ADC12130,ADC12132,ADC12138
ADC12130/ADC12132/ADC12138 Self-Calibrating 12-Bit Plus Sign Serial I/O
A/D Converters with MUX and Sample/Hold
Literature Number: SNAS098F
September 8, 2008
ADC12130/ADC12132/ADC12138
Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters
with MUX and Sample/Hold
General Description
NOTE: Some device/package combinations are obsolete
and are described and shown here for reference only. See
our web site for product availability.
The ADC12130, ADC12132 and ADC12138 are 12-bit plus
sign successive approximation Analog-to-Digital converters
with serial I/O and configurable input multiplexer. The
ADC12132 and ADC12138 have a 2 and an 8 channel mul-
tiplexer, respectively. The differential multiplexer outputs and
ADC inputs are available on the MUXOUT1, MUXOUT2,
A/DIN1 and A/DIN2 pins. The ADC12130 has a two channel
multiplexer with the multiplexer outputs and ADC inputs in-
ternally connected. The ADC12130 family is tested and spec-
ified with a 5 MHz clock. On request, these ADCs go through
a self calibration process that adjusts linearity, zero and full-
scale errors to typically less than ±1 LSB each.
The analog inputs can be configured to operate in various
combinations of single-ended, differential, or pseudo-differ-
ential modes. A fully differential unipolar analog input range
(0V to +5V) can be accommodated with a single +5V supply.
In the differential modes, valid outputs are obtained even
when the negative inputs are greater than the positive be-
cause of the 12-bit plus sign output data format.
The serial I/O is configured to comply with NSC MI-
CROWIRE. For voltage references, see the LM4040,
LM4050 or LM4041.
Features
Serial I/O (MICROWIRE, SPI and QSPI Compatible)
Power down mode
Programmable acquisition time
Variable digital output word length and format
No zero or full scale adjustment required
0V to 5V analog input range with single 5V power supply
Key Specifications
Resolution 12-bit plus sign
12-Bit plus sign conversion time 8.8 µs (max)
12-Bit plus sign throughput time 14 µs (max)
Integral Linearity Error ±2 LSB (max)
Single Supply 3.3V or 5V ±10%
Power Consumption
+3.3V 15 mW (max)
+3.3V power down 40 μW (typ)
+5V 33 mW (max)
+5V power down 100 μW (typ)
Applications
Pen-based computers
Digitizers
Global positioning systems
TRI-STATE® is a registered trademark of National Semiconductor Corporation.
© 2008 National Semiconductor Corporation 12079 www.national.com
ADC12130/ADC12132/ADC12138 Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters with
MUX and Sample/Hold
ADC12138 Simplified Block Diagram
1207901
Connection Diagrams
16-Pin Dual-In-Line and
Wide Body SO Packages
1207902
Top View
20-Pin SSOP Package
1207947
Top View
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ADC12130/ADC12132/ADC12138
28-Pin Dual-In-Line, SSOP and
Wide Body SO Packages
1207903
Top View
Ordering Information
Industrial Temperature Range
−40°C TA +85°C NS Package Number
ADC12130CIN N16E, Dual-In-Line
ADC12130CIWM M16B, Wide Body SO
ADC12130CIWMX M16B, Wide Body SO - Tape & Reel
ADC12132CIMSA MSA20, SSOP
ADC12132CIMSAX MSA20, SSOP - Tape & Reel
ADC12138CIN N28B, Dual-In-Line
ADC12138CIWM M28B
ADC12138CIWMX M28B - Tape & Reel
ADC12138CIMSA MSA28, SSOP
ADC12138CIMSA MSA28, SSOP - Tape & Reel
Some of these product/package combinations are obsolete and are shown here for reference only. Check the National web site
for availability.
Pin Descriptions
Pin Name Pin Description
CH0 thru CH7
Analog Inputs to the MUX (multiplexer). A channel input is selected by the address information at the DI pin,
which is loaded at the rising edge of SCLK into the address register (see Table 2 and Table 3). The voltage
applied to these inputs should not exceed VA+ or go below VA- or below GND. Exceeding this range on an
unselected channel may corrupt the reading of a selected channel.
COM Analog input pin that is used as a pseudo ground when the analog multiplexer is single-ended.
MUXOUT1
MUXOUT2
Multiplexer Output pins. If the multiplexer is used, these pins should be connected to the A/DIN pins, directly
or through an amplifier and/of filter.
A/DIN1
A/DIN2
Converter Input pins. MUXOUT1 is usually tied to A/DIN1. MUXOUT2 is usually tied to A/DIN2. If external
circuitry is placed between MUXOUT1 and A/DIN1, or MUXOUT2 and A/DIN2, it may be necessary to protect
these pins against voltage overload. The voltage at these pins should not exceed VA+ or go below AGND (see
Figure 6).
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ADC12130/ADC12132/ADC12138
Pin Name Pin Description
DO
Data Output pin. This pin is an active push/pull output when CS is low. When CS is high, this output is TRI-
STATE®. The conversion result (DB0–DB12) and converter status data are clocked out at the falling edge of
SCLK on this pin. The word length and format of this result can vary (see Table 1). The word length and format
are controlled by the data shifted into the multiplexer address and mode select register (see Table 4).
DI
Serial Data Input pin. The data applied to this pin is shifted at the rising edge of SCLK into the multiplexer
address and mode select register. Table 2 through Table 4 show the assignment of the multiplexer address
and the mode select data.
EOC
This pin is an active push/pull output which indicates the status of the ADC12130/2/8.A logic low on this pin
indicates that the ADC is busy with a conversion, Auto Calibration, Auto Zero or power down cycle. The rising
edge of EOC signals the end of one of these cycles
CONV
A logic low is required at this pin to program any mode or to change the ADC's configuration as listed in Mode
Programming (Table 4). When this pin is high, the ADC is placed in the read data only mode. While in the read
data only mode, bringing CS low and pulsing SCLK will only clock out the data stored in the ADCs output shift
register. The data at DI will be ignored. A new conversion will not be started and the ADC will remain in the
mode and/or configuration previously programmed. Read data only cannot be performed while a conversion,
Auto Cal or Auto Zero are in progress.
CS
Chip Select input pin. When a logic low is applied to this pin, the rising edge of SCLK shifts the data at the DI
input into the address register and brings DO out of TRI-STATE. With CS low, the falling edge of SCLK shifts
the data resulting from the previous ADC conversion out at the DO output, with the exception of the first bit of
data. When CS is low continuously, the first bit of the data is clocked out on the rising edge of EOC (end of
conversion). When CS is toggled, the falling edge of CS always clocks out the first bit of data. CS should be
brought low while SCLK is low. The falling edge of CS interrupts a conversion in progress and starts the
sequence for a new conversion. When CS is brought low during a conversion, that conversion is prematurely
terminated and the data in the output latches may be corrupted. Therefore, when CS is brought low during a
conversion in progress, the data output at that time should be ignored. CS may also be left continuously low.
In this case, it is imperative that the correct number of SCLK pulses be applied to the ADC in order to remain
synchronous. After the ADC supply power is applied, the device expects to see 13 clock pulses for each I/O
sequence. The number of clock pulses the ADC expects is the same as the digital output word length. This
word length can be modified by the data shifted in at the DO pin. Table 4 details the data required.
DOR Data Output Ready pin. This pin is an active push/pull output which is low when the conversion result is being
shifted out and goes high to signal that all the data has been shifted out.
SCLK
Serial Data Clock input. The clock applied to this input controls the rate at which the serial data exchange occurs.
The rising edge loads the information at the DI pin into the multiplexer address and mode select shift register.
This address controls which channel of the analog input multiplexer (MUX) is selected and the mode of operation
for the ADC. With CS low, the falling edge of SCLK shifts the data resulting from the previous ADC conversion
out on DO, with the exception of the first bit of data. When CS is low continuously, the first bit of the data is
clocked out on the rising edge of EOC (end of conversion). When CS is toggled, the falling edge of CS always
clocks out the first bit of data. CS should be brought low when SCLK is low. The rise and fall times of the clock
edges should not exceed 1 μs.
CCLK Conversion Clock input. The clock applied to this input controls the successive approximation conversion time
interval and the acquisition time. The rise and fall times of the clock edges should not exceed 1 μs.
VREF+
Positive analog voltage reference input. In order to maintain accuracy, the voltage range of VREF (VREF = VREF
+ − VREF−) is 1.0 VDC to 5.0 VDC and the voltage at VREF+ cannot exceed VA+. See Figure 5 for recommended
bypassing.
VREF-The negative analog voltage reference input. In order to maintain accuracy, the voltage at this pin must not go
below GND or exceed VREF+. (See Figure 5).
PD Power Down pin. When PD is high the ADC is powered down; when PD is low the ADC is powered up, or active.
The ADC takes a maximum of 700 μs to power up after the command is given.
VA+
VD+
These are the analog and digital power supply pins. VA+ and VD+ are not connected together on the chip. These
pins should be tied to the same supply voltage and bypassed separately (see Figure 5). The operating voltage
range of VA+ and VD+ is 3.0 VDC to 5.5 VDC.
DGND The digital ground pin (see Figure 5).
AGND The analog ground pin (see Figure 5).
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ADC12130/ADC12132/ADC12138
Absolute Maximum Ratings
(Notes 1, 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Positive Supply Voltage
(V+ = VA+ = VD+) 6.5V
Voltage at Inputs and Outputs
except CH0–CH7 and COM −0.3V to V+ +0.3V
Voltage at Analog Inputs
CH0–CH7 and COM GND −5V to V+ +5V
|VA+ − VD+| 300 mV
Input Current at Any Pin (Note 3) ±30 mA
Package Input Current (Note 3) ±120 mA
Package Dissipation at
TA = 25°C (Note 4) 500 mW
ESD Susceptibility (Note 5)
Human Body Model 1500V
Soldering Information
N Packages (10 seconds) 260°C
SO Package (Note 6):
Vapor Phase (60 seconds) 215°C
Infrared (15 seconds) 220°C
Storage Temperature −65°C to +150°C
Operating Ratings (Notes 1, 2)
Operating Temperature Range TMIN TA TMAX
−40°C TA +85°C
Supply Voltage (V+ = VA+ = VD+) +3.0V to +5.5V
|VA+ − VD+| 100 mV
VREF+ 0V to VA+
VREF 0V to (VREF+ −1V)
VREF (VREF+ − VREF−) 1V to VA+
VREF Common Mode Voltage Range
[(VREF+) − (VREF−)] / 2 0.1 VA+ to 0.6 VA+
A/DIN1, A/DIN2, MUXOUT1
and MUXOUT2 Voltage Range 0V to VA+
ADC IN Common Mode Voltage
Range
[(VIN+) − (VIN−)] / 2 0V to VA+
Package Thermal Resistance
Part Number Thermal Resistance
(θJA)
ADC12130CIN 53°C/W
ADC12130CIWM 70°C/W
ADC12132CIMSA 134°C/W
ADC12132CIWM 64°C/W
ADC121038CIN 40°C/W
ADC121038CIMSA 97°C/W
ADC12138CIWM 50°C/W
Some of these product/package combinations are obsolete
and are shown here for reference only. Check the National
web site for availability.
Converter Electrical Characteristics
The following specifications apply for (V+ = VA+ = VD+ = +5V, VREF+ = +4.096V, and fully differential input with fixed 2.048V common-
mode voltage) or (V+ = VA+ = VD+ = 3.3V, VREF+ = 2.5V and fully-differential input with fixed 1.250V common-mode voltage), VREF
− = 0V, 12-bit + sign conversion mode, source impedance for analog inputs, VREF and VREF+ 25Ω, fCK = fSK = 5 MHz, and 10
(tCK) acquisition time unless otherwise specified. Boldface limits apply for TA = TJ = TMIN to TMAX; all other limits TA = TJ = 25°
C. (Notes 7, 8, 9)
Symbol Parameter Conditions Typical
(Note 10)
Limits
(Note 11)
Units
(Limits)
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes 12 + sign Bits (min)
ILE Integral Linearity Error After Auto Cal (Notes 12, 18) ±1/2 ±2 LSB (max)
DNL Differential Non-Linearity After Auto Cal ±1.5 LSB (max)
Positive Full-Scale Error After Auto Cal (Notes 12, 18) ±1/2 ±3.0 LSB (max)
Negative Full-Scale Error After Auto Cal (Notes 12, 18) ±1/2 ±3.0 LSB (max)
Offset Error After Auto Cal (Notes 5, 18)
VIN(+) = VIN(−) = 2.048V ±1/2 ±2 LSB (max)
DC Common Mode Error After Auto Cal (Note 15) ±2 LSB (max)
TUE Total Unadjusted Error After Auto Cal (Notes 12, 13, 14) ±1 LSB
Multiplexer Chan-to-Chan Matching V+ = +5V ±10%, VREF = +4.096V ±0.05 LSB
Power Supply Sensitivity
Offset Error
+ Full-Scale Error
− Full-Scale Error
Integral Linearity Error
±0.5
±0.5
±0.5
±0.5
LSB
LSB
LSB
LSB
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ADC12130/ADC12132/ADC12138
Symbol Parameter Conditions Typical
(Note 10)
Limits
(Note 11)
Units
(Limits)
UNIPOLAR DYNAMIC CONVERTER CHARACTERISTICS
S/(N+D) Signal-to-Noise Plus Distortion Ratio
fIN = 1 kHz, VIN = 5 VPP, VREF+ = 5.0V 69.4 dB
fIN = 20 kHz, VIN = 5 VPP, VREF+ = 5.0V 68.3 dB
fIN = 40 kHz, VIN = 5 VPP, VREF+ = 5.0V 65.7 dB
−3 dB Full Power Bandwidth VIN = 5 VPP, where S/(N+D) drops 3 dB 31 kHz
DIFFERENTIAL DYNAMIC CONVERTER CHARACTERISTICS
fIN = 1 kHz, VIN = ±5V, VREF+ = 5.0V 77.0 dB
S/(N+D) Signal-to-Noise Plus Distortion Ratio fIN = 20 kHz, VIN = ±5V, VREF+ = 5.0V 73.9 dB
fIN = 40 kHz, VIN = ±5V, VREF+ = 5.0V 67.0 dB
−3 dB Full Power Bandwidth VIN = ±5V, where S/(N+D) drops 3 dB 40 kHz
REFERENCE INPUT, ANALOG INPUTS AND MULTIPLEXER CHARACTERISTICS
CREF Reference Input Capacitance 85 pF
CA/D
A/DIN1 and A/DIN2 Analog Input
Capacitance 75 pF
A/DIN1 and A/DIN2 Analog Input
Leakage Current VIN = +5.0V or VIN = 0V ±0.1 μA
CH0–CH7 and COM Input Voltage GND − 0.05
(VA+) + 0.05 V (min)
V (max)
CCH
CH0–CH7 and COM Input
Capacitance 10 pF
CMUXOUT MUX Output Capacitance 20 pF
Off Channel Leakage (Note 16)
CH0–CH7 and COM Pins
On Channel = 5V and
Off Channel = 0V −0.01 μA
On Channel = 0V and
Off Channel = 5V 0.01 μA
On Channel Leakage (Note 16)
CH0–CH7 and COM Pins
On Channel = 5V and
Off Channel = 0V 0.01 μA
On Channel = 0V and
Off Channel = 5V −0.01 μA
MUXOUT1 and MUXOUT2 Leakage
Current VMUXOUT = 5.0V or VMUXOUT = 0V 0.01 μA
RON MUX On Resistance VIN = 2.5V and
VMUXOUT = 2.4V 850 1900 Ω (max)
RON Matching Channel to Channel VIN = 2.5V and
VMUXOUT = 2.4V 5 %
Channel-to-Channel Crosstalk VIN = 5 VPP, fIN = 40 kHz −72 dB
MUX Bandwidth 90 kHz
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ADC12130/ADC12132/ADC12138
DC and Logic Electrical Characteristics
The following specifications apply for (V+ = VA+ = VD+ = +5V, VREF+ = +4.096V, and fully-differential input with fixed 2.048V
common-mode voltage) or (V+ = VA+ = VD+ = +3.3V, VREF+ = +2.5V and fully-differential input with fixed 1.250V common-mode
voltage), VREF− = 0V, 12-bit + sign conversion mode, source impedance for analog inputs, VREF− and VREF+ 25Ω, fCK = fSK = 5
MHz, and 10 (tCK) acquisition time unless otherwise specified. Boldface limits apply for TA = TJ = TMIN to TMAX; all other limits
TA = TJ = 25°C. (Notes 7, 8, 9)
Symbol Parameter Conditions Typical
(Note 10)
V+ = VA+ =
VD+ = 3.3V
Limits (Note
11)
V+ = VA+ =
VD+ = 5V
Limits (Note
11)
Units
(Limits)
CCLK, CS, CONV, DI, PD AND SCLK INPUT CHARACTERISTICS
VIN(1) Logical “1” Input Voltage VA+ = VD+ = V+ +10% 2.0 2.0 V (min)
VIN(0) Logical “0” Input Voltage VA+ = VD+ = V+ −10% 0.8 0.8 V (max)
IIN(1) Logical “1” Input Current VIN = V+0.005 1.0 1.0 μA (max)
IIN(0) Logical `“0” Input Current VIN = 0V −0.005 −1.0 −1.0 μA (min)
DO, EOC AND DOR DIGITAL OUTPUT CHARACTERISTICS
VOUT(1) Logical “1” Output Voltage
VA+ = VD+ = V+ − 10%,
IOUT = −360 μA 2.4 2.4 V (min)
VA+ = VD+ = V+ − 10%,
IOUT = −10 μA 2.9 4.25 V (min)
VOUT(0) Logical “0” Output Voltage VA+ = VD+ = V+ − 10%
IOUT = 1.6 mA 0.4 0.4 V (max)
IOUT TRI-STATE Output Current VOUT = 0V
VOUT = V+
−0.1
−0.1
−3.0
3.0
−3.0
3.0
μA (max)
μA (max)
+ISC Output Short Circuit Source Current VOUT = 0V −14 mA
−ISC Output Short Circuit Sink Current VOUT = VD+16 mA
POWER SUPPLY CHARACTERISTICS
ID+Digital Supply Current
Awake (Active) 1.5 2.5 mA (max)
CS = HIGH, Powered Down,
CCLK on 600 μA
CS = HIGH, Powered Down,
CCLK off 20 μA
IA+Positive Analog Supply Current
Awake (Active) 3.0 4.0 mA (max)
CS = HIGH, Powered Down,
CCLK on
10 μA
CS = HIGH, Powered Down,
CCLK off
0.1 μA
IREF Reference Input Current
CS = HIGH, Powered Down,
CCLK on 70 μA
CS = HIGH, Powered Down,
CCLK off 0.1 μA
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ADC12130/ADC12132/ADC12138
AC Electrical Characteristics
The following specifications apply for (V+ = VA+ = VD+ = +5V, VREF+ = +4.096V, and fully-differential input with fixed 2.048V
common-mode voltage) or (V+ = VA+ = VD+ = +3.3V, VREF+ = +2.5V and fully-differential input with fixed 1.250V common-mode
voltage), VREF− = 0V, 12-bit + sign conversion mode, source impedance for analog inputs, VREF− and VREF+ 25Ω, fCK = fSK = 5
MHz, and 10 (tCK) acquisition time unless otherwise specified. Boldface limits apply for TA = TJ = TMIN to TMAX; all other limits
TA = TJ = 25°C. (Note 17)
Symbol Parameter Conditions Typical
(Note 10) Limits (Note 11) Units (Limits)
fCK Conversion Clock (CCLK) Frequency 10
1
5MHz (max)
MHz (min)
fSK Serial Data Clock SCLK Frequency 10
0
5MHz (max)
Hz (min)
Conversion Clock Duty Cycle 40
60
% (min)
% (max)
Serial Data Clock Duty Cycle 40
60
% (min)
% (max)
tCConversion Time 12-Bit + Sign or 12-Bit 44(tCK)44(tCK)(max)
8.8 μs (max)
tAAcquisition Time (Note 19)
6 Cycles Programmed
6(tCK)6(tCK)(min)
7(tCK)(max)
1.2 μs (min)
1.4 μs (max)
10 Cycles Programmed
10(tCK)10(tCK)(min)
11(tCK)(max)
2.0 μs (min)
2.2 μs (max)
18 Cycles Programmed
18(tCK)18(tCK)(min)
19(tCK)(max)
3.6 μs (min)
3.8 μs (max)
34 Cycles Programmed
34(tCK)34(tCK)(min)
35(tCK)(max)
6.8 μs (min)
7.0 μs (max)
tCAL Self-Calibration Time 4944(tCK)4944(tCK)(max)
988.8 μs (max)
tAZ Auto Zero Time 76(tCK)76(tCK)(max)
15.2 μs (max)
tSYNC
Self-Calibration or Auto Zero
Synchronization Time from DOR
2(tCK)2(tCK)(min)
3(tCK)(max)
0.40 μs (min)
0.60 μs (max)
tDOR
DOR High Time when CS is Low
Continuously for Read Data and Software
Power Up/Down
9(tSK)9(tSK)(max)
1.8 μs (max)
tCONV CONV Valid Data Time 8(tSK)8(tSK)(max)
1.6 μs (max)
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ADC12130/ADC12132/ADC12138
AC Electrical Characteristics
The following specifications apply for (V+ = VA+ = VD+ = +5V, VREF+ = +4.096V, and fully-differential input with fixed 2.048V
common-mode voltage) or (V+ = VA+ = VD+ = +3.3V, VREF+ = +2.5V and fully-differential input with fixed 1.250V common-mode
voltage), VREF− = 0V, 12-bit + sign conversion mode, source impedance for analog inputs, VREF− and VREF+ 25Ω, fCK = fSK = 5
MHz, and 10 (tCK) acquisition time unless otherwise specified. Boldface limits apply for TA = TJ = TMIN to TMAX; all other limits
TA = TJ = 25°C. (Note 17)(Continued)
Symbol Parameter Conditions Typical (Note
10)
Limits (Note
11)
Units
(Limits)
tHPU
Hardware Power-Up Time, Time from PD
Falling Edge to EOC Rising Edge 500 700 μs (max)
tSPU
Software Power-Up Time, Time from Serial
Data Clock Falling Edge to EOC Rising Edge 500 700 μs (max)
tACC
Access Time Delay from CS Falling Edge to
DO Data Valid 25 60 ns (max)
tSET-UP
Set-Up Time of CS Falling Edge to Serial Data
Clock Rising Edge 50 ns (min)
tDELAY
Delay from SCLK Falling Edge to CS Falling
Edge 0 5ns (min)
t1H, t0H Delay from CS Rising Edge to DO TRI-STATE RL = 3k, CL = 100 pF 70 100 ns (max)
tHDI
DI Hold Time from Serial Data Clock Rising
Edge 5 15 ns (max)
tSDI
DI Set-Up Time from Serial Data Clock Rising
Edge 5 10 ns (min)
tHDO
DO Hold Time from Serial Data Clock Falling
Edge RL = 3k, CL = 100 pF 35 65
5
ns (max)
ns (min)
tDDO
Delay from Serial Data Clock Falling Edge to
DO Data Valid 50 90 ns (max)
tRDO
DO Rise Time, TRI-STATE to High DO Rise
Time, Low to High RL = 3k, CL = 100 pF 10
10
40
40
ns (max)
ns (max)
tFDO
DO Fall Time, TRI-STATE to Low DO Fall
Time, High to Low RL = 3k, CL = 100 pF 15
15
40
40
ns (max)
ns (max)
tCD
Delay from CS Falling Edge to DOR Falling
Edge 45 80 ns (max)
tSD
Delay from Serial Data Clock Falling Edge to
DOR Rising Edge 45 80 ns (max)
CIN Capacitance of Logic Inputs 20 pF
COUT Capacitance of Logic Outputs 20 pF
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
Note 3: When the input voltage (VIN) at any pin exceeds the power supplies (VIN < GND or VIN > VA+ or VD+), the current at that pin should be limited to 30 mA.
The 120 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 30 mA to four.
Note 4: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax, θJA and the ambient temperature, TA. The maximum
allowable power dissipation at any temperature is PD = (TJmax − TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. For this
device, TJmax = 150°C.
Note 5: The human body model is a 100 pF capacitor discharged through a 1.5 kΩ resistor into each pin.
Note 6: See AN450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in any post 1986 National
Semiconductor Linear Data Book for other methods of soldering surface mount devices.
Note 7: Two on-chip diodes are tied to each analog input through a series resistor as shown below. Input voltage magnitude up to 5V above VA+ or 5V below
GND will not damage this device. However, errors in conversion can occur (if these diodes are forward biased by more than 50 mV) if the input voltage magnitude
of selected or unselected analog input go above VA+ or below GND by more than 50 mV. As an example, if VA+ is 4.5 VDC, full-scale input voltage must be
4.55 VDC to ensure accurate conversions.
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ADC12130/ADC12132/ADC12138
1207904
Note 8: To guarantee accuracy, it is required that the VA+ and VD+ be connected together to the same power supply with separate bypass capacitors at each
V+ pin.
Note 9: With the test condition for VREF (VREF+ − VREF−) given as +4.096V, the 12-bit LSB is 1.0 mV. For VREF = 2.5V, the 12-bit LSB is 610 μV.
Note 10: Typical figures are at TJ = TA = 25°C and represent most likely parametric norm.
Note 11: Tested limits are guaranteed to National's AOQL (Average Outgoing Quality Level).
Note 12: Positive integral linearity error is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through positive full-
scale and zero. For negative integral linearity error, the straight line passes through negative full-scale and zero (see Figure 2 and Figure 3).
Note 13: Offset or Zero error is a measure of the deviation from the mid-scale voltage (a code of zero), expressed in LSB. It is the average value of the code
transitions between −1 to 0 and 0 to +1 (see Figure 4).
Note 14: Total unadjusted error includes offset, full-scale, linearity and multiplexer errors.
Note 15: The DC common-mode error is measured in the differential multiplexer mode with the assigned positive and negative input channels shorted together.
Note 16: Channel leakage current is measured after the channel selection.
Note 17: Timing specifications are tested at the TTL logic levels, VOL = 0.4V for a falling edge and VOL = 2.4V for a rising edge. TRI-STATE output voltage is
forced to 1.4V.
Note 18: The ADC12130 family's self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will
result in a maximum repeatability uncertainty of 0.2 LSB.
Note 19: If SCLK and CCLK are driven from the same clock source, then tA is 6, 10, 18 or 34 clock periods minimum and maximum.
Note 20: The “12-Bit Conversion of Offset” and “12-Bit Conversion of Full-Scale” modes are intended to test the functionality of the device. Therefore, the output
data from these modes are not an indication of the accuracy of a conversion result.
1207905
FIGURE 1. Transfer Characteristic
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ADC12130/ADC12132/ADC12138
1207906
FIGURE 2. Simplified Error Curve vs. Output Code without Auto Calibration or Auto Zero Cycles
1207907
FIGURE 3. Simplified Error Curve vs. Output Code after Auto Calibration Cycle
1207908
FIGURE 4. Offset or Zero Error Voltage
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ADC12130/ADC12132/ADC12138
Typical Performance Characteristics The following curves apply for 12-bit + sign mode after Auto
Calibration unless otherwise specified.
Linearity Error Change
vs. Clock Frequency
1207953
Linearity Error Change
vs. Temperature
1207954
Linearity Error Change
vs. Reference Voltage
1207955
Linearity Error Change
vs. Supply Voltage
1207956
Full-Scale Error Change
vs. Clock Frequency
1207957
Full-Scale Error Change
vs. Temperature
1207958
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ADC12130/ADC12132/ADC12138
Full-Scale Error Change
vs. Reference Voltage
1207959
Full-Scale Error Change
vs. Supply Voltage
1207960
Offset or Zero Error Change
vs. Clock Frequency
1207961
Offset or Zero Error Change
vs. Temperature
1207962
Offset or Zero Error Change
vs. Reference Voltage
1207963
Offset or Zero Error Change
vs. Supply Voltage
1207964
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ADC12130/ADC12132/ADC12138
Analog Supply Current
vs. Temperature
1207965
Digital Supply Current
vs. Clock Frequency
1207966
Digital Supply Current
vs. Temperature
1207967
Linearity Error Change
vs. Temperature
1207968
Full-Scale Error Change
vs. Temperature
1207969
Full-Scale Error Change
vs. Supply Voltage
1207970
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ADC12130/ADC12132/ADC12138
Offset or Zero Error Change
vs. Temperature
1207971
Offset or Zero Error Change
vs. Supply Voltage
1207972
Analog Supply Current
vs. Temperature
1207973
Digital Supply Current
vs. Temperature
1207974
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ADC12130/ADC12132/ADC12138
Typical Dynamic Performance Characteristics
The following curves apply for 12-bit + sign mode after Auto Calibration unless otherwise specified.
Bipolar Spectral Response
with 1 kHz Sine Wave Input
1207975
Bipolar Spectral Response
with 10 kHz Sine Wave Input
1207976
Bipolar Spectral Response
with 20 kHz Sine Wave Input
1207977
Bipolar Spectral Response
with 30 kHz Sine Wave Input
1207978
Bipolar Spectral Response
with 40 kHz Sine Wave Input
1207979
Bipolar Spectral Response
with 50 kHz Sine Wave Input
1207980
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ADC12130/ADC12132/ADC12138
Bipolar Spurious Free
Dynamic Range
1207981
Unipolar Signal-to-Noise Ratio
vs. Input Frequency
1207982
Unipolar Signal-to-Noise
+ Distortion Ratio
vs. Input Frequency
1207983
Unipolar Signal-to-Noise
+ Distortion Ratio
vs. Input Signal Level
1207984
Unipolar Spectral Response
with 1 kHz Sine Wave Input
1207985
Unipolar Spectral Response
with 10 kHz Sine Wave Input
1207986
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ADC12130/ADC12132/ADC12138
Unipolar Spectral Response
with 20 kHz Sine Wave Input
1207987
Unipolar Spectral Response
with 30 kHz Sine Wave Input
1207988
Unipolar Spectral Response
with 40 kHz Sine Wave Input
1207989
Unipolar Spectral Response
with 50 kHz Sine Wave Input
1207990
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ADC12130/ADC12132/ADC12138
Test Circuits
DO “TRI-STATE” (t1H, t0H)
1207913
DO except “TRI-STATE”
1207914
Leakage Current
1207915
Timing Diagrams
DO Falling and Rising Edge
1207916
DO “TRI-STATE” Falling and Rising Edge
1207917
DI Data Input Timing
1207918
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ADC12130/ADC12132/ADC12138
DO Data Output Timing Using CS
1207919
DO Data Output Timing with CS Continuously Low
1207920
ADC12138 Auto Cal or Auto Zero
1207921
Note: DO output data is not valid during this cycle.
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ADC12130/ADC12132/ADC12138
ADC12138 Read Data without Starting a Conversion Using CS
1207922
ADC12138 Read Data without Starting a Conversion with CS Continuously Low
1207923
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ADC12130/ADC12132/ADC12138
ADC12138 Conversion Using CS with 16-Bit Digital Output Format
1207924
ADC12138 Conversion with CS Continuously Low and 16-Bit Digital Output Format
1207925
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ADC12130/ADC12132/ADC12138
ADC12138 Software Power Up/Down Using CS with 16-Bit Digital Output Format
1207926
ADC12138 Software Power Up/Down with CS Continuously Low and 16-Bit Digital Output Format
1207927
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ADC12130/ADC12132/ADC12138
ADC12138 Hardware Power Up/Down
1207928
Note: Hardware power up/down may occur at any time. If PD is high while a conversion is in progress that conversion will be corrupted and erroneous data will
be stored in the output shift register.
ADC12138 Configuration Modification—Example of a Status Read
1207929
1207931
*Tantalum
**Monolithic Ceramic or better
FIGURE 5. Recommended Power Supply Bypassing and Grounding
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ADC12130/ADC12132/ADC12138
1207930
FIGURE 6. Protecting the MUXOUT1, MUXOUT2, A/DIN1 and A/DIN2 Analog Pins
Format and Set-Up Tables
TABLE 1. Data Out Formats
DO Formats DB0 DB1 DB2 DB3 DB4 DB5 DB6 DB7 DB8 DB9 DB 10 DB 11 DB 12 DB 13 DB 14 DB 15 DB 16
with
Sign
MSB
First
17
Bits X X X X Sign MSB 10 9 8 7 6 5 4 3 2 1 LSB
13
Bits Sing MSB 10 9 8 7 6 5 4 3 2 1 LSB
LSB
First
17
Bits LSB 1 2 3 4 5 6 7 8 9 10 MSB Sign X X X X
13
Bits LSB 1 2 3 4 5 6 7 8 9 10 MSB Sign
with-
out
Sign
MSB
First
16
Bits 0 0 0 0 MSB 10 9 8 7 6 5 4 3 2 1 LSB
12
Bits MSB 10 9 8 7 6 5 4 3 2 1 LSB
LSB
First
16
Bits LSB 1 2 3 4 5 6 7 8 9 10 MSB 0 0 0 0
12
Bits LSB 1 2 3 4 5 6 7 8 9 10 MSB
X = High or Low state.
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ADC12130/ADC12132/ADC12138
TABLE 2. ADC12138 Multiplexer Addressing
MUX Address
Analog Channel Addressed and Assignment
with A/DIN1 tied to MUXOUT1 and A/DIN2 tied to
MUXOUT2
ADC Input
Polarity
Assignment
Multiplexer Output
Channel Assignment Mode
DI0 DI1 DI2 DI3 CH
0
CH
1
CH
2
CH
3
CH
4
CH
5
CH
6
CH
7COM A/DIN1 A/DIN2 MUXOUT1 MUXOUT2
L L L L + + CH0 CH1
Differential
L L L H + + CH2 CH3
L L H L + + CH4 CH5
L L H H + + CH6 CH7
L H L L + + CH0 CH1
L H L H + + CH2 CH3
L H H L + + CH4 CH5
L H H H + + CH6 CH7
H L L L + +CH0 COM
Single-Ended
H L L H + +CH2 COM
H L H L + +CH4 COM
H L H H + +CH6 COM
H H L L + +CH1 COM
H H L H + +CH3 COM
H H H L + +CH5 COM
H H H H + +CH7 COM
TABLE 3. ADC12130 and ADC12132 Multiplexer Addressing
MUX Address
Analog Channel Addressed and Assignment
with A/DIN1 tied to MUXOUT1 and A/DIN2 tied
to MUXOUT2
ADC Input Polarity
Assignment
Multiplexer Output
Channel Assignment Mode
DI0 DI1 CH0 CH1 COM A/DIN1 A/DIN2 MUXOUT1 MUXOUT2
L L + + CH0 CH1 Differential
L H + + CH0 CH1
H L + +CH0 COM Single-Ended
H H + +CH1 COM
Note: ADC12130 do not have A/DIN1, A/DIN2, MUXOUT1 and MUXOUT2 pins.
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ADC12130/ADC12132/ADC12138
TABLE 4. Mode Programming
ADC12138 DI0 DI1 DI2 DI3 DI4 DI5 DI6 DI7
Mode Selected
(Current)
DO Format
(next Conversion
Cycle)
ADC12130
and
ADC12132
DI0 DI1 DI2 DI3 DI4 DI5
See Table 2 or Table 3 L L L L 12 Bit Conversion 12 or 13 Bit MSB First
See Table 2 or Table 3 L L L H 12 Bit Conversion 16 or 17 Bit MSB First
See Table 2 or Table 3 L H L L 12 Bit Conversion 12 or 13 Bit LSB First
See Table 2 or Table 3 L H L H 12 Bit Conversion 16 or 17 Bit LSB First
L L L L H L L L Auto Cal No Change
L L L L H L L H Auto Zero No Change
L L L L H L H L Power Up No Change
L L L L H L H H Power Down No Change
L L L L H H L L Read Status Register No Change
L L L L H H L H Data Out without Sign No Change
H L L L H H L H Data Out with Sign No Change
L L L L H H H L Acquisition Time—6 CCLK Cycles No Change
L H L L H H H L Acquisition Time—10 CCLK Cycles No Change
H L L L H H H L Acquisition Time—18 CCLK Cycles No Change
H H L L H H H L Acquisition Time—34 CCLK Cycles No Change
L L L L H H H H User Mode No Change
H X X X H H H H Test Mode
(CH1–CH7 become Active Outputs) No Change
Note: The ADC powers up with no Auto Cal, no Auto Zero, 10 CCLK acquisition time, 12-bit + sign conversion, power up, 12- or 13-bit MSB First, and user mode.
X = Don't Care
TABLE 5. Conversion/Read Data Only Mode Programming
CS CONV PD Mode
L L L See Table 4 for Mode
L H L Read Only (Previous DO Format). No Conversion.
H X L Idle
X X H Power Down
X = Don't Care
TABLE 6. Status Register
Status Bit DB0 DB1 DB2 DB3 DB4 DB5 DB6 DB7 DB8
Location
Status Bit PU PD Cal 12 or 13 16 or 17 Sign Justification Test Mode
Device Status DO Output Format Status
Function High”
indicates a
Power Up
Sequence
is in
progress
High”
indicates a
Power
Down
Sequence
is in
progress
High”
indicates
an Auto Cal
Sequence
is in
progress
Not used High”
indicates a
12 or 13 bit
format
High”
indicates a
16 or 17 bit
format
High”
indicates
that the
sign bit is
included.
When
“Low” the
sign bit is
not
included.
When “High”
the conversion
result will be
output MSB
first. When
“Low” the
result will be
output LSB
first.
When
“High” the
device is in
test mode.
When
“Low” the
device is in
user mode.
27 www.national.com
ADC12130/ADC12132/ADC12138
Application Information
NOTE: Some of the device/package combinations are ob-
solete and are shown and described here for reference
only. Please see the National web site for availability.
1.0 DIGITAL INTERFACE
1.1 Interface Concepts
The example in Figure 7 shows a typical sequence of events
after the power is applied to the ADC12130/2/8:
1207932
FIGURE 7. Typical Power Supply Power Up Sequence
The first instruction input to the ADC via DI initiates Auto Cal.
The data output on DO at that time is meaningless and is
completely random. To determine whether the Auto Cal has
been completed, a read status instruction should be issued to
the ADC. Again the data output at that time has no signifi-
cance since the Auto Cal procedure modifies the data in the
output shift register. To retrieve the status information, an ad-
ditional read status instruction should be issued to the ADC.
At this time the status data is available on DO. If the Cal signal
in the status word is low, Auto Cal has been completed.
Therefore, the next instruction issued can start a conversion.
The data output at this time is again status information.
To keep noise from corrupting the conversion, status can not
be read during a conversion. If CS is strobed and is brought
low during a conversion, that conversion is prematurely end-
ed. EOC can be used to determine the end of a conversion
or the ADC controller can keep track in software of when it
would be appropriate to communicate to the ADC again. Once
it has been determined that the ADC has completed a con-
version, another instruction can be transmitted to the ADC.
The data from this conversion can be accessed when the next
instruction is issued to the ADC.
Note, when CS is low continuously it is important to transmit
the exact number of SCLK cycles, as shown in the timing di-
agrams. Not doing so will desynchronize the serial commu-
nication to the ADC. (See Section 1.3 CS Low Continuously
Considerations.)
1.2 Changing Configuration
The configuration of the ADC12130/2/8 on power up defaults
to 12-bit plus sign resolution, 12- or 13-bit MSB First, 10 CCLK
acquisition time, user mode, no Auto Cal, no Auto Zero, and
power up mode. Changing the acquisition time and turning
the sign bit on and off requires an 8-bit instruction to be issued
to the ADC. This instruction will not start a conversion. The
instructions that select a multiplexer address and format the
output data do start a conversion. Figure 8 describes an ex-
ample of changing the configuration of the ADC12130/2/8.
During I/O sequence 1, the instruction at DI configures the
ADC to do a conversion with 12-bit +sign resolution. Notice
that, when the 6 CCLK Acquisition and Data Out without Sign
instructions are issued to the ADC, I/O sequences 2 and 3, a
new conversion is not started. The data output during these
instructions is from conversion N, which was started during
I/O sequence 1. The Configuration Modification timing dia-
gram describes in detail the sequence of events necessary
for a Data Out without Sign, Data Out with Sign, or 6/10/18/34
CCLK Acquisition time mode selection. Table 4 describes the
actual data necessary to be loaded into the ADC to accom-
plish this configuration modification. The next instruction,
shown in Figure 8, issued to the ADC starts conversion N+1
with 16-bit format and 12 bits of resolution formatted MSB
first. Again the data output during this I/O cycle is the data
from conversion N.
The number of SCLKs applied to the ADC during any con-
version I/O sequence should vary in accord with the data out
word format chosen during the previous conversion I/O se-
quence. The various formats and resolutions available are
shown in Table 1. In Figure 8, since 16-bit without sign MSB
first format was chosen during I/O sequence 4, the number of
SCLKs required during I/O sequence 5 is sixteen. In the fol-
lowing I/O sequence the format changes to 12-bit without sign
MSB first; therefore the number of SCLKs required during
I/O sequence 6 changes accordingly to 12.
1.3 CS Low Continuously Considerations
When CS is continuously low, it is important to transmit the
exact number of SCLK pulses that the ADC expects. Not do-
ing so will desynchronize the serial communications to the
ADC. When the supply power is first applied to the ADC, it will
expect to see 13 SCLK pulses for each I/O transmission. The
number of SCLK pulses that the ADC expects to see is the
same as the digital output word length. The digital output word
length is controlled by the Data Out (DO) format. The DO for-
mat maybe changed any time a conversion is started or when
the sign bit is turned on or off. The table below details out the
number of clock periods required for different DO formats:
DO Format
Number of
SCLKs
Expected
12-Bit MSB or LSB First SIGN OFF 12
SIGN ON 13
16-Bit MSB or LSB first SIGN OFF 16
SIGN ON 17
If erroneous SCLK pulses desynchronize the communica-
tions, the simplest way to recover is by cycling the power
supply to the device. Not being able to easily resynchronize
the device is a shortcoming of leaving CS low continuously.
The number of clock pulses required for an I/O exchange may
be different for the case when CS is left low continuously vs.
the case when CS is cycled. Take the I/O sequence detailed
in Figure 7 (Typical Power Supply Sequence) as an example.
The table below lists the number of SCLK pulses required for
each instruction:
Instruction CS Low
Continuously CS Strobed
Auto Cal 13 SCLKs 8 SCLKs
Read Status 13 SCLKs 8 SCLKs
Read Status 13 SCLKs 8 SCLKs
12-Bit + Sign Conv 1 13 SCLKs 8 SCLKs
12-Bit + Sign Conv 2 13 SCLKs 13 SCLKs
1.4 Analog Input Channel Selection
The data input at DI also selects the channel configuration
(see Table 2, Table 3 and Table 4). In Figure 8 the only times
when the channel configuration could be modified would be
during I/O sequences 1, 4, 5 and 6. Input channels are rese-
lected before the start of each new conversion. Shown below
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ADC12130/ADC12132/ADC12138
is the data bit stream required at DI during I/O sequence
number 4 in Figure 8 to set CH1 as the positive input and CH0
as the negative input for the different ADC versions.
Part
Number
DI Data
DI0 DI1 DI2 DI3 DI4 DI5 DI6 DI7
ADC12130
and
ADC12132
L H L L H L X X
ADC12138 L H L L L L H L
Where X can be a logic high (H) or low (L).
1.5 Power Up/Down
The ADC may be powered down by taking the PD pin HIGH
or by the instruction input at DI (see Table 4 and Table 5, and
the Power Up/Down timing diagrams). When the ADC is pow-
ered down in this way, the ADC conversion circuitry is deac-
tivated but the digital I/O circuitry is kept active.
Hardware power up/down is controlled by the state of the PD
pin. Software power-up/down is controlled by the instruction
issued to the ADC. If a software power up instruction is issued
to the ADC while a hardware power down is in effect (PD pin
high) the device will remain in the power-down state. If a soft-
ware power down instruction is issued to the ADC while a
hardware power up is in effect (PD pin low), the device will
power down. When the device is powered down by software,
it may be powered up by either issuing a software power up
instruction or by taking PD pin high and then low. If the power
down command is issued during a conversion, that conver-
sion is interrupted, so the data output after power up cannot
be relied upon.
1207933
FIGURE 8. Changing the ADC's Conversion Configuration
1.6 User Mode and Test Mode
An instruction may be issued to the ADC to put it into test
mode, which is used by the manufacturer to verify complete
functionality of the device. During test mode CH0–CH7 be-
come active outputs. If the device is inadvertently put into the
test mode with CS continuously low, the serial communica-
tions may be desynchronized. Synchronization may be re-
gained by cycling the power supply voltage to the device.
Cycling the power supply voltage will also set the device into
user mode. If CS is used in the serial interface, the ADC may
be queried to see what mode it is in. This is done by issuing
a “read STATUS register” instruction to the ADC. When bit 9
of the status register is high, the ADC is in test mode; when
bit 9 is low the ADC, is in user mode. As an alternative to
cycling the power supply, an instruction sequence may be
used to return the device to user mode. This instruction se-
quence must be issued to the ADC using CS. The following
table lists the instructions required to return the device to user
mode. Note that this entire sequence, including both Test
Mode and User Mode values, should be sent to recover from
the test mode.
Instruction DI Data
DI0 DI1 DI2 DI3 DI4 DI5 DI6 DI7
TEST MODE H X X X H H H H
Reset
Test Mode
Instructions
L L L L H H H L
L L L L H L H L
L L L L H L H H
USER MODE L L L L H H H H
Power Up L L L L H L H L
Set DO with or
without Sign
H or
LL L L H H L H
Set Acquisition
Time
H or
L
H or
LL L H H H L
Start a
Conversion
H or
L
H or
L
H or
L
H or
LLH or
L
H or
L
H or
L
X = Don't Care
The power up, data with or without sign, and acquisition time
instructions should be resent after returning to the user mode.
This is to ensure that the ADC is in the required state before
a conversion is started.
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ADC12130/ADC12132/ADC12138
1.7 Reading the Data Without Starting a Conversion
The data from a particular conversion may be accessed with-
out starting a new conversion by ensuring that the CONV line
is taken high during the I/O sequence. See the Read Data
timing diagrams. Table 5 describes the operation of the
CONV pin. It is not necessary to read the data as soon as
DOR goes low. The data will remain in the output register if
CS is brought high right after DOR goes high. A single con-
version may be read as many times as desired before CS is
brought low.
1.8 Brown Out Conditions
When the supply voltage dips below about 2.7V, the internal
registers, including the calibration coefficients and all of the
other registers, may lose their contents. When this happens
the ADC will not perform as expected or not at all after power
is fully restored. While writing the desired information to all
registers and performing a calibration might sometimes cause
recovery to full operation, the only sure recovery method is to
reduce the supply voltage to below 0.5V, then reprogram the
ADC and perform a calibration after power is fully restored.
2.0 THE ANALOG MULTIPLEXER
For the ADC12138, the analog input multiplexer can be con-
figured with 4 differential channels or 8 single ended channels
with the COM input as the zero reference or any combination
thereof (see Figure 9). The difference between the voltages
at the VREF+ and VREF pins determines the input voltage span
(VREF). The analog input voltage range is 0 to VA+. Negative
digital output codes result when VIN > VIN+. The actual volt-
age at VIN or VIN+ cannot go below AGND.
4 Differential
Channels
1207934
8 Single-Ended Channels
with COM
as Zero Reference
1207935
FIGURE 9. Input Multiplexer Options
Differential
Configuration
1207936
A/DIN1 and A/DIN2 can be assigned as the + or − input
Single-Ended
Configuration
1207937
A/DIN1 is + input
A/DIN2 is − input
FIGURE 10. MUXOUT connections for multiplexer option
CH0, CH2, CH4, and CH6 can be assigned to the MUXOUT1
pin in the differential configuration, while CH1, CH3, CH5, and
CH7 can be assigned to the MUXOUT2 pin. In the differential
configuration, the analog inputs are paired as follows: CH0
with CH1, CH2 with CH3, CH4 with CH5 and CH6 with CH7.
The A/DIN1 and A/DIN2 pins can be assigned positive or
negative polarity.
With the single-ended multiplexer configuration, CH0 through
CH7 can be assigned to the MUXOUT1 pin. The COM pin is
always assigned to the MUXOUT2 pin. A/DIN1 is assigned as
the positive input; A/DIN2 is assigned as the negative input.
(See Figure 10).
The Multiplexer assignment tables for these ADCs (Table 2
and Table 3) summarize the aforementioned functions for the
different versions of ADCs.
2.1 Biasing for Various Multiplexer Configurations
Figure 11 is an example of device connections for single-
ended operation. The sign bit is always low. The digital output
range is 0 0000 0000 0000 to 0 1111 1111 1111. One LSB is
equal to 1 mV (4.1V/4096 LSBs).
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ADC12130/ADC12132/ADC12138
1207938
FIGURE 11. Single-Ended Biasing
For pseudo-differential signed operation, the circuit of shows
a signal AC coupled to the ADC. This gives a digital output
range of −4096 to +4095. With a 2.5V reference, 1 LSB is
equal to 610 μV. Although the ADC is not production tested
with a 2.5V reference, when VA+ and VD+ are +5.0V, linearity
error typically will not change more than 0.1 LSB (see the
curves in the Typical Electrical Characteristics Section). With
the ADC set to an acquisition time of 10 clock periods, the
input biasing resistor needs to be 600Ω or less. Notice though
that the input coupling capacitor needs to be made fairly large
to bring down the high pass corner. Increasing the acquisition
time to 34 clock periods (with a 5 MHz CCLK frequency) would
allow the 600Ω to increase to 6k, which would set the high
pass corner at 26 Hz. Increasing R, to 6k would allow R2 to
be 2k with a 1 μF coupling capacitor.
1207939
FIGURE 12. Pseudo-Differential Biasing with the Signal Source AC Coupled Directly into the ADC
An alternative method for biasing pseudo-differential opera-
tion is to use the +2.5V from the LM4040 to bias any amplifier
circuits driving the ADC as shown in Figure 13. The value of
the resistor pull-up biasing the LM4040-2.5 will depend upon
the current required by the op amp biasing circuitry.
In the circuit of Figure 13, some voltage range is lost since the
amplifier will not be able to swing to +5V and GND with a
single +5V supply. Using an adjustable version of the LM4041
to set the full scale voltage at exactly 2.048V and a lower
grade LM4040D-2.5 to bias up everything to 2.5V as shown
in Figure 14 will allow the use of all the ADC's digital output
range of −4096 to +4095 while leaving plenty of head room
for the amplifier.
Fully differential operation is shown in Figure 15. One LSB for
this case is equal to (4.1V/4096) = 1 mV.
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ADC12130/ADC12132/ADC12138
1207940
FIGURE 13. Alternative Pseudo-Differential Biasing
1207941
FIGURE 14. Pseudo-Differential Biasing without the Loss of Digital Output Range
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ADC12130/ADC12132/ADC12138
1207942
FIGURE 15. Fully Differential Biasing
3.0 REFERENCE VOLTAGE
The difference in the voltages applied to the VREF+ and
VREF defines the analog input span (the difference between
the voltage applied between two multiplexer inputs or the
voltage applied to one of the multiplexer inputs and analog
ground) over which 4095 positive and 4096 negative codes
exist. The voltage sources driving VREF+ and VREF must have
very low output impedance and noise. The circuit in
Figure 16 is an example of a very stable reference appropriate
for use with the device.
1207943
*Tantalum
FIGURE 16. Low Drift Extremely
Stable Reference Circuit
The ADC12130/2/8 can be used in either ratiometric or ab-
solute reference applications. In ratiometric systems, the ana-
log input voltage is proportional to the voltage used for the
ADC's reference voltage. When this voltage is the system
power supply, the VREF+ pin is connected to VA+ and VREF is
connected to ground. This technique relaxes the system ref-
erence stability requirements because the analog input volt-
age and the ADC reference voltage move together. This
maintains the same output code for given input conditions.
For absolute accuracy, where the analog input voltage varies
between very specific voltage limits, a time and temperature
stable voltage source can be connected to the reference in-
puts. Typically, the reference voltage magnitude will require
an initial adjustment to null reference voltage induced full-
scale errors.
Below are recommended references along with some key
specifications.
Part Number
Output
Voltage
Tolerance
Temperature
Coefficient
LM4041CI-Adj ±0.5% ±100ppm/°C
LM4040AI-4.1 ±0.1% ±100ppm/°C
LM4120AI-4.1 ±0.2% ±50ppm/°C
LM4121AI-4.1 ±0.2% ±50ppm/°C
LM4050AI-4.1 ±0.1% ±50ppm/°C
LM4030AI-4.1 ±0.05% ±10ppm/°C
LM4040AI-4.1 ±0.1% ±3.0ppm/°C
Circuit of Figure 16 Adjustable ±2ppm/°C
The reference voltage inputs are not fully differential. The
ADC12130/2/8 will not generate correct conversions or com-
parisons if VREF+ is taken below VREF. Correct conversions
result when VREF+ and VREF differ by 1V or more and remain
at all times between ground and VA+. The VREF common mode
range, (VREF+ + VREF)/2, is restricted to (0.1 × VA+) to (0.6 ×
VA+). Therefore, with VA+ = 5V, the center of the reference
ladder should not go below 0.5V or above 3.0V. Figure 17 is
a graphic representation of the voltage restrictions on VREF+
and VREF.
33 www.national.com
ADC12130/ADC12132/ADC12138
1207944
FIGURE 17. VREF Operating Range
4.0 ANALOG INPUT VOLTAGE RANGE
The ADC12130/2/8's fully differential ADC generate a two's
complement output that is found by using the equation shown
below:
for (12-bit) resolution the Output Code =
Round off to the nearest integer value between −4096 to 4095
if the result of the above equation is not a whole number.
Examples are shown in the table below:
VREF+VREFVIN+VINCode Output
Digital
+2.5V +1V +1.5V 0V 0,1111,1111,1111
+4.096V 0V +3V 0V 0,1011,1011,1000
+4.096V 0V +2.499V +2.500V 1,1111,1111,1111
+4.096V 0V 0V +4.096V 1,0000,0000,0000
5.0 INPUT CURRENT
At the start of the acquisition window (tA) a charging current
flows into or out of the analog input pins (A/DIN1 and A/DIN2)
depending upon the input voltage polarity. The analog input
pins are CH0–CH7 and COM when A/DIN1 is tied to
MUXOUT1 and A/DIN2 is tied to MUXOUT2. The peak value
of this input current will depend upon the actual input voltage
applied, the source impedance and the internal multiplexer
switch on resistance. With MUXOUT1 tied to A/DIN1 and
MUXOUT2 tied to A/DIN2 the internal multiplexer switch on
resistance is typically 1.6 kΩ. The A/DIN1 and A/DIN2 mux
on resistance is typically 750Ω.
6.0 INPUT SOURCE RESISTANCE
For low impedance voltage sources (<600Ω), the input charg-
ing current will decay, before the end of the S/H's acquisition
time of 2 μs (10 CCLK periods with fCK = 5 MHz), to a value
that will not introduce any conversion errors. For high source
impedances, the S/H's acquisition time can be increased to
18 or 34 CCLK periods. For less ADC accuracy and/or slower
CCLK frequencies the S/H's acquisition time may be de-
creased to 6 CCLK periods. To determine the number of clock
periods (Nc) required for the acquisition time with a specific
source impedance for the various resolutions the following
equations can be used:
12 Bit + Sign NC = [RS + 2.3] × fCK × 0.824
Where fCK is the conversion clock (CCLK) frequency in MHz
and RS is the external source resistance in kΩ. As an exam-
ple, operating with a resolution of 12 Bits + sign, a 5 MHz clock
frequency and maximum acquisition time of 34 conversion
clock periods the ADC's analog inputs can handle a source
impedance as high as 6 kΩ. The acquisition time may also be
extended to compensate for the settling or response time of
external circuitry connected between the MUXOUT and
A/DIN pins.
An acquisition starts at a falling edge of SCLK and ends at a
rising edge of CCLK (see timing diagrams). If SCLK and
CCLK are asynchronous, one extra CCLK clock period may
be inserted into the programmed acquisition time for synchro-
nization. Therefore, with asynchronous SCLK and CCLK, the
acquisition time will change from conversion to conversion.
7.0 INPUT BYPASS CAPACITANCE
External capacitors (0.01 μF–0.1 μF) can be connected be-
tween the analog input pins, CH0–CH7, and analog ground
to filter any noise caused by inductive pickup associated with
long input leads. These capacitors will not degrade the con-
version accuracy.
8.0 NOISE
The leads to each of the analog multiplexer input pins should
be kept as short as possible. This will minimize input noise
and clock frequency coupling that can cause conversion er-
rors. Input filtering can be used to reduce the effects of the
noise sources.
9.0 POWER SUPPLIES
Noise spikes on the VA+ and VD+ supply lines can cause con-
version errors; the comparator will respond to the noise. The
ADC is especially sensitive to any power supply spikes that
occur during the Auto Zero or linearity correction. The mini-
mum power supply bypassing capacitors recommended are
low inductance tantalum capacitors of 10 μF or greater par-
alleled with 0.1 μF monolithic ceramic capacitors. More or
different bypassing may be necessary depending upon the
overall system requirements. Separate bypass capacitors
should be used for the VA+ and VD+ supplies and placed as
close as possible to these pins.
10.0 GROUNDING
The ADC12130/2/8's performance can be maximized through
proper grounding techniques. These include the use of sep-
arate analog and digital areas of the board with analog and
digital components and traces located only in their respective
areas. Bypass capacitors of 0.01 µF and 0.1 µF surface mount
capacitors and a 10 µF are recommended at each of the pow-
er supply pins for best performance. These capacitors should
be located as close to the bypassed pin as practical, espe-
cially the smaller value capacitors.
11.0 CLOCK SIGNAL LINE ISOLATION
The ADC12130/2/8's performance is optimized by routing the
analog input/output and reference signal conductors as far as
possible from the conductors that carry the clock signals to
the CCLK and SCLK pins. Maintaining a separation of at least
7 to 10 times the height of the clock trace above its reference
plane is recommended.
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ADC12130/ADC12132/ADC12138
12.0 THE CALIBRATION CYCLE
A calibration cycle needs to be started after the power sup-
plies, reference, and clock have been given enough time to
stabilize after initial turn-on. During the calibration cycle, cor-
rection values are determined for the offset voltage of the
sampled data comparator and any linearity and gain errors.
These values are stored in internal RAM and used during an
analog-to-digital conversion to bring the overall full-scale, off-
set, and linearity errors down to the specified limits. Full-scale
error typically changes ±0.4 LSB over temperature and lin-
earity error changes even less; therefore, it should be neces-
sary to go through the calibration cycle only once after power
up if the Power Supply Voltage and the ambient temperature
do not change significantly (see the curves in the Typical Per-
formance Characteristics).
13.0 THE Auto Zero CYCLE
To correct for any change in the zero (offset) error of the ADC,
the Auto Zero cycle can be used. It may be desirable to do an
Auto Zero cycle whenever the ambient temperature or the
power supply voltage change significantly. (See the curves
titled "Offset or Zero Error Change vs. Ambient Temperature”
and “Offset or Zero Error Change vs. Supply Voltage” in the
Typical Performance Characteristics.)
14.0 DYNAMIC PERFORMANCE
Many applications require the converter to digitize AC signals,
but the standard DC integral and differential nonlinearity
specifications will not accurately predict the converter's per-
formance with AC input signals. The important specifications
for AC applications reflect the converter's ability to digitize AC
signals without significant spectral errors and without adding
noise to the digitized signal. Dynamic characteristics such as
signal-to-noise (S/N), signal-to-noise + distortion ratio or
S/(N + D), effective bits, full power bandwidth, aperture time
and aperture jitter are quantitative measures of the
converter's capability.
An ADC's AC performance can be measured using Fast
Fourier Transform (FFT) methods. A sinusoidal waveform is
applied to the ADC's input, and the transform is then per-
formed on the digitized waveform. S/(N + D) and S/N are
calculated from the resulting FFT data, and a spectral plot
may also be obtained. Typical values for S/N are shown in the
table of Electrical Characteristics, and spectral plots of
S/(N + D) are included in the typical performance curves.
The ADC's noise and distortion levels will change with the
frequency of the input signal, with more distortion and noise
occurring at higher signal frequencies. This can be seen in
the S/(N + D) versus frequency curves. These curves will also
give an indication of the full power bandwidth (the frequency
at which the S/(N + D) or S/N drops 3 dB).
Effective number of bits can also be useful in describing the
ADC's noise and distortion performance. An ideal ADC will
have some amount of quantization noise, determined by its
resolution, and no distortion, which will yield an optimum
S/(N + D) ratio given by the following equation:
S/(N + D) = (6.02 × n + 1.76) dB
where "n" is the ADC's resolution in bits.
The effective bits of an actual ADC can be found by:
n(effective) = ENOB = (S/(N + D) - 1.76) / 6.02
As an example, this device with a differential signed 5V, 1 kHz
sine wave input signal will typically have a S/(N + D) of 77 dB,
which is equivalent to 12.5 effective bits.
15.0 AN RS232 SERIAL INTERFACE
Shown on the following page is a schematic for an RS232
interface to any IBM and compatible PCs. The DTR, RTS, and
CTS RS232 signal lines are buffered via level translators and
connected to the ADC12138's DI, SCLK, and DO pins, re-
spectively. The D flip-flop is used to generate the CS signal.
1207946
Note: VA+, VD+, and VREF+ on the ADC12138 each have 0.01 μF and 0.1 μF chip caps, and 10 μF tantalum caps. All logic devices are bypassed with 0.1 μF caps.
The assignment of the RS232 port is shown below
B7 B6 B5 B4 B3 B2 B1 B0
COM1 Input Address 3FE X X X CTS X X X X
Output Address 3FC X X X 0 X X RTS DTR
35 www.national.com
ADC12130/ADC12132/ADC12138
A sample program, written in Microsoft QuickBasic, is shown
on the next page. The program prompts for data mode select
instruction to be sent to the ADC. This can be found from the
Mode Programming table shown earlier. The data should be
entered in “1”s and “0”s as shown in the table with DI0 first.
Next, the program prompts for the number of SCLK cycles
required for the programmed mode select instruction. For in-
stance, to send all “0”s to the ADC, selects CH0 as the +input,
CH1 as the −input, 12-bit conversion, and 13-bit MSB first
data output format (if the sign bit was not turned off by a pre-
vious instruction). This would require 13 SCLK periods since
the output data format is 13 bits.
The ADC powers up with No Auto Cal, No Auto Zero, 10
CCLK Acquisition Time, 12-bit conversion, data out with sign,
power up, 12- or 13-bit MSB First, and user mode. Auto Cal,
Auto Zero, Power Up and Power Down instructions do not
change these default settings. The following power up se-
quence should be followed:
1. Run the program
2. Prior to responding to the prompt apply the power to the
ADC12138
3. Respond to the program prompts
It is recommended that the first instruction issued to the
ADC12138 be Auto Cal (See Section 1.1 Interface Con-
cepts).
www.national.com 36
ADC12130/ADC12132/ADC12138
Code Listing:
'variables DOL=Data Out word length, DI=Data string for the DI input,
' DO=ADC result string
'SET CS# HIGH
OUT &H3FC, (&H2 OR INP (&H3FC) 'set RTS HIGH
OUT &H3FC, (&HFE AND INP(&H3FC) 'SET DTR LOW
OUT &H3FC, (&HFD AND INP (&H3FC) 'SET RTS LOW
OUT &H3FC, (&HEF AND INP(&H3FC)) 'set B4 low
10
LINE INPUT “DI data for ADC12138 (see Mode Table on data sheet)”; DI$
INPUT “ADC12138 output word length (12,13,16 or 17)”; DOL
20
'SET CS# HIGH
OUT &H3FC, (&H2 OR INP (&H3FC) 'set RTS HIGH
OUT &H3FC, (&HFE AND INP(&H3FC) 'SET DTR LOW
OUT &H3FC, (&HFD AND INP (&H3FC) 'SET RTS LOW
'SET CS# LOW
OUT &H3FC, (&H2 OR INP (&H3FC) 'set RTS HIGH
OUT &H3FC, (&H1 OR INP(&H3FC) 'SET DTR HIGH
OUT &H3FC, (&HFD AND INP (&H3FC) 'SET RTS LOW
DO$=“ ” 'reset DO variable
OUT &H3FC, (&H1 OR INP(&H3FC) 'SET DTR HIGH
OUT &H3FC, (&HFD AND INP(&H3FC)) 'SCLK low
FOR N = 1 TO 8
Temp$ = MID$(DI$, N, 1)
IF Temp$=“0” THEN
OUT &H3FC, (&H1 OR INP(&H3FC))
ELSE OUT &H3FC, (&HFE AND INP(&H3FC))
END IF 'out DI
OUT &H3FC, (&H2 OR INP(&H3FC)) 'SCLK high
IF (INP(&H3FE) AND 16) = 16 THEN
DO$ = DO$ + “0”
ELSE
DO$ = DO$ + “1”
END IF 'Input DO
OUT &H3FC, (&H1 OR INP(&H3FC) 'SET DTR HIGH
OUT &H3FC, (&HFD AND INP(&H3FC)) 'SCLK low
NEXT N
IF DOL > 8 THEN
FOR N=9 TO DOL
OUT &H3FC, (&H1 OR INP(&H3FC) 'SET DTR HIGH
OUT &H3FC, (&HFD AND INP(&H3FC)) 'SCLK low
OUT &H3FC, (&H2 OR INP(&H3FC)) 'SCLK high
IF (INP(&H3FE) AND &H1O) = &H1O THEN
DO$ = DO$ + “0”
ELSE
DO$ = DO$ + “1”
END IF
NEXT N
END IF
OUT &H3FC, (&HFA AND INP(&H3FC)) 'SCLK low and DI high
FOR N = 1 TO 500
NEXT N
PRINT DO$
INPUT “Enter “C” to convert else “RETURN” to alter DI data”; s$
IF s$ = “C” OR s$ = “c” THEN
GOTO 20
ELSE
GOTO 10
END IF
END
37 www.national.com
ADC12130/ADC12132/ADC12138
Physical Dimensions inches (millimeters) unless otherwise noted
Order Number ADC12130CIWM
NS Package Number M16B
Order Number ADC12138CIWM
NS Package Number M28B
www.national.com 38
ADC12130/ADC12132/ADC12138
Order Number ADC12132CIMSA
NS Package Number MSA20
Order Number ADC12138CIMSA
NS Package Number MSA28
39 www.national.com
ADC12130/ADC12132/ADC12138
Order Number ADC12130CIN
NS Package Number N16E
Order Number ADC12138CIN
NS Package Number N28B
www.national.com 40
ADC12130/ADC12132/ADC12138
Notes
41 www.national.com
ADC12130/ADC12132/ADC12138
Notes
ADC12130/ADC12132/ADC12138 Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters with
MUX and Sample/Hold
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