ZXMN2B03E6
Issue 1 - September 2006 4 www.zetex.com
© Zetex Semiconductors plc 2006
Electrical characteristics (at Tamb = 25°C unless otherwise stated)
Parameter Symbol Min. Typ. Max. Unit Conditions
Static
Drain-source breakdown voltage V(BR)DSS 20 V ID= 250A, VGS=0V
Zero gate voltage drain current IDSS 1AV
DS= 20V, VGS=0V
Gate-body leakage IGSS 100 nA VGS=±8V, VDS=0V
Gate-source threshold voltage VGS(th) 0.4 1.0 V ID= 250A, VDS=VGS
Static drain-source on-state
resistance (*)
NOTES:
(*) Measured under pulsed conditions. Pulse width ⱕ300s; duty cycle ⱕ2%.
RDS(on) 0.040 ⍀VGS= 4.5V, ID= 4.3A
0.055 ⍀VGS= 2.5V, ID= 3.7A
0.075 ⍀VGS= 1.8V, ID= 3.2A
Forward transconductance(*) (‡) gfs 13.5 S VDS= 10V, ID= 4.3A
Dynamic(‡)
Input capacitance Ciss 1160 pF VDS= 10V, VGS=0V
f=1MHz
Output capacitance Coss 210 pF
Reverse transfer capacitance Crss 136 pF
Switching (†) (‡)
(†) Switching characteristics are independent of operating junction temperature.
(‡) For design aid only, not subject to production testing.
Turn-on-delay time td(on) 4.2 ns VDD= 10V, VGS= 4.5V
ID= 1A
RG ≈ 6.0⍀
Rise time tr 6.2 ns
Turn-off delay time td(off) 33.9 ns
Fall time tf12.4 ns
Total gate charge Qg14.5 nC VDS= 10V, VGS= 4.5V
ID= 4.3A
Gate-source charge Qgs 2nC
Gate drain charge Qgd 2.8 nC
Source-drain diode
Diode forward voltage(*) VSD 0.67 0.95 V Tj=25°C, IS= 1.8A,
VGS=0V
Reverse recovery time(‡) trr 10.8 ns Tj=25°C, IF= 2.8A,
di/dt=100A/s
Reverse recovery charge(‡) Qrr 3.4 nC