1
®
FN9155.5
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 |Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2004, 2005, 2007. All Rights Reserved
All other trademarks mentioned are the property of their respective owners.
ISL6614
Dual Advanced Synchronous Rectified
Buck MOSFET Drivers with Protection
Features
The ISL6614 integrates two ISL6613 MOSFET drivers and is
specifically designed to drive two independent power
channels in a Multi-Phase interleaved buck converter
topology. These drivers combined with HIP63xx or ISL65xx
Multi-Phase Buck PWM controllers and N-Channel
MOSFETs form complete core-voltage regulator solutions for
advanced microprocessors.
The ISL6614 drives both the upper and lower gates
simultaneously over a range from 5V to 12V. This drive
voltage provides the flexibility necessary to optimize
applications involving trade-offs between gate charge and
conduction losses.
An advanced adaptive zero shoot-through protecti on is
integrated to prevent both the upper and lower MOSFETs
from conducting simultaneously and to minimize th e dead
time. These products add an overvoltage protecti on feature
operational before VCC exceeds its turn-on threshold, at
which the PHASE node is connected to the gate of the low
side MOSFET (LGATE). The output voltage of the converter
is then limited by the threshold of the low side MOSFET,
which provides some protection to the microprocessor if the
upper MOSFET(s) is shorted during startup. The over-
temperature protection featur e prevents failures resulting
from excessive power dissipation by shutting off the outputs
when its junction temperature exceeds +150°C (typically).
The driver resets once its junction temperature returns to
+108°C (typically).
The ISL6614 also featu r es a three- state PWM input which,
working together with Intersil’s multi-phase PWM controllers,
prevents a negative transient on the output voltage when the
output is shut down. This feature elimi n at es the Schottky
diode that is used in some systems for protecting the load
from reversed output voltage events.
Features
Pin-to-pin Compatible with HIP6602 SOIC Family for
Better Performance and Extra Protection Features
Quad N-Channel MOSFET Drives for Two Synchronous
Rectified Bridges
Advanced Adaptive Zero Shoot-T hrough Protection
- Body Diode Detection
- Auto-zero of rDS(ON) Conduction Offset Effect
Adjustable Gate Voltage (5V to 12V) for Optimal Efficiency
Internal Bootstrap Schottky Diode
Bootstrap Capacitor Overcharging Prevention
Supports High Switching Frequency (u p to 1MHz)
- 3A Sinking Current Capability
- Fast Rise/F all Times and Low Propagation Delays
Three-State PWM Input for Output Stage Shutdown
Three-State PWM Input Hysteresis for Applications With
Power Sequencing Requirement
Pre-POR Overvoltage +Protection
VCC Undervoltage Protection
Over-Temperature Protection (OTP) with +42°C Hysteresis
Expandable Bottom Copper Pad for Enhanced Heat Sinking
QFN Package:
- Compliant to JEDEC PUB95 MO-220 QFN - Quad Flat
No Leads - Package Outline
- Near Chip Scale Package Foo tp r int, which Improves
PCB Efficiency and has a Thinner Profile
Pb-free Available (RoHS compliant)
Applications
Core Regulators for Intel® and AMD® Microprocessors
High Current DC/DC Converters
High Frequency and High Efficiency VRM and VRD
Related Literature
Technical Brief TB363 “Guidelines for Handling and
Processing Moisture Sensitive Surface Mo unt Devices
(SMDs)”
Technical Brief 400 and 417 for Power Train Design,
Layout Guidelines, and Feedba ck Compensation Design
Data Sheet May 5, 2008
2FN9155.5
May 5, 2008
ISL6614
ISL6614CB, ISL6614CBZ, ISL6614IB
(14 LD SOIC)
TOP VIEW
ISL6614CR, ISL6614CRZ, ISL6614IR, ISL6614IRZ
(16 LD QFN)
TOP VIEW
Ordering Information
PART NUMBER PART MARKING TEMP. RANGE (°C) PACKAGE PKG. DWG. #
ISL6614CB* ISL6614CB 0 to +85 14 Ld SOIC M14.15
ISL6614CBZ* (Note) 6614CBZ 0 to +85 14 Ld SOIC (Pb-free) M14.15
ISL6614CBZA* (Note) 6614CBZ 0 to +85 14 Ld SOIC (Pb-free) M14.15
ISL6614CR* ISL 6614CR 0 to +85 16 Ld 4x4 QFN L16.4x4
ISL6614CRZ* (Note) 66 14CRZ 0 to +85 16 Ld 4x4 QFN (Pb-free) L16.4x4
ISL6614CRZA* (Note) 66 14CRZ 0 to +85 16 Ld 4x4 QFN (Pb-free) L16.4x4
ISL6614IB* ISL6614IB -40 to +85 14 Ld SOIC M14.15
ISL6614IBZ* (Note) 6614IBZ -40 to +85 14 Ld SOIC (Pb-free) M14.15
ISL6614IR* ISL 6614IR -40 to +85 16 Ld 4x4 QFN L16.4x4
ISL6614IRZ* (Note) 66 14IRZ -40 to +85 16 Ld 4x4 QFN (Pb-free) L16.4x4
*Add “-T” suffix for tape and reel. Please refer to TB347 for details on reel specifications.
NOTE: These Intersil Pb-free plastic packaged products employ special Pb-free material sets; molding compounds/die attach materials and 100%
matte tin plate PLUS ANNEAL - e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations.
Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J
STD-020.
PWM1
PWM2
GND
LGATE1
1
2
3
4
14
13
12
PHASE1
UGATE1
BOOT1
PVCC
1
2
10
9
87
6
5BOOT2
UGATE2
PHASE2
VCC
PGND
LGATE2
11 1
3
4
15
GND
LGATE1
PVCC
PGND
PWM2
PWM1
VCC
PHASE1
16 14 13
2
12
10
9
11
6578
UGATE1
BOOT1
BOOT2
UGATE2
NC
LGATE2
PHASE2
NC
GND
3FN9155.5
May 5, 2008
Block Diagram
FOR ISL6614CR, THE PAD ON THE BOTTOM SIDE OF
THE QFN PACKAGE MUST BE SOLDERED TO THE CIRCUIT’S GROUND.
PRE-POR OVP
FEATURES
OTP AND
VCC
PWM1
+5V
10k
8k
CONTROL
LOGIC
SHOOT-
THROUGH
PROTECTION
BOOT1
UGATE1
PHASE1
LGATE1
PGND
PWM2
10k
8k SHOOT-
THROUGH
PROTECTION
BOOT2
UGATE2
PHASE2
LGATE2
+5V
GND
PVCC
PVCC
PGND
PGND
PAD
CHANNEL 1
CHANNEL 2
PVCC
PVCC
ISL6614
4FN9155.5
May 5, 2008
Typical Application - 4 Channel Converter Using ISL65xx and ISL6614 Gate Drivers
MAIN
CONTROL
ISL65xx
FB
+5V
COMP
PWM1
PWM2
ISEN2
PWM3
PWM4
ISEN4
VSEN
FS/DIS
ISEN1
ISEN3
GND
BOOT2
UGATE2
PHASE2
LGATE2
BOOT1
UGATE1
PHASE1
LGATE1
PWM1
PVCC
5V TO 12V
VCC
DUAL
DRIVER
ISL6614
BOOT2
UGATE2
PHASE2
LGATE2
BOOT1
UGATE1
PHASE1
LGATE1
PWM1
PVCC
VCC
DUAL
DRIVER
ISL6614
VCC
+VCORE
PWM2
PWM2
EN
VID
PGOOD
+12V
+12V
+12V
+12V
+12V
5V TO 12V
+12V
PGNDGND
PGNDGND
ISL6614
5FN9155.5
May 5, 2008
Absolute Maximum Ratings Thermal Information
Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15V
Supply Voltage (PVCC) . . . . . . . . . . . . . . . . . . . . . . . . . VCC + 0.3V
BOOT Voltage (VBOOT-GND). . . . . . . . . . . . . . . . . . . . . . . . . . . .36V
Input Voltage (VPWM) . . . . . . . . . . . . . . . . . . . . . .GND - 0.3V to 7V
UGATE. . . . . . . . . . . . . . . . . . . VPHASE - 0.3VDC to VBOOT + 0.3V
VPHASE - 3.5V (<100ns Pulse Width, 2µJ) to VBOOT + 0.3V
LGATE . . . . . . . . . . . . . . . . . . . . . . GND - 0.3VDC to VPVCC + 0.3V
GND - 5V (<100ns Pulse Width, 2µJ) to VPVCC + 0.3V
PHASE. . . . . . . . . . . . . . . . . . . . . . . . . . . . GND - 0.3VDC to 15VDC
GND - 8V (<400ns, 20µJ) to 30V (<200ns, VBOOT -GND <36V)
ESD Rating
Human Body Model . . . . . . . . . . . . . . . . . . . .Class I JEDEC STD
Thermal Resistance (Typical) . . . . . . . . . . θJA(°C/W) θJC(°C/W)
SOIC Package (Note 1) . . . . . . . . . . . . 90 N/A
QFN Package (Notes 2, 3). . . . . . . . . . 44 4.5
Maximum Junction Temperature (Plastic Package) . . . . . . .+150°C
Maximum Storage Temperature Range. . . . . . . . . .- 65°C to +150°C
Pb-free reflow profile . . . . . . . . . . . . . . . . . . . . . . . . . .see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
Recommended Operating Conditions
Ambient Temperature Range. . . . . . . . . . . . . . . . . . .-40°C to +85°C
Maximum Operating Junction Temperature. . . . . . . . . . . . . +125°C
Supply Voltage, VCC. . . . . . . . . . . . . . . . . . . . . . . . . . . . .12V ±10%
Supply Voltage Range, PVCC . . . . . . . . . . . . . . . . 5V to 12V ±10%
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
NOTES:
1. θJA is measured with the component mounted on a high effective thermal conductivity test board in free air.
2. θJA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See
Tech Brief TB379.
3. For θJC, the “case temp” location is the center of the exposed metal pad on the package underside.
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Noted.
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
VCC SUPPLY CURRENT
Bias Supply Current IVCC fPWM = 300kHz, VPVCC = 12V - 7.1 - mA
Gate Drive Bias Current IPVCC fPWM = 300kHz, VPVCC = 12V - 9.7 - mA
POWER-ON RESET AND ENABLE
VCC Rising Threshold 0°C to +85°C 9.35 9.80 10.05 V
-40°C to +85°C 8.35 - 10.05 V
VCC Falling Threshold 0°C to +85°C 7.35 7.60 8.00 V
-40°C to +85°C 6.35 - 8.00 V
PWM INPUT (See “TIMING DIAGRAM” on page 8)
Input Current IPWM VPWM = 5V - 450 - µA
VPWM = 0V - -400 - µA
PWM Rising Threshold VCC = 12V - 3.00 - V
PWM Falling Threshold VCC = 12V - 2.00 - V
Typical Three-State Shutdown Window VCC = 12V 1.80 - 2.40 V
Three-State Lower Gate Falling Threshold VCC = 12V - 1.50 - V
Three-State Lower Gate Rising Threshold VCC = 12V - 1.00 - V
Three-State Upper Gate Rising Threshold VCC = 12V - 3.20 - V
Three-State Upper Gate Falling Threshold VCC = 12V - 2.60 - V
Shutdown Hold-off Time tTSSHD - 245 - ns
UGATE Rise Time tRU VPVCC = 12V, 3nF Load, 10% to 90% - 26 - ns
LGATE Rise Time tRL VPVCC = 12V, 3nF Load, 10% to 90% - 18 - ns
UGATE Fall Time tFU VPVCC = 12V, 3nF Load, 90% to 10% - 18 - ns
LGATE Fall Time tFL VPVCC = 12V, 3nF Load, 90% to 10% - 12 - ns
UGATE Turn-On Propagation Delay (Note 4) tPDHU VPVCC = 12V, 3nF Load, Adaptive - 10 - ns
ISL6614
6FN9155.5
May 5, 2008
LGATE Turn-On Propagation Delay (Note 4) tPDHL VPVCC = 12V, 3nF Load, Adaptive - 10 - ns
UGATE Turn-Off Propagation Delay (Note 4) tPDLU VPVCC = 12V, 3nF Load - 10 - ns
LGATE Turn-Off Propagation Delay (Note 4) tPDLL VPVCC = 12V, 3nF Load - 10 - ns
LG/UG Three-State Propagation Delay (Note 4) tPDTS VPVCC = 12V, 3nF Load - 10 - ns
OUTPUT (Note 4)
Upper Drive Source Current IU_SOURCE VPVCC = 12V, 3nF Load - 1.25 - A
Upper Drive Source Impedance RU_SOURCE 150mA Source Current 1.4 2.0 3.0 Ω
Upper Drive Sink Current IU_SINK VPVCC = 12V, 3nF Load 2 - A
Upper Drive Transition Sink Impedance RU_SINK_TR -1.32.2Ω
Upper Drive DC Sink Impedance RU_SINK_DC 150mA Source Current 0.9 1.65 3.0 Ω
Lower Drive Source Current IL_SOURCE VPVCC = 12V, 3nF Load - 2 - A
Lower Drive Source Impedance RL_SOURCE 150mA Source Current 0.85 1.3 2.2 Ω
Lower Drive Sink Current IL_SINK VPVCC = 12V, 3nF Load - 3 - A
Lower Drive Sink Impedance RL_SINK 150mA Sink Current 0.60 0.94 1.35 Ω
OVER-TEMPERATURE SHUTDOWN
Thermal Shutdown Setpoint - 150 - °C
Thermal Recovery Setpoint - 108 - °C
NOTES:
4. Limits should be considered typical and are not production tested.
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Noted. (Continued)
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
ISL6614
7FN9155.5
May 5, 2008
Functional Pin Description
PACKAGE PIN
NUMBER PIN
SYMBOL FUNCTIONSOIC DFN
1 15 PWM1 The PWM signal is the control input for the Channel 1 driver . The PWM signal can enter three distinct states during
operation, see “Three-S tate PWM Input” on page 8 for further details. Connect this pin to the PWM output of the
controller.
2 16 PWM2 The PWM signal is the control input for the Channel 2 driver . The PWM signal can enter three distinct states during
operation, see see “Three-S t ate PWM Input” on page 8 for further details. Connect this pin to the PWM output of the
controller.
3 1 GND Bias and reference ground. All signals are referenced to this node.
4 2 LGATE1 Lower gate drive output of Channel 1. Connect to gate of the low-side power N-Channel MOSFET.
5 3 PVCC This pin supplies power to both the lower and higher gate drives in ISL6614. Its operating range is +5V to 12V.
Place a high quality low ESR ceramic capacitor from this pin to GND.
6 4 PGND It is the power ground return of both low gate drivers.
- 5, 8 N/C No Connection.
7 6 LGATE2 Lower gate drive output of Channel 2. Connect to gate of the low-side power N-Channel MOSFET.
8 7 PHASE2 Connect this pin to the SOURCE of the upper MOSFET and the DRAIN of the lower MOSFET in Channel 2. This
pin provides a return path for the upper gate drive.
9 9 UGATE2 Upper gate drive output of Channel 2. Connect to gate of high-side power N-Channel MOSFET.
10 10 BOOT2 Floating bootstrap supply pin for the upper gate drive of Channel 2. Connect the bootstrap capacitor between this
pin and the PHASE2 pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET. See the
“Internal Bootstrap Device” on page 9 for guidance in choosing the capacitor value.
11 11 BOOT1 Floating bootstrap supply pin for the upper gate drive of Channel 1. Connect the bootstrap capacitor between this
pin and the PHASE1 pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET. See “Internal
Bootstrap Device” on page 9 for guidance in choosing the capacitor value.
12 12 UGATE1 Upper gate drive output of Channel 1. Connect to gate of high-side power N-Channel MOSFET.
13 13 PHASE1 Connect this pin to the SOURCE of the upper MOSFET and the DRAIN of the lower MOSFET in Channel 1. This
pin provides a return path for the upper gate drive.
14 14 VCC Connect this pin to a +12V bias supply. It supplies power to internal analog circuits. Place a high quality low ESR
ceramic capacitor from this pin to GND.
- 17 PAD Connect this pad to the power ground plane (GND) via thermally enhanced connection.
ISL6614
8FN9155.5
May 5, 2008
Description
Operation
Designed for versatility and speed, the ISL6614 MOSFET
driver controls both high-side and low-side N-Channel FETs
of two half-bridge power trains from two externally provided
PWM signals.
Prior to VCC exceeding its POR level, the Pre-POR
overvoltage protection function is activated; the upper gate
(UGATE) is held low and the lower gate (LGATE), controlled by
the Pre-POR overvoltage protection circuits, is connected to the
PHASE. Once the VCC volt a ge surpasses the VCC Rising
Threshold (See “Electrical S pecifications” table on page 5), the
PWM signal takes control of gate transitions. A rising edge on
PWM initiates the turn-off of the lower MOSFET (see “TIMING
DIAGRAM” on page 8). After a short propagation delay [tPDLL],
the lower gate begins to fall. T ypical fall times [tFL] are provided
in the “Electrical Specifications” table on p age 5. Adaptive
shoot-through circuitry monitors the PHASE voltage and
determines the upper gate delay time [tPDHU]. This prevent s
both the lower and upper MOSFETs from conducting
simultaneously. Once this delay period is complete, the upper
gate drive begins to rise [tRU] and the upper MOSFET turns on.
A falling transition on PWM results in the turn-off of the upper
MOSFET and the turn-on of the lower MOSFET. A short
propagation delay [tPDLU] is encountered before the upper gate
begins to fall [tFU]. Again, the adaptive shoot-through circuitry
determines the lower gate delay time, tPDHL. The PHASE
voltage and the UGATE voltage are monitored, and the lower
gate is allowed to rise after PHASE drop s below a level or the
voltage of UGATE to PHASE reaches a level depending upon
the current direction (See the following section for details). The
lower gate then rises [tRL], turning on the lower MOSFET.
Advanced Adaptive Zero Shoot-Through Deadtime
Control (Patent Pending)
These drivers incorporate a unique adaptive deadtime control
technique to minimize deadtime, resulting in high efficiency
from the reduced freewheeling time of the lower MOSFETs’
body-diode conduction, and to prevent the upper and lower
MOSFETs from conducting simultaneously. This is
accomplished by ensuring either rising gate turns on its
MOSFET with minimum and sufficient delay after the other has
turned off.
During turn-off of the lower MOSFET, the PHASE voltage is
monitored until it reaches a -0.2V/+0.8V trip point for a
forward/reverse current, at which time the UGATE is released
to rise. An auto-zero comparato r is used to correct the
rDS(ON) d rop in the pha se volt ag e preventing from false
detection of the -0.2V phase level during rDS(ON) conduction
period. In the case of zero current, the UGATE is released
after 35ns delay of the LGATE dropping below 0.5V. During
the phase detection, the disturbance of LGATE’s falling
transition on the PHASE node is blanked out to prevent falsely
tripping. Once the PHASE is high, the advanced adaptive
shoot-through circuitry monitors the PHASE and UGATE
voltages du ring a PWM fall ing edge and the subsequent
UGATE turn-off. If either the UGATE falls to less than 1.75V
above the PHASE or the PHASE falls to less than +0.8V, the
LGATE is released to turn on.
Three-State PWM Input
A unique feature of these drivers and other Intersil drivers is
the addition of a shutdown window to the PWM input. If the
PWM signal enters and remains within the shutdown window
for a set holdoff time, the driver outputs are disabled and
both MOSFET gates are pulled and held low . The shutdown
state is removed when the PWM signal moves outside the
shutdown window. Oth erwise, the PWM rising and falling
thresholds outlined in the “Electrical Specificationstable on
page 5 determine when the lower and upper gates are
enabled.
This feature helps prevent a negative transient on the output
voltage when the output is shut down, eliminating the
PWM
UGATE
LGATE
tFL
tPDHU
tPDLL
tRL tTSSHD
tPDTS
tPDTS
1.5V<PWM<3.2V 1.0V<PWM<2.6V
tFU
tRU
tPDLU
tPDHL
tTSSHD
FIGURE 1. TIMING DIAGRAM
ISL6614
9FN9155.5
May 5, 2008
Schottky diode that is used in some systems for protecting
the load from reversed output voltage events.
In addition, more than 400mV hysteresis also incorporates
into the three-state shutdown window to eliminate PWM
input oscill a ti on s due to the capacitive load seen by the
PWM input through the body diode of the controllers PWM
output when the power-up and/or power -down sequence of
bias supplies of the driver and PWM controller are required.
Power-On Reset (POR) Fun ction
During initial startup, the VCC voltage rise is monitored.
Once the rising VCC voltage exceeds 9.8V (typically),
operation of the driver is enabled and the PWM input signal
takes control of the gate drives. If VCC drops below the
falling threshold of 7.6V (typically), operation of the driver is
disabled.
Pre-POR Overvoltage Protection
Prior to VCC exceeding its POR level, the upper gate is held
low and the lower gate is controlled by th e overvoltage
protection circuits during initial startup. The PHASE is
connected to the gate of the low side MOSFET (LGATE),
which provides some protection to the microprocessor if the
upper MOSFET(s) is shorted during initial startup. For
complete protection, the low side MOSFET should have a
gate threshold well below the maximum voltage rating of the
load/microprocessor.
When VCC drops below its POR level, both gates pull low
and the Pre-POR overvoltage protection circuits are not
activated until VCC resets.
Internal Bootstra p De vi ce
Both drivers feature an internal bootstrap Schottky diode.
Simply adding an external capacitor across the BOOT and
PHASE pins completes the bootstrap circuit. The bootstrap
function is also designed to prevent the bootstrap capacitor
from overcharging due to the large negative swing at the
trailing-edge of the PHASE node. This reduces voltage
stress on the boot to phase pins.
The bootstrap capacitor must have a maximum voltage
rating above UVCC + 5V and its capacitance value can be
chosen from Equation 1:
where QG1 is the amount of gate charge per upper MOSFET
at VGS1 gate-source voltage and NQ1 is the number of control
MOSFETs per channel. The ΔVBOOT_CAP term is defined as
the allowable droop in the rail of the upper gate drive.
As an example, suppose two IRLR7821 FETs are chosen as
the upper MOSFETs. The gate charge, QG, from the data
sheet is 10nC at 4.5V (VGS) gate-source voltage. Then the
QGATE is calculated to be 53nC for PVCC = 12V. We will
assume a 200mV droop in drive voltage over the PWM
cycle. We find that a bootstrap capacitance of at least
0.267µF is required.
Gate Drive Voltage Versatility
The ISL6614 provides the user flexibility in choosing the
gate drive voltage for efficiency optimization. The ISL6614
ties the upper and lower drive rails together . Simply applying
a voltage from 5V up to 12V on PVCC sets both gate drive
rail voltages simultaneously. Connecting a SOT-23 package
type of dual Schottky diodes from the VCC to BOOT1 and
BOOT2 can bypass the internal bootstrap devices of both
upper gates so that the part can operate as a dual ISL6612
driver, which has a fixed VCC (12V typically) on the upper
gate and a programmable lower gate drive voltage.
Over-Temperature Protection (OTP)
When the junction temperature of the IC exceeds +150°C
(typically), both upper and lower gates turn off. The driver
stays off and does not return to normal operation until its
junction temperature comes down below +108°C (typically).
For high frequency applications, applying a lower voltage to
PVCC helps reduce the power dissipation and lower the
junction temperature of the IC. This method reduces the risk
of tripping OTP.
Power Dissipation
Package powe r dis s ipation is mainl y a function of the
switching frequency (fSW), the output drive impedance, the
external gate resistance, and the selected MOSFET’s
internal gate resistance and total gate charge. Calculating
the power dissipation in the driver for a desired application is
critical to ensure safe operation. Exceeding the maximum
allowable power dissipation level will push the IC beyond the
maximum recommended operating junction temperature of
+125°C. The maximum allowa ble IC power dissipation for
CBOOT_CAP QGATE
ΔVBOOT_CAP
--------------------------------------
QGATE QG1 PVCC
VGS1
------------------------------------NQ1
=
(EQ. 1)
50nC
20nC
FIGURE 2. BOOTSTRAP CAP ACIT ANCE vs BOOT RIPPLE
VOLTAGE
ΔVBOOT_CAP (V)
CBOOT_CAP (µF)
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0 0.30.0 0.1 0.2 0.4 0.5 0.6 0.90.7 0.8 1.0
QGATE = 100nC
ISL6614
10 FN9155.5
May 5, 2008
the SO14 package is approximately 1W at room
temperature, while the power dissipation capacity in the
QFN packages, with an exposed heat escape pad, is around
2W. See “Layout Considerations” on page 10 for thermal
transfer improvement sugge stions. When designing the
driver into an application, it is recommended that the
following calculation is used to ensure safe operation at the
desired frequency for the selected MOSFETs. The total gate
drive power losses due to the gate charge of MOSFETs and
the driver’s internal circuitry and their corresponding average
driver current can be estimated using Equations 2 and 3,
respectively:
where the gate charge (QG1 and QG2) is defined at a
particular gate to source voltage (VGS1and VGS2) in the
corresponding MOSFET datasheet; IQ is the driver’s total
quiescent current with no load at both drive outputs; NQ1
and NQ2 are number of upper and lower MOSFETs,
respectively; PVCC is the drive voltages for both upper and
lower FETs, respectively. The IQ*VCC product is the
quiescent power of the driver without capacitive load and is
typically 200mW at 300kHz.
The tot a l gate drive power losses are dissipated amon g the
resistive components along the transition path. The drive
resistance dissipates a portion of the total gate drive power
losses, the rest will be dissipated by the external gate
resistors (RG1 and RG2) and the internal gate resistors
(RGI1 and RGI2) of MOSFETs. Figures 3 and 4 show the
typical upper and lower gate drives turn-on transition path.
The power dissipation on the driver can be roughly
estimated as:
Layout Considerations
For heat spreading, place copper underneath the IC whether
it has an exposed pad or not. The copper area can be
extended beyond the bottom area of the IC and/or
connected to buried copper plane(s) with thermal vias. This
combination of vias for vertical heat escape, extended
copper plane, and buried planes fo r heat spreading allows
the IC to achieve its full thermal potential.
Place each channel power component as close to each
other as possible to reduce PCB copper losses and PCB
parasitics: shortest distance between DRAINs of upper FETs
and SOURCEs of lower FETs; shortest distance between
DRAINs of lower FETs and the power ground. Thus, smaller
amplitudes of positive and negative ringing are on the
switching edges of the PHASE node. However, some space
in between the power components is required for good
airflow. The traces from the drivers to the FETs should be
kept short and wide to reduce the inductance of the traces
and to promote clean drive signals.
PQg_TOT 2P
Qg_Q1
2P
Qg_Q2
IQVCC++=(EQ. 2)
PQg_Q1 QG1 PVCC2
VGS1
---------------------------------------FSW
NQ1
=
PQg_Q2 QG2 PVCC2
VGS2
---------------------------------------FSW
NQ2
=
IDR QG1 NQ1
VGS1
------------------------------QG2 NQ2
VGS2
------------------------------
+
⎝⎠
⎜⎟
⎛⎞
FSW 2IQ
+=
(EQ. 3)
PDR 2PDR_UP 2PDR_LOW IQVCC++=(EQ. 4)
PDR_UP RHI1
RHI1 REXT1
+
-------------------------------------- RLO1
RLO1 REXT1
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
PQg_Q1
2
---------------------
=
PDR_LOW RHI2
RHI2 REXT2
+
-------------------------------------- RLO2
RLO2 REXT2
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
PQg_Q2
2
---------------------
=
REXT1 RG1 RGI1
NQ1
-------------
+= REXT2 RG2 RGI2
NQ2
-------------
+=
FIGURE 3. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
FIGURE 4. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
Q1
D
S
G
RGI1
RG1
BOOT
RHI1 CDS
CGS
CGD
RLO1
PHASE
PVCC
PVCC
Q2
D
S
G
RGI2
RG2
RHI2 CDS
CGS
CGD
RLO2
ISL6614
11 FN9155.5
May 5, 2008
ISL6614
Quad Flat No-Lead Plastic Package (QFN)
Micro Lead Frame Plastic Package (MLFP)
L16.4x4
16 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE
(COMPLIANT TO JEDEC MO-220-VGGC ISSUE C)
SYMBOL
MILLIMETERS
NOTESMIN NOMINAL MAX
A 0.80 0.90 1.00 -
A1 - - 0.05 -
A2 - - 1.00 9
A3 0.20 REF 9
b 0.23 0.28 0.35 5, 8
D 4.00 BSC -
D1 3.75 BSC 9
D2 1.95 2.10 2.25 7, 8
E 4.00 BSC -
E1 3.75 BSC 9
E2 1.95 2.10 2.25 7, 8
e 0.65 BSC -
k0.25 - - -
L 0.50 0.60 0.75 8
L1 - - 0.15 10
N162
Nd 4 3
Ne 4 3
P- -0.609
θ--129
Rev. 5 5/04
NOTES:
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.
2. N is the number of terminals.
3. Nd and Ne refer to the number of terminals on each D and E.
4. All dimensions are in millimeters. Angles are in degrees.
5. Dimension b applies to the metallized terminal and is measured
between 0.15mm and 0.30mm from the terminal tip.
6. The configuration of the pin #1 identifier is optional, but must be
located within the zone indicated. The pin #1 identifier may be
either a mold or mark feature.
7. Dimensions D2 and E2 are for the exposed pads which provide
improved electrical and thermal performance.
8. Nominal dimensions are provided to assist with PCB Land Pattern
Design efforts, see Intersil Technical Brief TB389.
9. Features and dimensions A2, A3, D1, E1, P & θ are present when
Anvil singulation method is used and not present for saw
singulation.
10. Depending on the method of lead termination at the edge of the
package, a maximum 0.15mm pull back (L1) maybe present. L
minus L1 to be equal to or greater than 0.3mm.
12
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No lice nse is gran t ed by i mpli catio n or other wise u nder an y p a tent or patent right s of Int ersi l or it s sub sidi aries.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN9155.5
May 5, 2008
ISL6614
Small Outline Plastic Packages (SOIC)
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact.
INDEX
AREA
E
D
N
123
-B-
0.25(0.010) C AMBS
e
-A-
L
B
M
-C-
A1
A
SEATING PLANE
0.10(0.004)
h x 45o
C
H0.25(0.010) BM M
α
M14.15 (JEDEC MS-012-AB ISSUE C)
14 LEAD NARROW BODY SMALL OUTLINE PLASTIC
PACKAGE
SYMBOL
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
A 0.0532 0.0688 1.35 1.75 -
A1 0.0040 0.0098 0.10 0.25 -
B 0.013 0.020 0.33 0.51 9
C 0.0075 0.0098 0.19 0.25 -
D 0.3367 0.3444 8.55 8.75 3
E 0.1497 0.1574 3.80 4.00 4
e 0.050 BSC 1.27 BSC -
H 0.2284 0.2440 5.80 6.20 -
h 0.0099 0.0196 0.25 0.50 5
L 0.016 0.050 0.40 1.27 6
N14 147
α0o8o0o8o-
Rev. 0 12/93