PAGE . 2
May 12.2010-REV.00
MMBT3906W
Parameter Symbol Test Condition MIN. TYP. MAX. Units
Collector - Emitter Breakdown Voltage V
(BR)
CEO IC=-1.0mA, IB=0 -40 - - V
Collector - Base Breakdown Voltage V
(BR)
CBO IC=-10uA, IE=0 -40 - - V
Emitter - Base Breakdown Voltage V
(BR)
EBO IE=-10uA, IC=0 -5.0 - - V
Base Cutoff Current I
BL
VCE=-30V, VEB=-3.0V - - -50 nA
Collector Cutoff Current I
CEX
VCE=-30V, VEB=-3.0V - - -50 nA
DC Current Gain (Note 2) h
FE
IC=-0.1mA, VCE=-1.0V
IC=-1.0mA, VCE=-1.0V
IC=-10mA, VCE=-1.0V
IC=-50mA, VCE=-1.0V
IC=-100mA, VCE=-1.0V
60
80
100
60
30
-
-
-
-
-
-
-
300
-
-
-
Collector - Emitter Saturation Voltage (Note 2) V
CE(SAT)
IC=-10mA, IB=-1.0mA
IC=-50mA, IB=-5.0mA --
-0.25
-0.4 V
Base - Emitter Saturation Voltage (Note 2) V
BE(SAT)
IC=-10mA, IB=-1.0mA
IC=-50mA, IB=-5.0mA -0.65
--
--0.85
-0.95 V
Collector - Base Capacitance C
CBO
VCB=-5V, IE=0, f=1MHz - - 4.5 pF
Emitter - Base Capacitance C
EBO
VEB=-0.5V, IC=0, f=1MHz - - 10 pF
Delay Time td VCC=-3V,VBE=--0.5V,
IC=-10mA,IB=-1.0mA --35ns
Rise Time tr VCC=-3V,VBE=-0.5V,
IC=-10mA,IB=-1.0mA --35ns
Storage Time ts VCC=-3V,IC=-10mA
IB1=IB2=-1.0mA - - 225 ns
Fall Time tf VCC=-3V,IC=-10mA
IB1=IB2=-1.0mA --75ns
ELECTRICAL CHARACTERISTICS
Note 2: Pulse Test: Pulse Width < 300 μs, Duty Cycle < 2.0%.
275 W
10K W
0
-0.5V
300ns -10.9V
+3V
Delay and Rise Time Equivalent Test Circuit
<1ns
C *<4pF
S
Storage and Fall Time Equivalent Test Circuit
0
+9 . 1 V
10 to 500us
Duty Cycle ~ 2.0%
-10.9V
< 1ns
0
1N916
+3V
275 W
10K W
C *<4pF
S
SWITCHING TIME EQUIVALENT TEST CIRCUITS