FDD2572 / FDU2572 N-Channel PowerTrench(R) MOSFET 150V, 29A, 54m Features Applications * r DS(ON) = 45m (Typ.), VGS = 10V, ID = 9A * DC/DC converters and Off-Line UPS * Qg(tot) = 26nC (Typ.), VGS = 10V * Distributed Power Architectures and VRMs * Low Miller Charge * Primary Switch for 24V and 48V Systems * Low QRR Body Diode * UIS Capability (Single Pulse and Repetitive Pulse) * High Voltage Synchronous Rectifier * Qualified to AEC Q101 * Direct Injection / Diesel Injection Systems Formerly developmental type 82860 * 42V Automotive Load Control * Electronic Valve Train Systems DRAIN (FLANGE) D SOURCE DRAIN DRAIN (FLANGE) GATE GATE G SOURCE TO-252AA TO-251AA FDD SERIES FDU SERIES S MOSFET Maximum Ratings TC = 25C unless otherwise noted Symbol VDSS Drain to Source Voltage Parameter Ratings 150 Units V VGS Gate to Source Voltage 20 V 29 A 20 A Drain Current Continuous (TC = 25oC, VGS = 10V) ID o Continuous (TC = 100 C, VGS = 10V) Continuous (Tamb = 25oC, VGS = 10V, R JA = 52oC/W) Pulsed E AS PD TJ, TSTG 4 Figure 4 A Single Pulse Avalanche Energy (Note 1) 36 mJ Power dissipation 135 W Derate above 25oC 0.9 W/oC Operating and Storage Temperature o -55 to 175 C Thermal Characteristics RJC Thermal Resistance Junction to Case TO-251, TO-252 1.11 o C/W RJA Thermal Resistance Junction to Ambient TO-251, TO-252 100 o C/W RJA Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area 52 oC/W This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/ Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html. All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems certification. (c)2002 Fairchild Semiconductor Corporation FDD2572 / FDU2572 Rev. B FDD2572 / FDU2572 September 2002 Device Marking FDD2572 Device FDD2572 Package TO-252AA Reel Size 330mm Tape Width 16mm Quantity 2500 units FDU2572 FDU2572 TO-251AA Tube N/A 75 units Electrical Characteristics TC = 25C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units Off Characteristics BVDSS Drain to Source Breakdown Voltage IDSS Zero Gate Voltage Drain Current IGSS Gate to Source Leakage Current ID = 250A, VGS = 0V 150 - - V - - 1 - - 250 A VGS = 20V - - 100 nA V GS = VDS, ID = 250A 2 - 4 V ID=9A, VGS=10V - 0.045 0.054 ID = 4A, VGS = 6V, - 0.050 0.075 ID=9A, VGS=10V, TC=175oC - 0.126 0.146 - 1770 - - 183 - pF - 40 - pF nC VDS = 120V VGS = 0V TC = 150o On Characteristics VGS(TH) rDS(ON) Gate to Source Threshold Voltage Drain to Source On Resistance Dynamic Characteristics CISS Input Capacitance COSS Output Capacitance CRSS Reverse Transfer Capacitance VDS = 25V, VGS = 0V, f = 1MHz pF Qg(TOT) Total Gate Charge at 10V VGS = 0V to 10V - 26 34 Qg(TH) Threshold Gate Charge VGS = 0V to 2V - 3.3 4.3 nC Qgs Gate to Source Gate Charge - 8 - nC Qgs2 Gate Charge Threshold to Plateau Qgd Gate to Drain "Miller" Charge VDD = 75V ID = 9A Ig = 1.0mA - 5 - nC - 6 - nC ns Resistive Switching Characteristics (VGS = 10V) tON Turn-On Time - - 36 td(ON) Turn-On Delay Time - 11 - ns tr Rise Time - 14 - ns td(OFF) Turn-Off Delay Time - 31 - ns tf Fall Time - 14 - ns tOFF Turn-Off Time - - 66 ns VDD = 75V, ID = 9A VGS = 10V, RGS = 11.0 Drain-Source Diode Characteristics ISD = 9A - - 1.25 V ISD = 4A - - 1.0 V Reverse Recovery Time ISD = 9A, dISD/dt =100A/s - - 74 ns Reverse Recovered Charge ISD = 9A, dISD/dt =100A/s - - 169 nC VSD Source to Drain Diode Voltage trr QRR Notes: 1: Starting TJ = 25C, L = 0.2mH, IAS = 19A. (c)2002 Fairchild Semiconductor Corporation FDD2572 / FDU2572 Rev. B FDD2572 / FDU2572 Package Marking and Ordering Information FDD2572 / FDU2572 Typical Characteristics TC = 25C unless otherwise noted 40 VGS = 10V 35 1.0 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.2 0.8 0.6 0.4 30 25 20 15 10 0.2 5 0 0 25 50 75 100 150 125 175 0 25 TC , CASE TEMPERATURE (oC) Figure 1. Normalized Power Dissipation vs Ambient Temperature 50 75 100 125 TC, CASE TEMPERATURE (oC) 150 175 Figure 2. Maximum Continuous Drain Current vs Case Temperature 2.0 DUTY CYCLE - DESCENDING ORDER 0.5 0.2 0.1 0.05 0.02 0.01 ZJC, NORMALIZED THERMAL IMPEDANCE 1.0 PDM 0.1 SINGLE PULSE t1 t2 NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZJC x RJC + TC 0.01 10-5 10-4 10-3 10-2 10-1 t , RECTANGULAR PULSE DURATION (s) 100 101 Figure 3. Normalized Maximum Transient Thermal Impedance 500 TC = 25oC FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS: IDM, PEAK CURRENT (A) TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION 175 - TC I = I25 150 100 VGS = 10V 20 10-5 10-4 10-3 10-2 t , PULSE WIDTH (s) 10-1 100 101 Figure 4. Peak Current Capability (c)2002 Fairchild Semiconductor Corporation FDD2572 / FDU2572 Rev. B FDD2572 / FDU2572 Typical Characteristics TC = 25C unless otherwise noted 100 1000 STARTING TJ = 25oC IAS, AVALANCHE CURRENT (A) ID, DRAIN CURRENT (A) 10s 100 100s 1ms 10 OPERATION IN THIS AREA MAY BE LIMITED BY rDS(ON) 10ms 1 SINGLE PULSE TJ = MAX RATED TC = 25oC DC STARTING TJ = 150oC 1 If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD) If R 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] 0.1 0.1 1 10 100 VDS, DRAIN TO SOURCE VOLTAGE (V) 0.001 200 1 Figure 6. Unclamped Inductive Switching Capability 60 60 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX VDD = 15V TC = 25oC 40 TJ = 175o C 30 TJ = 25o C 20 VGS = 10V 50 ID, DRAIN CURRENT (A) 50 TJ = -55oC 10 40 VGS = 7V VGS = 6V 30 VGS = 5V 20 10 0 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX 0 3.0 3.5 4.0 4.5 5.0 5.5 6.0 VGS , GATE TO SOURCE VOLTAGE (V) 0 6.5 Figure 7. Transfer Characteristics 1 2 3 4 VDS , DRAIN TO SOURCE VOLTAGE (V) 5 Figure 8. Saturation Characteristics 3.0 60 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX NORMALIZED DRAIN TO SOURCE ON RESISTANCE DRAIN TO SOURCE ON RESISTANCE (m ) 0.01 0.1 tAV, TIME IN AVALANCHE (ms) NOTE: Refer to Fairchild Application Notes AN7514 and AN7515 Figure 5. Forward Bias Safe Operating Area ID , DRAIN CURRENT (A) 10 VGS = 6V 55 50 VGS = 10V 45 40 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX 2.5 2.0 1.5 1.0 0.5 VGS = 10V, ID =9A 0 0 10 20 30 ID, DRAIN CURRENT (A) Figure 9. Drain to Source On Resistance vs Drain Current (c)2002 Fairchild Semiconductor Corporation -80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC) 200 Figure 10. Normalized Drain to Source On Resistance vs Junction Temperature FDD2572 / FDU2572 Rev. B FDD2572 / FDU2572 Typical Characteristics TC = 25C unless otherwise noted 1.2 1.4 VGS = VDS, ID = 250A NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE ID = 250A NORMALIZED GATE THRESHOLD VOLTAGE 1.2 1.0 0.8 0.6 0.4 1.1 1.0 0.9 -80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC) 200 Figure 11. Normalized Gate Threshold Voltage vs Junction Temperature -80 -40 0 40 80 120 160 TJ , JUNCTION TEMPERATURE (oC) 200 Figure 12. Normalized Drain to Source Breakdown Voltage vs Junction Temperature 1000 10 1000 C, CAPACITANCE (pF) VGS , GATE TO SOURCE VOLTAGE (V) VDD = 75V CISS = CGS + CGD COSS CDS + C GD CRSS = CGD 100 VGS = 0V, f = 1MHz 10 8 6 4 WAVEFORMS IN DESCENDING ORDER: ID = 9A ID = 4A 2 0 0.1 1 10 VDS , DRAIN TO SOURCE VOLTAGE (V) Figure 13. Capacitance vs Drain to Source Voltage (c)2002 Fairchild Semiconductor Corporation 150 0 5 10 15 20 Qg , GATE CHARGE (nC) 25 30 Figure 14. Gate Charge Waveforms for Constant Gate Currents FDD2572 / FDU2572 Rev. B BVDSS VDS tP VDS L IAS VDD VARY tP TO OBTAIN + RG REQUIRED PEAK IAS VDD - VGS DUT tP IAS 0V 0 0.01 tAV Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms VDS VDD Qg(TOT) VDS L VGS = 10V VGS + VDD VGS - VGS = 2V DUT Qgs2 0 Ig(REF) Qg(TH) Qgs Qgd Ig(REF) 0 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms VDS tON tOFF td(ON) td(OFF) RL tr VDS tf 90% 90% + VGS VDD - 10% 0 10% DUT 90% RGS VGS 50% 50% PULSE WIDTH VGS 0 Figure 19. Switching Time Test Circuit (c)2002 Fairchild Semiconductor Corporation 10% Figure 20. Switching Time Waveforms FDD2572 / FDU2572 Rev. B FDD2572 / FDU2572 Test Circuits and Waveforms FDD2572 / FDU2572 Thermal Resistance vs. Mounting Pad Area (T -T ) JM A P D M = ----------------------------R JA (EQ. 1) In using surface mount devices such as the TO-252 package, the environment in which it is applied will have a significant influence on the part's current and maximum power dissipation ratings. Precise determination of P DM is complex and influenced by many factors: 1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 125 RJA = 33.32+ 23.84/(0.268+Area) EQ.2 RJA = 33.32+ 154/(1.73+Area) EQ.3 100 RJA (oC/W) The maximum rated junction temperature, TJM , and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM , in an application. Therefore the application's ambient temperature, TA (oC), and thermal resistance RJA (oC/W) must be reviewed to ensure that TJM is never exceeded. Equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. 75 50 25 0.01 (0.0645) 0.1 (0.645) 1 10 (6.45) (64.5) AREA, TOP COPPER AREA in2 (cm2) Figure 21. Thermal Resistance vs Mounting Pad Area 2. The number of copper layers and the thickness of the board. 3. The use of external heat sinks. 4. The use of thermal vias. 5. Air flow and board orientation. 6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in. Fairchild provides thermal information to assist the designer's preliminary application evaluation. Figure 21 defines the RJA for the device as a function of the top copper (component side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized maximum transient thermal impedance curve. Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeter square. The area, in square inches or square centimeters is the top copper area including the gate and source pads. R JA 23.84 ( 0.268 + Area ) = 33.32 + ------------------------------------- (EQ. 2) Area in Inches Squared R JA 154 ( 1.73 + Area ) = 33.32 + ---------------------------------- (EQ. 3) Area in Centimeters Squared (c)2002 Fairchild Semiconductor Corporation FDD2572 / FDU2572 Rev. B rev April 2002 LDRAIN DPLCAP 10 Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD RSLC2 5 51 - Lgate 1 9 1.21e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 4.45e-9 RLDRAIN RSLC1 51 Ebreak 11 7 17 18 160 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 It 8 17 1 DRAIN 2 5 EVTHRES + 19 8 + LGATE GATE 1 ESLC 11 + 17 EBREAK 18 - 50 RDRAIN 6 8 ESG DBREAK + .SUBCKT FDD2572 2 1 3 ; CA 12 8 5.5e-10 Cb 15 14 7.4e-10 Cin 6 8 1.7e-9 EVTEMP RGATE + 18 22 9 20 21 16 DBODY MWEAK 6 MMED MSTRO RLGATE LSOURCE CIN 8 7 RSOURCE RLgate 1 9 12.1 RLdrain 2 5 10 RLsource 3 7 44.5 Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD S1A 12 S2A 13 8 S1B CA 17 18 RVTEMP S2B 13 CB 6 8 5 8 EDS - 19 VBAT + IT 14 + + EGS Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 35e-3 Rgate 9 20 1.6 RSLC1 5 51 RSLCMOD 1.0e-6 RSLC2 5 50 1.0e3 Rsource 8 7 RsourceMOD 3.0e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD RLSOURCE RBREAK 15 14 13 SOURCE 3 - 8 22 RVTHRES Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*52),3))} .MODEL DbodyMOD D (IS=6.0E-11 N=1.14 RS=3.9e-3 TRS1=3.5e-3 TRS2=3.0e-6 + CJO=1.1e-9 M=0.63 TT=6.2e-8 XTI=4.5) .MODEL DbreakMOD D (RS=10 TRS1=5.0e-3 TRS2=-5.0e-6) .MODEL DplcapMOD D (CJO=3.5e-10 IS=1.0e-30 N=10 M=0.65) .MODEL MmedMOD NMOS (VTO=3.55 KP=3 IS=1e-40 N=10 TOX=1 L=1u W=1u RG=1.6) .MODEL MstroMOD NMOS (VTO=4.0 KP=25 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MweakMOD NMOS (VTO=2.95 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=16 RS=0.1) .MODEL RbreakMOD RES (TC1=1.15e-3 TC2=-9.5e-7) .MODEL RdrainMOD RES (TC1=9.0e-3 TC2=2.5e-5) .MODEL RSLCMOD RES (TC1=3.0e-3 TC2=2.5e-6) .MODEL RsourceMOD RES (TC1=4.0e-3 TC2=1.0e-6) .MODEL RvthresMOD RES (TC1=-4.1e-3 TC2=-1.0e-5) .MODEL RvtempMOD RES (TC1=-4.0e-3 TC2=1.0e-6) .MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-5.0 VOFF=-3.5) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3.5 VOFF=-5.0) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=0.3) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=0.3 VOFF=-0.5) .ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. (c)2002 Fairchild Semiconductor Corporation FDD2572 / FDU2572 Rev. B FDD2572 / FDU2572 PSPICE Electrical Model REV April 2002 ttemplate FDD2572 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=6.0e-11,nl=1.14,rs=3.9e-3,trs1=3.5e-3,trs2=3.0e-6,cjo=1.1e-9,m=0.63,tt=6.2e-8,xti=4.5) dp..model dbreakmod = (rs=10,trs1=5.0e-3,trs2=-5.0e-6) dp..model dplcapmod = (cjo=3.5e-10,isl=10.0e-30,nl=10,m=0.65) m..model mmedmod = (type=_n,vto=3.55,kp=3,is=1e-40, tox=1) m..model mstrongmod = (type=_n,vto=4.0,kp=25,is=1e-30, tox=1) LDRAIN m..model mweakmod = (type=_n,vto=2.95,kp=0.05,is=1e-30, tox=1,rs=0.1) DPLCAP 5 DRAIN sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-5.0,voff=-3.5) 2 sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3.5,voff=-5.0) 10 RLDRAIN sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-0.5,voff=0.3) RSLC1 sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=0.3,voff=-0.5) 51 RSLC2 c.ca n12 n8 = 5.5e-10 ISCL c.cb n15 n14 = 7.4e-10 c.cin n6 n8 = 1.7e-9 dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod EVTHRES + 19 8 + LGATE spe.ebreak n11 n7 n17 n18 = 160 GATE 1 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 RDRAIN 6 8 ESG DBREAK 50 - EVTEMP RGATE + 18 22 9 20 21 11 DBODY 16 MWEAK 6 EBREAK + 17 18 - MMED MSTRO RLGATE CIN 8 LSOURCE 7 SOURCE 3 RSOURCE RLSOURCE i.it n8 n17 = 1 S1A 12 l.lgate n1 n9 = 1.21e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 4.45e-9 S2A 13 8 CA 15 14 13 S1B 17 18 RVTEMP S2B 13 CB + res.rlgate n1 n9 = 12.1 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 44.5 RBREAK 6 8 EGS - 19 IT 14 + VBAT 5 8 EDS - m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u + 8 22 RVTHRES res.rbreak n17 n18 = 1, tc1=1.15e-3,tc2=-9.5e-7 res.rdrain n50 n16 = 35e-3, tc1=9.0e-3,tc2=2.5e-5 res.rgate n9 n20 = 1.6 res.rslc1 n5 n51 = 1.0e-6, tc1=3.0e-3,tc2=2.5e-6 res.rslc2 n5 n50 = 1.0e3 res.rsource n8 n7 = 3.0e-3, tc1=4.0e-3,tc2=1.0e-6 res.rvthres n22 n8 = 1, tc1=-4.1e-3,tc2=-1.0e-5 res.rvtemp n18 n19 = 1, tc1=-4.0e-3,tc2=1.0e-6 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/52))** 3))} } (c)2002 Fairchild Semiconductor Corporation FDD2572 / FDU2572 Rev. B FDD2572 / FDU2572 SABER Electrical Model th JUNCTION REV 26 April 2002 FDD2572 CTHERM1 TH 6 3.8e-3 CTHERM2 6 5 4.0e-3 CTHERM3 5 4 4.2e-3 CTHERM4 4 3 4.3e-3 CTHERM5 3 2 8.5e-3 CTHERM6 2 TL 3.0e-2 RTHERM1 CTHERM1 6 RTHERM1 TH 6 5.5e-4 RTHERM2 6 5 5.0e-3 RTHERM3 5 4 4.5e-2 RTHERM4 4 3 10.5e-2 RTHERM5 3 2 3.7e-1 RTHERM6 2 TL 3.8e-1 RTHERM2 CTHERM2 5 SABER Thermal Model SABER thermal model FDD2572 template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =3.8e-3 ctherm.ctherm2 6 5 =4.0e-3 ctherm.ctherm3 5 4 =4.2e-3 ctherm.ctherm4 4 3 =4.3e-3 ctherm.ctherm5 3 2 =8.5e-3 ctherm.ctherm6 2 tl =3.0e-2 rtherm.rtherm1 th 6 =5.5e-4 rtherm.rtherm2 6 5 =5.0e-3 rtherm.rtherm3 5 4 =4.5e-2 rtherm.rtherm4 4 3 =10.5e-2 rtherm.rtherm5 3 2 =3.7e-1 rtherm.rtherm6 2 tl =3.8e-1 } CTHERM3 RTHERM3 4 RTHERM4 CTHERM4 3 RTHERM5 CTHERM5 2 RTHERM6 CTHERM6 tl (c)2002 Fairchild Semiconductor Corporation CASE FDD2572 / FDU2572 Rev. B FDD2572 / FDU2572 SPICE Thermal Model TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. FACTTM ACExTM FACT Quiet SeriesTM ActiveArrayTM FAST(R) BottomlessTM CoolFETTM FASTrTM CROSSVOLTTM FRFETTM DOMETM GlobalOptoisolatorTM EcoSPARKTM GTOTM E2CMOSTM HiSeCTM I2CTM EnSignaTM Across the board. Around the world.TM The Power FranchiseTM Programmable Active DroopTM ImpliedDisconnectTM ISOPLANARTM LittleFETTM MicroFETTM MicroPakTM MICROWIRETM MSXTM MSXProTM OCXTM OCXProTM OPTOLOGIC(R) OPTOPLANARTM PACMANTM POPTM Power247TM PowerTrench(R) QFETTM QSTM QT OptoelectronicsTM Quiet SeriesTM RapidConfigureTM RapidConnectTM SILENT SWITCHER(R) SMART STARTTM SPMTM StealthTM SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SyncFETTM TinyLogicTM TruTranslationTM UHCTM UltraFET(R) VCXTM DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. 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PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I1