BATTERY PROTECTION IC FOR 2-SERIAL / 3-SERIAL CELL PACK
(SECONDARY PROTECTION)
Rev.1.1_00 S-8213 Series
Seiko Instruments Inc. 7
Test Circuits
1. Overcharge detection voltage, overcharge hysteresis voltage
(Test circuit 1)
1. 1 Overcharge detection voltage n (VCUn)
Set V1 = V2 = V3 = VCU − 0.05 V. The Overcharge detection voltage 1 (VCU1) is the V1 voltage when the CO pin’s
output changes after the voltage of V1 has been gradually increased.
Overcharge detection voltage VCUn (n = 2, 3) can be determined in the same way as when n = 1.
1. 2 Overcharge hysteresis voltage n (VHCn)
Set V1 = VCU + 0.05 V, V2 = V3 = 2.5 V. The overcharge hysteresis voltage 1 (VHC1) is the difference between V1
voltage and VCU1 when the CO pin’s output changes after the V1 voltage has been gradually decreased.
Overcharge hysteresis voltage VHCn (n = 2, 3) can be determined in the same way as when n = 1.
2. Output current
(Test circuit 5)
Set SW1 and SW2 to OFF.
2. 1 Active "H"
2. 1. 1 CO pin source current (ICOH)
Set SW1 to ON after setting V1 = 5.5 V, V2 =V3 = 3.0 V, V4 = 0.5 V. I1 is the CO pin source current (ICOH) at that
time.
2. 1. 2 CO pin sink current (ICOL)
Set SW2 to ON after setting V1 to V3 = 3.5 V, V5 = 0.5 V. I2 is the CO pin sink current (ICOL) at that time.
2. 2 Active "L"
2. 2. 1 CO pin source current (ICOH)
Set SW1 to ON after setting V1 to V3 = 3.5 V, V4 = 0.5 V. I1 is the CO pin source current (ICOH) at that time.
2. 2. 2 CO pin sink current (ICOL)
Set SW2 to ON after setting V1 = 5.0 V, V2 = V3 = 3.0 V, V5 = 0.5 V. I2 is the CO pin sink current (ICOL) at that
time.
3. Overcharge detection delay time (tCU)
(Test circuit 1)
Increase V1 up to 5.0 V after setting V1 = V2 = V3 = 3.5 V. The overcharge detection delay time (tCU) is the time period
until the CO pin output changes.
4. Transition time to test mode (tTST)
(Test circuit 2)
Increase V4 up to 4.0 V, and decrease V4 again to 0 V after setting V1 = V2 = V3 = 3.5 V, and V4 = 0 V.
When the period from when V4 was raised to when it has fallen is short, if an overcharge detection operation is
performed subsequently, the delay time is tCU. However, when the period from when V4 is raised to when it has fallen is
gradually made longer, the delay time during the subsequent overcharge detection operation is shorter than tCU. The
transition time to test mode (tTST) is the period from when V4 was raised to when it has fallen at that time.