A
Microchip Technology Company
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
Data Sheet
www.microchip.com
Features
Single Voltage Read and Write Operations
2.7-3.6V
Serial Interface Architecture
SPI Compatible: Mode 0 and Mode 3
High Speed Clock Frequency
50/66 MHz conditional (see Table 14)
- (SST25VF080B-50-xx-xxxx)
80 MHz
- (SST25VF080B-80-xx-xxxx)
Superior Reliability
Endurance: 100,000 Cycles (typical)
Greater than 100 years Data Retention
Low Power Consumption:
Active Read Current: 10 mA (typical)
Standby Current: 5 µA (typical)
Flexible Erase Capability
Uniform 4 KByte sectors
Uniform 32 KByte overlay blocks
Uniform 64 KByte overlay blocks
Fast Erase and Byte-Program:
Chip-Erase Time: 35 ms (typical)
Sector-/Block-Erase Time: 18 ms (typical)
Byte-Program Time: 7 µs (typical)
Auto Address Increment (AAI) Programming
Decrease total chip programming time over Byte-Pro-
gram operations
End-of-Write Detection
Software polling the BUSY bit in Status Register
Busy Status readout on SO pin in AAI Mode
Hold Pin (HOLD#)
Suspends a serial sequence to the memory
without deselecting the device
Write Protection (WP#)
Enables/Disables the Lock-Down function of the status
register
Software Write Protection
Write protection through Block-Protection bits in status
register
Temperature Range
Commercial: 0°C to +70°C
Industrial: -40°C to +85°C
Packages Available
8-lead SOIC (200 mils)
8-lead SOIC (150 mils)
8-contact WSON (6mm x 5mm)
8-lead PDIP (300 mils)
All devices are RoHS compliant
8 Mbit SPI Serial Flash
SST25VF080B
SST's 25 series Serial Flash family features a four-wire, SPI-compatible interface
that allows for a low pin-count package which occupies less board space and ulti-
mately lowers total system costs. The SST25VF080B devices are enhanced with
improved operating frequency and lower power consumption. SST25VF080B SPI
serial flash memories are manufactured with SST's proprietary, high-performance
CMOS SuperFlash technology. The split-gate cell design and thick-oxide tunnel-
ing injector attain better reliability and manufacturability compared with alternate
approaches.
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
2
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Product Description
SST’s 25 series Serial Flash family features a four-wire, SPI-compatible interface that allows for a low
pin-count package which occupies less board space and ultimately lowers total system costs. The
SST25VF080B devices are enhanced with improved operating frequency and lower power consump-
tion. SST25VF080B SPI serial flash memories are manufactured with SST’s proprietary, high-perfor-
mance CMOS SuperFlash technology. The split-gate cell design and thick-oxide tunneling injector
attain better reliability and manufacturability compared with alternate approaches.
The SST25VF080B devices significantly improve performance and reliability, while lowering power
consumption. The devices write (Program or Erase) with a single power supply of 2.7-3.6V for
SST25VF080B. The total energy consumed is a function of the applied voltage, current, and time of
application. Since for any given voltage range, the SuperFlash technology uses less current to pro-
gram and has a shorter erase time, the total energy consumed during any Erase or Program operation
is less than alternative flash memory technologies.
The SST25VF080B device is offered in 8-lead SOIC (200 mils), 8-lead SOIC (150 mils), 8-contact
WSON (6mm x 5mm), and 8-lead PDIP (300 mils) packages. See Figure 2 for pin assignments.
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
3
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Block Diagram
Figure 1: Functional Block Diagram
1296 B1.0
I/O Buffers
and
Data Latches
SuperFlash
Memory
X - Decoder
Control Logic
Address
Buffers
and
Latches
CE#
Y - Decoder
SCK SI SO WP# HOLD#
Serial Interface
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
4
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Pin Description
Figure 2: Pin Assignments
Table 1: Pin Description
Symbol Pin Name Functions
SCK Serial Clock To provide the timing of the serial interface.
Commands, addresses, or input data are latched on the rising edge of the clock
input, while output data is shifted out on the falling edge of the clock input.
SI Serial Data Input To transfer commands, addresses, or data serially into the device.
Inputs are latched on the rising edge of the serial clock.
SO Serial Data Output To transfer data serially out of the device.
Data is shifted out on the falling edge of the serial clock.
Outputs Flash busy status during AAI Programming when reconfigured as RY/
BY# pin. See “Hardware End-of-Write Detection” on page 13 for details.
CE# Chip Enable The device is enabled by a high to low transition on CE#. CE# must remain low
for the duration of any command sequence.
WP# Write Protect The Write Protect (WP#) pin is used to enable/disable BPL bit in the status register.
HOLD# Hold To temporarily stop serial communication with SPI flash memory without reset-
ting the device.
VDD Power Supply To provide power supply voltage: 2.7-3.6V for SST25VF080B
VSS Ground
T1.0 25045
1
2
3
4
8
7
6
5
CE#
SO
WP#
VSS
VDD
HOLD#
SCK
SI
Top View
1296 08-soic S2A P1.0
1
2
3
4
8
7
6
5
CE#
SO
WP#
VSS
Top View
VDD
HOLD#
SCK
SI
1296 08-wson QA P2.0
8-lead SOIC 8-contact WSON
CE#
SO
WP#
VSS
VDD
HOLD#
SCK
SI
Top View
1296 08-pdip-PA-P3.0
8-lead PDIP
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
5
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Memory Organization
The SST25VF080B SuperFlash memory array is organized in uniform 4 KByte erasable sectors with 32
KByte overlay blocks and 64 KByte overlay erasable blocks.
Device Operation
The SST25VF080B is accessed through the SPI (Serial Peripheral Interface) bus compatible protocol.
The SPI bus consist of four control lines; Chip Enable (CE#) is used to select the device, and data is
accessed through the Serial Data Input (SI), Serial Data Output (SO), and Serial Clock (SCK).
The SST25VF080B supports both Mode 0 (0,0) and Mode 3 (1,1) of SPI bus operations. The difference
between the two modes, as shown in Figure 3, is the state of the SCK signal when the bus master is in
Stand-by mode and no data is being transferred. The SCK signal is low for Mode 0 and SCK signal is
high for Mode 3. For both modes, the Serial Data In (SI) is sampled at the rising edge of the SCK clock
signal and the Serial Data Output (SO) is driven after the falling edge of the SCK clock signal.
Figure 3: SPI Protocol
1296 SPIprot.0
MODE 3
SCK
SI
SO
CE#
MODE 3
DON T CARE
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
MODE 0MODE 0
HIGH IMPEDANCE
MSB
MSB
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
6
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Hold Operation
The HOLD# pin is used to pause a serial sequence underway with the SPI flash memory without reset-
ting the clocking sequence. To activate the HOLD# mode, CE# must be in active low state. The HOLD#
mode begins when the SCK active low state coincides with the falling edge of the HOLD# signal. The
HOLD mode ends when the HOLD# signal’s rising edge coincides with the SCK active low state.
If the falling edge of the HOLD# signal does not coincide with the SCK active low state, then the device
enters Hold mode when the SCK next reaches the active low state. Similarly, if the rising edge of the
HOLD# signal does not coincide with the SCK active low state, then the device exits in Hold mode
when the SCK next reaches the active low state. See Figure 4 for Hold Condition waveform.
Once the device enters Hold mode, SO will be in high-impedance state while SI and SCK can be VIL or VIH.
If CE# is driven active high during a Hold condition, it resets the internal logic of the device. As long as
HOLD# signal is low, the memory remains in the Hold condition. To resume communication with the device,
HOLD# must be driven active high, and CE# must be driven active low. See Figure 24 for Hold timing.
Figure 4: Hold Condition Waveform
Write Protection
SST25VF080B provides software Write protection. The Write Protect pin (WP#) enables or disables
the lock-down function of the status register. The Block-Protection bits (BP3, BP2, BP1, BP0, and BPL)
in the status register provide Write protection to the memory array and the status register. See Table 4
for the Block-Protection description.
Write Protect Pin (WP#)
The Write Protect (WP#) pin enables the lock-down function of the BPL bit (bit 7) in the status register.
When WP# is driven low, the execution of the Write-Status-Register (WRSR) instruction is determined by
the value of the BPL bit (see Table 2). When WP# is high, the lock-down function of the BPL bit is disabled.
Table 2: Conditions to execute Write-Status-Register (WRSR) Instruction
WP# BPL Execute WRSR Instruction
L 1 Not Allowed
L 0 Allowed
H X Allowed
T2.0 25045
Active Hold Active Hold Active
1296 HoldCond.0
SCK
HOLD#
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
7
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Status Register
The software status register provides status on whether the flash memory array is available for any
Read or Write operation, whether the device is Write enabled, and the state of the Memory Write pro-
tection. During an internal Erase or Program operation, the status register may be read only to deter-
mine the completion of an operation in progress. Table 3 describes the function of each bit in the
software status register.
Busy
The Busy bit determines whether there is an internal Erase or Program operation in progress. A “1” for
the Busy bit indicates the device is busy with an operation in progress. A “0” indicates the device is
ready for the next valid operation.
Write Enable Latch (WEL)
The Write-Enable-Latch bit indicates the status of the internal memory Write Enable Latch. If the
Write-Enable-Latch bit is set to “1”, it indicates the device is Write enabled. If the bit is set to “0” (reset),
it indicates the device is not Write enabled and does not accept any memory Write (Program/Erase)
commands. The Write-Enable-Latch bit is automatically reset under the following conditions:
Power-up
Write-Disable (WRDI) instruction completion
Byte-Program instruction completion
Auto Address Increment (AAI) programming is completed or reached its highest unpro-
tected memory address
Sector-Erase instruction completion
Block-Erase instruction completion
Chip-Erase instruction completion
Write-Status-Register instructions
Table 3: Software Status Register
Bit Name Function
Default at
Power-up Read/Write
0 BUSY 1 = Internal Write operation is in progress
0 = No internal Write operation is in progress
0R
1 WEL 1 = Device is memory Write enabled
0 = Device is not memory Write enabled
0R
2 BP0 Indicate current level of block write protection (See Table 4) 1 R/W
3 BP1 Indicate current level of block write protection (See Table 4) 1 R/W
4 BP2 Indicate current level of block write protection (See Table 4) 1 R/W
5 BP3 Indicate current level of block write protection (See Table 4) 0 R/W
6 AAI Auto Address Increment Programming status
1 = AAI programming mode
0 = Byte-Program mode
0R
7 BPL 1 = BP3, BP2, BP1, BP0 are read-only bits
0 = BP3, BP2, BP1, BP0 are read/writable
0 R/W
T3.0 25045
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
8
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Auto Address Increment (AAI)
The Auto Address Increment Programming-Status bit provides status on whether the device is in AAI
programming mode or Byte-Program mode. The default at power up is Byte-Program mode.
Block Protection (BP3,BP2, BP1, BP0)
The Block-Protection (BP3, BP2, BP1, BP0) bits define the size of the memory area, as defined in
Table 4, to be software protected against any memory Write (Program or Erase) operation. The Write-
Status-Register (WRSR) instruction is used to program the BP3, BP2, BP1 and BP0 bits as long as
WP# is high or the Block-Protect-Lock (BPL) bit is 0. Chip-Erase can only be executed if Block-Protec-
tion bits are all 0. After power-up, BP3, BP2, BP1 and BP0 are set to 1.
Block Protection Lock-Down (BPL)
WP# pin driven low (VIL), enables the Block-Protection-Lock-Down (BPL) bit. When BPL is set to 1, it
prevents any further alteration of the BPL, BP3, BP2, BP1, and BP0 bits. When the WP# pin is driven
high (VIH), the BPL bit has no effect and its value is “Don’t Care”. After power-up, the BPL bit is reset to
0.
Table 4: Software Status Register Block Protection for SST25VF080B1
1. X = Don’t Care (RESERVED) default is “0
Protection Level
Status Register Bit2
2. Default at power-up for BP2, BP1, and BP0 is ‘111’. (All Blocks Protected)
Protected Memory Address
BP3 BP2 BP1 BP0 8 Mbit
None X 0 0 0 None
Upper 1/16 X 0 0 1 F0000H-FFFFFH
Upper 1/8 X 0 1 0 E0000H-FFFFFH
Upper 1/4 X 0 1 1 C0000H-FFFFFH
Upper 1/2 X 1 0 0 80000H-FFFFFH
All Blocks X 1 0 1 00000H-FFFFFH
All Blocks X 1 1 0 00000H-FFFFFH
All Blocks X 1 1 1 00000H-FFFFFH
T4.0 25045
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
9
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Instructions
Instructions are used to read, write (Erase and Program), and configure the SST25VF080B. The
instruction bus cycles are 8 bits each for commands (Op Code), data, and addresses. Prior to execut-
ing any Byte-Program, Auto Address Increment (AAI) programming, Sector-Erase, Block-Erase, Write-
Status-Register, or Chip-Erase instructions, the Write-Enable (WREN) instruction must be executed
first. The complete list of instructions is provided in Table 5. All instructions are synchronized off a high
to low transition of CE#. Inputs will be accepted on the rising edge of SCK starting with the most signif-
icant bit. CE# must be driven low before an instruction is entered and must be driven high after the last
bit of the instruction has been shifted in (except for Read, Read-ID, and Read-Status-Register instruc-
tions). Any low to high transition on CE#, before receiving the last bit of an instruction bus cycle, will
terminate the instruction in progress and return the device to standby mode. Instruction commands
(Op Code), addresses, and data are all input from the most significant bit (MSB) first.
Table 5: Device Operation Instructions
Instruction Description Op Code Cycle1
1. One bus cycle is eight clock periods.
Address
Cycle(s)2
2. Address bits above the most significant bit of each density can be VIL or VIH.
Dummy
Cycle(s)
Data
Cycle(s)
Read Read Memory 0000 0011b (03H) 3 0 1 to
High-Speed Read Read Memory at higher
speed
0000 1011b (0BH) 3 1 1 to
4 KByte Sector-Erase3
3. 4KByte Sector Erase addresses: use AMS-A12, remaining addresses are don’t care but must be set either at VIL or VIH.
Erase 4 KByte of
memory array
0010 0000b (20H) 3 0 0
32 KByte Block-Erase4
4. 32KByte Block Erase addresses: use AMS-A15, remaining addresses are don’t care but must be set either at VIL or VIH.
Erase 32 KByte block
of memory array
0101 0010b (52H) 3 0 0
64 KByte Block-Erase5
5. 64KByte Block Erase addresses: use AMS-A16, remaining addresses are don’t care but must be set either at VIL or VIH.
Erase 64 KByte block
of memory array
1101 1000b (D8H) 3 0 0
Chip-Erase Erase Full Memory Array 0110 0000b (60H) or
1100 0111b (C7H)
000
Byte-Program To Program One Data Byte 0000 0010b (02H) 3 0 1
AAI-Word-Program6Auto Address Increment
Programming
1010 1101b (ADH) 3 0 2 to
RDSR7Read-Status-Register 0000 0101b (05H) 0 0 1 to
EWSR Enable-Write-Status-Register 0101b 0000b (50H) 0 0 0
WRSR Write-Status-Register 0000 0001b (01H) 0 0 1
WREN Write-Enable 0000 0110b (06H) 0 0 0
WRDI Write-Disable 0000 0100b (04H) 0 0 0
RDID8Read-ID 1001 0000b (90H) or
1010 1011b (ABH)
301to
JEDEC-ID JEDEC ID read 1001 1111b (9FH) 0 0 3 to
EBSY Enable SO to output RY/BY#
status during AAI programming
0111 0000b (70H) 0 0 0
DBSY Disable SO as RY/BY#
status during AAI programming
1000 0000b (80H) 0 0 0
T5.0 25045
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
10
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Read (25/33 MHz)
The Read instruction, 03H, supports up to 25 MHz (for SST25VF080B-50-xx-xxxx) or 33 MHz (for
SST25VF080B-80-xx-xxxx) Read. The device outputs the data starting from the specified address
location. The data output stream is continuous through all addresses until terminated by a low to high
transition on CE#. The internal address pointer will automatically increment until the highest memory
address is reached. Once the highest memory address is reached, the address pointer will automati-
cally increment to the beginning (wrap-around) of the address space. Once the data from address
location 1FFFFFH has been read, the next output will be from address location 000000H.
The Read instruction is initiated by executing an 8-bit command, 03H, followed by address bits [A23-
A0]. CE# must remain active low for the duration of the Read cycle. See Figure 5 for the Read
sequence.
Figure 5: Read Sequence
6. To continue programming to the next sequential address location, enter the 8-bit command, ADH, followed by 2 bytes of
data to be programmed. Data Byte 0 will be programmed into the initial address [A23-A1] with A0=0, Data Byte 1 will be
programmed into the
initial address [A23-A1] with A0=1.
7. The Read-Status-Register is continuous with ongoing clock cycles until terminated by a low to high transition on CE#.
8. Manufacturer’s ID is read with A0=0, and Device ID is read with A0=1. All other address bits are 00H. The Manufac-
turer’s ID and device ID output stream is continuous until terminated by a low-to-high transition on CE#.
1296 ReadSeq 0.0
CE#
SO
SI
SCK
ADD.
012345678
ADD. ADD.
03
HIGH IMPEDANCE
15 16 23 24 31 32 39 40 7047 48 55 56 63 64
N+2 N+3 N+4N N+1
DOUT
MSB MSB
MSB
MODE 0
MODE 3
DOUT DOUT DOUT DOUT
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
11
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
High-Speed-Read (66/80 MHz)
The High-Speed-Read instruction supporting up to 66 MHz (for SST25VF080B-50-xx-xxxx) or 80 MHz
(for SST25VF040B-80-xx-xxxx) Read is initiated by executing an 8-bit command, 0BH, followed by
address bits [A23-A0] and a dummy byte. CE# must remain active low for the duration of the High-
Speed-Read cycle. See Figure 6 for the High-Speed-Read sequence.
Following a dummy cycle, the High-Speed-Read instruction outputs the data starting from the speci-
fied address location. The data output stream is continuous through all addresses until terminated by a
low to high transition on CE#. The internal address pointer will automatically increment until the high-
est memory address is reached. Once the highest memory address is reached, the address pointer
will automatically increment to the beginning (wrap-around) of the address space. Once the data from
address location FFFFFH has been read, the next output will be from address location 00000H.
Figure 6: High-Speed-Read Sequence
1296 HSRdSeq.0
CE#
SO
SI
SCK
ADD.
012345678
ADD. ADD.0B
HIGH IMPEDANCE
15 16 23 24 31 32 39 40 47 48 55 56 63 64
N+2 N+3 N+4
NN+1
X
MSB
MSB
MSB
MODE 0
MODE 3
DOUT DOUT DOUT DOUT
80
71 72
DOUT
Note: X = Dummy Byte: 8 Clocks Input Dummy Cycle (VIL or VIH)
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
12
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Byte-Program
The Byte-Program instruction programs the bits in the selected byte to the desired data. The selected
byte must be in the erased state (FFH) when initiating a Program operation. A Byte-Program instruction
applied to a protected memory area will be ignored.
Prior to any Write operation, the Write-Enable (WREN) instruction must be executed. CE# must remain
active low for the duration of the Byte-Program instruction. The Byte-Program instruction is initiated by
executing an 8-bit command, 02H, followed by address bits [A23-A0]. Following the address, the data is
input in order from MSB (bit 7) to LSB (bit 0). CE# must be driven high before the instruction is exe-
cuted. The user may poll the Busy bit in the software status register or wait TBP for the completion of
the internal self-timed Byte-Program operation. See Figure 7 for the Byte-Program sequence.
Figure 7: Byte-Program Sequence
1296 ByteProg.0
CE#
SO
SI
SCK
ADD.
012345678
ADD. ADD. DIN
02
HIGH IMPEDANCE
15 16 23 24 31 32 39
MODE 0
MODE 3
MSBMSB
MSB LSB
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
13
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Auto Address Increment (AAI) Word-Program
The AAI program instruction allows multiple bytes of data to be programmed without re-issuing the
next sequential address location. This feature decreases total programming time when multiple bytes
or entire memory array is to be programmed. An AAI Word program instruction pointing to a protected
memory area will be ignored. The selected address range must be in the erased state (FFH) when ini-
tiating an AAI Word Program operation. While within AAI Word Programming sequence, only the fol-
lowing instructions are valid: for software end-of-write detection—AAI Word (ADH), WRDI (04H), and
RDSR (05H); for hardware end-of-write detection—AAI Word (ADH) and WRDI (04H). There are three
options to determine the completion of each AAI Word program cycle: hardware detection by reading
the Serial Output, software detection by polling the BUSY bit in the software status register, or wait TBP.
Refer to“End-of-Write Detection” for details.
Prior to any write operation, the Write-Enable (WREN) instruction must be executed. Initiate the AAI
Word Program instruction by executing an 8-bit command, ADH, followed by address bits [A23-A0]. Fol-
lowing the addresses, two bytes of data are input sequentially, each one from MSB (Bit 7) to LSB (Bit
0). The first byte of data (D0) is programmed into the initial address [A23-A1] with A0=0, the second
byte of Data (D1) is programmed into the initial address [A23-A1] with A0=1. CE# must be driven high
before executing the AAI Word Program instruction. Check the BUSY status before entering the next
valid command. Once the device indicates it is no longer busy, data for the next two sequential
addresses may be programmed, followed by the next two, and so on.
When programming the last desired word, or the highest unprotected memory address, check the busy
status using either the hardware or software (RDSR instruction) method to check for program comple-
tion. Once programming is complete, use the applicable method to terminate AAI. If the device is in
Software End-of-Write Detection mode, execute the Write-Disable (WRDI) instruction, 04H. If the
device is in AAI Hardware End-of-Write Detection mode, execute the Write-Disable (WRDI) instruction,
04H, followed by the 8-bit DBSY command, 80H. There is no wrap mode during AAI programming
once the highest unprotected memory address is reached. See Figures 10 and 11 for the AAI Word
programming sequence.
End-of-Write Detection
There are three methods to determine completion of a program cycle during AAI Word programming:
hardware detection by reading the Serial Output, software detection by polling the BUSY bit in the Soft-
ware Status Register, or wait TBP. The Hardware End-of-Write detection method is described in the
section below.
Hardware End-of-Write Detection
The Hardware End-of-Write detection method eliminates the overhead of polling the Busy bit in the
Software Status Register during an AAI Word program operation. The 8-bit command, 70H, configures
the Serial Output (SO) pin to indicate Flash Busy status during AAI Word programming. (see Figure 8)
The 8-bit command, 70H, must be executed prior to initiating an AAI Word-Program instruction. Once
an internal programming operation begins, asserting CE# will immediately drive the status of the inter-
nal flash status on the SO pin. A ‘0’ indicates the device is busy and a ‘1’ indicates the device is ready
for the next instruction. De-asserting CE# will return the SO pin to tri-state. While in AAI and Hardware
End-of-Write detection mode, the only valid instructions are AAI Word (ADH) and WRDI (04H).
To exit AAI Hardware End-of-Write detection, first execute WRDI instruction, 04H, to reset the Write-
Enable-Latch bit (WEL=0) and AAI bit. Then execute the 8-bit DBSY command, 80H, to disable RY/
BY# status during the AAI command. See Figures 9 and 10.
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
14
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Figure 8: Enable SO as Hardware RY/BY# During AAI Programming
Figure 9: Disable SO as Hardware RY/BY# During AAI Programming
CE#
SO
SI
SCK
01234567
70
HIGH IMPEDANCE
MODE 0
MODE 3
1296 EnableSO.0
MSB
CE#
SO
SI
SCK
01234567
80
HIGH IMPEDANCE
MODE 0
MODE 3
1296 DisableSO.0
MSB
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
15
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Figure 10:Auto Address Increment (AAI) Word-Program Sequence with
Hardware End-of-Write Detection
Figure 11:Auto Address Increment (AAI) Word-Program Sequence with
Software End-of-Write Detection
CE#
SI
SCK
SO
1296 AAI.HW.3
Check for Flash Busy Status to load next valid1command
Load AAI command, Address, 2 bytes data
Note: 1. Valid commands during AAI programming: AAI command or WRDI command
2. User must configure the SO pin to output Flash Busy status during AAI programming
0
AAA
AD D0 AD
MODE 3
MODE 0
D1 D2 D3
7
WREN
EBSY
07078 32 4715 16 23 24 31 04039 7 8 15 16 23
DOUT
WRDI followed by DBSY
to exit AAI Mode
WRDI RDSR
70157 80
DBSY
70
CE# cont.
SI cont.
SCK cont.
SO cont.
Last 2
Data Bytes
AD Dn-1 Dn
7 8 15 16 230
Check for Flash Busy Status to load next valid1command
078 32 4715 16 23 24 31 04039 7 8 15 16 23 7 8 15 16 23 70 157800
CE#
SI
SCK
SO DOUT
MODE 3
MODE 0
1296 AAI.SW.3
Note: 1. Valid commands during AAI programming: AAI command, RDSR command, or WRDI command
Wait TBP or poll Software Status
register to load next valid1command
Last 2
Data Bytes
WRDI to exit
AAI Mode
Load AAI command, Address, 2 bytes data
AAAAD D0 ADD1 D2 D3 AD Dn-1 Dn
WRDI
RDSR
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
16
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
4-KByte Sector-Erase
The Sector-Erase instruction clears all bits in the selected 4 KByte sector to FFH. A Sector-Erase
instruction applied to a protected memory area will be ignored. Prior to any Write operation, the Write-
Enable (WREN) instruction must be executed. CE# must remain active low for the duration of any com-
mand sequence. The Sector-Erase instruction is initiated by executing an 8-bit command, 20H, fol-
lowed by address bits [A23-A0]. Address bits [AMS-A12](A
MS = Most Significant address) are used to
determine the sector address (SAX), remaining address bits can be VIL or VIH. CE# must be driven high
before the instruction is executed. The user may poll the Busy bit in the software status register or wait
TSE for the completion of the internal self-timed Sector-Erase cycle. See Figure 12 for the Sector-
Erase sequence.
Figure 12:Sector-Erase Sequence
CE#
SO
SI
SCK
ADD.
012345678
ADD. ADD.
20
HIGH IMPEDANCE
15 16 23 24 31
MODE 0
MODE 3
1296 SecErase.0
MSBMSB
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
17
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
32-KByte and 64-KByte Block-Erase
The 32-KByte Block-Erase instruction clears all bits in the selected 32 KByte block to FFH. A Block-
Erase instruction applied to a protected memory area will be ignored. The 64-KByte Block-Erase instruc-
tion clears all bits in the selected 64 KByte block to FFH. A Block-Erase instruction applied to a protected mem-
ory area will be ignored. Prior to any Write operation, the Write-Enable (WREN) instruction must be executed.
CE# must remain active low for the duration of any command sequence. The 32-KByte Block-Erase
instruction is initiated by executing an 8-bit command, 52H, followed by address bits [A23-A0]. Address
bits [AMS-A15](A
MS = Most Significant Address) are used to determine block address (BAX), remaining
address bits can be VIL or VIH. CE# must be driven high before the instruction is executed. The 64-KByte Block-
Erase instruction is initiated by executing an 8-bit command D8H, followed by address bits [A23-A0]. Address bits
[AMS-A15] are used to determine block address (BAX), remaining address bits can be VIL or VIH. CE# must be
driven high before the instruction is executed. The user may poll the Busy bit in the software status register or
wait TBE for the completion of the internal self-timed 32-KByte Block-Erase or 64-KByte Block-Erase
cycles. See Figures 13 and 14 for the 32-KByte Block-Erase and 64-KByte Block-Erase sequences.
Figure 13:32-KByte Block-Erase Sequence
Figure 14:64-KByte Block-Erase Sequence
CE#
SO
SI
SCK
ADDR
012345678
ADDR ADDR
52
HIGH IMPEDANCE
15 16 23 24 31
MODE 0
MODE 3
1296 32KBklEr.0
MSB MSB
CE#
SO
SI
SCK
ADDR
012345678
ADDR ADDR
D8
HIGH IMPEDANCE
15 16 23 24 31
MODE 0
MODE 3
1296 63KBlkEr.0
MSB MSB
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
18
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Chip-Erase
The Chip-Erase instruction clears all bits in the device to FFH. A Chip-Erase instruction will be ignored
if any of the memory area is protected. Prior to any Write operation, the Write-Enable (WREN) instruction
must be executed. CE# must remain active low for the duration of the Chip-Erase instruction sequence.
The Chip-Erase instruction is initiated by executing an 8-bit command, 60H or C7H. CE# must be driven
high before the instruction is executed. The user may poll the Busy bit in the software status register or wait
TCE for the completion of the internal self-timed Chip-Erase cycle. See Figure 15 for the Chip-Erase
sequence.
Figure 15:Chip-Erase Sequence
Read-Status-Register (RDSR)
The Read-Status-Register (RDSR) instruction allows reading of the status register. The status register
may be read at any time even during a Write (Program/Erase) operation. When a Write operation is in
progress, the Busy bit may be checked before sending any new commands to assure that the new
commands are properly received by the device. CE# must be driven low before the RDSR instruction is
entered and remain low until the status data is read. Read-Status-Register is continuous with ongoing
clock cycles until it is terminated by a low to high transition of the CE#. See Figure 16 for the RDSR
instruction sequence.
Figure 16:Read-Status-Register (RDSR) Sequence
CE#
SO
SI
SCK
01234567
60 or C7
HIGH IMPEDANCE
MODE 0
MODE 3
1296 ChEr.0
MSB
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14
1296 RDSRseq.0
MODE 3
SCK
SI
SO
CE#
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
05
MODE 0
HIGH IMPEDANCE
Status
Register Out
MSB
MSB
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
19
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Write-Enable (WREN)
The Write-Enable (WREN) instruction sets the Write-Enable-Latch bit in the Status Register to 1 allow-
ing Write operations to occur. The WREN instruction must be executed prior to any Write (Program/
Erase) operation. The WREN instruction may also be used to allow execution of the Write-Status-Reg-
ister (WRSR) instruction; however, the Write-Enable-Latch bit in the Status Register will be cleared
upon the rising edge CE# of the WRSR instruction. CE# must be driven high before the WREN instruc-
tion is executed.
Figure 17:Write Enable (WREN) Sequence
Write-Disable (WRDI)
The Write-Disable (WRDI) instruction resets the Write-Enable-Latch bit and AAI bit to 0 disabling any
new Write operations from occurring. The WRDI instruction will not terminate any programming opera-
tion in progress. Any program operation in progress may continue up to TBP after executing the WRDI
instruction. CE# must be driven high before the WRDI instruction is executed.
Figure 18:Write Disable (WRDI) Sequence
CE#
SO
SI
SCK
01234567
06
HIGH IMPEDANCE
MODE 0
MODE 3
1296 WREN.0
MSB
CE#
SO
SI
SCK
01234567
04
HIGH IMPEDANCE
MODE 0
MODE 3
1296 WRDI.0
MSB
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
20
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Enable-Write-Status-Register (EWSR)
The Enable-Write-Status-Register (EWSR) instruction arms the Write-Status-Register (WRSR)
instruction and opens the status register for alteration. The Write-Status-Register instruction must be
executed immediately after the execution of the Enable-Write-Status-Register instruction. This two-
step instruction sequence of the EWSR instruction followed by the WRSR instruction works like SDP
(software data protection) command structure which prevents any accidental alteration of the status
register values. CE# must be driven low before the EWSR instruction is entered and must be driven
high before the EWSR instruction is executed.
Write-Status-Register (WRSR)
The Write-Status-Register instruction writes new values to the BP3, BP2, BP1, BP0, and BPL bits of
the status register. CE# must be driven low before the command sequence of the WRSR instruction is
entered and driven high before the WRSR instruction is executed. See Figure 19 for EWSR or WREN
and WRSR instruction sequences.
Executing the Write-Status-Register instruction will be ignored when WP# is low and BPL bit is set to
“1”. When the WP# is low, the BPL bit can only be set from “0” to “1” to lock-down the status register,
but cannot be reset from “1” to “0”. When WP# is high, the lock-down function of the BPL bit is disabled
and the BPL, BP0, and BP1 and BP2 bits in the status register can all be changed. As long as BPL bit
is set to 0 or WP# pin is driven high (VIH) prior to the low-to-high transition of the CE# pin at the end of
the WRSR instruction, the bits in the status register can all be altered by the WRSR instruction. In this
case, a single WRSR instruction can set the BPL bit to “1” to lock down the status register as well as
altering the BP0, BP1, and BP2 bits at the same time. See Table 2 for a summary description of WP#
and BPL functions.
Figure 19:Enable-Write-Status-Register (EWSR) or Write-Enable (WREN) and
Write-Status-Register (WRSR) Sequence
1296 EWSR.0
MODE 3
HIGH IMPEDANCE
MODE 0
STATUS
REGISTER IN
76543210
MSBMSBMSB
01
MODE 3
SCK
SI
SO
CE#
MODE 0
50 or 06
0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
21
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
JEDEC Read-ID
The JEDEC Read-ID instruction identifies the device as SST25VF080B and the manufacturer as SST.
The device information can be read from executing the 8-bit command, 9FH. Following the JEDEC
Read-ID instruction, the 8-bit manufacturer’s ID, BFH, is output from the device. After that, a 16-bit
device ID is shifted out on the SO pin. Byte 1, BFH, identifies the manufacturer as SST. Byte 2, 25H,
identifies the memory type as SPI Serial Flash. Byte 3, 8EH, identifies the device as SST25VF080B.
The instruction sequence is shown in Figure 20. The JEDEC Read ID instruction is terminated by a low
to high transition on CE# at any time during data output.
Figure 20:JEDEC Read-ID Sequence
Table 6: JEDEC Read-ID Data
Manufacturer’s ID Device ID
Memory Type Memory Capacity
Byte1 Byte 2 Byte 3
BFH 25H 8EH
T6.0 25045
25 8E
1296 JEDECID.1
CE#
SO
SI
SCK
012345678
HIGH IMPEDANCE
15 1614 28 29 30 31
BF
MODE 3
MODE 0
MSBMSB
9 10111213 1718 32 34
9F
19 20 21 22 23 3324 25 26 27
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
22
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Read-ID (RDID)
The Read-ID instruction (RDID) identifies the devices as SST25VF080B and manufacturer as SST.
This command is backward compatible and should be used as default device identification when multi-
ple versions of SPI Serial Flash devices are used in a design. The device information can be read from
executing an 8-bit command, 90H or ABH, followed by address bits [A23-A0]. Following the Read-ID
instruction, the manufacturer’s ID is located in address 00000H and the device ID is located in address
00001H. Once the device is in Read-ID mode, the manufacturer’s and device ID output data toggles
between address 00000H and 00001H until terminated by a low to high transition on CE#.
Refer to Tables 6 and 7 for device identification data.
Figure 21:Read-ID Sequence
Table 7: Product Identification
Address Data
Manufacturer’s ID 00000H BFH
Device ID
SST25VF080B 00001H 8EH
T7.0 25045
1265 RdID.0
CE#
SO
SI
SCK
00
012345678
00 ADD1
90 or AB
HIGH IMPEDANCE
15 16 23 24 31 32 39 40 47 48 55 56 63
BF Device ID BF Device ID
HIGH
IMPEDANCE
MODE 3
MODE 0
MSB MSB
MSB
Note: The manufacturer’s and device ID output stream is continuous until terminated by a low-to-high transition on
CE#.
Device ID = 8EH for SST25VF080B
100H will output the manufacture’s ID first and 01H will output device ID first before toggling between the two.
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
23
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Electrical Specifications
Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute
Maximum Stress Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these conditions or conditions greater than those defined in the
operational sections of this data sheet is not implied. Exposure to absolute maximum stress rating con-
ditions may affect device reliability.)
Temperature Under Bias .............................................. -55°C to +125°C
Storage Temperature................................................. -65°C to +150°C
D. C. Voltage on Any Pin to Ground Potential .............................-0.5V to VDD+0.5V
Transient Voltage (<20 ns) on Any Pin to Ground Potential ..................-2.0V to VDD+2.0V
Package Power Dissipation Capability (TA= 25°C)................................... 1.0W
Surface Mount Solder Reflow Temperature ...........................260°C for 10 seconds
Output Short Circuit Current1................................................... 50mA
1. Output shorted for no more than one second. No more than one output shorted at a time.
Table 8: Operating Range
Range Ambient Temp VDD
Commercial 0°C to +70°C 2.7-3.6V
Industrial -40°C to +85°C 2.7-3.6V
T8.1 25045
Table 9: AC Conditions of Test1
1. See Figures 26 and 27
Input Rise/Fall Time Output Load
5ns CL=30pF
T9.1 25045
Table 10:DC Operating Characteristics (SST25VF080B-50-xx-xxxx)
Symbol Parameter
Limits
Test ConditionsMin Max Units
IDDR Read Current 10 mA CE#=0.1 VDD/0.9 VDD@25 MHz, SO=open
IDDR2 Read Current 15 mA CE#=0.1 VDD/0.9 VDD@50 MHz, SO=open
IDDW Program and Erase Current 30 mA CE#=VDD
ISB Standby Current 20 µA CE#=VDD,V
IN=VDD or VSS
ILI Input Leakage Current 1 µA VIN=GND to VDD,V
DD=VDD Max
ILO Output Leakage Current 1 µA VOUT=GND to VDD,V
DD=VDD Max
VIL Input Low Voltage 0.8 V VDD=VDD Min
VIH Input High Voltage 0.7 VDD VV
DD=VDD Max
VOL Output Low Voltage 0.2 V IOL=100 µA, VDD=VDD Min
VOL2 Output Low Voltage 0.4 V IOL=1.6 mA, VDD=VDD Min
VOH Output High Voltage VDD-0.2 V IOH=-100 µA, VDD=VDD Min
T10.0 25045
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
24
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Table 11:DC Operating Characteristics (SST25VF080B-80-xx-xxxx)
Symbol Parameter
Limits
Test ConditionsMin Max Units
IDDR Read Current 12 mA CE#=0.1 VDD/0.9 VDD@33 MHz, SO=open
IDDR3 Read Current 20 mA CE#=0.1 VDD/0.9 VDD@80 MHz, SO=open
IDDW Program and Erase Current 30 mA CE#=VDD
ISB Standby Current 20 µA CE#=VDD,V
IN=VDD or VSS
ILI Input Leakage Current 1 µA VIN=GND to VDD,V
DD=VDD Max
ILO Output Leakage Current 1 µA VOUT=GND to VDD,V
DD=VDD Max
VIL Input Low Voltage 0.8 V VDD=VDD Min
VIH Input High Voltage 0.7 VDD VV
DD=VDD Max
VOL Output Low Voltage 0.2 V IOL=100 µA, VDD=VDD Min
VOL2 Output Low Voltage 0.4 V IOL=1.6 mA, VDD=VDD Min
VOH Output High Voltage VDD-0.2 V IOH=-100 µA, VDD=VDD Min
T11.0 25045
Table 12:Capacitance (TA= 25°C, f=1 Mhz, other pins open)
Parameter Description Test Condition Maximum
COUT1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Output Pin Capacitance VOUT =0V 12pF
CIN1Input Capacitance VIN =0V 6pF
T12.0 25045
Table 13:Reliability Characteristics
Symbol Parameter Minimum Specification Units Test Method
NEND1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Endurance 10,000 Cycles JEDEC Standard A117
TDR1Data Retention 100 Years JEDEC Standard A103
ILTH1Latch Up 100 + IDD mA JEDEC Standard 78
T13.0 25045
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
25
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Table 14:AC Operating Characteristics (SST25VF080B-50-xx-xxxx)
25 MHz 50 MHz 66 MHz1,2
Symbo
l Parameter Min Max Min Max Min Max Units
FCLK3Serial Clock Frequency 25 50 66 MHz
TSCKH Serial Clock High Time 18 9 7 ns
TSCKL Serial Clock Low Time 18 9 7 ns
TSCKR4Serial Clock Rise Time (Slew
Rate)
0.1 0.1 0.1 V/ns
TSCKF Serial Clock Fall Time (Slew
Rate)
0.1 0.1 0.1 V/ns
TCES5CE# Active Setup Time 10 5 4 ns
TCEH5CE# Active Hold Time 10 5 4 ns
TCHS5CE# Not Active Setup Time 10 5 4 ns
TCHH5CE# Not Active Hold Time 10 5 4 ns
TCPH CE# High Time 100 50 100 ns
TCHZ CE# High to High-Z Output 15 8 6 ns
TCLZ SCK Low to Low-Z Output 0 0 0 ns
TDS Data In Setup Time 5 2 2 ns
TDH Data In Hold Time 5 5 3 ns
THLS HOLD# Low Setup Time 10 5 4 ns
THHS HOLD# High Setup Time 10 5 4 ns
THLH HOLD# Low Hold Time 10 5 4 ns
THHH HOLD# High Hold Time 10 5 4 ns
THZ HOLD# Low to High-Z Output 20 8 8 ns
TLZ HOLD# High to Low-Z Output 15 8 8 ns
TOH Output Hold from SCK Change 0 0 0 ns
TVOutput Valid from SCK 15 8 6 ns
TSE Sector-Erase 25 25 25 ms
TBE Block-Erase 25 25 25 ms
TSCE Chip-Erase 50 50 50 ms
TBP Byte-Program 10 10 10 µs
T14.0 25045
1. VDD =3.0-3.6V,CL=15pF
2. Characterized, but not fully tested
3. Maximum clock frequency for Read Instruction, 03H, is 25 MHz
4. Maximum Rise and Fall time may be limited by TSCKH and TSCKL requirements
5. Relative to SCK.
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
26
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Table 15:AC Operating Characteristics (SST25VF080B-80-xx-xxxx)
33 MHz 80 MHz
Symbol Parameter Min Max Min Max Units
FCLK1Serial Clock Frequency 33 80 MHz
TSCKH Serial Clock High Time 13 6 ns
TSCKL Serial Clock Low Time 13 6 ns
TSCKR2Serial Clock Rise Time (Slew Rate) 0.1 0.1 V/ns
TSCKF Serial Clock Fall Time (Slew Rate) 0.1 0.1 V/ns
TCES3CE# Active Setup Time 5 5 ns
TCEH5CE# Active Hold Time 5 5 ns
TCHS5CE# Not Active Setup Time 5 5 ns
TCHH5CE# Not Active Hold Time 5 5 ns
TCPH CE# High Time 50 50 ns
TCHZ CE# High to High-Z Output 7 7 ns
TCLZ SCK Low to Low-Z Output 0 0 ns
TDS Data In Setup Time 2 2 ns
TDH Data In Hold Time 4 4 ns
THLS HOLD# Low Setup Time 5 5 ns
THHS HOLD# High Setup Time 5 5 ns
THLH HOLD# Low Hold Time 5 5 ns
THHH HOLD# High Hold Time 5 5 ns
THZ HOLD# Low to High-Z Output 7 7 ns
TLZ HOLD# High to Low-Z Output 7 7 ns
TOH Output Hold from SCK Change 0 0 ns
TVOutput Valid from SCK 10 6 ns
TSE Sector-Erase 25 25 ms
TBE Block-Erase 25 25 ms
TSCE Chip-Erase 50 50 ms
TBP Byte-Program 10 10 µs
T15.0 25045
1. Maximum clock frequency for Read Instruction, 03H, is 33 MHz
2. Maximum Rise and Fall time may be limited by TSCKH and TSCKL requirements
3. Relative to SCK.
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
27
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Figure 22:Serial Input Timing Diagram
Figure 23:Serial Output Timing Diagram
Figure 24:Hold Timing Diagram
HIGH-Z HIGH-Z
CE#
SO
SI
SCK
MSB LSB
TDS TDH
TCHH TCES TCEH TCHS
TSCKR
TSCKF
TCPH
1296 SerIn.0
1296 SerOut.0
CE#
SI
SO
SCK
MSB
TCLZ
TV
TSCKH
TCHZ
TOH
TSCKL
LSB
THZ TLZ
THHH THLS THHS
1296 Hold.0
HOLD#
CE#
SCK
SO
SI
THLH
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
28
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Power-Up Specifications
All functionalities and DC specifications are specified for a VDD ramp rate of greater than 1V per 100
ms (0v - 3.0V in less than 300 ms). See Table 16 and Figure 25 for more information.
Figure 25:Power-up Timing Diagram
Table 16:Recommended System Power-up Timings
Symbol Parameter Minimum Units
TPU-READ1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
VDD Min to Read Operation 100 µs
TPU-WRITE1VDD Min to Write Operation 100 µs
T16.0 25045
Time
VDD Min
VDD Max
VDD
Device fully accessible
TPU-READ
TPU-WRITE
Chip selection is not allowed.
Commands may not be accepted or properly
interpreted by the device.
1296 PwrUp.0
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
29
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Figure 26:AC Input/Output Reference Waveforms
Figure 27:A Test Load Example
1296 IORef.0
REFERENCE POINTS OUTPUTINPUT
VHT
VLT
VHT
VLT
VIHT
VILT
AC test inputs are driven at VIHT (0.9VDD) for a logic “1” and VILT (0.1VDD) for a logic “0”. Measure-
ment reference points for inputs and outputs are VHT (0.6VDD) and VLT (0.4VDD). Input rise and fall
times (10% 90%) are <5 ns.
Note: VHT -V
HIGH Test
VLT -V
LOW Test
VIHT -V
INPUT HIGH
Test
1296 TstLd.0
TO TESTER
TO DUT
C
L
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
30
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Product Ordering Information
SST 25 VF 080B - 80 - 4C - S2AE
XX XX XXXX - XX - XX -XXXX
Environmental Attribute
E1= non-Pb / non-Sn contact (lead) finish
F2= non-Pb / non-Sn contact (lead) finish:
Nickel plating with Gold top (outer) layer
Package Modifier
A = 8 leads or contacts
Package Type
S = SOIC 150 mil body width
S2 = SOIC 200 mil body width
Q = WSON
P= PDIP 300 mil body width
Temperature Range
C = Commercial = 0°C to +70°C
I = Industrial = -40°C to +85°C
Minimum Endurance
4 = 10,000 cycles
Operating Frequency
50 = 50 MHz
80 = 80 MHz
Device Density
080 = 8 Mbit
Voltage
V = 2.7-3.6V
Product Series
25 = Serial Peripheral Interface flash
memory
1. Environmental suffix “E” denotes non-Pb solder.
SST non-Pb solder devices are “RoHS Compliant”.
2. Environmental suffix “F” denotes non-Pb/non-SN
solder. SST non-Pb/non-Sn solder devices are
“RoHS Compliant”.
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
31
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Valid Combinations for SST25VF080B
SST25VF080B-50-4C-S2AF SST25VF080B-50-4C-QAF SST25VF080B-50-4C-PAE
SST25VF080B-50-4I-S2AF SST25VF080B-50-4I-QAF
SST25VF080B-80-4C-S2AE SST25VF080B-80-4C-QAE
SST25VF080B-80-4I-S2AE SST25VF080B-80-4I-QAE
SST25VF080B-80-4C-SAE
SST25VF080B-80-4I-SAE
Note:Valid combinations are those products in mass production or will be in mass production. Consult your SST sales rep-
resentative to confirm availability of valid combinations and to determine availability of new combinations.
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
32
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Packaging Diagrams
Figure 28: 8-lead Small Outline Integrated Circuit (SOIC) 200 mil body width (5.2mm x 8mm)
SST Package Code: S2A
2.16
1.75
08-soic-EIAJ-S2A-3
Note: 1. All linear dimensions are in millimeters (max/min).
2. Coplanarity: 0.1 mm
3. Maximum allowable mold flash is 0.15 mm at the package ends and 0.25 mm between leads.
TOP VIEW SIDE VIEW
END VIEW
5.40
5.15
8.10
7.70
5.40
5.15
Pin #1
Identifier
0.50
0.35
1.27 BSC
0.25
0.05
0.25
0.19
0.80
0.50
1mm
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
33
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Figure 29: 8-lead Small Outline Integrated Circuit (SOIC) 150 mil body width (4.9mm x 6mm)
SST Package Code: SA
08-soic-5x6-SA-8
Note: 1. Complies with JEDEC publication 95 MS-012 AA dimensions,
although some dimensions may be more stringent.
2. All linear dimensions are in millimeters (max/min).
3. Coplanarity: 0.1 mm
4. Maximum allowable mold flash is 0.15 mm at the package ends and 0.25 mm between leads.
TOP VIEW SIDE VIEW
END VIEW
5.0
4.8
6.20
5.80
4.00
3.80
Pin #1
Identifier
0.51
0.33
1.27 BSC
0.25
0.10
1.75
1.35
4 places
0.25
0.19
1.27
0.40
45°
4 places
1mm
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
34
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Figure 30:8-contact Very-very-thin Small Outline No-lead (WSON)
SST Package Code: QA
Note: 1. All linear dimensions are in millimeters (max/min).
2. Untoleranced dimensions (shown with box surround)
are nominal target dimensions.
3. The external paddle is electrically connected to the
die back-side and possibly to certain VSS leads.
This paddle can be soldered to the PC board;
it is suggested to connect this paddle to the VSS of the unit.
Connection of this paddle to any other voltage potential can
result in shorts and/or electrical malfunction of the device.
8-wson-5x6-QA-9.0
4.0
1.27 BSC
Pin #1
0.48
0.35
0.076
3.4
5.00 ±0.10
6.00 ± 0.10 0.05 Max
0.70
0.50
0.80
0.70
0.80
0.70
Pin #1
Corner
TOP VIEW BOTTOM VIEW
CROSS SECTION
SIDE VIEW
1mm
0.2
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
35
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Figure 31:8-lead Plastic Dual In-Line Pins (PDIP)
SST Package Code: PA
8-pdip-PA-1.0
Note: 1. Complies with JEDEC publication 95 MS-001 BA dimensions, although some dimensions may be more stringent.
2. All linear dimensions are in inches (min/max).
3. Dimensions do not include mold flash. Maximum allowable mold flash is .010 inches.
TOP VIEW
SIDE VIEW END VIEW
0.25 inches
0.355
0.400
0.245
0.260
0.100 BSC
0.056
0.064
0.014
0.022
0.126
0.142
0.015 min
0.115
0.150
0.300
0.325
0.335
0.375
0.008
0.014
Pin 1
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
36
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
Table 17:Revision History
Revision Description Date
00 Initial release of data sheet Sep 2005
01 Migrated document to a Data Sheet
Updated Surface Mount Solder Reflow Temperature information
Jan 2006
02 Updated Features
Updated Table 5 on page 9
Updated “High-Speed-Read (66/80 MHz)” on page 11
Updated Table 14 on page 25
Jun 2007
03 Modified “Features”, “Product Description”, “Pin Description”, “Product
Ordering Information”, and “Packaging Diagrams” to include the PAE
package.
Updated Figures 10 and 11 on page 15.
Mar 2009
04 Added 80 MHz High Speed Clock Frequency to Features
Removed Maximum Frequency from Table 5 on page 9
Edited “Read (25/33 MHz)” on page 10 and “High-Speed-Read (66/80
MHz)” on page 11.
Added Table 11 on page 24 and Table 15 on page 26
Edited Product Ordering Information
Added Valid Combinations SST25VF080B-80-4C-S2AE,
SST25VF080B-80-4I-S2AE, SST25VF080B-80-4C-QAE, and
SST25VF080B-80-4I-QAE
Jan 2010
05 Updated “Auto Address Increment (AAI) Word-Program”, “End-of-Write
Detection”, and “Hardware End-of-Write Detection” on page 13.
Revised Figures 10 and 11 on page 15.
Updated document to new format.
Added SAE package drawing on page 33 and SAE information to “Prod-
uct Ordering Information” on page 30
Feb 2011
AAdded “Power-Up Specifications” on page 28
Updated Table 16 on page 28
Released document under letter revision system
Updated Spec number from S71296 to DS25045
Sep 2011
©2011 Silicon Storage Technology, Inc. DS25045A 09/11
37
8 Mbit SPI Serial Flash
SST25VF080B
Data Sheet
A
Microchip Technology Company
©
2011 Silicon Storage Technology, Inc–a Microchip Technology Company. All rights reserved.
SST, Silicon Storage Technology, the SST logo, SuperFlash, MTP, and FlashFlex are registered trademarks of Silicon Storage Tech-
nology, Inc. MPF, SQI, Serial Quad I/O, and Z-Scale are trademarks of Silicon Storage Technology, Inc. All other trademarks and
registered trademarks mentioned herein are the property of their respective owners.
Specifications are subject to change without notice. Refer to www.microchip.com for the most recent documentation. For the most current
package drawings, please see the Packaging Specification located at http://www.microchip.com/packaging.
Memory sizes denote raw storage capacity; actual usable capacity may be less.
SST makes no warranty for the use of its products other than those expressly contained in the Standard Terms and Conditions of
Sale.
For sales office locations and information, please see www.microchip.com.
Silicon Storage Technology, Inc.
A Microchip Technology Company
www.microchip.com
ISBN:978-1-61341-648-8