ADC081S101CISDX - Texas Instruments High-Performance Analog

3 4

VACS

GND SDATA

VIN SCLK

ADC081S101

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ADC081S101 Single Channel, 0.5 to 1 Msps, 8-Bit A/D Converter

Check for Samples: ADC081S101

1FEATURES DESCRIPTION

The ADC081S101 is a low-power, single channel

2• Specified Over a Range of Sample Rates. CMOS 8-bit analog-to-digital converter with a high-

• 6-Lead WSON and SOT-23 Packages speed serial interface. Unlike the conventional

• Variable Power Management practice of specifying performance at a single sample

rate only, the ADC081S101 is fully specified over a

• Single Power Supply with 2.7V - 5.25V Range sample rate range of 500 ksps to 1 Msps. The

• SPI™/QSPI™/MICROWIRE/DSP Compatible converter is based upon a successive-approximation

APPLICATIONS circuit.

• Portable Systems The output serial data is straight binary, and is

• Remote Data Aquisitions compatible with several standards, such as SPI™,

QSPI™, MICROWIRE, and many common DSP

• Instrumentation and Control Systems serial interfaces.

KEY SPECIFICATIONS The ADC081S101 operates with a single supply that

can range from +2.7V to +5.25V. Normal power

• DNL ± 0.07 LSB (typ) consumption using a +3V or +5V supply is 2.0 mW

• INL ± 0.05 LSB (typ) and 10.0 mW, respectively. The power-down feature

• SNR 49.7 dB (typ) reduces the power consumption to just 2.5 µW using

a +5V supply.

• Power Consumption The ADC081S101 is packaged in an 6-lead WSON

– 3V Supply 2.0 mW (typ) and SOT-23 packages. Operation over the industrial

– 5V Supply 10.0 mW (typ) temperature range of −40°C to +85°C is ensured.

Table 1. Pin-Compatible Alternatives by Resolution and Speed(1)

Resolution Specified for Sample Rate Range of:

50 to 200 ksps 200 to 500 ksps 500 ksps to 1 Msps

12-bit ADC121S021 ADC121S051 ADC121S101

10-bit ADC101S021 ADC101S051 ADC101S101

8-bit ADC081S021 ADC081S051 ADC081S101

(1) All devices are fully pin and function compatible.

Connection Diagram

Figure 1. 6-Lead SOT-23 or WSON

See DBV or NGF Package

1Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2All trademarks are the property of their respective owners.

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.

T/H

8-BIT

SUCCESSIVE

APPROXIMATION

ADC

SCLK

SDATA

CONTROL

LOGIC

VIN

ADC081S101

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Block Diagram

PIN DESCRIPTIONS AND EQUIVALENT CIRCUITS

Pin No. Symbol Description

ANALOG I/O

3 VIN Analog input. This signal can range from 0V to VA.

DIGITAL I/O

4 SCLK Digital clock input. This clock directly controls the conversion and readout processes.

5 SDATA Digital data output. The output samples are clocked out of this pin on falling edges of the SCLK pin.

6 CS Chip select. On the falling edge of CS, a conversion process begins.

POWER SUPPLY

Positive supply pin. This pin should be connected to a quiet +2.7V to +5.25V source and bypassed to

1 VAGND with a 1 µF capacitor and a 0.1 µF monolithic capacitor located within 1 cm of the power pin.

2 GND The ground return for the supply and signals.

PAD GND For package suffix CISD(X) only, it is recommended that the center pad should be connected to ground.

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

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Absolute Maximum Ratings (1)(2)(3)

Analog Supply Voltage VA−0.3V to 6.5V

Voltage on Any Pin to GND −0.3V to (VA+0.3)V

Input Current at Any Pin (4) ±10 mA

Package Input Current (4) ±20 mA

Power Consumption at TA= 25°C See (5)

ESD Susceptibility (6)

Human Body Model 3500V

Machine Model 300V

Junction Temperature +150°C

Storage Temperature −65°C to +150°C

(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the

Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may

degrade when the device is not operated under the listed test conditions.

(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and

specifications.

(3) All voltages are measured with respect to GND = 0V, unless otherwise specified.

(4) When the input voltage at any pin exceeds the power supply (that is, VIN < GND or VIN > VA), the current at that pin should be limited to

10 mA. The 20 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an

input current of 10 mA to two. The Absolute Maximum Rating specification does not apply to the VApin. The current into the VApin is

limited by the Analog Supply Voltage specification.

(5) The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by

TJmax, the junction-to-ambient thermal resistance (θJA), and the ambient temperature (TA), and can be calculated using the formula

PDmax = (TJmax −TA) / θJA. The values for maximum power dissipation listed above will be reached only when the device is operated

in a severe fault condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is

reversed). Obviously, such conditions should always be avoided.

(6) Human body model is 100 pF capacitor discharged through a 1.5 kΩresistor. Machine model is 220 pF discharged through zero ohms.

Operating Ratings (1)(2)

Operating Temperature Range −40°C ≤TA≤+85°C

VASupply Voltage +2.7V to +5.25V

Digital Input Pins Voltage Range −0.3V to +5.25V

(regardless of supply voltage)

Clock Frequency 25 kHz to 20 MHz

Sample Rate Up to 1 Msps

Analog Input Voltage 0V to VA

(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the

Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may

degrade when the device is not operated under the listed test conditions.

(2) All voltages are measured with respect to GND = 0V, unless otherwise specified.

Package Thermal Resistance(1)

Package θJA

6-lead WSON 94°C / W

6-lead SOT-23 265°C / W

Soldering process must comply with Texas Instrument's Reflow Temperature Profile specifications. Refer to www.ti.com and

http://www.ti.com/lit/SNOA549.

(1) Reflow temperature profiles are different for lead-free and non-lead-free packages.

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ADC081S101 Converter Electrical Characteristics (1)(2)

The following specifications apply for VA= +2.7V to 5.25V, GND = 0V, fSCLK = 10 MHz to 20 MHz, CL= 15 pF, fSAMPLE = 500

ksps to 1 Msps, unless otherwise noted. Boldface limits apply for TA= TMIN to TMAX: all other limits TA= 25°C.

Limits

Symbol Parameter Conditions Typical Units

(2)

STATIC CONVERTER CHARACTERISTICS

Resolution with No Missing 8Bits

Codes LSB

INL Integral Non-Linearity VA= +2.7V to +5.25V ±0.05 ±0.3 (max)

LSB

DNL Differential Non-Linearity VA= +2.7V to +5.25V ±0.07 ±0.3 (max)

LSB

VOFF Offset Error VA= +2.7V to +5.25V ±0.03 ±0.3 (max)

LSB

GE Gain Error VA= +2.7V to +5.25V ±0.08 ±0.4 (max)

LSB

TUE Total Unadjusted Error VA= +2.7V to +5.25V ±0.07 ±0.3 (max)

DYNAMIC CONVERTER CHARACTERISTICS

Signal-to-Noise Plus VA= +2.7 to 5.25V

SINAD 49.7 49 dB (min)

Distortion Ratio fIN = 100 kHz, −0.02 dBFS

VA= +2.7 to 5.25V

SNR Signal-to-Noise Ratio 49.7 dB (min)

fIN = 100 kHz, −0.02 dBFS

VA= +2.7 to 5.25V

THD Total Harmonic Distortion −77 −65 dB (max)

fIN = 100 kHz, −0.02 dBFS

Spurious-Free Dynamic VA= +2.7 to 5.25V

SFDR 68 65 dB (min)

Range fIN = 100 kHz, −0.02 dBFS

VA= +2.7 to 5.25V

ENOB Effective Number of Bits 7.9 7.8 Bits (min)

fIN = 100 kHz, −0.02 dBFS

Intermodulation Distortion, VA= +5.25V −68 dB

Second Order Terms fa= 103.5 kHz, fb= 113.5 kHz

IMD Intermodulation Distortion, VA= +5.25V −68 dB

Third Order Terms fa= 103.5 kHz, fb= 113.5 kHz

VA= +5V 11 MHz

FPBW -3 dB Full Power Bandwidth VA= +3V 8 MHz

ANALOG INPUT CHARACTERISTICS

VIN Input Range 0 to VAV

IDCL DC Leakage Current ±1 µA (max)

Track Mode 30 pF

CINA Input Capacitance Hold Mode 4 pF

DIGITAL INPUT CHARACTERISTICS

VA= +5.25V 2.4

VIH Input High Voltage V (min)

VA= +3.6V 2.1

VA= +5V 0.8 V (max)

VIL Input Low Voltage VA= +3V 0.4 V (max)

IIN Input Current VIN = 0V or VA±10 nA ±1 µA (max)

CIND Digital Input Capacitance 2 4pF (max)

DIGITAL OUTPUT CHARACTERISTICS

ISOURCE = 200 µA VA−0.07 VA−0.2 V (min)

VOH Output High Voltage ISOURCE = 1 mA VA−0.1 V

ISINK = 200 µA 0.03 0.4 V (max)

VOL Output Low Voltage ISINK = 1 mA 0.1 V

(1) Tested limits are specified to TI's AOQL (Average Outgoing Quality Level).

(2) Data sheet min/max specification limits are ensured by design, test, or statistical analysis.

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ADC081S101 Converter Electrical Characteristics (1)(2) (continued)

The following specifications apply for VA= +2.7V to 5.25V, GND = 0V, fSCLK = 10 MHz to 20 MHz, CL= 15 pF, fSAMPLE = 500

ksps to 1 Msps, unless otherwise noted. Boldface limits apply for TA= TMIN to TMAX: all other limits TA= 25°C.

Limits

Symbol Parameter Conditions Typical Units

(2)

TRI-STATE® Leakage

IOZL, IOZH ±0.1 ±10 µA (max)

Current

TRI-STATE® Output

COUT 24pF (max)

Capacitance

Output Coding Straight (Natural) Binary

POWER SUPPLY CHARACTERISTICS

2.7 V (min)

VASupply Voltage 5.25 V (max)

SOT-23 3.2 mA

VA= +5.25V, fSAMPLE = 1 Msps 2.0 (max)

WSON 2.6

Supply Current, Normal

Mode (Operational, CS low) SOT-23 1.5 mA

VA= +3.6V, fSAMPLE = 1 Msps 0.6

IA(max)

WSON 1.1

VA= +5.25V, fSCLK = 0 MHz, fSAMPLE = 0 ksps 500 nA

Supply Current, Shutdown VA= +5.25V, fSCLK = 20 MHz,

(CS high) 60 µA

fSAMPLE = 0 ksps SOT-23 16 mW

VA= +5V 10

Power Consumption, (max)

WSON 13

Normal Mode (Operational, SOT-23 4.5 mW

CS low) VA= +3V 2.0 (max)

WSON 3.3

PDVA= +5V, fSCLK = 0 MHz, 2.5 µW

fSAMPLE = 0 ksps

Power Consumption,

Shutdown (CS high) VA= +5V, fSCLK = 20 MHz, 300 µW

fSAMPLE = 0 ksps

AC ELECTRICAL CHARACTERISTICS

MHz

10 (min)

fSCLK Clock Frequency (3) MHz

20 (max)

ksps

50 500 (min)

fSSample Rate (3) Msps

1(max)

SCLk

tHOLD Hold Time 13 Falling

Edges

40 % (min)

DC SCLK Duty Cycle fSCLK = 20 MHz 50 60 % (max)

Minimum Time Required for

tACQ 350 ns (max)

Acquisition

tQUIET (4) 50 ns (min)

tAD Aperture Delay 3 ns

tAJ Aperture Jitter 30 ps

(3) This is the frequency range over which the electrical performance is ensured. The device is functional over a wider range which is

specified under Operating Ratings.

(4) Minimum Quiet Time required by bus relinquish and the start of the next conversion.

Product Folder Links: ADC081S101

IOL

200 PA

IOH

200 PA

1.6 V

To Output Pin

25 pF

ADC081S101

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ADC081S101 Timing Specifications

The following specifications apply for VA= +2.7V to 5.25V, GND = 0V, fSCLK = 10.0 MHz to 20.0 MHz, CL= 25 pF, fSAMPLE =

500 ksps to 1 Msps, Boldface limits apply for TA= TMIN to TMAX: all other limits TA= 25°C.

Symbol Parameter Conditions Typical Limits Units

tCS Minimum CS Pulse Width 10 ns (min)

tSU CS to SCLK Setup Time 10 ns (min)

tEN Delay from CS Until SDATA TRI-STATE Disabled (1) 20 ns (max)

VA= +2.7 to +3.6 40 ns (max)

tACC Data Access Time after SCLK Falling Edge (2) VA= +4.75 to +5.25 20 ns (max)

tCL SCLK Low Pulse Width 0.4 x tSCLK ns (min)

tCH SCLK High Pulse Width 0.4 x tSCLK ns (min)

VA= +2.7 to +3.6 7ns (min)

tHSCLK to Data Valid Hold Time VA= +4.75 to +5.25 5ns (min)

25 ns (max)

VA= +2.7 to +3.6 6ns (min)

tDIS SCLK Falling Edge to SDATA High Impedance (3) 25 ns (max)

VA= +4.75 to +5.25 5ns (min)

tPOWER- Power-Up Time from Full Power-Down 1 µs

(1) Measured with the timing test circuit shown in Figure 2 and defined as the time taken by the output signal to cross 1.0V.

(2) Measured with the timing test circuit shown in Figure 2 and defined as the time taken by the output signal to cross 1.0V or 2.0V.

(3) tDIS is derived from the time taken by the outputs to change by 0.5V with the timing test circuit shown in Figure 2. The measured number

is then adjusted to remove the effects of charging or discharging the output capacitance. This means that tDIS is the true bus relinquish

time, independent of the bus loading.

Timing Diagrams

Figure 2. Timing Test Circuit

Product Folder Links: ADC081S101

Z2 Z1 Z0 DB7 Zero Zero Zero Zero

tQUIET

Track

3 leading zero bits 8 data bits

SCLK

SDATA

1 2 3 4 5 12 13 14 15 16

TRI-STATE

tSU tCL

tEN tCH tACC tHtDIS

tCS

Hold

tACQ

17 18 19 20

4 trailing zeroes

ADC081S101

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Figure 3. ADC081S101 Serial Timing Diagram

Specification Definitions

ACQUISITION TIME is the time required to acquire the input voltage. That is, it is time required for the hold

capacitor to charge up to the input voltage. Acquisition time is measured backwards from the falling edge

of CS when the signal is sampled and the part moves from track to hold. The start of the time interval that

contains TACQ is the 13th rising edge of SCLK of the previous conversion when the part moves from hold

to track. The user must ensure that the time between the 13th rising edge of SCLK and the falling edge of

the next CS is not less than TACQ to meet performance specifications.

APERTURE DELAY is the time after the falling edge of CS when the input signal is acquired or held for

conversion.

APERTURE JITTER (APERTURE UNCERTAINTY) is the variation in aperture delay from sample to sample.

Aperture jitter manifests itself as noise in the output.

CONVERSION TIME is the time required, after the input voltage is acquired, for the ADC to convert the input

voltage to a digital word. This is from the falling edge of CS when the input signal is sampled to the 16th

falling edge of SCLK when the SDATA output goes into TRI-STATE.

DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1

LSB.

DUTY CYCLE is the ratio of the time that a repetitive digital waveform is high to the total time of one period. The

specification here refers to the SCLK.

EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise

and Distortion or SINAD. ENOB is defined as (SINAD −1.76) / 6.02 and says that the converter is

equivalent to a perfect ADC of this (ENOB) number of bits.

FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental

drops 3 dB below its low frequency value for a full scale input.

GAIN ERROR is the deviation of the last code transition (111...110) to (111...111) from the ideal (VREF −1 LSB),

after adjusting for offset error.

INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from

negative full scale (½ LSB below the first code transition) through positive full scale (½ LSB above the last

code transition). The deviation of any given code from this straight line is measured from the center of that

code value.

INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two

sinusoidal frequencies being applied to the ADC input at the same time. It is defined as the ratio of the

power in the second and third order intermodulation products to the sum of the power in both of the

original frequencies. IMD is usually expressed in dB.

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‡AA++A

log20=THD 

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MISSING CODES are those output codes that will never appear at the ADC outputs. The ADC081S101 is

ensured not to have any missing codes.

OFFSET ERROR is the deviation of the first code transition (000...000) to (000...001) from the ideal (i.e. GND +

1 LSB).

SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in dB, of the rms value of the input signal to the rms

value of the sum of all other spectral components below one-half the sampling frequency, not including

harmonics or d.c.

SIGNAL TO NOISE PLUS DISTORTION (S/N+D or SINAD) Is the ratio, expressed in dB, of the rms value of

the input signal to the rms value of all of the other spectral components below half the clock frequency,

including harmonics but excluding d.c.

SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the desired signal

amplitude to the amplitude of the peak spurious spectral component, where a spurious spectral

component is any signal present in the output spectrum that is not present at the input and may or may

not be a harmonic.

TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dB or dBc, of the rms total of the first five

harmonic components at the output to the rms level of the input signal frequency as seen at the output.

THD is calculated as

where

• Af1is the RMS power of the input frequency at the output

• Af2through Af6are the RMS power in the first 5 harmonic frequencies (1)

TOTAL UNADJUSTED ERROR is the worst deviation found from the ideal transfer function. As such, it is a

comprehensive specification which includes full scale error, linearity error, and offset error.

THROUGHPUT TIME is the minimum time required between the start of two successive conversion. It is the

acquisition time plus the conversion time.

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Typical Performance Characteristics

TA= +25°C, fSAMPLE = 500 ksps to 1 Msps, fSCLK = 10 MHz to 20 MHz, fIN = 100 kHz unless otherwise stated.

DNL INL

fSCLK = 10 MHz fSCLK = 10 MHz

Figure 4. Figure 5.

DNL INL

fSCLK = 20 MHz fSCLK = 20 MHz

Figure 6. Figure 7.

DNL INL

vs vs

Clock Frequency Clock Frequency

Figure 8. Figure 9.

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Typical Performance Characteristics (continued)

TA= +25°C, fSAMPLE = 500 ksps to 1 Msps, fSCLK = 10 MHz to 20 MHz, fIN = 100 kHz unless otherwise stated.

Total Unadjusted Error SNR

vs vs

Clock Frequency Clock Frequency

Figure 10. Figure 11.

SINAD THD

vs. vs.

Clock Frequency Clock Frequency

Figure 12. Figure 13.

SFDR

vs. Spectral Response, VA= 5V

Clock Frequency fSCLK = 10 MHz

Figure 14. Figure 15.

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Typical Performance Characteristics (continued)

TA= +25°C, fSAMPLE = 500 ksps to 1 Msps, fSCLK = 10 MHz to 20 MHz, fIN = 100 kHz unless otherwise stated.

Power Consumption

vs.

Spectral Response, VA= 5V Throughput,

fSCLK = 20 MHz fSCLK = 20 MHz

Figure 16. Figure 17.

Product Folder Links: ADC081S101

GND

SAMPLING

CAPACITOR

SW1

+CONTROL

LOGIC

CHARGE

REDISTRIBUTION

DAC

SW2

VIN

GND

SAMPLING

CAPACITOR

SW1

+CONTROL

LOGIC

CHARGE

REDISTRIBUTION

DAC

SW2

VIN

ADC081S101

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APPLICATIONS INFORMATION

ADC081S101 Operation

The ADC081S101 is a successive-approximation analog-to-digital converter designed around a charge-

redistribution digital-to-analog converter core. Simplified schematics of the ADC081S101 in both track and hold

operation are shown in Figure 18 and Figure 19, respectively. In Figure 18, the device is in track mode: switch

SW1 connects the sampling capacitor to the input, and SW2 balances the comparator inputs. The device is in

this state until CS is brought low, at which point the device moves to hold mode.

Figure 19 shows the device in hold mode: switch SW1 connects the sampling capacitor to ground, maintaining

the sampled voltage, and switch SW2 unbalances the comparator. The control logic then instructs the charge-

redistribution DAC to add or subtract fixed amounts of charge from the sampling capacitor until the comparator is

balanced. When the comparator is balanced, the digital word supplied to the DAC is the digital representation of

the analog input voltage. The device moves from hold mode to track mode on the 13th rising edge of SCLK.

Figure 18. ADC081S101 in Track Mode

Figure 19. ADC081S101 in Hold Mode

Using the ADC081S101

The serial interface timing diagram for the ADC is shown in Figure 3. CS is chip select, which initiates

conversions on the ADC and frames the serial data transfers. SCLK (serial clock) controls both the conversion

process and the timing of serial data. SDATA is the serial data out pin, where a conversion result is found as a

serial data stream.

Basic operation of the ADC begins with CS going low, which initiates a conversion process and data transfer.

Subsequent rising and falling edges of SCLK will be labelled with reference to the falling edge of CS; for

example, "the third falling edge of SCLK" shall refer to the third falling edge of SCLK after CS goes low.

At the fall of CS, the SDATA pin comes out of TRI-STATE, and the converter moves from track mode to hold

mode. The input signal is sampled and held for conversion on the falling edge of CS. The converter moves from

hold mode to track mode on the 13th rising edge of SCLK (see Figure 3). It is at this point that the interval for the

TACQ specification begins. In the worst case, 350 ns must pass between the 13th rising edge and the next falling

edge of SCLK. The SDATA pin will be placed back into TRI-STATE after the 16th falling edge of SCLK, or at the

rising edge of CS, whichever occurs first. After a conversion is completed, the quiet time tQUIET must be satisfied

before bringing CS low again to begin another conversion.

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000...001

000...010

011...111

111...000

000...000

111...111

111...110

ADC CODE

ANALOG INPUT

1 LSB = VA/256

1 LSB +VA-1 LSB

ADC081S101

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Sixteen SCLK cycles are required to read a complete sample from the ADC. The sample bits (including leading

or trailing zeroes) are clocked out on falling edges of SCLK, and are intended to be clocked in by a receiver on

subsequent falling edges of SCLK. The ADC will produce three leading zero bits on SDATA, followed by eight

data bits, most significant first. After the data bits, the ADC will clock out four trailing zeros.

If CS goes low before the rising edge of SCLK, an additional (fourth) zero bit may be captured by the next falling

edge of SCLK.

Determining Throughput

Throughput depends on the frequency of SCLK and how much time is allowed to elapse between the end of one

conversion and the start of another. At the maximum specified SCLK frequency, the maximum ensured

throughput is obtained by using a 20 SCLK frame. As shown in Figure 3, the minimum allowed time between CS

falling edges is determined by 1) 12.5 SCLKs for Hold mode, 2) the larger of two quantities: either the minimum

required time for Track mode (tACQ) or 2.5 SCLKs to finish reading the result and 3) 0, 1/2 or 1 SCLK padding to

ensure an even number of SCLK cycles so there is a falling SCLK edge when CS next falls. For example, at the

fastest rate for this family of parts, SCLK is 20MHz and 2.5 SCLKs are 125ns, so the minimum time between CS

falling edges is calculated by:

12.5*50ns + 350ns + 0.5*50ns = 1000ns (2)

(12.5 SCLKs + tACQ + 1/2 SCLK) which corresponds to a maximum throughput of 1MSPS. At the slowest rate for

this family, SCLK is 1MHz. Using a 20-cycle conversion frame as shown in Figure 3 yields a 20μs time between

CS falling edges for a throughput of 50KSPS.

It is possible, however, to use fewer than 20 clock cycles provided the timing parameters are met. With a 1MHz

SCLK, there are 2500ns in 2.5 SCLK cycles, which is greater than tACQ. After the last data bit has come out, the

clock will need one full cycle to return to a falling edge. Thus the total time between falling edges of CS is

12.5*1μs +2.5*1μs +1*1μs=16μs which is a throughput of 62.5KSPS.

ADC081S101 Transfer Function

The output format of the ADC is straight binary. Code transitions occur midway between successive integer LSB

values. The LSB width for the ADC is VA/256. The ideal transfer characteristic is shown in Figure 20. The

transition from an output code of 0000 0000 to a code of 0000 0001 is at 1/2 LSB, or a voltage of VA/512. Other

code transitions occur at steps of one LSB.

Figure 20. Ideal Transfer Characteristic

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VIN

26 pF

4 pF

Conversion Phase - Switch Open

Track Phase - Switch Closed

MICROPROCESSOR

DSP

SCLK

SDATA

GND

ADC081S101

LP2950 5V

1 PF0.1 PF 0.1 PF1 PF

VIN

ADC081S101

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Typical Application Circuit

A typical application of the ADC is shown in Figure 21. Power is provided in this example by the TI LP2950 low-

dropout voltage regulator, available in a variety of fixed and adjustable output voltages. The power supply pin is

bypassed with a capacitor network located close to the ADC. Because the reference for the ADC is the supply

voltage, any noise on the supply will degrade device noise performance. To keep noise off the supply, use a

dedicated linear regulator for this device, or provide sufficient decoupling from other circuitry to keep noise off the

ADC supply pin. Because of the ADC's low power requirements, it is also possible to use a precision reference

as a power supply to maximize performance. The four-wire interface is also shown connected to a

microprocessor or DSP.

Figure 21. Typical Application Circuit

Analog Input

An equivalent circuit for the ADC's input channel is shown in Figure 22. Diodes D1 and D2 provide ESD

protection for the analog inputs. At no time should any input go beyond (VA+ 300 mV) or (GND −300 mV), as

these ESD diodes will begin conducting, which could result in erratic operation. For this reason, the ESD diodes

should not be used to clamp the input signal.

The capacitor C1 in Figure 22 has a typical value of 4 pF, and is mainly the package pin capacitance. Resistor

R1 is the on resistance of the multiplexer and track / hold switch, and is typically 500Ω. Capacitor C2 is the ADC

sampling capacitor and is typically 26 pF. The ADC will deliver best performance when driven by a low-

impedance source to eliminate distortion caused by the charging of the sampling capacitance. This is especially

important when using the ADC to sample AC signals. Also important when sampling dynamic signals is an anti-

aliasing filter.

Figure 22. Equivalent Input Circuit

Digital Inputs and Outputs

The ADC digital inputs (SCLK and CS) are not limited by the same absolute maximum ratings as the analog

inputs. The digital input pins are instead limited to +5.25V with respect to GND, regardless of VA, the supply

voltage. This allows the ADC to be interfaced with a wide range of logic levels, independent of the supply

voltage.

Product Folder Links: ADC081S101

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SNAS310C –JANUARY 2006–REVISED MARCH 2013

Modes of Operation

The ADC has two possible modes of operation: normal mode, and shutdown mode. The ADC enters normal

mode (and a conversion process is begun) when CS is pulled low. The device will enter shutdown mode if CS is

pulled high before the tenth falling edge of SCLK after CS is pulled low, or will stay in normal mode if CS remains

low. Once in shutdown mode, the device will stay there until CS is brought low again. By varying the ratio of time

spent in the normal and shutdown modes, a system may trade-off throughput for power consumption, with a

sample rate as low as zero.

Normal Mode

The fastest possible throughput is obtained by leaving the ADC in normal mode at all times, so there are no

power-up delays. To keep the device in normal mode continuously, CS must be kept low until after the 10th

falling edge of SCLK after the start of a conversion (remember that a conversion is initiated by bringing CS low).

If CS is brought high after the 10th falling edge, but before the 16th falling edge, the device will remain in normal

mode, but the current conversion will be aborted, and SDATA will return to TRI-STATE (truncating the output

word).

Sixteen SCLK cycles are required to read all of a conversion word from the device. After sixteen SCLK cycles

have elapsed, CS may be idled either high or low until the next conversion. If CS is idled low, it must be brought

high again before the start of the next conversion, which begins when CS is again brought low.

After sixteen SCLK cycles, SDATA returns to TRI-STATE. Another conversion may be started, after tQUIET has

elapsed, by bringing CS low again.

Shutdown Mode

Shutdown mode is appropriate for applications that either do not sample continuously, or it is acceptable to trade

throughput for power consumption. When the ADC is in shutdown mode, all of the analog circuitry is turned off.

To enter shutdown mode, a conversion must be interrupted by bringing CS back high anytime between the

second and tenth falling edges of SCLK, as shown in Figure 23. Once CS has been brought high in this manner,

the device will enter shutdown mode; the current conversion will be aborted and SDATA will enter TRI-STATE. If

CS is brought high before the second falling edge of SCLK, the device will not change mode; this is to avoid

accidentally changing mode as a result of noise on the CS line.

Figure 23. Entering Shutdown Mode

Figure 24. Entering Normal Mode

To exit shutdown mode, bring CS back low. Upon bringing CS low, the ADC will begin powering up (power-up

time is specified in the ADC081S101 Timing Specifications table). This power-up delay results in the first

conversion result being unusable. The second conversion performed after power-up, however, is valid, as shown

in Figure 24.

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If CS is brought back high before the 10th falling edge of SCLK, the device will return to shutdown mode. This is

done to avoid accidentally entering normal mode as a result of noise on the CS line. To exit shutdown mode and

remain in normal mode, CS must be kept low until after the 10th falling edge of SCLK. The ADC will be fully

powered-up after 16 SCLK cycles.

Power Management

The ADC takes time to power-up, either after first applying VA, or after returning to normal mode from shutdown

mode. This corresponds to one "dummy" conversion for any SCLK frequency within the specifications in this

document. After this first dummy conversion, the ADC will perform conversions properly. Note that the tQUIET time

must still be included between the first dummy conversion and the second valid conversion.

When the VAsupply is first applied, the ADC may power up in either of the two modes: normal or shutdown. As

such, one dummy conversion should be performed after start-up, as described in the previous paragraph. The

part may then be placed into either normal mode or the shutdown mode, as described in Normal Mode and

Shutdown Mode.

When the ADC is operated continuously in normal mode, the maximum ensured throughput is fSCLK / 20 at the

maximum specified fSCLK. Throughput may be traded for power consumption by running fSCLK at its maximum

specified rate and performing fewer conversions per unit time, raising the ADC CS line after the 10th and before

the 15th fall of SCLK of each conversion. A plot of typical power consumption versus throughput is shown in the

Typical Performance Characteristics section. To calculate the power consumption for a given throughput, multiply

the fraction of time spent in the normal mode by the normal mode power consumption and add the fraction of

time spent in shutdown mode multiplied by the shutdown mode power consumption. Note that the curve of power

consumption vs. throughput is essentially linear. This is because the power consumption in the shutdown mode

is so small that it can be ignored for all practical purposes.

Power Supply Noise Considerations

The charging of any output load capacitance requires current from the power supply, VA. The current pulses

required from the supply to charge the output capacitance will cause voltage variations on the supply. If these

variations are large enough, they could degrade SNR and SINAD performance of the ADC. Furthermore,

discharging the output capacitance when the digital output goes from a logic high to a logic low will dump current

into the die substrate, which is resistive. Load discharge currents will cause "ground bounce" noise in the

substrate that will degrade noise performance if that current is large enough. The larger the output capacitance,

the more current flows through the die substrate and the greater is the noise coupled into the analog channel,

degrading noise performance.

To keep noise out of the power supply, keep the output load capacitance as small as practical. It is good practice

to use a 100Ωseries resistor at the ADC output, located as close to the ADC output pin as practical. This will

limit the charge and discharge current of the output capacitance and improve noise performance.

Product Folder Links: ADC081S101

ADC081S101

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SNAS310C –JANUARY 2006–REVISED MARCH 2013

REVISION HISTORY

Changes from Revision B (March 2013) to Revision C Page

• Changed layout of National Data Sheet to TI format .......................................................................................................... 16

Product Folder Links: ADC081S101

PACKAGE OPTION ADDENDUM

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Addendum-Page 1

PACKAGING INFORMATION

Orderable Device Status

(1)

Package Type Package

Drawing Pins Package

Qty Eco Plan

(2)

Lead/Ball Finish MSL Peak Temp

(3)

Op Temp (°C) Device Marking

(4/5)

Samples

ADC081S101CIMF/NOPB ACTIVE SOT-23 DBV 6 1000 Green (RoHS

& no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 85 X03C

ADC081S101CIMFX/NOPB ACTIVE SOT-23 DBV 6 3000 Green (RoHS

& no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 85 X03C

ADC081S101CISD/NOPB ACTIVE WSON NGF 6 1000 Green (RoHS

& no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 85 X3C

ADC081S101CISDX/NOPB ACTIVE WSON NGF 6 4500 Green (RoHS

& no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 85 X3C

(1) The marketing status values are defined as follows:

ACTIVE: Product device recommended for new designs.

LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.

NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.

PREVIEW: Device has been announced but is not in production. Samples may or may not be available.

OBSOLETE: TI has discontinued the production of the device.

(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability

information and additional product content details.

TBD: The Pb-Free/Green conversion plan has not been defined.

Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that

lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.

Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between

the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.

Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight

in homogeneous material)

(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation

of the previous line and the two combined represent the entire Device Marking for that device.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information

provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and

PACKAGE OPTION ADDENDUM

www.ti.com 7-Oct-2013

Addendum-Page 2

continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.

TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

TAPE AND REEL INFORMATION

*All dimensions are nominal

Device Package

Type Package

Drawing Pins SPQ Reel

Diameter

(mm)

Reel

Width

W1 (mm)

(mm) B0

(mm) K0

(mm) P1

(mm) W

(mm) Pin1

Quadrant

ADC081S101CIMF/NOPB SOT-23 DBV 6 1000 178.0 8.4 3.2 3.2 1.4 4.0 8.0 Q3

ADC081S101CIMFX/NOP

BSOT-23 DBV 6 3000 178.0 8.4 3.2 3.2 1.4 4.0 8.0 Q3

ADC081S101CISD/NOPB WSON NGF 6 1000 178.0 12.4 2.8 2.5 1.0 8.0 12.0 Q1

ADC081S101CISDX/NOP

BWSON NGF 6 4500 330.0 12.4 2.8 2.5 1.0 8.0 12.0 Q1

PACKAGE MATERIALS INFORMATION

www.ti.com 23-Sep-2013

Pack Materials-Page 1

*All dimensions are nominal

Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)

ADC081S101CIMF/NOPB SOT-23 DBV 6 1000 210.0 185.0 35.0

ADC081S101CIMFX/NOP

BSOT-23 DBV 6 3000 210.0 185.0 35.0

ADC081S101CISD/NOPB WSON NGF 6 1000 210.0 185.0 35.0

ADC081S101CISDX/NOP

BWSON NGF 6 4500 367.0 367.0 35.0

PACKAGE MATERIALS INFORMATION

www.ti.com 23-Sep-2013

Pack Materials-Page 2

MECHANICAL DATA

NGF0006A

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