DATA SH EET
Product data sheet
Supersedes data of 2002 Jun 24 2003 Aug 20
DISCRETE SEMICONDUCTORS
PMEG2010EV
Low VF MEGA Schottky barrier
diode
M3D74
4
2003 Aug 20 2
NXP Semiconductors Product data sheet
Low VF MEGA Schottky barrier diode PMEG2010EV
FEATURES
Forward current: 1 A
Reverse voltage: 20 V
Very low forward voltage
Ultra small SMD package
Flat leads: excellent coplanarity and improved thermal
behaviour.
APPLICATIONS
Low voltage rectification
High efficiency DC/ DC conv ersion
Switch mode power supply
Inverse polarity protection
Low power cons ump tion applications.
DESCRIPTION
Planar Maximum Efficiency Ge neral Application (MEGA)
Schottky barrier diode w ith an integrated guard ring for
stress protection in a SOT666 ultra small SMD plastic
package.
PINNING
PIN DESCRIPTION
1cathode
2cathode
3anode
4anode
5cathode
6cathode
handbook, halfpage
123
456
1, 2
5, 6 3, 4
MHC310
Fig.1 Simplified outline (SOT666) and symbol.
Marking code: F1.
LIMITING VALUES
In accordance with the A b solute Maxi m um Rating Syst em (IEC 60134)
Note
1. Only valid if pins 3 and 4 are connected in parallel.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VRcontinuous revers e voltage 20 V
IFcontinuous forward current 1 A
IFSM non-repetitive peak forward current t = 8.3 ms half sinewave;
JEDEC method; note 1 8 A
Tstg storage temperature 65 +150 °C
Tjjunction temperature 125 °C
Tamb operating ambient temperature 65 +125 °C
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NXP Semiconductors Pr oduct data shee t
Low VF MEGA Schottky barrier diode PMEG2010EV
THERMAL CHARACTE RISTICS
Notes
1. Refer to SOT666 standard mounting conditions.
2. Mounted on printed circuit-bo ard, 1 cm2 copper area.
Soldering
The only recommended soldering meth od is reflow soldering.
ELECTRICAL CHARACTERISTIC S
Tamb = 25 °C unless otherwise specified.
Notes
1. Only valid if pins 1, 2, 5 and 6 are soldered on a 1 cm2 copper solder land.
2. Pulse test: tp = 300 μs; δ = 0.02.
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to ambient note 1 405 K/W
note 2 215 K/W
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
VFcontinuous forward v oltage IF = 10 mA 240 270 mV
IF = 100 mA 300 350 mV
IF = 1 000 mA; note 1; see Fig.2 480 550 mV
IRreverse current VR = 5 V; note 2 5 10 μA
VR = 8 V; note 2 7 20 μA
VR = 15 V; note 2; see Fig.3 10 50 μA
Cddiode capacitan c e VR = 5 V; f = 1 MHz; see Fig.4 19 25 pF
2003 Aug 20 4
NXP Semiconductors Pr oduct data shee t
Low VF MEGA Schottky barrier diode PMEG2010EV
GRAPHICAL DATA
handbook, halfpage
0.60.20 0.4 VF (V)
IF
(mA)
103
102
10
1
101
MHC311
(1) (2) (3)
Fig.2 Forward current as a function of forward
voltage; typical values.
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
handbook, halfpage
250 51015
IR
(μA)
20 VR (V)
105
104
103
102
10
1
MHC312
(1)
(2)
(3)
Fig.3 Reverse current as a function of rev erse
voltage; typical values.
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
handbook, halfpage
05
Cd
(pF)
10 20
80
60
20
0
40
15 VR (V)
MHC313
Fig.4 Diode capacitance as a function of reverse
voltage; typical values.
f = 1 MHz; Tamb = 25 °C.
2003 Aug 20 5
NXP Semiconductors Pr oduct data shee t
Low VF MEGA Schottky barrier diode PMEG2010EV
PACKAGE OUTLINE
UNIT bpcDE e1HELpw
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
01-01-04
01-08-27
IEC JEDEC EIAJ
mm 0.27
0.17 0.18
0.08 1.7
1.5 1.3
1.1 0.5
e
1.0 1.7
1.5 0.1
y
0.1
DIMENSIONS (mm are the original dimensions)
0.3
0.1
SOT666
bp
pin 1 index
D
e1
e
A
Lp
detail X
HE
E
A
S
0 1 2 mm
scale
A
0.6
0.5
c
X
123
456
Plastic surface mounted package; 6 leads SOT66
6
YS
wMA
2003 Aug 20 6
NXP Semiconductors Pr oduct data shee t
Low VF MEGA Schottky barrier diode PMEG2010EV
DATA SHEET STATUS
Notes
1. Please consult the most rec en tly iss ued document before initiating or completing a design.
2. The product status of device(s) described in this document may have changed since this do cument was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the product specification.
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modification.
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratin gs only and
operation of the device at these or any other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values an d
Characteristics sections of this document, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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Customer notification
This data sheet was changed to reflect the new company name NXP Semicon ductors. No change s were
made to the content, except for the legal definitions and disclaimer s.
Printed in The Netherlands 613514/02/pp7 Date of release: 2003 Aug 20 Document orde r number: 9397 750 11684