1. General description
The PCF8593 is a CMOS1 clock and calendar circuit, optimized for low power
consumption. Addresses an d data are transferred serially via the two-line bidirectional
I2C-bus. The built-in word address re gister is incremented automatically af ter each wr itten
or read data byte. The built-in 32.768 kHz oscillator circuit and the first 8 bytes of the RAM
are used for the clock, calendar, and counter functions. The next 8 bytes can be
programmed as alar m registers or used as free RAM space.
2. Features and benefits
I2C-bus interface operating supply voltage: 2.5 V to 6.0 V
Clock operating supply voltage 1.0 V to 6.0 V at 0 °Cto+70°C
8 bytes scratchpad RAM (when alarm not used)
Data retention voltage: 1.0 V to 6.0 V
External RESET input resets I2C interface only
Operating current (at fSCL = 0 Hz, 32 kHz time base, VDD = 2.0 V): typical 1 μA
Clock function with four year calendar
Universal timer with alarm and overflow indication
24 hour or 12 hour format
32.768 kHz or 50 Hz tim e base
Serial input and output bus (I2C-bus)
Automatic word address incrementing
Programmable alarm, timer, and interrupt function
Space-saving SO8 package available
Slave addresses: A3h for reading, A2h for writing
3. Ordering information
PCF8593
Low power clock and calendar
Rev. 04 — 6 October 2010 Product data sheet
1. The definition of the abbreviations and acronyms used in this data sheet can be found in Section 14.
Table 1. Ordering information
Type number Package
Name Description Version
PCF8593P DIP8 plastic dual in-line package; 8 leads (300 mil) SOT97-1
PCF8593T SO8 plastic small outline package; 8 leads;
body width 3.9 mm SOT96-1
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Product data sheet Rev. 04 — 6 October 2010 2 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
4. Marking
5. Block diagram
Table 2. Marking codes
Type number Marking code
PCF8593P PCF8593P
PCF8593T 8583T
Fig 1. Block diagram of PCF8593
013aaa37
9
PCF8593
OSCI
OSCO
INT
SCL
SDA
OSCILLATOR
RESET
I2C-BUS
INTERFACE
DIVIDER
CONTROL
LOGIC
ADDRESS
REGISTER
00h
01h
02h
03h
04h
05h
06h
07h
0Fh
control/status
hundredth second
seconds
minutes
hours
year/date
weekdays/months
timer
alarm or RAM
RESET
VSS
VDD
08h
to
alarm control
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Product data sheet Rev. 04 — 6 October 2010 3 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
6. Pinning information
6.1 Pinning
6.2 Pin description
Top view. For mechanical details, see Figure 24.
Fig 2. Pin co nfi gura tio n for DIP8 (PCF85 93P )
Top view. For mechanical details, see Figure 25.
Fig 3. Pin configuration for SO8 (PCF8593T)
PCF8593P
OSCI VDD
OSCO INT
RESET SCL
VSS SDA
013aaa380
1
2
3
4
6
5
8
7
PCF8593T
013aaa381
1
2
3
4
6
5
8
7
OSCI
OSCO
RESET
VSS
VDD
INT
SCL
SDA
Table 3. Pin description
Symbol Pin Type Description
DIP8
(PCF8593P) SO8
(PCF8593T)
OSCI 1 1 input oscillator input, 50 Hz or event-pulse
input
OSCO 2 2 output oscillator output
RESET 3 3 input reset
VSS 4 4 supply ground supply voltage
SDA 5 5 input/output serial data line
SCL 6 6 input serial clock line
INT 7 7 output open-drain interrupt output (active LOW)
VDD 8 8 supply supply voltage
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Product data sheet Rev. 04 — 6 October 2010 4 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
7. Functional description
The PCF8593 contains sixteen 8 bit registers with an 8 bit auto-incrementing address
register, an on-chip 32.768 kHz os cillator circuit, a frequency divider and a serial two-line
bidirectional I2C-bus interfa ce.
The first 8 registers (memory addresses 00h to 07h) are designed as addressable 8 bit
parallel registers. The first register (memory address 00h) is used as a control and status
register. The memory addresses 01h to 07h are used as counters for the clock function.
The memory addresses 08h to 0Fh may be programmed as alarm registers or used as
free RAM locations.
7.1 Counter function modes
When the control and status register is programmed, a 32.768 kHz clock mode, a 50 Hz
clock mode or an event-counter mode ca n be selected.
In the clock modes the hundredths of a second, seconds, minutes, hours, date, month
(four year calen d ar ) and we ekday are stored in a B ina ry Code d Decim a l (BCD) format.
The timer register stores up to 99 days. The event counter mode is used to coun t pulses
applied to the oscillator input (OSCO left open-circuit). The event counter stores up to 6
digits of data.
When one of the counters is read (memory locations 01h to 07h), the contents of all
counters are strobed into capture latches at the beginning of a read cycle. Therefore,
faulty reading of the counter during a carry condition is prevented. When a counter is
written, other counters are not affected.
7.2 Alarm function modes
By setting the alarm enable bit of the control and status register the alarm control register
(address 08h) is activated.
By setting the alarm control register, a dated alarm, a daily alarm, a weekday alarm, or a
timer alarm may be programmed. In the clock modes, the timer register (address 07h)
may be programmed to count hundredths of a second, seconds, minutes, hours, or days.
Days are counted wh en an ala rm is not pro gr am m ed.
Whenever an alarm even t o ccu rs the alarm flag of the co ntrol and status r egister is set. A
timer alarm event will set the alarm flag and an overflow condition of the timer will set the
timer flag. The open- drain inter rupt output is switched o n (active LOW) when the a larm or
timer flag is set (enabled). The flags remain set until directly reset by a write operation.
When the alarm is disabled (bit 2 of control and sta tus register set logic 0) the alarm
registers at addresses 08h to 0Fh may be used as free RAM.
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Product data sheet Rev. 04 — 6 October 2010 5 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
7.3 Control and status register
The control and status register is defined as the memory location 00h with free access for
reading and writin g via th e I 2C-bus. All functions and options are controlled by the
contents of the control and status register (see Figure 4).
Fig 4. Control and status register
timer flag:
alarm flag:
alarm enable bit:
mask flag:
function mode:
00
01
10
11
hold last count flag:
logic 0:
logic 1:
stop counting flag:
logic 0:
logic 1:
76543210
MSB LSB
013aaa382
memory location 00h
alarm disabled: flags toggle
alarm control register to disabled
(memory locations 08h to 0Fh
are free RAM space)
logic 1: enable alarm control register
(memory location 08h is the
alarm control register)
logic 0: read locations 05h to 06h
unmasked
logic 1: read date and month count
directly
50 % duty factor
seconds flag if alarm enable bit
is logic 0
50 % duty factor
minutes flag if alarm enable bit
is logic 0
logic 0:
clock mode 32.768 kHz
clock mode 50 Hz
event-counter mode
test modes
store and hold last count in
capture latches
count
count pulses
stop counting, reset divider
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Product data sheet Rev. 04 — 6 October 2010 6 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
7.4 Counter registers
The format for 24 hour or 12 hour clock modes can be selected by setting the most
significant bit of the hours counter register. The format of the hours counter is shown in
Figure 5.
The year and date are stored in memory location 05h (see Figure 6). The weekdays and
months are in memory location 06h (see Figure 7).
When reading these memory locations the year and weekdays are masked out when the
mask flag of the control and status register is set. This allows the user to read the date
and month count dir ectly.
Fig 5. Format of the hours counter
Fig 6. Format of the year and date counter
Fig 7. Format of the weekdays and month counter
76543210
MSB LSB
013aaa383
memory location 04h (hours counter)
unit place
ten's place (0 to 2 binary)
AM/PM flag:
logic 0: AM
logic 1: PM
format:
logic 0: 24 hour format, AM/PM flag remains unchanged
logic 1: 12 h format, AM/PM flag will be updated
hours in BCD format:
7 65 432 10
MSB LSB
013aaa384
unit place
ten's place (0 to 3 binary)
year (0 to 3 binary, read as logic 0
if the mask flag is set)
memory location 05h (year/date)
days in BCD format:
76 543 210
MSB LSB
013aaa385
memory location 06h (weekdays/months)
unit place
ten's place
weekdays (0 to 6 binary, read as logic 0
if the mask flag is set)
months in BCD format:
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Product data sheet Rev. 04 — 6 October 2010 7 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
In the event-counter mode, events are stored in BCD format. D5 is the most significant
and D0 the least significant digit. The divider is by-passed.
In the different modes the counter re gisters are programmed and arranged as shown in
Figure 8. Counter cycles are listed in Table 4.
Fig 8. Register arrangement
control/status
hundredth of a second
1/10 s
seconds
minutes
hours
year/date
weekdays/months
timer
10 s
10 min
10 h
10 day
10 month
10 day
1/100 s
1 s
1 min
1 h
1 day
1 month
1 day
alarm control
hundredth of a second alarm
1/10 s 1/100 s
alarm seconds
alarm minutes
alarm hours
alarm month
alarm timer
alarm date
control/status
D1
D3
D5
free
free
free
timer
T1
alarm control
alarm alarm
D1
D3
D5
D0
D2
D4
T0
D0
D2
D4
free
free
free
alarm timer
00h
01h
02h
03h
04h
05h
06h
07h
08h
09h
0Ah
0Bh
0Ch
0Dh
0Eh
0Fh
CLOCK MODES EVENT COUNTER
013aaa386
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Product data sheet Rev. 04 — 6 October 2010 8 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
7.5 Alarm control register
When the alarm enable bit of the co ntrol an d status register is set (a dd re ss 00h, bit 2) the
alarm control register (addr ess 08h) is activated. All alarm, timer, and interrupt output
functions are controlled by the contents of the alarm control register (see Figure 9).
Table 4. Cycle length of the time counters, clock modes
Unit Counting cycle Carry to next unit Contents of month
calendar
hundredths of a second 00 to 99 99 to 00 -
seconds 00 to 59 59 to 00 -
minutes 00 to 59 59 to 00 -
hours (24) 00 to 23 23 to 00 -
hours (12) 12 am - -
01 am to 11 am - -
12 pm - -
01 pm to 11 pm 11 pm to 12 am -
date 01 to 31 31 to 01 1, 3, 5, 7, 8, 10, and 12
01 to 30 30 to 01 4, 6, 9, and 11
01 to 29 29 to 01 2, year = 0
01 to 28 28 to 01 2, year = 1, 2, and 3
months 01 to 12 12 to 01 -
year 0 to 3 - -
weekdays 0 to 6 6 to 0 -
timer 00 to 99 no carry -
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Product data sheet Rev. 04 — 6 October 2010 9 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
7.6 Alarm registers
All alarm registers are allocated with a constant address offset of 08h to the
corresponding counter registers (see Figure 8).
An alarm signal is generated when th e content s of the alar m registers match bit-by-bit th e
contents of the involved counte r re g is te rs. The y ear an d week da y bits are igno re d in a
dated alarm. A daily alarm ignores the month and date bits. When a weekday alarm is
selected, the contents of the alarm weekday and month register selects the weekdays on
which an alarm is activated (see Figure 10).
Remark: In the 12 hour mode, bits 6 and 7 of the alarm hours register must be the same
as the hours counter.
Fig 9. Alarm control registers, clock mode
memory location 08h
timer function:
timer interrupt enable:
clock alarm function:
timer alarm enable:
alarm interrupt enable:
7 654 321 0
MSB LSB
013aaa387
000
001
010
011
100
101
110
111
no timer
hundredths of a second
seconds
minutes
hours
days
not used
test mode, all counters
in parallel
0
1
timer flag, no interrupt
timer flag, interrupt
00
01
10
11
no clock alarm
daily alarm
weekday alarm
dated alarm
0
1
no timer alarm
timer alarm
(only valid when alarm enable in
the control and status register is set)
0
1
alarm flag, no interrupt
alarm flag, interrupt
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Product data sheet Rev. 04 — 6 October 2010 10 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
7.7 Timer
The timer (location 07h) is enabled by setting the control and status register to
XX0X X1XX. The timer counts up from 0 (or a programmed value) to 99. On overflow, the
timer resets to 0. The timer flag (LSB of control and status regi ster) is set on overflo w of
the timer. This flag must be reset by software. T he inverted value of this flag can be
transferred to the external interrupt by setting bit 3 of the alarm control registe r.
Additionally, a timer alarm can be programmed by setting the timer alarm enable (bit 6 of
the alarm control register). When th e value of the timer equals a pre-pr ogrammed value in
the alarm timer register (location 0Fh), the alarm flag is set (bit 1 of the control and st atus
register). The inverted value of the alarm flag can be transferred to the externa l interrupt
by enabling the alarm interrupt (bit 6 of the alarm control register).
Resolution of the timer is programmed via the 3 LSBs of the alarm control register (see
Figure 11).
Fig 10. Selection of alarm weekdays
76543210
MSB LSB
013aaa375
memory location 0Eh (alarm_weekday/month)
weekday 0 enabled when set
weekday 1 enabled when set
weekday 2 enabled when set
weekday 3 enabled when set
weekday 4 enabled when set
weekday 5 enabled when set
weekday 6 enabled when set
not used
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Product data sheet Rev. 04 — 6 October 2010 11 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
7.8 Event counter mode
Event counter m ode is selected by bit s 4 and 5 which ar e logic 10 in the control and st atus
register. The event counter mode is used to count pulses externally applied to the
oscillator input (OSCO left open-circuit).
The event counter stor es up to 6 digits of data, which are stor ed as 6 hexadecimal values
located in the registers 1h, 2h, and 3h. Therefore, up to 1 million events may be recorded.
An event counter alarm occurs when the event counter registers match the value
programmed in the re gisters 9 h, Ah, a nd Bh, an d the even t alar m is ena bled ( bits 4 and 5
which are logic 01 in the alarm control register). In this event, the alarm flag (bit 1 of the
control and status register) is set. The inverted value of this flag can be transferred to the
interrupt pin (pin 7) by setting the alarm interrupt enable in the alarm control register. In
(1) If the alarm enable bit of the control and status register is reset (logic 0), a 1 Hz signal is observed on the interrupt pin INT.
Fig 11. Alarm and timer interrupt logic diagram
INT
7 654 321 0 76543210
timer overflow
interrupt
alarm
interrupt
TIMERALARM
CLOCK/CALENDAR
MUX
timer
control
timer
alarm overflow
alarm
control
clock
alarm
counter
control
mode
select
oscillator
CONTROL/STATUS
REGISTER (1)
ALARM CONTROL
REGISTER
013aaa377
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NXP Semiconductors PCF8593
Low power clock and calendar
this mode, the timer (location 07h) increments once for every one, one hundred, ten
thousand, or 1 million events, depending on the value programmed in bits 0, 1 and 2 of
the alarm control register. In all other events, the timer functions are as in the clock mode.
7.9 Interrupt control
The conditions for activating the output INT (active LOW) are determined by appropriate
programming of the alarm control register. These conditions are clock alarm, timer alarm,
timer overflow, and event counter alarm. An interrupt occurs when the alarm flag or the
timer flag is set, and th e co rre sp o ndi ng inte rr up t is enabled. In all events, the interrupt is
cleared only by software resetting of the flag which initiated the interrupt.
In the clock mode, if the alarm enable is not activated (alarm enable bit of the control and
status register is logic 0), the interrupt output toggles at 1 Hz with a 50 % duty cycle (may
be used for calibration). The OFF voltage of the interrupt output may exceed the supply
voltage, up to a maximum of 6.0 V. A logic diagram of the interrupt output is shown in
Figure 11.
7.10 Oscillator and divider
A 32.768 kHz quartz crystal has to be connected to OSCI an d OSCO. A trimmer capacitor
between OSCI and VDD is used for tuning the oscillator (see Section 11.1). A 100 Hz clock
signal is derived from the quartz oscillator for the clock counters.
Fig 12. Alarm control register, event counter mode
memory location 08h
reset state: 0000 0000
timer function:
clock alarm function:
timer alarm enable:
alarm interrupt enable:
7 654 321 0
MSB LSB
013aaa376
000
001
010
011
100
101
110
111
no timer
units
100
10 000
1 000 000
not allowed
not allowed
test mode, all counters
in parallel
timer interrupt enable:
0
1
timer flag, no interrupt
timer flag, interrupt
00
01
10
11
no event alarm
event alarm
not allowed
not allowed
0
1
no timer alarm
timer alarm
0
1
alarm flag, no interrupt
alarm flag, interrupt
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Product data sheet Rev. 04 — 6 October 2010 13 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
In the 50 Hz clock mode or event-counter mode the oscillator is disabled and the oscillator
input is switched to a high-impedance state. This allows the user to feed the 50 Hz
reference fr eq ue n cy or an ext er nal hig h spe e d ev en t si gnal into the input OSCI.
7.10.1 Designing
When designing the printed-circuit board layout, keep the oscillator components as close
to the IC package as possible, and keep all other signal lines as far away as possible. In
applications involving tight packing of components, shielding of the oscillator may be
necessary. AC coupling of extraneous signals can introduce oscillator inaccuracy.
7.11 Initialization
Note that immediately following power-on, all internal registers are undefined and,
following a RESET pulse on pin 3, must be defined via software . Atten tio n should be paid
to the possibility that the device may be initially in event-counter mode, in which event the
oscillator will not operate. Over-ride can be achieved via software.
Reset is accomplished by applying an external RESET pulse (active LOW) at pin 3. When
reset occurs only the I2C-bus interface is reset. The control and status register and all
clock counters are not affected by RESET. RESET must return HIGH during device
operation.
An RC combination can also be utilized to provide a power-on RESET signal at pin 3. In
this event, the values of the PCF859 3 must fulfil the following relationship to guarantee
power-on reset (see Figure 13).
RESET input must be input must be 0.3VDD when VDD reaches VDD(min) (or higher).
It is recommended to set the stop counting flag of the control and status register before
loading the actual time into the counters. Loading of illegal states may lead to a temporary
clock malfunction.
To avoid overload of the internal diode by falling VDD, an external diode should be added in parallel
to RR if CR 0.2 μF. Note that RC must be evaluated with the actual VDD of the application, as their
value will be VDD rise-time dependent.
Fig 13. PCF8593 reset
RESET
PCF8593
VDD
013aaa38
8
VDD
RR
reset
input
CR
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Product data sheet Rev. 04 — 6 October 2010 14 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
8. Characteristics of the I2C-bus
8.1 Characteristics
The I2C-bus is for bidirectional, two-line communication between different ICs or modules.
The two lines are a Serial DAt a line (SDA) and a Serial Clock Line (SCL). Both lines mu st
be connected to a positive supply via a pull-up re sistor . Dat a transfe r is initiated only when
the bus is not busy.
8.1.1 Bit transfer
One data bit is transferred during each clock pulse (see Figure 14). The data on the SDA
line must remain stable during the HIGH period of the clock pulse as changes in the data
line at this time are interpreted as a control signal.
8.1.2 Start and stop conditions
Both data and clock lines remain HIGH when the bus is not busy.
A HIGH-to-LOW transition of the dat a line while the clock is HIGH is defined as the ST AR T
condition - S.
A LOW-to-HIGH transition of the data line while the clock is HIGH is defined as the STOP
condition - P (see Figure 15).
8.1.3 System configuration
A device generating a message is a transmitter; a device receiving a message is the
receiver (see Figure 16). The device that controls the message is the master; and the
devices which are controlled by the master are the slaves.
Fig 14. Bit transfer
mbc62
1
data line
stable;
data valid
change
of data
allowed
SDA
SCL
Fig 15. Def in ition of start and stop conditions
mbc62
2
SDA
SCL
P
STOP condition
SDA
SCL
S
START condition
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Product data sheet Rev. 04 — 6 October 2010 15 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
8.1.4 Acknowledge
The number of data bytes transf er re d be tween the START and STOP conditions from
transmitter to receiver is unlimited. Each byte of eight bits is followe d by an acknowledge
cycle.
A slave receiver, which is addressed, must generate an acknowledge after the
reception of each byte.
Also a master receiver must gener ate an acknowle dge after the reception of each
byte that has been clocked out of the slave transmitter.
The device that acknowledges must pull-down the SDA line during the acknowledge
clock pulse, so that the SDA line is stable LOW during the HIGH period of the
acknowledge related clock pulse (set-up and hold times must be taken into
consideration).
A master receiver must signal an end of data to the transmitter by not generating an
acknowledge on the last byte that has been clocked out of the slave. In this event, the
transmitter must leave the data line HIGH to enable the master to generate a STOP
condition.
Acknowledgement on the I2C-bus is illustrated in Figure 17.
Fig 16. System configuration
mba60
5
MASTER
TRANSMITTER
RECEIVER
SLAVE
RECEIVER
SLAVE
TRANSMITTER
RECEIVER
MASTER
TRANSMITTER
MASTER
TRANSMITTER
RECEIVER
SDA
SCL
Fig 17. Acknowl edgement on the I2C-bus
mbc60
2
S
START
condition
9821
clock pulse for
acknowledgement
not acknowledge
acknowledge
data output
by transmitter
data output
by receiver
SCL from
master
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Product data sheet Rev. 04 — 6 October 2010 16 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
8.2 I2C-bus protocol
8.2.1 Addressing
Before any data is transmitted on the I2C-bu s, th e de vice which must respond is
addressed first. The addressing is always carried out with the first byte transmitted after
the start procedure .
The clock and calendar act s as a slave receiver or slave tr ansmitter. The clock signal SCL
is only an input signal but the data signal SDA is a bidirectional line.
The clock and calendar slave address is shown in Table 5.
8.2.2 Clock and calendar READ or WRITE cycles
The I2C-bus configu ration for the dif ferent PCF 8593 READ and WRITE cycles is shown in
Figure 18, Figure 19 and Figure 20.
Table 5. I2C slave address byte
Slave address
Bit 7 6 5 4 3 2 1 0
MSB LSB
1010001R/W
Fig 18. Master transmits to slave receiver (WRITE mode)
S0ASLAVE ADDRESS REGISTER ADDRESS A ADATA P
acknowledgement
from slave
acknowledgement
from slave
acknowledgement
from slave
R/W
auto increment
memory register address
013aaa34
6
n bytes
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Product data sheet Rev. 04 — 6 October 2010 17 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
(1) At this moment master transmitter becomes master receiver and PCF8593 slave receiver becomes slave transmitter.
Fig 19. Master reads after setting word addr ess (write word address; READ data)
S0A
SLAVE ADDRESS REGISTER ADDRESS A A
R/W
A
DATA
013aaa041
P
1
auto increment
memory register address
last byte
R/W
S1
n bytes
(1)
acknowledgement
from slave
acknowledgement
from slave
acknowledgement
from slave
acknowledgement
from slave
no acknowledgement
from master
auto increment
memory register address
SLAVE ADDRESS
DATA
Fig 20. Master reads slave immediately after first byte (READ mode)
S1A
SLAVE ADDRESS DATA A1DATA
acknowledgement
from slave
acknowledgement
from master
no acknowledgement
from master
R/W
auto increment
register address
013aaa347
auto increment
register address
n bytes last byte
P
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Product data sheet Rev. 04 — 6 October 2010 18 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
9. Limiting values
[1] Pass level; Human Body Model (HBM), according to Ref. 5 “JESD22-A114.
[2] Pass level; Machine Model (MM), according to Ref. 6 “JESD22-A115.
[3] Pass level; latch-up testing according to Ref. 7 JESD78 at maximum ambient temperature (Tamb(max)).
[4] According to the NXP store and transport requirements (see Ref. 9 “NX3-00092) the devices have to be
stored at a temperature of +8 °C to +45 °C and a humidity of 25 % to 75 %. For long term storage products
deviant conditions are described in that document.
Table 6. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
VDD supply voltage 0.8 +0.7 V
IDD supply current - 50 mA
ISS ground supply current - 50 mA
VIinput voltage 0.8 VDD + 0.8 V
IIinput current - 10 mA
IOoutput current - 10 mA
Ptot total power dissipation - 300 mW
Pooutput power - 50 mW
VESD electrostatic discharge
voltage HBM [1] -±3000 V
MM [2] -±300 V
Ilu latch-up current [3] - 100 mA
Tstg storage temperature [4] 65 +150 °C
Tamb ambient temperature operating device 40 +85 °C
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NXP Semiconductors PCF8593
Low power clock and calendar
10. Characteristics
10.1 Static characteristics
[1] Typical values measured at Tamb = 25 °C.
[2] When the device is powered on, VDD must exceed the specified minimum value by 300 mV to guarantee correct start-up of the
oscillator.
[3] Event counter mode: supply current dependan t upon input frequency.
[4] Tested on a sample basis.
Table 7. Static characteristics
VDD = 2.5 V to 6.0 V; VSS = 0 V; Tamb =
40
°
C to +85
°
C unless otherwise specified.
Symbol Parameter Conditions Min Typ[1] Max Unit
VDD supply voltage operating mode
I2C-bus active 2.5 - 6.0 V
I2C-bus inactive 1.0 - 6.0 V
quartz oscillator
Tamb = 0 °C to +70 °C[2] 1.0 - 6.0 V
Tamb = 40 °C to +85 °C[2] 1.2 - 6.0 V
IDD supply current operating mode
fSCL = 100 kHz clock mode [3] - - 200 μA
clock mode; fSCL = 0 Hz
VDD = 2.0 V - 1.0 8.0 μA
VDD = 5.0 V - 4 15 μA
Pin SDA, SCL and INT
VIL LOW-level input voltage 0 - 0.3VDD V
VIH HIGH-level input voltage 0.7VDD -V
DD V
IOL LOW-level output current VOL =0.4V 3 - - mA
ILI input leakage current VI = VDD or VSS 1- +1μA
CIinput capacitance [4] --7pF
Pins OSCI and RESET
ILI input leakage current VI = VDD or VSS 250 - +250 nA
Pin INT
IOL LOW-level output current VOL = 0.4 V 1 - - mA
ILI input leakage current VI = VDD or VSS 1- +1μA
Pin SCL
ILI input leakage current VI = VDD or VSS 1- +1μA
CIinput capacitance [4] --7pF
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Product data sheet Rev. 04 — 6 October 2010 20 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
fSCL = 32 kHz; Tamb = 25 °C
Fig 21. Typical supply current in clock mode as a function of supply voltage
001aam493
VDD (V)
0642
4
2
6
8
lDD
(μA)
0
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NXP Semiconductors PCF8593
Low power clock and calendar
10.2 Dynamic characteristics
[1] Event counter mode only.
[2] All timing values are valid within the operating supply voltage, ambient temperature range, reference to VIL and VIH and with an input
voltage swing of VSS to VDD.
Table 8. Dynamic characteristics
VDD = 2.5 V to 6.0 V; VSS = 0 V; Tamb =
40
°
C to +85
°
C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
Oscillator
COSCO capacitance on pin OSCO 20 25 30 pF
Δfosc/fosc relative oscillator frequency
variation for ΔVDD = 100 mV ; Tamb =25°C;
VDD = 1.5 V -0.2-ppm
fclk(ext) external clock freque ncy [1] --1MHz
Quartz crystal parameters (f = 32.768 kHz)
RSseries resistance - - 40 kΩ
CLparallel load capacitance - 10 - pF
Ctrim trimmer capacitance 5 - 25 pF
I2C-bus timing (see Figure 21)[2]
fSCL SCL clock frequency - - 100 kHz
tSP pulse width of spikes that
must be suppressed by the
input filter
--100ns
tBUF bus free time between a
STOP and START condition 4.7 - - μs
tSU;STA set-up time for a repeated
START condition 4.7 - - μs
tHD;STA hold time (repeated) START
condition 4.0 - - μs
tLOW LOW period of the SCL clock 4.7 - - μs
tHIGH HIGH period of the SCL clock 4.0 - - μs
trrise time of both SDA and
SCL signals --1.0μs
tffall time of both SDA and SCL
signals --0.3μs
tSU;DAT data set-up time 250 - - ns
tHD;DAT data hold time 0 - - ns
tVD;DAT data valid time - - 3.4 μs
tSU;STO set-up time for STOP
condition 4.0 - - μs
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Product data sheet Rev. 04 — 6 October 2010 22 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
Fig 22. I2C-bus timing diagram; rise and fall times refer to VIL and VIH
PROTOCOL
SCL
SDA
mbd82
BIT 0
LSB
(R/W)
START
CONDITION
(S)
BIT 7
MSB
(A7)
BIT 6
(A6)
ACKNOWLEDGE
(A)
STOP
CONDITION
(P)
t
SU;STA
t
HD;STA
t
SU;DAT
t
HD;DAT
t
VD;DAT
t
SU;STO
t
LOW
t
HIGH
1 / f
SCL
t
BUF
t
r
t
f
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Product data sheet Rev. 04 — 6 October 2010 23 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
11. Application information
11.1 Oscillator frequency adjustment
11.1.1 Method 1: Fixed OSCI capacitor
By evaluating the average capacitance necessary for the application layout a fixed
capacitor can be used. The frequency is best measured via the 1 Hz signal which can be
programmed to occur at the interrupt output (pin 7). The frequency tolerance depends on
the quartz crystal tolerance, the capacitor tolerance and the device-to-device tolerance
(on average ±5 ×106). Average deviations of ±5 minutes per year can be achieved.
11.1.2 Method 2: OSCI trimmer
Using the alarm function (via the I2C-bus) a signal faster than the 1 Hz is generate d at the
interrupt output for fast setting of a trimmer.
Procedure:
Power the device on
Apply RESET.
Routine:
Set clock to time t and set alarm to time t + Δt
at time t + Δt (interrupt) repeat routine.
11.1.3 Method 3: Direct measurement
Direct measurement of oscillator output (allowing for test probe capacitance).
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Product data sheet Rev. 04 — 6 October 2010 24 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
Fig 23. App li ca tion example
013aaa38
9
SCL
SDA
VSS
OSCI
OSCO
CLOCK/CALENDAR
PCF8593
SDA
SCL
MASTER
TRANSMITTER/
RECEIVER
VDD
SDA SCL
RR
R: pull-up resistor
R = tr
Cb
VDD
VSS
RESET
VDD
(I2C-bus)
1 F
RESET VDD
RESET
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Product data sheet Rev. 04 — 6 October 2010 25 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
12. Package outline
Fig 24. Package outline SOT97-1 (DIP8) of PCF8593P
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
SOT97-1 99-12-27
03-02-13
UNIT A
max. 12 b1(1) (1) (1)
b2cD E e M Z
H
L
mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
A
min. A
max. bmax.
w
ME
e1
1.73
1.14
0.53
0.38
0.36
0.23
9.8
9.2
6.48
6.20
3.60
3.05 0.2542.54 7.62 8.25
7.80
10.0
8.3 1.154.2 0.51 3.2
inches 0.068
0.045
0.021
0.015
0.014
0.009
1.07
0.89
0.042
0.035
0.39
0.36
0.26
0.24
0.14
0.12 0.010.1 0.3 0.32
0.31
0.39
0.33 0.0450.17 0.02 0.13
b2
050G01 MO-001 SC-504-8
MH
c
(e )
1
ME
A
L
seating plane
A1
wM
b1
e
D
A2
Z
8
1
5
4
b
E
0 5 10 mm
scale
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
pin 1 index
D
IP8: plastic dual in-line package; 8 leads (300 mil) SOT97
-1
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Product data sheet Rev. 04 — 6 October 2010 26 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
Fig 25. Package outline SOT96-1 (SO8) of PCF8593T
UNIT A
max. A1A2A3bpcD
(1) E(2) (1)
eH
ELL
pQZywv θ
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
mm
inches
1.75 0.25
0.10
1.45
1.25 0.25 0.49
0.36
0.25
0.19
5.0
4.8
4.0
3.8 1.27 6.2
5.8 1.05 0.7
0.6
0.7
0.3 8
0
o
o
0.25 0.10.25
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Notes
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
2. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
1.0
0.4
SOT96-1
X
wM
θ
A
A1
A2
bp
D
HE
Lp
Q
detail X
E
Z
e
c
L
vMA
(A )
3
A
4
5
pin 1 index
1
8
y
076E03 MS-012
0.069 0.010
0.004
0.057
0.049 0.01 0.019
0.014
0.0100
0.0075
0.20
0.19
0.16
0.15 0.05 0.244
0.228
0.028
0.024
0.028
0.012
0.010.010.041 0.004
0.039
0.016
0 2.5 5 mm
scale
S
O8: plastic small outline package; 8 leads; body width 3.9 mm SOT96
-1
99-12-27
03-02-18
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NXP Semiconductors PCF8593
Low power clock and calendar
13. Soldering of SMD packages
This text provides a very brief insight into a complex technology. A more in-depth account
of soldering ICs can be found in Application Note AN10365 “Surface mount reflow
soldering description”.
13.1 Introduction to soldering
Soldering is one of the most common methods through which packages are attached to
Printed Circuit Boards (PCBs), to form electrical circuits. The soldered joint provides both
the mechanical and the electrical connection. There is no single soldering method that is
ideal for all IC packages. Wave soldering is often preferred when through -hole and
Surface Mount Devices (SMDs) are mixed on on e printed wiring board; however, it is not
suitable for fine pitch SMDs. Reflow soldering is ideal for the small pitches and high
densities that come with increased miniaturization.
13.2 Wave and reflow soldering
W ave soldering is a joining te chnology in which the joints are m ade by solder coming from
a standing wave of liquid solder. The wave soldering process is suitable for the following:
Through-hole components
Leaded or leadless SMDs, which are glued to the surface of the printed circuit bo ard
Not all SMDs can be wave soldered. Packages with solder balls, and some leadless
packages which have solde r lands underneath the body, cannot be wave soldered. Also,
leaded SMDs with leads ha ving a pitch smaller than ~0.6 mm cannot be wave soldered,
due to an increased probability of bridging.
The reflow soldering process involves applying solder paste to a board, followed by
component placement and exposure to a temperature profile. Leaded packages,
packages with solder balls, and leadless packages are all reflow solderable.
Key characteristics in both wave and reflow soldering are:
Board specifications, including the board finish, solder masks and vias
Package footprints, including solder thieves and orientation
The moisture sensitivity level of the packages
Package placement
Inspection and repair
Lead-free soldering ve rsus SnPb soldering
13.3 Wave soldering
Key characteristics in wave soldering are:
Process issues, such as application of adhesive and flux, clinching of leads, board
transport, the solder wave parameters, and the time during which components are
exposed to the wave
Solder bath specifications, including temperature and impurities
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Product data sheet Rev. 04 — 6 October 2010 28 of 35
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Low power clock and calendar
13.4 Reflow soldering
Key characteristics in reflow soldering are :
Lead-free ve rsus SnPb soldering; note th at a lead-free reflow process usua lly leads to
higher minimum peak temperatures (see Figure 26) than a SnPb process, thus
reducing the process window
Solder paste printing issues including smearing, release, and adjusting the process
window for a mix of large and small components on one board
Reflow temperature profile; this profile includes preheat, reflow (in which the board is
heated to the peak temperature) an d cooling down. It is imperative that the peak
temperature is high enoug h for the solder to make reliable solder joint s (a solder paste
characteristic). In addition, the peak temperature must be low enough that the
packages and/or boards are not damaged. The peak temperature of the package
depends on p ackage thickness and volume and is classified in accordance with
Table 9 and 10
Moisture sensitivity precautions, as indicated on the packing, must be respected at all
times.
Studies have shown that small packages reach higher temperatures during reflow
soldering, see Figure 26.
Table 9. SnPb eutectic process (from J-STD-020C)
Package thickness (mm) Package reflow temperature (°C)
Volume (mm3)
< 350 350
< 2.5 235 220
2.5 220 220
Table 10. Lead-free process (from J-STD-020C)
Package thickness (mm) Package reflow temperature (°C)
Volume (mm3)
< 350 350 to 2000 > 2000
< 1.6 260 260 260
1.6 to 2.5 260 250 245
> 2.5 250 245 245
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Product data sheet Rev. 04 — 6 October 2010 29 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
For further informa tion on temperature profiles, refer to Application Note AN10365
“Surface mount reflow soldering description”.
MSL: Moisture Sensitivity Level
Fig 26. Temperature profiles for large and small components
001aac84
4
temperature
time
minimum peak temperature
= minimum soldering temperature
maximum peak temperature
= MSL limit, damage level
peak
temperature
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Low power clock and calendar
14. Abbreviations
Table 11. Abbreviations
Acronym Description
AM Ante Meridiem
BCD Binary Coded Decimal
CMOS Complementary Metal-Oxide Semiconductor
ESD ElectroStatic Discharge
HBM Human Body Model
I2C Inter-Integrated Circuit bus
IC Integrated Circuit
LSB Least Significant Bit
MM Machine Model
MSB Most Significant Bit
MSL Moisture Sensitivity Level
MUX Multiplexer
PCB Printed-Circuit Board
PM Post Meridiem
POR Power-On Reset
PPM Parts Per Million
RF Radio Frequency
RAM Random Access Memory
SCL Serial Clock Line
SDA Serial DAta line
SMD Surface-Mount Device
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Product data sheet Rev. 04 — 6 October 2010 31 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
15. References
[1] AN10365 — Surface mount reflow soldering description
[2] IEC 60134 Rating syst ems for electronic tubes and valves and analogous
semiconductor devices
[3] IEC 61340-5 Protection of electronic devices from electrostatic phenomena
[4] IPC/JEDEC J-STD-020 — Moisture/Reflow Sensitivity Classification for
Nonhermetic Solid State Surface Mount Devices
[5] JESD22-A114 Elec trostatic Discharge (ESD) Sensitivity Testing Human Body
Model (HBM)
[6] JESD22-A115 Electrostatic Discharge (ESD) Sensitivity Testing Machine Model
(MM)
[7] JESD78 — IC Latch-Up Test
[8] JESD625-A — Requirements for Handling Electrostatic-Discharge-Sensitive
(ESDS) Devices
[9] NX3-00092 — NXP store and transport requirements
[10] SNV-FA-01-02 — Marking Formats Integrated Circuits
[11] UM10204 — I2C-bus specification an d user manual
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Low power clock and calendar
16. Revision history
Table 12. Revision history
Document ID Relea se date Data sheet status Change notice Supersedes
PCF8593 v.4 20101006 Product data sheet - PCF8593_3
Modifications: The format of this data sheet has been redesigned to comply with the new identity
guidelines of NXP Semiconductors.
Legal texts have been adapted to the new company name where appropriate .
PCF8593_3 19970325 Product specification - PCF8593_2
PCF8593_2 19940829 Product specification - PCF8593_1
PCF8593_1 19940606 Product specification - -
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Product data sheet Rev. 04 — 6 October 2010 33 of 35
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Low power clock and calendar
17. Legal information
17.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of de vice(s) descr ibed in th is document m ay have cha nged since thi s document w as publish ed and may di ffe r in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
17.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not b e relied u pon to cont ain det ailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semicond uctors sales
office. In case of any inconsistency or conflict with the short data sheet, th e
full data sheet shall pre va il.
Product specificat ionThe information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to off er functions and qualities beyond those described in the
Product data sheet.
17.3 Disclaimers
Limited warr a nty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warrant ies, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequ ential damages (including - wit hout limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability t owards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all informa tion supplied prior
to the publication hereof .
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suit able for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in perso nal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liab ility for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and ope ration of their applications
and products using NXP Semiconductors product s, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suit able and fit for the custome r’s applications and
products planned, as well as fo r the planned application and use of
customer’s third party customer(s). Custo mers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party custo m er(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Te rms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individua l agreement. In case an individual
agreement is concluded only the ter m s and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly ob jects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing i n this document may be interpreted or
construed as an of fer t o sell product s that is open for accept ance or the gr ant,
conveyance or implication of any license under any copyrights, patents or
other industrial or inte llectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulatio ns. Export might require a prior
authorization from national authorities.
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contain s data from the objective specification for product development.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document contains the prod uct specification.
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Product data sheet Rev. 04 — 6 October 2010 34 of 35
NXP Semiconductors PCF8593
Low power clock and calendar
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for aut omotive use. It i s neit her qua lified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in au tomotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automot ive specifications and standards, custome r
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such au tomotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconduct ors for an y
liability, damages or failed product claims result ing from customer design an d
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specificat ions.
17.4 Trademarks
Notice: All referenced b rands, produc t names, service names and trademarks
are the property of their respective ow ners.
I2C-bus — logo is a trademark of NXP B.V.
18. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
NXP Semiconductors PCF8593
Low power clock and calendar
© NXP B.V. 2010. All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 6 October 2010
Document identifier: PCF8593
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
19. Contents
1 General description. . . . . . . . . . . . . . . . . . . . . . 1
2 Features and benefits . . . . . . . . . . . . . . . . . . . . 1
3 Ordering information. . . . . . . . . . . . . . . . . . . . . 1
4 Marking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
5 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 2
6 Pinning information. . . . . . . . . . . . . . . . . . . . . . 3
6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3
7 Functional description . . . . . . . . . . . . . . . . . . . 4
7.1 Counter function modes . . . . . . . . . . . . . . . . . . 4
7.2 Alarm function modes. . . . . . . . . . . . . . . . . . . . 4
7.3 Control and status register . . . . . . . . . . . . . . . . 5
7.4 Counter registers . . . . . . . . . . . . . . . . . . . . . . . 6
7.5 Alarm control register . . . . . . . . . . . . . . . . . . . . 8
7.6 Alarm registers . . . . . . . . . . . . . . . . . . . . . . . . . 9
7.7 Timer. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
7.8 Event counter mode . . . . . . . . . . . . . . . . . . . . 11
7.9 Interrupt control . . . . . . . . . . . . . . . . . . . . . . . 12
7.10 Oscillator and divider . . . . . . . . . . . . . . . . . . . 12
7.10.1 Designing . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.11 Initialization. . . . . . . . . . . . . . . . . . . . . . . . . . . 13
8 Characteristics of the I2C-bus . . . . . . . . . . . . 14
8.1 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 14
8.1.1 Bit transfer . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
8.1.2 Start and stop conditions . . . . . . . . . . . . . . . . 14
8.1.3 System configuration . . . . . . . . . . . . . . . . . . . 14
8.1.4 Acknowledge . . . . . . . . . . . . . . . . . . . . . . . . . 15
8.2 I2C-bus protocol . . . . . . . . . . . . . . . . . . . . . . . 16
8.2.1 Addressing . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
8.2.2 Clock and calendar READ or WRITE cycles . 16
9 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 18
10 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . 19
10.1 Static characteristics. . . . . . . . . . . . . . . . . . . . 19
10.2 Dynamic characteristics . . . . . . . . . . . . . . . . . 21
11 Application information. . . . . . . . . . . . . . . . . . 23
11.1 Oscillator frequency adju stment . . . . . . . . . . . 23
11.1.1 Method 1: Fixed OSCI capacitor. . . . . . . . . . . 23
11.1.2 Method 2: OSCI trimmer. . . . . . . . . . . . . . . . . 23
11.1.3 Method 3: Direct measurement . . . . . . . . . . . 23
12 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 25
13 Soldering of SMD packages . . . . . . . . . . . . . . 27
13.1 Introduction to soldering . . . . . . . . . . . . . . . . . 27
13.2 Wave and reflow soldering . . . . . . . . . . . . . . . 27
13.3 Wave soldering. . . . . . . . . . . . . . . . . . . . . . . . 27
13.4 Reflow soldering. . . . . . . . . . . . . . . . . . . . . . . 28
14 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . 30
15 References. . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
16 Revision history . . . . . . . . . . . . . . . . . . . . . . . 32
17 Legal information . . . . . . . . . . . . . . . . . . . . . . 33
17.1 Data sheet status. . . . . . . . . . . . . . . . . . . . . . 33
17.2 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
17.3 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . 33
17.4 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 34
18 Contact information . . . . . . . . . . . . . . . . . . . . 34
19 Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35