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74F113
Dual J-K negative edge-triggered
flip-flops without reset
Product specification
IC15 Data Handbook
1991 Feb 14
INTEGRATED CIRCUITS
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops
without reset
2
1996 Mar 14 853–0339 16575
FEATURE
Industrial temperature range available (–40°C to +85°C)
DESCRIPTION
The 74F113, dual negative edge-triggered JK-type flip-flop, features
individual J, K, clock (CP), set (SD) inputs, true and complementary
outputs. The asynchronous SD input, when low, forces the outputs
to the steady state levels as shown in the function table regardless
of the level at the other inputs.
A high level on the clock (CP) input enables the J and K inputs and
data will be accepted. The logic levels at the J and K inputs may be
allowed to change while the CP is high and flip-flop will perform
according to the function table as long as minimum setup and hold
times are observed. Output changes are initiated by the high-to-low
transition of the CP.
PIN CONFIGURATION
14
13
12
11
10
9
87
6
5
4
3
2
1
GND
VCC
SD1
Q1
Q1
J1
CP1
K1
CP0
K0
Q0
J0
SD0
Q0
SF00140
TYPE TYPICAL fmax TYPICAL SUPPLY CURRENT (TOTAL)
74F113 100MHz 15mA
ORDERING INFORMATION
ORDER CODE
DESCRIPTION COMMERCIAL RANGE
VCC = 5V ±10%,
Tamb = 0°C to +70°C
INDUSTRIAL RANGE
VCC = 5V ±10%,
Tamb = –40°C to +85°C
PKG. DWG. #
14-pin plastic DIP N74F113N I74F113N SOT27–1
14-pin plastic SO N74F113D I74F113D SOT108–1
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS DESCRIPTION 74F (U.L.) HIGH/LOW LOAD VALUE HIGH/LOW
J0, J1 J inputs 1.0/1.0 20µA/0.6mA
K0, K1 K inputs 1.0/1.0 20µA/0.6mA
CP0, CP1Clock inputs (active falling edge) 1.0/4.0 20µA/2.4mA
SD0, SD1 Set inputs (active low) 1.0/5.0 20µA/3.0mA
Q0, Q1, Q0, Q1Data outputs 50/33 1.0mA/20mA
NOTE:
One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOGIC SYMBOL
Q0 Q0 Q1 Q1
56 98
VCC = Pin 14
GND = Pin 7
1
4
13
10
CP0
SD0
CP1
SD1
J1 K0
212
SF00141
K1J0
311
IEC/IEEE SYMBOL
3
1
2
4
11
13
12
10
5
6
9
8
1J
2J
C1
C2
1S
1K
2K
2S
SF00142
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops
without reset
1996 Mar 14 3
LOGIC DIAGRAM
VCC = Pin 14
GND = Pin 7
Q
J
CP1, 13
K2, 12
4, 10
5, 9
Q
SD
6, 8
3, 11
SF00143
FUNCTION TABLE
INPUTS OUTPUTS
OPERATING MODE
SD CP J K Q Q
OPERATING
MODE
L X X X H L Asynchronous set
Hh h q q Toggle
Hh l H L Load ”1” (set)
Hl h L H Load ”0” (reset)
Hl l q q Hold ’no change”
NOTES:
H = High-voltage level
h = High-voltage level one setup time prior to high-to-low
clock transition
L = Low-voltage level
l = Low-voltage level one setup time prior to high-to-low clock
transition
q = Lower case indicate the state of the referenced output
prior to the high-to-low clock transition
X = Don’t care
= high-to-low clock transition
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL PARAMETER RATING UNIT
VCC Supply voltage –0.5 to +7.0 V
VIN Input voltage –0.5 to +7.0 V
IIN Input current –30 to +5 mA
VOUT Voltage applied to output in High output state –0.5 to VCC V
IOUT Current applied to output in Low output state 40 mA
T
O
p
erating free air tem
p
erature range
Commercial range 0 to +70 °C
T
amb
Operating
free
-
air
temperat
u
re
range
Industrial range –40 to +85 °C
Tstg Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
MIN NOM MAX
UNIT
VCC Supply voltage 4.5 5.0 5.5 V
VIH High-level input voltage 2.0 V
VIL Low-level input voltage 0.8 V
IIK Input clamp current –18 mA
IOH High-level output current –1 mA
IOL Low-level output current 20 mA
T
O
p
erating free air tem
p
erature range
Commercial range 0 +70 °C
T
amb
Operating
free
-
air
temperat
u
re
range
Industrial range –40 +85 °C
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops
without reset
1996 Mar 14 4
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST
CONDITIONS1
MIN TYP2MAX
UNIT
VO
High level out
p
ut voltage
V
= MIN
V
= MAX
IO= MAX
±10%VCC 2.5 V
V
OH
High
-
le
v
el
o
u
tp
u
t
v
oltage
VIH = MIN
I
OH =
MAX
±5%VCC 2.7 3.4 V
VO
Low level out
p
ut voltage
V
= MIN
V
= MAX
IO= MAX
±10%VCC 0.30 0.50 V
V
OL
Lo
w-
le
v
el
o
u
tp
u
t
v
oltage
VIH = MIN
I
OL =
MAX
±5%VCC 0.30 0.50 V
VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V
IIInput current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA
IIH High-level input current VCC = MAX, VI = 2.7V 20 µA
Jn, Kn –0.6 mA
IIL Low-level input current CPnVCC = MAX, VI = 0.5V –2.4 mA
SDn –3.0 mA
IOS Short-circuit output current3VCC = MAX -60 –150 mA
ICC Supply current4 (total) VCC = MAX 15 21 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. Measure ICC with the clock input grounded and all outputs open, then with Q and Q outputs high in turn.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL PARAMETER TEST
CONDITION
VCC = +5.0V
Tamb = +25°C
CL = 50pF
RL = 500
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF
RL = 500
VCC = +5.0V ± 10%
Tamb = –40°C to +85°C
CL = 50pF
RL = 500
UNIT
MIN TYP MAX MIN MAX MIN MAX
fmax Maximum clock frequency Waveform 1 85 100 80 80 ns
tPLH
tPHL Propagation delay
CPn to Qn or Qn Waveform 1 2.0
2.0 4.0
4.0 6.0
6.0 2.0
2.0 7.0
7.0 2.0
2.0 7.5
7.0 ns
tPLH
tPHL Propagation delay
SDn, to Qn or Qn Waveform 2 2.0
2.0 4.5
4.5 6.5
6.5 2.0
2.0 7.5
7.5 2.0
2.0 8.0
7.5 ns
AC SETUP REQUIREMENTS
LIMITS
SYMBOL PARAMETER TEST
CONDITION
VCC = +5.0V
Tamb = +25°C
CL = 50pF
RL = 500
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF
RL = 500
VCC = +5.0V ± 10%
Tamb = –40°C to +85°C
CL = 50pF
RL = 500
UNIT
MIN TYP MAX MIN MAX MIN MAX
tsu (H)
tsu(L) Setup time, high or low
Jn, Kn to CPnW aveform 1 4.0
3.5 5.0
4.0 5.0
4.5 ns
th (H)
th (L) Hold time, high or low
Jn, Kn to CPnW aveform 1 0.0
0.0 0.0
0.0 0.0
0.0 ns
tw (H)
tw (L) CP pulse width,
high or low W aveform 1 4.5
4.5 5.0
5.0 5.0
5.0 ns
tw (L) SDn pulse width, low Waveform 2 4.5 5.0 5.0 ns
trec Recovery time
SDn to CPn W aveform 2 4.5 5.0 5.0 ns
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops
without reset
1996 Mar 14 5
AC WAVEFORMS
For all waveforms, VM = 1.5V.
The shaded areas indicate when the input is permitted to change for predictable output performance.
tPLH
VM
VM
CPn
VMVMVMVM
VMVM
Jn, Kn
Qn
VM
tw(H)
1/fmax
tsu(L) th(L) = 0
VM
VM
tPLH
Qn
tw(L)
tPHL
tPHL
tsu(H) th(H) = 0
SF00144
Kn
Jn
Jn
Kn
W aveform 1. Propagation Delay for Data to Output, Data Setup Time and Hold Times, and Clock Width,
and Maximum Clock Frequency
VM
CPn
Qn
VM
VM
Qn
tPHL
tPLH
SDn VM
VMtw(L)
trec
Jn, Kn
SF00145
W aveform 2. Propagation Delay for Set to Output, Set Pulse Width, and Recovery Time for Set to Clock
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops
without reset
1996 Mar 14 6
TEST CIRCUIT AND WAVEFORMS
tw90%
VM
10%
90%
VM10%
90%
VM10%
90%
VM
10%
NEGATIVE
PULSE
POSITIVE
PULSE
tw
AMP (V)
0V
0V
tTHL (tf )
INPUT PULSE REQUIREMENTS
rep. rate twtTLH tTHL
1MHz 500ns 2.5ns 2.5ns
Input Pulse Definition
VCC
family
74F
D.U.T.
PULSE
GENERATOR
RL
CL
RT
VIN VOUT
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
RL= Load resistor;
see AC ELECTRICAL CHARACTERISTICS for value.
CL= Load capacitance includes jig and probe capacitance;
see AC ELECTRICAL CHARACTERISTICS for value.
RT= Termination resistance should be equal to ZOUT of
pulse generators.
tTHL (tf )
tTLH (tr )
tTLH (tr )AMP (V)
amplitude
3.0V 1.5V
VM
SF00006
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops without reset
1996 Mar 14 7
DIP14: plastic dual in-line package; 14 leads (300 mil) SOT27-1
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops without reset
1996 Mar 14 8
SO14: plastic small outline package; 14 leads; body width 3.9 mm SOT108-1
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops without reset
1996 Mar 14 9
NOTES
Philips Semiconductors Product specification
74F113
Dual J-K negative edge-triggered flip-flops without reset
yyyy mmm dd 10
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may af fect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print code Date of release: 10-98
Document order number: 9397-750-05072
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
Data sheet
status
Objective
specification
Preliminary
specification
Product
specification
Product
status
Development
Qualification
Production
Definition [1]
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
Data sheet status
[1] Please consult the most recently issued datasheet before initiating or completing a design.