA8-ACS Specification http://www.t13.org/

June 2009 Serial ATA Revision 3.0 http://www.sata-io.org

May 2006 SFF-8223, 2.5-inch Drive w/Serial Attachment Connector http://www.sffcommittee.org

May 2005 SFF-8201, 2.5-inch drive form factor http://www.sffcommittee.org

1995

1996

1995

1997

1994

International Electrotechnical Commission EN 61000

4-2 (Electrostatic discharge immunity test)

4-3 (Radi ated, r adi o-frequency, electromagnetic fiel d immunit y test )

4-4 (Electrical fast transient/burst immunity test)

4-5 (Surge immunity test)

4-6 (Immunity to conducted di sturbances, induced by radio-

frequency fields)

4-11 (Voltage Variations, voltage dips, short interruptions and

voltage variations immunity tests)

http://www.iec.ch

1995 ENV 50204

(Radiated electromagnetic field from digital radio telephones) http://www.dbicorporation.com/

radimmun.htm

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8.0 Terms and Acronyms

Table 16 defines the terms and acronyms used in this document.

Table 16. Glossary of Terms and Acronyms

Term Definition

ATA Advanced Technology Attachment

DAS Device Activity Signal

DIPM Device Initiated Power Management

DMA Direct M e mory Access

EXT Extended

FPDMA First Party Direct Memory Access

GB Gigabyte

Note: The total usable capacity of the SSD may be less than the total physical capacity because a

small portion of the capacity is used for NAND flash management and maintenance purposes.

Gb Gigabit

HDD Hard Disk Dr ive

KB Kilobyte

I/O Input/Output

IOPS Input/Output Operations Per Second

ISO International Standards Organization

LBA Logical Block Address

MB Megabyte

MLC Multi-level Cell

MTBF Mean Time Between Failures

NCQ Native Command Queuing

NOP No Operation

PIO Programmed Input/Output

RDT Reliability Demonstration Test

RMS Root Mean Square

RoHS Restriction of Hazardous Substances

SATA Serial Advanced Technology Attachment

SMART Self-Monitoring, Analysis and Reporting Technology

An open st andard for developing hard drives and software systems that automatically monitors the

health of a drive and reports potential problems.

SSD Solid-State Drive

TYP Typical

UBER Uncorrectable Bit Error Rate

VCCI Voluntary Control Council for Interface

WHQL Microsoft* Windows Hardware Quality Labs

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9.0 Revision History

Date Revision Description

March 2011 001 Initial release.

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Appendix A IDENTIFY DEVICE Command Data

Table 17 details the sector data returned after issuing an IDENTIFY DEVICE command.

Table 17. Returned Sector Data

Word F = Fixed

V = Variable

X = Both Default Value Description

0 F 0040h General configuration bit-significant information

1 X 3FFFh Obsolete - Number of logical cylinders (16,383)

2 V C837h Specific configuration

3 X 0010h Obsolete - Number of logical heads (16)

4-5 X 0h Retired

6 X 003Fh Obsolete - Number of logical sectors per logical track (63)

7-8 V 0h Reserved for a ssignment by the CompactFlash* Association (CFA)

9X 0hRetired

10-19 F varies Serial number (20 ASCII characters)

20-21 X 0h Retired

22 X 0h Obsolete

23-26 F varies Firmware revision (8 ASCII characters)

27-46 F varies Model number (Intel® Solid-State Drive)

47 F 8010h 7:0—Maximum number of sectors transferred per interrupt on multiple

commands

48 F 0000h Reserved

49 F 2F00h Capabilities

50 F 4000h Capabilities

51-52 X 0h Obsolete

53 F 0007h Words 88 and 70:64 valid

54 X 3FFFh Obsolete - Number of logical cylinders (16,383)

55 X 0010h Obsolete - Number of logical heads (16)

56 X 003Fh Obsolete - Number of logical sectors per logical track (63)

57-58 X 00FBFC10h Obsolete

59 V 0110h Number of sectors transferred per interrupt on multiple commands

60-61 F varies Total number of user-addressable sectors

62 X 0h Obsolete

63 F 0007h Multi-word DMA modes supported/selected

64 F 0003h PIO modes supported

65 F 0078h Minimum multiword DMA transfer cycle time per word

66 F 0078h Manufacturer’s recommended multiword DMA transfer cycle time

67 F 0078h Minimum PIO transfer cycle time without flow control

68 F 0078h Minimum PIO transfer cycle time with IORDY flow control

69 F 4020h Additional Supported

70 F 0000h Reserved

71-74 F 0h Reserved for IDENTIFY PACKET DEVICE command

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75 F 001Fh Queue depth

76 F 0506h Serial ATA capabilities

77 F 0h Reserved for future Serial ATA definition

78 F 0048h Serial ATA features supported

79 V 0040h Serial ATA features enabled

80 F 01FCh Major version number

81 F 0029h Minor version number

82 F 746Bh Command set supported

83 F 7D01h Command sets supported

84 F 6163h Command set/feature supported extension

85 V 7469h Command set/feature enabled

86 V BC01h Command set/feature enabled

87 V 6163h Command set/feature default

88 V 407Fh Ultra DMA Modes

89 F 0001h Time required for security erase unit completion

90 F 0001h Time required for enhanced security erase completion

91 V 0h Current advanced power management value

92 V FFFEh Master Password Revision Code

93 F 0h Hardware reset result: the contents of bits (12:0) of this word shall

change only during the execution of a hardware reset

94 V 0h Vendor’s recommended and actual acoustic management value

95 F 0h Stream minimum request size

96 V 0h Streaming transfer time - DMA

97 V 0h Streaming access latency - DMA and PIO

98-99 F 0h Streaming performance granularity

100-103 V varies Maximum user LBA for 48-bit address feature set

104 V 0h Streaming transfer time - PIO

105 F 0008h Reserved

106 F 4000h Physical sector size / logical sector size

107 F 0h Inter-seek delay for ISO-7779 acoustic testing in microseconds

108-111 F varies Unique ID

112-115 F 0h Reserved for world wide name extension to 128 bits

116 V 0h Reserved for technical report

117-118 F 0h Words per logical sector

119 F 401Ch Supported settings

120 F 401Ch Command set/feature enabled/supported

121-126 F 0h Reserved

127 F 0h Removable Media Status Notification feature set support

128 V 0021h Security status

129-159 X varies Vendor-specific

Table 17. Returned Sector Data (Continued)

Word F = Fixed

V = Variable

X = Both Default Value Description

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Notes: F = Fixed. The content of the word is fix ed and does not change. F or remov abl e media devices, thes e va lues may chan ge

when media is r emoved or changed.

V = Variable. The state of at least one bit in a word is variable and may change dependin g on the state of the device or

the commands executed by the device.

X = F or V. The content of the word may be fixed or variable.

160 F 0h CompactFlash Association (CFA) power mode 1

161-168 X 0h Reserved for assignment by the CFA

169 X 0001h Data set management Trim attribute support

170-173 F 0h Additional Product Identifier

174-175 F 0h Reserved

176-205 V 0h Current media serial number

206 X 003Dh SCT Comm and Transport

207-208 X 0000h Reserved

209 X 0000h Alignment of logical blocks within a physical block

210-211 X 0000h Write-Read-Verify Sector Count Mode 3 (DWord)

212-213 X 0000h Write-Read-Verify Sector Count Mode 2 (DWord)

214 X 0000h NV Cache Capabilities

215-216 X 0000h NV Cache Size in Logical Blocks (DWord)

217 X 0001h Nominal media rotation rate

218 X 0000h Reserved

219 X 0000h NV Cache Options

220 X 0000h Write-Read-Verify feature set

221 X 0000h Reserved

222 X 101Fh Transport major version number

223 X 0000h Transport minor version number

224-229 X 0000h Reserved

230-233 X 0000h Extended Number of User Addressable Sectors (QWord)

234 X 0001h Minimum number of 512-byte data blocks per DOWNLOAD MICROCODE

command for mode 03h

235 X 0400h Maximum number of 512-byte data blocks per DOWNLOAD MICROCODE

command for mode 03h

236-254 X 0000h Reserved

255 X varies Integrity word

Table 17. Returned Sector Data (Continued)

Word F = Fixed

V = Variable

X = Both Default Value Description