CY74FCT16245T/2245T
CY74FCT16445T/2H245
3
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
VIH Input HIGH Voltage 2.0 V
VIL Input LOW Voltage 0.8 V
VHInput Hyst eresi s[6] 100 mV
VIK Input Clamp Diode Voltage VCC=Min., IIN=–18 mA –0.7 –1.2 V
IIH Input HIGH Curr ent Standard VCC=Max., VI=VCC ±1µA
Bus Hold ±100
IIL Input LOW Current Standard VCC=Max., VI=GND ±1µA
Bus Hold ±100 µA
IBBH
IBBL Bus Hold Sustai n Current on Bus Hold Input[7] VCC=Min. VI=2.0V –50 µA
VI=0.8V +50
IBHHO
IBHLO Bus Hold Ov erdrive Curr ent on Bus Hold Input[7] VCC=Max., VI=1.5V TBD mA
IOZH High Impedance Output Current
(Three- State Out put pins) VCC=Max., VOUT=2.7V ±1µA
IOZL High Impedance Output Current
(Three- State Out put pins) VCC=Max., VOUT=0.5V ±1µA
IOS Short Circuit Current[8] VCC=Max., VOUT=GND –80 –140 –200 mA
IOOutput Drive Current[8] VCC=Max., VOUT=2.5V –50 –180 mA
IOFF Power-O ff D isabl e VCC=0V, VOUT≤4.5V[9] ±1µA
Output Drive Characteristics for CY74FCT16245T, CY74FCT16445T
Parameter Description Test Conditi ons Min. Typ.[5] Max. Unit
VOH Output HI GH Voltage VCC=Min., IOH=–3 mA 2.5 3.5 V
VCC=Min., IOH=–15 mA 2.4 3.5 V
VCC=Min., IOH=–32 mA 2.0 3.0 V
VOL Output LOW Voltage VCC=Min., IOL=64 mA 0.2 0.55 V
Output Drive Characteristics for CY74FCT162245T, CY74FCT162H245T
Parameter Description Test Conditi ons Min. Typ.[5] Max. Unit
IODL Output LOW Current[8] VCC=5V, VIN=VIH or VIL, VOUT=1.5V 60 115 150 mA
IODH Output HIGH Current[8] VCC=5V, VIN=VIH or VIL, VOUT=1.5V –60 –115 –150 mA
VOH Output HI GH Voltage VCC=Min., IOH=–24 mA 2.4 3.3 V
VOL Output LOW Voltage VCC=Min., IOL=24 mA 0.3 0.55 V
Notes:
5. Typical values are at VCC=5.0V, TA=+25°C ambient.
6. This parameter is guaranteed but not tested.
7. Pins with bus hold are described in Pin Description.
8. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorti ng of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
9. Tested at +25°C.