MIL SPECS Tc ooo0125 Ooo013%5 7 NOTICE INCH-POUND OF VALIDATION MIL-S-19500/254A (ER) NOTICE 1 29 August 1988 MILITARY SPECIFICATION SHEET SEMICONDUCTOR DEVICE, DIODE, SILICON TYPES 1N1147 AND 1N1149 Military specification MIL-S-19500/254A(EL), dated 6 February 1968, has been reviewed and determined to be valid for use in acquisition. Custodian: Preparing Activity: Army - ER Army-ER AMSC N/A FSC 5961 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. a 1 6f 1MIL SPECS Icff cooo1es oo01397 4 MIL-S-19500/254A(EL) 6 February 1968 SUPERSEDING MIL~S-19500/254(SigC) 4 September 1962 SEMICONDUCTOR DEVICE, DIODE, SILICON TYPES IN1147 and IN1149 1. SCOPE 1.1 Scope.- This specification covers the detail requirements for silicon, semiconductor diodes for use particularly as high-voltage rectifier devices in compatible equipment circuits. (See 6.2 herein.) 1,2 Outline and dimensions.- See Figure | herein. 1.3 Operating characteristics. and ratings.~- (At LN = +25C, unless otherwise specified. See 3.4 herein.) Operating temperature: 65 to +125C Storage temperature: ~65 to +150C Operating altitude (barom. press.)- maximum, without derating : 1N1149 1N1147 ; 40,000 ft. approx. 30,000 ff. approx. / For higher altitude, derate maximum permissible peak reverse voltage in accordance with Figure 2 herein. v. Vp Vp lo i, (surge) (at:Ta=+125C) (at:Tc=+100C) (at:T-=+100C) (at: 1/120 sec) Max, Max. Mox. Max. Max. Kvde Kyde KVac(rms) mAdc oa IN1147] 14.4 12 8.4 45 10 IN1149] 19.2 14 11.2 45 10 FSC-5961MIL SPECS 1ff oooo1es ooo1asa o &f MIL-S-19500/254A(EL) 2. APPLICABLE DOCUMENTS 2.1 The following documents, of the issue in effect on date of invitation for bids or request for proposal, form o port of this specification to the extent specified herein: SPECIFICATIONS MILITARY MIL-S-19500 Semiconductor Devices, General Specification STANDARDS rer MILITARY MIL-STD-15 Electrical And Electronic Symbols MIL-STD-750 Test Methods For Semiconductor Devices (Copies of specifications, standards, drawings, and publications required by contractors in connection with specific procurement functions should be obtained from the procuring agency or as directed by the contracting officer. Both the title and number or symbol should be stipulated when requesting copies.) 3. REQUIREMENTS 3,1 Requirements.- Requirements for the diodes shall be in accordance with Specifico- tion MIL-5-19500 and as otherwise specified herein. 3.2 Abbreviations and symbols.- The abbreviations and symbols used herein are defined in Specification MIL-S-19500. 3.3 Design and construction.- The diodes shall be of the design, construction, and physical dimensions specified in Figure 1. 3.3.1 Terminal arrangement.- The terminal arrangement on the diodes shall be as indicated in Figure 1. 3.3.2 Operating position.- The diodes shall be capable of proper operation in any position. 3.4 Performance characteristics.- The diode performance characteristics shall be as specified in Tables | and IT herein (see 4.2 herein). Except where specifically differentiated for respective diode types (see 1.3 and Tables | andli herein), the performance requirements, including characteristics, ratings, ond test conditions, apply equally to both diode types covered herein.MIL SPECS Tc J cooo1es 0001399 2 j MIL-S-19500/254A(EL) 3.5 Marking.- Except as otherwise specified herein, marking shall be in accordance with Specification MIL-S-19500. If any specification-requirements waiver has been granted, the product-identification marking shall consist of the classification type designation only. The "manufacturer's identification" and "country :of origin" may, at option of the manufacturer, be omitted from being marked directly on the semiconductor device covered sherein. 3.5.1 Polarity marking.- The graphic symbol for polarity indication on the semiconductor on the semiconductor diode shall be as designated in Standard MIL-STD-15. 4. QUALITY ASSURANCE PROVISIONS 4.1 General.- Except as otherwise specified herein, the responsibility for inspection, general procedures for acceptance, classification of inspection, and inspection conditions and methods of test shall be in accordance with Specification MIL-S-19500, Quality Assurance Provisions, 4.2 Qualification and Acceptance Inspection.- Qualification and Quality Conformance inspection shall be in accordance with Specification MIL-S-19500, Quality Assurance Provisions, and as otherwise specified herein (see 4.2.2 herein). Groups A and B inspection shall consist of the examinations and tests specified in Tables 1 and Hl, respectively, herein, Acceptance Inspection shall include inspection of Preparation for Delivery. (See 5.1 herein.) 4.2.1 Specified LTPD for subgroups.- The LTPD specified for @ subgroup in Table | and {Il herein shall apply for all of the tests, combined, in the subgroup. 4.2.2 Sample size for subgroups.- The sample size shall be selected by the manufacturer and shall be within the Max. Acc. No. limit (from "0" Acceptance Number to that specified in Tables | and t! herein) relative to the particular subgroup LTPD. 4.2.3 Disposition of sample units.- Sample units that have been subjected to Group B, Subgroup 4 test shall not be delivered on the contract or order. Sample units that have been subjected to and have passed Group B, Subgroups 1, 2, 3, 5, 6, and 7 tests, these tests to be considered non-destructive, may be delivered on the contract or order provided that, after Group B inspection is terminated, those sample units are subjected to and pass Group A inspection. Defective units from any sample group that may have passed group inspection shall not be delivered on the contract or order until the defect(s) has been remedied to the satisfaction of the Government.MIL SPECS TCJfcooo1es Ooo14oo s MIL-S-19500/254A(EL) 4.3 Particular examination and test procedures. - 4.3.1 Interval for End=Point test measurements.~ All applicable End-Point Test measure~ ments shall be performed, after sample units have been subjected to required physical- mechanical or environmental test(s), in accordance with the following time-delay limitations: (a) For Qualification inspection: within 24 hours. (b) For Quality Conformance inspection: within 96 hours. 4.3.2 Mechanical damage resulting from test.- Except for intentionally deforming, mutilating, or dismembering mechanical-stress tests to which samples are subjected, there shall be no evidence of mechanical damage to any sample unit as a result of any of the Groups A, B, or C tests.Ic 0000125 oo001401 7 i MIL SPECS MIL-S-19500/254A(EL) *paijroads ounyosodwiay 94} 49 payopas uaeq soy winiiqiinba jouseyy 42430 Spow aq |[DYS yUaWsINsD||W 4sOj _ "usasey "EG 225 _ fe /t spyn Ook y opayoi=ta 6vLINI a 4 opayzi=ta ZyLint 3JUQUIND aSIBAaY 9LOr 3.SZ14=" 1 u0}jpsado ainjossdwa}-Yy6ip} /t apy" = OOL --- x! 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