APTM20AM08FTG
APTM20AM08FTG – Rev 2 July, 2006
www.microsemi.com 2
6
All ratings @ Tj = 25°C unless otherwise specified
Electrical Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
VGS = 0V,VDS = 200V Tj = 25°C 375
IDSS Zero Gate Voltage Drain Current VGS = 0V,VDS = 160V T
j = 125°C 1500 µA
RDS(on) Drain – Source on Resistance VGS = 10V, ID = 104A 8 10
mΩ
VGS(th) Gate Threshold Voltage VGS = VDS, ID = 5mA 3 5 V
IGS S Gate – Source Leakage Current VGS = ±30 V, VDS = 0V ±150 nA
Dynamic Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
Cis s Input Capacitance 14.4
Coss Output Capacitance 4.66
Crss Reverse Transfer Capacitance
VGS = 0V
VDS = 25V
f = 1MHz 0.29
nF
Qg Total gate Charge 280
Qgs Gate – Source Charge 106
Qgd Gate – Drain Charge
VGS = 10V
VBus = 100V
ID = 208A 134
nC
Td(on) Tur n-on Delay Ti me 32
Tr Rise Time 64
Td(off) Turn-off Delay Time 88
Tf Fall Time
Inductive switching @ 125°C
VGS = 15V
VBus = 133V
ID = 208A
RG = 2.5Ω 116
ns
Eon Turn-on Switching Energy 1698
Eoff Turn-off Switching Energy
Inductive switching @ 25°C
VGS = 15V, VBus = 133V
ID = 208A, RG = 2.5Ω 1858
µJ
Eon Turn-on Switching Energy 1872
Eoff Turn-off Switching Energy
Inductive switching @ 125°C
VGS = 15V, VBus = 133V
ID = 208A, RG = 2.5Ω 1972
µJ
Source - Drain diode ratings and characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
Tc = 25°C 208
IS Continuous Source c urrent
(Body diode)
Tc = 80°C 155 A
VSD Diode Forward Voltage VGS = 0V, IS = - 208A 1.3 V
dv/dt Peak Diode Recovery X 5 V/ns
Tj = 25°C 230
trr Reverse Recovery Time Tj = 125°C 450 ns
Tj = 25°C 1.8
Qrr Reverse Recovery Charge
IS = - 208A
VR = 133V
diS/dt = 200A/µs
Tj = 125°C 6.8
µC
X dv/dt numbers reflect the limitations of the circuit rather than the device itself.
IS ≤ - 208A di/dt ≤ 700A/µs VR ≤ VDSS Tj ≤ 150°C