CY54/74FCT373T
CY54/74FCT573T
2
Maximum Ratings[2, 3]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–65°C to +135°C
Supply Voltage t o Ground Potential ...............–0.5V to +7.0V
DC Input Voltage .. .............. ............................ –0. 5V to +7.0V
DC Output Volta ge .........................................–0. 5V to +7.0V
DC Output Current (Maximum Sink Cur rent/ Pin) ...... 120 mA
Power Dissipation. .........................................................0.5W
Static Discharge Voltage...........................................>2001V
(per MIL-STD-883, Method 3015)
Function Table[1]
Inputs Outputs
OE LE D O
L H H H
L H L L
L L X Q0
H X X Z Operating Range
Range Range Ambient
Temperature VCC
Commercial DT 0°C to +70°C 5V ± 5%
Commercial T, AT, CT –40°C to +85°C 5V ± 5%
Military[4] All –55°C to +125°C 5V ± 10%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
VOH Output HIGH Volt a ge VCC=Min., IOH= –32 mA Com’l 2.0 V
VCC=Min., IOH=–15 mA Com’l 2.4 3.3 V
VCC=Min., IOH=–12 mA Mil 2.4 3.3 V
VOL Output LOW Voltage VCC=Min., IOL=64 mA Com’l 0.3 0.55 V
VCC=Min., IOL=32 mA Mil 0.3 0.55 V
VIH Input HIGH Voltage 2.0 V
VIL Input LOW Voltage 0.8 V
VHHysteresis[6] All inputs 0.2 V
VIK Input Clamp Diode Voltage VCC=Min., IIN=–18 mA –0.7 –1.2 V
IIInput HIGH Current VCC=Max., VIN=VCC 5µA
IIH Input HIGH Current VCC=Max., VIN=2.7V ±1µA
IIL Input LOW Current VCC=Max., VIN=0.5V ±1µA
IOZH Off State HIGH-Level Output
Current VCC=Max., VOUT=2.7V 10 µA
IOZL Off State LOW-Level
Output Current VCC=Max., V OUT=0.5V –10 µA
IOS Output Short Circuit Curre nt[7] VCC=Max., VOUT=0.0V –60 –120 –225 mA
IOFF Power-Off Disable VCC=0V, VOUT=4.5V ±1µA
Notes:
1. H = HIGH Voltage Level
L = LO W Voltage Level
X = Don’t Care
Z = HIGH Impedance
Qn = Previous state o f flip flops (Qn-1)
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unuse d inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
4. TA is the “instant on” case temperature.
5. Typical values are at VCC=5.0V, TA=+25°C ambient.
6. This parameter is guaranteed but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one s econd. The use of high-speed test apparatus and/or sample
and hold tec hniques are preferable in order to min imize internal chip heating and more accurately reflec t operational values. O therwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.