COMMUNICATIONS COMPONENTS
Key Features High responsivity in near infrared spectrum
Low dark current for high accuracy
High shunt resistance
Linear over wide range of input optical power
Active diameters of 0.5 and 1 mm
The JDSU ETX 500T and ETX 1000T series large-area InGaAs PIN
photodetectors have photosensitive areas with diameters of 500 and 1000 µm,
respectively. These photodiodes offer high responsivity in the 800 – 1700 nm
spectrum, and are designed for use in instrumentation, sensing, and range-
finding applications.
The detectors feature high sensitivity and linear spectral responsivity over a broad
range of input powers. When operating in photovoltaic mode, a noise current
density of 10 fA/Hz1/2 is typical at room temperature. When reverse-biased for
greater bandwidth, a noise floor of 60fA/Hz1/2 at -5 V is typical. Linear spectral
response results from the low series resistance of the photodiodes.
The ETX 500T and ETX 1000T series are optimal for the high-speed, differential
mode measurements common in precision optical power meters, optical fiber
identifiers, and optical loss test sets.
The ETX 500T and ETX1000T photodiodes are packaged in hermetically-sealed
TO cans.
Applications
Optical power meters
Optical fiber identifiers
Optical attenuation test sets
Near infrared spectroscopy
Infrared range finders
Large-area InGaAs Photodiodes
ETX 500 and ETX 1000 Series
NORTH AMERICA:800 498-JDSU (5378) WEBSITE:www.jdsu.comWORLDWIDE:+800 5378-JDSU
(Specifications in mm unless otherwise noted.)Dimensions Diagram: ETX 500T, ETX 1000T
2
LARGE AREA INGAAS PHOTODIODES
1
23
Electrical Schematic
45°
PIN DIA
1.27
Ø2.54
5.4
25.4
2
3
1.0
4.70
3.20
2.50
0.5
to Chip
Wire Bond
Specifications
3
LARGE AREA INGAAS PHOTODIODES
Parameter ETX 500T ETX 1000T
Electrical and Optical Specifications
Conditions 25 °C, VR= 5 V 25 °C, VR= 5 V
Active diameter Typical 0.5 mm 1.0 mm
Responsivity at 850 nm Minimum 0.10 A/W 0.10 A/W
Typical 0.20 A/W 0.20 A/W
Responsivity at 1300 nm Minimum 0.80 A/W 0.80 A/W
Typical 0.90 A/W 0.90 A/W
Responsivity at 1500 nm Typical 0.95 A/W 0.95 A/W
Dark current Typical 12 nA 50 nA
Maximum 100 nA 400 nA
Shunt resistance1Minimum 5.0 MΩ2.0 MΩ
Typical 250 MΩ50 MΩ
Linearity2Typical ±0.15 dB ±0.15 dB
Total capacitance3Typical 35 pF 100 pF
Maximum 50 pF 150 pF
Bandwidth4Typical 140 MHz 35 MHz
Maximum Ratings
Reverse voltage Typical 20 V 20 V
Reverse current5Typical 10 mA 10 mA
Forward current6Typical 10 mA 10 mA
Power dissipation Typical 100 mW 100 mW
Operating temperature -40 to 85°C -40 to 85°C
Storage temperature -40 to 85°C -40 to 85°C
1. VR= 10 mV
2. For ETX 500T and ETX 1000T, to 9 dBm
3. For ETX 500T and ETX 1000T, VR= 0 V
4. -3 dB point into a 50 Ωload
5. Under reverse bias, current at which device may be damaged
6. Under forward bias, current at which device may be damaged
NORTH AMERICA:800 498-JDSU (5378) WEBSITE:www.jdsu.comWORLDWIDE:+800 5378-JDSU
4
Ordering Information
For more information on this or other products and their availability, please contact your local JDSU account manager or
JDSU directly at 1-800-498-JDSU (5378) in North America and +800-5378-JDSU worldwide, or via e-mail at
customer.service@jdsu.com.
Sample: ETX 500T
LARGE AREA INGAAS PHOTODIODES
Product Code Description
ETX 500T 0.5 mm diode in TO46 package
ETX 1000T 1.0 mm diode in TO46 package
Precaution for Use
Glass windows must be cleaned with 99 percent pure, reagent grade Isopropanol.
ESD PROTECTION IS IMPERATIVE. Use of grounding straps, antistatic mats, and other standard ESD protective
equipment is recommended when handling or testing any InGaAs PIN or any other junction photodiode.
Quality and Reliability
JDSU maintains a strict quality control program throughout the design and manufacturing process of its photodetectors. All
products are evaluated against MIL-STD 883C, GR468, or custom specifications. JDSU purges each photodiode for 18 hours
at 125°C, with bias applied. Long-term life-testing has indicated an expected lifetime of at least 107hours for the large area
InGaAs photodiodes ETX 500 and ETX 1000T. Contact JDSU for details of specific qualification tests performed on the large-
area InGaAs photodiode series.
Product specifications and descriptions in this document subject to change without notice. © 2008 JDS Uniphase Corporation 30137357 002 1108 ETX500.DS.CC.AE November 2008