74F821SPC - Fairchild Semiconductor

April 1988

Revised October 2000

74F821 10-Bit D-Type Flip-F lop

74F821

10-Bit D-Type Flip-Flop

General Description

The 74F821 is a 10-bit D-type flip-flop with 3-STATE true

outputs arranged in a broadside pinout.

Features

■3-STATE Outputs

Ordering Code:

Devices also available in Tape and R eel. Speci fy by append ing the suffix let t er “X” to the orderin g c ode.

Logic Symbols

IEEE/IEC

Connection Diagram

Order Number Package Number Package Description

74F821SC M24B 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide

74F821SPC N24C 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

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74F821

Unit Loading/Fan Out

Functional Description

The 74F821 consists of ten D-type edge-triggered flip-

flops. This device has 3-STATE true outputs for bus sys-

tems or ga nized i n a b ro adside pi nn ing. The buff ere d Cl ock

(CP) and buffered Output Enable (OE) are common to all

flip-flops. The flip-flops will store the state of their individual

D inputs that meet the setup and hold times requirements

on the LOW-to- HIGH CP transition. With th e OE LOW the

cont ent of th e flip-fl ops are availab le at the outputs. When

the OE is HIGH, the outputs go to the high impedance

state. Operatio n of the OE input does not affect the state of

the flip-f l ops.

Function Table

L = LOW Voltage Level

H = HIGH Voltage Level

X = Immateri al

Z = High Impedance



= LOW-to-HIGH Transition

NC = No Change

Logic Diagram

Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.

Pin Names Description U.L. Input IIH/IIL

HIGH/LOW Output IOH/IOL

D0–D9Data Inputs 1.0/1.0 20 µA/−0.6 mA

OE Output Enable 1.0/1.0 20 µA/−0.6 mA

3-STATE Input

CP Clock Input 1.0/1.0 20 µA/−0.6 mA

O0–O93-STATE Outputs 150/40 (33.3) −3.0 mA/24 mA (20 mA)

Inputs Internal Output Function

OE CP D Q O

H H X NC Z Hold

H L X NC Z Hold



L H Z Load



H L Z Load



L H L Data Available



H L H Data Available

L H X NC NC No Change in Data

L L X NC NC No Change in Data

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74F821

Absolute Maximum Ratings(Note 1) Recommended Operating

Conditions

Note 1: Absolute maximum ratings are values beyond which the device

may be damaged or have its useful life impaired. Functional operation

under these conditions is not implied.

Note 2: Eith er v oltage lim it or c urrent limit is sufficie nt to protect inputs.

DC Electrical Characteristics

Storage Temperature −65°C to +150°C

Ambient Temper atu re und er Bias −55°C to +125°C

Junction Temperature under Bias −55°C to +150°C

VCC Pin Potential to Ground Pin −0.5V to +7.0V

Input Voltage (Note 2) −0.5V to +7.0V

Input Current (Note 2) −30 mA to +5.0 mA

Voltage Applied to Output

in HIGH State (with VCC = 0V)

Standa rd Outp ut −0.5V to VCC

3-STATE Output −0.5V to +5.5V

Current Applied to Output

in LOW State (Ma x) twice the rat ed IOL (mA)

Free Air Ambient Temperature 0°C to +70°C

Supply Voltage +4.5V to +5.5V

Symbol Parameter Min Typ Max Units VCC Conditions

VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal

VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal

VCD Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA

VOH Output HIGH 10% VCC 2.5

VMin

IOH = −1 mA

Voltage 10% VCC 2.4 IOH = −3 mA

5% VCC 2.7 IOH = −1 mA

5% VCC 2.7 IOH = −3 mA

VOL Output LOW Voltage 10% VCC 0.5 V Min IOL = 24 mA

IIH Input HIGH Current 5.0 µAMaxV

IN = 2.7 V

IBVI Input HIGH Current 7.0 µAMaxV

IN = 7.0 V

Breakdown Test

ICEX Output HIGH 50 µAMaxV

OUT = VCC

Leakage Current

VID Input Leakage 4.75 V 0.0 IID = 1.9 µA,

Test All Other Pins Grounded

IOD Output Leakage 3.75 µA0.0

VIOD = 150 mV

Circuit Current All Other Pins Grounded

IIL Input LOW Current −0.6 mA Max VIN = 0.5V

IOZH Output Leakage Current 50 µAMaxV

OUT = 2.7V

IOZL Output Leakage Current −50 µAMaxV

OUT = 0.5V

IOS Output Short-Circuit Current −60 −150 mA Max VOUT = 0V

ICCZ Power Supply Current 78 100 mA Max VO = HIGH Z

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74F821

AC Electrical Characteristi cs

AC Operating Requirements

Symbol Parameter

TA = +25°CT

A = −55°C to +125°CT

A = 0°C to +70°C

Units

VCC = +5.0V VCC = +5.0V VCC = +5.0V

CL = 50 pF CL = 50 pF CL = 50 pF

Min Typ Max Min Max Min Max

fMAX Maximum Clock Frequency 100 150 60 70 MHz

tPLH Propagation Delay 2.0 6.4 9.5 2.0 10.5 2.0 10.5 ns

tPHL CP to On2.0 6.2 9.5 2.0 10.5 2.0 10.5

tPZH Output Enable Time 2.0 5.8 10.5 2.0 13.0 2.0 11.5

tPZL OE to On2.0 6.3 10.5 2.0 13.0 2.0 11.5 ns

tPHZ Output Disable Time 1.5 3.4 7.0 1.0 7.5 1.5 7.5

tPLZ OE to On1.53.57.01.07.51.57.5

Symbol Parameter

TA = +25°CT

A = −55°C to +125°CT

A = 0°C to +70°C

UnitsVCC = +5.0V VCC = +5.0V VCC = +5.0V

Min Max Min Max Min Max

tS(H) Setup Time, HIGH or LOW 2.5 4.0 3.0

tS(L) Dn to CP 2.5 4.0 3.0 ns

tH(H) Hold Time, HIGH or LOW 2.5 2.5 2.5

tH(L) Dn to CP 2.5 2.5 2.5

tW(H) CP Pulse Width 5.0 6.0 6.0 ns

tW(L) HIGH or LOW 5.0 6.0 6.0

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74F821

Physical Dimensions inches (millimeters) unless otherwise noted

24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide

Package Number M24B

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74F821 10-Bit D-Type Flip-Flop

Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

Package Number N24C

Fairchild does not assu me any responsibility for use of any circuitry de scribed, no circuit patent licenses are implied and

Fairchild reserves the right at any time without notice to change said circuitry and specifications.

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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT

DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD

SEMICONDUCTOR CORPORATION. As used herein:

1. Life suppor t de vices o r syste ms are devices or syste ms

which, (a) are intended for surgical implant into the

body, or (b) support or sustain life, and (c) whose failure

to perform when properly used in accordance with

instructions for use provided in the labeling, can be rea-

sonably expected to result in a significant injury to the

user.

2. A critical compon ent i n any compon ent of a lif e supp ort

device or system whose failure to perform can be rea-

sonabl y ex pect ed to ca use the fa ilu re of the li fe su pp ort

device or system, or to affect its safety or effectiveness.