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IXGR 32N170AH1
Symbol Test Conditions Characteristic Values
(TJ = 25°C unless otherwise specified)
min. typ. max.
gfs IC= IT VCE = 10 V, Note 2 16 26 S
Cies 3670 pF
Coes VCE = 25 V, VGE = 0 V, f = 1 MHz 215 pF
Cres 44 pF
Qg155 nC
Qge IC = IT VGE = 15 V, VCE = 0.5 VCES 26 nC
Qgc 56 nC
td(on) 46 ns
tri 57 ns
td(off) 260 500 ns
tfi 50 100 ns
Eoff 1.5 2.6 mJ
td(on) 48 ns
tri 59 ns
Eon 5.0 mJ
td(off) 300 ns
tfi 70 ns
Eoff 2.4 mJ
RthJC 0.65 K/W
RthCK 0.15 K/W
Inductive load, TJ = 125°°
°°
°C
IC = IT, VGE = 15 V
RG = 2.7 Ω, VCE = 0.8 VCES
Note 4
Inductive load, TJ = 25°°
°°
°C
IC = IT, VGE = 15 V
RG = 2.7 Ω, VCE = 0.8 VCES
Note 4
Notes: 1. Device must be heatsunk for high temperature leakage current
measurements to avoid thermal runaway.
2. Pulse test, t ≤ 300 µs, duty cycle ≤ 2 %
3. Test current IT = 21 A
4. Switching times may increase for VCE (Clamp) > 0.8 • VCES, higher TJ or
increased RG.
5. See IXGH32N170A datasheets for additional IGBT characteristics.
ISOPLUS247 Outline
Reverse Diode (FRED) Characteristic Values
(TJ = 25°C unless otherwise specified)
Symbol Test Conditions min. typ. max.
VFIF = 20A, VGE = 0 V, Note 2 2.85 V
TJ = 150°C 2.9 V
VTO For conduction power losses only 2.1 V
rFO TJ = 150°C40mΩ
IRM IF = 20A, VGE = 0 V, VR = 1200 V 23 A
-diF/dt = 450 A/µsT
J = 125°C27 A
trr 230 ns
TJ = 125°C 400 ns
RthJC 1.5 K/W