H11L1M, H11L2M, H11L3M
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2
SAFETY AND INSULATION RATINGS
As per DIN EN/IEC 60747−5−5, this optocoupler is suitable for “safe electrical insulation” only within the safety limit data. Compliance with
the safety ratings shall be ensured by means of protective circuits.
Parameter Characteristics
Installation Classifications per DIN VDE
0110/1.89 Table 1, For For Rated Mains Voltage
< 150 VRMS I−IV
< 300 VRMS I−IV
Climatic Classification 55/100/21
Pollution Degree (DIN VDE 0110/1.89) 2
Comparative Tracking Index 175
Symbol Parameter Value Units
VPR Input−to−Output Test Voltage, Method A, VIORM × 1.6 = VPR,
Type and Sample Test with tm = 10 s, Partial Discharge < 5 pC
1360 Vpeak
Input−to−Output Test Voltage, Method B, VIORM × 1.875 = VPR,
100% Production Test with tm = 1 s, Partial Discharge < 5 pC
1594 Vpeak
VIORM Maximum Working Insulation Voltage 850 Vpeak
VIOTM Highest Allowable Over−Voltage 6000 Vpeak
External Creepage ≥7 mm
External Clearance ≥7 mm
External Clearance (for Option TV, 0.4” Lead Spacing) ≥10 mm
DTI Distance Through Insulation (Insulation Thickness) ≥0.5 mm
TSCase Temperature (Note 1) 175 °C
IS,INPUT Input Current (Note 1) 350 mA
PS,OUTPUT Output Power (Note 1) 800 mW
RIO Insulation Resistance at TS, VIO = 500 V (Note 1) >109W
1. Safety limit values − maximum values allowed in the event of a failure.
ABSOLUTE MAXIMUM RATINGS
Symbol Parameters Value Units
TOTAL DEVICE
TSTG Storage Temperature −40 to +125 °C
TOPR Operating Temperature −40 to +85 °C
TJJunction Temperature −40 to +125 °C
TSOL Lead Solder Temperature 260 for 10 seconds °C
PDTotal Device Power Dissipation at 25°C
Derate Above 25°C
250 mW
2.94 mW/°C
EMITTER
IFContinuous Forward Current 30 mA
VRReverse Voltage 6 V
IF(pk) Forward Current − Peak (1 ms pulse, 300 pps) 100 mA
PDLED Power Dissipation 60 mW
DETECTOR
PDDetector Power Dissipation 150 mW
VOV45 Allowed Range 0 to 16 V
VCC V65 Allowed Range 3 to 16 V
IOI4 Output Current 50 mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.