W39F010
128K × 8 CMOS FLASH MEMORY
Publication Release Date: December 26, 2005
- 1 - Revision A4
Table of Contents-
1. GENERAL DESCRIPTION......................................................................................................... 3
2. FEATURES................................................................................................................................. 3
3. PIN CONFIGURATIONS ............................................................................................................ 4
4. BLOCK DIAGRAM...................................................................................................................... 5
5. PIN DESCRIPTION..................................................................................................................... 6
6. FUNCTIONAL DESCRIPTION ................................................................................................... 7
6.1 Device Bus Operation..................................................................................................... 7
6.1.1 Read Mode...............................................................................................................7
6.1.2 Write Mode...............................................................................................................7
6.1.3 Standby Mode ..........................................................................................................7
6.1.4 Output Disable Mode................................................................................................7
6.2 Data Protection............................................................................................................... 7
6.3 Boot Block Operation...................................................................................................... 8
6.3.1 Low VDD Inhibit........................................................................................................8
6.3.2 Write Pulse "Glitch" Protection .................................................................................8
6.3.3 Logical Inhibit............................................................................................................8
6.3.4 Power-up Write Inhibit ..............................................................................................8
6.4 Command Definitions ..................................................................................................... 8
6.4.1 Read Command .......................................................................................................9
6.4.2 Auto-select Command..............................................................................................9
6.4.3 Byte Program Command..........................................................................................9
6.4.4 Chip Erase Command ............................................................................................10
6.4.5 Page Erase Command ...........................................................................................10
6.5 Write Operation Status ................................................................................................. 10
6.5.1 DQ7: Data Polling...................................................................................................10
6.5.2 DQ6: Toggle Bit......................................................................................................11
7. TABLE OF OPERATING MODES............................................................................................ 12
7.1 Device Bus Operations................................................................................................. 12
7.2 Command Definitions ................................................................................................... 12
7.3 Embedded Programming Algorithm ............................................................................. 14
7.4 Embedded Erase Algorithm.......................................................................................... 15
7.5 Embedded #Data Polling Algorithm.............................................................................. 16
7.6 Boot Block Lockout Enable Flow Chart........................................................................ 17
7.7 Software Product Identification and Boot Block Lockout Detection Flow Chart........... 18
W39F010
- 2 -
8. DC CHARACTERISTICS.......................................................................................................... 19
8.1 Absolute maximum Ratings.......................................................................................... 19
8.2 DC Operating Characteristics....................................................................................... 19
8.3 Pin Capacitance............................................................................................................ 19
9. AC CHARACTERISTICS.......................................................................................................... 20
9.1 AC Test Conditions....................................................................................................... 20
9.2 AC Test Load and Waveform ....................................................................................... 20
9.3 Read Cycle Timing Parameters.................................................................................... 21
9.4 Write Cycle Timing Parameters.................................................................................... 21
9.5 Power-up Timing........................................................................................................... 22
9.6 Data Polling and Toggle Bit Timing Parameters .......................................................... 22
10. TIMING WAVEFORMS............................................................................................................. 23
10.1 Read Cycle Timing Diagram......................................................................................... 23
10.2 #WE Controlled Command Write Cycle Timing Diagram............................................. 23
10.3 #CE Controlled Command Write Cycle Timing Diagram.............................................. 24
10.4 Chip Erase Timing Diagram ......................................................................................... 24
10.5 Page Erase Timing Diagram ........................................................................................ 25
10.6 #DATA Polling Timing Diagram.................................................................................... 25
10.7 Toggle Bit Timing Diagram........................................................................................... 26
11. ORDERING INFORMATION .................................................................................................... 27
12. HOW TO READ THE TOP MARKING...................................................................................... 28
13. PACKAGE DIMENSIONS......................................................................................................... 29
13.1 32-pin P-DIP ................................................................................................................. 29
13.2 32-pin TSOP (8 x 20 mm)............................................................................................. 30
13.3 32-pin PLCC ................................................................................................................. 31
13.4 32-pin STSOP (8 x 14 mm) .......................................................................................... 31
14. VERSION HISTORY................................................................................................................. 32
W39F010
Publication Release Date: December 26, 2005
- 3 - Revision A4
1. GENERAL DESCRIPTION
The W39F010 is a 1Mbit, 5-volt only CMOS flash memory organized as 128K × 8 bits. For flexible
erase capability, the 1Mbits of data are divided into 32 small even pages with 4 Kbytes. The byte-wide
(× 8) data appears on DQ7 − DQ0. The device can be programmed and erased in-system with a
standard 5V power supply. A 12-volt VPP is not required. The unique cell architecture of the W39F010
results in fast program/erase operations with extremely low current consumption (compared to other
comparable 5-volt flash memory products). The device can also be programmed and erased by using
standard EPROM programmers.
2. FEATURES
y Single 5-volt operations
− 5-volt Read
− 5-volt Erase
− 5-volt Program
y Fast Program operation:
− Byte-by-Byte programming: 50 μS (max.)
y Fast Erase operation:
− Chip Erase cycle time: 100 mS (max.)
− Page Erase cycle time: 25 mS (max.)
y Read access time: 70/90 nS
y 32 even pages with 4K bytes
y Any individual page can be erased
y Hardware protection:
− Optional 16K byte Top/Bottom Boot Block with lockout protection
y Flexible 4K-page size can be used as Parameter Blocks
y Typical program/erase cycles:
− 1K/10K
y Twenty-year data retention
y Low power consumption
− Active current: 15 mA (typ.)
− Standby current: 15 μA (typ.)
y End of program detection
− Software method: Toggle bit/Data polling
y TTL compatible I/O
y JEDEC standard byte-wide pinouts
y Available packages: 32-pin 600 mil DIP, 32-pin PLCC, 32- pin STSOP (8 x 14 mm) and 32- pin
TSOP
W39F010
Publication Release Date: December 26, 2005
- 4 - Revision A4
3. PIN CONFIGURATIONS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
DQ0
DQ1
DQ2
Vss
A7
A6
A5
A4
A3
A2
A1
A0
NC
A16
A15
A12
V
#WE
A14
A13
A8
A9
A11
#OE
A10
#CE
DQ7
DQ6
DQ5
DQ4
DQ3
DD
32-pin
DIP
5
6
7
9
10
11
12
13
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
29
28
27
26
25
24
23
22
21
3031
32
1
2
3
4
8
2019
18171615
14
D
Q
1
D
Q
2
V
S
S
D
Q
3
D
Q
4
D
Q
5
D
Q
6
A14
A13
A8
A9
A11
#OE
A10
#CE
DQ7
A
1
2
A
1
6N
C
V
D
D
#
W
E
A
1
5
32-pin
PLCC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16 A3
A2
A1
A0
DQ0
DQ1
DQ2
Vss
#OE
A10
#CE
DQ7
DQ6
DQ5
DQ4
DQ3
32-pin
TSOP
A15
A12
A7
A6
A5
A4
V
#WE
A14
A13
A8
DD
A11
A9
NC
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A16
NC
N
C
NC
W39F010
Publication Release Date: December 26, 2005
- 5 - Revision A4
4. BLOCK DIAGRAM
DQ0 - DQ7
A0 - A16
Data
latch
Input / output
Buffers
Chip Enable
Output Enable
Logic
Y-MUX / SENSING
ARRAY
Y-Decode
X-decode
A
d
d
r
e
s
s
L
a
t
c
h
State
Control
Command
Register
#CE
#WE
#OE
VDD
Vss
VDD Detect
Timer
Erase Voltage
Generator
Program Voltage
Generator
W39F010
- 6 -
5. PIN DESCRIPTION
SYMBOL PIN NAME
A0 − A16 Address Inputs
DQ0 − DQ7 Data Inputs/Outputs
#CE Chip Enable
#OE Output Enable
#WE Write Enable
VDD Power Supply
VSS Ground
NC No Connections
W39F010
Publication Release Date: December 26, 2005
- 7 - Revision A4
6. FUNCTIONAL DESCRIPTION
6.1 Device Bus Operation
6.1.1 Read Mode
The read operation of the W39F010 is controlled by #CE and #OE, both of which have to be low for
the host to obtain data from the outputs. #CE is used for device selection. When #CE is high, the chip
is de-selected and only standby power will be consumed. #OE is the output control and is used to gate
data from the output pins. The data bus is in high impedance state when either #CE or #OE is high.
Refer to the timing waveforms for further details.
6.1.2 Write Mode
Device erasure and programming are accomplished via the command register. The contents of the
register serve as inputs to the internal state machine. The state machine outputs dictate the function
of the device.
The command register itself does not occupy any addressable memory location. The register is a latch
used to store the commands, along with the address and data information needed to execute the
command. The command register is written to bring #WE to logic low state, while #CE is at logic low
state and #OE is at logic high state. Addresses are latched on the falling edge of #WE or #CE,
whichever happens later; while data is latched on the rising edge of #WE or #CE, whichever happens
first. Standard microprocessor write timings are used.
Refer to AC Write Characteristics and the Erase/Programming Waveforms for specific timing
parameters.
6.1.3 Standby Mode
There are two ways to implement the standby mode on the W39F010 device, both using the #CE pin.
A CMOS standby mode is achieved with the #CE input held at VDD ±0.5V. Under this condition the current
is typically reduced to less than 50 μA. A TTL standby mode is achieved with the #CE pin held at VIH.
Under this condition the current is typically reduced to 2 mA.
In the standby mode the outputs are in the high impedance state, independent of the #OE input.
6.1.4 Output Disable Mode
With the #OE input at a logic high level (VIH), output from the device is disabled. This will cause the
output pins to be in a high impedance state.
6.2 Data Protection
The W39F010 is designed to offer protection against accidental erasure or programming caused by
spurious system level signals that may exist during power transitions. During power up the device
automatically resets the internal state machine in the Read mode. Also, with its control register
architecture, alteration of the memory contents only occurs after successful completion of specific
multi-bus cycle command sequences. The device also incorporates several features to prevent
inadvertent write cycles resulting from VDD power-up and power-down transitions or system noise.
W39F010
- 8 -
6.3 Boot Block Operation
There are two alternatives to set the boot block. The 16K-byte in the top/bottom location of this device
can be locked as boot block, which can be used to store boot codes. It is located in the last 16K bytes
or first 16K bytes of the memory with the address range from 1C000(hex) to 1FFFF(hex) for top
location or 00000(hex) to 03FFF(hex) for bottom location.
See Command Codes for Boot Block Lockout Enable for the specific code. Once this feature is set the
data for the designated block cannot be erased or programmed (programming lockout), other memory
locations can be changed by the regular programming method.
In order to detect whether the boot block feature is set on the first/last 16K-byte block or not, users
can perform software command sequence: enter the product identification mode (see Command
Codes for Identification/Boot Block Lockout Detection for specific code), and then read from address
0002(hex) for first(bottom) location or 1FFF2(hex) for last(top) location. If the DQ0/DQ1 of output
data is "1," the 16Kbytes boot block programming lockout feature will be activated; if the DQ0/DQ1 of
output data is "0," the lockout feature will be inactivated and the block can be erased/programmed.
To return to normal operation, perform a three-byte command sequence (or an alternate single-byte
command) to exit the identification mode. For the specific code, see Command Codes for
Identification/Boot Block Lockout Detection.
6.3.1 Low VDD Inhibit
To avoid initiation of a write cycle during VDD power-up and power-down, the W39F010 locks out
when VDD < 2.0V (see DC Characteristics section for voltages). The write and read operations are
inhibited when VDD is less than 2.0V typical. The W39F010 ignores all write and read operations until
VDD > 2,0V. The user must ensure that the control pins are in the correct logic state when VDD > 2.0V
to prevent unintentional writes.
6.3.2 Write Pulse "Glitch" Protection
Noise pulses of less than 10 nS (typical) on #OE, #CE, or #WE will not initiate a write cycle.
6.3.3 Logical Inhibit
Writing is inhibited by holding any one of #OE = VIL, #CE = VIH, or #WE = VIH. To initiate a write cycle
#CE and #WE must be a logical zero while #OE is a logical one.
6.3.4 Power-up Write Inhibit
Power-up of the device with #WE = #CE = VIL and #OE = VIH will not accept commands on the rising
edge of #WE except 5mS delay (see the power up timing in AC Characteristics). The internal state
machine is automatically reset to the read mode on power-up.
6.4 Command Definitions
Device operations are selected by writing specific address and data sequences into the command
register. Writing incorrect address and data values or writing them in the improper sequence will reset
the device to the read mode. "Command Definitions" defines the valid register command sequences.
W39F010
Publication Release Date: December 26, 2005
- 9 - Revision A4
6.4.1 Read Command
The device will automatically power-up in the read state. In this case, a command sequence is not
required to read data. Standard microprocessor read cycles will retrieve array data. This default value
ensures that no spurious alteration of the memory content occurs during the power transition.
The device will automatically returns to read state after completing an Embedded Program or
Embedded Erase algorithm.
Refer to the AC Read Characteristics and Waveforms for the specific timing parameters.
6.4.2 Auto-select Command
Flash memories are intended for use in applications where the local CPU can alter memory contents.
As such, manufacture and device codes must be accessible while the device resides in the target
system.
The device contains an auto-select command operation to supplement traditional PROM programming
methodology. The operation is initiated by writing the auto-select command sequence into the
command register. Following the command write, a read cycle from address XX00H retrieves the
manufacture code of DAH. A read cycle from address XX01H returns the device code (W39F010 =
A1).
To terminate the operation, it is necessary to write the auto-select exit command sequence into the
register.
6.4.3 Byte Program Command
The device is programmed on a byte-by-byte basis. Programming is a four-bus-cycle operation. The
program command sequence is initiated by writing two "unlock" write cycles, followed by the program
set-up command. The program address and data are written next, which in turn initiate the Embedded
program algorithm. Addresses are latched on the falling edge of #CE or #WE, whichever happens
later and the data is latched on the rising edge of #CE or #WE, whichever happens first. The rising
edge of #CE or #WE (whichever happens first) begins programming using the Embedded Program
Algorithm. Upon executing the algorithm, the system is not required to provide further controls or
timings. The device will automatically provide adequate internally generated program pulses and verify
the programmed cell margin.
The automatic programming operation is completed when the data on DQ7 (also used as Data
Polling) is equivalent to the data written to this bit at which time the device returns to the read mode
and addresses are no longer latched (see "Hardware Sequence Flags"). Therefore, the device
requires that a valid address to the device be supplied by the system at this particular instance of time
for Data Polling operations. Data Polling must be performed at the memory location which is being
programmed.
Any commands written to the chip during the Embedded Program Algorithm will be ignored. If a
hardware reset occurs during the programming operation, the data at that particular location will be
corrupted.
Programming is allowed in any sequence and across page boundaries. Beware that a data "0" cannot
be programmed back to a "1". Attempting to program 0 back to 1, the toggle bit will stop toggling. Only
erase operations can convert "0"s to "1"s.
Refer to the Programming Command Flow Chart using typical command strings and bus operations.
W39F010
- 10 -
6.4.4 Chip Erase Command
Chip erase is a six-bus-cycle operation. There are two "unlock" write cycles, followed by writing the
"set-up" command. Two more "unlock" write cycles are asserted, followed by the chip erase
command.
Chip erase does not require the user to program the device prior to erase. Upon executing the
Embedded Erase Algorithm command sequence the device will automatically erase and verify the
entire memory for an all one data pattern. The erase is performed sequentially on each pages at the
same time (see "Feature"). The system is not required to provide any controls or timings during these
operations.
The automatic erase begins on the rising edge of the last #WE pulse in the command sequence and
terminates when the data on DQ7 is "1" at which time the device returns to read the mode.
Refer to the Erase Command Flow Chart using typical command strings and bus operations.
6.4.5 Page Erase Command
Page erase is a six-bus cycles operation. There are two "unlock" write cycles, followed by writing the
"set-up" command. Two more "unlock" write cycles then follows by the page erase command. The
page address (any address location within the desired page) is latched on the falling edge of #WE,
while the command (50H) is latched on the rising edge of #WE.
Page erase does not require the user to program the device prior to erase. When erasing a page, the
remaining unselected pages are not affected. The system is not required to provide any controls or
timings during these operations.
The automatic page erase begins after the erase command is completed, right from the rising edge of
the #WE pulse for the last page erase command pulse and terminates when the data on DQ7, Data
Polling, is "1" at which time the device returns to the read mode. Data Polling must be performed at an
address within any of the pages being erased.
Refer to the Erase Command flow Chart using typical command strings and bus operations.
6.5 Write Operation Status
6.5.1 DQ7: Data Polling
The W39F010 device features Data Polling as a method to indicate to the host that the embedded
algorithms are in progress or completed.
During the Embedded Program Algorithm, an attempt to read the device will produce the complement
of the data last written to DQ7. Upon completion of the Embedded Program Algorithm, an attempt to
read the device will produce the true data last written to DQ7.
During the Embedded Erase Algorithm, an attempt to read the device will produce a "0" at the DQ7
output. Upon completion of the Embedded Erase Algorithm, an attempt to read the device will produce
a "1" at the DQ7 output.
For chip erase, the Data Polling is valid after the rising edge of the sixth pulse in the six #WE write
pulse sequences. For page erase, the Data Polling is valid after the last rising edge of the page erase
#WE pulse. Data Polling must be performed at addresses within any of the pages being erased.
Otherwise, the status may not be valid.
W39F010
Publication Release Date: December 26, 2005
- 11 - Revision A4
Just prior to the completion of Embedded Algorithm operations DQ7 may change asynchronously
while the output enable (#OE) is asserted low. This means that the device is driving status information
on DQ7 at one instant of time and then that byte′s valid data at the next instant of time. Depending on
when the system samples the DQ7 output, it may read the status or valid data. Even if the device has
completed the Embedded Algorithm operations and DQ7 has a valid data, the data outputs on DQ0–
DQ6 may be still invalid. The valid data on DQ0 − DQ7 will be read on the successive read attempts.
The Data Polling feature is only active during the Embedded Programming Algorithm, Embedded
Erase Algorithm, or page erase time-out (see "Command Definitions").
6.5.2 DQ6: Toggle Bit
The W39F010 also features the "Toggle Bit" as a method to indicate to the host system that the
embedded algorithms are in progress or completed.
During an Embedded Program or Erase Algorithm cycle, successive attempts to read (#OE toggling)
data from the device at any address will result in DQ6 toggling between one and zero. Once the
Embedded Program or Erase Algorithm cycle is completed, DQ6 will stop toggling and valid data will
be read on the next successive attempt. During programming, the Toggle Bit is valid after the rising
edge of the fourth #WE pulse in the four write pulse sequence. For chip erase, the Toggle Bit is valid
after the rising edge of the sixth #WE pulse in the six write pulse sequence. For page erase, the
Toggle Bit is valid after the last rising edge of the page erase #WE pulse. The Toggle Bit is active
during the page erase time-out.
Either #CE or #OE toggling will cause DQ6 to toggle.
W39F010
- 12 -
7. TABLE OF OPERATING MODES
7.1 Device Bus Operations
PIN
MODE #CE #OE #WE DQ0 − DQ7
Read VIL VIL VIH Dout
Write VIL VIH VIL Din
Standby VIH X X High Z
X VIL X High Z/Dout
Write Inhibit X X VIH High Z/Dout
Output Disable VIL VIH VIH High Z
7.2 Command Definitions
COMMAND NO. OF 1ST CYCLE 2ND CYCLE 3RD CYCLE 4TH CYCLE 5TH CYCLE 6TH CYCLE 7TH CYCLE
Description Cycles Addr. (1)Data Addr. Data Addr. Data Addr. Data Addr. Data Addr. Data Addr. Data
Read 1
AIN D
OUT
Chip Erase 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 10
Page Erase 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 PA(3) 50
Byte Program 4 5555 AA 2AAA 55 5555 A0 AIN D
IN
Top Boot Block
Lockout –16KByte 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 70 1FFFF
XX(4)
Bottom Boot Block
Lockout - 16KByte 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 70 00000
XX(4)
Product ID Entry 3 5555 AA 2AAA 55 5555 90
Product ID Exit (2) 3 5555 AA 2AAA 55 5555 F0
Product ID Exit (2) 1 XXXX F0
Notes:
1. Address Format: A14 − A0 (Hex); Data Format: DQ7 − DQ0 (Hex)
2. Either one of the two Product ID Exit commands can be used.
3. PA: Page Address
W39F010
Publication Release Date: December 26, 2005
- 13 - Revision A4
PA = 1FXXXh for Page 31 PA = 0FXXXh for Page 15
PA = 1EXXXh for Page 30 PA = 0EXXXh for Page 14
PA = 1DXXXh for Page 29 PA = 0DXXXh for Page 13
PA = 1CXXXh for Page 28 PA = 0CXXXh for Page 12
PA = 1BXXXh for Page 27 PA = 0BXXXh for Page 11
PA = 1AXXXh for Page 26 PA = 0AXXXh for Page 10
PA = 19XXXh for Page 25 PA = 09XXXh for Page 9
PA = 18XXXh for Page 24 PA = 08XXXh for Page 8
PA = 17XXXh for Page 23 PA = 07XXXh for Page 7
PA = 16XXXh for Page 22 PA = 06XXXh for Page 6
PA = 15XXXh for Page 21 PA = 05XXXh for Page 5
PA = 14XXXh for Page 20 PA = 04XXXh for Page 4
PA = 13XXXh for Page 19 PA = 03XXXh for Page 3
PA = 12XXXh for Page 18 PA = 02XXXh for Page 2
PA = 11XXXh for Page 17 PA = 01XXXh for Page 1
PA = 10XXXh for Page 16 PA = 00XXXh for Page 0
4. XX: Don't care
W39F010
- 14 -
7.3 Embedded Programming Algorithm
Start
Write Program Command Sequence
(see below)
Increment Address
Programming Completed
5555H/AAH
2AAAH/55H
5555H/A0H
Program Address/Program Data
#Data Polling/ Toggle bit
Last Address
?
No
Yes
Program Command Sequence (Address/Command):
Pause TBP
W39F010
Publication Release Date: December 26, 2005
- 15 - Revision A4
7.4 Embedded Erase Algorithm
Start
Write Erase Command Sequence
(see below)
Erasure Completed
#Data Polling or Toggle Bit
Successfully Completed
5555H/AAH
5555H/AAH
2AAAH/55H
2AAAH/55H
5555H/80H
5555H/10H
Chip Erase Command Sequence
(Address/Command):
5555H/AAH
5555H/AAH
2AAAH/55H
2AAAH/55H
5555H/80H
Page Address/50H
Individual Page Erase
(Address/Command):
Command Sequence
Pause TEC /TPEC
W39F010
- 16 -
7.5 Embedded #Data Polling Algorithm
Start
Read Byte
(DQ0 - DQ7)
Address = VA
Pass
DQ7 = Data
?
Yes
No
VA = Byte address for programming
= Any of the page addresses within
the page being erased during page
erase operation
=Any of the device addresses being erased
during chip operation
Embedded Toggle Bit Algorithm
Start
Read Byte
(DQ0 - DQ7)
Address = Don't Care
DQ6 = Toggle
?
Yes
No
Pass
W39F010
Publication Release Date: December 26, 2005
- 17 - Revision A4
7.6 Boot Block Lockout Enable Flow Chart
Boot Block Lockout
Feature Set Flow
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 80
to
address 5555
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 70
to
address 5555
Pause T
Exit
70 to lock 16K Boot Block
Load data XX
to
address 1FFFF/0 1FFFF(XX) to lock Top Boot Block
00000(XX) to lock Bottom Boot Block
BP
W39F010
- 18 -
7.7 Software Product Identification and Boot Block Lockout Detection Flow Chart
Product
Identification
Entry (1)
Load data 55
to
address 2AAA
Load data 90
to
address 5555
Pause 10 S
Product
Identification
and Boot Block
Lockout Detection
Mode (3)
Read address = 0000
data = DA
Read address = 0001
Read address=02/1FFF2
for Bottom/Top
data: in DQ1="1" or "0"
for 16K Boot Block
(4)
Product
Identification Exit(6)
Load data 55
to
address 2AAA
Load data F0
to
address 5555
Normal Mode (5)
(2)
(2)
Load data AA
to
address 5555
μ
Load data AA
to
address 5555
Pause 10 S
μ
data = A1
Notes for software product identification/boot block lockout detection:
(1) Data Format: DQ7−DQ0 (Hex); Address Format: A14−A0 (Hex)
(2) A1−A16 = VIL; manufacture code is read for A0 = VIL; device code is read for A0 = VIH.
(3) The device does not remain in identification and boot block lockout detection mode if power down.
(4) If the output data in DQ0 or DQ1= " 1 " the boot block programming lockout feature is activated; if the output data
in DQ0 or DQ1= " 0 ," the lockout feature is inactivated and the matched boot block can be programmed.
(5) The device returns to standard operation mode.
(6) Optional 1-byte cycle (write F0 hex at XXXX address) can be used to exit the product identification/boot block lockout
detection.
W39F010
Publication Release Date: December 26, 2005
- 19 - Revision A4
8. DC CHARACTERISTICS
8.1 Absolute maximum Ratings
PARAMETER RATING UNIT
Power Supply Voltage to VSS Potential -2.0 to +7.0 V
Operating Temperature 0 to +70 °C
Storage Temperature -65 to +125 °C
Voltage on Any Pin to Ground Potential Except A9 -2.0 to +7.0 V
Voltage on A9 Pin to Ground Potential -2.0 to +13.0 V
Note: Exposure to conditions beyond those listed under Absolute maximum Ratings may adversely affect the life and reliability
of the device.
8.2 DC Operating Characteristics
(VDD = 5V ±0.5V, VSS = 0V, TA = 0 to 70° C)
LIMITS
PARAMETER SYM. TEST CONDITIONS MIN. TYP. MAX. UNIT
Power Supply Current IDD #CE = #OE = VIL, #WE = VIH,
all DQs open
Address inputs = VIL/VIH, at f = 5 MHz - 15 30 mA
Standby VDD
Current (TTL input) ISB1
#CE = VIH, all DQs open
Other inputs = VIL/VIH - 1 2 mA
Standby VDD Current
(CMOS input) ISB2 #CE = VDD -0.3V, all DQs open
Other inputs = VDD -0.3V/ VSS - 15 50 μA
Input Leakage Current ILI VIN = VSS to VDD - - 1
μA
Output Leakage
Current ILO VOUT = VSS to VDD - - 1
μA
Input Low Voltage VIL - -0.3 - 0.8 V
Input High Voltage VIH - 2.0 - VDD +0.5 V
Output Low Voltage VOL IOL = 2.1 mA - - 0.45 V
Output High Voltage VOH IOH = -0.4 mA 2.4 - - V
8.3 Pin Capacitance
(VDD = 5V, TA = 25° C, f = 1 MHz)
PARAMETER SYMBOL CONDITIONS TYP. MAX. UNIT
Input Capacitance CIN VIN = 0V 6 8 pF
Output Capacitance COUT VOUT = 0V 10 12 pF
W39F010
- 20 -
9. AC CHARACTERISTICS
9.1 AC Test Conditions
PARAMETER CONDITIONS
Input Pulse Levels 0V to 3V
Input Rise/Fall Time <5 nS
Input/Output Timing Level 1.5V/1.5V
Output Load 1 TTL Gate and CL = 30 pF
9.2 AC Test Load and Waveform
+5V
1.8K
1.3K
DOUT
Ω
Ω
30 pF
(Including Jig and Scope)
Input
3V
0V
Test Point Test Point
1.5V 1.5V
Output
W39F010
Publication Release Date: December 26, 2005
- 21 - Revision A4
AC Characteristics, continued
9.3 Read Cycle Timing Parameters
(VDD = 5V ±0.5V, VSS = 0V, TA = 0 to 70° C)
W39F010-70 W39F010-90
PARAMETER SYMBOL MIN. MAX. MIN. MAX. UNIT
Read Cycle Time TRC 70 - 90 - nS
Chip Enable Access Time TCE - 70 - 90 nS
Address Access Time TAA - 70 - 90 nS
Output Enable Access Time TOE - 35 - 45 nS
#CE Low to Active Output TCLZ 0 - 0 - nS
#OE Low to Active Output TOLZ 0 - 0 - nS
#CE High to High-Z Output TCHZ - 25 - 25 nS
#OE High to High-Z Output TOHZ - 25 - 25 nS
Output Hold from Address Change TOH 0 - 0 - nS
9.4 Write Cycle Timing Parameters
PARAMETER SYMBOL MIN. TYP. MAX. UNIT
Address Setup Time TAS 0 - - nS
Address Hold Time TAH 40 - - nS
#WE and #CE Setup Time TCS 0 - - nS
#WE and #CE Hold Time TCH 0 - - nS
#OE High Setup Time TOES 0 - - nS
#OE High Hold Time TOEH 0 - - nS
#CE Pulse Width TCP 100 - - nS
#WE Pulse Width TWP 100 - - nS
#WE High Width TWPH 100 - - nS
Data Setup Time TDS 40 - - nS
Data Hold Time TDH 10 - - nS
Byte programming Time TBP - 35 50 μS
Chip Erase Cycle Time TEC - 50 100 mS
Page Erase Cycle Time TEP - 12.5 25 mS
Note: All AC timing signals observe the following guidelines for determining setup and hold times:
(a) High level signal's reference level is VIH and (b) low level signal's reference level is VIL.
W39F010
- 22 -
AC Characteristics, Continued
9.5 Power-up Timing
PARAMETER SYMBOL TYPICAL UNIT
Power-up to Read Operation TPU. READ 100 μS
Power-up to Write Operation TPU. WRITE 5 mS
9.6 Data Polling and Toggle Bit Timing Parameters
W39F010-70 W39F010-90
PARAMETER SYM.
MIN. MAX. MIN. MAX. UNIT
#OE to Data Polling Output Delay TOEP - 35 - 45 nS
#CE to Data Polling Output Delay TCEP - 70 - 90 nS
#OE to Toggle Bit Output Delay TOET - 35 - 45 nS
#CE to Toggle Bit Output Delay TCET - 70 - 90 nS
W39F010
Publication Release Date: December 26, 2005
- 23 - Revision A4
10. TIMING WAVEFORMS
10.1 Read Cycle Timing Diagram
Address A16-0
DQ7-0 Data Valid
Data Valid
High-Z
#CE
#OE
#WE
TRC
VIH
TCLZ
TOLZ
TOE
TCE
TOH
TAA
TCHZ
TOHZ
High-Z
10.2 #WE Controlled Command Write Cycle Timing Diagram
Address A16-0
DQ7-0 Data Valid
#CE
#OE
#WE
TAS
TCS
TOES
TAH
TCH
TOEH
TWPH
TWP
TDS
TDH
Timing Waveforms, Continued
W39F010
- 24 -
10.3 #CE Controlled Command Write Cycle Timing Diagram
High Z Data Valid
#CE
#OE
#WE
DQ7-0
TAS TAH
TCPH
TOEH
TDH
TDS
TCP
TOES
Address A16-0
10.4 Chip Erase Timing Diagram
SB2
SB1
SB0
Address A16-0
DQ7-0
#CE
#OE
#WE
SB3 SB4 SB5 Internal Erase starts
Six-byte code for 5V-only software
chip erase
TWP
TWPH
TEC
5555 2AAA 5555 5555 2AAA 5555
AA 55 80 AA 55 10
W39F010
Publication Release Date: December 26, 2005
- 25 - Revision A4
Timing Waveforms, Continued
10.5 Page Erase Timing Diagram
SB2
SB1
SB0
Address A16-0
DQ7-0
#CE
#OE
#WE
SB3 SB4 SB5 Internal Erase starts
Six-byte commands for 5V-onl
y
Page Erase
TWP
TWPH
TEP
5555 2AAA 5555 5555 2AAA PA
AA 55 80 AA 55 50
PA = Page Address
Please refer to page 9 for detail informati
o
10.6 #DATA Polling Timing Diagram
Address A16-0
DQ7
#WE
#OE
#CE
X X X X
TCEP
TOEH
TOEP
TOES
TEC
TBP or
An An An An
W39F010
- 26 -
Timing Waveforms, Continued
10.7 Toggle Bit Timing Diagram
Address A16-0
DQ6
#CE
#OE
#WE
TOEH TOES
TBP orTEC
W39F010
Publication Release Date: December 26, 2005
- 27 - Revision A4
11. ORDERING INFORMATION
PART NO. ACCESS
TIME
(NS)
POWER SUPPLY
CURRENT MAX.
(MA)
STANDBY VDD
CURRENT MAX.
(MA) PACKAGE CYCLE
W39F010-70B 70 30 2 32-pin DIP 10K
W39F010-90B 90 30 2 32-pin DIP 10K
W39F010T-70B 70 30 2 32-pin TSOP (8 mm x 20 mm) 10K
W39F010T-90B 90 30 2 32-pin TSOP (8 mm x 20 mm) 10K
W39F010Q-70B 70 30 2 32-pin STSOP (8 mm x 14 mm) 10K
W39F010Q-90B 90 30 2 32-pin STSOP (8 mm x 14 mm) 10K
W39F010P-70B 70 30 2 32-pin PLCC 10K
W39F010P-90B 90 30 2 32-pin PLCC 10K
W39F010P-70Z 70 30 2 32-pin PLCC (Lead free) 10K
W39F010P-90Z 90 30 2 32-pin PLCC (Lead free) 10K
Notes:
1. Winbond reserves the right to make changes to its products without prior notice.
2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in
applications where personal injury might occur as a consequence of product failure.
W39F010
- 28 -
12. HOW TO READ THE TOP MARKING
Example: The top marking of 32-pin PLCC W39F010P-70
W39F010P-70
2138977A-A12
149OBSA
1st line: winbond logo
2nd line: the part number: W39F010P-70
3rd line: the lot number
4th line: the tracking code: 149 O B SA
149: Packages made in '01, week
49
O: Assembly house ID: A means ASE, O means OSE, ...etc.
B: IC revision; A means version A, B means version B, ...etc.
SA: Process code
W39F010
Publication Release Date: December 26, 2005
- 29 - Revision A4
13. PACKAGE DIMENSIONS
13.1 32-pin P-DIP
1.Dimensions D Max. & S include mold fl
a
tie bar burrs.
2.Dimension E1 does not include interlea
3.Dimensions D & E1 include mold mism
a
are determined at the mold parting li
n
6.General appearance spec. should be b
a
final visual inspection spec
.
.
1.371.22
0.0540.048
Notes:
Symbol Min. Nom. Max. Max.
Nom.
Min.
Dimension in inchesDimension in mm
A
B
c
D
e
A
L
S
A
A1
2
E
0.050 1.27
0.210 5.33
0.010
0.150
0.016
0.155
0.018
0.160
0.022
3.81
0.41
0.25
3.94
0.46
4.06
0.56
0.008
0.120
0.670
0.010
0.130
0.014
0.140
0.20
3.05
0.25
3.30
0.36
3.56
0.555
0.550
0.545 14.10
13.97
13.84
17.02
15.24
14.99 15.49
0.6000.590 0.610
2.29 2.54 2.790.090 0.100 0.110
B1
1
e
E1
a
1.650 1.660 41.91 42.16
015
0.085 2.16
0.650
0.630 16.00 16.51
protrusion/intrusion.
4.Dimension B1 does not include dam
5.Controlling dimension: Inche
s
150
Seating Plane
eA
2
A
a
c
E
Base Plane
1A
1
e
L
A
S
1E
D
1
B
B
32
116
17
W39F010
- 30 -
13.2 32-pin TSOP (8 x 20 mm)
A
A
A
2
1
L
L1Y
c
E
H
D
D
b
e
M
0.10(0.004)
θ
Min. Nom. Max. Min. Nom. Max.
Symbol
A
A
b
c
D
E
e
L
L
Y
1
1
2
A
HD
Note:
Controlling dimension: Millimeters
Dimension in Inches
0.047
0.006
0.041
0.039
0.037
0.007 0.008 0.009
0.005 0.006 0.007
0.720 0.724 0.728
0.311 0.315 0.319
0.780 0.787 0.795
0.020
0.016 0.020 0.024
0.031
0.000 0.004
135
0.002
1.20
0.05 0.15
1.051.00
0.95
0.17
0.12
18.30
7.90
19.80
0.40
0.00
1
0.20 0.23
0.15 0.17
18.40 18.50
8.00 8.10
20.00 20.20
0.50
0.50 0.60
0.80
0.10
35
Dimension in mm
θ
__ __ __ __
__ __
__ __
__ __
__
__
__
__
__
__
W39F010
Publication Release Date: December 26, 2005
- 31 - Revision A4
Package Dimensions, Continued
13.3 32-pin PLCC
L
c
1
b
2
A
H
E
E
eb
DHD
y
A
A1
Seating Plane
E
G
GD
1
13
14 20
29
32
4
5
21
30
Notes:
1. Dimensions D & E do not include interlead flash.
2. Dimension b1 does not include dambar protrusion/intrusion.
3. Controlling dimension: Inches.
4. General appearance spec. should be based on final
visual inspection sepc.
Symbol Min. Nom. Max. Max.Nom.Min.
Dimension in Inches Dimension in mm
A
b
c
D
e
HE
L
y
A
A1
2
E
b1
GD
3.56
0.50
2.802.67 2.93
0.71
0.66 0.81
0.41 0.46 0.56
0.20 0.25 0.35
13.89 13.97 14.05
11.35 11.43 11.51
1.27
HD
GE
12.45 12.95 13.46
9.91 10.41 10.92
14.86 14.99 15.11
12.32 12.45 12.57
1.91 2.29
0.004
0.095
0.090
0.075
0.495
0.490
0.485
0.595
0.590
0.585
0.430
0.410
0.390
0.530
0.510
0.490
0.050
0.453
0.450
0.447
0.553
0.550
0.547
0.014
0.010
0.008
0.022
0.018
0.016
0.0320.026 0.028
0.1150.105 0.110
0.020
0.140
1.12 1.420.044 0.056
0 10 10
0
0.10
2.41
θ
θ
13.4 32-pin STSOP (8 x 14 mm)
Min.
Dimension in Inches
Nom. Max. Min. Nom. Max.
Symbol
1.20
0.05 0.15
1.05
1.00
0.95
0.17
0.10
0.50
0.00
0
0.22 0.27
----- 0.21
12.40
8.00
14.00
0.50
0.60 0.70
0.80
0.10
35
0.047
0.006
0.041
0.040
0.035
0.007 0.009 0.010
0.004 ----- 0.008
0.488
0.315
0.551
0.020
0.020 0.024 0.028
0.031
0.000 0.004
035
0.002
A
A
b
c
D
E
e
L
L
Y
1
1
2
A
HD
θ
Dimension in mm
A
A
A2
1
LL1
Y
E
H
D
D
c
θ
b
e
W39F010
- 32 -
14. VERSION HISTORY
VERSION DATE PAGE DESCRIPTION
A1 Dec. 2000 - Initial Issued
1, 23 Add cycle of 1K
1 Change active current from 10 to15mA (typ.)
Change standby current from 20 to15 μA (typ.)
4 Modify Low VDD Inhibit
10, 11, 12 Delete old flow chart and add Embedded Algorithm
10 Remove Block Erase from the Embedded Erase
Algorithm
11 Correct Embedded #Data Polling Algorithm
16 Change IDD from 10/20 mA to15/30 mA (typ./max.)
Change ISB2 from 20/50 μA to15/50 μA (typ./max.)
1, 23 Rename TSOP (8 x 14 mm) as STSOP (8 x 14 mm)
A2 June 17, 2002
24 Add HOW TO READ THE TOP MARKING
A3 April 15, 2005 27 Add Important Notice
A4 December 26,
2005 27 Add 32-pin PLCC lead free part
W39F010
Publication Release Date: December 26, 2005
- 33 - Revision A4
Important Notice
Winbond products are not designed, intended, authorized or w arranted for use as components
in systems or equipment intended for surgical implantation, atomic energy control
instruments, airplane or spaceship instruments, transportation instruments, traffic signal
instruments, combustion control instruments, or for other applications intended to support or
sustain life. Further more, Winbond products are not intended for applications w herein failure
of Winbond products could result or lead to a situation wherein personal injury, death or
severe property or environmental damage could occur.
Winbond customers using or selling these products for use in such applications do so at their
ow n risk and agree to fully indemnify Winbond for any damages resulting from such improper
use or sales.
