- 6 / 7 -
(SCM7591-XC)
Specification : TS-S97D014C
Date : March, 2001
9. Reliability Test
8. Relation between Disable Input Voltage and Optical Output Power
7-2. Receiver side
Parameter S
mbol min. T
. Max. Unit Note
Center Wavelen
th - 1261 1580 nm
Minimum Sensitivit
Pmin -28.0 dBm 1, 2
Overload Pmax -8.0 dBm 1, 2
Fla
Assert Level Pa -37 dBm
Fla
Deassert Level Pd -40 dBm
FLAG Hysteresis Phys 3 dB
Note 1. BER=10^-10
2. Measured at the bit rate of 155.52Mbps, PRBS 2^23-1, NRZ
2
Disable In
ut Volta
eO
tical Out
ut Power
"L"
0.0 ~ 0.8V
Enabled
"H"
2.0V ~ Vcc
Disabled
<-45dBm
GR-468-CORE Issue 1, December 1998 Laser Module
HEADING TEST REFERENCE CONDITIONS SAMPLING ENV'T Sumitomo Result
LTPD SS C CO RT/ SS Pass/Fail
UNC
Mechanical MIL-STD-883 5 times/axis
Shock Method 2002 w/o TEC 1,500G, 0.5ms 20 11 0 R R 11 Pass
Vibration MIL-STD-883 Cond. A 20G, 20-2,000G 20 11 0 R R 11 Pass
Mechanical Method 2007 Hz, 4min/cy, 4cy/axis
Integrity Thermal Shock MIL-STD-883 Delta T=100degC 20 11 0 R R 11 Pass
Method 1011 0degC to 100degC
Solderability MIL-STD-883 (steam aging not 20 11 0 R R 11 Pass
Method 2003 required)
Accel. Aging (R)-4-53 Section 85degC; rated power -
(High Temp.) 5.18 2,000 hrs. - 25 - R 25 Pass
5,000 hrs. 10 O 25 Pass
Endurance Low Temp. - min, storage T 20 11 0 O O 11 Pass
Storage 2,000 hrs.
Temperature Section 5.20 -40degC to +85degC
Cycling 500 pass/fail 20 11 0 - R 11 Pass
1,000 for info. - 11 - - R 11 Pass
Damp Heat MIL-STD-202 85degC/85%RH 1,000hrs. 20 11 0 R R 11 Pass
Method 103 or
IEC-68-2-3
Cyc. Moist,. Res. Sec. 5.23 - 20 11 0 - R 11 Pass
Special Tests Internal MIL-STD-883 Max. 5,000ppm water 20 11 0 R R 11 Pass
Moisture Method 1018 vapour
ESD Threshold Section 5.22 - 6 - R R 6 -----
LTPD (in %); min. acceptable sample size(SS) and corresponding number of allowed failures (C)
CO; Conditional Objective
RT/UNC; Room Temp. / Uncontrol
R; Requirement
O; Objective