Rev.2.1_00 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR S-801 Series The S-801 Series is a series of high-precision voltage detectors with a built-in delay time generator of fixed time developed using CMOS process. The detection voltage is fixed internally, with an accuracy of 2.0 %. Internal oscillator and counter timer can delay the release signal without external parts. Three delay times 50 ms, 100 ms, and 200 ms are available. Two output forms, Nch open-drain and CMOS output, are available. Features * * * * * 1.3 A typ. (at VDD=3.5 V) 2.0 % 60 mV typ. 2.2 V to 6.0 V (0.1 V step) A type 50 ms typ. B type 100 ms typ. C type 200 ms typ. * ON/OFF switching function of delay time (DS pin) * Operating voltage range 0.95 V to 10.0 V * Output forms Nch open-drain output (Active Low) CMOS output (Active Low) Ultra-low current consumption High-precision detection voltage Hysteresis characteristics Detection voltage Three delay times Applications * Power monitor for portable equipment such as notebook computers, digital still cameras, PDA, and cellular phones. * Constant voltage power monitor for cameras, video equipment and communication devices. * Power monitor for microcomputers and reset for CPUs. Packages Package name SOT-23-5 SNT-4A Package MP005-A PF004-A Drawing code Tape MP005-A PF004-A Seiko Instruments Inc. Reel MP005-A PF004-A 1 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Block Diagrams 1. Nch Open-drain Output Products VDD Delay circuit + *1 - Oscillator counter timer VREF OUT *1 *1 VSS DS *1. Parasitic diode Figure 1 2. CMOS Output Products VDD + *1 - Delay circuit *1 OUT Oscillator counter timer *1 *1 VREF VSS DS *1. Parasitic diode Figure 2 2 Seiko Instruments Inc. ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Product Name Structure The detection voltage, delay time, output form and packages for S-801 Series can be selected at the user's request. Refer to the "1. Product name" for the construction of the product name and "2. Product Name List" for the full product names. 1. Product Name 1-1. SOT-23-5 package S-801xx x x MC - xxx - T2 IC direction in tape specifications T2: SOT-23-5 *1 *2 Product code Package code MC: SOT-23-5 Output form N: Nch open-drain output (Active low) L: CMOS output (Active low) Delay time A: 50 ms typ. B: 100 ms typ. C: 200 ms typ. Detection voltage value 22 to 60 (e.g. When the detection voltage is 2.2 V, it is expressed as 22.) *1. Refer to the taping specifications at the end this book. T2 is the standard. *2. Refer to the Table 1 in the "2. Product name list". Seiko Instruments Inc. 3 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series 1-2. SNT-4A package S-801xx x x PF - xxx TF G Fixed IC direction in tape specifications TF: SNT-4A *1 *2 Product code Package code PF: SNT-4A Output form N: Nch open-drain output (Active low) L: CMOS output (Active low) Delay time A: 50 ms typ. B: 100 ms typ. C: 200 ms typ. Detection voltage value 22 to 60 (e.g. When the detection voltage is 2.2 V, it is expressed as 22.) *1. Refer to the taping specifications at the end this book. TF is the standard. *2. Refer to the Table 2 in the "2. Product name list". 2. Product Name List 2-1. SOT-23-5 Table 1 (1/3) Detection voltage range 2.2 V 2.0% 2.3 V 2.0% 2.4 V 2.0% 2.5 V 2.0% 2.6 V 2.0% 2.7 V 2.0% 2.8 V 2.0% 4 Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80122ANMC-JCH-T2 S-80122BNMC-JGH-T2 S-80122CNMC-JKH-T2 S-80123ANMC-JCI-T2 S-80123BNMC-JGI-T2 S-80123CNMC-JKI-T2 S-80124ANMC-JCJ-T2 S-80124BNMC-JGJ-T2 S-80124CNMC-JKJ-T2 S-80125ANMC-JCK-T2 S-80125BNMC-JGK-T2 S-80125CNMC-JKK-T2 S-80126ANMC-JCL-T2 S-80126BNMC-JGL-T2 S-80126CNMC-JKL-T2 S-80127ANMC-JCM-T2 S-80127BNMC-JGM-T2 S-80127CNMC-JKM-T2 S-80128ANMC-JCN-T2 S-80128BNMC-JGN-T2 S-80128CNMC-JKN-T2 Seiko Instruments Inc. CMOS output products S-80122ALMC-JAH-T2 S-80122BLMC-JEH-T2 S-80122CLMC-JIH-T2 S-80123ALMC-JAI-T2 S-80123BLMC-JEI-T2 S-80123CLMC-JII-T2 S-80124ALMC-JAJ-T2 S-80124BLMC-JEJ-T2 S-80124CLMC-JIJ-T2 S-80125ALMC-JAK-T2 S-80125BLMC-JEK-T2 S-80125CLMC-JIK-T2 S-80126ALMC-JAL-T2 S-80126BLMC-JEL-T2 S-80126CLMC-JIL-T2 S-80127ALMC-JAM-T2 S-80127BLMC-JEM-T2 S-80127CLMC-JIM-T2 S-80128ALMC-JAN-T2 S-80128BLMC-JEN-T2 S-80128CLMC-JIN-T2 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Table 1 (2/3) Detection voltage range 2.9 V 2.0% 3.0 V 2.0% 3.1 V 2.0% 3.2 V 2.0% 3.3 V 2.0% 3.4 V 2.0% 3.5 V 2.0% 3.6 V 2.0% 3.7 V 2.0% 3.8 V 2.0% 3.9 V 2.0% 4.0 V 2.0% 4.1 V 2.0% 4.2 V 2.0% 4.3 V 2.0% 4.4 V 2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80129ANMC-JCO-T2 S-80129BNMC-JGO-T2 S-80129CNMC-JKO-T2 S-80130ANMC-JCP-T2 S-80130BNMC-JGP-T2 S-80130CNMC-JKP-T2 S-80131ANMC-JCQ-T2 S-80131BNMC-JGQ-T2 S-80131CNMC-JKQ-T2 S-80132ANMC-JCR-T2 S-80132BNMC-JGR-T2 S-80132CNMC-JKR-T2 S-80133ANMC-JCS-T2 S-80133BNMC-JGS-T2 S-80133CNMC-JKS-T2 S-80134ANMC-JCT-T2 S-80134BNMC-JGT-T2 S-80134CNMC-JKT-T2 S-80135ANMC-JCU-T2 S-80135BNMC-JGU-T2 S-80135CNMC-JKU-T2 S-80136ANMC-JCV-T2 S-80136BNMC-JGV-T2 S-80136CNMC-JKV-T2 S-80137ANMC-JCW-T2 S-80137BNMC-JGW-T2 S-80137CNMC-JKW-T2 S-80138ANMC-JCX-T2 S-80138BNMC-JGX-T2 S-80138CNMC-JKX-T2 S-80139ANMC-JCY-T2 S-80139BNMC-JGY-T2 S-80139CNMC-JKY-T2 S-80140ANMC-JCZ-T2 S-80140BNMC-JGZ-T2 S-80140CNMC-JKZ-T2 S-80141ANMC-JC2-T2 S-80141BNMC-JG2-T2 S-80141CNMC-JK2-T2 S-80142ANMC-JC3-T2 S-80142BNMC-JG3-T2 S-80142CNMC-JK3-T2 S-80143ANMC-JC4-T2 S-80143BNMC-JG4-T2 S-80143CNMC-JK4-T2 S-80144ANMC-JC5-T2 S-80144BNMC-JG5-T2 S-80144CNMC-JK5-T2 Seiko Instruments Inc. CMOS output products S-80129ALMC-JAO-T2 S-80129BLMC-JEO-T2 S-80129CLMC-JIO-T2 S-80130ALMC-JAP-T2 S-80130BLMC-JEP-T2 S-80130CLMC-JIP-T2 S-80131ALMC-JAQ-T2 S-80131BLMC-JEQ-T2 S-80131CLMC-JIQ-T2 S-80132ALMC-JAR-T2 S-80132BLMC-JER-T2 S-80132CLMC-JIR-T2 S-80133ALMC-JAS-T2 S-80133BLMC-JES-T2 S-80133CLMC-JIS-T2 S-80134ALMC-JAT-T2 S-80134BLMC-JET-T2 S-80134CLMC-JIT-T2 S-80135ALMC-JAU-T2 S-80135BLMC-JEU-T2 S-80135CLMC-JIU-T2 S-80136ALMC-JAV-T2 S-80136BLMC-JEV-T2 S-80136CLMC-JIV-T2 S-80137ALMC-JAW-T2 S-80137BLMC-JEW-T2 S-80137CLMC-JIW-T2 S-80138ALMC-JAX-T2 S-80138BLMC-JEX-T2 S-80138CLMC-JIX-T2 S-80139ALMC-JAY-T2 S-80139BLMC-JEY-T2 S-80139CLMC-JIY-T2 S-80140ALMC-JAZ-T2 S-80140BLMC-JEZ-T2 S-80140CLMC-JIZ-T2 S-80141ALMC-JA2-T2 S-80141BLMC-JE2-T2 S-80141CLMC-JI2-T2 S-80142ALMC-JA3-T2 S-80142BLMC-JE3-T2 S-80142CLMC-JI3-T2 S-80143ALMC-JA4-T2 S-80143BLMC-JE4-T2 S-80143CLMC-JI4-T2 S-80144ALMC-JA5-T2 S-80144BLMC-JE5-T2 S-80144CLMC-JI5-T2 5 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Table 1 (3/3) Detection voltage range 4.5 V 2.0% 4.6 V 2.0% 4.7 V 2.0% 4.8 V 2.0% 4.9 V 2.0% 5.0 V 2.0% 5.1 V 2.0% 5.2 V 2.0% 5.3 V 2.0% 5.4 V 2.0% 5.5 V 2.0% 5.6 V 2.0% 5.7 V 2.0% 5.8 V 2.0% 5.9 V 2.0% 6.0 V 2.0% 6 Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80145ANMC-JC6-T2 S-80145BNMC-JG6-T2 S-80145CNMC-JK6-T2 S-80146ANMC-JC7-T2 S-80146BNMC-JG7-T2 S-80146CNMC-JK7-T2 S-80147ANMC-JC8-T2 S-80147BNMC-JG8-T2 S-80147CNMC-JK8-T2 S-80148ANMC-JC9-T2 S-80148BNMC-JG9-T2 S-80148CNMC-JK9-T2 S-80149ANMC-JDA-T2 S-80149BNMC-JHA-T2 S-80149CNMC-JLA-T2 S-80150ANMC-JDB-T2 S-80150BNMC-JHB-T2 S-80150CNMC-JLB-T2 S-80151ANMC-JDC-T2 S-80151BNMC-JHC-T2 S-80151CNMC-JLC-T2 S-80152ANMC-JDD-T2 S-80152BNMC-JHD-T2 S-80152CNMC-JLD-T2 S-80153ANMC-JDE-T2 S-80153BNMC-JHE-T2 S-80153CNMC-JLE-T2 S-80154ANMC-JDF-T2 S-80154BNMC-JHF-T2 S-80154CNMC-JLF-T2 S-80155ANMC-JDG-T2 S-80155BNMC-JHG-T2 S-80155CNMC-JLG-T2 S-80156ANMC-JDH-T2 S-80156BNMC-JHH-T2 S-80156CNMC-JLH-T2 S-80157ANMC-JDI-T2 S-80157BNMC-JHI-T2 S-80157CNMC-JLI-T2 S-80158ANMC-JDJ-T2 S-80158BNMC-JHJ-T2 S-80158CNMC-JLJ-T2 S-80159ANMC-JDK-T2 S-80159BNMC-JHK-T2 S-80159CNMC-JLK-T2 S-80160ANMC-JDL-T2 S-80160BNMC-JHL-T2 S-80160CNMC-JLL-T2 Seiko Instruments Inc. CMOS output products S-80145ALMC-JA6-T2 S-80145BLMC-JE6-T2 S-80145CLMC-JI6-T2 S-80146ALMC-JA7-T2 S-80146BLMC-JE7-T2 S-80146CLMC-JI7-T2 S-80147ALMC-JA8-T2 S-80147BLMC-JE8-T2 S-80147CLMC-JI8-T2 S-80148ALMC-JA9-T2 S-80148BLMC-JE9-T2 S-80148CLMC-JI9-T2 S-80149ALMC-JBA-T2 S-80149BLMC-JFA-T2 S-80149CLMC-JJA-T2 S-80150ALMC-JBB-T2 S-80150BLMC-JFB-T2 S-80150CLMC-JJB-T2 S-80151ALMC-JBC-T2 S-80151BLMC-JFC-T2 S-80151CLMC-JJC-T2 S-80152ALMC-JBD-T2 S-80152BLMC-JFD-T2 S-80152CLMC-JJD-T2 S-80153ALMC-JBE-T2 S-80153BLMC-JFE-T2 S-80153CLMC-JJE-T2 S-80154ALMC-JBF-T2 S-80154BLMC-JFF-T2 S-80154CLMC-JJF-T2 S-80155ALMC-JBG-T2 S-80155BLMC-JFG-T2 S-80155CLMC-JJG-T2 S-80156ALMC-JBH-T2 S-80156BLMC-JFH-T2 S-80156CLMC-JJH-T2 S-80157ALMC-JBI-T2 S-80157BLMC-JFI-T2 S-80157CLMC-JJI-T2 S-80158ALMC-JBJ-T2 S-80158BLMC-JFJ-T2 S-80158CLMC-JJJ-T2 S-80159ALMC-JBK-T2 S-80159BLMC-JFK-T2 S-80159CLMC-JJK-T2 S-80160ALMC-JBL-T2 S-80160BLMC-JFL-T2 S-80160CLMC-JJL-T2 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series 2-2. SNT-4A Table 2 (1/3) Detection voltage range 2.2 V 2.0% 2.3 V 2.0% 2.4 V 2.0% 2.5 V 2.0% 2.6 V 2.0% 2.7 V 2.0% 2.8 V 2.0% 2.9 V 2.0% 3.0 V 2.0% 3.1 V 2.0% 3.2 V 2.0% 3.3 V 2.0% 3.4 V 2.0% 3.5 V 2.0% 3.6 V 2.0% 3.7 V 2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80122ANPF-JCHTFG S-80122BNPF-JGHTFG S-80122CNPF-JKHTFG S-80123ANPF-JCITFG S-80123BNPF-JGITFG S-80123CNPF-JKITFG S-80124ANPF-JCJTFG S-80124BNPF-JGJTFG S-80124CNPF-JKJTFG S-80125ANPF-JCKTFG S-80125BNPF-JGKTFG S-80125CNPF-JKKTFG S-80126ANPF-JCLTFG S-80126BNPF-JGLTFG S-80126CNPF-JKLTFG S-80127ANPF-JCMTFG S-80127BNPF-JGMTFG S-80127CNPF-JKMTFG S-80128ANPF-JCNTFG S-80128BNPF-JGNTFG S-80128CNPF-JKNTFG S-80129ANPF-JCOTFG S-80129BNPF-JGOTFG S-80129CNPF-JKOTFG S-80130ANPF-JCPTFG S-80130BNPF-JGPTFG S-80130CNPF-JKPTFG S-80131ANPF-JCQTFG S-80131BNPF-JGQTFG S-80131CNPF-JKQTFG S-80132ANPF-JCRTFG S-80132BNPF-JGRTFG S-80132CNPF-JKRTFG S-80133ANPF-JCSTFG S-80133BNPF-JGSTFG S-80133CNPF-JKSTFG S-80134ANPF-JCTTFG S-80134BNPF-JGTTFG S-80134CNPF-JKTTFG S-80135ANPF-JCUTFG S-80135BNPF-JGUTFG S-80135CNPF-JKUTFG S-80136ANPF-JCVTFG S-80136BNPF-JGVTFG S-80136CNPF-JKVTFG S-80137ANPF-JCWTFG S-80137BNPF-JGWTFG S-80137CNPF-JKWTFG Seiko Instruments Inc. CMOS output products S-80122ALPF-JAHTFG S-80122BLPF-JEHTFG S-80122CLPF-JIHTFG S-80123ALPF-JAITFG S-80123BLPF-JEITFG S-80123CLPF-JIITFG S-80124ALPF-JAJTFG S-80124BLPF-JEJTFG S-80124CLPF-JIJTFG S-80125ALPF-JAKTFG S-80125BLPF-JEKTFG S-80125CLPF-JIKTFG S-80126ALPF-JALTFG S-80126BLPF-JELTFG S-80126CLPF-JILTFG S-80127ALPF-JAMTFG S-80127BLPF-JEMTFG S-80127CLPF-JIMTFG S-80128ALPF-JANTFG S-80128BLPF-JENTFG S-80128CLPF-JINTFG S-80129ALPF-JAOTFG S-80129BLPF-JEOTFG S-80129CLPF-JIOTFG S-80130ALPF-JAPTFG S-80130BLPF-JEPTFG S-80130CLPF-JIPTFG S-80131ALPF-JAQTFG S-80131BLPF-JEQTFG S-80131CLPF-JIQTFG S-80132ALPF-JARTFG S-80132BLPF-JERTFG S-80132CLPF-JIRTFG S-80133ALPF-JASTFG S-80133BLPF-JESTFG S-80133CLPF-JISTFG S-80134ALPF-JATTFG S-80134BLPF-JETTFG S-80134CLPF-JITTFG S-80135ALPF-JAUTFG S-80135BLPF-JEUTFG S-80135CLPF-JIUTFG S-80136ALPF-JAVTFG S-80136BLPF-JEVTFG S-80136CLPF-JIVTFG S-80137ALPF-JAWTFG S-80137BLPF-JEWTFG S-80137CLPF-JIWTFG 7 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Table 2 (2/3) Detection voltage range 3.8 V 2.0% 3.9 V 2.0% 4.0 V 2.0% 4.1 V 2.0% 4.2 V 2.0% 4.3 V 2.0% 4.4 V 2.0% 4.5 V 2.0% 4.6 V 2.0% 4.7 V 2.0% 4.8 V 2.0% 4.9 V 2.0% 5.0 V 2.0% 5.1 V 2.0% 5.2 V 2.0% 5.3 V 2.0% 8 Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80138ANPF-JCXTFG S-80138BNPF-JGXTFG S-80138CNPF-JKXTFG S-80139ANPF-JCYTFG S-80139BNPF-JGYTFG S-80139CNPF-JKYTFG S-80140ANPF-JCZTFG S-80140BNPF-JGZTFG S-80140CNPF-JKZTFG S-80141ANPF-JC2TFG S-80141BNPF-JG2TFG S-80141CNPF-JK2TFG S-80142ANPF-JC3TFG S-80142BNPF-JG3TFG S-80142CNPF-JK3TFG S-80143ANPF-JC4TFG S-80143BNPF-JG4TFG S-80143CNPF-JK4TFG S-80144ANPF-JC5TFG S-80144BNPF-JG5TFG S-80144CNPF-JK5TFG S-80145ANPF-JC6TFG S-80145BNPF-JG6TFG S-80145CNPF-JK6TFG S-80146ANPF-JC7TFG S-80146BNPF-JG7TFG S-80146CNPF-JK7TFG S-80147ANPF-JC8TFG S-80147BNPF-JG8TFG S-80147CNPF-JK8TFG S-80148ANPF-JC9TFG S-80148BNPF-JG9TFG S-80148CNPF-JK9TFG S-80149ANPF-JDATFG S-80149BNPF-JHATFG S-80149CNPF-JLATFG S-80150ANPF-JDBTFG S-80150BNPF-JHBTFG S-80150CNPF-JLBTFG S-80151ANPF-JDCTFG S-80151BNPF-JHCTFG S-80151CNPF-JLCTFG S-80152ANPF-JDDTFG S-80152BNPF-JHDTFG S-80152CNPF-JLDTFG S-80153ANPF-JDETFG S-80153BNPF-JHETFG S-80153CNPF-JLETFG Seiko Instruments Inc. CMOS output products S-80138ALPF-JAXTFG S-80138BLPF-JEXTFG S-80138CLPF-JIXTFG S-80139ALPF-JAYTFG S-80139BLPF-JEYTFG S-80139CLPF-JIYTFG S-80140ALPF-JAZTFG S-80140BLPF-JEZTFG S-80140CLPF-JIZTFG S-80141ALPF-JA2TFG S-80141BLPF-JE2TFG S-80141CLPF-JI2TFG S-80142ALPF-JA3TFG S-80142BLPF-JE3TFG S-80142CLPF-JI3TFG S-80143ALPF-JA4TFG S-80143BLPF-JE4TFG S-80143CLPF-JI4TFG S-80144ALPF-JA5TFG S-80144BLPF-JE5TFG S-80144CLPF-JI5TFG S-80145ALPF-JA6TFG S-80145BLPF-JE6TFG S-80145CLPF-JI6TFG S-80146ALPF-JA7TFG S-80146BLPF-JE7TFG S-80146CLPF-JI7TFG S-80147ALPF-JA8TFG S-80147BLPF-JE8TFG S-80147CLPF-JI8TFG S-80148ALPF-JA9TFG S-80148BLPF-JE9TFG S-80148CLPF-JI9TFG S-80149ALPF-JBATFG S-80149BLPF-JFATFG S-80149CLPF-JJATFG S-80150ALPF-JBBTFG S-80150BLPF-JFBTFG S-80150CLPF-JJBTFG S-80151ALPF-JBCTFG S-80151BLPF-JFCTFG S-80151CLPF-JJCTFG S-80152ALPF-JBDTFG S-80152BLPF-JFDTFG S-80152CLPF-JJDTFG S-80153ALPF-JBETFG S-80153BLPF-JFETFG S-80153CLPF-JJETFG ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Table 2 (3/3) Detection voltage range 5.4 V 2.0% 5.5 V 2.0% 5.6 V 2.0% 5.7 V 2.0% 5.8 V 2.0% 5.9 V 2.0% 6.0 V 2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80154ANPF-JDFTFG S-80154BNPF-JHFTFG S-80154CNPF-JLFTFG S-80155ANPF-JDGTFG S-80155BNPF-JHGTFG S-80155CNPF-JLGTFG S-80156ANPF-JDHTFG S-80156BNPF-JHHTFG S-80156CNPF-JLHTFG S-80157ANPF-JDITFG S-80157BNPF-JHITFG S-80157CNPF-JLITFG S-80158ANPF-JDJTFG S-80158BNPF-JHJTFG S-80158CNPF-JLJTFG S-80159ANPF-JDKTFG S-80159BNPF-JHKTFG S-80159CNPF-JLKTFG S-80160ANPF-JDLTFG S-80160BNPF-JHLTFG S-80160CNPF-JLLTFG Seiko Instruments Inc. CMOS output products S-80154ALPF-JBFTFG S-80154BLPF-JFFTFG S-80154CLPF-JJFTFG S-80155ALPF-JBGTFG S-80155BLPF-JFGTFG S-80155CLPF-JJGTFG S-80156ALPF-JBHTFG S-80156BLPF-JFHTFG S-80156CLPF-JJHTFG S-80157ALPF-JBITFG S-80157BLPF-JFITFG S-80157CLPF-JJITFG S-80158ALPF-JBJTFG S-80158BLPF-JFJTFG S-80158CLPF-JJJTFG S-80159ALPF-JBKTFG S-80159BLPF-JFKTFG S-80159CLPF-JJKTFG S-80160ALPF-JBLTFG S-80160BLPF-JFLTFG S-80160CLPF-JJLTFG 9 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Pin Configurations Table 3 SOT-23-5 Top view 5 1 Pin No. Pin name Pin description *1 DS ON/OFF switch for delay time 1 2 VSS GND pin *2 NC No connection 3 4 OUT Voltage detection output pin 5 VDD Voltage input pin *1. Refer to "2. Delay Circuit" in " Operation" for operation. *2. The NC pin is electrically open. The NC pin can be connected to VDD or VSS. 4 2 3 Figure 3 Table 4 SNT-4A Top view 1 4 2 3 Pin No. Pin name Pin description 1 VSS GND pin *1 DS ON/OFF switch for delay time 2 3 VDD Voltage input pin 4 OUT Voltage detection output pin *1. Refer to "2. Delay Circuit" in " Operation" for operation. Figure 4 Absolute Maximum Ratings Table 5 (Ta=25C unless otherwise specified) Absolute maximum ratings Unit Power supply voltage 12 V Output voltage Nch open-drain output products VSS-0.3 to VSS+12 CMOS output products VSS-0.3 to VDD+0.3 Output current IOUT 50 mA Power dissipation PD SOT-23-5 250 mW SNT-4A 140 Operating ambient temperature Topr -40 to +85 C Storage temperature Tstg -40 to +125 Caution The absolute maximum ratings are rated values exceeding which the product could suffer physical damage. These values must therefore not be exceeded under any conditions. Item 10 Symbol VDD-VSS VOUT Seiko Instruments Inc. ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Electrical Characteristics Table 6 Item Symbol *1 Detection voltage -VDET Hysteresis width Current consumption VHYS ISS Operating voltage VDD Output current IOUT Leakage current ILEAK Detection voltage temperature *2 coefficient Delay time 1 - VDET Ta * - VDET tD1 (Ta=25 C Unless otherwise specified) Test Condition Min. Typ. Max. Unit circuit -VDET(S) -VDET(S) -VDET(S) -- V 1 x0.98 x1.02 -- 30 60 100 mV S-80122 to 26 -- 1.3 3.3 A VDD=3.5 V S-80127 to 39 -- 1.5 3.5 VDD=4.5 V S-80140 to 60 -- 1.8 4.0 VDD=6.5 V -- 0.95 -- 10.0 V Output transistor, VDD=1.2 V 0.75 1.5 -- mA 2 Nch, VOUT=0.5 V S-80122 to 60 VDD=2.4 V 3.0 6.0 -- S-80127 to 60 V =4.8 V Only for CMOS output products, DD 1.0 2.0 -- S-80122 to 39 Output transistor, VDD=6.0 V Pch, VDD-VOUT=0.5 V 1.25 2.5 -- S-80140 to 54 VDD=8.4 V 1.5 3.0 -- S-80155 to 60 Only for Nch open-drain output products, Output transistor, A -- -- 0.1 Nch, VDD=10.0 V, VOUT=10.0 V Ta=-40 C to +85 C VDD=-VDET+1 V, DS pin Low -- 120 360 ppm/ C 1 S-801xxAx S-801xxBx S-801xxCx 32.5 50 72.5 ms 65 100 145 130 200 290 110 220 330 3 Delay time 2 tD2 s VDD=-VDET+1 V, DS pin High 1.0 -- -- V 4 Input voltage VSH DS pin, VDD=6.0 V -- -- 0.3 VSL DS pin, VDD=6.0 V *1. -VDET: Actual detection voltage value, -VDET(S): Specified detection voltage value (The center value of the detection voltage range in Table 1 to 2.) *2. Temperature change ratio for the detection voltage [mV/C] is calculated using the following equation. - VDET [mV/ C]*1 = -VDET(S) (Typ.) [V ]*2 x - VDET [ppm/ C]*3 / 1000 Ta * - VDET Ta *1. Temperature change ratio of the detection voltage *2. Specified detection voltage value *3. Detection voltage temperature coefficient Seiko Instruments Inc. 11 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Test Circuits 1. A *1 R 100 k VDD DS 2. VDD DS OUT VSS OUT A VSS V *1. R is unnecessary for CMOS output products. Figure 5 Figure 6 3. *1 R 100 k VDD DS 4. A VDD OUT VSS DS V V *1. R is unnecessary for CMOS output products. Figure 7 12 OUT VSS *1. R is unnecessary for CMOS output products. *1 R 100 k Figure 8 Seiko Instruments Inc. ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Operation 1. Basic Operation: CMOS Output (Active Low) 1-1. When the power supply voltage (VDD) is higher than the release voltage (+VDET), the Nch transistor is OFF and the Pch transistor is ON to provide VDD (high) at the output. Since the (RB + RC ) * VDD Nch transistor N1 in Figure 9 is OFF, the comparator input voltage is . RA + RB + RC 1-2. When the VDD goes below +VDET, the output provides the VDD level, as long as VDD remains above the detection voltage (-VDET). When the VDD falls below -VDET (point A in Figure 10), the Nch transistor becomes ON, the Pch transistor becomes OFF, and the VSS level appears at the output. At this time the Nch transistor N1 in Figure 9 becomes ON, the comparator input RB * VDD . voltage is changed to RA + RB 1-3. When the VDD falls below the minimum operating voltage, the output becomes undefined, or goes to VDD when the output is pulled up to VDD. 1-4. The VSS level appears when VDD rises above the minimum operating voltage. The VSS level still appears even when VDD surpasses the -VDET, as long as it does not exceed the release voltage +VDET. 1-5. When VDD rises above +VDET (point B in Figure 10), the Nch transistor becomes OFF and the Pch transistor becomes ON to provide VDD at the output. The VDD at the OUT pin is delayed for tD due to the delay circuit. VDD *1 RA + Delay circuit - Pch OUT *1 RB VREF VSS Nch RC N1 DS *1. Paracitic diode Figure 9 Operation 1 Seiko Instruments Inc. 13 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series (1) (2) (3) (4) (5) VDD B Hysterisis width (VHYS) Release voltage (+VDET) Detection voltage (-VDET) A Minimum operating voltage VSS VDD Output from OUT pin VSS tD Figure 10 Operation 2 2. Delay Circuit 2-1. Delay Time The delay circuit delays the output signal from the time at which the power voltage (VDD) exceeds the release voltage (+VDET) when VDD is turned on. The output signal is not delayed when the VDD goes below the detection voltage (-VDET). (Refer to Figure 10.) The delay time (tD) is a fixed value that is determined by a built-in oscillation circuit and counter. 2-2. DS Pin (ON/OFF Switch Pin for Delay Time) The DS pin should be connected to Low or High. When the DS pin is High, the output delay time becomes short since the output signal is taken from the middle of counter circuit (Refer to Figure 15). 3. Other Characteristics 3-1. Temperature Characteristics of Detection Voltage The shaded area in Figure 11 shows the temperature characteristics of the detection voltage. -VDET [V] +0.792 mV/C 2.200 -0.792 mV/C -40 25 85 Ta [C] Figure 11 Temperature Characteristics of Detection Voltage (Example for S-80122xxxx) 14 Seiko Instruments Inc. ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series 3-2. Temperature Characteristics of Release Voltage The temperature coefficient coefficient + VDET Ta + VDET of the release voltage is calculated by the temperature Ta - VDET for the detection voltage as follows: Ta + VDET - VDET = x - VDET Ta The temperature coefficients for the release voltage and the detection voltage have the same sign consequently. 3-3. Temperature Characteristics of Hysteresis Voltage The temperature characteristics for the hysteresis voltage is expressed as + VDET - VDET and - Ta Ta is calculated as follows: + VDET - VDET VHYS - VDET - = x Ta Ta - VDET Ta Standard Circuit *1 VDD DS R 100 k OUT VSS *1. R is unnecessary for CMOS output products. Figure 12 Caution The above connection diagram and constant will not guarantees successful operation. Perform through using the actual application to set the constant. Seiko Instruments Inc. 15 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Technical Terms 1. Detection Voltage (-VDET), Release Voltage (+ +VDET) The detection voltage (-VDET) is a voltage at which the output turns to low. The detection voltage varies slightly among products of the same specification. The variation of detection voltage between the specified minimum (-VDET) Min. and the maximum (-VDET) Max. is called the detection voltage range (Refer to Figure 13). e.g. For the S-80122AN, the detection voltage lies in the range of 2.156 (-VDET) 2.244. This means that some S-80122ANs have 2.156 V for -VDET and some have 2.244 V. The release voltage (+VDET) is a voltage at which the output turns to high. The release voltage varies slightly among products of the same specification. The variation of release voltages between the specified minimum (+VDET) Min. and the maximum (+VDET) Max. is called the release voltage range (Refer to Figure 14). e.g. For the S-80122AN, the release voltage lies in the range of 2.186 (+VDET) 2.344. This means that some S-80122ANs have 2.186 V for +VDET and some have 2.344 V. VDD VDD Detection voltage (-VDET) Max. Detection voltage range (-VDET) Min. Release voltage (+VDET) Max. (+VDET) Min. Release voltage range OUT OUT Delay time Figure 13 Detection Voltage Figure 14 Release Voltage Remark Although the detection voltage and release voltage overlap in the range of 2.186 V to 2.244 V, +VDET is always larger than -VDET. 16 Seiko Instruments Inc. ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series 2. Hysteresis Width (VHYS) Hysteresis width is the voltage difference between the detection voltage and the release voltage (The voltage at point B-The voltage at point A=VHYS in Figure 10). The existence of the hysteresis width prevents malfunction caused by noise on input signal. 3. Delay Time (tD) Delay time is a time internally measured from the instant at which input voltage to the VDD pin exceeds the release voltage (+VDET) to the point at which the output of the OUT pin inverts. The delay time is fixed in each series distinguished by A, B and C. S-801xxAx series: typ. 50 ms S-801xxBx series: typ. 100 ms S-801xxCx series: typ. 200 ms The output of the OUT pin can be inverted in a short delay time (tD2) by setting the DS pin High (Refer to Figure 15). VDD V +VDET at DS="H" OUT tD1 tD2 Figure 15 4. Through-type Current The through-type current refers to the current that flows instantaneously at the time of detection and release of a voltage detector. The through-type current flows at a frequency of 20 kHz during release delay time since the internal logic circuit operates. Seiko Instruments Inc. 17 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series 5. Oscillation In applications where a resistor is connected to the voltage detector input (Figure 16), taking a CMOS active low products for example, the through-type current which is generated when the output goes from low to high (release) causes a voltage drop equal to [through-type current] x [input resistance] across the resistor. When the input voltage drops below the detection voltage (-VDET) as a result, the output voltage goes to low level. In this state, the through-type current stops and its resultant voltage drop disappears, and the output goes from low to high. The through-type current is again generated, a voltage drop appears, and repeating the process finally induces oscillation. VDD RA VIN S-801 OUT RB VSS Figure 16 Example for Bad Implementation of Input Voltage Divider Precautions * In the S-801 series products, the through-type current flows at a frequency of 20 kHz approximately during the delay time since the internal oscillator circuit and counter timer operate at voltage release. High impedance in the input may cause oscillation by the through-type current. When the input impedance is high, insert a capacitor between VDD pin and VSS pin to prevent oscillation. * Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic protection circuit. * In CMOS output products of the S-801 Series, the through-type current flows at detection and release. If the impedance is high, oscillation may occur due to the voltage drop by the through-type current during releasing. * When designing for mass production using an application circuit described herein, the product deviation and temperature characteristics should be taken into consideration. SII shall not bear any responsibility for the patents on the circuits described herein. * SII claims no responsibility for any and all disputes arising out of or in connection with any infringement of the products including this IC upon patents owned a third party. 18 Seiko Instruments Inc. ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Typical Characteristics (Typical Data) 1. Detection Voltage (VDET) - Temperature (Ta) S-80122AL S-80160AL 6.4 2.4 VDET [V] VDET [V] VDET (+) 2.3 2.2 6.2 VDET (+) 6.0 VDET (-) VDET (-) 5.8 2.1 -40 -20 0 20 40 60 80 -40 100 -20 0 20 40 60 80 100 60 80 100 Ta [C)] Ta [C] 100 100 90 90 80 80 VHYS [mV] VHYS [mV] 2. Hysteresis Voltage Width (VHYS) - Temperature (Ta) S-80122AL S-80160AL 70 60 50 60 50 40 40 30 30 -40 -20 0 20 40 60 80 -40 100 Ta [C] 3. Current Consumption (ISS) - Input Voltage (VDD) (a) S-80122AL Ta=25C -20 0 20 Ta=25C 3.5 3.0 ISS [A] 2.0 1.5 2.5 2.0 1.5 1.0 1.0 0.5 0.5 0.0 0.0 0 2 3.3 A 3.0 2.9 A 2.5 4 6 8 10 0 2 4 VDD [V] 8 10 (d) S-80160AL Ta=25C 5.0 A 3.5 2.5 2.5 ISS [A] 3.0 2.0 1.5 2.0 1.5 1.0 1.0 0.5 0.5 0.0 0.0 2 4 6 8 10 Ta=25C 20 A 3.5 3.0 0 6 VDD [V] (c) S-80130AL ISS [A] 40 Ta [C] (b) S-80129AL 3.5 ISS [A] 70 0 VDD [V] 2 4 6 8 10 VDD [V] Seiko Instruments Inc. 19 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series 4. Current Consumption (ISS) - Temperature (Ta) (a) S-80122AL VDD=3.5 V 5.0 (b) S-80129AL 4.0 ISS [A] ISS [A] 4.0 3.0 2.0 1.0 -20 0 20 40 60 80 100 -40 Ta [C] (c) S-80130AL 0 20 40 60 80 100 Ta [C] VDD=6.5 V 5.0 4.0 ISS [A] 4.0 3.0 2.0 3.0 2.0 1.0 1.0 0.0 0.0 -40 -20 0 20 40 60 80 100 Ta [C] 5. Nch Transistor Output Current (IOUT) -VOUT S-80160AL Ta=25C 70 VDD=1 V, 1.2 V 60 -40 30 2.4 V 20 IOUT [mA] 4V 0 20 40 60 80 100 6V 50 40 -20 Ta [C] 6. Pch Transistor Output Current (IOUT) - (VDD-VOUT) S-80122AL Ta=25C 40 5.5 V 30 VDD=4 V 4.8 V 10 V 20 8V 10 2V 10 0 6.5 V 0 0 2 4 6 8 10 VOUT [V] 7. Nch Transistor Output Current (IOUT) - Input Voltage (VDD) S-80160AL VDS=0.5 V 25 0 IOUT [mA] 15 10 85C 4 6 8 10 Ta= -40C 4 25C 5 2 VDD-VOUT [V] 8. Pch transistor Output Current (IOUT) - Input Voltage (VDD) S-80122AL VDS=0.5 V 5 Ta= -40C 20 3 2 25C 1 85C 0 0 0 2 4 6 8 10 0 2 4 6 VDD [V] VDD [V] 20 -20 (d) S-80160AL VDD=4.5 V 5.0 ISS [A] 2.0 0.0 -40 IOUT [mA] 3.0 1.0 0.0 IOUT [mA] VDD=4.5 V 5.0 Seiko Instruments Inc. 8 10 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series 9. Minimum Operating Voltage - Input Voltage (VDD) S-80122AN Pull-up, VDD:100 k 0.6 VOUT [V] 0.5 Ta= -40C 0.4 0.3 25C 0.2 0.1 85C 0 0 0.5 1 1.5 VDD [V] 11. Threshold Voltage of DS Pin - Input Voltage (VDD) S-80122AL 1 Threshold [V] threshold [V] 10. Threshold Voltage of DS Pin - Temperature (Ta) S-80122AL VDD=6.0 V 1 0.8 0.6 0.4 0.2 0.6 25C 0.4 85C 0.2 0 0 -40 0 -20 20 40 60 80 Delay time [ms] 150 100 50 20 40 10 60 80 VDD=7.0 V 200 150 100 50 100 -40 Ta [C] 13. Delay Time 1 - Input Voltage (VDD) S-80122CL -20 0 20 40 60 80 100 Ta [C] Ta=25C 300 Delay time [ms] 8 250 0 0 6 300 200 -20 4 S-80160CL 250 -40 2 VDD [V] VDD=3.2 V 300 0 0 100 Ta [C] 12. Delay Time 1 - Temperature (Ta) S-80122CL Delay time [ms] Ta= -40C 0.8 250 200 150 100 50 0 2 4 6 8 10 VDD [V] Seiko Instruments Inc. 21 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series S-80160AL VDD=3.2 V 400 350 300 250 200 150 100 50 0 Delay time [s] Delay time [s] 14. Delay Time 2 - Temperature (Ta) S-80122AL -40 0 -20 20 40 60 80 VDD=7.0 V 400 350 300 250 200 150 100 50 0 -40 100 -20 0 20 40 60 80 100 Ta [C] Ta [C] Delay time [s] 15. Delay Time 2 - Input Voltage (VDD) S-80122AN Ta=25C 400 350 300 250 200 150 100 50 0 2 4 6 8 10 VDD [V] VDD VIH *1 INPUT VOLTAGE VIL VDD DS V S-801 Series VSS tD *2 R 100 k OUT V VDDx90 % OUTPUT VOLTAGE *1. Set to VDD or VSS. *2. R is not necessary for CMOS output products. VSS VIH=10 V, VIL=0.95 V Figure 17 Measurment Condition for Delay Time Figure 18 Measurment Circuit for Delay Time Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. 22 Seiko Instruments Inc. ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series 16. Response Time - Load Capacitor (COUT) S-80122AL 0.1 tPHL 0.01 tPLH (Delay time2) Ta=25C 100 Response time [ms] 1 Response time [ms] S-80122AN Ta=25C 0.001 10 1 0.1 tPHL tPLH (Delay time2) 0.01 0.001 0.00001 0.0001 0.001 0.01 0.1 0.00001 0.0001 COUT [F] S-80160AL 0.01 0.1 S-80160AN Ta=25C 0.1 tPHL 0.01 tPLH (Delay time2) Ta=25C 100 Response time [ms] 1 Response time [ms] 0.001 COUT [F] 10 1 0.1 tPHL tPLH (Delay time2) 0.01 0.001 0.001 0.00001 0.0001 0.001 0.01 0.00001 0.1 0.0001 VIH 1 s 1 s VDD tPHL VDD 0.01 0.1 VDD INPUT VOLTAGE VIL 0.001 COUT [F] COUT [F] V DS tPLH S-801 Series VSS VDD x 90 % *1 R 100 k OUT V OUTPUT VOLTAGE *1. R is not necessary for CMOS output products. VDD x 10 % VIH=10 V, VIL=0.95 V Figure 19 Measurment Condition for Response Time Figure 20 Measurment Circuit for Response Time Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. Seiko Instruments Inc. 23 ULTRA-SMALL PACKAGE BUILT-IN DELAY CIRCUIT HIGH-PRECISION VOLTAGE DETECTOR Rev.2.1_00 S-801 Series Application Circuit Examples Microcomputer Reset Circuits If the power supply voltage to a microcomputer falls below the specified level, an unspecified operation may be performed or the contents of the memory register may be lost. When power supply voltage returns to normal, the microcomputer needs to be initialized before normal operations can be done. Reset circuits protect microcomputers in the event of current being momentarily switched off or lowered. Reset circuits shown in Figures 21 to 22 can be easily constructed with the help of the S-801 series that has low operating voltage, a high-precision detection voltage, hysteresis, and a built-in delay circuit. VDD1 VDD2 VDD S801xxAL S801xxAN Microcomputer VSS Microcomputer VSS (Nch open-drain output products only.) Figure 21 Ret Circuit (S-801xxAL) Figure 22 Reset Circuit (S-801xxAN) Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. 24 Seiko Instruments Inc. 2.90.2 1.90.2 4 5 1 2 +0.1 0.16 -0.06 3 0.950.1 0.40.1 No. MP005-A-P-SD-1.2 TITLE No. SOT235-A-PKG Dimensions MP005-A-P-SD-1.2 SCALE UNIT mm Seiko Instruments Inc. 4.00.1(10 pitches:40.00.2) +0.1 o1.5 -0 2.00.05 +0.2 o1.0 -0 0.250.1 4.00.1 1.40.2 3.20.2 3 2 1 4 5 Feed direction No. MP005-A-C-SD-2.1 TITLE SOT235-A-Carrier Tape No. MP005-A-C-SD-2.1 SCALE UNIT mm Seiko Instruments Inc. 12.5max. 9.00.3 Enlarged drawing in the central part o130.2 (60) (60) No. MP005-A-R-SD-1.1 SOT235-A-Reel TITLE No. MP005-A-R-SD-1.1 SCALE QTY. UNIT mm Seiko Instruments Inc. 3,000 1.20.04 +0.05 0.08 -0.02 0.65 0.480.02 0.20.05 No. PF004-A-P-SD-3.0 TITLE SNT-4A-A-PKG Dimensions PF004-A-P-SD-3.0 No. SCALE UNIT mm Seiko Instruments Inc. +0.1 o1.5 -0 4.00.1 2.00.05 0.250.05 +0.1 5 1.450.1 o0.5 -0 4.00.1 0.650.05 TF type 2 1 3 4 Feed direction No. PF004-A-C-SD-1.0 TITLE SNT-4A-A-Carrier Tape PF004-A-C-SD-1.0 No. SCALE UNIT mm Seiko Instruments Inc. 12.5max. 9.00.3 Enlarged drawing in the central part o130.2 (60) (60) No. PF004-A-R-SD-1.0 SNT-4A-A-Reel TITLE PF004-A-R-SD-1.0 No. SCALE UNIT QTY. mm Seiko Instruments Inc. 5,000 * * * * * * The information described herein is subject to change without notice. Seiko Instruments Inc. is not responsible for any problems caused by circuits or diagrams described herein whose related industrial properties, patents, or other rights belong to third parties. The application circuit examples explain typical applications of the products, and do not guarantee the success of any specific mass-production design. When the products described herein are regulated products subject to the Wassenaar Arrangement or other agreements, they may not be exported without authorization from the appropriate governmental authority. Use of the information described herein for other purposes and/or reproduction or copying without the express permission of Seiko Instruments Inc. is strictly prohibited. The products described herein cannot be used as part of any device or equipment affecting the human body, such as exercise equipment, medical equipment, security systems, gas equipment, or any apparatus installed in airplanes and other vehicles, without prior written permission of Seiko Instruments Inc. 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