28 GENL INSTR OPTOELEK == 880 02929 i 8901 0 PTOEL LEK ae - MCL2630 (HCPL-2630) DUAL 10 MBit/ Ss Loaic GATE MCL2631 (HCPL-2631) NTL. Oe 3490128 gooeie4 fs ! l I l { { 4 (080) . 3.05 (120) MIN 0.89 (035) TYP SN 3.94 (.155)' 4.95 (195) ] 368 (145), , MAX 356 (140) ot (020), Ck DESCRIPTION The MCL/HCPL-2630 and MCL/HCPL-2631 dual channel optocouplers have two channels, each wk ee = consisting of a 700 nm GaAsP LED, optically ay . coupled to a very high speed integrated - 15 MAX photodetector logic gate. The outputs feature _ oo. 6.86 (.270) open collectors, thereby permitting wired-OR . 6.35 (.250) 0.36 (.014) - outputs, The coupled parameters are guaranteed O 0.20 (008) over the temperature range of 0-70C. nn St maximum input signal of 5 mA will provide a _ _ - minumum output sink current of 13 mA (fan-out 245 (380) | 782 1.78 (070) REF f+ ofs), A (360) . (arr Tra An internal noise shield provides superior . oo Loo - common mode rejection of typically 10 kV/us. 2.64 (100) TP 0.9 036) TYP-* ~ qhe MOL/HCPL 2631 has a minimum CMR of . or Pee . HS . f pp . . An improved double-molded package allows superior insulation, permitting a 480 V working voltage compared to industry standard 220 V, FEATURES - Ww . Very high speed one: . = Superior _ s 0.56 (022) 2091 s ; ae a Superior insulation 2600 V RMS 1 min. 0.41 (016) DIMENSIONS IN mm me Double working voltage 480 V . . @ ran-out o over U- . - RO ~ oe - a Logic gate output -+ = Wired-OR open collector : 1 NOISE 8 a tee a ULL. recognized (File #ESOI51) AoA pF bypass capacitor must be connected between pins 8 and 5. (See APPLICATIONS . = Ground loop elimination a LSTTL to TTL, LSTTL or 5-volt CMOS # Line receiver, data transmission = Data multiplexing Switching power supplies - 7 Jvos ~ - Voa : EB , \ - i Veo +4 ; note 1) . = = Pulse transformer replacement 5 |ono = Computer-peripheral interface - ce . owe : : ed . . oe . : Equivalent Circuit - - Sos Pe fo ABSOLUTE MAXIMUM RATINGS = - :7 -- . - ~ Storage temperature .........,.-55BCto+126C | ~- 4 . . Operating temperature ......5665.. O Cto+ 70C | Reverse input voltage (each channel)........5.0V Lead solder temperature... deveees ++ 260C for 10s Reverse supply voltage (-Voc) .........5- -500 mV DC/Average forward input current Supply voltage, (Vcc) ... 7.0 V/1 minute maximum > (each Channel)... ccs cererseseceeesesees TOMA _ Output current, (lo) (each channel) ........ 16 mA 7 Peak forward input current Output voltage, (Vo) (each channel).........7.0V (each channel} eenees - 30 mA (s 1 msec duration) _ Collector output power dissipation ........ 60 mWMCL2636 u 2650 iiGTi-2630) fiGL2631 HCPL-2631) o -GENL INSTRa OPTOELEK *& AB DE 3890128 oog2930 i T-41-85 RECOMMENDED OPERATING CONDITIONS ~~~. ; SYMBOL MIN, WAX. onITs (Input current, lowlevel =. - 2 det : Oo. .. BF HA - Input current, high level 75. 7. ten = a 6a2- .- Le, Tet Supply voltage, output -""- Veo | 48 er 55 0 T \ Operating temperature ~~ Ta QE c Fan out (TTL Load) - N mS _ 8 . . 6. 3 mA Is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshoid value is 5.0 mA or less, ELECTRICAL C CHARACTERISTICS (Ta= 0C ~ 70C Unless Otherwise Specitied) PARAMETER _{SYMBOL | MIN. TYP, MAX. UNITS TEST CONDITIONS - Voc = 6.5 V, Vo =5.6V High level output current _ ; fou 2 250 uA ir = 250 pA, Note 6 : Voc = 5.8 V, IF =5 mA Li t { . . . ow leve output vo tage VoL 0.34 0.6 Vv Note 6, lo. = 13 mA : : . . . Voc = 6.5 V, IF =O mA I it I - , _| High level supply current IcCcH ., 4 =~ 30 mA (Both channels) Veo = 5.5 V, lr = 10mA 4 bi ' ow level supply current lect a 26 % mA (Both channels) Input forward voltage - VF 1.55 1.75 V Ir = 10 mA, Ta = 25C Input reverse breakdown voltage Bva 5.0 Vv ih = 10 2A, Ta = 25C Input capacitance Gn 60 pF Ve =0, f= 1 MHz Input diode temperature ~ = - coefficient | AVF/ATA - 1.4 mV C lF=10mA Input-input insulation . Relative humidity = 45% leakage current it. . 0.005 nA t=5s, Vi4=500 V, Note 7 Resistance (input-input) Ri-1 1011 a Vi-1 = 500 V, Note 7 Capacitance (input-input) C- 0.25 - pF f= 1 MHz, Note 7 : - Relative humidity = 45% input-output . f-o vat - 1.0 BA ho av, ag insulation leakage current ad : . - - Note 10 Resistance (input to output) _RI-O ; 10'2 : 0 Vi-o = 500 V, Note 10 Capacitance (input to output) C-0 0.6 pF f=1 MHz, Note 10 Withstand insulation test voltage | Viso 2500 | * Vams f iH 1 ain TA= 28C " *All typical values are at Veg = 6 V, T, 25C (sach channel), SWITCHING CHARACTERISTICS (Ta = 25C, Voc = 5.0 V Unless Otherwise Specified) _ . PARAMETER ~ | SYMBOL; DEVICE | MIN. TYR MAX, UNITS TEST CONDITIONS Propagation delay time . Loo (For output high level} tpi 48 1% ns . Tn - Propagation delay time _ rn jon . Ri = 350 0 (For output low level PHL oo _ 75 ns CL=16 pF - - Output rise time (10-80%) |. ate of Je.) e. . O- J. ns lF=7.5mA Output fall time (90-10%) tt * . 146 . ns Notes, 2, 8, 4 & 5, Fig. 8 Common mode transient : - ~ Vom = 50 V (peak) immunity - CMH pee 1000 e000 a) V/us IF =O mA, VoL (min) = 2,0 V (At output high level) - . " 7 . Ri = 350 9, Note 9, Fig. 12 Common mode transient ~ - soe ef te % : - os Vom = 50 V (peak) immunity. CML 2631 -1000 | -10,000 | | Vins - lF=7.5 mA, a output low level) ~ 7 2630 -10,000 ~ - - VoL (max) = 0.8 V Meee a O . 7 Ri = 350 9, Note 8, Fig. 12BB DEB IO1CS o002@9a1 & MGLZ630 (HGPL-2630) MGL2Z631 (HOPL-2631) 3890128 GENL INSTR, OPTOELEK 88D 02931 DT-4/-85 TYPICAL CHARACTERISTIC CURVES (Ta = 25 C Unless Otherwise Specified) 1.0 = s s 8.0 | w. 8.0 g z 7 m 2 5 7.0 & a w 34 > g 60 5 06 5. 5 E 04 E 3 50 8 5 40 02 ot x a g EB AL= 1Kt & 0 a 5 30 = 006 z . o 004 3 1 20 . , $ 31002 2 . > 10 so 001 1 20 30 40 50 60 70 6 10 2 2 40 50 6 70 0 10 20 30 40 50 60 Ta TEMPERATURE (C) TEMPERATURE (T,, Cl FORWARD INPUT CURRENT (Ir, mA) C1613 C1598 1602 Fig. 2. High Level Output Fig, 3, Low Level Output Fig. 4. Output Voltage vs. Current vs. Voltage vs. Forward Input Current Temperature Temperature too <q = z b = z > > 2 10 5 4 o w uf 2 a a o z 5 g 5 5 g 5 = a g 2 s Z 2 g z oo a o momo ty Ip = 7.6mA ~ ta = 6,0V Ot 1 1.2 1.4 1.6 0 10 2 30 4 6 e& 70 0 5 10 15 20 Ve, FORWARD INPUT VOLTAGE {V} T, - TEMPERATURE c} |, - PULSED INPUT CURRENT {mA} 1600 C1604 C1603 Fig. 5. Forward Input Current Fig. 6. Propagation Delay vs. Fig. 7. Propagation Delay vs. vs. Forward Input Temperature Pulse Input Current Voltage PULSE NOE 8 GENERATOR] _ | SHIELD | 1 8 Zo = 50 Uh! ay , t=5ns > RL }H} Pw oe -1 wF INPUT BYPASS] _ , MONITORING [3 6 | =e CL MODE 1 OUTPUT ae MONITORING 47a [ is} NODE *C Is approximately 15 pF, which a includes probe and stray wiring capacitance ci980 Fig. 8. Test CircuitZ try, tory tr and t, 39 a _ 2 io8 3. rot ve o 4 aa? for i sn anime fom meeMCL2630 (HCPL-2630) MCL2631 (HCPL-2631) GENL INSTR OPTOELEK . -O8 De ff 3eso1es gooe%e & | eee CURVES ess Ulnerwise specitied) 10K 9K Veo = ie = 7.5mA BK 7K 6K 5K 4K 3K ~ RISE & FALL TIME {ns} 2K t,. 1K o 10 20 30 40 50 66 70 7 CM ~ COMMON MODE TRANSIENT IMMUNITY (V/s) RELATIVE COMMON MODE TRANSIENT IMMUNITY 100 260 300 400 500 600 700 800 9001000 Q 10 20, 30 40 50 60 70 Ta, - TEMPERATURE (C) Vong - COMMON MODE TRANSIENT AMPLITUDE (VJ T, TEMPERATURE (C} C160 C1890 C1595 Fig. 9. Rise and Fall Time Fig. 10. Relative Common Mode Fig. 11. Relative Common Mode vs. Temperature Transient immunity vs. Common Transient Immunity vs. NOISE Mode Transient Complitude Temperature Oe tr SHIELD =| 1 ee 2 Sf FBV OO 50V lipF 3 / \ / ravPasss Vou : OV 5V OM, Vo SWITCH POS. {A}, I, =0 \S Yo Vo (MIN) Vo (MAX.) Yo JX. SWITCH POS. (8), Ip = 7.5mA Teele vere al | er L ny o.5Vv cm, PULSE GEN = C1594 Zo =501 C1981 Fig. 12, Test Circuit for Transient Immunity and Typical Waveforms NOTES: 1, The Voc supply voltage to each MCL2630 isolator must be bypassed by a 0.1 F capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package Vec and GND pins of each device. 2. tpry, - Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse. 3. tp_y - Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5 V level on the Low to High transition of the output voltage pulse. t; - Fall time is measured from the 10% to the 90% levels of the HIGH to LOW transition on the output pulse. t, ~- Rise time is measured from the 90% to the 10% levels of the LOW to HIGH transition on the output puise. Each channel, Measured between pins 7 and 2 shorted together, and pins 3 and 4 shorted together. CM, ~ The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.., Voy7 > 0.8 V). Measured in volts per microsecond (V/%s). 9. CM, - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (Le., Vour> 2.0 VJ. Measured in volts per microsecond (VFus). Volts/microsecond can be translated to sinusoidial voltages: ONAAA (Vou) V/s = e Max. = mf om Vom (D-D.) at Example: Voy = 318 V pp when foy = 1 MHz using CM, and CM, =1000 V/ps: 10. - Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted together. 100