IRF634 IRF634FP N-CHANNEL 250V - 0.38 - 8A TO-220/TO-220FP MESH OVERLAYTM MOSFET TYPE IRF634 IRF634FP VDSS RDS(on) ID 250 V 250 V < 0.45 < 0.45 8A 8A TYPICAL RDS(on) = 0.38 EXTREMELY HIGH dv/dt CAPABILITY 100% AVALANCHE TESTED 3 1 DESCRIPTION Using the latest high voltage MESH OVERLAYTM process, STMicroelectronics has designed an advanced family of power MOSFETs with outstanding performance. The new patented STrip layout coupled with the Company's proprietary edge termination structure, makes it suitable in coverters for lighting applications. 3 2 1 TO-220 2 TO-220FP INTERNAL SCHEMATIC DIAGRAM APPLICATIONS HIGH CURRENT, HIGH SPEED SWITCHING SWITH MODE POWER SUPPLIES (SMPS) DC-DC CONVERTERS FOR TELECOM, INDUSTRIAL, AND LIGHTING EQUIPMENT IDEAL FOR MONITOR's B+ FUNCTION ABSOLUTE MAXIMUM RATINGS Symbol Parameter Value IRF634 VDS VDGR VGS Unit IRF634FP Drain-source Voltage (VGS = 0) 250 V Drain-gate Voltage (RGS = 20 k) 250 V Gate- source Voltage 20 V ID Drain Current (continuos) at TC = 25C 8 8(*) A ID Drain Current (continuos) at TC = 100C 5 5(*) A Drain Current (pulsed) 32 32(*) A IDM () PTOT Total Dissipation at TC = 25C Derating Factor dv/dt (1) Insulation Withstand Voltage (DC) Tstg Storage Temperature Max. Operating Junction Temperature (*)Pulse width limited by safe operating area July 2001 30 W 0.24 W/C Peak Diode Recovery voltage slope VISO Tj 80 0.64 5 - V/ns 2000 V -65 to 150 C 150 C (1) ISD 8A, di/dt300 A/s, VDD V (BR)DSS, TjTjMAX (*)Limited only by maximum temperature allowed 1/9 IRF634/IRF634FP THERMAL DATA TO-220 TO-220FP 1.56 4.11 Rthj-case Thermal Resistance Junction-case Max Rthj-amb Thermal Resistance Junction-ambient Max 62.5 C/W Maximum Lead Temperature For Soldering Purpose 300 C Tl C/W AVALANCHE CHARACTERISTICS Symbol Parameter IAR Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by Tj max) EAS Single Pulse Avalanche Energy (starting Tj = 25 C, ID = IAR, VDD = 50 V) Max Value Unit 8 A 300 mJ ELECTRICAL CHARACTERISTICS (TCASE = 25 C UNLESS OTHERWISE SPECIFIED) OFF Symbol V(BR)DSS IDSS IGSS Parameter Test Conditions Min. Typ. Max. 250 Unit Drain-source Breakdown Voltage ID = 250 A, VGS = 0 V Zero Gate Voltage Drain Current (VGS = 0) VDS = Max Rating 1 A VDS = Max Rating, TC = 125 C 10 A Gate-body Leakage Current (VDS = 0) VGS = 20V 100 nA ON (1) Symbol Parameter Test Conditions VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250A RDS(on) Static Drain-source On Resistance VGS = 10V, ID = 4 A Min. Typ. Max. Unit 2 3 4 V 0.38 0.45 Min. Typ. Max. Unit 7 8 S 770 pF DYNAMIC Symbol gfs (1) 2/9 Parameter Forward Transconductance Test Conditions VDS > ID(on) x RDS(on)max, ID = 4A VDS = 25V, f = 1 MHz, VGS = 0 Ciss Input Capacitance Coss Output Capacitance 118 pF Crss Reverse Transfer Capacitance 48 pF IRF634/IRF634FP ELECTRICAL CHARACTERISTICS (CONTINUED) SWITCHING ON Symbol td(on) tr Parameter Turn-on Delay Time Rise Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd Gate-Drain Charge Test Conditions Min. VDD = 125 V, ID = 4 A RG = 4.7 VGS = 10 V (see test circuit, Figure 3) VDD = 200V, ID = 8 A, VGS = 10V Typ. Max. Unit 13 ns 18 ns 37 51.8 nC 5.2 nC 14.8 nC SWITCHING OFF Symbol Parameter Test Conditions Min. Typ. Max. Unit td(Voff) tf Turn-off- Delay Time Fall Time VDD = 125V, ID = 4 A, RG = 4.7, VGS = 10V (see test circuit, Figure 3) 51 16 ns ns tr(Voff) tf tc Off-voltage Rise Time Fall Time Cross-over Time Vclamp = 200V, ID = 8 A, RG = 4.7, VGS = 10V (see test circuit, Figure 5) 12.5 12.5 28 ns ns ns SOURCE DRAIN DIODE Symbol ISD Parameter Test Conditions Min. Typ. Max. Unit Source-drain Current 8 A ISDM (2) Source-drain Current (pulsed) 32 A VSD (1) Forward On Voltage ISD = 8 A, VGS = 0 1.7 V trr Reverse Recovery Time Qrr Reverse Recovery Charge ISD = 8 A, di/dt = 100A/s VDD = 30V, Tj = 150C (see test circuit, Figure 5) IRRM Reverse Recovery Current 198 ns 1.1 C 11.3 A Note: 1. Pulsed: Pulse duration = 300 s, duty cycle 1.5 %. 2. Pulse width limited by safe operating area. Safe Operating Area for TO-220 Safe Operating Area for TO-220FP 3/9 IRF634/IRF634FP Thermal Impedence for TO-220 Output Characteristics Transconductance 4/9 Thermal Impedence for TO-220FP Transfer Characteristics Static Drain-source On Resistance IRF634/IRF634FP Gate Charge vs Gate-source Voltage Normalized Gate Thereshold Voltage vs Temp. Capacitance Variations Normalized On Resistance vs Temperature Source-drain Diode Forward Characteristics 5/9 IRF634/IRF634FP Fig. 1: Unclamped Inductive Load Test Circuit Fig. 2: Unclamped Inductive Waveform Fig. 3: Switching Times Test Circuit For Resistive Load Fig. 4: Gate Charge test Circuit Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times 6/9 IRF634/IRF634FP TO-220 MECHANICAL DATA mm DIM. MIN. inch TYP. MAX. MIN. TYP. MAX. A 4.40 4.60 0.173 0.181 C 1.23 1.32 0.048 0.051 D 2.40 2.72 0.094 D1 0.107 1.27 0.050 E 0.49 0.70 0.019 0.027 F 0.61 0.88 0.024 0.034 F1 1.14 1.70 0.044 0.067 F2 1.14 1.70 0.044 0.067 G 4.95 5.15 0.194 0.203 G1 2.4 2.7 0.094 0.106 H2 10.0 10.40 0.393 0.409 L2 16.4 0.645 13.0 14.0 0.511 0.551 L5 2.65 2.95 0.104 0.116 L6 15.25 15.75 0.600 0.620 L7 6.2 6.6 0.244 0.260 L9 3.5 3.93 0.137 0.154 DIA. 3.75 3.85 0.147 0.151 D1 C D A E L4 H2 G G1 F1 L2 F2 F Dia. L5 L9 L7 L6 L4 P011C 7/9 IRF634/IRF634FP TO-220FP MECHANICAL DATA mm. DIM. MIN. inch TYP MAX. MIN. 4.6 0.173 TYP. MAX. A 4.4 0.181 B 2.5 2.7 0.098 0.106 D 2.5 2.75 0.098 0.108 E 0.45 0.7 0.017 0.027 F 0.75 1 0.030 0.039 F1 1.15 1.7 0.045 0.067 F2 1.15 1.7 0.045 0.067 G 4.95 5.2 0.195 0.204 G1 2.4 2.7 0.094 0.106 H 10 10.4 0.393 L2 0.409 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 .0385 0.417 L5 2.9 3.6 0.114 0.141 L6 15.9 16.4 0.626 0.645 9 9.3 0.354 0.366 O 3 3.2 0.118 0.126 B D A E L7 L3 L6 F2 H G G1 F F1 L7 L2 8/9 L5 1 2 3 L4 IRF634/IRF634FP Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. 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