Approval sheet
Page 7 of 9 ASC_WA04/06_V16 Apr-2014
TEST AND REQUIREMENTS(JIS C 5201-1 : 1998)
Essentially all tests are carried out according to the schedule of IEC publication 115-8, category
LCT/UCT/56(rated temperature range : Lower Category Temperature, Upper Category Temperature; damp
heat, long term, 56 days). The testing also meets the requirements specified by EIA, EIAJ and JIS.
The tests are carried out in accordance with IEC publication 68, "Recommended basic climatic and mechanical
robustness testing procedure for electronic components" and under standard atmospheric conditions according
to IEC 60068-1, subclause 5.3. Unless otherwise specified, the following value supplied :
Temperature: 15°C to 35°C.
Relative humidity: 45% to 75%.
Air pressure: 86kPa to 106 kPa (860 mbar to 1060 mbar).
All soldering tests are performed with midly activated flux.
REQUIREMENT
TEST PROCEDURE Resistor Jumper
DC resistance
Clause 4.5
DC resistance values measured at the test voltages specified below :
<10Ω@0.1V,<100Ω@0.3V,<1KΩ@1.0V,<10KΩ@3V, <100KΩ@10V,
<1MΩ@25V, <10MΩ@30V
Within the specified
tolerance < 50mΩ
Temperature Coefficient
of Resistance (T.C.R)
Clause 4.8
Natural resistance change per change in degree centigrade.
( )
6
121
12 10×
−
ttR RR
(ppm/°C) t
1
: 20°C+5°C-1°C
R
1
: Resistance at reference temperature
R
2
: Resistance at test temperature
Refer to
“QUICK REFERENCE DATA”
N/a
Short time overload
(S.T.O.L)
Clause 4.13
Permanent resistance change after a 5second application of a
voltage 2.5 times RCWV or the maximum overload voltage specified
in the above list, whichever is less.
∆R/R max. ±(2%+0.10Ω)
< 50mΩ
Resistance to soldering
heat(R.S.H)
Clause 4.18
Un-mounted chips completely immersed for 10±1second in a SAC
solder bath at 260℃±5ºC
ΔR/R max. ±(1%+0.05Ω)
no visible damage < 50mΩ
Solderability
Clause 4.17
Un-mounted chips completely immersed for 2±0.5 second in a SAC
solder bath at 235℃±5℃ good tinning (>95% covered)
no visible damage
Temperature cycling
Clause 4.19 30 minutes at -55°C±3°C, 2~3 minutes at 20°C+5°C-1°C, 30
minutes at +155°C±3°C, 2~3 minutes at 20°C+5°C-1°C, total 5
continuous cycles
ΔR/R max. ±(1%+0.05Ω)
no visible damage < 50mΩ
Load life (endurance)
Clause 4.25 1000 +48/-0 hours, loaded with RCWV or Vmax in chamber
controller 70±2ºC, 1.5 hours on and 0.5 hours off ΔR/R max.±(3%+0.10Ω)
For 10Ω≤R<1MΩ ;
ΔR/R max.±(5%+0.10Ω)
For R<10Ω, R≥1MΩ
< 50mΩ
Load life in Humidity
Clause 4.24 1000 +48/-0 hours, loaded with RCWV or Vmax in humidity chamber
controller at 40°C±2°C and 90~95% relative humidity, 1.5hours on
and 0.5 hours off
ΔR/R max.±(3%+0.10Ω)
For 10Ω≤R<1MΩ ;
ΔR/R max.±(5%+0.10Ω)
For R<10Ω, R≥1MΩ
< 50mΩ
Adhesion
Clause 4.32 Pressurizing force: 5N, Test time: 10±1sec. No remarkable damage or removal of
the terminations.
Insulation Resistance
Clause 4.6 Apply the maximum overload voltage (DC) for 1minute R≧10GΩ
Dielectric Withstand
Voltage
Clause 4.7
Apply the maximum overload voltage (AC) for 1 minute No breakdown or flashover