K M Y Drawing No: RNC−K−HTS−0001 /7
Title: FIXED THIN FILM CHIP RESISTORS; RECTANGULAR TYPE
RNC06, 20, 32 Page: 4/12
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Issue: KAMAYA ELECTRIC CO., LTD. Research & Development Department HOKKAIDO Research center Last update: 2012.10.5
7. Performance
7.1 The standard condition for tests shall be in accordance with Sub−clause 4.2, JIS C 5201−1: 1998.
7.2 The performance shall be satisfied in Table−4.
Table−4(1)
No. Test items Condition of test (JIS C 5201−1) Performance requirements
1 Visual examination Sub−clause 4.4.1
Checked by visual examination.
As in 4.4.1
The marking shall be legible, as
checked by visual examination.
2 Dimension
Resistance
Sub−clause 4.4.2
Sub−clause 4.5
As specified in Table−3 of this
specification.
As in 4.5.2
The resistance value shall
correspond with the rated resistance
taking into account the specified
tolerance.
3 Voltage proof Sub−clause 4.7
Method: 4.6.1.4(See Figure−5)
Test voltage: Alternating voltage with a peak
value of 1.42 times the insulation voltage.
Duration: 60 s ± 5 s
Insulation resistance
Test voltage: Insulation voltage
Duration: 1 min.
No breakdown or flash over
R ≥ 1 G Ω
4 Solderability Sub−clause 4.17
Without ageing
Flux: The resistors shall be immersed in a
non−activated soldering flux for 2s.
Bath temperature: 235 °C ± 5 °C
Immersion time: 2 s ± 0.5 s
As in 4.17.4.5
The terminations shall be covered
with a smooth and bright solder
coating.
5 Mounting
Overload
(in the mounted state)
Solvent resistance of the
marking
Sub−clause 4.31
Substrate material: Epoxide woven glass
Test substrate: Figure−3
Sub−clause 4.13
The applied voltage shall be 2.5 times the
rated voltage or twice the limiting element
voltage, whichever is the less severe.
Duration: 2 s
Visual examination
Resistance
Sub−clause 4.30
Solvent: 2−propanol
Solvent temperature: 23 °C ± 5 °C
Method 1
Rubbing material: cotton wool
Without recovery
No visible damage
∆R ≤ ± (0.25%+0.05Ω)
Legible marking