Dual, 12-/14-/16-Bit nanoDACs® with
5 ppm/°C On-Chip Reference, I2C® Interface
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700 www.analog.com
Fax: 781.461.3113 ©2007 Analog Devices, Inc. All rights reserved.
FEATURES
Low power, smallest pin-compatible, dual nanoDACs
AD5627R/AD5647R/AD5667R
12-/14-/16-bit
On-chip 1.25 V/2.5 V, 5 ppm/°C reference
AD5627/AD5667
12-/16-bit
External reference only
3 mm x 3 mm LFCSP and 10-lead MSOP
2.7 V to 5.5 V power supply
Guaranteed monotonic by design
Power-on reset to zero scale
Per channel power-down
Hardware LDAC and CLR functions
I2C-compatible serial interface supports standard (100 kHz),
fast (400 kHz), and high speed (3.4 MHz) modes
APPLICATIONS
Process control
Data acquisition systems
Portable battery-powered instruments
Digital gain and offset adjustment
Programmable voltage and current sources
Programmable attenuators
FUNCTIONAL BLOCK DIAGRAMS
INTERFACE
LOGIC
SDA
SCL
A
DDR
V
DD GND
POWER-ON
RESET
1.25V/2.5V REF
V
REFIN
/
VREFOUT
AD5627R/AD5647R/AD5667R
POWER-DOWN
LOGIC
INPUT
REGISTER
DAC
REGISTER
STRING
DAC A VOUTA
BUFFER
INPUT
REGISTER
DAC
REGISTER
STRING
DAC B VOUTB
LDAC CLR
BUFFER
06342-001
Figure 1. AD5627R/AD5647R/AD5667R
INTERFACE
LOGIC
SDA
SCL
A
DDR
V
DD
GND
POWER-ON
RESET
V
REFIN
AD5627/AD5667
POWER-DOWN
LOGIC
INPUT
REGISTER
DAC
REGISTER
STRING
DAC A V
OUT
A
BUFFER
INPUT
REGISTER
DAC
REGISTER
STRING
DAC B V
OUT
B
LDAC CLR
BUFFER
06342-002
Figure 2. AD5627/AD5667
GENERAL DESCRIPTION
The AD5627R/AD5647R/AD5667R, AD5627/AD5667
members of the nanoDAC family are low power, dual, 12-, 14-,
16-bit buffered voltage-out DACs with/without on-chip
reference. All devices operate from a single 2.7 V to 5.5 V
supply, are guaranteed monotonic by design, and have an I2C-
compatible serial interface.
The AD5627R/AD5647R/AD5667R have an on-chip reference.
The AD56x7RBCPZ have a 1.25 V, 5 ppm/°C reference, giving a
full-scale output range of 2.5 V; the AD56x7RBRMZ have a
2.5 V, 5 ppm/°C reference, giving a full-scale output range of 5
V. The on-chip reference is off at power-up, allowing the use of
an external reference. The internal reference is enabled via a
software write. The AD5667 and AD5627 require an external
reference voltage to set the output range of the DAC.
The AD56x7R/AD56x7 incorporate a power-on reset circuit
that ensures the DAC output powers up to 0 V, and remains
there until a valid write takes place. The part contains a per-
channel power-down feature that reduces the current
consumption of the device to 480 nA at 5 V and provides
software-selectable output loads while in power-down mode.
The low power consumption of this part in normal operation
makes it ideally suited to portable battery-operated equipment.
The on-chip precision output amplifier enables rail-to-rail
output swing.
The AD56x7R/AD56x7 use a 2-wire I2C-compatible serial
interface that operates in standard (100 kHz), fast (400 kHz),
and high speed (3.4 MHz) modes.
Table 1. Related Devices
Part No. Description
AD5663 2.7 V to 5.5 V, dual 16-bit DAC,
external reference, SPI® interface
AD5623R/AD5643R/AD5663R 2.7 V to 5.5 V, dual 12-, 14-, 16-bit
DACs, internal reference,
SPI interface
AD5625R/AD5645R/AD5665R,
AD5625/AD5665
2.7 V to 5.5 V, quad 12-, 14-, 16-bit
DACs, with/without internal
reference, I2C interface
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 2 of 32
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications....................................................................................... 1
Functional Block Diagrams............................................................. 1
General Description......................................................................... 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
AC Characteristics........................................................................ 5
I2C Timing Specifications............................................................ 6
Absolute Maximum Ratings............................................................ 8
ESD Caution.................................................................................. 8
Pin Configuration and Function Descriptions............................. 9
Typical Performance Characteristics ........................................... 10
Terminology .................................................................................... 18
Theory of Operation ...................................................................... 20
D/A Section................................................................................. 20
Resistor String............................................................................. 20
Output Amplifier........................................................................ 20
Internal reference........................................................................ 20
External reference....................................................................... 20
Serial Interface............................................................................ 21
Write Operation.......................................................................... 21
Read Operation........................................................................... 21
High Speed Mode....................................................................... 21
Input Shift Register .................................................................... 23
Multiple Byte Operation............................................................ 23
Broadcast Mode.......................................................................... 23
LDAC Function .......................................................................... 23
Power-Down Modes .................................................................. 25
Power-On Reset and Software Reset ....................................... 26
Clear Pin (CLR).......................................................................... 26
Internal Reference Setup (R Versions) .................................... 26
Application Information................................................................ 27
Using a Reference as a Power Supply for the
AD56x7R/AD56x7..................................................................... 27
Bipolar Operation Using the AD56x7R/AD56x7.................. 27
Power Supply Bypassing and Grounding................................ 27
Outline Dimensions....................................................................... 28
Ordering Guide .......................................................................... 29
REVISION HISTORY
1/07—Revision 0: Initial Version
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 3 of 32
SPECIFICATIONS
VDD = 2.7 V to 5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; VREFIN = VDD; all specifications TMIN to TMAX, unless otherwise noted.
Table 2.
Parameter Min Typ Max Unit Conditions/Comments1
STATIC PERFORMANCE2
AD5667R/AD5667
Resolution 16 Bits
Relative Accuracy ±8 ±12 LSB
Differential Nonlinearity ±1 LSB Guaranteed monotonic by design
AD5647R
Resolution 14 Bits
Relative Accuracy ±2 ±4 LSB
Differential Nonlinearity ±0.5 LSB Guaranteed monotonic by design
AD5627R/AD5627
Resolution 12 Bits
Relative Accuracy ±0.5 ±1 LSB
Differential Nonlinearity ±0.25 LSB Guaranteed monotonic by design
Zero-Code Error 2 10 mV All 0s loaded to DAC register
Offset Error ±1 ±10 mV
Full-Scale Error −0.1 ±1 % of FSR All 1s loaded to DAC register
Gain Error ±1.5 % of FSR
Zero-Code Error Drift ±2 µV/°C
Gain Temperature Coefficient ±2.5 ppm Of FSR/°C
DC Power Supply Rejection Ratio −100 dB DAC code = midscale ; VDD = 5 V ± 10%
DC Crosstalk (External Reference) 15 µV Due to full-scale output change,
RL = 2 kΩ to GND or 2 kΩ to VDD
10 µV/mA Due to load current change
8 µV Due to powering down (per channel)
DC Crosstalk (Internal Reference) 25 µV Due to full-scale output change,
RL = 2 kΩ to GND or 2 kΩ to VDD
20 µV/mA Due to load current change
10 µV Due to powering down (per channel)
OUTPUT CHARACTERISTICS3
Output Voltage Range 0 VDD V
Capacitive Load Stability 2 nF RL = ∞
10 nF RL = 2 kΩ
DC Output Impedance 0.5
Short-Circuit Current 30 mA VDD = 5 V
Power-Up Time 4 µs Coming out of power-down mode; VDD = 5 V
REFERENCE INPUTS
Reference Current 110 130 µA VREF = VDD = 5.5 V
Reference Input Range 0.75 VDD V
Reference Input Impedance 50 kΩ
REFERENCE OUTPUT
(LFCSP_WD PACKAGE)
Output Voltage 1.247 1.253 V At ambient
Reference TC3 ±10 ppm/°C
Output Impedance 7.5 kΩ
REFERENCE OUTPUT (MSOP PACKAGE)
Output Voltage 2.495 2.505 V At ambient
Reference TC3 ±5 ±10 ppm/°C
Output Impedance 7.5 kΩ
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 4 of 32
Parameter Min Typ Max Unit Conditions/Comments1
LOGIC INPUTS (ADDR, CLR, LDAC)3
IIN, Input Current ±1 µA
VINL, Input Low Voltage 0.15 × VDD V
VINH, Input High Voltage 0.85 × VDD V
CIN, Pin Capacitance 2 pF ADDR
20 pF
CLR, LDAC
VHYST, Input Hysteresis 0.1 × VDD V
LOGIC INPUTS (SDA, SCL)
IIN, Input Current ±1 µA
VINL, Input Low Voltage 0.3 × VDD V
VINH, Input High Voltage 0.7 × VDD V
CIN, Pin Capacitance 2 pF
VHYST, Input Hysteresis 0.1 × VDD V
LOGIC OUTPUTS (OPEN-DRAIN)
VOL, Output Low Voltage 0.4 V ISINK = 3 mA
0.6 V ISINK = 6 mA
Floating-State Leakage Current ±1 µA
Floating-State Output Capacitance 2 pF
POWER REQUIREMENTS
VDD 2.7 5.5 V
IDD (Normal Mode)4 V
IH = VDD, VIL = GND
VDD = 4.5 V to 5.5 V 0.4 0.5 mA Internal reference off
VDD = 2.7 V to 3.6 V 0.35 0.45 mA Internal reference off
VDD = 4.5 V to 5.5 V 0.95 1.15 mA Internal reference on
VDD = 2.7 V to 3.6 V 0.8 0.95 mA Internal reference on
IDD (All Power-Down Modes)5 0.48 1 µA VIH = VDD, VIL = GND
1 Temperature range: B grade: −40°C to +105°C.
2 Linearity calculated using a reduced code range: AD5567R/AD5667 (Code 512 to Code 65,024); AD5647R (Code 128 to Code 16,256); AD5627R/AD5627 (Code 32 to
Code 4064). Output unloaded.
3 Guaranteed by design and characterization, not production tested.
4 Interface inactive. All DACs active. DAC outputs unloaded.
5 All DACs powered down.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 5 of 32
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; VREFIN = VDD; all specifications TMIN to TMAX, unless otherwise noted.1
Table 3.
Parameter2Min Typ Max Unit Conditions/Comments3
Output Voltage Settling Time
AD5627R/AD5627 3 4.5 µs ¼ to ¾ scale settling to ±0.5 LSB
AD5647R 3.5 5 µs ¼ to ¾ scale settling to ±0.5 LSB
AD5667R/AD5667 4 7 µs ¼ to ¾ scale settling to ±2 LSB
Slew Rate 1.8 V/µs
Digital-to-Analog Glitch Impulse 15 nV-s 1 LSB change around major carry transition
Digital Feedthrough 0.1 nV-s
Reference Feedthrough −90 dB VREF = 2 V ± 0.1 V p-p, frequency 10 Hz to 20 MHz
Digital Crosstalk 0.1 nV-s
Analog Crosstalk 1 nV-s External reference
4 nV-s Internal reference
DAC-to-DAC Crosstalk 1 nV-s External reference
4 nV-s Internal reference
Multiplying Bandwidth 340 kHz VREF = 2 V ± 0.1 V p-p
Total Harmonic Distortion −80 dB VREF = 2 V ± 0.1 V p-p, frequency = 10 kHz
Output Noise Spectral Density 120 nV/√Hz DAC code = midscale, 1 kHz
100 nV/√Hz DAC code = midscale, 10 kHz
Output Noise 15 µV p-p 0.1 Hz to 10 Hz
1 Guaranteed by design and characterization, not production tested.
2 See the Terminology section.
3 Temperature range is −40°C to +105°C, typical @ 25°C.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 6 of 32
I2C TIMING SPECIFICATIONS
VDD = 2.7 V to 5.5 V; all specifications TMIN to TMAX, fSCL = 3.4 MHz, unless otherwise noted.1
Table 4.
Parameter Conditions2 Min Max Unit Description
fSCL3 Standard mode 100 kHz Serial clock frequency
Fast mode 400 kHz
High speed mode, CB = 100 pF 3.4 MHz
High speed mode, CB = 400 pF 1.7 MHz
t1 Standard mode 4 s tHIGH, SCL high time
Fast mode 0.6 s
High speed mode, CB = 100 pF 60 ns
High speed mode, CB = 400 pF 120 ns
t2 Standard mode 4.7 s tLOW, SCL low time
Fast mode 1.3 s
High speed mode, CB = 100 pF 160 ns
High speed mode, CB = 400 pF 320 ns
t3 Standard mode 250 ns tSU;DAT, data setup time
Fast mode 100 ns
High speed mode 10 ns
t4 Standard mode 0 3.45 s tHD;DAT, data hold time
Fast mode 0 0.9 s
High speed mode, CB = 100 pF 0 70 ns
High speed mode, CB = 400 pF 0 150 ns
t5 Standard mode 4.7 s tSU;STA, setup time for a repeated start condition
Fast mode 0.6 s
High speed mode 160 ns
t6 Standard mode 4 s tHD;STA, hold time (repeated) start condition
Fast mode 0.6 s
High speed mode 160 ns
t7 Standard mode 4.7 s tBUF, bus free time between a stop and a start condition
Fast mode 1.3 s
t8 Standard mode 4 s tSU;STO, setup time for a stop condition
Fast mode 0.6 s
High speed mode 160 ns
t9 Standard mode 1000 ns tRDA, rise time of SDA signal
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns
High speed mode, CB = 400 pF 20 160 ns
t10 Standard mode 300 ns tFDA, fall time of SDA signal
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns
High speed mode, CB = 400 pF 20 160 ns
t11 Standard mode 1000 ns tRCL, rise time of SCL signal
Fast mode 300 ns
High speed mode, CB = 100 pF 10 40 ns
High speed mode, CB = 400 pF 20 80 ns
t11A Standard mode 1000 ns tRCL1, rise time of SCL signal after a repeated start condition and after
an acknowledge bit
Fast mode 300 ns
High speed mode, CB = 100 pF 10 80 ns
High speed mode, CB = 400 pF 20 160 ns
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 7 of 32
Parameter Conditions2 Min Max Unit Description
t12 Standard mode 300 ns tFCL, fall time of SCL signal
Fast mode 300 ns
High speed mode, CB = 100 pF 10 40 ns
High speed mode, CB = 400 pF 20 80 ns
t13 Standard mode 10 ns
LDAC pulse width low
Fast mode 10 ns
High speed mode 10 ns
t14 Standard mode 300 ns
Falling edge of 9th SCL clock pulse of last byte of valid write to LDAC
falling edge
Fast mode 300 ns
High speed mode 30 ns
t15 Standard mode 20 ns
CLR pulse width low
Fast mode 20 ns
High speed mode 20 ns
tSP4 Fast mode 0 50 ns Pulse width of spike suppressed
High speed mode 0 10 ns
1 See Figure 3. High speed mode timing specification applies only to the AD5627RBRMZ-2/AD5627BRMZ-2REEL7 and AD5667RBRMZ-2/AD5667BRMZ-2REEL7.
2 CB refers to the capacitance on the bus line.
3 The SDA and SCL timing is measured with the input filters enabled. Switching off the input filters improves the transfer rate but has a negative effect on EMC behavior
of the part.
4 Input filtering on the SCL and SDA inputs suppresses noise spikes that are less than 50 ns for fast mode or 10 ns for high speed mode.
SCL
SDA
PS S P
t
8
t
6
t
5
t
3
t
10
t
9
t
4
t
6
t
1
t
2
t
11
t
12
t
14
CLR
t
13
t
15
LDAC*
t
7
*ASYNCHRONOUS LDAC UPDATE MODE.
06342-003
Figure 3. 2-Wire Serial Interface Timing Diagram
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 8 of 32
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 5.
Parameter Rating
VDD to GND −0.3 V to +7 V
VOUT to GND −0.3 V to VDD + 0.3 V
VREFIN/VREFOUT to GND −0.3 V to VDD + 0.3 V
Digital Input Voltage to GND −0.3 V to VDD + 0.3 V
Operating Temperature Range, Industrial −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (TJ maximum) 150°C
Power Dissipation (TJ max − TA)/θJA
θJA Thermal Impedance
LFCSP_WD Package (4-Layer Board) 61°C/W
MSOP Package 150.4°C/W
Reflow Soldering Peak Temperature, Pb-Free 260°C ± 5°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 9 of 32
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
V
OUT
A
10
V
REFIN
2
V
OUT
B
9
V
DD
3
GND
8
SDA
4
LDAC
7
SCL
5
CLR
6
ADDR
AD5627/
AD5667
TOP VIEW
(Not to Scale)
EXPOSED PAD TIED TO GND
ON LFCSP PACKAGE.
06342-101
Figure 4. AD5627/AD5667 Pin Configuration
1
V
OUT
A
10
V
REFIN
/V
REFOUT
2
V
OUT
B
9
V
DD
3
GND
8
SDA
4
LDAC
7
SCL
5
CLR
6
ADDR
AD5627R/
AD5647R/
AD5667R
TOP VIEW
(Not to Scale)
EXPOSED PAD TIED TO GND
ON LFCSP PACKAGE.
06342-102
Figure 5. AD5627R/AD5647R/AD5667R Pin Configuration
Table 6. Pin Function Descriptions
Pin
No. Mnemonic Description
1 VOUTA Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
2 VOUTB Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
3 GND Ground reference point for all circuitry on the part.
4 LDAC Pulsing this pin low allows any or all DAC registers to be updated if the inputs have new data. This allows
simultaneous updates of all DAC outputs. Alternatively, this pin can be tied permanently low.
5 CLR Asynchronous Clear Input. The CLR input is falling-edge sensitive. While CLR is low, all LDAC pulses are ignored.
When CLR is activated, zero scale is loaded to all input and DAC registers. This clears the output to 0 V. The part exits
clear code mode on the falling edge of the 9th clock pulse of the last byte of valid write. If CLR is activated during a
write sequence, the write is aborted. If CLR is activated during high speed mode the part will exit high speed mode.
6 ADDR Three-State Address Input. Sets the two least significant bits (Bit A1, Bit A0) of the 7-bit slave address.
7 SCL Serial Clock Line. This is used in conjunction with the SDA line to clock data into or out of the 24-bit input register.
8 SDA Serial Data Line. This is used in conjunction with the SCL line to clock data into or out of the 24-bit input register. It is
a bidirectional, open-drain data line that should be pulled to the supply with an external pull-up resistor.
9 VDD Power Supply Input. These parts can be operated from 2.7 V to 5.5 V, and the supply should be decoupled with a
10 F capacitor in parallel with a 0.1 F capacitor to GND.
10 VREFIN/VREFOUT The AD56x7R have a common pin for reference input and reference output. When using the internal reference, this is
the reference output pin. When using an external reference, this is the reference input pin. The default for this pin is
as a reference input. (The internal reference and reference output are only available on R suffix versions.) The AD56x7
has a reference input pin only.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 10 of 32
TYPICAL PERFORMANCE CHARACTERISTICS
CODE
INL ERROR (LSB)
10
4
6
8
0
2
–6
–10
–8
–2
–4
0 5k 10k 15k 20k 25k 30k 35k 40k 45k 50k 55k 60k 65k
V
DD
= V
REF
= 5V
T
A
= 25°C
06342-005
Figure 6. AD5667 INL, External Reference
CODE
INL ERROR (LSB)
4
–4
0 2500 5000 7500 10000 12500 15000
–3
–2
–1
0
1
2
3
V
DD
= V
REF
= 5V
T
A
= 25°C
06342-006
Figure 7. AD5647R INL, External Reference
CODE
INL ERROR (LSB)
1.0
–1.0
0 500 1000 1500 2000 2500 3000 3500 4000
–0.8
–0.6
–0.4
0
0.4
0.2
–0.2
0.6
0.8
V
DD
= V
REF
= 5V
T
A
= 25°C
06342-100
Figure 8. AD5627 INL, External Reference
CODE
DNL ERROR (LSB)
1.0
0.6
0.4
0.2
0.8
0
–0.4
–0.2
–0.6
–1.0
–0.8
0 10k 20k 30k 40k 50k 60k
V
DD
= V
REF
= 5V
T
A
= 25°C
0
6342-007
Figure 9. AD5667 DNL, External Reference
DNL ERROR (LSB)
0.5
0.3
0.2
0.1
0.4
0
–0.2
–0.1
–0.3
–0.5
–0.4
V
DD
= V
REF
= 5V
T
A
= 25°C
CODE
02500 5000 7500 10000 12500 15000
0
6342-008
Figure 10. DNL AD5647R, External Reference
DNL ERROR (LSB)
0.20
0.10
0.05
0.15
0
–0.05
–0.10
–0.20
–0.15
CODE
0500 1000 1500 2000 2500 3000 3500 4000
V
DD
= V
REF
= 5V
T
A
= 25°C
0
6342-009
Figure 11. AD5627 DNL, External Reference
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 11 of 32
CODE
INL ERROR (LSB)
10
8
0
–10
–6
–8
–4
6
–2
4
2
65000
60000
55000
50000
45000
40000
35000
30000
25000
20000
15000
10000
5000
0
VDD = 5V
VREFOUT = 2.5V
T
A
= 25°C
06342-010
Figure 12. AD5667R INL, 2.5 V Internal Reference
CODE
INL ERROR (LSB)
4
3
–4
–3
–2
2
–1
1
0
16250
15000
13750
12500
11250
10000
8750
7500
6250
5000
3750
2500
1250
0
V
DD
=5V
V
REFOUT
=2.5V
T
A
=25°C
06342-011
Figure 13. AD5647R INL, 2.5 V Internal Reference
CODE
INL ERROR (LSB)
1.0
0.8
0
–1.0
–0.8
–0.6
0.6
–0.4
–0.2
0.4
0.2
0 1000500 20001500 350030002500 4000
VDD =5V
VREFOUT =2.5V
TA= 25°C
06342-012
Figure 14. AD5627R INL, 2.5 V Internal Reference
CODE
DNL ERROR (LSB)
1.0
0.8
0
–1.0
–0.6
–0.8
–0.4
0.6
–0.2
0.4
0.2
65000
60000
55000
50000
45000
40000
35000
30000
25000
20000
15000
10000
5000
0
VDD =5V
VREFOUT =2.5V
T
A
=25°C
06342-013
Figure 15. AD5667R DNL, 2.5 V Internal Reference
CODE
DNL ERROR (LSB)
0.5
0.4
0
–0.5
–0.3
–0.4
–0.2
0.3
–0.1
0.2
0.1
16250
15000
13750
12500
11250
10000
8750
7500
6250
5000
3750
2500
1250
0
V
DD
= 5V
V
REFOUT
= 2.5V
T
A
= 25°C
0
6342-014
Figure 16. AD5647R DNL, 2.5 V Internal Reference
CODE
DNL ERROR (LSB)
0.20
0.15
0
–0.20
–0.15
–0.10
0.10
–0.05
0.05
0 1000500 20001500 350030002500 4000
V
DD
= 5V
V
REFOUT
= 2.5V
T
A
= 25°C
0
6342-015
Figure 17. AD5627R DNL, 2.5 V Internal Reference
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 12 of 32
CODE
INL ERROR (LSB)
10
8
4
6
2
0
–4
–2
–6
–8
–10
65000
60000
55000
50000
45000
40000
35000
30000
25000
20000
15000
10000
5000
0
V
DD
= 3V
V
REFOUT
= 1.25V
T
A
= 25°C
06342-016
Figure 18. AD5667R INL,1.25 V Internal Reference
CODE
INL ERROR (LSB)
4
–4
16250
15000
13750
12500
11250
10000
8750
7500
6250
5000
3750
2500
1250
0
3
2
1
0
–1
–2
–3
V
DD
= 3V
V
REFOUT
= 1.25V
T
A
= 25°C
06342-017
Figure 19. AD5647R INL, 1.25 V Internal Reference
CODE
INL ERROR (LSB)
1.0
–1.0
0 500 1000 1500 2000 2500 3000 3500 4000
0
0.8
0.6
0.4
0.2
–0.2
–0.4
–0.6
–0.8
V
DD
= 3V
V
REFOUT
= 1.25V
T
A
= 25°C
06342-018
Figure 20. AD5627R INL,1.25 V Internal Reference
CODE
DNL ERROR (LSB)
1.0
0.8
0.4
0.6
0.2
0
–0.4
–0.2
–0.6
–0.8
–1.0
65000
60000
55000
50000
45000
40000
35000
30000
25000
20000
15000
10000
5000
0
V
DD
= 3V
V
REFOUT
= 1.25V
T
A
= 25°C
06342-019
Figure 21. AD5667R DNL,1.25 V Internal Reference
CODE
DNL ERROR (LSB)
0.5
–0.5
16250
15000
13750
12500
11250
10000
8750
7500
6250
5000
3750
2500
1250
0
0
0.4
0.3
0.2
0.1
–0.1
–0.2
–0.3
–0.4
V
DD
= 3V
V
REFOUT
= 1.25V
T
A
= 25°C
06342-020
Figure 22. AD5647R DNL,1.25 V Internal Reference
CODE
DNL ERROR (LSB)
0.20
–0.20
0 500 1000 1500 2000 2500 3000 3500 4000
0
0.15
0.10
0.05
–0.05
–0.10
–0.15
V
DD
= 3V
V
REFOUT
= 1.25V
T
A
= 25°C
06342-021
Figure 23. AD5627R DNL, 1.25 V Internal Reference
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 13 of 32
TEMPERATURE (°C)
ERROR (LSB)
8
6
4
2
–6
–4
–2
0
–8
–40 –20 4020018060 00
MIN DNL
MAX DNL
MAX INL
MIN INL
V
DD
= V
REF
= 5V
06342-022
Figure 24. INL Error and DNL Error vs. Temperature
VREF (V)
ERROR (LSB)
10
4
6
8
2
0
–8
–6
–4
–2
–10
0.75 1.25 1.75 2.25 4.253.753.252.75 4.75
MIN DNL
MAX DNL
MAX INL
MIN INL
VDD = 5V
TA = 25°C
06342-023
Figure 25. INL and DNL Error vs. VREF
VDD (V)
ERROR (LSB)
8
6
4
2
–6
–4
–2
0
–8
2.7 3.2 3.7 4.74.2 5.2
MIN DNL
MAX DNL
MAX INL
MIN INL
TA = 25°C
06342-024
Figure 26. INL and DNL Error vs. Supply
TEMPERATURE (°C)
ERROR (% FSR)
0
–0.04
–0.02
–0.06
–0.08
–0.10
–0.18
–0.16
–0.14
–0.12
–0.20
–40 –20 40200 1008060
V
DD
= 5V
GAIN ERROR
FULL-SCALE ERROR
06342-025
Figure 27. Gain Error and Full-Scale Error vs. Temperature
TEMPERATURE (°C)
ERROR (mV)
1.5
1.0
0.5
0
–2.0
–1.5
–1.0
–0.5
–2.5
–40 –20 40200860 100
0
OFFSET ERROR
ZERO-SCALE ERROR
06342-026
Figure 28. Zero-Scale Error and Offset Error vs. Temperature
V
DD
(V)
ERROR (% FSR)
1.0
–1.5
–1.0
–0.5
0
0.5
–2.0
2.7 3.2 3.7 4.74.2 5.2
GAIN ERROR
FULL-SCALE ERROR
06342-027
Figure 29. Gain Error and Full-Scale Error vs. Supply
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 14 of 32
V
DD
(V)
ERROR (mV)
1.0
0.5
0
–2.0
–1.5
–1.0
–0.5
–2.5
2.7 3.2 4.23.7 5.24.7
ZERO-SCALE ERROR
OFFSET ERROR
T
A
= 25°C
06342-028
Figure 30. Zero-Scale Error and Offset Error vs. Supply
I
DD
(mA)
NUMBER OF DEVICES
0
18
16
14
12
10
8
6
4
2
0.440.420.400.380.360.340.320.30
V
DD
= 3.6V
V
DD
= 5.5V
06342-029
Figure 31. IDD Histogram with External Reference
I
DD
(mA)
NUMBER OF DEVICES
0
14
12
10
8
6
4
2
0.74
0.75
0.76
0.77
0.78
0.79
0.80
0.81
0.82
0.83
0.84
0.85
0.86
0.87
0.88
0.89
0.90
0.91
0.92
0.93
0.94
0.95
0.96
0.97
0.98
0.99
1.00
1.01
1.02
1.03
1.04
V
DD
= 3.6V
V
DD
= 5.5V
06342-030
V
REFOUT
= 2.5V
V
REFOUT
= 1.25V
Figure 32. IDD Histogram with Internal Reference
CURRENT (mA)
ERROR VOL
T
AGE (V)
0.5
0.4
–0.5
–0.4
–0.3
–0.2
–0.1
0
0.1
0.2
0.3
–10 –8 –6 –4 –2 0 2 4 861
0
V
DD
= 3V
V
REFOUT
= 1.25V
V
DD
= 5V
V
REFOUT
= 2.5V
DAC LOADED WITH
ZERO-SCALE
SINKING CURRENT
DAC LOADED WITH
FULL-SCALE
SOURCING CURRENT
0
6342-031
Figure 33. Headroom at Rails vs. Source and Sink
CURRENT (mA)
V
OUT
(V)
6
5
4
3
2
1
–1
0
–30 –20 –10 0 10 20 30
V
DD
= 5V
V
REFOUT
= 2.5V
T
A
= 25°C
ZERO SCALE
FULL SCALE
MIDSCALE
1/4 SCALE
3/4 SCALE
0
6342-046
Figure 34. AD56x7R with 2.5 V Reference, Source and Sink Capability
CURRENT (mA)
V
OUT
(V)
4
–1
0
1
2
3
–30 –20 –10 0 10 20 30
V
DD
= 3V
V
REFOUT
= 1.25V
T
A
= 25°C
ZERO SCALE
FULL SCALE
MIDSCALE
1/4 SCALE
3/4 SCALE
0
6342-047
Figure 35. AD56x7R with 1.25 V Reference, Source and Sink Capability
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 15 of 32
CODE
I
DD
(mA)
0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
512 10512 20512 30512 40512 50512 60512
T
A
= 25°C
V
DD
= 5V, V
REFOUT
= 2.5V
V
DD
= V
REF
= 5V
0
6342-060
Figure 36. Supply Current vs. Code
SUPPLY VOLTAGE (V)
IDD (mA)
0
0.05
0.10
0.15
0.25
0.20
0.30
0.40
0.35
3.22.7 3.7 4.2 4.7 5.2
TA = 25°C
06342-061
Figure 37. Supply Current vs. Supply Voltage
TEMPERATURE (°C)
IDD (mA)
0.45
0.05
0.10
0.15
0.20
0.35
0.40
0.25
0.30
0
–40 –20 0 20 40 60 80 100
06342-063
VDD = VREFIN = 5V
VDD = VREFIN = 3V
Figure 38. Supply Current vs. Temperature
TIME BASE = 4µs/DIV
V
DD
= V
REF
= 5V
T
A
= 25°C
FULL-SCALE CODE CHANGE
0x0000 TO 0xFFFF
OUTPUT LOADED WITH 2k
AND 200pF TO GND
V
OUT
= 909mV/DIV
1
06342-048
Figure 39. Full-Scale Settling Time, 5 V
CH1 2.0V CH2 500mV M100µs 125MS/s
A CH1 1.28V
8.0ns/pt
V
DD
= V
REF
= 5V
T
A
= 25°C
V
OUT
V
DD
1
2
MAX(C2)
420.0mV
06342-049
Figure 40. Power-On Reset to 0 V
V
DD
= 5V
SYNC
SLCK
V
OUT
1
3
CH1 5.0V
CH3 5.0V
CH2 500mV M400ns A CH1 1.4V
2
0
6342-050
Figure 41. Exiting Power-Down to Midscale
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 16 of 32
SAMPLE NUMBER
V
OUT
(V)
2.521
2.522
2.523
2.524
2.525
2.526
2.527
2.528
2.529
2.530
2.531
2.532
2.533
2.534
2.535
2.536
2.537
2.538
0 50 100 150 350 400200 250 300 450 512
V
DD
= V
REF
= 5V
T
A
= 25°C
5ns/SAMPLE NUMBER
GLITCH IMPULSE = 9.494nV
1LSB CHANGE AROUND
MIDSCALE (0x8000 TO 0x7FFF)
0
6342-058
Figure 42. Digital-to-Analog Glitch Impulse (Negative)
SAMPLE NUMBER
V
OUT
(V)
2.491
2.492
2.493
2.494
2.495
2.496
2.497
2.498
0 50 100 150 350 400200 250 300 450 512
V
DD
= V
REF
= 5V
T
A
= 25°C
5ns/SAMPLE NUMBER
ANALOG CROSSTALK = 0.424nV
0
6342-059
Figure 43. Analog Crosstalk, External Reference
SAMPLE NUMBER
V
OUT
(V)
2.456
2.458
2.460
2.462
2.464
2.466
2.468
2.470
2.472
2.474
2.476
2.478
2.480
2.482
2.484
2.486
2.488
2.490
2.492
2.494
2.496
0 50 100 150 350 400200 250 300 450 512
V
DD
= 5V
V
REFOUT
= 2.5V
T
A
= 25°C
5ns/SAMPLE NUMBER
ANALOG CROSSTALK = 4.462nV
0
6342-062
Figure 44. Analog Crosstalk, Internal Reference
1
VDD = VREF = 5V
TA = 25°C
DAC LOADED WITH MIDSCALE
4s/DIV
2µV/DI
V
06342-051
Figure 45. 0.1 Hz to 10 Hz Output Noise Plot, External Reference
5s/DIV
10µV/DI
V
1
V
DD
= 5V
V
REFOUT
= 2.5V
T
A
= 25°C
DAC LOADED WITH MIDSCALE
06342-052
Figure 46. 0.1 Hz to 10 Hz Output Noise Plot, 2.5 V Internal Reference
4s/DIV
5µV/DI
V
1
V
DD
= 3V
V
REFOUT
= 1.25V
T
A
= 25°C
DAC LOADED WITH MIDSCALE
06342-053
Figure 47. 0.1 Hz to 10 Hz Output Noise Plot,1.25 V Internal Reference
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 17 of 32
FREQUENCY (Hz)
OUTPUT NOISE (nV/Hz)
800
0
100
200
300
400
500
600
700
100 10k1k 100k 1M
V
DD
= 3V
V
REFOUT
= 1.25V
V
DD
= 5V
V
REFOUT
= 2.5V
T
A
= 25°C
MIDSCALE LOADED
0
6342-054
Figure 48. Noise Spectral Density, Internal Reference
FREQUENCY (Hz)
(dB)
20
–50
–80
–30
–40
–60
–70
–90
–100
2k 4k 6k 8k 10k
V
DD
= 5V
T
A
= 25°C
DAC LOADED WITH FULL SCALE
V
REF
= 2V ± 0.3V p-p
0
6342-055
Figure 49. Total Harmonic Distortion
CAPACITANCE (nF)
TIME (µs)
16
14
12
10
8
6
4
012 34567 981
0
V
REF
= V
DD
T
A
= 25°C
V
DD =
5V
V
DD =
3V
0
6342-056
Figure 50. Settling Time vs. Capacitive Load
FREQUENCY (Hz)
(dB)
5
–40
10k 100k 1M 10M
35
30
25
20
15
10
5
0
V
DD
= 5V
T
A
= 25°C
06342-057
Figure 51. Multiplying Bandwidth
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 18 of 32
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer function.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent codes.
A specified differential nonlinearity of ±1 LSB maximum ensures
monotonicity. This DAC is guaranteed monotonic by design.
Zero-Code Error
Zero-code error is a measurement of the output error when
zero scale (0x0000) is loaded to the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive in
the AD5667R because the output of the DAC cannot go below
0 V due to a combination of the offset errors in the DAC and
the output amplifier. Zero-code error is expressed in mV.
Full-Scale Error
Full-scale error is a measurement of the output error when full-
scale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be VDD − 1 LSB. Full-scale error is expressed in %
of full-scale range (FSR).
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal
expressed in % of FSR.
Zero-Code Error Drift
Zero-code error drift is a measurement of the change in zero-
code error with a change in temperature. It is expressed in µV/°C.
Gain Temperature Coefficient
Gain temperature coefficient is a measurement of the change in
gain error with changes in temperature. It is expressed in ppm
of FSR/°C.
Offset Error
Offset error is a measure of the difference between VOUT (actual)
and VOUT (ideal) expressed in mV in the linear region of the
transfer function. Offset error is measured on the AD5667R
with code 512 loaded in the DAC register. It can be negative or
positive.
DC Power Supply Rejection Ratio (PSRR)
DC PSRR indicates how the output of the DAC is affected by
changes in the supply voltage. PSRR is the ratio of the change in
VOUT to a change in VDD for full-scale output of the DAC. It is
measured in dB. VREF is held at 2 V and VDD is varied by ±10%.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for
the output of a DAC to settle to a specified level for a ¼ to ¾
full-scale input change and is measured from the rising edge of
the stop condition.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s,
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000) (see
Figure 42).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s, and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Reference Feedthrough
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated. It is expressed in dB.
Output Noise Spectral Density
Output noise spectral density is a measurement of the internally
generated random noise. Random noise is characterized as a
spectral density. It is measured by loading the DAC to midscale
and measuring noise at the output. It is measured in nV/√Hz. A
plot of noise spectral density can be seen in Figure 48.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC (or soft
power-down and power-up) while monitoring another DAC kept
at midscale. It is expressed in V.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has to
another DAC kept at midscale. It is expressed in µV/mA.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s and vice versa) in the input register of another
DAC. It is measured in standalone mode and is expressed in nV-s.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 19 of 32
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC due to a change in the output of another DAC. It is
measured by loading one of the input registers with a full-scale
code change (all 0s to all 1s and vice versa), then executing a
software LDAC and monitoring the output of the DAC whose
digital code was not changed. The area of the glitch is expressed
in nV-s.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC due to a digital code change and subsequent
analog output change of another DAC. It is measured by
loading the attack channel with a full-scale code change (all 0s
to all 1s and vice versa) with LDAC low while monitoring the
output of the victim channel that is at midscale. The energy of
the glitch is expressed in nV-s.
Multiplying Bandwidth
The multiplying bandwidth is a measure of the finite bandwidth
of the amplifiers within the DAC. A sine wave on the reference
(with full-scale code loaded to the DAC) appears on the output.
The multiplying bandwidth is the frequency at which the output
amplitude falls to 3 dB below the input.
Total Harmonic Distortion (THD)
THD is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC, and the THD is a measurement of the
harmonics present on the DAC output. It is measured in dB.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 20 of 32
THEORY OF OPERATION
D/A SECTION
The AD56x7R/AD56x7 DACs are fabricated on a CMOS
process. The architecture consists of a string DAC followed by
an output buffer amplifier. Figure 52 shows a block diagram of
the DAC architecture.
DAC
REGISTER RESISTOR
STRING
REF (+)
DD
GND
REF (–)
V
OUT
OUTPUT
AMPLIFIER
GAIN = +2
06342-032
Figure 52. DAC Architecture
Because the input coding to the DAC is straight binary, the ideal
output voltage when using an external reference is given by
×= N
REFIN
OUT
D
VV 2
The ideal output voltage when using the internal reference is
given by
××= N
REFOUTOUT
D
VV 2
2
where:
D is the decimal equivalent of the binary code that is loaded to
the DAC register:
0 to 4095 for AD5627R/AD5627 (12-bit).
0 to 16,383 for AD5647R (14-bit).
0 to 65,535 for AD5667R/AD5667 (16-bit).
N is the DAC resolution.
RESISTOR STRING
The resistor string is shown in Figure 53. It is simply a string of
resistors, each of value R. The code loaded to the DAC register
determines at which node on the string the voltage is tapped off
to be fed into the output amplifier. The voltage is tapped off by
closing one of the switches connecting the string to the amplifier.
Because it is a string of resistors, it is guaranteed monotonic.
OUTPUT AMPLIFIER
The output buffer amplifier can generate rail-to-rail voltages on
its output, which gives an output range of 0 V to VDD. It can drive
a load of 2 k in parallel with 1000 pF to GND. The source and
sink capabilities of the output amplifier can be seen in Figure 33
and Figure 34. The slew rate is 1.8 V/µs with a ¼ to ¾ full-scale
settling time of 7 µs.
R
R
R
R
RTO OUTPUT
AMPLIFIER
0
6342-033
Figure 53. Resistor String
INTERNAL REFERENCE
The AD5627R/AD5647R/AD5667R feature an on-chip
reference. Versions without the R suffix require an external
reference. The on-chip reference is off at power-up and is
enabled via a write to a control register. See the Internal
Reference Setup section for details.
Versions packaged in a 10-lead LFCSP package have a 1.25 V
reference, giving a full-scale output of 2.5 V. These parts can be
operated with a VDD supply of 2.7 V to 5.5 V. Versions packaged
in a 10-lead MSOP package have a 2.5 V reference, giving a full-
scale output of 5 V. The parts are functional with a VDD supply
of 2.7 V to 5.5 V, but with a VDD supply of less than 5 V, the
output is clamped to VDD. See the Ordering Guide for a full list
of models. The internal reference associated with each part is
available at the VREFOUT pin.
A buffer is required if the reference output is used to drive
external loads. When using the internal reference, it is
recommended that a 100 nF capacitor be placed between the
reference output and GND for reference stability.
EXTERNAL REFERENCE
The AD5627/AD5667 require an external reference, which is
applied at the VREFIN pin. The VREFIN pin on the AD56x7R allows
the use of an external reference if the application requires it.
The default condition of the on-chip reference is off at power-
up. All devices can be operated from a single 2.7 V to 5.5 V supply.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 21 of 32
SERIAL INTERFACE
The AD56x7R/AD56x7 have 2-wire I2C-compatible serial
interfaces (refer to I2C-Bus Specification, Version 2.1, January 2000,
available from Philips Semiconductor). The AD56x7R/AD56x7
can be connected to an I2C bus as a slave device, under the control
of a master device. See Figure 3 for a timing diagram of a
typical write sequence.
The AD56x7R/AD56x7 support standard (100 kHz), fast
(400 kHz), and high speed (3.4 MHz) data transfer modes.
High speed operation is only available on select models. See
the Ordering Guide for a full list of models. Support is not
provided for 10-bit addressing and general call addressing.
The AD56x7R/AD56x7 each have a 7-bit slave address. The five
MSBs are 00011 and the two LSBs (A1, A0) are set by the state
of the ADDR address pin. The facility to make hardwired
changes to ADDR allows the user to incorporate up to three of
these devices on one bus, as outlined in Table 7.
Table 7. Device Address Selection
ADDR Pin Connection A1 A0
VDD 0 0
No Connection 1 0
GND 1 1
The 2-wire serial bus protocol operates as follows:
1. The master initiates data transfer by establishing a start
condition when a high-to-low transition on the SDA line
occurs while SCL is high. The following byte is the address
byte, which consists of the 7-bit slave address. The slave
address corresponding to the transmitted address responds
by pulling SDA low during the 9th clock pulse (this is
termed the acknowledge bit). At this stage, all other devices
on the bus remain idle while the selected device waits for
data to be written to, or read from, its shift register.
2. Data is transmitted over the serial bus in sequences of nine
clock pulses (eight data bits followed by an acknowledge
bit). The transitions on the SDA line must occur during the
low period of SCL and remain stable during the high
period of SCL.
3. When all data bits have been read or written, a stop
condition is established. In write mode, the master pulls
the SDA line high during the 10th clock pulse to establish a
stop condition. In read mode, the master issues a no
acknowledge for the 9th clock pulse (that is, the SDA line
remains high). The master then brings the SDA line low
before the 10th clock pulse, and then high during the 10th
clock pulse to establish a stop condition.
WRITE OPERATION
When writing to the AD56x7R/AD56x7, the user must begin
with a start command followed by an address byte (R/W= 0),
after which the DAC acknowledges that it is prepared to receive
data by pulling SDA low. The AD56x7R/AD56x7 requires two
bytes of data for the DAC and a command byte that controls
various DAC functions. Three bytes of data must therefore be
written to the DAC, the command byte followed by the most
significant data byte and the least significant data byte, as
shown in Figure 54. All these data bytes are acknowledged by
the AD56x7R/AD56x7. A stop condition follows.
READ OPERATION
When reading data back from the AD56x7R/AD56x7, the user
begins with a start command followed by an address byte
(R/W = 1), after which the DAC acknowledges that it is
prepared to transmit data by pulling SDA low. Three bytes of
data are then read from the DAC, which are acknowledged by
the master, as shown in Figure 55. A stop condition follows.
HIGH SPEED MODE
The AD5627RBRMZ and the AD5667RBRMZ offer high speed
serial communication with a clock frequency of 3.4 MHz. See
the Ordering Guide for details.
High speed mode communication commences after the master
addresses all devices connected to the bus with the Master Code
00001XXX to indicate that a high speed mode transfer is to
begin (see Figure 56). No device connected to the bus is
permitted to acknowledge the high speed master code.
Therefore, the code is followed by a no acknowledge. The
master must then issue a repeated start followed by the device
address. The selected device then acknowledges its address.
All devices continue to operate in high speed mode until the
master issues a stop condition. When the stop condition is
issued, the devices return to standard/fast mode. The part also
returns to standard/fast mode when CLR is activated while the
part is in high speed mode.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 22 of 32
FRAME 2
COMMAND BYTE
FRAME 1
SLAVE ADDRESS
19 91
SCL
START BY
MASTER
ACK. BY
AD56x7
ACK. BY
AD56x7
SDA R/W DB23A0A11000 1 DB22 DB21 DB20 DB19 DB18 DB17 DB16
191
ACK. BY
AD56x7
ACK. BY
AD56x7
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
FRAME 3
MOST SIGNIFICANT
DATA BYTE
9
STOP BY
MASTER
SCL
(
CONTINUED)
SDA
(CONTINUED) DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
06342-103
Figure 54. I2C Write Operation
FRAME 2
COMMAND BYTE
FRAME 1
SLAVE ADDRESS
19 91
SCL
START BY
MASTER
ACK. BY
AD56x7
ACK. BY
MASTER
SDA R/W DB23A0A11000 1 DB22 DB21 DB20 DB19 DB18 DB17 DB16
191
ACK. BY
MASTER
NO ACK.
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
FRAME 3
MOST SIGNIFICANT
DATA BYTE
9
STOP BY
MASTER
SCL
(
CONTINUED)
SDA
(CONTINUED) DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
0
6342-104
Figure 55. I2C Read Operation
SCL
0 0 0 0 1 X X X 0 0 0 1 1 A1 A0 R/W
SDA
1919
NO ACK SR
START BY
MASTER
ACK. BY
AD56x7
HS-MODE
MASTER CODE SERIAL BUS
ADDRESS BYTE
FAST MODE HIGH-SPEED MODE
06342-105
Figure 56. Placing the AD5627RBRMZ-2/AD5667RBRMZ-2 in High Speed Mode
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 23 of 32
INPUT SHIFT REGISTER
The input shift register is 24 bits wide. Data is loaded into the
device as a 24-bit word under the control of a serial clock input,
SCL. The timing diagram for this operation is shown in Figure 3.
The 8 MSBs make up the command byte. DB23 is reserved and
should always be set to 0 when writing to the device. DB22 (S)
is used to select multiple byte operation The next three bits are
the command bits (C2, C1, C0) that control the mode of operation
of the device. See Table 8 for details. The last 3 bits of first byte
are the address bits (A2, A1, A0). See Table 9 for details. The
rest of the bits are the 16-, 14-, 12-bit data word. The data word
comprises the 16-, 14-, 12-bit input code followed by two or four
dont cares for the AD5647R and the AD5627R/AD5627,
respectively (see Figure 59 through Figure 61).
MULTIPLE BYTE OPERATION
Multiple byte operation is supported on the AD56x7R/AD56x7.
A 2-byte operation is useful for applications that require fast
DAC updating and do not need to change the command byte.
The S bit (DB22) in the command register can be set to 1 for 2-
byte mode of operation (see Figure 57). For standard 3-byte
and 4-byte operation, the S bit (DB22) in the command byte
should be set to 0 (see Figure 58).
BROADCAST MODE
Broadcast addressing is supported on the AD56x7R/AD56x7.
Broadcast addressing can be used to synchronously update or
power down multiple AD56x7R/AD56x7 devices. Using the
broadcast address, the AD56x7R/AD56x7 responds regardless of
the states of the address pins. Broadcast is supported only in write
mode. The AD56x7R/AD56x7 broadcast address is 00010000.
Table 8. Command Definition
C2 C1 C0 Command
0 0 0 Write to input register n
0 0 1 Update DAC register n
0 1 0 Write to input register n, update all
(software LDAC)
0 1 1 Write to and update DAC channel n
1 0 0 Power up/power down
1 0 1 Reset
1 1 0 LDAC register setup
1 1 1 Internal reference setup (on/off )
Table 9. DAC Address Command
A2 A1 A0 ADDRESS (n)
0 0 0 DAC A
0 0 1 DAC B
1 1 1 Both DACs
LDAC FUNCTION
The AD56x7R/AD56x7 DACs have double-buffered interfaces
consisting of two banks of registers, input registers and DAC
registers. The input registers are connected directly to the input
shift register, and the digital code is transferred to the relevant
input register on completion of a valid write sequence. The
DAC registers contain the digital codes used by the resistor strings.
Access to the DAC registers is controlled by the LDAC pin.
When the LDAC pin is high, the DAC registers are latched and
the input registers can change state without affecting the
contents of the DAC registers. When LDAC is brought low,
however, the DAC registers become transparent and the contents
of the input registers are transferred to them. The double-
buffered interface is useful if the user requires simultaneous
updating of all DAC outputs. The user can write to one of the
input registers individually and then, by bringing LDAC low
when writing to the other DAC input register, all outputs
update simultaneously.
These parts each contain an extra feature whereby a DAC
register is not updated unless its input register has been updated
since the last time LDAC was brought low. Normally, when LDAC
is brought low, the DAC registers are filled with the contents of the
input registers. In the case of the AD56x7R/AD56x7, the DAC
register updates only if the input register has changed since the
last time the DAC register was updated, thereby removing
unnecessary digital crosstalk.
The outputs of all DACs can be simultaneously updated, using
the hardware LDAC pin.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 24 of 32
SLAVE
ADDRESS COMMAND
BYTE MO S T SI G NI F I CANT
DAT A BY TE MO ST SIGNIFI CANT
DATA BYTE
LE AST SIGNIFICANT
DAT A BY TE LE AST SIGNIFI CANT
DAT A BY TE
S = 1 BLO CK 1 S = 1 BLOCK 2
MOST SIGNIFICANT
DATA BYTE LEAST SI GNIFICANT
DATA BYTE STOP
S = 1 BLO CK n
06342-106
Figure 57. Multiple Block Write with Initial Command Byte Only (S = 1)
SLAVE
ADDRESS COMMAND
BYTE MOST SIGNIFICANT
DATA BYTE COMMAND
BYTE
LE AS T SIG NIF ICANT
DATA BYTE MO ST S I GNI F ICANT
DATA B Y TE L EAST SIGNIF ICANT
DATA BYTE
S = 0 BLOCK 1 S = 0 BLOCK 2
MO S T SIGN IFICANT
DATA B Y TE
COMMAND
BYTE LEAST SIGNIFICANT
DATA BYTE STOP
S = 0 BLO CK n
06342-107
Figure 58. Multiple Block Write with Command Byte in Each Block (S = 0)
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
R S
RESERVED
BYTE
SELECTION
C2 C1 C0 A2 A1 A0 D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
COMMAND DAC ADDRESS DAC DATA DAC DATA
COM MAND BY T E DATA HIGH BYT E DATA LOW BYTE
06342-108
Figure 59. AD5667R/AD5667 Input Shift Register (16-Bit DAC)
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
R S
RESERVED
BYTE
SELECTION
C2 C1 C0 A2 A1 A0 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 X X
COMMAND DAC ADDRESS DAC DATA DAC DATA
COM MAND BY T E DATA HIGH BYT E DATA LOW BYTE
06342-109
Figure 60. AD5647R Input Shift Register (14-Bit DAC)
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
R S
RESERVED
BYTE
SELECTION
C2 C1 C0 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 X X X X
COMMAND DAC ADDRESS DAC DATA DAC DAT A
COM MAND BY T E DATA HIG H BYTE DATA LOW BYTE
06342-110
Figure 61. AD5627R/AD5627 Input Shift Register (12-Bit DAC)
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 25 of 32
Synchronous LDAC
The DAC registers are updated after new data is read in. LDAC
can be permanently low or pulsed.
Asynchronous LDAC
The outputs are not updated at the same time that the input
registers are written to. When LDAC goes low, the DAC
registers are updated with the contents of the input register.
The LDAC register gives the user full flexibility and control over
the hardware LDAC pin. This register allows the user to select
which combination of channels to simultaneously update when
the hardware LDAC pin is executed. Setting the LDAC bit
register to 0 for a DAC channel means that the update of this
channel is controlled by the LDAC pin. If this bit is set to 1, this
channel synchronously updates, that is, the DAC register is
updated after new data is read in, regardless of the state of the
LDAC pin. It effectively sees the LDAC pin as being pulled low.
See Table 10 for the LDAC register mode of operation. This
flexibility is useful in applications when the user wants to
simultaneously update select channels while the rest of the
channels are synchronously updating.
Writing to the DAC using Command 110 loads the 2-bit LDAC
register [DB1:DB0]. The default for each channel is 0, that is,
the LDAC pin works normally. Setting the bits to 1 means the
DAC register is updated, regardless of the state of the LDAC
pin. See Figure 63 for contents of the input shift register during
the LDAC register setup command.
Table 10. LDAC Register Mode of Operation:
Load DAC Register
LDAC Bits
(DB1 to DB0) LDAC Pin LDAC Operation
0 1/0
Determined by LDAC pin.
1 x = don’t care The DAC registers are updated
after new data is read in.
POWER-DOWN MODES
Command 100 is reserved for the power-up/down function.
The power-up/down modes are programmed by setting Bit
DB5 and Bit DB4. This defines the output state of the DAC
amplifier, as shown in Table 11. Bit DB1and Bit DB0 determine
to which DAC or DACs the power-up/down command is
applied. Setting one of these bits to 1 applies the power-up/down
state defined by DB5 and DB4 to the corresponding DAC. If a
bit is 0, the state of the DAC is unchanged. Figure 65 shows the
contents of the input shift register for the power up/down
command.
When Bit DB5 and Bit DB4 are set to 0, the part works normally
with its normal power consumption of 400 µA at 5 V. However,
for the three power-down modes, the supply current falls to
480 nA at 5 V. Not only does the supply current fall, but the
output stage is also internally switched from the output of the
amplifier to a resistor network of known values. This allows the
output impedance of the part to be known while the part is in
power-down mode. The outputs can either be connected
internally to GND through a 1 k or 100 k resistor, or left
open-circuited (three-state) as shown in Figure 62.
Table 11. Modes of Operation for the AD56x7R/AD56x7
DB5 DB4 Operating Mode
0 0 Normal operation
Power-down modes
0 1 1 kΩ pull-down to GND
1 0 100 kΩ pull-down to GND
1 1 Three-state, high impedance
RESISTOR
NETWORK
V
OUT
RESISTOR
STRING DAC
POWER-DOWN
CIRCUITRY
AMPLIFIER
06342-038
Figure 62. Output Stage During Power-Down
The bias generator, the output amplifier, the resistor string, and
other associated linear circuitry are shut down when power-
down mode is activated. However, the contents of the DAC
register are unaffected when in power-down. The time to exit
power-down is typically 4 µs for VDD = 5 V.
R S C2 C1 C0 A2 A1 A0 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
0 X
RESERVED
DON’T
CARE
110A2 A1 A0 XXXXXXXXXXXXXXDACB DACA
COMMAND DAC ADDRESS
(DON’T CARE) DON’T CARE DON’T CARE
DAC SELECT
(0 = LDAC PIN ENABLED)
06342-111
Figure 63. LDAC Setup Command
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 26 of 32
POWER-ON RESET AND SOFTWARE RESET
The AD56x7R/AD56x7 contain a power-on reset circuit that
controls the output voltage during power-up. The device powers
up to 0 V and the output remains powered up at this level until
a valid write sequence is made to the DAC. This is useful in
applications where it is important to know the state of the
output of the DAC while it is in the process of powering up. Any
events on LDAC or CLR during power-on reset are ignored.
There is also a software reset function. Command 101 is the
software reset command. The software reset command contains
two reset modes that are software programmable by setting Bit
DB0 in the input shift register.
Table 12 shows how the state of the bit corresponds to the
software reset modes of operation of the devices. Figure 64
shows the contents of the input shift register during the
software reset mode of operation.
Table 12. Software Reset Modes for the AD56x7R/AD56x7
DB0 Registers reset to zero
0 DAC register
Input shift register
1 (Power-On Reset) DAC register
Input shift register
LDAC register
Power-down register
Internal reference setup register
CLEAR PIN (CLR)
The AD56x7R/AD56x7 has an asynchronous clear input. The
CLR input is falling-edge sensitive. While CLR is low, all LDAC
pulses are ignored. When CLR is activated, zero scale is loaded
to all input and DAC registers. This clears the output to 0 V. The
part exits clear code mode on the on the falling edge of the 9th
clock pulse of the last byte of valid write. If CLR is activated
during a write sequence, the write is aborted. If CLR is activated
during high speed mode, the part exits high speed mode to
standard/fast mode.
INTERNAL REFERENCE SETUP (R VERSIONS)
The on-chip reference is off at power-up by default. It can be
turned on by sending the reference setup command (111) and
setting DB0 in the input shift register. Table 13 shows how the
state of the bit corresponds to the mode of operation. See Figure 66
for the contents of the input shift register during the internal
reference setup command.
Table 13. Reference Setup Command
DB0 Action
0 Internal reference off (default)
1 Internal reference on
X S C2 C1 C0 A2 A1 A0 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
0 X
RESERVED
DON’T
CARE
101XXXXXXXXXXXXXXXXXXRST
COMMAND DAC ADDRESS
(DON’T CARE) DON’T CARE DON’T CARE
RESET
MODE
06342-113
Figure 64. Software Reset Command
R S C2 C1 C0 A2 A1 A0 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
0 X
RESERVED
DON’T
CARE
1 0 0 X X X X X X X X X X X X X PD1 PD0 X X DACB DACA
COMMAND DAC ADDRESS
(DON’T CARE) DON’T CARE DON’T CARE POWER-
DOWN MODE DON’T CARE
DAC SELECT
(1 = DAC SELECTED)
06342-112
Figure 65. Power Up/Down Command
R S C2 C1 C0 A2 A1 A0 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
0 X
RESERVED
DON’T
CARE
111XXXXXXXXXXXXXXXXXXREF
COMMAND DAC ADDRESS
(DON’T CARE) DON’T CARE DON’T CARE
REFERENCE
MODE
06342-114
Figure 66. Reference Setup Command
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 27 of 32
APPLICATION INFORMATION
USING A REFERENCE AS A POWER SUPPLY FOR
THE AD56x7R/AD56x7
Because the supply current required by the AD56x7R/AD56x7 is
extremely low, an alternative option is to use a voltage reference
to supply the required voltage to the part (see Figure 67). This is
especially useful if the power supply is quite noisy, or if the
system supply voltages are at some value other than 5 V or 3 V,
for example, 15 V. The voltage reference outputs a steady supply
voltage for the AD56x7R/AD56x7. If the low dropout REF195 is
used, it must supply 450 μA of current to the AD56x7R/AD56x7
with no load on the output of the DAC. When the DAC output is
loaded, the REF195 also needs to supply the current to the load.
The total current required (with a 5 kΩ load on the DAC
output) is
450 μA + (5 V/5 kΩ) = 1.45 mA
The load regulation of the REF195 is typically 2 ppm/mA,
resulting in a 2.9 ppm (14.5 μV) error for the 1.45 mA current
drawn from it. This corresponds to a 0.191 LSB error.
2-WIRE
SERIAL
INTERFACE
SCL
SDA
5V
V
OUT
= 0V TO 5V
V
DD
GND
15
V
REF195
AD5627R/
AD5647R/
AD5667R/
AD5627/
AD5667
06342-043
Figure 67. REF195 as Power Supply to the AD56x7R/AD56x7
BIPOLAR OPERATION USING THE
AD56x7R/AD56x7
The AD56x7R/AD56x7 has been designed for single-supply
operation, but a bipolar output range is also possible using the
circuit in Figure 68. The circuit gives an output voltage range of
±5 V. Rail-to-rail operation at the amplifier output is achieved
using an AD820 or an OP295 as the output amplifier.
The output voltage for any input code can be calculated as
follows:
×
+
×
×= R1
R2
V
R1
R2R1D
VV DDDD
O536,65
where D represents the input code in decimal (0 to 65535).
With VDD = 5 V, R1 = R2 = 10 kΩ,
V5
536,65
10
×
=D
VO
This is an output voltage range of ±5 V, with 0x0000 corre-
sponding to a −5 V output, and 0xFFFF corresponding to a
+5 V output.
2-WIRE
SERIAL
INTERFACE
R2 = 10k
+5V
–5V
AD820/
OP295
AD5627R/
AD5647R/
AD5667R/
AD5627/
AD5667
VDD VOUT
R1 = 10k
±5V
0.1µF10µF
+
5
V
SDASCLGND
06342-044
VO
Figure 68. Bipolar Operation with the AD56x7R/AD56x7
POWER SUPPLY BYPASSING AND GROUNDING
When accuracy is important in a circuit, it is helpful to carefully
consider the power supply and ground return layout on the
board. The printed circuit board containing the AD56x7R/AD56x7
should have separate analog and digital sections, each having its
own area of the board. If the AD56x7R/AD56x7 are in a system
where other devices require an AGND to DGND connection, the
connection should be made at one point only. This ground point
should be as close as possible to the AD56x7R/AD56x7.
The power supply to the AD56x7R/AD56x7 should be bypassed
with 10 μF and 0.1 μF capacitors. The capacitors should be
located as close as possible to the device, with the 0.1 μF capacitor
ideally right up against the device. The 10 μF capacitor should be
the tantalum bead type. It is important that the 0.1 μF capacitor
have low effective series resistance (ESR) and effective series
inductance (ESI), for example, common ceramic types of
capacitors. This 0.1 μF capacitor provides a low impedance path
to ground for high frequencies caused by transient currents due
to internal logic switching.
The power supply line itself should have as large a trace as
possible to provide a low impedance path and to reduce glitch
effects on the supply line. Clocks and other fast switching
digital signals should be shielded from other parts of the board
by digital ground. Avoid crossover of digital and analog signals
if possible. When traces cross on opposite sides of the board,
ensure that they run at right angles to each other to reduce
feedthrough effects through the board. The best board layout
technique is the microstrip technique where the component
side of the board is dedicated to the ground plane only and the
signal traces are placed on the solder side. However, this is not
always possible with a two-layer board.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 28 of 32
OUTLINE DIMENSIONS
3.00
BSC SQ
INDEX
AREA
TOP VIEW
1.50
BCS SQ
EXPOSED
PAD
(BOTTOM VIEW)
1.74
1.64
1.49
2.48
2.38
2.23
1
6
10
0.50
BSC
0.50
0.40
0.30
5
PIN 1
INDICATOR
0.80
0.75
0.70 0.05 MAX
0.02 NOM
S
EATING
PLANE 0.30
0.23
0.18
0.20 REF
0.80 MAX
0.55 TYP
SIDE VIEW
Figure 69. 10-Lead Lead Frame Chip Scale Package [LFCSP_WD]
3 mm x 3 mm Body, Very Very Thin, Dual Lead
(CP-10-9)
Dimensions shown in millimeters
COMPLIANT TO JEDEC STANDARDS MO-187-BA
0.23
0.08
0.80
0.60
0.40
0.15
0.05
0.33
0.17
0.95
0.85
0.75
SEATING
PLANE
1.10 MAX
10 6
5
1
0.50 BSC
PIN 1
COPLANARITY
0.10
3.10
3.00
2.90
3.10
3.00
2.90
5.15
4.90
4.65
Figure 70. 10-Lead Mini Small Outline Package [MSOP]
(RM-10)
Dimensions shown in millimeters
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 29 of 32
ORDERING GUIDE
Model
Temperature
Range Accuracy
On-Chip
Reference
Max I2C
Speed
Package
Description
Package
Option Branding
AD5627BCPZ-R21−40°C to +105°C ±1 LSB INL None 400 kHz 10-Lead LFCSP_WD CP-10 -9 DA1
AD5627BCPZ-REEL71 −40°C to +105°C ±1 LSB INL None 400 kHz 10-Lead LFCSP_WD CP-10-9 DA1
AD5627BRMZ1 −40°C to +105°C ±1 LSB INL None 400 kHz 10-Lead MSOP RM-10 DA1
AD5627BRMZ-REEL71 −40°C to +105°C ±1 LSB INL None 400 kHz 10-Lead MSOP RM-10 DA1
AD5627RBCPZ-R21 −40°C to +105°C ±1 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 D9J
AD5627RBCPZ-REEL71 −40°C to +105°C ±1 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 D9J
AD5627RBRMZ-11 −40°C to +105°C ±1 LSB INL 2.5 V 400 kHz 10-Lead MSOP RM-10 DA7
AD5627RBRMZ-1REEL71 −40°C to +105°C ±1 LSB INL 2.5 V 400 kHz 10-Lead MSOP RM-10 DA7
AD5627RBRMZ-21 −40°C to +105°C ±1 LSB INL 2.5 V 3.4 MHz 10-Lead MSOP RM-10 DA8
AD5627RBRMZ-2REEL71 −40°C to +105°C ±1 LSB INL 2.5 V 3.4 MHz 10-Lead MSOP RM-10 DA8
AD5647RBCPZ-R21 −40°C to +105°C ±4 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD RU-14 D9G
AD5647RBCPZ-REEL71 −40°C to +105°C ±4 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD RU-14 D9G
AD5647RBRMZ1 −40°C to +105°C ±4 LSB INL 2.5 V 400 kHz 10-Lead MSOP RM-10 D9G
AD5647RBRMZ-REEL71 −40°C to +105°C ±4 LSB INL 2.5 V 400 kHz 10-Lead MSOP RM-10 D9G
AD5667BCPZ-R21 −40°C to +105°C ±12 LSB INL None 400 kHz 10-Lead LFCSP_WD CP-10-9 D9Z
AD5667BCPZ-REEL71 −40°C to +105°C ±12 LSB INL None 400 kHz 10-Lead LFCSP_WD CP-10-9 D9Z
AD5667BRMZ1 −40°C to +105°C ±12 LSB INL None 400 kHz 10-Lead MSOP RM-10 D9Z
AD5667BRMZ-REEL71 −40°C to +105°C ±12 LSB INL None 400 kHz 10-Lead MSOP RM-10 D9Z
AD5667RBCPZ-R21 −40°C to +105°C ±12 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 D8X
AD5667RBCPZ-REEL71 −40°C to +105°C ±12 LSB INL 1.25 V 400 kHz 10-Lead LFCSP_WD CP-10-9 D8X
AD5667RBRMZ-11 −40°C to +105°C ±12 LSB INL 2.5 V 400 kHz 10-Lead MSOP RM-10 DA5
AD5667RBRMZ-1REEL71 −40°C to +105°C ±12 LSB INL 2.5 V 400 kHz 10-Lead MSOP RM-10 DA5
AD5667RBRMZ-21 −40°C to +105°C ±12 LSB INL 2.5 V 3.4 MHz 10-Lead MSOP RM-10 DA6
AD5667RBRMZ-2REEL71 −40°C to +105°C ±12 LSB INL 2.5 V 3.4 MHz 10-Lead MSOP RM-10 DA6
EVAL-AD5667REBZ1 Evaluation Board
1 Z = Pb-free part.
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 30 of 32
NOTES
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 31 of 32
NOTES
AD5627R/AD5647R/AD5667R, AD5627/AD5667
Rev. 0 | Page 32 of 32
NOTES
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Rights to use these components in an I2C system, provided that the system conforms to the I2C Standard Specification as defined by Philips.
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registered trademarks are the property of their respective owners.
D06342-0-1/07(0)