74F133
13-input NAND gate
Product specification
Supersedes data of 1989 Oct 16
IC15 Data Handbook
1993 Jul 02
INTEGRATED CIRCUITS
Philips Semiconductors Product specification
74F13313-input NAND gate
2
July 2, 1993 853–1154 10219
FEATURE
•Industrial temperature range available (–40°C to +85°C)
TYPE TYPICAL
PROPAGATION
DELAY
TYPICAL
SUPPLY CURRENT
(TOTAL)
74F133 4.0ns 2.0mA
PIN CONFIGURATION
16
15
14
13
12
11
107
6
5
4
3
2
1
D6
VCC
D9
D8
D7
D10
D12
D11
D0
D1
D5
D2
D3
D4
98GND Q
SF00099
ORDERING INFORMATION
DESCRIPTION COMMERCIAL RANGE
VCC = 5V ±10%, Tamb = 0°C to +70°CINDUSTRIAL RANGE
VCC = 5V ±10%, Tamb = –40°C to +85°CPKG DWG #
16-pin plastic DIP N74F133N I74F133N SOT38-4
16-pin plastic SO N74F133D I74F133D SOT109-1
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS DESCRIPTION 74F (U.L.) HIGH/LOW LOAD VALUE HIGH/LOW
D0–D12 Data inputs 1.0/1.0 20µA/0.6mA
QData output 50/33 1.0mA/20mA
NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOGIC SYMBOL
Q9
VCC = Pin 16
GND = Pin 8
SF00100
1
2
3
4
5
6
7
10
11
12
13
14
15
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
D10
D11
D12
IEC/IEEE SYMBOL
9
SF00101
1
2
3
4
5
6
7
10
11
12
13
14
15
&
Philips Semiconductors Product specification
74F13313-input NAND gate
July 2, 1993 3
LOGIC DIAGRAM
D0 D1 D2 D3 D4 D5
VCC = Pin 16
GND = Pin 8
D6 D7 D8 D9 D10 D11 D12
1234567101112131415
9
Q
SF00102
FUNCTION TABLE
INPUTS OUTPUT
D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11 D12 Q
HHHHHHHHHHHHH L
Any one input = L H
NOTES:
H = High voltage level
L = Low voltage level
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL PARAMETER RATING UNIT
VCC Supply voltage –0.5 to +7.0 V
VIN Input voltage –0.5 to +7.0 V
IIN Input current –30 to +5 mA
VOUT Voltage applied to output in High output state –0.5 to VCC V
IOUT Current applied to output in Low output state 40 mA
T
O
p
erating free air tem
p
erature range
Commercial range 0 to +70 °C
T
amb
Operating
free
-
air
temperat
u
re
range
Industrial range –40 to +85 °C
Tstg Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
MIN NOM MAX
UNIT
VCC Supply voltage 4.5 5.0 5.5 V
VIH High-level input voltage 2.0 V
VIL Low-level input voltage 0.8 V
IIK Input clamp current –18 mA
IOH High-level output current –1 mA
IOL Low-level output current 20 mA
T
O
p
erating free air tem
p
erature range
Commercial range 0 +70 °C
T
amb
Operating
free
-
air
temperat
u
re
range
Industrial range –40 +85 °C
Philips Semiconductors Product specification
74F13313-input NAND gate
July 2, 1993 4
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NO TAG
LIMITS
SYMBOL PARAMETER TEST CONDITIONS
NO
TAG
MIN TYP
NO TAG MAX UNIT
VO
High level out
p
ut voltage
VCC = MIN, VIL = MAX ±10%VCC 2.5
V
V
OH
High
-
le
v
el
o
u
tp
u
t
v
oltage
VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4
V
VO
Low level out
p
ut voltage
VCC = MIN, VIL = MAX ±10%VCC 0.35 0.50
V
V
OL
Lo
w-
le
v
el
o
u
tp
u
t
v
oltage
VIH = MIN, IOL = MAX ±5%VCC 0.35 0.50
V
VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V
IIInput current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA
IIH High-level input current VCC = MAX, VI = 2.7V 20 µA
IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA
IOS Short-circuit output currentNO TAG VCC = MAX –60 –150 mA
ICC
Su
pp
ly current (total)
ICCH
VCC = MAX
1.0 2.0
mA
I
CC
S
u
ppl
y
c
u
rrent
(total)
ICCL
V
CC =
MAX
2.5 4.0
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
TEST
VCC = +5.0V VCC = +5.0V ± 10% VCC = +5.0V ± 10%
SYMBOL PARAMETER
TEST
CONDITION
Tamb = +25°C Tamb = 0°C to +70°C Tamb = –40°C to +85°C UNIT
CONDITION
CL = 50pF, RL = 500ΩCL = 50pF, RL = 500ΩCL = 50pF, RL = 500Ω
MIN TYP MAX MIN MAX MIN MAX
tPLH
tPHL Propagation delay
Dn to Q Waveform
NO TAG 2.0
2.5 4.0
4.5 7.0
7.5 1.5
2.0 7.5
8.0 1.5
2.0 7.5
8.0 ns
AC WAVEFORMS
VM
VM
VM
VM
Q
Dn
tPHL tPLH
SF00098
W aveform 1. Propagation Delay for Data to Outputs
NOTE:
For all waveforms, VM = 1.5V.
Philips Semiconductors Product specification
74F13313-input NAND gate
July 2, 1993 5
TEST CIRCUIT AND WAVEFORMS
tw90%
VM
10%
90%
VM10%
90%
VM10%
90%
VM
10%
NEGATIVE
PULSE
POSITIVE
PULSE
tw
AMP (V)
0V
0V
tTHL (tf )
INPUT PULSE REQUIREMENTS
rep. rate twtTLH tTHL
1MHz 500ns 2.5ns 2.5ns
Input Pulse Definition
VCC
family
74F
D.U.T.
PULSE
GENERATOR
RL
CL
RT
VIN VOUT
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
RL= Load resistor;
see AC ELECTRICAL CHARACTERISTICS for value.
CL= Load capacitance includes jig and probe capacitance;
see AC ELECTRICAL CHARACTERISTICS for value.
RT= Termination resistance should be equal to ZOUT of
pulse generators.
tTHL (tf )
tTLH (tr )
tTLH (tr )AMP (V)
amplitude
3.0V 1.5V
VM
SF00006
Philips Semiconductors Product specification
74F133
13-input NAND gate
1993 Jul 02 6
DIP16: plastic dual in-line package; 16 leads (300 mil) SOT38-4
Philips Semiconductors Product specification
74F133
13-input NAND gate
1993 Jul 02 7
SO16: plastic small outline package; 16 leads; body width 3.9 mm SOT109-1
Philips Semiconductors Product specification
74F133
13-input NAND gate
yyyy mmm dd 8
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may af fect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1993
All rights reserved. Printed in U.S.A.
Date of release: 10-93
Document order number: 9397-750-07371
Data sheet
status
Objective
specification
Preliminary
specification
Product
specification
Product
status
Development
Qualification
Production
Definition [1]
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make changes at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
Data sheet status
[1] Please consult the most recently issued datasheet before initiating or completing a design.
